CN105676109B - A kind of motherboard test method and equipment - Google Patents

A kind of motherboard test method and equipment Download PDF

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Publication number
CN105676109B
CN105676109B CN201610012934.6A CN201610012934A CN105676109B CN 105676109 B CN105676109 B CN 105676109B CN 201610012934 A CN201610012934 A CN 201610012934A CN 105676109 B CN105676109 B CN 105676109B
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Prior art keywords
mainboard
measured
signal
test equipment
channel
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CN105676109A (en
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叶阳
胡海石
张明龙
王永博
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Hisense Visual Technology Co Ltd
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Qingdao Hisense Electronics Co Ltd
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Priority to CN201610012934.6A priority Critical patent/CN105676109B/en
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/2806Apparatus therefor, e.g. test stations, drivers, analysers, conveyors
    • GPHYSICS
    • G05CONTROLLING; REGULATING
    • G05BCONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B19/00Programme-control systems
    • G05B19/02Programme-control systems electric
    • G05B19/04Programme control other than numerical control, i.e. in sequence controllers or logic controllers

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  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Automation & Control Theory (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)

Abstract

The embodiment of the present invention provides a kind of motherboard test method and equipment, is related to test macro, can be realized automatic detection mainboard, improves detection efficiency and accuracy rate, and then ensure that mainboard quality.The mainboard test equipment includes: automatic switching component and the detection circuit that connect with automatic switching component;Wherein, automatic switching component, for when mainboard test equipment detects mainboard to be measured access, mainboard to be measured is driven to be communicated with mainboard test equipment, or carry out data transmission with mainboard test equipment, it for each channel of mainboard to be measured, generates the first signal and transmits the first signal via mainboard to be measured, obtain the second signal of mainboard output to be measured;Detection circuit, for, in each channel of mainboard to be measured the first signal generated and the second signal got, determining mainboard to be measured with the presence or absence of failure according to automatic switching component.

Description

A kind of motherboard test method and equipment
Technical field
The present invention relates to test macro more particularly to a kind of motherboard test methods and equipment.
Background technique
With the continuous development of technology, intelligent terminal using more and more, the function that intelligent terminal can be realized also is got over Come abundanter.Therewith, the quantity of the mainboard of intelligent terminal includes new function module and connecting terminal is also more and more.
The mainboard of intelligent terminal has to pass through various functional tests before producing.Currently, each equipment manufacturer is to intelligence The test of the mainboard of terminal mainly operates dependence test fixture by operator to detect each test function of the mainboard, and Determine the mainboard of intelligent terminal with the presence or absence of failure according to each test function.
Above-mentioned test method depends not only upon the qualification and technical skills of operator, but also depends on operator The current working condition of member, it is low so as to cause testing efficiency, and not can guarantee the quality of the mainboard of intelligent terminal.For example, if behaviour Making in a state of fatigue, lack of skill of personnel etc. all would potentially result in that testing efficiency is low, error in judgement, and then influence entire The product quality of intelligent terminal.
Summary of the invention
The embodiment of the present invention provides a kind of motherboard test method and equipment, can be realized automatic detection mainboard, improves Detection efficiency and accuracy rate, and then ensure that mainboard quality.
In order to achieve the above objectives, the embodiment of the present invention adopts the following technical scheme that
The embodiment of the present invention provides a kind of mainboard test equipment, including automatic switching component and with the automatic switching component The detection circuit of connection;Wherein,
The automatic switching component, for when the mainboard test equipment detects mainboard to be measured access, described in driving Mainboard to be measured is communicated with the mainboard test equipment, or is carried out data transmission with the mainboard test equipment, for institute Each channel of mainboard to be measured is stated, the first signal is generated and transmits first signal via the mainboard to be measured, is obtained Take the second signal of the mainboard output to be measured;
The detection circuit, for being generated according to the automatic switching component in each channel of the mainboard to be measured One signal and the second signal got determine the mainboard to be measured with the presence or absence of failure.
