CN105444817B - The reading circuit and its reading method of resistive compound sensor array - Google Patents
The reading circuit and its reading method of resistive compound sensor array Download PDFInfo
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- CN105444817B CN105444817B CN201610003423.8A CN201610003423A CN105444817B CN 105444817 B CN105444817 B CN 105444817B CN 201610003423 A CN201610003423 A CN 201610003423A CN 105444817 B CN105444817 B CN 105444817B
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
- G01D21/00—Measuring or testing not otherwise provided for
- G01D21/02—Measuring two or more variables by means not covered by a single other subclass
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
- G01D5/00—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable
- G01D5/12—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable using electric or magnetic means
- G01D5/14—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable using electric or magnetic means influencing the magnitude of a current or voltage
- G01D5/16—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable using electric or magnetic means influencing the magnitude of a current or voltage by varying resistance
Abstract
The invention discloses a kind of reading circuit of resistive compound sensor array, belong to sensor technical field.The present invention is for the data reading speed problem for the two-dimensional array being made up of the resistive compound sensor for including the end resistance sensing unit of odd number two, based on twin voltage feedback transmitter, array of designs structure and corresponding reading circuit, single detection can read the resistance of the sensitive resistive unit of two different physical quantities in same resistive compound sensor, so as to greatly improve the Data Detection speed of sensor array, while the effectively complexity of reduction sensor-based system.The invention also discloses the reading method of the reading circuit.Compared with prior art, detection speed of the present invention faster, and can carry out repeated detection in single pass to some resistive sensing units to be measured that need high-frequency to detect, in addition, circuit complexity and cost of implementation of the invention is lower.
Description
Technical field
The present invention relates to sensor technical field, more particularly to a kind of resistive compound sensor array reading circuit and its
Reading method.
Background technology
Array sensing device is exactly, by multiple sensing elements with same performance, to be combined according to the structure of two-dimensional array
Together, it can change by detecting the Parameters variation focused on array or generate corresponding form and feature.This is special
Property is widely used in terms of bio-sensing, temperature tactile and thermal imaging based on infrared sensor etc..
Resistive sensor array is widely used in Simulations of Infrared Image system, power tactilely-perceptible and temperature tactilely-perceptible.With
Exemplified by temperature tactile, due to being related to the transmission of heat and the perception of temperature in temperature sensation sensing device, to obtain the heat category of object
Property, device proposes higher requirement to temperature measurement accuracy and resolution ratio, and in order to further obtain object diverse location material
The hot attribute that matter is shown, then propose higher spatial resolving power requirement to temperature sensation sensing device.
The quality or resolution ratio of resistive sensor array are needed by increasing the quantity of the sensor in array come increased.
However, when the scale of sensor array is increased, information gathering and signal transacting to all components just become difficult.General feelings
Under condition, the progress of all resistive sensors of a M N array is accessed one by one, and each resistive sensor has two
Individual port, needs 2 × M × N root connecting lines altogether.Not only line is complicated for this connected mode, and can only select single treat every time
Measuring resistance, sweep speed is slow, and the cycle is long, and efficiency is low.To reduce the complexity of device interconnection, shared line and alignment can be introduced
Two-dimensional array, scanning monitor is combined with single operational amplification circuit and MUX, nevertheless, still can only be real
The measurement of existing single testing resistance, therefore how to choose multiple testing resistances simultaneously in each scanning and just attacked into needs together
Gram problem.
Detection on resistance-type sensor array is studied, and R.S.Saxena in 2006 et al. is proposed based on infrared thermal imaging
Array technology, test structure be based on resistance sensing network configuration, based on resistance it is linear with it is homogeneity using compensate
Network theorem and stacking network theorem develop the theoretical model of the resistor network.Use 16 × 16 array network bolometer battle arrays
Row checking, using only 32 pins, it has already been proven that, the model can be effective for the minor variations of device failure or device value
Differentiate, it has certain precision, but still there is technological deficiency in detection speed.Y.J.Yang in 2009 et al. is proposed
The temperature and tactile sensing array of one 32 × 32 array, for the artificial skin of mechanical arm, are added many in array network
Road selector, row selection is greatly speeded up with column selection speed, and maximum detection rates can reach 3000 sensing units per second, but
The detection of the array can only also detect single to-be-measured cell every time, and detection efficiency turns into maximum technical bottleneck.
One Chinese invention patent (CN201110148963.2) discloses a kind of array temperature touch sensing device, adopts
The sensing of temperature tactile is realized with resistance sensor array, it feeds back voltage that testing resistance is expert at by driving isolation circuit through row
Terminal voltage VSG after selector feeds back to non-selected line and alignment, although have to precision improves to a certain degree, but not in inspection
It is had breakthrough on degree of testing the speed.Separately there is Chinese invention patent CN201410183065《A kind of resistive sensing battle array for strengthening Voltage Feedback
The detection circuit of row》, it selects scanning monitor, feedback circuit, row multichannel on the basis of patent CN201110148963.2
Select device and row MUX is combined, wherein feedback circuit is made up of single operational amplifier and bleeder circuit, in bleeder circuit
Resistance R1 and resistance R2 selects the resistance of specific resistance, and resistance R1 and resistance R2 ratio are defined into R1: R2=Rr: Rs, its
In, Rr represents the passage internal resistance of row MUX, and Rs represents sampling resistor.Although this method can effectively reduce testing resistance
Adjacent column resistance and row MUX the interference that measures measured resistance of internal resistance, significantly improve its measurement accuracy, but according to
Single testing resistance so can only be selected every time, so in detection speed, in addition it is also necessary to further improve and improve.
With the development of sensor technology, the resistive compound sensor of a class is occurred in that at present, each sensor is by multiple
Two end resistance sensing units are constituted, and multiple identical or different physical quantitys can be detected simultaneously.For resistive multiple by this class
The sensor array that sensor is constituted is closed, measurement is such as scanned using traditional Voltage Feedback method, same single measurement is only
The resistance of single resistive sensing unit can be obtained, detection speed is relatively low.Further, since the resistive sensing unit in sensor array
Quantity is bigger, and the wiring quantity needed for thus also bringing group battle array is excessive, the problem of complexity is too high.
