CN105491375A - Product circuit board test system and method and television set - Google Patents
Product circuit board test system and method and television set Download PDFInfo
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- CN105491375A CN105491375A CN201511003826.4A CN201511003826A CN105491375A CN 105491375 A CN105491375 A CN 105491375A CN 201511003826 A CN201511003826 A CN 201511003826A CN 105491375 A CN105491375 A CN 105491375A
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N17/00—Diagnosis, testing or measuring for television systems or their details
- H04N17/04—Diagnosis, testing or measuring for television systems or their details for receivers
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- Engineering & Computer Science (AREA)
- Health & Medical Sciences (AREA)
- Biomedical Technology (AREA)
- General Health & Medical Sciences (AREA)
- Multimedia (AREA)
- Signal Processing (AREA)
- Testing, Inspecting, Measuring Of Stereoscopic Televisions And Televisions (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
Abstract
The invention discloses a product circuit board test system and method and a television set. The test system comprises a product circuit board of a connector; the product circuit board comprises a switching circuit and a main circuit; the switching circuit comprises a first interface, a second interface connected to a tube pin to be connected to the ground of the connector, and a third interface connected to the signal to be detected of the main circuit; the switching circuit is used for the condition that when the first interface is suspended, the tube pin to be connected to the ground of the connector outputs the signal to be detected of the main circuit, and when the first interface is accessed by the power supply signal, the tube pin to be connected to the ground of the connector is connected to the ground. The invention can conveniently test the signal to be tested.
Description
Technical field
The present invention relates to product test technology, particularly a kind of test macro of product circuit plate and method and television set.
Background technology
Current television set design generally can be experienced several test manufacture stage to volume production just can put into volume production from holding case.The test manufacture stage is to pinpoint the problems a little, and solves in time or increase countermeasure.The television set in test manufacture stage all can carry out burn-in test usually, and when aging high temperature, high humidity, television set breaks down sometimes, the situation such as such as standby, blank screen, Hua Ping, deadlock, at this time just needs to go to analyze.
In present television set peripheral interface, software connecting interface has had (such as at HDMI or AV interface compatibility Software for Design), can when not disassembling television rear shell reading software information, more convenient.And measurement on hardware is just cumbersome, must pull down television rear shell could measure.May disappear because fault tester in power-down state restarts rear bad phenomenon, in order to keep bad phenomenon, television set power-off can not be taken out of burn-in chamber with going other point analysis by analyst, can only disassemble back cover and measure under burn-in chamber keeps energising.Disassemble very difficult in such environment, and burn-in chamber does not have special to disassemble platform, and the fixed screw on television rear shell is many again, it is long to disassemble the duration, allows analyst with to tear machine personnel open soaked with sweat.And contrary if there is problem in low-temperature test, will carry out disassembling operation in low-temperature cabinet, environment is also very severe.
Summary of the invention
The test macro of a kind of product circuit plate provided by the invention and method and television set, can treat test signal easily and measure.
For achieving the above object, technical scheme of the present invention is achieved in that
A test macro for product circuit plate, described test macro comprises: the product circuit plate with connector;
Described product circuit plate also comprises: commutation circuit and main circuit;
Described commutation circuit comprises: first interface, the second interface that ground pin is connected for the treatment of with described connector; And the 3rd interface to be connected with the measured signal of described main circuit;
Described commutation circuit is used for, when described first interface puts sky, described connector treat that ground pin exports the measured signal of described main circuit, when described first interface access power supply signal, described connector treat ground pin ground connection.
Described commutation circuit comprises: metal-oxide-semiconductor; The grid of described metal-oxide-semiconductor connects the first end of the second resistance; The source ground of described metal-oxide-semiconductor; The drain electrode of described metal-oxide-semiconductor connects the first end of the first resistance; Second end of described second resistance connects the first end of the 3rd resistance and the first end of the 4th resistance, the second end ground connection of described 4th resistance respectively;
Second end of described 3rd resistance is the first interface of described commutation circuit; The drain electrode of described metal-oxide-semiconductor is the second interface of described commutation circuit; Second end of described first resistance is the 3rd interface of described commutation circuit.
Described test macro also comprises: testing circuit board, and described testing circuit board is provided with test point, with described connector, described test point treats that ground pin is connected.
Described product circuit plate is arranged in product shell, and described testing circuit board is arranged on outside described product shell.
The treating that ground pin is connected and be specially of described test point and described connector: with described connector, described test point treats that ground pin is connected by connecting line.
Described connector is the connector of externally fed.
A kind of television set, described television set comprises the test macro of described product circuit plate.
