CN105911029A - System for measuring sample photoluminescence under deep low temperature and intense magnetic field - Google Patents
System for measuring sample photoluminescence under deep low temperature and intense magnetic field Download PDFInfo
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- CN105911029A CN105911029A CN201610406776.2A CN201610406776A CN105911029A CN 105911029 A CN105911029 A CN 105911029A CN 201610406776 A CN201610406776 A CN 201610406776A CN 105911029 A CN105911029 A CN 105911029A
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- optical fiber
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- vacuum sealing
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
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- Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
Abstract
The invention discloses a system for measuring sample photoluminescence under a deep low temperature and intense magnetic field. The measuring system is mainly composed of an optical fiber laser, optical fiber components, optical fibers, a vacuum sealing joint, an O-shaped ring, a nut, a sample to be measured, a magnetic conveying sample chamber, a spectrometer, a test and analysis computer and the like. The measuring system is mainly characterized in that photoluminescence testing is conducted on the sample in a deep low temperature and intense magnetic field environment by means of the optical fiber components, and combination of the photoluminescence testing and deep low temperature and intense magnetic field conveying measurement is achieved.
Description
Technical field
The present invention relates to the measurement system of a kind of luminescence generated by light, creative by optical fiber by photoluminescence measurement
Be incorporated under extremely low temperature, high-intensity magnetic field, for measure the structure of material, composition, environment atomic arrangement information with
And the minority carrier lifetime etc. of semi-conducting material provides new tool, have simple, without destructive, to sample
Product size no requirement (NR), resolution high.
Background technology
In the means of testing that semiconductor materials and devices is relevant, magnetic transport is a kind of important and the research on basis
Means, in order to the carrier concentration of research material, the essential information such as type and mobility.And at profound hypothermia
Under the conditions of, numerous quantum effects present, and as the correction to classical conductance, the quantum effect of conductance is anti-
Mirroring the physical message such as spin properties of material, these characteristics may be in the physical device spin of a new generation
Electronics device is applied, therefore there is important researching value.The quantum effect of conductance is ground
Studying carefully and have become as a new subject, the phenomenon of research includes magnetoresistance oscillations, quantum hall effect, weak local
With weak anti-localization effect, quantum tunneling etc..
These research major parts use traditional electrical testing method at present, therefore suffer from such as material substrate electricity
Lead, the carrier on three-dimensional, sample etches are difficult to and may destroy sample and prepared by sample electrode
It is difficult to wait restriction.Luminescence generated by light refer to material under the excitation of light, electronics transits to conduction band and at valency from valence band
Band leaves hole；Electronics and hole reach respective by relaxation in each comfortable conduction band and valence band and are not occupied
Lowest excited state (being at the bottom of conduction band in intrinsic semiconductor and top of valence band), becomes quasi-equilibrium state；Quasi-equilibrium state
Under electronics and hole again by recombination luminescence, form intensity or the spectrum of Energy distribution of different wavelengths of light
Figure.In the case of exciting light energy is not very big, luminescence generated by light test is a kind of lossless method of testing,
Can quickly and conveniently characterize the luminescent properties of the defect of semi-conducting material, impurity and material.Photic
Light can be provided with the pass structure of material, composition and the information of environment atomic arrangement, be a kind of nondestructive,
Highly sensitive analysis method.The application of laser more make this alanysis method be deep into microcell, selective exitation and
The field of transient process, makes it further become important research means, is applied to physics, material supply section
The fields such as, chemistry and molecular biology.The present invention makes full use of the advantages for development of current fiber optic materials, will
Photoluminescence measurement is incorporated in the measurement environment of profound hypothermia, highfield, for research material at different temperatures
Provide a kind of new research method and means with the performance under magnetic field, be research material electrical and optical property
Powerful with structure phase dry units.
Summary of the invention
It is an object of the invention to provide a kind of photoluminescence measurement method based on optical fiber, and be introduced into
Profound hypothermia, high-intensity magnetic field measurement environment in, for measure the structure of material, composition, the letter of environment atomic arrangement
Breath and the minority carrier lifetime etc. of semi-conducting material provide new tool, have simple, without destructive,
To sample size no requirement (NR), resolution high.
