CN105388165A - Defect monitoring method of polarizing film - Google Patents
Defect monitoring method of polarizing film Download PDFInfo
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- CN105388165A CN105388165A CN201510546614.4A CN201510546614A CN105388165A CN 105388165 A CN105388165 A CN 105388165A CN 201510546614 A CN201510546614 A CN 201510546614A CN 105388165 A CN105388165 A CN 105388165A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
- G01N21/892—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
- G01N21/896—Optical defects in or on transparent materials, e.g. distortion, surface flaws in conveyed flat sheet or rod
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
- G01N21/892—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
- G01N21/892—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
- G01N21/894—Pinholes
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/93—Detection standards; Calibrating baseline adjustment, drift correction
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/94—Investigating contamination, e.g. dust
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
- G01N21/958—Inspecting transparent materials or objects, e.g. windscreens
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
- G01N23/20008—Constructional details of analysers, e.g. characterised by X-ray source, detector or optical system; Accessories therefor; Preparing specimens therefor
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
- G01N23/225—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material using electron or ion
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N5/00—Analysing materials by weighing, e.g. weighing small particles separated from a gas or liquid
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N9/00—Investigating density or specific gravity of materials; Analysing materials by determining density or specific gravity
- G01N9/26—Investigating density or specific gravity of materials; Analysing materials by determining density or specific gravity by measuring pressure differences
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- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B5/00—Optical elements other than lenses
- G02B5/30—Polarising elements
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- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
- Polarising Elements (AREA)
Abstract
The invention relates to a defect monitoring method of a polarizing film. More specifically the method can quantize defects, raise homogeneity of products, predict defects on a production line and substantially raise the production efficiency. The method comprises the following steps: S1, a photo of the transferred polarizing film is taken so as to recognize the area where stains exist; S2, a difference of luminance between the area with the stains and a reference area is measured to obtain luminous intensity; S3, the luminous intensity of each stain is converted to be percentile; and S4, selecting a representative value (G) for each stain in luminous intensity values of 65-100 of the percentile; and determining the occurrence of the defects when the representative values (G) of the stains exceed a defect reference value.
Description
Technical field
The present invention relates to a kind of defect monitoring method that easily can find the light polarizing film of the defects such as the spot produced when the manufacture of light polarizing film.
Background technology
The various image display devices such as liquid crystal display, organic light emitting display, electric field transmitted display (FED), plasma display panel (PDP) are widely developed recently and use.
On the other hand, occur various bad in the manufacture process of image display device before outbound, through multiple checking process, one in the parts wherein used at most at image display device is the blooming such as light polarizing film, phase retardation film, therefore, the defect of blooming is the one of the main reasons of the poor prognostic cause of image display device.For the detection of the defect of blooming, first, differentiate whether be defect, carry out correct judgement, then, if the defect of being determined as, then carry out the repairing (repair) according to defect or removing etc. that is discarded and then defect cause, in the yield of manufacturing process, can be described as part and parcel.
The manufacture of blooming, in order to a large amount of production, uses production line operation usually.Therefore, the detection of defect is photographed to blooming continuously by the ad-hoc location at production line, differentiates defect and carry out in the part of photography.
In the differentiation of defect, find that various defect is important in the past without omitting ground.Associated with it, No. 2010-24753rd, KR published patent discloses the method area of the closed curve and foreign matter that comprise foreign matter being compared the foreign matter differentiating production line form.
Recently because the maximization of blooming is inclined to, the original cost of parts rises, and its result requires the method for discrimination of more accurate defect, and therefore, still requirement correctly can differentiate the method for defect.
Prior art document
Patent documentation
Patent documentation 1: No. 2010-24753rd, KR published patent
Summary of the invention
The problem that invention will solve
The object of the present invention is to provide and correctly predict defect, the method for supervising of the light polarizing film of the disqualification rate of goods can be reduced significantly by carrying out the replies rapidly such as the change of process conditions in advance.
In addition, the defect monitoring method that the invention provides and predict defect on a production line, the light polarizing film of production efficiency can be significantly improved.
Technical measure:
1. a defect monitoring method for light polarizing film, it comprises:
(S1) with the stage in the region existed the image recognition spot of being photographed by the light polarizing film transferred;
(S2) difference of the brightness of each mensuration stained region of each spot and reference area is obtained to the stage of intensity of brightness in described image;
(S3) intensity of brightness of described each spot is scaled the stage of hundredths; With
(S4) at described hundredths be 65 ~ 100 luminance intensity value in the typical value (G) of selected spot, warn the stage of the generation of defect when the typical value (G) of described spot exceedes defect reference value.
2. the defect monitoring method of the light polarizing film according to 1, wherein, the photography supervising device of described light polarizing film carries out, and this supervising device comprises:
At the light source of the side of described light polarizing film configuration;
In the photography portion that the opposite side of described light polarizing film configures; With
Configure between described light source with photography portion, absorb axle at least one inspection polagizing filter vertical with described light polarizing film.
