CN105553544A - AFDX photoelectric converter testing method - Google Patents
AFDX photoelectric converter testing method Download PDFInfo
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- CN105553544A CN105553544A CN201510896081.2A CN201510896081A CN105553544A CN 105553544 A CN105553544 A CN 105553544A CN 201510896081 A CN201510896081 A CN 201510896081A CN 105553544 A CN105553544 A CN 105553544A
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04B—TRANSMISSION
- H04B10/00—Transmission systems employing electromagnetic waves other than radio-waves, e.g. infrared, visible or ultraviolet light, or employing corpuscular radiation, e.g. quantum communication
- H04B10/07—Arrangements for monitoring or testing transmission systems; Arrangements for fault measurement of transmission systems
- H04B10/073—Arrangements for monitoring or testing transmission systems; Arrangements for fault measurement of transmission systems using an out-of-service signal
- H04B10/0731—Testing or characterisation of optical devices, e.g. amplifiers
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Abstract
The invention belongs to field of airborne network testing technologies and provides an AFDX photoelectric converter testing method. According to the invention, an AFDX end system based on FPGA is adopted, the data conversion accuracy, the data frame sequence and the conversion delay of an AFDX photoelectric converter are tested, the testing mechanism is simplified, the testing cost and difficulty are lowered, the rapid and reliable measurement on the AFDX photoelectric converter is realized, and the testing efficiency is improved.
Description
Technical field
The present invention is used for onboard networks field tests, relates to the method for testing of the data transaction correctness of AFDX optical-electrical converter, data frame sequence, transfer lag.
Background technology
Avionic full-duplex switched-type Ethernet (AFDX) is a kind of full-duplex switched Ethernet in real time, to determine, is current internationally recognized transporter main flow onboard networks.Traditional AFDX Network Transfer Media is coaxial cable, and shortcoming is that weight is large, and transmission range is near.In order to overcome these shortcomings of coaxial cable, some AFDX equipment use optical fiber are as transmission medium.In airborne AFDX network, because coaxial cable is not replaced completely by optical fiber, AFDX optical-electrical converter is therefore needed to provide opto-electronic conversion for coaxial cable and optical fiber.In order to ensure reliability, the real-time of AFDX network service, strict requirement is proposed to the data transaction correctness of AFDX optical-electrical converter, data frame sequence, transfer lag.
AFDX optical-electrical converter input/output terminal interface signal is different, and apply original method of testing when testing it, need multiple testing equipment to carry out, mechanism for testing is complicated, and testing cost is high, and test period is long, and testing efficiency is low simultaneously.
Summary of the invention
The present invention is directed to the data transaction correctness of AFDX optical-electrical converter, data frame sequence, transfer lag requirement, propose a kind of AFDX opto-electronic conversion method of testing, adopt one piece of AFDX end system based on FPGA, achieve the test of AFDX optical-electrical converter data transaction correctness, data frame sequence, transfer lag, reduce difficulty of test, improve testing efficiency.
Technical solution of the present invention is as follows:
A kind of AFDX opto-electronic conversion method of testing, comprises the test of data transaction correctness, data frame sequence test and transfer lag test;
The step of the test of data transaction correctness and data frame sequence test is as follows:
1) the quantity forwarded n of AFDX test platform signal of telecommunication AFDX data is set;
2) signal of telecommunication AFDX data are sent to tested AFDX optical-electrical converter by AFDX test platform;
3) signal of telecommunication AFDX data are converted to light signal AFDX data by tested AFDX optical-electrical converter, and light signal AFDX data get back to tested AFDX optical-electrical converter by optical fiber winding;
4) light signal AFDX data are converted to signal of telecommunication AFDX data by tested AFDX optical-electrical converter, and the signal of telecommunication AFDX transfer of data after conversion is to AFDX test platform;
5) AFDX test platform is by step 4) in the signal of telecommunication AFDX data that receive of AFDX test platform and step 2) signal of telecommunication AFDX data that send of middle AFDX test platform contrast, whether the content contrasting them is consistent, and whether the frame sequential contrasting them is consistent;
If all consistent, jump procedure 6);
If their content is inconsistent or their frame sequential is inconsistent, then jump procedure 7);
Wherein, if all consistent, the signal of telecommunication AFDX data that definition AFDX test platform receives are correct data;
6) AFDX test platform judge to receive signal of telecommunication AFDX data bulk m, with step 1) in quantity forwarded n whether equal; If m is less than n, then jump procedure 5), if m equals n, then jump procedure 7);