The content of the invention
The technical problems to be solved by the invention are to overcome prior art not enough, and there is provided a kind of resistive compound sensor battle array
The reading circuit and its reading method of row, for the two-dimensional array being made up of resistive compound sensor, based on twin voltage feedback
Method, improves the quantity for the resistive sensing unit that single detection can be read, so that detection speed is improved, while effectively reduction sensing
The complexity of system.
A kind of reading circuit of resistive compound sensor array, the resistive compound sensor array is M × N number of resistive multiple
Close the two-dimensional array that sensor is constituted；Each resistive compound sensor includes 2K+1 two end resistance sensing units, each resistance
Property sensing unit one end access the public point of the resistive compound sensor, the other end is an individual end points, each resistive
Compound sensor has 2K+2 end points；The public point of the resistive compound sensor of same row is connected with each other, and constitutes the row resistive
The shared alignment of compound sensor, the other end with i-th of resistive sensing unit in the resistive compound sensor of a line is connected with each other,
Constitute i-th shared line of the resistive compound sensor of the row, i=1,2 ..., 2K+1；K is non-zero natural number；It is described to read electricity
Road includes：Row MUX, row MUX, scanning monitor, first voltage feedback driving circuit, second voltage feedback
Drive circuit, sampling resistor, test voltage input；Sampling resistor one end is grounded, other end connection first voltage feedback driving
The input of circuit；2K+1 bars per the resistive compound sensor of a line share line and are divided into advance according to identical packet mode
Two groups；Shared line for belonging to first group, row MUX can cause any of which to be total under scanning monitor control
Connected and disconnected with the output end of second voltage feedback driving circuit with line and test voltage input, or and second voltage
The output end of feedback driving circuit is connected and disconnected with test voltage input；Shared line for belonging to second group, row is more
Road selector can cause any of which to share the input of line and first voltage feedback driving circuit under scanning monitor control
Termination is led to and disconnected with the output end of second voltage feedback driving circuit, or the output end with second voltage feedback driving circuit
Connect and disconnected with the input of first voltage feedback driving circuit；Row MUX can cause under scanning monitor control
The input of any shared alignment and second voltage feedback driving circuit connect and with the output of first voltage feedback driving circuit
End disconnects, or with the output end of first voltage feedback driving circuit connect and with the input of second voltage feedback driving circuit
Disconnect.
Preferably, the first voltage feedback driving circuit includes the first operational amplifier and the first drive circuit, first
The inverting input of operational amplifier is connected with the output end of the first operational amplifier and the input of the first drive circuit, and first
The in-phase input end of operational amplifier, the first drive circuit output end respectively as first voltage feedback driving circuit input
End, the output end of first voltage feedback driving circuit；The second voltage feedback driving circuit include the second operational amplifier and
The output end and the second drive circuit of second drive circuit, the inverting input of the second operational amplifier and the second operational amplifier
Input connection, the in-phase input end of the second operational amplifier, the output end of the second drive circuit are respectively as second voltage
The input of feedback driving circuit, the output end of second voltage feedback driving circuit.
Preferably, the shared line of 2K+1 bars per the resistive compound sensor of a line is divided into quantity is respectively K, K+1 two
Group.
Preferably, the row MUX includes sharing line one with M (2K+1) bar of resistive compound sensor array
The one corresponding individual alternative bilateral analog switch of M (2K+1)；According to the packet situation of shared line, this M (2K+1) individual alternative
Bilateral analog switch is divided into corresponding two groups；For each alternative bilateral analog switch in first group, its is public defeated
Enter/output end is connected with the shared line corresponding to it, two independent input/output end respectively with test voltage input,
The output end connection of second voltage feedback driving circuit, its control signal input is connected with scanning monitor；For second group
In each alternative bilateral analog switch, its public input/output terminal is connected with the shared line corresponding to it, two
Independent input/output end input respectively with first voltage feedback driving circuit, the output of second voltage feedback driving circuit
End connection, its control signal input is connected with scanning monitor.
Preferably, the row MUX includes sharing alignment one-to-one corresponding with the N bars of resistive compound sensor array
N number of alternative bilateral analog switch；For each alternative bilateral analog switch, its public input/output terminal and its institute
Corresponding shared alignment connection, two independent input/output end output end respectively with first voltage feedback driving circuit, the
The input connection of two Voltage Feedback drive circuits, its control signal input is connected with scanning monitor.
As above the reading method of reading circuit described in any technical scheme, scanning monitor control row MUX, make
Shared alignment and the second voltage feedback driving circuit of the resistive compound sensor of current scan list input connect and with the
The output end of one Voltage Feedback drive circuit is disconnected, and remaining output end for sharing alignment and first voltage feedback driving circuit is connected
And disconnected with the input of second voltage feedback driving circuit；Meanwhile, scanning monitor control row MUX so that current
2K+1 bars corresponding to the resistive compound sensor of scan line share a shared line for belonging to first group in line with testing electricity
Press input to connect, second group of a common row is belonged in the shared line of the 2K+1 bars corresponding to the resistive compound sensor of the row
The input of line and first voltage feedback driving circuit is connected, and remaining all shared line in resistive compound sensor array are equal
Connected with the output end of second voltage feedback driving circuit；Then Current Scan row, column intersection is obtained using below equation
In resistive compound sensor, the resistance value for the resistive sensing unit corresponding to shared line connected with test voltage input
R1, and the resistance with the resistive sensing unit corresponding to the shared line of the input connection of first voltage feedback driving circuit
Value R2：
In formula, VIThe test voltage inputted for test voltage input, VS1For the input of first voltage feedback driving circuit
Terminal voltage, VS2For the input terminal voltage of second voltage feedback driving circuit, RSFor the resistance value of the sampling resistor.