3. the defect monitoring method of the light polarizing film according to 2, wherein, by described inspection polagizing filter with described light polarizing film for benchmark is configured at light source side and side, photography portion respectively, its absorb axle be parallel to each other.
4. the defect monitoring method of the light polarizing film according to 1, wherein, the length that described spot is included in the limit of film direct of travel is more than 2mm, the length on the limit vertical with film direct of travel is the inside of the quadrilateral of 1 ~ 20mm, is 3 ~ 20gray with the difference of the brightness of reference area.
5. the defect monitoring method of the light polarizing film according to 1, wherein, the apperance of described spot is selected from linear, circular and oval.
6. the defect monitoring method of the light polarizing film according to 1, wherein, the hundredths converted in stage at described (S4) is in the luminance intensity value of 80 ~ 90, the typical value (G) of selected spot, when the typical value (G) of described spot exceedes defect reference value, the generation of warning defect.
7. the defect monitoring method of the light polarizing film according to 1, wherein, at described (S4) in the stage, G value is continuous when exceeding defect reference value more than 2 times, the generation of warning defect.
8. the defect monitoring method of the light polarizing film according to 1, wherein, at described (S4) in the stage, G value exceedes defect reference value continuous more than 2 times, when also increasing simultaneously, the generation of warning defect.
The effect of invention
The defect monitoring method of light polarizing film of the present invention, by providing the method correctly can predicting defect, can carry out being tackled rapidly by the change etc. of process conditions in advance, therefore, it is possible to reduce the disqualification rate of goods significantly.
In addition, the defect monitoring method of light polarizing film of the present invention, can predict defect on a production line, enhance productivity significantly.
Accompanying drawing explanation
Fig. 1 is as the concise and to the point process flow diagram of the defect monitoring method of one embodiment of the invention, light polarizing film.
Fig. 2 is the accompanying drawing of the supervising device of the defect monitoring method illustrated briefly for light polarizing film.
Fig. 3 is the accompanying drawing of the embodiment illustrating spot defect briefly.
Fig. 4 is the accompanying drawing of the defect alarm data that relates to of comparing embodiment 1 and the data with orthogonal b value.
Embodiment
The present invention relates to the defect monitoring method of light polarizing film, in more detail, by comprising: (S1) is with to the stage in region existed by the image recognition spot of light polarizing film photography transferred; (S2) difference of the brightness of each mensuration stained region of each spot and reference area is obtained to the stage of intensity of brightness in described image; (S3) intensity of brightness of described each spot is scaled the stage of hundredths; (S4) at described hundredths be 65 ~ 100 luminance intensity value in the typical value (G) of selected spot, when the typical value (G) of described spot exceedes defect reference value, the stage of the generation of warning defect, thus correctly can predict defect, the change etc. can carrying out process conditions is in advance tackled rapidly, therefore, it is possible to reduce the disqualification rate of goods significantly.In addition, defect can be predicted on a production line, enhance productivity significantly.
Referring to accompanying drawing, the present invention is illustrated in greater detail.
Fig. 1 is the accompanying drawing of the process flow diagram of the defect monitoring method illustrating the light polarizing film that one embodiment of the invention relate to briefly.
First, with the region (S1) existed the image recognition spot of being photographed by the light polarizing film transferred.
The manufacture of usual light polarizing film is undertaken by transfer limit, limit by continuous print operation, such as reel-to-reel (Roll-to-Roll) operation limit.Therefore, in order to differentiate the defect of light polarizing film, obtain the image of light polarizing film from being photographed to light polarizing film by the top of the light polarizing film transferred on constant direction.
In the present invention, the photographs of light polarizing film can by comprise photography portion, light source, inspection polagizing filter supervising device (with reference to Fig. 2) and obtain.Described supervising device can be as lower device: at the side of check object light polarizing film configuration light source, in the opposite side configuration photography portion of light polarizing film, configure between described light source with photography portion and absorb axle at least one inspection polagizing filter vertical with described light polarizing film.In addition, with described device, the light by check object light polarizing film and inspection polagizing filter is photographed, can photographs be obtained.
According to another embodiment of the present invention, in described supervising device, can be that benchmark configures 1 in light source side with light polarizing film by inspection polagizing filter, or configure 1 in side, photography portion.
According to still another embodiment of the invention, described inspection polagizing filter can with described light polarizing film for benchmark configures 1 (with reference to Fig. 2) respectively in light source side and side, photography portion.In this case, the absorption axle of two inspection polagizing filters is vertical with light polarizing film, but these absorption axles are parallel to each other.When light source side and side, photography portion configure each 1 polagizing filter respectively, the fiduciary level of defects detection can be improved further.
If the light polarizing film of check object is certified products, the light passed through between the orthogonal polagizing filter of polarization direction and light polarizing film disappears, therefore the video of black is obtained, if there is spot in the light polarizing film of check object, the direction of polarisation changes in this section, therefore result obtains the video that there is light leak and bright part (that is, the part of spot).