7) the quantity k of AFDX test platform statistics correct data, if k equals n, then the test of tested AFDX optical-electrical converter is passed through, otherwise test is not passed through;
8) test result of the quantity k of correct data and tested AFDX optical-electrical converter is issued PC by AFDX test platform;
The step of transfer lag test is as follows:
A) by two of AFDX test platform electric mouth electrical connections, these two electric mouths belong to same AFDX end system, and these two electric mouths are respectively electric mouth A and electric mouth B;
B) AFDX end system sends AFDX data by electric mouth A to electric mouth B; When AFDX data are sent out by electric mouth A, produce and send enable signal accordingly, when electric mouth B receives AFDX data, produce and receive useful signal;
C) acquisition step b) send the moment t1 of enable signal and receive the moment t2 of useful signal, t2 is deducted t1 and obtain Δ T1 time of delay;
D) disconnect the electrical connection of electric mouth A and electric mouth B, electric mouth A is connected with two electric mouths on tested AFDX optical-electrical converter respectively with electric mouth B;
The two-way optical interface of tested AFDX optical-electrical converter uses optical fiber winding;
E) AFDX end system sends AFDX data by one of them electric mouth to tested AFDX optical-electrical converter, and AFDX data after tested AFDX optical-electrical converter conversion, then are back to AFDX end system;
When AFDX data are sent by the electric mouth of AFDX end system, produce and send enable signal accordingly, when AFDX end system receives the AFDX data returned, produce and receive useful signal;
F) acquisition step e) the moment t3 of middle transmission enable signal and the moment t4 of reception useful signal, t4 is deducted t3 and obtain Δ T2 time of delay;
G) Δ T2 is deducted Δ T1, obtain the transfer lag Δ T of tested AFDX optical-electrical converter;
H) transfer lag Δ T is issued PC by AFDX test platform;
Wherein, AFDX end system is the AFDX end system based on FPGA.
The step 2 of the test of data transaction correctness and data frame sequence test) in, signal of telecommunication AFDX data send to tested AFDX optical-electrical converter through coaxial cable or netting twine.
The step 4 that the test of data transaction correctness and data frame sequence are tested) in, the signal of telecommunication AFDX data after conversion through coaxial cable or network cable transmission to AFDX test platform.
Realize the test platform of above-mentioned AFDX opto-electronic conversion method of testing, its special character is:
Comprise cabinet and be arranged on the AFDX end system of cabinet inside, power supply unit and motherboard;
Described AFDX end system is fixed on motherboard, and power supply unit is electrically connected with AFDX end system by motherboard;
Described cabinet is provided with cabinet panel, and cabinet panel is provided with serial ports, power supply interface and multiple electric mouth,
Serial ports is used for being connected with PC;
Power supply interface is connected with power supply unit, for powering to unit under test;
Each electric mouth is electrically connected with AFDX end system respectively by motherboard.
Above-mentioned AFDX end system is the AFDX end system based on FPGA.
Above-mentioned electric mouth has two.
Switch is provided with between above-mentioned power supply interface and power supply unit.
Beneficial effect:
The AFDX opto-electronic conversion method of testing that the present invention proposes, data transaction correctness, data frame sequence and transfer lag content measurement can be concentrated on one piece to realize based on the AFDX end system of FPGA, simplify mechanism for testing, reduce testing cost and difficulty, achieve and AFDX optical-electrical converter is measured fast, reliably, improve testing efficiency.
Accompanying drawing explanation
Fig. 1 is AFDX optical-electrical converter functional block diagram;
Fig. 2 is functional schematic of the present invention;
Fig. 3 is AFDX opto-electronic conversion method of testing schematic diagram.
Embodiment
AFDX opto-electronic conversion is tested, and comprising: data transaction correctness, data frame sequence and transfer lag are tested.
1, data transaction correctness and data frame sequence test
2, transfer lag test
Below in conjunction with accompanying drawing, the present invention is described further:
The function of AFDX optical-electrical converter, as shown in Figure 1, completes the light signal of AFDX data and the conversion of the signal of telecommunication, need ensure data transaction correctness, data frame sequence and conversion delaing time.
As shown in Figure 2, opto-electronic conversion test platform provided by the invention, function of the present invention, comprises cabinet and is arranged on the AFDX end system of cabinet inside, power supply unit and motherboard;
AFDX end system is fixed on motherboard, and power supply unit is electrically connected with AFDX end system by motherboard;
Cabinet is provided with cabinet panel, serial ports, power supply interface and multiple electric mouth on cabinet panel; Serial ports is used for being connected with PC; Power supply interface is connected with power supply unit, for powering to unit under test; Each electric mouth is electrically connected with AFDX end system respectively by motherboard, and electric mouth preferably arranges two.