It in mainboard test equipment include automatic switching component and detection circuit in the embodiment of the present invention.Automatic switching component It can be automatically performed the detection to each channel of mainboard to be measured, examined when mainboard test equipment detects mainboard to be measured access Slowdown monitoring circuit is capable of detecting when each channel with the presence or absence of failure.Mainboard test equipment provided in an embodiment of the present invention in this way can be certainly Test of the row switching to mainboard, and the test that each mainboard of board test apparatus is become owner of in docking is voluntarily completed, realize automation Mainboard is detected, it is high compared with the testing efficiency of operator's manual test mainboard, and test accuracy rate is improved, and then ensure that mainboard Quality.
Specifically, the automatic switching component includes control circuit, the signal generator being connect with the control circuit, with The electrical interface that the control circuit and the signal generator are all connected with;Wherein,
The control circuit, for generating pumping signal when the mainboard test equipment detects mainboard to be measured access, And the pumping signal is sent to the electrical interface, the pumping signal includes the mark of the mainboard to be measured, and is used for Control signal is sequentially generated, and sends the control signal to the signal generator and the mainboard to be measured, the control letter Number include channel to be measured mark;
The signal generator, for receiving the control signal, according to channel to be measured described in the control signal Mark, by the channel of the signal generator be switched to the channel to be measured mark instruction channel to be measured, and it is described to It surveys in channel and generates the first signal, send first signal to the mainboard to be measured and the detection circuit;
The electrical interface, for receiving the pumping signal, according to the pumping signal drive the mainboard to be measured with The mainboard test equipment is communicated, or is carried out data transmission with the mainboard test equipment, so that the master to be measured Plate receives the control signal, and the channel of the mainboard to be measured is switched to the channel to be measured.
Further, the mainboard test equipment further includes display;
The display is screen and/or indicator light, and the display is used to show the detection circuit determines first Testing result, first testing result are used to indicate the mainboard to be measured with the presence or absence of failure.
Specifically, the detection circuit, specifically for according to the automatic switching component in each of described mainboard to be measured First signal in channel and the second signal got determine that each channel of the mainboard to be measured whether there is failure, and root Determine the mainboard to be measured with the presence or absence of failure according to the testing result in each channel.
Specifically, for each channel of the mainboard to be measured, the detection circuit is specifically used for judging second letter Number whether meet preset condition, the preset condition is the second signal second signal identical or described with first signal Attribute value and first signal attribute value difference be less than preset threshold, attribute value be signal amplitude or phase;If The second signal meets the preset condition, it is determined that failure is not present in the channel;If the second signal is unsatisfactory for institute State preset condition, it is determined that there are failures in the channel.
Further, if the display is the screen, the display is also used to show the first of each channel Signal and second signal.
Another embodiment of the present invention provides a kind of motherboard test method, mainboard test equipment detects mainboard access to be measured When, n channel of mainboard to be measured is detected with the presence or absence of failure, and record n testing result, wherein n >=1;The mainboard test Equipment determines the mainboard to be measured with the presence or absence of failure according to the n testing result;The mainboard test equipment display determines As a result, the definitive result is used to indicate the mainboard to be measured with the presence or absence of failure.
Mainboard test equipment detects the n of mainboard to be measured when detecting mainboard to be measured access first in the embodiment of the present invention (n >=1) a channel whether there is failure, and record n testing result, then, mainboard test equipment according to n testing result, Mainboard to be measured is determined with the presence or absence of failure, finally, mainboard test equipment, which will be used to indicate mainboard to be measured, whether there is failure really Determine as the result is shown.With this solution, mainboard test equipment can voluntarily switch the test to mainboard, and voluntarily complete docking and become owner of The test of each mainboard of board test apparatus, realizes automatic detection mainboard, compared with the test of operator's manual test mainboard It is high-efficient, and test accuracy rate is improved, and then ensure that mainboard quality.
Wherein, for the first passage in the n channel, whether the mainboard test equipment detects the first passage There are failures, and record the first testing result, and first testing result is for identifying the first passage with the presence or absence of failure.
