CN105789124A - 晶片的加工方法 - Google Patents
晶片的加工方法 Download PDFInfo
- Publication number
- CN105789124A CN105789124A CN201511004991.1A CN201511004991A CN105789124A CN 105789124 A CN105789124 A CN 105789124A CN 201511004991 A CN201511004991 A CN 201511004991A CN 105789124 A CN105789124 A CN 105789124A
- Authority
- CN
- China
- Prior art keywords
- wafer
- laser beam
- pulse laser
- upgrading layer
- pulse
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000003672 processing method Methods 0.000 title claims abstract description 16
- 230000011218 segmentation Effects 0.000 claims abstract description 31
- 230000007246 mechanism Effects 0.000 claims abstract description 28
- 238000000034 method Methods 0.000 claims abstract description 12
- 229910052710 silicon Inorganic materials 0.000 claims description 15
- 239000010703 silicon Substances 0.000 claims description 15
- 208000037656 Respiratory Sounds Diseases 0.000 claims description 8
- 230000035699 permeability Effects 0.000 claims description 7
- 238000005286 illumination Methods 0.000 claims description 3
- 230000014759 maintenance of location Effects 0.000 abstract description 11
- 230000001678 irradiating effect Effects 0.000 abstract description 3
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 13
- 230000003287 optical effect Effects 0.000 description 8
- 230000007480 spreading Effects 0.000 description 8
- 238000001514 detection method Methods 0.000 description 7
- 238000010521 absorption reaction Methods 0.000 description 5
- 239000004065 semiconductor Substances 0.000 description 5
- 230000015572 biosynthetic process Effects 0.000 description 3
- 229910052779 Neodymium Inorganic materials 0.000 description 2
- 230000033228 biological regulation Effects 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 238000003754 machining Methods 0.000 description 2
- 230000005855 radiation Effects 0.000 description 2
- 238000000926 separation method Methods 0.000 description 2
- 230000003068 static effect Effects 0.000 description 2
- 150000001206 Neodymium Chemical class 0.000 description 1
- 230000015556 catabolic process Effects 0.000 description 1
- 229910003460 diamond Inorganic materials 0.000 description 1
- 239000010432 diamond Substances 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 238000002347 injection Methods 0.000 description 1
- 239000007924 injection Substances 0.000 description 1
- 238000009413 insulation Methods 0.000 description 1
- 229910052751 metal Inorganic materials 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- QEFYFXOXNSNQGX-UHFFFAOYSA-N neodymium atom Chemical compound [Nd] QEFYFXOXNSNQGX-UHFFFAOYSA-N 0.000 description 1
- 230000008520 organization Effects 0.000 description 1
- 239000002245 particle Substances 0.000 description 1
- 230000000149 penetrating effect Effects 0.000 description 1
- 230000002093 peripheral effect Effects 0.000 description 1
- 230000008569 process Effects 0.000 description 1
- 239000011347 resin Substances 0.000 description 1
- 229920005989 resin Polymers 0.000 description 1
- 150000003376 silicon Chemical class 0.000 description 1
- 230000001629 suppression Effects 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/70—Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
- H01L21/77—Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate
- H01L21/78—Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate with subsequent division of the substrate into plural individual devices
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/26—Bombardment with radiation
- H01L21/263—Bombardment with radiation with high-energy radiation
- H01L21/268—Bombardment with radiation with high-energy radiation using electromagnetic radiation, e.g. laser radiation
Landscapes
- Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- High Energy & Nuclear Physics (AREA)
- Optics & Photonics (AREA)
- Electromagnetism (AREA)
- Health & Medical Sciences (AREA)
- Toxicology (AREA)
- Laser Beam Processing (AREA)
- Dicing (AREA)
- Chemical & Material Sciences (AREA)
