CN105467330A - LED power supply aging test tool - Google Patents
LED power supply aging test tool Download PDFInfo
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- CN105467330A CN105467330A CN201410458518.XA CN201410458518A CN105467330A CN 105467330 A CN105467330 A CN 105467330A CN 201410458518 A CN201410458518 A CN 201410458518A CN 105467330 A CN105467330 A CN 105467330A
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- connector
- led power
- series
- testing jig
- aging testing
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- 238000012360 testing method Methods 0.000 title claims abstract description 32
- 230000032683 aging Effects 0.000 title claims abstract description 24
- 239000004568 cement Substances 0.000 abstract description 5
- 238000010586 diagram Methods 0.000 description 4
- 238000012986 modification Methods 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
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Abstract
The invention discloses an LED power supply aging test tool comprising multiple connectors and multiple analog load groups. All the connectors are connected in series. Each connector is provided with a positive electrode end and a negative electrode end. The positive electrode end and the negative electrode end of each connector can be connected in a shorting way via a jumper wire. The positive electrode end and the negative electrode end of the first connector can be connected in the shorting way via the jumper wire and grounded. The positive electrode end and the negative electrode end of the last connector can be connected in the shorting way via the jumper wire. One analog load group is connected in series between every two connectors. Different specifications of LED power supply aging testing can be achieved by only one set of tool so that the design is simple and operation is easy; besides, cement resistors do not need to be used so that the tool is small in size and low in weight; and normal output of an LED power supply can be detected by using light-emitting diodes.
Description
[technical field]
The present invention relates to aging testing jig, particularly relate to a kind of LED power aging testing jig.
[background technology]
For different PowerLED (LED power) products, such as 3W, 5W, 10W, 15W etc., when doing burnin (aging) test to LED power product, can use the fictitious load of different equivalent resistance usually.
Because the output voltage of each product, output current is all different, and load is also all different.When current product line is tested for different LED power, adopt different cement resistors to be used as fictitious load, correspondingly design the aging testing jig adapting to different LED power supply.
But, above-mentioned aging testing jig, because different LED power products just needs to design different tools, therefore tool is various; In addition, because the volume of cement resistor is very large, weight is very heavy, therefore, tool takes up room greatly, operate trouble.
In view of this, be necessary to develop a kind of LED power aging testing jig, to solve the problem in fact.
[summary of the invention]
Therefore, the object of this invention is to provide a kind of LED power aging testing jig, need to use different tool during to solve and to do burn-in test for the LED power product of different voltage specification, design trouble, complex operation and the problem that existing tool volume is large, weight is large.
In order to achieve the above object, LED power aging testing jig provided by the invention, comprising:
Several connectors, be connected in series between each connector, each connector has positive terminal and negative pole end, by wire jumper short circuit between the positive terminal of each described connector and negative pole end, with wire jumper short circuit and ground connection between the positive terminal of first connector and negative pole end, with wire jumper short circuit between the positive terminal of an end connector and negative pole end;
Several fictitious load groups, are serially connected with a described fictitious load group between every two described connectors.
Alternatively, described each fictitious load group comprises several bridges heap (bridgediode) be connected in series.
Alternatively, described bridge heap adopts model to be the electronic component of US8KB80R.
Alternatively, first described fictitious load group comprises five bridge heaps be connected in series, and all the other each fictitious load groups comprise two bridge heaps be connected in series.
Alternatively, the pressure drop of each described bridge heap is 1.4V.
Alternatively, described connector number is 17, and the number of described fictitious load group is 16.
Alternatively, except first connector, between the positive terminal of each connector described in all the other and ground, be connected in series with light emitting diode and resistance.
Compared to prior art, utilize LED power aging testing jig of the present invention, in time using, first connector is connected by needing the LED power negative pole carrying out burn-in test, LED power positive pole connects the connector chosen, respectively with wire jumper short circuit between the positive terminal of each described connector between the described connector chosen and described first connector and negative pole end, each fictitious load group between the connector chosen described in making with described first connector connect after total pressure drop be greater than 80% of LED power output voltage to be tested and be less than or equal to its output voltage.Because the LED power of the different output voltage of correspondence carries out burn-in test, only need to select corresponding connector positive terminal to be connected with LED power positive pole, and by between the positive terminal of each described connector between the connector chosen and described first connector and negative pole end respectively with wire jumper short circuit, can reach.Therefore, only need a set of tool can reach the LED power burn-in test of different size, simplicity of design, simple to operate; And do not need to use cement resistor, tool volume is little, lightweight; The use of light emitting diode more can detect whether LED power normally exports.