Following technical scheme can also be obtained according to identical invention thinking：
A kind of sensing device, including resistive compound sensor array and reading circuit, the resistive compound sensor array
The two-dimensional array being made up of M × N number of resistive compound sensor；It is quick that each resistive compound sensor includes 2K+1 two end resistances
Feel unit, the public point of the resistive compound sensor is accessed in one end of each resistive sensing unit, and the other end is an independence
End points, each resistive compound sensor has 2K+2 end points；The public point of the resistive compound sensor of same row is connected with each other,
Constitute the shared alignment of the resistive compound sensor of the row, with the resistive compound sensor of a line i-th resistive sensing unit it is another
One end is connected with each other, and constitutes i-th shared line of the resistive compound sensor of the row, i=1,2 ..., 2K+1；K is that non-zero is natural
Number；The reading circuit is as above reading circuit described in any technical scheme.
Each resistive compound sensor can include the 2K+1 two end resistance sensing units sensitive to same physical quantitiess,
The 2K+1 two end resistance sensing units sensitive to different physical quantities can be included.It is preferred that the latter, so as to simultaneously to a variety of
Different physical quantitys (such as temperature, pressure, light intensity) are detected.
Compared with prior art, the invention has the advantages that：
First, the present invention be directed to the detection of resistive compound sensor array needs, resistive compound sensor battle array is not being destroyed
Array structure and on the premise of not interrupting the sensor array normal work, to certain resistive compound sensor on any row either rank
The internal resistive sensing unit of any two is detected simultaneously, improves detection speed.
2nd, polling rate of the present invention is improved, cycle time, the shadow that the time that can effectively reduce brings to sensor array
Ring, simultaneously for the sensitive resistive sensing unit to be measured of physical quantity, when physical attribute quickly changes, circuit of the present invention can
Faster discover its change, complete the measurement of variable quantity.
3rd, for some resistive sensing units to be measured for needing high-frequency to detect, this hair in resistive compound sensor array
It is bright to be realized by changing the programming of scanning monitor to the resistance to be measured in a certain in array or some resistive compound sensors
Property sensing unit high-frequency ground repeated detection, also ensured while every other resistive sensing unit detection to be measured is completed compared with
High sweep speed.
4th, the present invention uses twin voltage feedback driving circuit, on the premise of measurement accuracy is ensured, reduces and connects between device
The quantity of line, reduces the cost of circuit to a certain extent.
5th, the present invention uses the resistive compound sensor array for sharing line and alignment, and according to M × N modes two dimension
Distribution, by taking the resistive compound sensor array that each sensor includes three resistive sensing units as an example, totally 3 × M × N number of resistive
Line number can be reduced to 3M+N roots by sensing unit, the present invention, reduce the complexity of device interconnection, it is ensured that in array
Each resistive compound sensor includes the access that its each internal resistive sensing unit has unique row and column combination
Mode.
Brief description of the drawings
Fig. 1 is the resistive compound sensor array schematic diagram for sharing line (x-ray, Y lines, Z lines) and alignment (O lines)；
Fig. 2 is the circuit diagram of a specific embodiment of the invention；
Fig. 3 is the region division schematic diagram of resistive compound sensor array when detecting resistive sensing unit to be measured；
With the electricity of resistive compound sensor same column where resistive sensing unit to be measured when Fig. 4 is reading circuit work of the present invention
Road schematic diagram；
The electricity gone together when Fig. 5 is reading circuit work of the present invention with resistive compound sensor where resistive sensing unit to be measured
Road schematic diagram；
The circuit signal of Fig. 6 non-selected row non-selected row resistive compound sensor arrays when being reading circuit work of the present invention
Figure；
Simplification circuit diagram when Fig. 7 is reading circuit work of the present invention；
Fig. 8 is the circuit and region division schematic diagram of another embodiment of the present invention.
Each label implication is as follows in figure：
1st, resistive compound sensor array, 2, X and Y unit row MUX, 3, Z unit row MUX, 4, row
MUX, 5, scanning monitor voltage, 6, first voltage feedback driving circuit, 7, second voltage feedback driving circuit, 8, X
Cell row MUX Y, 9, Z unit row MUX.
Embodiment
The present invention is directed to what the resistive compound sensor for including the resistive sensing unit of odd number by each sensor was constituted
The data reading speed problem of two-dimensional array, based on twin voltage feedback transmitter, array of designs structure and corresponding reading circuit, single
Detection can read the resistance of two resistive sensing units of difference in same resistive compound sensor, so as to greatly improve sensor
The Data Detection speed of array, while the effectively complexity of reduction sensor-based system.
The technical solution adopted in the present invention is specific as follows：
A kind of reading circuit of resistive compound sensor array, the resistive compound sensor array is M × N number of resistive multiple
Close the two-dimensional array that sensor is constituted；Each resistive compound sensor includes 2K+1 two end resistance sensing units, each resistance
Property sensing unit one end access the public point of the resistive compound sensor, the other end is an individual end points, each resistive
Compound sensor has 2K+2 end points；The public point of the resistive compound sensor of same row is connected with each other, and constitutes the row resistive
The shared alignment of compound sensor, the other end with i-th of resistive sensing unit in the resistive compound sensor of a line is connected with each other,
Constitute i-th shared line of the resistive compound sensor of the row, i=1,2 ..., 2K+1；K is non-zero natural number；It is described to read electricity
Road includes：Row MUX, row MUX, scanning monitor, first voltage feedback driving circuit, second voltage feedback
Drive circuit, sampling resistor, test voltage input；Sampling resistor one end is grounded, other end connection first voltage feedback driving
The input of circuit；2K+1 bars per the resistive compound sensor of a line share line and are divided into advance according to identical packet mode
Two groups；Shared line for belonging to first group, row MUX can cause any of which to be total under scanning monitor control
Connected and disconnected with the output end of second voltage feedback driving circuit with line and test voltage input, or and second voltage
The output end of feedback driving circuit is connected and disconnected with test voltage input；Shared line for belonging to second group, row is more
Road selector can cause any of which to share the input of line and first voltage feedback driving circuit under scanning monitor control
Termination is led to and disconnected with the output end of second voltage feedback driving circuit, or the output end with second voltage feedback driving circuit
Connect and disconnected with the input of first voltage feedback driving circuit；Row MUX can cause under scanning monitor control
The input of any shared alignment and second voltage feedback driving circuit connect and with the output of first voltage feedback driving circuit
End disconnects, or with the output end of first voltage feedback driving circuit connect and with the input of second voltage feedback driving circuit
Disconnect.
