CN105629608A - Array substrate structure and array substrate broken line repairing method - Google Patents

Array substrate structure and array substrate broken line repairing method Download PDF

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Publication number
CN105629608A
CN105629608A CN201610029361.8A CN201610029361A CN105629608A CN 105629608 A CN105629608 A CN 105629608A CN 201610029361 A CN201610029361 A CN 201610029361A CN 105629608 A CN105629608 A CN 105629608A
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Prior art keywords
patch cord
scan line
data wire
controlling grid
grid scan
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Chinese (zh)
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唐国强
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Wuhan China Star Optoelectronics Technology Co Ltd
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Wuhan China Star Optoelectronics Technology Co Ltd
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Priority to CN201610029361.8A priority Critical patent/CN105629608A/en
Publication of CN105629608A publication Critical patent/CN105629608A/en
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    • GPHYSICS
    • G02OPTICS
    • G02FOPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/133Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
    • G02F1/136Liquid crystal cells structurally associated with a semi-conducting layer or substrate, e.g. cells forming part of an integrated circuit
    • G02F1/1362Active matrix addressed cells
    • G02F1/136286Wiring, e.g. gate line, drain line
    • GPHYSICS
    • G02OPTICS
    • G02FOPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/133Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
    • G02F1/136Liquid crystal cells structurally associated with a semi-conducting layer or substrate, e.g. cells forming part of an integrated circuit
    • G02F1/1362Active matrix addressed cells
    • G02F1/136259Repairing; Defects
    • GPHYSICS
    • G02OPTICS
    • G02FOPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/133Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
    • G02F1/136Liquid crystal cells structurally associated with a semi-conducting layer or substrate, e.g. cells forming part of an integrated circuit
    • G02F1/1362Active matrix addressed cells
    • G02F1/136259Repairing; Defects
    • G02F1/136272Auxiliary lines

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  • Physics & Mathematics (AREA)
  • Nonlinear Science (AREA)
  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Mathematical Physics (AREA)
  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Devices For Indicating Variable Information By Combining Individual Elements (AREA)

Abstract

The invention provides an array substrate and an array substrate broken line repairing method. The array substrate is characterized in that cross-shaped metal repairing layers (3) are arranged in crossed positions of data lines (2) and grid scanning lines (1); each cross-shaped metal repairing layer (3) comprises a transverse repairing line (31) and a longitudinal repairing line (32) which is vertically intersected with the transverse repairing line (31); the grid scanning lines (1) cover the transverse repairing lines (31); the data lines (2) cover the longitudinal repairing lines (32); the crossed positions of the transverse repairing lines (31) and the longitudinal repairing lines (32) and the crossed positions of the data lines (2) and the grid scanning lines (1) are coincided spatially. According to the array substrate and the array substrate broken line repairing method, provided by the invention, on the premise that the aperture ratio of a display panel is not affected and the influence on resistance of the data lines and the grid scanning lines is smaller, a repairing process is simplified, the repairing success rate and the repairing efficiency are increased, and the production cost is reduced.