Specifically, the mainboard test equipment, which detects the first passage, whether there is failure, specifically include:
A, the mainboard test equipment generates the control signal of the mark comprising the first passage, and sends the control Signal is to the mainboard to be measured, so that mark leading to the to be measured mainboard of the mainboard to be measured according to the first passage Road switches first passage, wherein the mark of the first passage indicates first passage;
B, the mainboard test equipment sends the first signal to the mainboard to be measured, so that first signal is via institute First passage transmission is stated, and exports second signal;
C, the mainboard test equipment judges whether the second signal of the mainboard output to be measured meets preset condition, described Preset condition is the attribute value and first letter of the second signal second signal identical or described with first signal Number attribute value difference be less than preset threshold, attribute value be signal amplitude or phase;
If D, the second signal meets the preset condition, the mainboard test equipment determine the first passage without Failure;
If E, the second signal is unsatisfactory for the preset condition, B and C are repeated;
If F, repeating m E, the mainboard test equipment determines that the first passage breaks down, wherein m >= 1。
Further, before the mainboard test equipment sends the first signal to the mainboard to be measured, the mainboard test Method further include:
The channel of itself is switched to the first passage by the mainboard test equipment, and generates institute in the first passage State the first signal.
Specifically, the mainboard test equipment determines the mainboard to be measured with the presence or absence of event according to the n testing result Barrier, comprising:
If first testing result indicates the first passage there are failure, described in the mainboard test equipment determines There are failures for mainboard to be measured.
Detailed description of the invention
In order to more clearly explain the embodiment of the invention or the technical proposal in the existing technology, to embodiment or will show below There is attached drawing needed in technical description to be briefly described, it should be apparent that, the accompanying drawings in the following description is only this Some embodiments of invention for those of ordinary skill in the art without creative efforts, can be with It obtains other drawings based on these drawings.
Fig. 1 is the structural schematic diagram one of mainboard test equipment provided in an embodiment of the present invention;
Fig. 2 is the structural schematic diagram two of mainboard test equipment provided in an embodiment of the present invention;
Fig. 3 is the flow diagram of motherboard test method provided in an embodiment of the present invention;
Fig. 4 is the flow diagram of test first passage provided in an embodiment of the present invention.
Specific embodiment
Following will be combined with the drawings in the embodiments of the present invention, and technical solution in the embodiment of the present invention carries out clear, complete Site preparation description, it is clear that described embodiments are only a part of the embodiments of the present invention, instead of all the embodiments.It is based on Embodiment in the present invention, it is obtained by those of ordinary skill in the art without making creative efforts every other Embodiment shall fall within the protection scope of the present invention.
In addition, the terms "and/or", only a kind of incidence relation for describing affiliated partner, indicates may exist Three kinds of relationships, for example, A and/or B, can indicate: individualism A exists simultaneously A and B, these three situations of individualism B.Separately Outside, character "/" herein typicallys represent the relationship that forward-backward correlation object is a kind of "or".
When the embodiment of the present invention refers to the ordinal numbers such as " first ", " second ", unless based on context its express really it is suitable The meaning of sequence, it is appreciated that being only to distinguish to be used.
Embodiment one
The embodiment of the present invention provides a kind of mainboard test equipment, as shown in Figure 1, the mainboard test equipment may include automatic Changeover module 10, detection circuit 11 and system bus 12.
Wherein, it is connected between automatic switching component 10 and detection circuit 11 by system bus 12 and completes mutual lead to Letter.
Specifically, automatic switching component 10 is used to drive to be measured when mainboard test equipment detects mainboard to be measured access Mainboard is communicated with mainboard test equipment, or is carried out data transmission with mainboard test equipment, for each of mainboard to be measured Channel generates the first signal and transmits the first signal via mainboard to be measured, obtains the second signal of mainboard output to be measured.
It is understood that mainboard test equipment drives master to be measured automatically when mainboard to be measured accesses mainboard test equipment Plate is communicated or is carried out data transmission with mainboard test equipment.Therefore, if multiple mainboards to be measured access mainboard test equipment When, mainboard test equipment can successively drive each mainboard to be measured to test with mainboard according to the electrifying timing sequence of each mainboard to be measured and set It is standby to be communicated or carried out data transmission.
In practical application, each mainboard to be measured includes at least one channel, for each channel, mainboard test equipment The first signal is generated, and the first signal is sent to mainboard to be measured, in order to which the first signal is transmitted via mainboard to be measured, and it is defeated Second signal out.
Channel in the embodiment of the present invention is sound channel, VGA (Video Graphics Array, Video Graphics Array) Channel, the channel YPbPr, HDMI (High Definition Multimedia Interface, high-definition multimedia interface) Channel, (Audio Video, the audio frequency and video) channel AV or TV (Television, TV) channel.