Technical scheme is as follows:
Test system includes that optical fiber laser 101, optical fiber component A102, optical fiber I103, vacuum seal and connects
104, O 105, nut 106, testing sample 107, optical fiber II108, magnetic transport sample room 109,
Optical fiber component B110, spectrogrph 111 and test analysis computer 112, basic structure is shown in accompanying drawing 1.Vacuum
Seal nipple 104, O 105 and nut 106 concrete structure and with optical fiber I103, optical fiber II108
Accompanying drawing 2 is shown in connection with magnetic transport sample room 109.
Described optical fiber component A102 two ends by fibre-optical splice respectively with optical fiber laser 101 and optical fiber
I103 connects；Described optical fiber I103 left end is connected with optical fiber component A102 by fibre-optical splice, and right-hand member is worn
Cross after vacuum sealing joint 104 enters magnetic transport sample room 109 and be directed at testing sample 107；Described optical fiber
II108 left end is connected with optical fiber component B110 by fibre-optical splice, and right-hand member enters through vacuum sealing joint 104
It is directed at testing sample 107 after entering magnetic transport sample room 109；Vacuum sealing joint 104 is circular, inside has stripping
The optical fiber I103 and optical fiber II108 that remove crust Jin Liu center quartz portions pass, and central employing fluid sealant is fixed
And sealing；Vacuum sealing joint 104 is through magnetic transport sample room 109, and a part is positioned at magnetic transport sample room
109 is outer and in having groove, O 105 to pack into vacuum sealing joint 104 and be in vacuum sealing joint 104
In groove, O 105 exposes the part of groove and is affixed on magnetic transport sample room 109 outer wall, and vacuum seals
Joint 104 is in the part within magnetic transport sample room 109 has screw thread, nut 106 are screwed into screw thread and paste
Tight magnetic transport sample room 109 outer wall, plays fixing and vacuum sealing function；It is defeated that testing sample 107 lies against magnetic
In the superconducting coil of fortune bottom, sample room 109；Adjust testing sample 107 position and optical fiber I103, optical fiber II108
The angle of lower end aligned testing sample 107 so that the laser light incident that optical fiber I103 sends is to testing sample 107
On, the luminescence generated by light excited is received by optical fiber II108；Optical fiber component B110 two ends are connect by optical fiber
Head is connected with spectrogrph 111 and optical fiber II108 respectively；Spectrogrph 111 is connected to test analysis computer 112,
Thus record, analyze the spectral information obtained.
The optical maser wavelength that described optical fiber laser 101 is excited is shorter than the light that is excited of testing sample 107
Wavelength.
Described optical fiber component A (102), optical fiber I (103), optical fiber II (108) and optical fiber component B (110)
Core diameter and transmission light efficiency meet signal transmission needs and measurement requirement, and optical fiber core diameter is not less than 1 micron, passes
Lose efficiency higher than 50 percent.
Described optical fiber I (103) lower end is planar end surface, in order to launch parallel laser.
Described optical fiber II (108) lower end is hemisphere face, in order to collect luminescence generated by light signal.
Described spectrogrph (111) institute light-metering wave-length coverage meets luminescence generated by light and includes luminescence generated by light signal wavelength
Scope；Place corresponding with the optical maser wavelength that optical fiber laser (101) is excited within spectrogrph (111)
Filter plate with remove excitation laser on measure impact.
It is an advantage of the current invention that: utilize optical fiber that luminescence generated by light imports to the measurement bar of profound hypothermia, high-intensity magnetic field
Under part, for characterizing the structure of material, composition, ring under the various characteristics especially profound hypothermia of material, high-intensity magnetic field
The information of border atomic arrangement and the minority carrier lifetime etc. of semi-conducting material provide new tool, use nothing
Contact, non-destructive method measure, and method is simple and convenient, can directly measure sample, have
Simply, without destructive, to sample size no requirement (NR), resolution high.
Accompanying drawing explanation
Fig. 1: a kind of for measuring the system schematic of sample luminescence generated by light under profound hypothermia, high-intensity magnetic field.In figure
Each several part is: optical fiber laser 101, optical fiber component A102, optical fiber I103, vacuum sealing joint 104,
O 105, nut 106, testing sample 107, optical fiber II108, magnetic transport sample room 109, optical fiber
Assembly B110, spectrogrph 111 and test analysis computer 112.