Description

Array base-plate structure and array base palte method for repairing disconnected lines
Technical field
The present invention relates to Display Technique field, particularly relate to a kind of array base-plate structure and array base palte method for repairing disconnected lines.
Background technology
Liquid crystal indicator (LiquidCrystalDisplay, LCD) have that fuselage is thin, power saving, the many merits such as radiationless, it is widely used, as: mobile phone, personal digital assistant (PDA), digital camera, computer screen or notebook computer screen etc.
Liquid crystal indicator major part on existing market is backlight liquid crystal indicator, and it includes housing, the display panels of being located in housing and the backlight module (Backlightmodule) being located in housing. The structure of display panels is by a colored filter substrate (ColorFilterSubstrate), a thin-film transistor array base-plate (ThinFilmTransistorArraySubstrate, TFTArraySubstrate) and a liquid crystal layer (LiquidCrystalLayer) being configured between two substrates constituted, on array base palte, be wherein placed with the controlling grid scan line (GateLine) of many vertical data wires (DataLine) and level. The operation principle of display panels is by applying the rotation that driving voltage controls the liquid crystal molecule of liquid crystal layer on two panels glass substrate, the light of backlight module being reflected generation picture.
Along with the development of Display Technique, consumer requires more and more higher for the image quality of liquid crystal indicator, and wherein display resolution is one of very important performance indications. Display resolution characterizes the precision of screen picture, refers to the pixel that display floater can show has how many. When size of display panels is fixing, display resolution more hi-vision is more clear, controlling grid scan line and the cross-line of data wire in unit sizes also can get more and more, owing to array base palte production process is complicated, impact by production technology and power house environment factor, the data wire of array base palte and controlling grid scan line occur the probability of disconnection defect to increase at cross-line place, and broken string can cause producing black line in display picture, has a strong impact on image display quality.
In order to repair array base palte broken string, as shown in Figure 1, the connecting line 300 that traditional array base palte method for repairing disconnected lines needs to carry out metal (such as tungsten) formation of deposits at broken string place laser chemical vapor deposition (LaserChemicalVaporDeposition, LaserCVD) of controlling grid scan line 100 or data wire 200 longer will occur the controlling grid scan line 100 of broken string or data wire 200 to couple together. The shortcoming of this conventional repair method is in that connecting line 300 is longer, and corresponding resistance is bigger; When laser energy is higher, it is easy to causing short circuit between connecting line 300 and controlling grid scan line 100 or data wire 200, success rate of mending is relatively low; Length consuming time, repairing efficiency is low; The important impact of another one is that the region that connecting line 300 is arranged on beyond controlling grid scan line 100 or data wire 200 can shut out the light, make originally should the region of printing opacity light tight, reduce the aperture opening ratio of display floater.
Summary of the invention
It is an object of the invention to provide a kind of array base-plate structure, it is easy to carry out array base palte broken line repairing, and do not affect the aperture opening ratio of display floater, it is adaptable to undersized display floater.
The present invention also aims to provide a kind of array base palte method for repairing disconnected lines, can under the aperture opening ratio not affecting display floater and the premise that data wire, controlling grid scan line Resistance Influence is less, simplify mending course, improve success rate of mending and efficiency, reduce production cost.
For achieving the above object, the present invention provides a kind of array base-plate structure, including the controlling grid scan line of a plurality of laterally spaced distribution, a plurality of longitudinally spaced distribution and described a plurality of controlling grid scan line spatially square crossing and insulation data wire and in described data wire and controlling grid scan line infall arrange in criss-cross metal mending layer;
Described include horizontal patch cord and the longitudinal patch cord with described horizontal patch cord square crossing in criss-cross metal mending layer; Described horizontal patch cord is hidden by described controlling grid scan line, and described longitudinal patch cord is hidden by described data wire, and described horizontal patch cord spatially overlaps with the infall of controlling grid scan line with infall and the data wire of longitudinal patch cord.
The described material in criss-cross metal mending layer is molybdenum/aluminum/molybdenum composite bed.
The width of described horizontal patch cord is not more than the width of controlling grid scan line, and the width of described longitudinal patch cord is not more than the width of data wire.
Described array base-plate structure also includes multiple TFT arranged in array; The grid of TFT is formed by the first metal layer patterning with described controlling grid scan line, and grid is connected with controlling grid scan line; The source electrode of TFT, drain electrode and data wire are by the second metal layer patterning formation, and source electrode is connected with data wire; Described metal layer patterning formed by the 3rd in criss-cross metal mending layer.