[accompanying drawing explanation]
Fig. 1 illustrates the electrical block diagram into LED power aging testing jig one of the present invention preferred embodiment.
Fig. 2 illustrates the electrical block diagram into a preferred embodiment of the present invention jackshaft heap.
[embodiment]
Refer to Fig. 1, Fig. 1 illustrates the electrical block diagram into LED power aging testing jig of the present invention.
In order to achieve the above object, LED power aging testing jig provided by the invention, comprising:
Several connectors 100, be connected in series between each connector 100, each connector 100 has positive terminal 101 and negative pole end 102, by wire jumper short circuit between the positive terminal 101 of each described connector 100 and negative pole end 102, with wire jumper short circuit and ground connection between the positive terminal 101 of first connector 100 and negative pole end 102, with wire jumper short circuit between the positive terminal 101 of an end connector 100 and negative pole end 102;
Several fictitious load groups, a described fictitious load group is serially connected with between every two described connectors 100, wherein, each described each fictitious load group can be comprise several bridge heaps 200 be connected in series (please to combine again and consult Fig. 2, Fig. 2 illustrates the electrical block diagram into a preferred embodiment of the present invention jackshaft heap), described bridge heap 200 is such as the electronic component of model US8KB80R, and the pressure drop of each described bridge heap 200 is 1.4V.
In the present embodiment, first described fictitious load group comprises five bridge heaps 200 be connected in series, and all the other each fictitious load groups comprise two bridge heaps 200 be connected in series.Described connector 100 number is 17, and the number of described fictitious load group is 16.
Utilize LED power aging testing jig of the present invention, in time using, first connector 100 is connected by needing the LED power negative pole carrying out burn-in test, LED power positive pole connects the connector 100 chosen, respectively with wire jumper short circuit between the positive terminal 101 of each described connector 100 between the described connector 100 chosen and described first connector 100 and negative pole end 102, each fictitious load group between the connector 100 chosen described in making with described first connector 100 connect after total pressure drop be greater than 80% of LED power output voltage to be tested and be less than or equal to its output voltage, to guarantee that described LED power has higher load factor when carrying out burn-in test and can not exceed its output voltage.
Because the LED power of the different output voltage of correspondence carries out burn-in test, only need to select corresponding connector 100 positive terminal 101 to be connected with LED power positive pole, and by between the positive terminal 101 of each described connector 100 between the connector 100 chosen and described first connector 100 and negative pole end 102 respectively with wire jumper short circuit, can reach.In this way, for following situation: the number of described fictitious load group is 16, first described fictitious load group comprises five bridge heaps 200 be connected in series, and all the other each fictitious load groups comprise two bridge heaps 200 be connected in series, and the pressure drop of each described bridge heap 200 is 1.4V.Then can reach the pressure drop after following 16 series connection: 7V, 9.8V, 12.6V, 15.4V, 18.2V, 21V, 23.8V, 26.6V, 29.4V, 32.2V, 35V, 37.8V, 40.6V, 43.4V, 46.2V, 49V.Therefore, only need a set of tool can reach the LED power burn-in test of different size, simplicity of design, simple to operate; And do not need to use cement resistor, tool volume is little, lightweight.
Alternatively, except first connector 100, be connected in series with light emitting diode 300 and resistance 400 between the positive terminal 101 of each connector 100 described in all the other and ground, described resistance 400 for dividing potential drop guarantee light emitting diode 300 two ends operating voltage (resistance of described resistance 400 can be chosen as according to this 500 ohm, 700 ohm, 900 ohm, 1.1K ohm, 1.3K ohm, 1.5K ohm, 1.7K ohm, 1.9K ohm, 2.1K ohm, 2.3K ohm, 2.5K ohm, 2.7K ohm, 2.9K ohm, 3.1K ohm, 3.3K ohm, 3.5K ohm).The use of light emitting diode 300 more can detect whether LED power normally exports.