- Crystallography & Structural Chemistry (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2015-003531 | 2015-01-09 | ||
JP2015003531A JP2016129203A (ja) | 2015-01-09 | 2015-01-09 | ウエーハの加工方法 |
Publications (1)
Publication Number | Publication Date |
---|---|
CN105789124A true CN105789124A (zh) | 2016-07-20 |
Family
ID=56384457
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN201511004991.1A Pending CN105789124A (zh) | 2015-01-09 | 2015-12-29 | 晶片的加工方法 |
Country Status (4)
Country | Link |
---|---|
JP (1) | JP2016129203A (ja) |
KR (1) | KR20160086267A (ja) |
CN (1) | CN105789124A (ja) |
TW (1) | TW201635357A (ja) |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN109524358A (zh) * | 2017-09-20 | 2019-03-26 | 东芝存储器株式会社 | 半导体装置及其制造方法 |
CN110039204A (zh) * | 2018-01-16 | 2019-07-23 | 株式会社迪思科 | 被加工物的激光加工方法 |
CN110625275A (zh) * | 2018-06-20 | 2019-12-31 | 株式会社迪思科 | 激光加工装置 |
CN111295265A (zh) * | 2017-11-07 | 2020-06-16 | 浜松光子学株式会社 | 激光加工方法和激光加工装置 |
Families Citing this family (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20180141160A1 (en) * | 2016-11-21 | 2018-05-24 | General Electric Company | In-line laser scanner for controlled cooling rates of direct metal laser melting |
KR101902991B1 (ko) * | 2017-02-20 | 2018-10-02 | (주)큐엠씨 | 레이저 스크라이빙 장치 |
JP6620825B2 (ja) | 2017-02-27 | 2019-12-18 | 日亜化学工業株式会社 | 半導体素子の製造方法 |
JP6869623B2 (ja) * | 2017-10-26 | 2021-05-12 | 住友重機械工業株式会社 | レーザ加工装置 |
JP6925945B2 (ja) * | 2017-11-30 | 2021-08-25 | 株式会社ディスコ | ウエーハの加工方法 |
JP7339509B2 (ja) | 2019-08-02 | 2023-09-06 | 日亜化学工業株式会社 | 発光素子の製造方法 |
KR20210038335A (ko) | 2019-09-30 | 2021-04-07 | 니치아 카가쿠 고교 가부시키가이샤 | 발광 소자의 제조 방법 |
CN111055028A (zh) * | 2019-12-31 | 2020-04-24 | 武汉大学 | 基于等离子体的扩展可控裂纹的激光切割装置及方法 |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN102024886A (zh) * | 2009-09-14 | 2011-04-20 | 株式会社迪思科 | 晶片的加工方法 |
JP2013146747A (ja) * | 2012-01-17 | 2013-08-01 | Aisin Seiki Co Ltd | レーザによる割断方法、及びレーザ割断装置 |
Family Cites Families (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP4659301B2 (ja) * | 2001-09-12 | 2011-03-30 | 浜松ホトニクス株式会社 | レーザ加工方法 |
JP4684544B2 (ja) | 2003-09-26 | 2011-05-18 | 株式会社ディスコ | シリコンから形成された半導体ウエーハの分割方法及び装置 |
JP2006035710A (ja) * | 2004-07-28 | 2006-02-09 | Cyber Laser Kk | レーザによるガラス加工方法ならびに装置 |
JP2006108459A (ja) | 2004-10-07 | 2006-04-20 | Disco Abrasive Syst Ltd | シリコンウエーハのレーザー加工方法およびレーザー加工装置 |
JP4402708B2 (ja) | 2007-08-03 | 2010-01-20 | 浜松ホトニクス株式会社 | レーザ加工方法、レーザ加工装置及びその製造方法 |
JP2014241359A (ja) * | 2013-06-12 | 2014-12-25 | 三星ダイヤモンド工業株式会社 | 基板の分断方法 |
-
2015
- 2015-01-09 JP JP2015003531A patent/JP2016129203A/ja active Pending
- 2015-12-03 TW TW104140568A patent/TW201635357A/zh unknown
- 2015-12-22 KR KR1020150183853A patent/KR20160086267A/ko unknown
- 2015-12-29 CN CN201511004991.1A patent/CN105789124A/zh active Pending
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN102024886A (zh) * | 2009-09-14 | 2011-04-20 | 株式会社迪思科 | 晶片的加工方法 |
JP2013146747A (ja) * | 2012-01-17 | 2013-08-01 | Aisin Seiki Co Ltd | レーザによる割断方法、及びレーザ割断装置 |
Cited By (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN109524358A (zh) * | 2017-09-20 | 2019-03-26 | 东芝存储器株式会社 | 半导体装置及其制造方法 |
CN111295265A (zh) * | 2017-11-07 | 2020-06-16 | 浜松光子学株式会社 | 激光加工方法和激光加工装置 |
US11642743B2 (en) | 2017-11-07 | 2023-05-09 | Hamamatsu Photonics K.K. | Laser processing method, and laser processing device |
CN110039204A (zh) * | 2018-01-16 | 2019-07-23 | 株式会社迪思科 | 被加工物的激光加工方法 |
CN110039204B (zh) * | 2018-01-16 | 2022-09-16 | 株式会社迪思科 | 被加工物的激光加工方法 |
CN110625275A (zh) * | 2018-06-20 | 2019-12-31 | 株式会社迪思科 | 激光加工装置 |
Also Published As
Publication number | Publication date |
---|---|
TW201635357A (zh) | 2016-10-01 |
JP2016129203A (ja) | 2016-07-14 |
KR20160086267A (ko) | 2016-07-19 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
C06 | Publication | ||
PB01 | Publication | ||
SE01 | Entry into force of request for substantive examination | ||
SE01 | Entry into force of request for substantive examination | ||
WD01 | Invention patent application deemed withdrawn after publication |
Application publication date: 20160720 |
|
WD01 | Invention patent application deemed withdrawn after publication |