The present invention also provides for a kind of array base palte method for repairing disconnected lines, comprises the steps:
Step 1, offer array base palte;
The structure of described array base palte include the controlling grid scan line of a plurality of laterally spaced distribution, a plurality of longitudinally spaced distribution and described a plurality of controlling grid scan line spatially square crossing and insulation data wire and in described data wire and controlling grid scan line infall arrange in criss-cross metal mending layer;
Described include horizontal patch cord and the longitudinal patch cord with described horizontal patch cord square crossing in criss-cross metal mending layer; Described horizontal patch cord is hidden by described controlling grid scan line, and described longitudinal patch cord is hidden by described data wire, and described horizontal patch cord spatially overlaps with the infall of controlling grid scan line with infall and the data wire of longitudinal patch cord;
Step 2, detect described array base palte occurs broken string data wire and occur broken string controlling grid scan line;
Step 3, for there is the data wire of broken string at the infall of data wire and controlling grid scan line, with corresponding data line, the two ends of described longitudinal patch cord in criss-cross metal mending layer are occurred that the two ends of broken string couple together respectively;
For there is the controlling grid scan line of broken string at the infall of data wire with controlling grid scan line, the two ends of the described horizontal patch cord in criss-cross metal mending layer are scanned with respective gates respectively line and occurs that the two ends of broken string couple together.
The described material in criss-cross metal mending layer is molybdenum/aluminum/molybdenum composite bed.
The width of described horizontal patch cord is not more than the width of controlling grid scan line, and the width of described longitudinal patch cord is not more than the width of data wire.
With corresponding data line, the two ends of described longitudinal patch cord in criss-cross metal mending layer are occurred that the two ends of broken string couple together by laser welding process by described step 3 respectively; By laser welding process, line is scanned at the two ends of the described horizontal patch cord in criss-cross metal mending layer respectively with respective gates and occur that the two ends of broken string couple together.
Beneficial effects of the present invention: array base-plate structure provided by the invention and array base palte method for repairing disconnected lines, arrange in criss-cross metal mending layer at data wire and controlling grid scan line infall, described include horizontal patch cord and the longitudinal patch cord with described horizontal patch cord square crossing in criss-cross metal mending layer, described horizontal patch cord is hidden by controlling grid scan line, described longitudinal patch cord is hidden by data wire, described horizontal patch cord spatially overlaps with the infall of controlling grid scan line with infall and the data wire of longitudinal patch cord, data wire and controlling grid scan line itself are in lightproof area, described it is not take up transmission region in criss-cross metal mending layer, do not affect the aperture opening ratio of display floater, and the horizontal patch cord of metal mending layer and longitudinal patch cord square crossing, winding displacement quantity is few, take up room little, it is adaptable to undersized display floater, for there is the data wire of broken string at the infall of data wire with controlling grid scan line, with corresponding data line, the two ends of described longitudinal patch cord in criss-cross metal mending layer are occurred that the two ends of broken string couple together respectively, for there is the controlling grid scan line of broken string at the infall of data wire with controlling grid scan line, the two ends of the described horizontal patch cord in criss-cross metal mending layer are scanned with respective gates respectively line and occurs that the two ends of broken string couple together, compared to existing long line repairing technique, to data wire, controlling grid scan line Resistance Influence is less, mending course is simple, improve success rate of mending and efficiency, reduce production cost.
Accompanying drawing explanation
In order to be able to be further understood that inventive feature and technology contents, refer to the detailed description below in connection with the present invention and accompanying drawing, but accompanying drawing only provides reference and use is described, be not used for the present invention is any limitation as.
In accompanying drawing,
Fig. 1 is the schematic diagram of traditional array base palte method for repairing disconnected lines;
Fig. 2 is the schematic diagram of the array base-plate structure of the present invention;
Fig. 3 is the flow chart of the array base palte method for repairing disconnected lines of the present invention;
Fig. 4 be the array base palte method for repairing disconnected lines of the present invention step 3 in data wire carried out the schematic diagram of broken line repairing;
Fig. 5 be the array base palte method for repairing disconnected lines of the present invention step 3 in controlling grid scan line carried out the schematic diagram of broken line repairing.
Detailed description of the invention