The reading method of reading circuit as described above, scanning monitor control row MUX so that current scan list
The shared alignment of resistive compound sensor is connected with the input of second voltage feedback driving circuit and feeds back and drive with first voltage
The output end of dynamic circuit disconnects, remaining output end for sharing alignment and first voltage feedback driving circuit connect and and second voltage
The input of feedback driving circuit disconnects；Meanwhile, scanning monitor control row MUX so that current scan line is resistive multiple
2K+1 bars corresponding to conjunction sensor share a shared line for belonging to first group in line and test voltage input is connected,
2K+1 bars corresponding to the resistive compound sensor of the row, which are shared, belongs to second group of a shared line and first voltage in line
The input of feedback driving circuit is connected, and remaining all shared line in resistive compound sensor array are anti-with second voltage
The output end for presenting drive circuit is connected；Then the resistive composite sensing of Current Scan row, column intersection is obtained using below equation
In device, the resistance value R1 for the resistive sensing unit corresponding to shared line connected with test voltage input, and with first
The resistance value R2 for the resistive sensing unit corresponding to shared line that the input of Voltage Feedback drive circuit is connected：
In formula, VIThe test voltage inputted for test voltage input, VS1For the input of first voltage feedback driving circuit
Terminal voltage, VS2For the input terminal voltage of second voltage feedback driving circuit, RSFor the resistance value of the sampling resistor.
For the ease of public understanding, the resistive multiple of three resistive sensing units is included with simplest each sensor below
Exemplified by closing sensor array, and technical solution of the present invention is further described in detail with reference to accompanying drawing.
Resistive compound sensor array (M × N) structure in the present embodiment is as shown in figure 1, it is by M × N number of resistive multiple
The two-dimensional array that sensor is constituted is closed, it shares line (x-ray, Y lines, Z lines) and alignment (O lines), and line (x-ray, Y lines, Z lines) is
It is orthogonal with alignment (O lines).There are three resistive sensing unit (R in each resistive compound sensor in arrayx、Ry、Rz), three
One end of resistive sensing unit is connected with each other to public terminal (O lines), and each also has independent connection terminal (x-ray, a Y
Line, Z lines).The two dimension connection in the way of common row alignment of M × N number of resistive compound sensor, M is line number, and N is columns, each column
O lines link together, have N root alignments, often capable x-ray links together, often capable Y lines link together, often capable Z lines
Link together, each resistive sensing unit having in each resistive compound sensor in 3M root lines, array has only
The combination of one line and alignment.Each resistive compound sensor is carried out according to M × N two-dimensional structure in such a manner
Distribution, it is only necessary to which 3M+N root line numbers can ensure the specific resistive sensitivity in any one specific resistive compound sensor
Unit can be by controlling the respective combination of line and alignment to be accessed.It is distributed according to M × N two-dimensional array structure, wherein, M
For line number, N is columns, X unit, Y unit, the resistive sensitivity of Z unit in the resistive compound sensor that the i-th row jth is arranged
Unit uses R respectivelyxij、Ryij、RzijRepresent, wherein i=1,2 ..., M, j=1,2 ..., N.
Based on the resistive compound sensor array shown in Fig. 1, a specific embodiment of the constructed sensing device of the present invention
As shown in Figure 2 (with Rx11And Rz11Exemplified by resistive sensing unit to be measured).As shown in Fig. 2 the sensing device includes common row
The resistive compound sensor array 1 of line (x-ray, Y lines, Z lines) and alignment (O lines), and reading circuit, the reading circuit bag
Include：X and Y unit row MUX 2, Z unit row MUX 3, row MUX 4, the electricity of scanning monitor 5, first
Press feedback driving circuit 6, second voltage feedback driving circuit 7.X-ray, Y lines, Z lines are divided into two groups in the present embodiment, one group is X
Line and Y lines, another group is Z lines.In order to simplify circuit, the X and Y unit row MUX 2, Z in cost, the present embodiment are reduced
Cell row MUX 3, row MUX 4 be respectively adopted 2M, M, N number of alternative bilateral analog switch (for example most
Common controllable single-pole double-throw switch (SPDT)) build, the control end of each alternative bilateral analog switch be connected with scanning monitor 5 and by
It is controlled.
As shown in Fig. 2 the public input of M alternative bilateral analog switch in X and Y unit row MUX 2/defeated
Go out to hold xriEnd (i=1,2 ..., M) connected one to one with the M bar x-rays of resistive compound sensor array, this M alternative is two-way
One of independent input/output end a of analog switchr1、ar2、…、arMEnd and test voltage VIIt is connected, another is independent defeated
Enter/output end br1、br2、…、brMEnd is connected with the output end of second voltage feedback driving circuit 7；X and Y unit row multi-path choice
The public input/output terminal y of other M alternative bilateral analog switch in device 2riEnd (i=1,2 ..., M) with it is resistive it is compound pass
The M bar Y lines of sensor array connect one to one, one of independent input/output end of this M alternative bilateral analog switch
cr1、cr2、…、crMEnd and test voltage VIIt is connected, another independent input/output end dr1、dr2、…、drMEnd and second voltage
The output end of feedback driving circuit 7 is connected；M alternative bilateral analog switch in Z unit row MUX 3 it is public defeated
Enter/output end zriEnd (i=1,2 ..., M) connected one to one with the M bar Z lines of resistive compound sensor array, this M two is selected
One of independent input/output end e of one bilateral analog switchr1、er2、…、erMEnd and second voltage feedback driving circuit 7
Output end be connected, another independent input/Ausgangr1、fr2、…、frMEnd and the input of first voltage feedback driving circuit 6
End is connected；The public input/output terminal o of N number of alternative bilateral analog switch of row MUX 4cjEnd (j=1,2 ..., N)
Connected one to one with the N bar O lines of resistive compound sensor array, one of them of this N number of alternative bilateral analog switch is only
Vertical input/output terminal ac1、ac2、…、acNEnd is connected with the output end of first voltage feedback driving circuit 6, and another is independent defeated
Enter/output end bc1、bc2、…、bcNEnd is connected with the input of second voltage feedback driving circuit 7.The output of scanning monitor 4 is swept
Control signal is retouched, the connected mode of each MUX inner port is controlled, X and Y unit row MUX 2 pass through X and Y unit
Row control signal, controls x respectivelyriEnd and ariEnd or and briEnd connection, yriEnd and criEnd or and driEnd connection；Z unit row is more
Road selector 3 controls z by Z unit row control signalriEnd and eriEnd or and friEnd connection；Row MUX 4 passes through row
Control signal, controls ocjEnd and acjEnd or and bcjEnd connection.It thus can simultaneously select and be located at the resistance that the i-th row jth is arranged in array
Property compound sensor in any two resistive sensing unit to be measured detect simultaneously, and can ensure to realize and travel through in array
All resistive sensing units to be measured.