It should be noted that the channel in the embodiment of the present invention be not limited to it is above-mentioned several.
Specifically, as shown in Figure 1, automatic switching component 10 includes that control circuit 101, signal generator 102 and electronics connect Mouth 103.
Wherein, signal generator 102 and electrical interface 103 are connect with control circuit 101, and 102 He of signal generator Electrical interface 103 is connect with detection circuit 11.
Control circuit 101, for generating pumping signal, concurrently when mainboard test equipment detects mainboard to be measured access Send pumping signal to electrical interface 103, pumping signal includes the mark of mainboard to be measured, and for sequentially generating control signal, And signal generator 102 and mainboard to be measured are sent a control signal to, control signal includes the mark in channel to be measured.
Optionally, the mark in the channel to be measured in the embodiment of the present invention can be the code value in channel to be measured.
Specifically, control circuit 101, for generating and carrying channel to be measured in the preset time period for generating pumping signal Code value control signal, the control signal be used to indicate signal generator 102 and mainboard to be measured according to code value switch it is respective Channel.
Optionally, the control circuit 101 in the embodiment of the present invention may include the single-chip microcontroller for coding, control circuit 101 in the preset time period for generating pumping signal, generates infrared encoded signal, and single-chip microcontroller carries out the infrared encoded signal NEC coding generates NEC code value, or carries out RC5 coding and generate RC5 code value.
Signal generator 102, according to the mark in channel to be measured in control signal, signal is sent out for receiving control signal The channel of raw device 102 is switched to the channel to be measured of the mark instruction in channel to be measured, and the first signal is generated in channel to be measured, sends out Send the first signal to mainboard to be measured and detection circuit 11.
It is easily understood that in the embodiment of the present invention mainboard test equipment according to detection the first signal and the first signal via The second signal exported after mainboard to be measured transmission determines mainboard to be measured with the presence or absence of failure, and mainboard to be measured includes at least one A channel, therefore, it is necessary to the channel in the channel of mainboard to be measured and signal generator is switched to identical channel.
Electrical interface 103, for receiving pumping signal, according to pumping signal drive mainboard to be measured and mainboard test equipment into Row communication, or carries out data transmission with mainboard test equipment, so that mainboard to be measured receives control signal, and by mainboard to be measured Channel be switched to channel to be measured.
Wherein, the electrical interface 102 in the embodiment of the present invention is for carrying or connecting mainboard to be measured, the embodiment of the present invention In electrical interface can carry or connect at least one mainboard to be measured.
Specifically, if at least two mainboards to be measured access mainboard test equipment, the interface of providing loans in the embodiment of the present invention 102 may include relay, and the mark for the mainboard to be measured that electrical interface 102 includes according to control signal is chosen by relay Mainboard to be measured.
The detection circuit, for what is generated according to the automatic switching component 10 in each channel of the mainboard to be measured First signal and the second signal got determine the mainboard to be measured with the presence or absence of failure.
Further, as shown in Fig. 2, mainboard test equipment further includes the display 12 connecting with detection circuit 11.
Specifically, the display 12 is screen and/or indicator light, the display 12 is for showing the detection circuit 11 the first testing results determined, first testing result are used to indicate the mainboard to be measured with the presence or absence of failure.
The detection circuit 11, specifically for according to the automatic switching component 10 in each channel of the mainboard to be measured The first signal and the second signal that gets, determine each channel of the mainboard to be measured with the presence or absence of failure, and according to every The testing result in a channel determines the mainboard to be measured with the presence or absence of failure.
Specifically, for each channel of the mainboard to be measured, the detection circuit 11 is specifically used for judging described second Whether signal meets preset condition, and the preset condition is that second signal is identical as first signal or described second believes Number attribute value and first signal attribute value difference be less than preset threshold, attribute value be signal amplitude or phase; If the second signal meets the preset condition, it is determined that failure is not present in the channel;If the second signal is unsatisfactory for The preset condition, it is determined that there are failures in the channel.
Wherein, the first signal in the embodiment of the present invention can be audio signal, or picture signal, the present invention are real It applies example and this is not especially limited.Correspondingly, second signal is also audio signal if the first signal is audio signal.If first Signal is picture signal, and second signal is also picture signal.
