CN105738391A - X-ray diffraction device with magnetic analysis function - Google Patents
X-ray diffraction device with magnetic analysis function Download PDFInfo
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- CN105738391A CN105738391A CN201610133044.0A CN201610133044A CN105738391A CN 105738391 A CN105738391 A CN 105738391A CN 201610133044 A CN201610133044 A CN 201610133044A CN 105738391 A CN105738391 A CN 105738391A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R33/00—Arrangements or instruments for measuring magnetic variables
- G01R33/12—Measuring magnetic properties of articles or specimens of solids or fluids
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Abstract
The invention relates to an X-ray diffraction device with a magnetic analysis function. The X-ray diffraction device comprises a sample stage, an X-ray source, a detector and a magnetic field generator. A glass slide can be fixed onto the sample stage, and a sample is mounted on the glass slide; the X-ray source is used for illuminating the sample with X-rays; the detector is used for detecting the X-rays reflected by the sample; the magnetic field generator is used for generating magnetic fields and applying the magnetic fields to the sample. The X-ray diffraction device has the advantages that the X-ray diffraction device further has the certain magnetic analysis function besides traditional functions and accordingly can replace neutron diffraction devices to a certain degree.
Description
Technical field
Present invention relates in general to X-ray diffraction device, more specifically it relates to a kind of X-ray diffraction device with magnetic analysis function.
Background technology
Since last century the nineties, spintronics obtains significant progress, various new experimental phenomenas, new theory and new practical devices emerge in an endless stream, driven sensor, memorizer, replacement conventional semiconductor devices magnetic device (in other words, self-spining device, for instance spin transistor, spin logic device) etc. application and development.The development of spintronics has also started the research boom of magnetic Material Field.
X-ray diffraction device is to material composition and the very important equipment of one studied of atom level structure thereof, is one of the most frequently used equipment in investigation of materials field.Regrettably, traditional X-ray diffraction device does not have magnetic analysis function, it is impossible to the magnetic characteristic of research material.
The ultimate principle of neutron diffraction is similar to X-ray diffraction, therefore can also be used for the composition of research material and atom level structure, and compared with X ray, and neutron diffraction has higher sensitivity, resolution and penetrance.Neutron diffraction even can distinguish the different isotopes of identity element, and this is that X-ray diffraction can not be accomplished.Another important feature of neutron diffraction is that neutron has magnetic moment, therefore can be used for the magnetic structure of research material, and this is also that X-ray diffraction is irrealizable.But, produce neutron beam and be directed to use with particle accelerator to accelerate charged particle, then with charged particle bombardment target to obtain neutron.Relevant device (especially accelerator) is huge and complicated, which has limited widely using of neutron diffraction.
Therefore, it is desirable to be provided that a kind of X-ray diffraction device with magnetic analysis function.
Summary of the invention
The present invention one one exemplary embodiment provides a kind of X-ray diffraction device, including: sample stage, it is used for fixing microscope slide, described microscope slide is provided with sample；X-ray source, for X-ray irradiation to described sample；Detector, for detecting the X ray through the reflection of described sample or transmission；And magnetic field generator, for producing and applying magnetic field to described sample.
In some instances, described magnetic field generator is electric magnet.
In some instances, described electric magnet includes: magnet exciting coil；And it being arranged on the iron core in described magnet exciting coil, described iron core has the cartridge extended towards described sample.
In some instances, described cartridge can move to regulate the size in the magnetic field being applied to described sample toward and away from described sample.
In some instances, described X-ray diffraction device also includes: Magnetic Sensor, is arranged on described sample stage and near described sample, for sensing the magnetic field applied to described sample.
In some instances, described magnetic field generator includes the first electric magnet for applying the first magnetic field, and described first magnetic field is vertical or parallel to the principal plane that described sample is positioned at.
In some instances, described magnetic field generator also includes the second electric magnet for applying the second magnetic field, and described second magnetic field is perpendicular to described first magnetic field.