As shown in Fig. 2 the first voltage feedback driving circuit 6 in the present embodiment includes operational amplifier 1 (AMP1) with driving
Dynamic circuit 1 (Drive1), the in-phase input end of operational amplifier 1 as first voltage feedback driving circuit 6 input, and
And, the input of first voltage feedback driving circuit 6 is connected with sampling resistor Rs one end, sampling resistor Rs another termination
Ground, the output end of first voltage feedback driving circuit 6 is connected with the inverting input of operational amplifier 1, while first voltage is anti-
The output end for presenting drive circuit 6 connects the input and ADC1 of drive circuit 1；Second voltage feedback driving circuit 7 includes fortune
Amplifier 2 (AMP2) and drive circuit 2 (Drive2) are calculated, the in-phase input end of operational amplifier 2 feeds back as second voltage to be driven
The input of dynamic circuit 7, its inverting input connection output end formation feedback, meanwhile, the output end connection of operational amplifier 2 is driven
The input and ADC2 of dynamic circuit 2.
Fig. 3 show detect resistive sensing unit to be measured when resistive compound sensor array region division, the figure with
Rx11And Rz11Exemplified by resistive sensing unit to be measured.As shown in figure 3, positioned at the resistive compound sensor of the first row first row
X-ray and X and a of Y unit row MUXr1End is connected, Y lines and X and the d of Y unit row MUXr1End is connected, Z lines
With the f of Z unit row MUXr1End is connected, the b of O lines and row MUXc1End is connected, now Rx11And Rz11It is chosen
Measurement.The present invention can be simultaneously scanned to the two resistive sensing units to be measured.Pass through resistive sensing unit R to be measuredx11With
Rz11Resistive compound sensor array is divided into 4 regions by the resistive compound sensor at place：
1) I areas：Resistive sensing unit R to be measuredx11And Rz11In the resistive compound sensor of the first row first row, now
Resistive sensing unit Rx11Separate end be expert at 1 xr1End and ar1End is connected, ar1The magnitude of voltage at end is test voltage VI, it is resistive quick
Feel unit Rx11The o of common port column 1c1End and bc1End is connected, bc1The magnitude of voltage at end is test voltage Vs2, now resistive sensitivity
Unit Rx11Chosen measurement；Resistive sensing unit Rz11Separate end be expert at 1 zr1End and fr1End is connected, fr1The magnitude of voltage at end
For sampled voltage Vs1, resistive sensing unit Rz11The o of common port column 1c1End and bc1End is connected, bc1The magnitude of voltage at end is test
Voltage Vs2, now resistive sensing unit Rz11Chosen measurement；Resistive sensing unit Ry11Separate end be expert at 1 yr1End and dr1
End is connected, dr1The magnitude of voltage at end is the second feedback voltage VF2。
2) II areas：With resistive sensing unit R to be measuredx11And Rz11The resistive compound sensor in place is in the non-to be measured of same row
The resistive compound sensor of adjacent lines, (M-1) is individual altogether, is somebody's turn to do the shared alignment of (M-1) individual non-adjacent resistive compound sensor to be measured and is
Resistive sensing unit R to be measuredx11And Rz11Alignment 1, the o of alignment 1c1End and bc1End is connected, bc1The magnitude of voltage at end is test voltage
Vs2, because the line of these devices is not selected, for the line of not selected X unit, row p is denoted as, it is corresponding
xrpEnd and brpEnd is connected, brpThe magnitude of voltage at end is the second feedback voltage VF2, for the line of not selected Y unit, by its table
It is shown as row q, corresponding yrqEnd and drqEnd is connected, drqThe magnitude of voltage at end is the second feedback voltage VF2, it is mono- for not selected Z
The line of member, is denoted as row m, corresponding zrmEnd and ermEnd is connected, ermThe magnitude of voltage at end is the second feedback voltage VF2。
3) III areas：With resistive sensing unit R to be measuredx11And Rz11The resistive compound sensor in place is in the non-to be measured of same a line
The resistive compound sensor of adjacent column, (N-1) individual device altogether, because resistive compound sensor array shares line (x-ray, Y lines, Z
Line), it is resistive sensitive list to be measured to be somebody's turn to do the line (x-ray, Y lines, Z lines) of (N-1) individual non-resistive compound sensor of adjacent column to be measured
First Rx11And Rz11The line (x-ray, Y lines, Z lines) of the resistive compound sensor in place, x-ray and xr1End is connected, xr1End and ar1Hold phase
Even, ar1The magnitude of voltage at end is test voltage VI, Y lines and yr1End is connected, yr1End and dr1End is connected, dr1The magnitude of voltage at end is second
Feedback voltage VF2, Z lines and zr1End is connected, zr1End and fr1End is connected, fr1The magnitude of voltage at end is the first feedback voltage VF1.Due to this
The alignment of a little devices is not selected, and these unchecked alignments are expressed as to arrange j ', column j ' ocj' end and acj' end phase
Even, acjThe magnitude of voltage at ' end is the first feedback voltage VF1。
4) IV areas：Line and the not selected resistive compound sensor region of alignment, the individual devices of common (M-1) × (N-1),
Because the line (x-ray, Y lines, Z lines) of these resistive compound sensors is not selected with alignment (O lines), its column j's '
ocj' end and acj' end is connected, acjThe magnitude of voltage at ' end is the first feedback voltage VF1；The x of the line of its p that is expert at X unitrpEnd
With brpEnd is connected, brpThe magnitude of voltage at end is the second feedback voltage VF2；The y of the line of its q that is expert at Y unitrqEnd and drqEnd
It is connected, drqThe magnitude of voltage at end is the second feedback voltage VF2；The z of the line of its m that is expert at Z unitrmEnd and ermEnd is connected, erm
The magnitude of voltage at end is the second feedback voltage VF2。
Still with Rx11And Rz11Exemplified by resistive sensing unit to be measured, when Fig. 4 shows reading circuit of the present invention work with
The circuit diagram of resistive compound sensor same column where resistive sensing unit to be measured.As shown in Figure 4, resistive sensing unit