A method of testing for product circuit plate, described product circuit plate is provided with connector and main circuit; It is characterized in that, described method comprises:
In described product circuit plate, commutation circuit is set; Described commutation circuit comprises: first interface, the second interface that ground pin is connected for the treatment of with described connector; And the 3rd interface to be connected with the measured signal of described main circuit;
Switch the input signal of described first interface, make when the described first interface of described commutation circuit puts sky, described connector treat that ground pin exports the measured signal of described main circuit, when the described first interface access power supply signal of described commutation circuit, described connector treat ground pin ground connection.
Described method of testing, also comprises:
Arrange a testing circuit board, described testing circuit board is provided with test point, with described connector, described test point treats that ground pin is connected, and makes the signal by measuring described test point measure the corresponding signal that ground pin exports for the treatment of of described connector.
Described commutation circuit comprises: metal-oxide-semiconductor; The grid of described metal-oxide-semiconductor connects the first end of the second resistance; The source ground of described metal-oxide-semiconductor; The drain electrode of described metal-oxide-semiconductor connects the first end of the first resistance; Second end of described second resistance connects the first end of the 3rd resistance and the first end of the 4th resistance, the second end ground connection of described 4th resistance respectively;
Second end of described 3rd resistance is the first interface of described commutation circuit; The drain electrode of described metal-oxide-semiconductor is the second interface of described commutation circuit; Second end of described first resistance is the 3rd interface of described commutation circuit.
The beneficial effect of the embodiment of the present invention is:
The test macro of product circuit plate disclosed in the embodiment of the present invention, by the output signal treating ground pin of test connector, can carry out corresponding test to the measured signal of main circuit in circuit board easily.
Accompanying drawing explanation
The connection diagram of the test macro of the product circuit plate that Fig. 1 provides for the embodiment of the present invention;
The circuit diagram of commutation circuit in the test macro of the product circuit plate that Fig. 2 provides for the embodiment of the present invention;
Fig. 3 is the connection diagram of HDMI of the prior art;
Fig. 4 is the connection diagram of the pin two of HDMI in the test macro of product circuit plate in the embodiment of the present invention;
The schematic diagram of the method for testing of the product circuit plate that Fig. 5 provides for the embodiment of the present invention.
Embodiment
For making the object, technical solutions and advantages of the present invention clearly, below in conjunction with accompanying drawing, embodiment of the present invention is described further in detail.
As shown in Figure 1, be the test macro of a kind of product circuit plate of the present invention, described test macro comprises: the product circuit plate 11 with connector 111;
Described product circuit plate 11 also comprises: commutation circuit 112 and main circuit 113; Main circuit can be the miscellaneous part in product circuit plate 11 except commutation circuit 112.
Described commutation circuit 112 comprises: first interface, the second interface that ground pin is connected for the treatment of with described connector; And the 3rd interface to be connected with the measured signal of described main circuit.
Described commutation circuit 112 for, when switching the input signal of described first interface, described connector treat that ground pin exports corresponding signal.
Described when switching the input signal of described first interface, described connector treat that ground pin exports corresponding signal and is specially:
When described first interface puts sky, described connector treat that ground pin exports the measured signal of described main circuit;
When described first interface access power supply signal, described connector treat ground pin ground connection.
Like this, by testing the output signal treating ground pin of described connector, corresponding test can be carried out to the measured signal of described main circuit easily.That is, connector can connect different external equipments, uses as the custom interface use of described circuit board or the test interface as described circuit board.
As shown in Figure 2, described commutation circuit 112 comprises: metal-oxide-semiconductor Q1; The grid of described metal-oxide-semiconductor Q1 connects the first end of the second resistance R2; The source ground of described metal-oxide-semiconductor Q1; The drain electrode of described metal-oxide-semiconductor Q1 connects the first end of the first resistance R1; Second end of described second resistance R2 connects the first end of the 3rd resistance R3 and the first end of the 4th resistance R4, the second end ground connection of described 4th resistance R4 respectively;
Second end of described 3rd resistance R3 is the first interface of described commutation circuit; The drain electrode of described metal-oxide-semiconductor Q1 is the second interface of described commutation circuit; Second end of described first resistance R1 is the 3rd interface of described commutation circuit 112.
Described test macro also comprises: testing circuit board 12, and described testing circuit board 12 is provided with test point, with described connector 111, described test point treats that ground pin is connected.
Described product circuit plate 11 is arranged in product shell, and described testing circuit board is arranged on outside described product shell.When product is television set, described television set comprises test macro, and product circuit plate is arranged in tv shell, and it is external that described testing circuit board is arranged on institute's television cabin.Like this, when testing circuit board is connected with product circuit plate, can not needing to take housing apart, by measuring the signal of the test point on described circuit board, the signal obtained in product circuit plate can be measured.