In some instances, described magnetic field generator also includes the 3rd electric magnet for applying the 3rd magnetic field, and described 3rd magnetic field is perpendicular to described first magnetic field and described second magnetic field.
In some instances, described X-ray diffraction device also includes: housing, is used for limiting sealing space, and described sample stage is arranged in described sealing space；Thermostat unit, for regulating the temperature in described sealing space；Temperature sensor, for sensing the temperature in described sealing space；And temperature controller, the operation of described thermostat unit is controlled for the temperature in the described sealing space that senses based on described temperature sensor.
In some instances, described microscope slide includes: body, it is formed groove and the sidewall around described groove, described temperature sensor is arranged in described groove, and it is wired to described temperature controller, being coated with Heat Conduction Material in described temperature sensor, described sample can be placed on described Heat Conduction Material.
In some instances, the upper surface of described Heat Conduction Material is lower than the upper surface of the sidewall around described groove or flush.
Except traditional function, described X-ray diffraction device can also realize certain magnetic analysis function, it is thus possible to replaces neutron diffraction equipment to use to a certain extent.
Accompanying drawing explanation
Fig. 1 illustrates the schematic diagram of the X-ray diffraction device according to the present invention one one exemplary embodiment.
Fig. 2 illustrates the schematic diagram of the X-ray diffraction device according to another one exemplary embodiment of the present invention.
Fig. 3 illustrates the schematic diagram of the X-ray diffraction device according to yet another exemplary embodiment of the present invention.
Fig. 4 illustrates the schematic diagram of the microscope slide of the X-ray diffraction device that can be used for Fig. 3.
Detailed description of the invention
The one exemplary embodiment of the present invention is described below with reference to accompanying drawings.In described one exemplary embodiment, give many specific detail.Should be understood that these specific detail are only used to those skilled in the art and fully disclose principles of the invention, not for restriction the scope of the present invention.
Fig. 1 illustrates the schematic diagram of the X-ray diffraction device 100 according to the present invention one one exemplary embodiment.As it is shown in figure 1, X-ray diffraction device 100 includes sample stage 110, sample 114 can be fixed on microscope slide 112, and microscope slide 112 can be placed on sample stage 110.
Sample stage 110 can be circular or square platform, it can be formed by the metal of such as rustless steel, copper etc or any other suitable material such as pottery etc., can being provided with such as chuck or deck on it, microscope slide 112 can lie low on sample stage 110 and be fixed by chuck or deck.It is arranged on sample stage 110 although Fig. 1 illustrates that microscope slide 112 lies low, but in further embodiments, microscope slide 112 can be vertically arranged on sample stage 110, for instance its one end is fixed on sample stage 110, when this structure is particularly suited for needing to carry out transmission-type x-ray diffraction experiment.Sample stage 110 can also be any other shape or structure, for instance its supporting structure that could be for supporting microscope slide 112.
Microscope slide 112 is used for installing sample 114.Such as, sample 114 can be installed on microscope slide 112 by operator on operating board, then again microscope slide 112 is shifted and is fixed on sample stage 110.Although name is called " microscope slide ", this is the those skilled in the art's usual appellations to it, it should be appreciated that microscope slide 112 can be formed by various suitable materials, for instance but it is not limited to glass, quartz, plastics, pottery, metal etc..The shape of microscope slide 112 also can be different according to its sample to be mounted.Such as, some microscope slides 112 can be rectangular tab shape, is used for installing solid bulk sample；Some microscope slides 112 can be the tabular with groove, for being installed in groove by powder sample, and can be flattened by powder.When needs install microscope slide 112 as previously mentioned vertically, it is also possible to glue, powder is fixed in a groove.Such as can on recess edge is dripped glue, glue can be inhaled in the powder in groove, thus fixing powder and don't destroy the flat surfaces of powder, smooth surface can be beneficial to incidence and the reflection of X ray.The specific means of these and other x-ray diffraction experiment is all well-known to those skilled in the art, does not describe in detail one by one herein.