Fig. 2 is vacuum sealing joint structure chart, wherein: (a) vacuum sealing joint 104 top view, and (b) is true
Empty seal nipple 104 side cut away view.In figure, each several part is: optical fiber I103, vacuum sealing joint 104,
O 105, nut 106, optical fiber II108 and magnetic transport sample room 109.
Detailed description of the invention
Illustrate to provide a preferable example of the present invention below according to summary of the invention and accompanying drawing, enter in conjunction with example
One step illustrates the technology of the present invention details, architectural feature and functional characteristics.But this example is not limiting as model of the present invention
Enclose, should be included in the scope of the invention in accordance with the example described in summary of the invention and accompanying drawing explanation.
Optical fiber laser 101 uses 532nm optical fiber laser, model LSR532H-600.
Optical fiber component A102 and optical fiber component B110 uses silica fibre, product type UV600-1*2.Light
Fine I103 and optical fiber II108 uses silica fibre, core diameter 1 millimeter, is positioned at outside magnetic transport sample room 109
Portion outer layer has 3 millimeters of sheaths, is positioned at vacuum sealing joint 104 and magnetic transport sample room 109 part
Peel off sheath.
Vacuum sealing joint 104 uses rustless steel to make, and for circular hollow structure, is designed with groove and screw thread,
Coordinate O 105 and nut 106 and fluid sealant to use, reach vacuum-packed purpose.It is specifically shown in figure
2。
Magnetic transport sample room 109 combines existing profound hypothermia, magnetic transport system, follows without liquid helium for a set of Oxford
A part for ring superconducting magnet system.
Spectrogrph 110 uses fiber spectrometer, model PC4000, wave-length coverage 400～1100nm, differentiates
Rate about 0.5nm.
With in optical fiber measurement photoluminescent method, optical fiber laser 101 sends laser, through optical fiber component
A102 and optical fiber I103 is shone on testing sample 107 by the lower end planar end surface transmitting of optical fiber I103, produces light
Photoluminescence signal is received by optical fiber II108 lower end hemisphere face, passes through optical fiber II108 and optical fiber component B110
Enter to spectrogrph 111, it measure its spectral signal, and stored by test analysis computer 112 record.
The variation relation of the photoluminescence spectra of available testing sample 107 under different temperatures, different magnetic field.
Claims (6)
1. for measuring a system for sample photoluminescence spectra under profound hypothermia high-intensity magnetic field, including: optical fiber
Laser instrument (101), optical fiber component A (102), optical fiber I (103), vacuum sealing joint (104), O
Type circle (105), nut (106), testing sample (107), optical fiber II (108), magnetic transport sample room (109),
Optical fiber component B (110), spectrogrph (111) and test analysis computer (112), it is characterised in that:
Described optical fiber component A (102) two ends by fibre-optical splice respectively with optical fiber laser (101) and
Optical fiber I (103) connects；Described optical fiber I (103) left end is by fibre-optical splice and optical fiber component A (102)
Connecting, right-hand member is directed at afterwards through vacuum sealing joint (104) entrance magnetic transport sample room (109) and treats test sample
Product (107)；Described optical fiber II (108) left end is connected with optical fiber component B (110) by fibre-optical splice,
Right-hand member enters magnetic transport sample room (109) through vacuum sealing joint (104) and is directed at testing sample (107) afterwards；
Vacuum sealing joint (104) is circular, inside has the optical fiber I (103) peelling off crust Jin Liu center quartz portions
Passing with optical fiber II (108), central employing fluid sealant is fixed and seals；Vacuum sealing joint (104) is worn
Crossing magnetic transport sample room (109), a part is positioned at magnetic transport sample room (109) outward and has groove, O type
Enclose in (105) pack into vacuum sealing joint (104) and be in vacuum sealing joint (104) groove, O
Type circle (105) exposes the part of groove and is affixed on magnetic transport sample room (109) outer wall, vacuum sealing joint (104)
It is in the part within magnetic transport sample room (109) and has screw thread, nut (106) are screwed into screw thread and are adjacent to
Magnetic transport sample room (109) outer wall, plays fixing and vacuum sealing function；Testing sample (107) lies against
In the superconducting coil of magnetic transport sample room (109) bottom；Adjust testing sample (107) position and optical fiber I
(103), the angle of optical fiber II (108) lower end aligned testing sample (107) so that optical fiber I (103)
The laser light incident sent is on testing sample (107), and the luminescence generated by light excited is by optical fiber II (108) institute
Receive；Optical fiber component B (110) two ends by fibre-optical splice respectively with spectrogrph (111) and optical fiber II (108)
Connect；Spectrogrph (111) is connected to test analysis computer (112), thus records, analyzes and obtain
Spectral information.