Optionally, for audio signal, detection circuit can detecte the attribute value of signal.For picture signal, detection electricity Road can detecte the color of signal.
Specifically, detection circuit 11 successively detects each channel of mainboard to be measured with the presence or absence of failure, then according to each Testing result determines the mainboard to be measured with the presence or absence of failure.
If the display is the screen, screen is displayed for first signal and the second letter in each channel Number, i.e., more direct testing result is shown, for administrator determine the mainboard to be measured failure occur where.
If display is indicator light, after detection circuit 11 determines mainboard to be measured with the presence or absence of failure, knot will test Fruit shows.
Optionally, indicator light colors are red, and representing mainboard to be measured, there are failures.Indicator light colors be green, represent to It surveys mainboard and failure is not present.
It is understood that mainboard test equipment provided in an embodiment of the present invention can also include memory (in attached drawing It is not shown), which can mainly include storing program area and storage data area, wherein storing program area can store operation system Application program needed for system, at least one function (for example sending message function) etc.;Storage data area can store each channel Testing result etc..
It in mainboard test equipment include automatic switching component and detection circuit in the embodiment of the present invention.Automatic switching component It can be automatically performed the detection to each channel of mainboard to be measured, examined when mainboard test equipment detects mainboard to be measured access Slowdown monitoring circuit is capable of detecting when each channel with the presence or absence of failure.Mainboard test equipment provided in an embodiment of the present invention in this way can be certainly Test of the row switching to mainboard, and the test that each mainboard of board test apparatus is become owner of in docking is voluntarily completed, realize automation Mainboard is detected, it is high compared with the testing efficiency of operator's manual test mainboard, and test accuracy rate is improved, and then ensure that mainboard Quality.
Embodiment two
The present invention provides a kind of motherboard test method, and executing subject is main board test apparatus, and the mainboard test equipment is primary At least one mainboard to be measured can be tested, wherein the method that mainboard test equipment tests each mainboard to be measured is identical, therefore, The embodiment of the present invention is only described in detail so that mainboard test equipment tests one of them mainboard to be measured as an example.
The embodiment of the present invention provides a kind of motherboard test method, as shown in figure 3, this method comprises:
When S101, mainboard test equipment detect mainboard to be measured access, n channel of mainboard to be measured is detected with the presence or absence of event Barrier, and record n testing result, wherein n >=1.
Wherein, the channel in the embodiment of the present invention can be sound channel, the channel VGA, the channel YPbPr, the channel HDMI, AV Channel or the channel TV, the present invention is not especially limit this.
In practical application, mainboard to be measured includes at least one channel.For each mainboard to be measured, mainboard test equipment is being surveyed It when examination, needs to test each channel of the mainboard to be measured, failure whether there is with each channel of determination, and then according to all logical The test result in road determines the mainboard to be measured with the presence or absence of failure.
Specifically, mainboard test equipment drives mainboard to be measured automatically when mainboard test equipment detects mainboard to be measured access It is communicated or is carried out data transmission with mainboard test equipment.Therefore, if multiple mainboards to be measured access mainboard test equipment, Mainboard test equipment can successively drive each mainboard to be measured and mainboard test equipment according to the electrifying timing sequence of each mainboard to be measured It is communicated or is carried out data transmission.
For each mainboard to be measured, mainboard test equipment detects n (n >=1) a channel of the mainboard to be measured with the presence or absence of event Barrier, and record n testing result.
For the first passage in n channel, mainboard test equipment, which detects first passage, whether there is failure, and record the One channel whether there is the first testing result of failure, wherein first passage is any one in n channel.
Mainboard test equipment detection first passage is explained below with the presence or absence of the method for failure, and details are not described herein again.
S102, mainboard test equipment determine mainboard to be measured with the presence or absence of failure according to n testing result.
After mainboard test equipment detects in the n channel to mainboard to be measured, mainboard test equipment is tied according to n detection Fruit determines mainboard to be measured with the presence or absence of failure.
It is deposited it is understood that being used to indicate its corresponding channel simply by the presence of a testing result in n testing result In failure, just illustrate that mainboard to be measured then has failure.If n testing result indicates that there is no failures, mainboard to be measured is without reason Barrier.