X-ray diffraction device 100 could be included for launching the x-ray source 132 of X ray and for detecting the detector 134 of X ray.The X ray that x-ray source 132 is launched can collimated be irradiated on the sample 114 being positioned on sample platform 110, X ray reflects (such as through sample 114, as described in Figure 1) or after transmission (not shown), being detected by detector 134, the signal detected can be sent to control station (not shown) for processing or storage by detector 134.In certain embodiments, x-ray source 132 and detector 134 may be mounted on the track of sample stage 110 such that it is able to move around sample stage 110, change the incident angle of the X ray incided on sample 114.In certain embodiments, sample stage 110 itself is also rotatable.
X-ray diffraction device 100 can also include housing 102, it can limit a sealing space, sample stage 110 and microscope slide thereon 112 and sample 114, x-ray source 132, detector 134 all can be arranged in the sealing space that housing 102 limits, this can keep the cleaning of sample 114, will not be subject to the interference of the such as dust of the impurity in environment.In certain embodiments, X-ray diffraction device 100 can also include bleeding and aerating device (not shown), it can extract the air in the sealing space that housing 102 limits out to realize certain vacuum, or specific gas such as helium etc. can also be filled with, to realize specifically testing atmosphere.
X-ray diffraction device 100 can also include magnetic field generator 120, and it can produce and apply predetermined magnetic field to the sample 114 on sample stage 110.Magnetic field generator 120 can utilize various magnetic fields generating mode, for instance utilizes permanent magnet or electric magnet.In some embodiments of the invention, electric magnet is preferably as it can be advantageously controlled and regulate.
As shown in Figure 1, in certain embodiments, magnetic field generator 120 can include a pair magnet exciting coil 122 and 126 being arranged on sample stage 110 both sides, magnet exciting coil 122,126 is respectively provided with cored 124,128, iron core 124,128 is each with the cartridge extended towards sample stage 110, cartridge can have truncated cone shape such that it is able to produce intensity height and uniform magnetic field at sample stage place.In certain embodiments, iron core 124,128 is each fixing, it is possible to by regulating the size being regulated the magnetic field being applied to sample 114 by the electric current of magnet exciting coil 122,126.In further embodiments, at least one in iron core 124,128 can move towards or away from sample stage 110, is changed the size in the magnetic field being applied to sample 114 by the distance between change cartridge.It should be understood that, although figure 1 illustrates two magnet exciting coils 122,126, but magnetic field generator 120 can also only include a magnet exciting coil, yoke is through this magnet exciting coil and extends to sample stage 110 both sides thus on the sample 114 that is applied in magnetic field on sample stage 110.
It is understood that magnet exciting coil 122,126 operationally can produce certain heat.Sample 114 is produced uncertain impact by the heat produced in order to avoid magnet exciting coil, in the embodiment shown in fig. 1, preferably magnet exciting coil 122 and 126 is arranged on beyond housing 102, and iron core 124 and 128 (or its cartridge part) can extend across housing 102 and arrives near sample stage 110.In further embodiments, whole electric magnet (including magnet exciting coil) can also be all disposed within housing 102.
In the embodiment shown in fig. 1, magnetic field can be applied on sample 114 by magnetic field generator (in other words electric magnet) 120 along the direction vertical with the principal plane that sample 114 is positioned at.In contrast to this, in the X-ray diffraction device 200 shown in Fig. 2, magnetic field can be applied on sample 114 by magnetic field generator 220 along the direction parallel with the principal plane that sample 114 is positioned at.Other aspects of X-ray diffraction device 200 are same or like with the X-ray diffraction device 100 shown in Fig. 1, and indicate each element with same or similar accompanying drawing labelling, omit the repeated description to it herein.