It is noted that the invention is not restricted to above-mentioned embodiment, any simple modification that any those skilled in the art do above-described embodiment based on technical solution of the present invention, equivalent variations and modification, all fall within the scope of protection of the present invention.
Claims (7)
1. a LED power aging testing jig, is characterized in that, it comprises:
Several connectors, be connected in series between each connector, each connector has positive terminal and negative pole end, by wire jumper short circuit between the positive terminal of each described connector and negative pole end, with wire jumper short circuit and ground connection between the positive terminal of first connector and negative pole end, with wire jumper short circuit between the positive terminal of an end connector and negative pole end;
Several fictitious load groups, are serially connected with a described fictitious load group between every two described connectors.
2. LED power aging testing jig as claimed in claim 1, is characterized in that, described each fictitious load group comprises several bridge heaps be connected in series.
3. LED power aging testing jig as claimed in claim 2, is characterized in that, described bridge heap adopts model to be the electronic component of US8KB80R.
4. LED power aging testing jig as claimed in claim 2, is characterized in that, first described fictitious load group comprises five bridge heaps be connected in series, and all the other each fictitious load groups comprise two bridge heaps be connected in series.
5. LED power aging testing jig as claimed in claim 2, is characterized in that, the pressure drop of each described bridge heap is 1.4V.
6. LED power aging testing jig as described in any of claims 1, is characterized in that, described connector number is 17, and the number of described fictitious load group is 16.
7. the LED power aging testing jig according to any one of claim 1-6, is characterized in that, except first connector, is connected in series with light emitting diode and resistance between the positive terminal of each connector described in all the other and ground.
Priority Applications (1)
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CN201410458518.XA CN105467330B (en) | 2014-09-10 | 2014-09-10 | LED power aging testing jig |
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CN201410458518.XA CN105467330B (en) | 2014-09-10 | 2014-09-10 | LED power aging testing jig |
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CN105467330A true CN105467330A (en) | 2016-04-06 |
CN105467330B CN105467330B (en) | 2018-06-26 |
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Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN109507562A (en) * | 2018-12-24 | 2019-03-22 | 南昌易美光电科技有限公司 | A kind of circuit board and method for lamp bead senile experiment |
CN111830384A (en) * | 2019-04-12 | 2020-10-27 | 博计电子股份有限公司 | Low-pressure drop electronic load connecting device |
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US20050242822A1 (en) * | 2004-04-30 | 2005-11-03 | Siemens Aktiengesellschaft | Method and device for testing at least one LED strip |
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US20140184265A1 (en) * | 2012-12-29 | 2014-07-03 | Hon Hai Precision Industry Co., Ltd. | Test circuit for power supply unit |
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2014
- 2014-09-10 CN CN201410458518.XA patent/CN105467330B/en not_active Expired - Fee Related
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US20050242822A1 (en) * | 2004-04-30 | 2005-11-03 | Siemens Aktiengesellschaft | Method and device for testing at least one LED strip |
CN102445635A (en) * | 2010-10-11 | 2012-05-09 | 中国电信股份有限公司 | Quick tester for wire jumper |
CN102692594A (en) * | 2011-03-21 | 2012-09-26 | 海洋王照明科技股份有限公司 | Tool and method for testing constant current of LED drive board |
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Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN109507562A (en) * | 2018-12-24 | 2019-03-22 | 南昌易美光电科技有限公司 | A kind of circuit board and method for lamp bead senile experiment |
CN109507562B (en) * | 2018-12-24 | 2024-05-14 | 南昌易美光电科技有限公司 | Circuit board and method for lamp bead aging experiment |
CN111830384A (en) * | 2019-04-12 | 2020-10-27 | 博计电子股份有限公司 | Low-pressure drop electronic load connecting device |
CN111830384B (en) * | 2019-04-12 | 2023-02-28 | 博计电子股份有限公司 | Low-pressure drop electronic load connecting device |
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