For further setting forth the technological means and effect thereof that the present invention takes, it is described in detail below in conjunction with the preferred embodiments of the present invention and accompanying drawing thereof.
Refer to Fig. 2, present invention firstly provides a kind of array base-plate structure, including the controlling grid scan line 1 of a plurality of laterally spaced distribution, a plurality of longitudinally spaced distribution and the data wire 2 of described a plurality of controlling grid scan line 1 spatially square crossing and insulation and in described data wire 2 and controlling grid scan line 1 infall arrange in criss-cross metal mending layer 3.
Described include horizontal patch cord 31 and the longitudinal patch cord 32 with the square crossing of described horizontal patch cord 31 in criss-cross metal mending layer 3; Described horizontal patch cord 31 is hidden by described controlling grid scan line 1, and described longitudinal patch cord 32 is hidden by described data wire 2, and described horizontal patch cord 31 spatially overlaps with the infall of controlling grid scan line 1 with infall and the data wire 2 of longitudinal patch cord 32. It is understandable that, in the present embodiment, the lower section of data wire 2 and controlling grid scan line 1 infall it is located in criss-cross metal mending layer 3, but being not limited to the present invention, spatially overlapping with the infall of controlling grid scan line 1 with infall and the data wire 2 of longitudinal patch cord 32 as long as meeting horizontal patch cord 31.
Described in criss-cross metal mending layer 3 for repairing the disconnection defect of data wire 2 and the disconnection defect of controlling grid scan line 1. Owing to data wire 2 and controlling grid scan line 1 itself are in lightproof area, described hidden by data wire 2 and controlling grid scan line 1 in criss-cross metal mending layer 3, it is not take up transmission region, do not affect the aperture opening ratio of display floater, and the horizontal patch cord 31 of metal mending layer 3 and longitudinal patch cord 32 square crossing, winding displacement quantity is few, takes up room little, it is adaptable to undersized display floater. For there is the data wire 2 of broken string at the infall of data wire 2 with controlling grid scan line 1, the two ends of described longitudinal patch cord 32 in criss-cross metal mending layer 3 are occurred with corresponding data line 2 respectively, and the two ends of broken string couple together, and can realize the repairing to data wire 2; For there is the controlling grid scan line 1 of broken string at the infall of data wire 2 with controlling grid scan line 1, the two ends of the described horizontal patch cord 31 in criss-cross metal mending layer 3 are scanned with respective gates respectively line 1 and occurs that the two ends of broken string couple together, the repairing to controlling grid scan line 1 can be realized; Compared to existing long line repairing technique, the array base-plate structure of the present invention utilizes to be repaired in criss-cross metal mending layer 3, and the Resistance Influence of data wire 2, controlling grid scan line 1 is less, and mending course is simple, success rate of mending and efficiency can be improved, reduce production cost.
Specifically, the described material in criss-cross metal mending layer 3 is molybdenum/aluminum/molybdenum (Mo/Al/Mo) composite bed.
The width of described horizontal patch cord 31 is not more than the width of controlling grid scan line 1, and the width of described longitudinal patch cord 32 is not more than the width of data wire 2.
Described array base-plate structure also includes multiple TFT arranged in array; The grid of TFT is formed by the first metal layer patterning with described controlling grid scan line 1, and grid is connected with controlling grid scan line 1; The source electrode of TFT, drain electrode and data wire 2 are by the second metal layer patterning formation, and source electrode is connected with data wire 2; Described metal layer patterning formed by the 3rd in criss-cross metal mending layer 3.
This kind of array base-plate structure in processing procedure process except making before cushion (including silicon nitride layer and silicon oxide layer) first deposition the 3rd metal level ((Mo/Al/Mo composite bed) on underlay substrate, then through exposure, development, 3rd metal level is patterned processing by etching processing procedure, producing described is beyond criss-cross metal mending layer 3, other processing procedure operation and prior art are as good as, on underlay substrate, each rete from the bottom to top is made successively: in criss-cross metal mending layer according to sequencing, cushion, semiconductor layer, gate insulator, the first metal layer (includes controlling grid scan line 1, and the grid of TFT), interlayer insulating film, second metal level (includes data wire 2, and the source electrode of TFT, drain electrode), flatness layer, common electrode layer, protective layer, and pixel electrode layer etc.
Referring to Fig. 3, in conjunction with Fig. 2, Fig. 4 and Fig. 5, the present invention also provides for a kind of array base palte method for repairing disconnected lines, comprises the steps:
Step 1, offer array base palte.
The structure of described array base palte as in figure 2 it is shown, include the controlling grid scan line 1 of a plurality of laterally spaced distribution, a plurality of longitudinally spaced distribution and the data wire 2 of described a plurality of controlling grid scan line 1 spatially square crossing and insulation and in described data wire 2 and controlling grid scan line 1 infall arrange in criss-cross metal mending layer 3.