Specifically, mainboard test equipment determines to be measured if the first testing result is used to indicate first passage there are failure There are failures for mainboard.
S103, mainboard test equipment show definitive result, wherein definitive result is used to indicate mainboard to be measured with the presence or absence of event Barrier.
Mainboard test equipment shows definitive result after mainboard to be measured is with the presence or absence of failure.
Specifically, mainboard test equipment can show definitive result by indicator light.For example, if mainboard test equipment is true There are failures for fixed mainboard to be measured, then the indicator light of mainboard test equipment is displayed in red.
Further, mainboard test equipment can also show definitive result by screen.
Specifically, screen shows the signal that the signal for inputting mainboard to be measured and mainboard to be measured export, so that mainboard The administrator of test equipment can directly know that failure occurs in which channel of mainboard to be measured by watching screen.
Specifically, as shown in figure 4, mainboard test equipment detects whether there is event for the first passage in n channel Barrier, and the method for recording the first testing result are as follows:
S201, mainboard test equipment generate comprising first passage mark control signal, and send a control signal to Mainboard is surveyed, so that the channel of mainboard to be measured is switched first passage according to control signal by mainboard to be measured.
Wherein, the mark of first passage indicates first passage.
S202, mainboard test equipment send the first signal to mainboard to be measured, so that the first signal is passed via first passage It is defeated, and export second signal.
S203, mainboard test equipment judge whether the second signal of mainboard output to be measured meets preset condition.
Wherein, preset condition is that second signal is identical as the first signal or the attribute value of second signal and the first signal The difference of attribute value is less than preset threshold, and attribute value is the amplitude or phase of signal.
If S204, second signal meet preset condition, mainboard test equipment determines first passage fault-free.
If S205, second signal are unsatisfactory for preset condition, S202 and S203 are repeated, if repeating m S202 After S203, second signal still not satisfies preset condition, and mainboard test equipment then determines that first passage breaks down, wherein m ≥1。
Since mainboard to be measured includes n channel, mainboard test equipment is in the first passage for detecting mainboard to be measured It is no there are when failure, need mainboard to be measured that its channel is switched to first passage first.
Specifically, mainboard test equipment sends a control signal to mainboard to be measured, so that mainboard to be measured is believed according to the control Number its channel is switched to first passage.
Optionally, the control signal in the embodiment of the present invention is digital signal.
After its channel is switched to first passage by mainboard to be measured, mainboard test equipment sends the first signal to master to be measured Plate, so that the first signal is transmitted via the first passage of mainboard to be measured.
Wherein, the first signal is that the channel of itself is switched to after first passage by main board test apparatus according to control signal The signal of generation.
It is easily understood that needing to guarantee the channel of itself when mainboard test equipment detects the first passage of mainboard to be measured It is identical as first passage.In this way, the first signal will not have greatly changed when the first signal is transmitted via first passage.
Specifically, mainboard test equipment also includes at least one channel, and at least one channel of mainboard test equipment It is identical as n channel of mainboard to be measured.In this way, mainboard test equipment can complete the detection to n channel of mainboard to be measured.
Further, for mainboard test equipment after sending the first signal to mainboard to be measured, the first signal can be via master to be measured The first passage of plate transmits, and mainboard to be measured exports second signal after responding to the first signal, at this point, mainboard test equipment utilizes the Binary signal determines the first passage with the presence or absence of failure.
Specifically, mainboard test equipment judges whether the second signal meets preset condition, wherein preset condition second Signal is identical as the first signal, alternatively, the difference of the attribute value of the attribute value of second signal and the first signal is less than preset threshold, The attribute value of signal is the amplitude or phase of signal.
Signal in the embodiment of the present invention can be audio signal, or picture signal, the embodiment of the present invention is to this It is not especially limited.
Illustratively, if the first signal is the first picture signal, second signal is the second picture signal, then mainboard test is set The standby color of image that may determine that predeterminated position in the color of image of predeterminated position and the first picture signal in the second picture signal It is whether identical.If the first signal is the first audio signal, second signal is second sound signal, then mainboard test equipment can be sentenced The difference of the amplitude of the amplitude and the first audio signal of disconnected second sound signal is less than preset threshold.