The treating that ground pin is connected and be specially of described test point and described connector: with described connector, described test point treats that ground pin is connected by connecting line.
Described connector is the connector of externally fed.That is, the power supply signal of the pin of the power supply signal to be connected in described connector is not the power supply signal supply in product circuit plate, but other equipment connected by product circuit plate supply.
Described connector is high-definition multimedia HDMI or Video Graphics Array USB interface.Accordingly, connecting line can be HDMI connecting line or VGA connecting line.
The present invention also provides a kind of television set, and described television set comprises the test macro of above-mentioned product circuit plate.The present invention can be applied to the quick auxiliary repair exempting to tear open housing of product, be improved to example with the HDMI on TV SKD circuit to be below described, other equipment have also general this principle (such as display etc.) of HDMI mouth, and other ports also can do similar designs (such as USB interface).
The application scenarios that a kind of television set exempts to tear open the test macro of the quick auxiliary repair of back cover is below described.The test macro of signal in a kind of rapid measuring product circuit plate, in the design basis of original circuit board, the interface circuit design of the connector exposed in the periphery of television set adds new circuit function, the testing circuit board that the circuit part newly increased coordinates aerial lug to insert again, directly can measure on the testing circuit board of periphery connection and need not tear machine analysis open to required signal, and when not inserting testing circuit board, the connector of television set can also keep original function constant.
As shown in Figure 3, for the HDMI normal interface of television set of the prior art defines; In HDMI, 2,5,8,11,17 is all treat ground pin, in usually designing, connect earth signal.
HDMI design after improvement in the present invention as shown in Figure 4.
In Fig. 4, signal HDMI-5V voltage is that external equipment is powered to TV.When needing the normal HDMI mouth using TV, after inserting HDMI wire, external equipment can be powered to TV, and metal-oxide-semiconductor Q1 can open by HDMI-5V, and now HDMI-2 pin is connected on the ground, is consistent with normal HDMI function pin.
If what connect is not externally fed equipment, now signal HDMI-5V does not have voltage, Q1 not conducting, and what HDMI-2 pin was communicated with is exactly signal 1 to be measured.
Same reason, increases a few cover metal-oxide-semiconductor, can use HMDI-5 pin measurement signal 2, HDMI-8 pin measurement signal 3, HMDI-11 pin measurement signal 4, HDMI-17 pin measurement signal 5 respectively.
Like this, a PCB tool platelet (being equivalent to above-mentioned testing circuit board) is added by a HDMI wire in product circuit plate outside, PCB tool platelet there is test point, test point is connected with the pin 2,5,8,11,17 etc. of HMDI line, like this, directly can measure the signal on HDMI2,5,8,11,17 on the PCB tool platelet of outside, this signal wants the signal measured to carry out arranging change arbitrarily in TV motherboard (being equivalent to above-mentioned product circuit plate) according to user.
For television set, can carry out necessary voltage and measure, such as 3.3V, 5V, 1.2V, poweron signal, 12V, backlight on/off signal and other users want the signal measured.
Because product circuit plate may there be 2 even 3 HDMI mouths, these interfaces can do similar designs, and the signal that such user can measure will be a lot.
In addition, this Analysis of Nested Design can use in the research and development test manufacture stage, if the follow-up volume production stage, and can by soft copy as above whether paster and HMDI initial condition can be become.For Fig. 4, when test manufacture, R1, R2, R3, R4, Q1 can above, and R5 does not go up part; Just in time contrary when volume production, the resistance of part 0ohm on a R15, other do not go up part.
The invention solves in prior art and must tear the shortcoming that casing carries out analyzing measurement hardware signal open, analyst can be allowed by this invention design, measure the baseband signal (above-mentioned measured signal) in product circuit plate quickly and easily, convenient and strength-saving, without the need to disassembling television rear shell, decrease the activity duration in adverse circumstances, save and tear the machine time open, increase work efficiency.
As shown in Figure 5, be the method for testing of a kind of product circuit plate of the present invention, described product circuit plate is provided with connector and main circuit; Described method comprises:
Step 51, arranges commutation circuit in described product circuit plate; Described commutation circuit comprises: first interface, the second interface that ground pin is connected for the treatment of with described connector; And the 3rd interface to be connected with the measured signal of described main circuit;
Step 52, switches the input signal of described first interface, and what make described connector treats that ground pin exports corresponding signal.
Step 52 is specially:
When described first interface puts sky, described connector treat that ground pin exports the measured signal of described main circuit;
When described first interface access power supply signal, described connector treat ground pin ground connection.
Described method of testing, also comprises:
Step 53, one testing circuit board is set, described testing circuit board is provided with test point, with described connector, described test point treats that ground pin is connected, and makes the signal by measuring described test point measure the corresponding signal that ground pin exports for the treatment of of described connector.