Described include horizontal patch cord 31 and the longitudinal patch cord 32 with the square crossing of described horizontal patch cord 31 in criss-cross metal mending layer 3; Described horizontal patch cord 31 is hidden by described controlling grid scan line 1, and described longitudinal patch cord 32 is hidden by described data wire 2, and described horizontal patch cord 31 spatially overlaps with the infall of controlling grid scan line 1 with infall and the data wire 2 of longitudinal patch cord 32.
Owing to data wire 2 and controlling grid scan line 1 itself are in lightproof area, described hidden by data wire 2 and controlling grid scan line 1 in criss-cross metal mending layer 3, it is not take up transmission region, do not affect the aperture opening ratio of display floater, and the horizontal patch cord 31 of metal mending layer 3 and longitudinal patch cord 32 square crossing, winding displacement quantity is few, takes up room little, it is adaptable to undersized display floater.
Specifically, the described material in criss-cross metal mending layer 3 is molybdenum/aluminum/molybdenum composite bed. The width of described horizontal patch cord 31 is not more than the width of controlling grid scan line 1, and the width of described longitudinal patch cord 32 is not more than the width of data wire 2. Described array base-plate structure also includes multiple TFT arranged in array; The grid of TFT is formed by the first metal layer patterning with described controlling grid scan line 1, and grid is connected with controlling grid scan line 1; The source electrode of TFT, drain electrode and data wire 2 are by the second metal layer patterning formation, and source electrode is connected with data wire 2; Described metal layer patterning formed by the 3rd in criss-cross metal mending layer 3.
Step 2, detect described array base palte occurs broken string data wire 2 and occur broken string controlling grid scan line 1.
Step 3, for there is the data wire 2 of broken string at the infall of data wire 2 with controlling grid scan line 1, as shown in Figure 4, by laser welding process, the two ends of described longitudinal patch cord 32 in criss-cross metal mending layer 3 are occurred that the two ends of broken string couple together respectively with corresponding data line 2, it is achieved the repairing to data wire 2;
For there is the controlling grid scan line 1 of broken string at the infall of data wire 2 with controlling grid scan line 1, by laser welding process, line 1 is scanned at the two ends of the described horizontal patch cord 31 in criss-cross metal mending layer 3 respectively with respective gates and occur that the two ends of broken string couple together, it is achieved the repairing to controlling grid scan line 1.
After completing this step 3, described data wire 2 transmits data signal at broken string place by described longitudinal patch cord 32 in criss-cross metal mending layer 3; Described controlling grid scan line 1 transmits gated sweep signal at broken string place by the described horizontal patch cord 31 in criss-cross metal mending layer 3. Compared to existing long line repairing technique, it is that criss-cross metal mending layer 3 can complete broken line repairing by simple laser welding process that the array base palte method for repairing disconnected lines of the present invention utilizes described, under the aperture opening ratio not affecting display floater and the premise that data wire 2, controlling grid scan line 1 Resistance Influence is less, simplify mending course, improve success rate of mending and efficiency, reduce production cost.
In sum, the array base-plate structure of the present invention and array base palte method for repairing disconnected lines, arrange in criss-cross metal mending layer at data wire and controlling grid scan line infall, described include horizontal patch cord and the longitudinal patch cord with described horizontal patch cord square crossing in criss-cross metal mending layer, described horizontal patch cord is hidden by controlling grid scan line, described longitudinal patch cord is hidden by data wire, described horizontal patch cord spatially overlaps with the infall of controlling grid scan line with infall and the data wire of longitudinal patch cord, data wire and controlling grid scan line itself are in lightproof area, described it is not take up transmission region in criss-cross metal mending layer, do not affect the aperture opening ratio of display floater, and the horizontal patch cord of metal mending layer and longitudinal patch cord square crossing, winding displacement quantity is few, take up room little, it is adaptable to undersized display floater, for there is the data wire of broken string at the infall of data wire with controlling grid scan line, with corresponding data line, the two ends of described longitudinal patch cord in criss-cross metal mending layer are occurred that the two ends of broken string couple together respectively, for there is the controlling grid scan line of broken string at the infall of data wire with controlling grid scan line, the two ends of the described horizontal patch cord in criss-cross metal mending layer are scanned with respective gates respectively line and occurs that the two ends of broken string couple together, compared to existing long line repairing technique, to data wire, controlling grid scan line Resistance Influence is less, mending course is simple, improve success rate of mending and efficiency, reduce production cost.
The above; for the person of ordinary skill of the art; can conceive according to technical scheme and technology and make other various corresponding changes and deformation, and all these change and deform the protection domain that all should belong to appended claims of the present invention.