Rx11And Rz11The column voltage of the resistive compound sensor at place is test voltage Vs2, Rx11The row voltage of the 1st row is where separate end
Test voltage VI, Rz11The row voltage of 1st row where separate end is sampled voltage Vs1, it is unselected in the resistive compound sensor
Y unit resistive sensing unit Ry11The row voltage of separate end is the second feedback voltage VF2, wherein VF2=Vs2, it is known that Ry11Two
End potential-free is poor, i.e., no electric current flows through；X, Y, the row voltage of Z unit of the resistive compound sensor of remaining non-selected row is
Second feedback voltage VF2, column voltage is identical with the column voltage of the resistive compound sensor where resistive sensing unit to be measured, to survey
Try voltage Vs2, wherein, VF2=Vs2, when circuit works, the resistive compound sensor positioned at select column but non-selected row is due to nothing
Electrical potential difference, so no electric current flows through, i.e., the electric current on the resistive sensing unit in all resistive compound sensors in II areas is all
For the resistive sensing unit R to be measured in 0, I areasx11And Rz11Because there is electrical potential difference in respective two ends, so have electric current process, the two
Resistive sensing unit is with sampling resistor RsSeries loop is constituted, so Ix11=Iy21。
Fig. 5 is that resistive compound sensor when reading circuit of the present invention works and where resistive sensing unit to be measured is gone together
Circuit diagram.Fig. 5 is still with Rx11And Rz11Exemplified by resistive sensing unit to be measured, the row of the resistive compound sensor where it
Voltage is test voltage Vs2, Rx11The row voltage that separate end is expert at is test voltage VI, Rz11The row voltage that separate end is expert at
For sampled voltage Vs1, Ry11The row voltage that separate end is expert at is the second feedback voltage VF2, wherein, VF2=Vs2, it is known that Ry11Two ends
Potential-free is poor, i.e., no electric current flows through；Because the resistive compound sensor of colleague shares line (x-ray, Y lines, Z lines), non-
The row voltage of the resistive sensing unit of the X unit of the resistive compound sensor of select column is test voltage VI, Y unit it is resistive quick
The row voltage for feeling unit is the second feedback voltage VF2, the row voltage of the resistive sensing unit of Z unit is sampled voltage Vs1, remaining
The column voltage of the resistive compound sensor of non-selected row is the first feedback voltage VF1, wherein, VF1=Vs1.When circuit works, I
The resistive sensing unit R to be measured in areax11And Rz11Because there is electrical potential difference in respective two ends both sides, so have electric current process, the two
Resistive sensing unit is with sampling resistor RsSeries loop is constituted, so Ix11=Iy21.In the resistive compound sensor in III areas
Z unit resistive sensing unit due to both sides potential-free it is poor, so no current flows through；The resistive sensing unit of X unit due to
Row voltage is test voltage VI, public terminal voltage is the first feedback voltage VF1, because VI≠VF1, so the area is resistive compound
The resistive sensing unit of each X unit has electric current to flow through in sensor, and electric current can be than larger；The resistive sensitive list of Y unit
Member is the second feedback voltage V due to row voltageF2, public terminal voltage is the first feedback voltage VF1, there is potential in Y unit two ends
Difference, so there is electric current process.
Fig. 6 is the circuit signal of non-selected row and non-selected row resistive compound sensor array when circuit of the present invention works
Figure.The non-selected non-selected resistive compound sensor array of row of row is IV areas, altogether the individual resistive compound sensors of (M-1) × (N-1).Often
The row voltage of X unit in individual resistive compound sensor is the second feedback voltage VF2, the row voltage of Y unit is the second feedback voltage
VF2, the row voltage of Z unit is the second feedback voltage VF2, the column voltage of public terminal is the first feedback voltage VF1, so the area is every
All there is electrical potential difference in individual resistive sensing unit two ends, so each resistance has electric current to pass through, form loop.
Fig. 7 is simplification circuit diagram when circuit of the present invention works.By the circuit after simplification it will be evident that resistance to be measured
Property sensing unit Rx11And Rz11With sampling resistor RsSeries loop is constituted, the test voltage of input is VI, by Rx11After-potential drops
For test voltage Vs2, then by Rz11After-potential is reduced to sampled voltage Vs1, after by RsAfter be grounded, potential is reduced to 0, whole series connection
Circuital current is expressed as I, then
I=Vs1/Rs
Using electric resistance partial pressure principle, testing resistance R is easily drawnx11And Rz11Resistance：
Rx11=(VI-Vs2)/I
Rz11=(Vs2-Vs1)/I
Fig. 8 shows the circuit and region division of another embodiment of the present invention, and the present embodiment is the resistive sensing unit of Y unit
Drop-down.As shown in figure 8, the sensing device in the present embodiment includes：The resistive compound sensor arrays 1 of M × N, the choosing of X unit row multichannel
Select device 8, Y and Z unit row MUX 9, row MUX 4, scanning monitor 5 and first voltage feedback driving circuit 6
With second voltage feedback driving circuit 7.Wherein, the connected mode inside the resistive compound sensor arrays 1 of M × N keeps constant, X
The a of cell row MUX 8r1、ar2、…、arMPort and test voltage VIIt is connected, the b of X unit row MUX 8r1、
br2、…、brMPort is connected with the output end of second voltage feedback driving circuit 7；Y and Z unit row MUX 9 cr1、
cr2、…、crMPort and er1、er2、…、erMPort is connected with the output end of second voltage feedback driving circuit 7, Y and Z unit row
The d of MUX 9r1、dr2、…、drMPort and fr1、fr2、…、frMPort and the input of first voltage feedback driving circuit 6
End is connected；The connected mode of row MUX 4 keeps constant.Scanning monitor 5 exports scan control signal, X unit control
Signal control X unit row MUX 8, Y and Z unit control signal control Y and Z unit row MUX 9, row control letter
Number control row MUX 4.