The most according to claim 1 a kind of for measure sample luminescence generated by light under profound hypothermia high-intensity magnetic field it is
System, it is characterised in that: the optical maser wavelength that described optical fiber laser (101) is excited is shorter than testing sample
(107) wavelength of the light that is excited.
The most according to claim 1 a kind of for measure sample luminescence generated by light under profound hypothermia high-intensity magnetic field it is
System, it is characterised in that: optical fiber component A (102), optical fiber I (103), optical fiber II (108) and optical fiber group
Part B (110) core diameter is not less than 1 micron, and transmission light efficiency is higher than 50 percent.
The most according to claim 1 a kind of for measure sample luminescence generated by light under profound hypothermia high-intensity magnetic field it is
System, it is characterised in that: described optical fiber I (103) lower end is for ease of launching the planar end surface of parallel laser.
The most according to claim 1 a kind of for measure sample luminescence generated by light under profound hypothermia high-intensity magnetic field it is
System, it is characterised in that: described optical fiber II (108) lower end is for ease of collecting the hemisphere of luminescence generated by light signal
Face.
The most according to claim 1 a kind of for measure sample luminescence generated by light under profound hypothermia high-intensity magnetic field it is
System, it is characterised in that: spectrogrph (111) institute light-metering wave-length coverage meets luminescence generated by light and includes luminescence generated by light
Signal wavelength range；The laser excited with optical fiber laser (101) it is placed with within spectrogrph (111)
The corresponding filter plate of wavelength is to remove the excitation laser impact on measuring.
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201610019745.1A CN105510282A (en) | 2016-01-13 | 2016-01-13 | System for measuring photoluminescence of sample in deep low-temperature and high-intensity magnetic field |
| CN2016100197451 | 2016-01-13 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN105911029A true CN105911029A (en) | 2016-08-31 |
| CN105911029B CN105911029B (en) | 2018-10-19 |
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201610019745.1A Pending CN105510282A (en) | 2016-01-13 | 2016-01-13 | System for measuring photoluminescence of sample in deep low-temperature and high-intensity magnetic field |
| CN201610406776.2A Active CN105911029B (en) | 2016-01-13 | 2016-06-12 | A kind of system for measuring sample luminescence generated by light under profound hypothermia high-intensity magnetic field |
| CN201620558438.6U Withdrawn - After Issue CN205808932U (en) | 2016-01-13 | 2016-06-12 | For measuring the system of sample luminescence generated by light under profound hypothermia high-intensity magnetic field |
Family Applications Before (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201610019745.1A Pending CN105510282A (en) | 2016-01-13 | 2016-01-13 | System for measuring photoluminescence of sample in deep low-temperature and high-intensity magnetic field |
Family Applications After (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201620558438.6U Withdrawn - After Issue CN205808932U (en) | 2016-01-13 | 2016-06-12 | For measuring the system of sample luminescence generated by light under profound hypothermia high-intensity magnetic field |
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| Country | Link |
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Families Citing this family (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105510282A (en) * | 2016-01-13 | 2016-04-20 | 中国科学院上海技术物理研究所 | System for measuring photoluminescence of sample in deep low-temperature and high-intensity magnetic field |