The foregoing is only preferred embodiment of the present invention, be not intended to limit protection scope of the present invention.All any amendments done within the spirit and principles in the present invention, equivalent replacement, improvement etc., be all included in protection scope of the present invention.
Claims (10)
1. a test macro for product circuit plate, is characterized in that, described test macro comprises: the product circuit plate with connector;
Described product circuit plate also comprises: commutation circuit and main circuit;
Described commutation circuit comprises: first interface, the second interface that ground pin is connected for the treatment of with described connector; And the 3rd interface to be connected with the measured signal of described main circuit;
Described commutation circuit is used for, when described first interface puts sky, described connector treat that ground pin exports the measured signal of described main circuit, when described first interface access power supply signal, described connector treat ground pin ground connection.
2. test macro according to claim 1, is characterized in that, described commutation circuit comprises: metal-oxide-semiconductor; The grid of described metal-oxide-semiconductor connects the first end of the second resistance; The source ground of described metal-oxide-semiconductor; The drain electrode of described metal-oxide-semiconductor connects the first end of the first resistance; Second end of described second resistance connects the first end of the 3rd resistance and the first end of the 4th resistance, the second end ground connection of described 4th resistance respectively;
Second end of described 3rd resistance is the first interface of described commutation circuit; The drain electrode of described metal-oxide-semiconductor is the second interface of described commutation circuit; Second end of described first resistance is the 3rd interface of described commutation circuit.
3. test macro according to claim 1, is characterized in that, described test macro also comprises: testing circuit board, and described testing circuit board is provided with test point, with described connector, described test point treats that ground pin is connected.
4. test macro according to claim 3, is characterized in that, the treating that ground pin is connected and be specially of described test point and described connector: with described connector, described test point treats that ground pin is connected by connecting line.
5. test macro according to claim 1, is characterized in that, described product circuit plate is arranged in product shell, and described testing circuit board is arranged on outside described product shell.
6. test macro according to claim 1, is characterized in that, described connector is the connector of externally fed.
7. a television set, is characterized in that, described television set comprises the test macro of the product circuit plate described in the arbitrary claim of claim 1-6.
8. a method of testing for product circuit plate, is characterized in that, described product circuit plate is provided with connector and main circuit; It is characterized in that, described method comprises:
In described product circuit plate, commutation circuit is set; Described commutation circuit comprises: first interface, the second interface that ground pin is connected for the treatment of with described connector; And the 3rd interface to be connected with the measured signal of described main circuit;
Switch the input signal of described first interface, make when the described first interface of described commutation circuit puts sky, described connector treat that ground pin exports the measured signal of described main circuit, when the described first interface access power supply signal of described commutation circuit, described connector treat ground pin ground connection.
9. method of testing according to claim 8, is characterized in that, also comprises:
Arrange a testing circuit board, described testing circuit board is provided with test point, with described connector, described test point treats that ground pin is connected, and makes the signal by measuring described test point measure the corresponding signal that ground pin exports for the treatment of of described connector.
10. method of testing according to claim 8, is characterized in that, described commutation circuit comprises: metal-oxide-semiconductor; The grid of described metal-oxide-semiconductor connects the first end of the second resistance; The source ground of described metal-oxide-semiconductor; The drain electrode of described metal-oxide-semiconductor connects the first end of the first resistance; Second end of described second resistance connects the first end of the 3rd resistance and the first end of the 4th resistance, the second end ground connection of described 4th resistance respectively;
Second end of described 3rd resistance is the first interface of described commutation circuit; The drain electrode of described metal-oxide-semiconductor is the second interface of described commutation circuit; Second end of described first resistance is the 3rd interface of described commutation circuit.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201511003826.4A CN105491375B (en) | 2015-12-28 | 2015-12-28 | The test system and method and television set of a kind of product circuit plate |
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| Application Number | Priority Date | Filing Date | Title |
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| CN201511003826.4A CN105491375B (en) | 2015-12-28 | 2015-12-28 | The test system and method and television set of a kind of product circuit plate |
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| CN105491375A true CN105491375A (en) | 2016-04-13 |
| CN105491375B CN105491375B (en) | 2018-02-16 |
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Cited By (1)
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| CN107015555A (en) * | 2017-04-25 | 2017-08-04 | 歌尔股份有限公司 | A kind of interactive signal test device |
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| CN201577167U (en) * | 2010-01-04 | 2010-09-08 | 青岛海信电器股份有限公司 | Circuit board selectively-cutting testing circuit and a television testing circuit |
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| CN105491375B (en) | 2018-02-16 |
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