Specifically, mainboard test equipment determines first passage fault-free if second signal meets preset condition.If second Signal is unsatisfactory for preset condition, then repeats S202 and S203, if after repeating m S202 and S203, second signal is still It is so unsatisfactory for preset condition, mainboard test equipment then determines that first passage breaks down, wherein m >=1.
It is understood that judge by accident in order to prevent, mainboard test equipment when determining that second signal is unsatisfactory for preset condition, The first passage of mainboard to be measured is tested in repetition.As long as mainboard test equipment once determines second signal in test process Meet preset condition, that is, can determine first passage fault-free.
Mainboard test equipment successively detects n channel of mainboard to be measured using the above method, and whether records each channel There are failures.
Mainboard test equipment detects the n of mainboard to be measured when detecting mainboard to be measured access first in the embodiment of the present invention (n >=1) a channel whether there is failure, and record n testing result, then, mainboard test equipment according to n testing result, Mainboard to be measured is determined with the presence or absence of failure, finally, mainboard test equipment, which will be used to indicate mainboard to be measured, whether there is failure really Determine as the result is shown.With this solution, mainboard test equipment can voluntarily switch the test to mainboard, and voluntarily complete docking and become owner of The test of each mainboard of board test apparatus, realizes automatic detection mainboard, compared with the test of operator's manual test mainboard It is high-efficient, and test accuracy rate is improved, and then ensure that mainboard quality.
It is apparent to those skilled in the art that for convenience and simplicity of description, only with above-mentioned each function The division progress of module can according to need and for example, in practical application by above-mentioned function distribution by different function moulds Block is completed, i.e., the internal structure of device is divided into different functional modules, to complete all or part of function described above Energy.The specific work process of the system, apparatus, and unit of foregoing description, can be with reference to corresponding in preceding method embodiment Journey, details are not described herein.
In several embodiments provided herein, it should be understood that disclosed system, device and method can be with It realizes by another way.For example, the apparatus embodiments described above are merely exemplary, for example, the module or The division of unit, only a kind of logical function partition, there may be another division manner in actual implementation, such as multiple units Or component can be combined or can be integrated into another system, or some features can be ignored or not executed.Another point, institute Display or the mutual coupling, direct-coupling or communication connection discussed can be through some interfaces, device or unit Indirect coupling or communication connection can be electrical property, mechanical or other forms.
The above description is merely a specific embodiment, but scope of protection of the present invention is not limited thereto, any Those familiar with the art in the technical scope disclosed by the present invention, can easily think of the change or the replacement, and should all contain Lid is within protection scope of the present invention.Therefore, protection scope of the present invention should be based on the protection scope of the described claims.

Claims (9)

1. a kind of mainboard test equipment, which is characterized in that connect including automatic switching component and with the automatic switching component Detection circuit;Wherein,
The automatic switching component, for driving described to be measured when the mainboard test equipment detects mainboard to be measured access Mainboard is communicated with the mainboard test equipment, or is carried out data transmission with the mainboard test equipment, for it is described to Each channel of mainboard is surveyed, the first signal is generated and transmits first signal via the mainboard to be measured, obtains institute The second signal for stating mainboard output to be measured, including control circuit:
The control circuit, for generating pumping signal, concurrently when the mainboard test equipment detects mainboard to be measured access Send the pumping signal to electrical interface, the pumping signal includes the mark of the mainboard to be measured, and for sequentially generating Control signal, and send the control signal to the signal generator and the mainboard to be measured, the control signal comprising to Survey the mark in channel;
The detection circuit, the first letter for being generated according to the automatic switching component in each channel of the mainboard to be measured Number and the second signal that gets, determine the mainboard to be measured with the presence or absence of failure;
The automatic switching component includes the electrical interface, and the electrical interface carries or connect at least one described master to be measured Plate, the electrical interface choose the mainboard to be measured by relay.