AFDX end system is the AFDX end system based on FPGA.
AFDX end system is responsible for sending and receiving AFDX data, judges the content correctness, the data frame sequence that transmit and receive data, gathers and sends the enable signal moment and receive significant instant, calculate conversion delaing time.
Switch is provided with between above-mentioned power supply interface and power supply unit.
A kind of AFDX opto-electronic conversion method of testing performing step is as follows:
As shown in Figure 3, data transaction correctness and data frame sequence performing step
1) the quantity forwarded n of AFDX end system signal of telecommunication AFDX data is set;
2) signal of telecommunication AFDX data are sent to tested AFDX optical-electrical converter through coaxial cable by AFDX test platform;
3) signal of telecommunication AFDX data are converted to light signal AFDX data by tested AFDX optical-electrical converter, and light signal AFDX data get back to tested AFDX optical-electrical converter by optical fiber winding;
4) light signal AFDX data are converted to signal of telecommunication AFDX data by tested AFDX optical-electrical converter, and the signal of telecommunication AFDX transfer of data after conversion is to AFDX test platform;
5) AFDX test platform is by step 4) in the signal of telecommunication AFDX data that receive of AFDX test platform and step 2) signal of telecommunication AFDX data that send of middle AFDX test platform contrast, whether the content contrasting them is consistent, and whether the frame sequential contrasting them is consistent;
If all consistent, jump procedure 6);
If their content is inconsistent or their frame sequential is inconsistent, then jump procedure 7);
Wherein, if all consistent, the signal of telecommunication AFDX data that definition AFDX test platform receives are correct data;
6) AFDX test platform judge to receive signal of telecommunication AFDX data bulk m, with step 1) in quantity forwarded n whether equal; If m is less than n, then jump procedure 5), if m equals n, then jump procedure 7);
7) the quantity k of AFDX test platform statistics correct data, if k equals n, then the test of tested AFDX optical-electrical converter is passed through, otherwise test is not passed through;
8) test result of the quantity k of correct data and tested AFDX optical-electrical converter is issued PC by AFDX test platform.
As shown in Figure 3, transfer lag test performing step:
A) be electrically connected by two of AFDX test platform electric mouth crossover network cables, these two electric mouths belong to same AFDX end system, and these two electric mouths are respectively electric mouth A and electric mouth B;
B) AFDX end system internal loopback AFDX data, specific as follows:
AFDX end system sends AFDX data by electric mouth A to electric mouth B; When AFDX data are sent out by electric mouth A, produce and send enable signal accordingly, when electric mouth B receives AFDX data, produce and receive useful signal accordingly;
C) the FPGA acquisition step b on AFDX end system) the moment t1 of middle transmission enable signal and the moment t2 of reception useful signal, t2 is deducted t1 and obtain Δ T1 time of delay;
D) disconnect the electrical connection of electric mouth A and electric mouth B, electric mouth A is connected with two electric mouths on tested AFDX optical-electrical converter respectively with electric mouth B;
The two-way optical interface of tested AFDX optical-electrical converter uses optical fiber winding;
E) AFDX end system sends AFDX data by one of them electric mouth to tested AFDX optical-electrical converter, and AFDX data after tested AFDX optical-electrical converter conversion, then are back to AFDX end system;
When AFDX data are sent by the electric mouth of AFDX end system, produce and send enable signal accordingly, when AFDX end system receives the AFDX data returned, produce and receive useful signal;
F) the FPGA acquisition step e on AFDX end system) the moment t3 of middle transmission enable signal and the moment t4 of reception useful signal, t4 is deducted t3 and obtain Δ T2 time of delay;
G) Δ T2 is deducted Δ T1, obtain the transfer lag Δ T of tested AFDX optical-electrical converter;
H) transfer lag Δ T is issued PC by AFDX test platform.