Claims (8)

1. an array base-plate structure, it is characterized in that, including the controlling grid scan line (1) of a plurality of laterally spaced distribution, a plurality of longitudinally spaced distribution and the spatially square crossing of described a plurality of controlling grid scan line (1) and insulation data wire (2) and in described data wire (2) and controlling grid scan line (1) infall arrange in criss-cross metal mending layer (3);
Described include horizontal patch cord (31) and the longitudinal patch cord (32) with the square crossing of described horizontal patch cord (31) in criss-cross metal mending layer (3); Described horizontal patch cord (31) is hidden by described controlling grid scan line (1), described longitudinal patch cord (32) is hidden by described data wire (2), and described horizontal patch cord (31) spatially overlaps with the infall of controlling grid scan line (1) with infall and the data wire (2) of longitudinal patch cord (32).
2. array base-plate structure as claimed in claim 1, it is characterised in that the described material in criss-cross metal mending layer (3) is molybdenum/aluminum/molybdenum composite bed.
3. array base-plate structure as claimed in claim 1, it is characterized in that, the width of described horizontal patch cord (31) is not more than the width of controlling grid scan line (1), and the width of described longitudinal patch cord (32) is not more than the width of data wire (2).
4. array base-plate structure as claimed in claim 1, it is characterised in that also include multiple TFT arranged in array; The grid of TFT is formed by the first metal layer patterning with described controlling grid scan line (1), and grid is connected with controlling grid scan line (1); The source electrode of TFT, drain electrode and data wire (2) are by the second metal layer patterning formation, and source electrode is connected with data wire (2); Described metal layer patterning formed by the 3rd in criss-cross metal mending layer (3).
5. an array base palte method for repairing disconnected lines, it is characterised in that comprise the steps:
Step 1, offer array base palte;
The structure of described array base palte include the controlling grid scan line (1) of a plurality of laterally spaced distribution, a plurality of longitudinally spaced distribution and the spatially square crossing of described a plurality of controlling grid scan line (1) and insulation data wire (2) and in described data wire (2) and controlling grid scan line (1) infall arrange in criss-cross metal mending layer (3);
Described include horizontal patch cord (31) and the longitudinal patch cord (32) with the square crossing of described horizontal patch cord (31) in criss-cross metal mending layer (3); Described horizontal patch cord (31) is hidden by described controlling grid scan line (1), described longitudinal patch cord (32) is hidden by described data wire (2), and described horizontal patch cord (31) spatially overlaps with the infall of controlling grid scan line (1) with infall and the data wire (2) of longitudinal patch cord (32);
Step 2, detect described array base palte occurs broken string data wire (2) and occur broken string controlling grid scan line (1);
Step 3, for there is the data wire (2) of broken string at the infall of data wire (2) and controlling grid scan line (1), with corresponding data line (2), the two ends of described longitudinal patch cord (32) in criss-cross metal mending layer (3) are occurred that the two ends broken couple together respectively;
For there is the controlling grid scan line (1) of broken string at the infall of data wire (2) with controlling grid scan line (1), the two ends of the described horizontal patch cord (31) in criss-cross metal mending layer (3) are scanned with respective gates respectively line (1) and occurs that the two ends of broken string couple together.
6. array base palte method for repairing disconnected lines as claimed in claim 5, it is characterised in that the described material in criss-cross metal mending layer (3) is molybdenum/aluminum/molybdenum composite bed.
7. array base palte method for repairing disconnected lines as claimed in claim 5, it is characterized in that, the width of described horizontal patch cord (31) is not more than the width of controlling grid scan line (1), and the width of described longitudinal patch cord (32) is not more than the width of data wire (2).
8. array base palte method for repairing disconnected lines as claimed in claim 5, it is characterized in that, with corresponding data line (2), the two ends of described longitudinal patch cord (32) in criss-cross metal mending layer (3) are occurred that the two ends of broken string couple together by laser welding process by described step 3 respectively; By laser welding process, line (1) is scanned at the two ends of the described horizontal patch cord (31) in criss-cross metal mending layer (3) respectively with respective gates and occur that the two ends of broken string couple together.
CN201610029361.8A 2016-01-15 2016-01-15 Array substrate structure and array substrate broken line repairing method Pending CN105629608A (en)