Although in the X-ray diffraction device 100 and 200 shown in Fig. 1 and Fig. 2, all only employ an electric magnet and apply magnetic field along specific direction to sample 114, it is to be appreciated that multiple electric magnet can also be used in certain embodiments to apply magnetic field along multiple different directions to sample 114.Such as in certain embodiments, it is possible to use the first electric magnet 120 and the second electric magnet 220 come respectively along and the principal plane that is positioned at of sample 114 perpendicular and parallel direction of hanging down apply magnetic field to sample 114.In further embodiments, the direction that the 3rd electric magnet comes along the direction in the magnetic field applied with the first and second electric magnet 120,220 is all vertical can also be used to apply magnetic field to sample 114, that is, it is possible to apply magnetic field along X, Y perpendicular to one another and three directions of Z axis to sample 114.This is very favorable for the magnetic characteristic of study sample, because X-ray diffraction is usually used in analyzing the crystal structure of sample, and the crystal structure of sample is usually included in the lattice paprmeter on three-dimensional.Such as, by applying magnetic field to sample in a different direction individually or simultaneously, and apply the magnetic field of varying strength, it is possible to the study sample lattice variations when different magnetic field, and also the magnetic characteristic of the atomic level obtaining sample itself can be analyzed.As such, it is possible to partly substitute the function of neutron diffraction equipment.
Although it is not shown, it is also possible to the sample 114 on sample stage 110 is arranged around magnetic field sensor, magnetic field sensor can sense the magnetic field size applied along different directions (such as aforementioned X, Y and Z-direction), and sensing magnetic fields data can be sent collectively to control station (not shown) for processing or storage with the X ray diffracting data that detector 134 detects.
Fig. 3 illustrates the X-ray diffraction device 300 according to yet another exemplary embodiment of the present invention.In the X-ray diffraction device 300 shown in Fig. 3, the parts identical with the X-ray diffraction device 100 shown in Fig. 1, with identical accompanying drawing labelling instruction, omit the repeated description to it herein, and only describe different elements.
As it is shown on figure 3, X-ray diffraction device 300 also includes thermostat unit 310, its sealing space that can be such as limited with housing 102 by pipeline 312 is connected, such that it is able to regulate the temperature sealed in space.Although Fig. 3 illustrate only a pipeline 312, but can be connected to therebetween multiple pipeline, for instance two pipelines.Such as, thermostat unit 310 can be based on the thermostat unit of liquid helium, it passes into liquid helium with certain speed by pipeline 312 in sealing space, extract the gas sealed in space out also by another pipeline, thus regulating, within the scope of than room temperature lower temperature, the temperature sealed in space simultaneously；On the other hand, thermostat unit 310 can also pass into heated air in sealing space, thus regulating the temperature sealed in space in the temperature range higher than room temperature.
X-ray diffraction device 300 can also include temperature sensor 322, it can be arranged on to sense the temperature sealed in space near the sample 114 on sample stage 110, or is set directly in microscope slide 112 as described referring to Fig. 4 thus sensing the temperature of sample 114 itself as much as possible.The temperature data that temperature sensor 322 senses can send temperature controller 320 to, and temperature controller 320 can control the operation of thermostat unit 310 based on the temperature data that temperature sensor 322 senses.So, it is also possible to the measuring samples 114 various physical characteristics under condition of different temperatures.
Fig. 4 illustrates the schematic diagram of the microscope slide of the X-ray diffraction device that can be used for Fig. 3.As described in Figure 4, microscope slide 400 can include body 410, and body 410 could be formed with groove 412 and the sidewall 414 around groove 412.In certain embodiments, sidewall 414 can from four sides, three sides, two sides or even side around groove 412.Temperature sensor 416 can be arranged in groove 412, the wire 420,422 connecting temperature sensor can extend to beyond microscope slide 400 at the edge through sidewall 414 or from depression 412, and can be connected to the wire being connected with temperature controller 320 (Fig. 3) by such as union joint.Can covering temperature sensor 416 with Heat Conduction Material 418, Heat Conduction Material 418 can be such as Gold plated Layer, and sample 114 can be placed on the upper surface of Heat Conduction Material 418, thus temperature sensor 416 can sense the temperature of sample 114 observantly.Heat Conduction Material 418 can have smooth upper surface for disposing sample 114.The upper surface of Heat Conduction Material 418 can higher or lower than the upper surface of sidewall 414, or flush.In certain embodiments, sidewall 414 can from four sides around groove 412, and the upper surface of Heat Conduction Material 418 can lower than the upper surface of sidewall 414, such that it is able to easily powder sample is placed in the groove 412 on Heat Conduction Material 418.