Still with Rx11And Ry11Exemplified by resistive sensing unit to be measured, the x of X unit row MUXr1End and X unit row
The a of MUXr1End is connected, ar1End and test voltage VIIt is connected, the y of Y and Z unit row MUXr1End and Y and Z are mono-
The d of first row MUXr1End is connected, dr1End and sampled voltage Vs1Be connected, remaining 3M-2 roots line with the second feedback voltage
VF2It is connected.The o of row MUXc1End and the b of row MUXc1End is connected, and remaining N-1 roots alignment feeds back with first
Voltage VF1It is connected.Pass through resistive sensing unit R to be measuredx11And Rz11The resistive compound sensor at place by resistive compound sensor battle array
Row are divided into 4 regions.
I areas：Resistive sensing unit R to be measuredx11And Rz11The resistive compound sensor at place is located at the first row first of array
Row, Rx11The row voltage that separate end is expert at is test voltage VI, Ry11The row voltage that separate end is expert at is sampled voltage Vs1, it is public
Terminal voltage is that column voltage is test voltage V altogethers2, Rz11The row voltage that separate end is expert at is the second feedback voltage VF2, wherein, VF2
=Vs2, therefore Rz11Two ends potential-free is poor, i.e., no current passes through.And resistive sensing unit R to be measuredx11And Ry11Because respective two ends are deposited
In electrical potential difference, so there is electric current process, the two resistive sensing units are with sampling resistor RsSeries loop is constituted, so Ix11=
Iy11=I, wherein I are the electric current of series loop.
II areas：With resistive sensing unit R to be measuredx11And Ry11Non- to be measured phase of the resistive compound sensor in place in same row
The resistive compound sensor of adjacent rows, common M-1 device, the row voltage of tri- units of its X, Y, Z is the second feedback voltage VF2, row electricity
Press to share the voltage i.e. test voltage V of alignments2, wherein, VF2=Vs2, therefore each resistive sensing unit two ends in II areas are equal
With electrical potential difference, no current passes through.
III areas：With resistive sensing unit R to be measuredx11And Ry11The resistive compound sensor in place is in the non-to be measured of same a line
The resistive compound sensor of adjacent lines, common N-1 device, the row voltage of tri- resistive sensing units of its X, Y, Z is to share line (X
Line, Y lines, Z lines) voltage, respectively test voltage VI, sampled voltage Vs1, the second feedback voltage VF2, column voltage is first anti-
Feedthrough voltage VF1, wherein, VF1=Vs1.The resistive sensing unit of Y unit is poor due to both sides potential-free, so no current flows through；X is mono-
The resistive sensing unit of member is test voltage V due to row voltageI, public terminal voltage is the first feedback voltage VF1, because VI≠
VF1, so the resistive sensing unit of each X unit has electric current to flow through in the resistive compound sensor in the area, and electric current can compare
Greatly；The resistive sensing unit of Z unit is the second feedback voltage V due to row voltageF2, public terminal voltage is the first feedback voltage
VF1, there is electrical potential difference in Z unit two ends, so there is electric current process.
IV areas：Situation when being pulled up with the resistive sensing unit of Y unit is identical.
Similarly, using electric resistance partial pressure principle, testing resistance R is easily drawnx11And Ry11Resistance：
I=Vs1/Rs
Rx11=(VI-Vs2)/I
Ry11=(Vs2-Vs1)/I
It can be seen from above-mentioned analysis, the resistive compound sensor battle array of 3 resistive sensing units is included for each sensor
Any resistive compound sensor in row, the present invention only needs to can obtain its all three resistive sensitive list by measuring twice
The resistance value of member, and wherein there is a resistive sensing unit to measure twice.Similarly understand, include 5 for each sensor
The resistive compound sensor array of resistive sensing unit, be able to can be obtained using the present invention by minimum three times, most four measurements
The resistance value of all 5 resistive sensing units into any resistive compound sensor；And it is resistive including 7 for each sensor
The resistive compound sensor array of sensing unit, be able to can be appointed using the present invention by minimum four times, most six measurements
The resistance value of all 7 resistive sensing units in one resistive compound sensor；Each sensor includes more resistive sensing units
Resistive compound sensor array it is similar, here is omitted.Therefore, different packets can be passed through according to actual needs
Mode, to obtain most fast detection speed；Or, while very fast detection speed is obtained, to wherein needing in single pass
Some or certain the several resistive sensing units for wanting high-frequency to detect take multiple measurements.
In addition, above-mentioned row, column is relative concept, those skilled in the art completely can exchange it, row, column multi-path choice
Implementing for the part such as device and Voltage Feedback drive circuit also can be using various existing or will have a technology；People in the art
Member is, it should be understood that similar such a simple deformation based on thinking of the present invention is still covered by technical solution of the present invention.