2. mainboard test equipment according to claim 1, which is characterized in that the automatic switching component includes and the control The signal generator of circuit connection processed, the electrical interface being all connected with the control circuit and the signal generator, the letter Number generator and the electrical interface are connect with the detection circuit;Wherein,
The signal generator, for receiving the control signal, according to the mark in channel to be measured described in the control signal, The channel of the signal generator is switched to the channel to be measured of the mark instruction in the channel to be measured, and in the channel to be measured The first signal of middle generation sends first signal to the mainboard to be measured and the detection circuit;
The electrical interface, for receiving the pumping signal, according to the pumping signal drive the mainboard to be measured with it is described Mainboard test equipment is communicated, or is carried out data transmission with the mainboard test equipment, so that the mainboard to be measured connects The control signal is received, and the channel of the mainboard to be measured is switched to the channel to be measured.
3. mainboard test equipment according to claim 1 or 2, which is characterized in that the mainboard test equipment further include with The display of the detection circuit connection;
The display is screen and/or indicator light, and the display is used to show the first detection that the detection circuit determines As a result, first testing result is used to indicate the mainboard to be measured with the presence or absence of failure.
4. mainboard test equipment according to claim 3, which is characterized in that
The detection circuit, specifically for the first letter according to the automatic switching component in each channel of the mainboard to be measured Number and the second signal that gets, determine each channel of the mainboard to be measured with the presence or absence of failure, and according to each channel Testing result determines the mainboard to be measured with the presence or absence of failure.
5. mainboard test equipment according to claim 4, which is characterized in that
For each channel of the mainboard to be measured, the detection circuit, specifically for judging whether the second signal meets Preset condition, the preset condition be the second signal second signal identical or described with first signal attribute value and The difference of the attribute value of first signal is less than preset threshold, and attribute value is the amplitude or phase of signal;If second letter Number meet the preset condition, it is determined that failure is not present in the channel;If the second signal is unsatisfactory for the preset condition, Then determine that there are failures in the channel.
6. mainboard test equipment according to claim 5, which is characterized in that
If the display is the screen, the display is also used to show first signal and the second letter in each channel Number.
7. a kind of motherboard test method characterized by comprising
Mainboard test equipment chooses mainboard to be measured by relay;
When the mainboard test equipment detects the mainboard to be measured access, whether n channel for detecting the mainboard to be measured is deposited In failure, and record n testing result, wherein n >=1;
According to motherboard test method described above, which is characterized in that for the first passage in the n channel, the master Board test apparatus, which detects the first passage, whether there is failure, and record the first testing result, and first testing result is used It whether there is failure in identifying the first passage;
The mainboard test equipment, which detects the first passage, whether there is failure, specifically include:
A, the mainboard test equipment generates the control signal of the mark comprising the first passage, and sends the control signal To the mainboard to be measured, so that the mainboard to be measured cuts the channel of the mainboard to be measured according to the mark of the first passage Change first passage, wherein the mark of the first passage indicates first passage;
B, the mainboard test equipment sends the first signal to the mainboard to be measured, so that first signal is via described the One channel transfer, and export second signal;
C, the mainboard test equipment judges whether the second signal of the mainboard output to be measured meets preset condition, described default Condition is the attribute value and first signal of the second signal second signal identical or described with first signal The difference of attribute value is less than preset threshold, and attribute value is the amplitude or phase of signal;
If D, the second signal meets the preset condition, the mainboard test equipment determines the first passage without reason Barrier;
If E, the second signal is unsatisfactory for the preset condition, B and C are repeated;
If F, repeating m E, the mainboard test equipment determines that the first passage breaks down, wherein m >=1;
The mainboard test equipment determines the mainboard to be measured with the presence or absence of failure according to the n testing result;
The mainboard test equipment shows that definitive result, the definitive result are used to indicate the mainboard to be measured with the presence or absence of event Barrier.
8. motherboard test method according to claim 7, which is characterized in that the mainboard test equipment sends the first signal Before to the mainboard to be measured, the motherboard test method further include:
The channel of itself is switched to the first passage by the mainboard test equipment;
The mainboard test equipment generates first signal in the first passage.
9. motherboard test method according to claim 7 or 8, which is characterized in that the mainboard test equipment is according to the n A testing result determines the mainboard to be measured with the presence or absence of failure, comprising:
If first testing result indicates the first passage there are failure, the mainboard test equipment determines described to be measured There are failures for mainboard.
CN201610012934.6A 2016-01-08 2016-01-08 A kind of motherboard test method and equipment Active CN105676109B (en)

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