Although describing the present invention above with reference to one exemplary embodiment, but the invention is not restricted to these specific embodiments.Those skilled in the art would readily recognize that upon reading this disclosure, when without departing from the scope of the present invention and thought, it is possible to carry out the variations and modifications in form and details.The scope of the present invention is only defined by claims and equivalent thereof.
Claims (10)
1. an X-ray diffraction device, including:
Sample stage, it is used for fix microscope slide, described microscope slide is provided with sample；
X-ray source, for X-ray irradiation to described sample；
Detector, for detecting the X ray through the reflection of described sample or transmission；And
Magnetic field generator, for producing and applying magnetic field to described sample.
2. X-ray diffraction device as claimed in claim 1, wherein, described magnetic field generator is electric magnet, and described electric magnet includes:
Magnet exciting coil；And
Being arranged on the iron core in described magnet exciting coil, described iron core has the cartridge extended towards described sample.
3. X-ray diffraction device as claimed in claim 2, wherein, described cartridge can move to regulate the size in the magnetic field being applied to described sample toward and away from described sample.
4. X-ray diffraction device as claimed in claim 1, also includes:
Magnetic Sensor, is arranged on described sample stage and near described sample, for sensing the magnetic field applied to described sample.
5. X-ray diffraction device as claimed in claim 1, wherein, described magnetic field generator includes the first electric magnet for applying the first magnetic field, and described first magnetic field is vertical or parallel to the principal plane that described sample is positioned at.
6. X-ray diffraction device as claimed in claim 5, wherein, described magnetic field generator also includes the second electric magnet for applying the second magnetic field, and described second magnetic field is perpendicular to described first magnetic field.
7. X-ray diffraction device as claimed in claim 6, wherein, described magnetic field generator also includes the 3rd electric magnet for applying the 3rd magnetic field, and described 3rd magnetic field is perpendicular to described first magnetic field and described second magnetic field.
8. X-ray diffraction device as claimed in claim 1, also includes:
Housing, is used for limiting sealing space, and described sample stage is arranged in described sealing space；
Thermostat unit, for regulating the temperature in described sealing space；
Temperature sensor, for sensing the temperature in described sealing space；And
Temperature controller, controls the operation of described thermostat unit for the temperature in the described sealing space that senses based on described temperature sensor.
9. X-ray diffraction device as claimed in claim 8, wherein, described microscope slide includes:
Body, being formed with groove and the sidewall around described groove on it, described temperature sensor is arranged in described groove, and is wired to described temperature controller, being coated with Heat Conduction Material in described temperature sensor, described sample can be placed on described Heat Conduction Material.
10. X-ray diffraction device as claimed in claim 9, wherein, the upper surface of described Heat Conduction Material is lower than the upper surface of the sidewall around described groove or flush.
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| CN201610133044.0A CN105738391A (en) | 2016-03-09 | 2016-03-09 | X-ray diffraction device with magnetic analysis function |
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| CN201610133044.0A CN105738391A (en) | 2016-03-09 | 2016-03-09 | X-ray diffraction device with magnetic analysis function |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
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| CN110501362A (en) * | 2019-07-31 | 2019-11-26 | 中国科学院合肥物质科学研究院 | The transmitting device of X-ray under a kind of high-intensity magnetic field |
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