| CN112268885B (en) * | 2020-10-22 | 2021-07-09 | 清华大学 | Semiconductor nanowire photoluminescence characteristic in-situ characterization system for scanning electron microscope |
| CN112362581B (en) * | 2020-10-28 | 2022-02-15 | 华南理工大学 | Non-magnetic sample cavity for measuring magnetic field effect |
Citations (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4385333A (en) * | 1980-08-04 | 1983-05-24 | International Memories, Inc. | Magnetic disc drive system |
| CN2166469Y (en) * | 1993-09-07 | 1994-05-25 | 中国科学院上海技术物理研究所 | Optical transmission apparatus for Fourier magneto-optic testing |
| CN101806623A (en) * | 2010-04-07 | 2010-08-18 | 中国科学院半导体研究所 | Multifunctional reflection-type magneto-optic spectrum measuring system |
| CN103500870A (en) * | 2013-10-10 | 2014-01-08 | 中国科学院上海技术物理研究所 | Reflection type resonant cavity for measuring sample surface state in profound hypothermia high-intensity magnetic field |
| CN203535204U (en) * | 2013-10-10 | 2014-04-09 | 中国科学院上海技术物理研究所 | Sample rod for contactless low-temperature magneto-transport tests |
| CN104034686A (en) * | 2014-06-12 | 2014-09-10 | 中国科学院上海技术物理研究所 | Magneto-optical modulation reflection spectrum device based on Fourier transform infrared spectrometer |
| CN104465283A (en) * | 2014-12-11 | 2015-03-25 | 中国科学院电工研究所 | Low-temperature cooling system of superconduction high-intensity magnetic field magnetron sputtering cathode |
| US20150355098A1 (en) * | 2014-05-06 | 2015-12-10 | California Institute Of Technology | Rotating scattering plane based nonlinear optical spectrometer to study the crystallographic and electronic symmetries of crystals |
| CN205808932U (en) * | 2016-01-13 | 2016-12-14 | 中国科学院上海技术物理研究所 | For measuring the system of sample luminescence generated by light under profound hypothermia high-intensity magnetic field |
-
2016
- 2016-01-13 CN CN201610019745.1A patent/CN105510282A/en active Pending
- 2016-06-12 CN CN201610406776.2A patent/CN105911029B/en active Active
- 2016-06-12 CN CN201620558438.6U patent/CN205808932U/en not_active Withdrawn - After Issue
Patent Citations (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4385333A (en) * | 1980-08-04 | 1983-05-24 | International Memories, Inc. | Magnetic disc drive system |
| CN2166469Y (en) * | 1993-09-07 | 1994-05-25 | 中国科学院上海技术物理研究所 | Optical transmission apparatus for Fourier magneto-optic testing |
| CN101806623A (en) * | 2010-04-07 | 2010-08-18 | 中国科学院半导体研究所 | Multifunctional reflection-type magneto-optic spectrum measuring system |
| CN103500870A (en) * | 2013-10-10 | 2014-01-08 | 中国科学院上海技术物理研究所 | Reflection type resonant cavity for measuring sample surface state in profound hypothermia high-intensity magnetic field |
| CN203535204U (en) * | 2013-10-10 | 2014-04-09 | 中国科学院上海技术物理研究所 | Sample rod for contactless low-temperature magneto-transport tests |
| US20150355098A1 (en) * | 2014-05-06 | 2015-12-10 | California Institute Of Technology | Rotating scattering plane based nonlinear optical spectrometer to study the crystallographic and electronic symmetries of crystals |
| CN104034686A (en) * | 2014-06-12 | 2014-09-10 | 中国科学院上海技术物理研究所 | Magneto-optical modulation reflection spectrum device based on Fourier transform infrared spectrometer |
| CN104465283A (en) * | 2014-12-11 | 2015-03-25 | 中国科学院电工研究所 | Low-temperature cooling system of superconduction high-intensity magnetic field magnetron sputtering cathode |
| CN205808932U (en) * | 2016-01-13 | 2016-12-14 | 中国科学院上海技术物理研究所 | For measuring the system of sample luminescence generated by light under profound hypothermia high-intensity magnetic field |
Also Published As
| Publication number | Publication date |
|---|---|
| CN205808932U (en) | 2016-12-14 |
| CN105510282A (en) | 2016-04-20 |
| CN105911029B (en) | 2018-10-19 |
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