Claims (8)
1. a kind of reading circuit of resistive compound sensor array, it is characterised in that the resistive compound sensor array be M ×
The two-dimensional array that N number of resistive compound sensor is constituted；It is sensitive single that each resistive compound sensor includes 2K+1 two end resistances
The public point of the resistive compound sensor is accessed in member, one end of each resistive sensing unit, and the other end is an individual end points,
Each resistive compound sensor has 2K+2 end points；The public point of the resistive compound sensor of same row is connected with each other, and is constituted
The shared alignment of the resistive compound sensor of the row, with the other end of i-th of resistive sensing unit in the resistive compound sensor of a line
It is connected with each other, constitutes i-th shared line of the resistive compound sensor of the row, i=1,2 ..., 2K+1；K is non-zero natural number；
The reading circuit includes：Row MUX, row MUX, scanning monitor, first voltage feedback driving circuit,
Two Voltage Feedback drive circuits, sampling resistor, test voltage input；Sampling resistor one end is grounded, the electricity of other end connection first
Press the input of feedback driving circuit；2K+1 bars per the resistive compound sensor of a line share line and are grouped in advance according to identical
Mode is divided into two groups；Shared line for belonging to first group, row MUX can cause under scanning monitor control
Any of which shares line and connects and disconnected with the output end of second voltage feedback driving circuit with test voltage input, or
Connect and disconnected with test voltage input with the output end of second voltage feedback driving circuit；For belong to second group share
Line, row MUX can cause any of which to share line and first voltage feedback driving electricity under scanning monitor control
The input on road is connected and disconnected with the output end of second voltage feedback driving circuit, or with second voltage feedback driving circuit
Output end connect and disconnected with the input of first voltage feedback driving circuit；Row MUX can be in scanning monitor control
The input of any shared alignment and second voltage feedback driving circuit is caused to connect and drive electricity with first voltage feedback under system
The output end on road disconnects, or with the output end of first voltage feedback driving circuit connect and with second voltage feedback driving circuit
Input disconnect.
2. reading circuit as claimed in claim 1, it is characterised in that the first voltage feedback driving circuit includes the first computing
Amplifier and the first drive circuit, the inverting input of the first operational amplifier and the output end of the first operational amplifier and first
Drive circuit input connection, the in-phase input end of the first operational amplifier, the first drive circuit output end respectively as
The input of first voltage feedback driving circuit, the output end of first voltage feedback driving circuit；The second voltage feedback is driven
Dynamic circuit includes the second operational amplifier and the second drive circuit, and the inverting input of the second operational amplifier is put with the second computing
The output end of big device and the input connection of the second drive circuit, the in-phase input end of the second operational amplifier, the second driving electricity
The output end on road is respectively as the input of second voltage feedback driving circuit, the output end of second voltage feedback driving circuit.
3. reading circuit as claimed in claim 1, it is characterised in that the 2K+1 bars per the resistive compound sensor of a line share line
It is divided into two groups that quantity is respectively K, K+1.
4. reading circuit as claimed in claim 1, it is characterised in that the row MUX includes and resistive compound sensor
M (2K+1) bar of array shares the individual alternative bilateral analog switch of the one-to-one M of line (2K+1)；According to point of shared line
Group situation, this individual alternative bilateral analog switch of M (2K+1) is divided into corresponding two groups；For each two choosing in first group
One bilateral analog switch, its public input/output terminal is connected with the shared line corresponding to it, two independent input/output
The output end respectively with test voltage input, second voltage feedback driving circuit is held to be connected, its control signal input is with sweeping
Retouch controller connection；For each alternative bilateral analog switch in second group, its public input/output terminal and its institute are right
The shared line connection answered, two independent input/output end input respectively with first voltage feedback driving circuit, second
The output end connection of Voltage Feedback drive circuit, its control signal input is connected with scanning monitor.
5. reading circuit as claimed in claim 1, it is characterised in that the row MUX includes and resistive compound sensor
The N bars of array share the one-to-one N number of alternative bilateral analog switch of alignment；Opened for each alternative bidirectional analog
Close, its public input/output terminal is connected with the shared alignment corresponding to it, two independent input/output end is respectively with first
The input connection of the output end of Voltage Feedback drive circuit, second voltage feedback driving circuit, its control signal input with
Scanning monitor is connected.
6. the reading method of reading circuit as described in any one of Claims 1 to 5, it is characterised in that scanning monitor control row
MUX so that the shared alignment of the resistive compound sensor of current scan list and the input of second voltage feedback driving circuit
Termination is led to and disconnected with the output end of first voltage feedback driving circuit, and remaining shares alignment and first voltage feedback driving circuit
Output end connect and disconnected with the input of second voltage feedback driving circuit；Meanwhile, scanning monitor control row multichannel choosing
Select device so that belong to first group in the shared line of 2K+1 bars corresponding to the resistive compound sensor of current scan line one shares
Line is connected with test voltage input, and the 2K+1 bars corresponding to the resistive compound sensor of the row, which are shared in line, belongs to second group
The input of a shared line and first voltage feedback driving circuit connect, remaining institute in resistive compound sensor array
There is output end of the shared line with second voltage feedback driving circuit to connect；Then Current Scan is obtained using below equation
In the resistive compound sensor of row, column intersection, the resistive sensitivity corresponding to shared line connected with test voltage input
The resistance value R1 of unit, and it is resistive quick corresponding to the shared line connected with the input of first voltage feedback driving circuit
Feel the resistance value R2 of unit：
In formula, VIThe test voltage inputted for test voltage input, VS1For the input electricity of first voltage feedback driving circuit
Pressure, VS2For the input terminal voltage of second voltage feedback driving circuit, RSFor the resistance value of the sampling resistor.
7. a kind of sensing device, including resistive compound sensor array and reading circuit, it is characterised in that the resistive compound biography
The two-dimensional array that sensor array is made up of M × N number of resistive compound sensor；Each resistive compound sensor includes 2K+1 two
The public point of the resistive compound sensor is accessed in end resistance sensing unit, one end of each resistive sensing unit, and the other end is
One individual end points, each resistive compound sensor has 2K+2 end points；The public point of the resistive compound sensor of same row
It is connected with each other, the shared alignment of the resistive compound sensor of the row is constituted, with i-th of resistive sensitivity in the resistive compound sensor of a line
The other end of unit is connected with each other, and constitutes i-th shared line of the resistive compound sensor of the row, i=1,2 ..., 2K+1；K is
Non-zero natural number；The reading circuit is any one of the Claims 1 to 5 reading circuit.
8. sensing device as claimed in claim 7, it is characterised in that each resistive compound sensor includes 2K+1 to not jljl
Two sensitive end resistance sensing units of reason amount.
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| AU2001286157A1 (en) * | 2000-11-16 | 2002-05-27 | International Business Machines Corporation | Method and apparatus for reading an array of thermal resistance sensors |
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