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Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN107463038A (en) * 2017-08-23 2017-12-12 京东方科技集团股份有限公司 A kind of array base palte and its short-circuit restorative procedure and display device
CN109917957A (en) * 2019-02-27 2019-06-21 上海天马微电子有限公司 Touch panel, manufacturing method and repairing method thereof and touch device
CN110265410A (en) * 2019-06-21 2019-09-20 京东方科技集团股份有限公司 The production method and display panel and display device of a kind of display panel
CN110764289A (en) * 2019-10-29 2020-02-07 深圳市华星光电技术有限公司 Liquid crystal panel repairing method

Citations (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100382456B1 (en) * 2000-05-01 2003-05-01 엘지.필립스 엘시디 주식회사 method for forming Repair pattern of liquid crystal display
CN1877844A (en) * 2006-07-05 2006-12-13 广辉电子股份有限公司 Repairing structure and active component array substrate
CN101086564A (en) * 2006-06-09 2007-12-12 三星电子株式会社 Display substrate and repairing method
CN101211929A (en) * 2006-12-29 2008-07-02 群康科技(深圳)有限公司 Thin film transistor substrate and its producing method
CN201886251U (en) * 2010-12-24 2011-06-29 京东方科技集团股份有限公司 TFT array substrate and repaired TFT array substrate
CN102213879A (en) * 2010-04-12 2011-10-12 北京京东方光电科技有限公司 Film transistor array substrate and manufacturing and repairing methods thereof
CN102629062A (en) * 2012-04-19 2012-08-08 深圳市华星光电技术有限公司 Display panel and signal line repairing method thereof
CN102969363A (en) * 2011-08-29 2013-03-13 三星显示有限公司 Thin film transistor array substrate and manufacturing method of the same
CN103247245A (en) * 2012-02-03 2013-08-14 元太科技工业股份有限公司 Display panel circuit structure

Patent Citations (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100382456B1 (en) * 2000-05-01 2003-05-01 엘지.필립스 엘시디 주식회사 method for forming Repair pattern of liquid crystal display
CN101086564A (en) * 2006-06-09 2007-12-12 三星电子株式会社 Display substrate and repairing method
CN1877844A (en) * 2006-07-05 2006-12-13 广辉电子股份有限公司 Repairing structure and active component array substrate
CN101211929A (en) * 2006-12-29 2008-07-02 群康科技(深圳)有限公司 Thin film transistor substrate and its producing method
CN102213879A (en) * 2010-04-12 2011-10-12 北京京东方光电科技有限公司 Film transistor array substrate and manufacturing and repairing methods thereof
CN201886251U (en) * 2010-12-24 2011-06-29 京东方科技集团股份有限公司 TFT array substrate and repaired TFT array substrate
CN102969363A (en) * 2011-08-29 2013-03-13 三星显示有限公司 Thin film transistor array substrate and manufacturing method of the same
CN103247245A (en) * 2012-02-03 2013-08-14 元太科技工业股份有限公司 Display panel circuit structure
CN102629062A (en) * 2012-04-19 2012-08-08 深圳市华星光电技术有限公司 Display panel and signal line repairing method thereof

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN107463038A (en) * 2017-08-23 2017-12-12 京东方科技集团股份有限公司 A kind of array base palte and its short-circuit restorative procedure and display device
CN109917957A (en) * 2019-02-27 2019-06-21 上海天马微电子有限公司 Touch panel, manufacturing method and repairing method thereof and touch device
CN109917957B (en) * 2019-02-27 2023-11-21 上海天马微电子有限公司 Touch panel, manufacturing method and repairing method thereof and touch device
CN110265410A (en) * 2019-06-21 2019-09-20 京东方科技集团股份有限公司 The production method and display panel and display device of a kind of display panel
CN110265410B (en) * 2019-06-21 2021-12-14 京东方科技集团股份有限公司 Manufacturing method of display panel, display panel and display device
CN110764289A (en) * 2019-10-29 2020-02-07 深圳市华星光电技术有限公司 Liquid crystal panel repairing method
CN110764289B (en) * 2019-10-29 2022-03-29 Tcl华星光电技术有限公司 Liquid crystal panel repairing method

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