Claims (8)
1. an AFDX opto-electronic conversion method of testing, comprises the test of data transaction correctness, data frame sequence test and transfer lag test; It is characterized in that:
The step of the test of data transaction correctness and data frame sequence test is as follows:
1) the quantity forwarded n of AFDX test platform signal of telecommunication AFDX data is set;
2) signal of telecommunication AFDX data are sent to tested AFDX optical-electrical converter by AFDX test platform;
3) signal of telecommunication AFDX data are converted to light signal AFDX data by tested AFDX optical-electrical converter, and light signal AFDX data get back to tested AFDX optical-electrical converter by optical fiber winding;
4) light signal AFDX data are converted to signal of telecommunication AFDX data by tested AFDX optical-electrical converter, and the signal of telecommunication AFDX transfer of data after conversion is to AFDX test platform;
5) AFDX test platform is by step 4) in the signal of telecommunication AFDX data that receive of AFDX test platform and step 2) signal of telecommunication AFDX data that send of middle AFDX test platform contrast, whether the content contrasting them is consistent, and whether the frame sequential contrasting them is consistent;
If all consistent, jump procedure 6);
If their content is inconsistent or their frame sequential is inconsistent, then jump procedure 7);
Wherein, if all consistent, the signal of telecommunication AFDX data that definition AFDX test platform receives are correct data;
6) AFDX test platform judge to receive signal of telecommunication AFDX data bulk m, with step 1) in quantity forwarded n whether equal; If m is less than n, then jump procedure 5), if m equals n, then jump procedure 7);
7) the quantity k of AFDX test platform statistics correct data, if k equals n, then the test of tested AFDX optical-electrical converter is passed through, otherwise test is not passed through;
8) test result of the quantity k of correct data and tested AFDX optical-electrical converter is issued PC by AFDX test platform;
The step of transfer lag test is as follows:
A) by two of AFDX test platform electric mouth electrical connections, these two electric mouths belong to same AFDX end system, and these two electric mouths are respectively electric mouth A and electric mouth B;
B) AFDX end system sends AFDX data by electric mouth A to electric mouth B; When AFDX data are sent out by electric mouth A, produce and send enable signal accordingly, when electric mouth B receives AFDX data, produce and receive useful signal;
C) acquisition step b) the moment t1 of middle transmission enable signal and the moment t2 of reception useful signal, t2 is deducted t1 and obtain Δ T1 time of delay;
D) disconnect the electrical connection of electric mouth A and electric mouth B, electric mouth A is connected with two electric mouths on tested AFDX optical-electrical converter respectively with electric mouth B;
The two-way optical interface of tested AFDX optical-electrical converter uses optical fiber winding;
E) AFDX end system sends AFDX data by one of them electric mouth to tested AFDX optical-electrical converter, and AFDX data after tested AFDX optical-electrical converter conversion, then are back to AFDX end system;
When AFDX data are sent by the electric mouth of AFDX end system, produce and send enable signal accordingly, when AFDX end system receives the AFDX data returned, produce and receive useful signal;
F) acquisition step e) the moment t3 of middle transmission enable signal and the moment t4 of reception useful signal, t4 is deducted t3 and obtain Δ T2 time of delay;
G) Δ T2 is deducted Δ T1, obtain the transfer lag Δ T of tested AFDX optical-electrical converter;
H) transfer lag Δ T is issued PC by AFDX test platform.
2. AFDX opto-electronic conversion method of testing according to claim 1, is characterized in that,
AFDX end system is the AFDX end system based on FPGA.
3. AFDX opto-electronic conversion method of testing according to claim 1 and 2, is characterized in that,
The step 2 of the test of data transaction correctness and data frame sequence test) in, signal of telecommunication AFDX data send to tested AFDX optical-electrical converter through coaxial cable or netting twine.
4. AFDX opto-electronic conversion method of testing according to claim 3, is characterized in that,
The step 4 that the test of data transaction correctness and data frame sequence are tested) in, the signal of telecommunication AFDX data after conversion through coaxial cable or network cable transmission to AFDX test platform.
5. realize the test platform of claim 1 or 2 or the AFDX opto-electronic conversion method of testing described in 3 or 4, it is characterized in that:
Comprise cabinet and be arranged on the AFDX end system of cabinet inside, power supply unit and motherboard;
Described AFDX end system is fixed on motherboard, and power supply unit is electrically connected with AFDX end system by motherboard;
Described cabinet is provided with cabinet panel, and cabinet panel is provided with serial ports, power supply interface and multiple electric mouth,
Serial ports is used for being connected with PC;
Power supply interface is connected with power supply unit, for powering to unit under test;
Each electric mouth is electrically connected with AFDX end system respectively by motherboard.
6. test platform according to claim 5, is characterized in that,
AFDX end system is the AFDX end system based on FPGA.
7. the test platform according to claim 5 or 6, is characterized in that, described electric mouth has two.
8. test platform according to claim 7, is characterized in that, is provided with switch between described power supply interface and power supply unit.
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| CN111123447A (en) * | 2018-10-30 | 2020-05-08 | 富士通光器件株式会社 | Optical transceiver, optical transceiver module using the same, and method for testing optical transceiver |
| CN108809756B (en) * | 2018-05-18 | 2020-11-27 | 深圳市智微智能科技股份有限公司 | Communication method of photoelectric conversion module under linux system and related product |
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Application publication date: 20160504 |