In the present invention, so-called " spot ", be light polarizing film average homogeneity outside part, be according to differentiate result can be judged to be normal scope within (qualified moral character spot) or the part of " defect " of the bad reason as goods can be judged to be.
With the image obtained to the identification in the region that spot exists, can, after setting the average homogeneity of light polarizing film, image processing software etc. be used to carry out the image in the region of the part comprised beyond this (part of spot).
Fig. 3 is the video photography of spot defect.
If enumerate the concrete example of described stained region, the length that can be included in the limit of film direct of travel is more than 2mm, the length on the limit vertical with film direct of travel is the inside of the quadrilateral of 1 ~ 20mm, be the region of 3 ~ 20gray with the difference of the brightness of reference area.
The upper limit of the length on the limit of described film direct of travel, as long as within the length of the film of determination object, be then not particularly limited.Such as, when photographing to light polarizing film with 1m interval, the upper limit of the length on the limit of the film direct of travel of stained region can be 1m.In addition, being not particularly limited the shape of described stained region, can be linear, circular, oval.
Then in described image for the difference of the brightness of each mensuration stained region of each spot and reference area, obtain intensity of brightness (S2).
In the present invention, so-called " reference area ", referring to the part of not existing defects in light polarizing film, meaning not existing during described area illumination light by the light of the orthogonal light polarizing film of polarization direction and inspection polagizing filter, the part that can obtain the video image of black.
In addition, in the present invention, so-called " intensity of brightness ", mean the value of the stained region of selection and the difference of the brightness in reference area, differ from larger, its intensity is larger.
Next, the intensity of brightness of described each spot is scaled hundredths (S3).
Then, be the typical value (G) of selected spot in the luminance intensity value of 65 ~ 100 at described hundredths, when the typical value (G) of described spot exceedes defect reference value, the generation (S4) of warning defect.
In the present invention, so-called " typical value of spot " is as the value that the value that the generation probability of defect is high is selected in advance in the luminance intensity value of spot.There is no particular limitation on it, according to the characteristic of goods be suitable for, or detects defect according to the fiduciary level of which kind of degree, or complete degree required by goods and changing.In order to detect defect with the most excellent fiduciary level, select from 65 hundredths ~ 100 hundredths in the percentile of described intensity of brightness.Such as, the luminance intensity value of 85 hundredths can be appointed as the typical value of spot.
So-called " hundredths (percentilerank) ", mean the value representing the relative position of each intensity of brightness in the intensity of brightness distribution of certain given group, the hundredths of intensity of brightness certain relative to certain in the intensity of brightness distribution of certain group, refers to the percent relative to all examples of the example being positioned at its intensity of brightness not enough.The method calculating hundredths can adopt usually known method to obtain.
Such as, measure the intensity of brightness of spot, wherein, if the intensity of brightness of 85 hundredths is 3.0, mean intensity of brightness less than 3.0 spot be 85% of entire objects spot.
In the present invention, so-called " defect reference value ", is the luminance intensity value of fixed defect warning, is if G value exceedes described defect reference value, and the generation probability of defect is high and the value selected in advance.There is no particular limitation on it, according to the characteristic of the goods be suitable for or detect defect according to the fiduciary level of which kind of degree, or complete degree required by goods and changing.
Described defect reference value can be in fact judged to be defect intensity of brightness, such as 80%, 90%, 95%, the intensity of brightness of 100% selectes.
But, when 1 spot only being detected in the image of photographing, the luminance intensity value of this spot is compared with defect reference value.
Be in the luminance intensity value of 65 ~ 100 at the hundredths of described conversion, select the typical value (G) of spot, when the typical value (G) of described spot is compared with defect reference value, judgement more correctly can predict the generation probability of defect, tackled rapidly by the change etc. of process conditions in advance thus, the disqualification rate of goods can be reduced significantly.
According to another embodiment of the present invention, at described (S4) in the stage, it is the typical value (G) selecting spot in the luminance intensity value of 80 ~ 90 hundredths at hundredths, when the typical value (G) of described spot exceedes defect reference value, be judged as that the generation probability of spot defect is high, the generation of defect can be warned.
According to another embodiment of the present invention, at described (S4) in the stage, when G value is continuous exceed defect reference value more than 2 times, the generation of defect can be warned, in this case, be judged as that the generation probability of defect is higher.
In addition, according to another embodiment of the present invention, when G value is continuous exceed defect reference value more than 2 times while increase, the generation of defect can be warned, in this case, be judged as that the generation probability of defect is higher.
G value continues to exceed the number of times of defect reference value can complete degree required by goods and changing.Such as, in order to detect defect with the fiduciary level of highest level, when exceeding number of times and being more than 2 times, can think and create defect.In addition, when G value is continuous exceed defect reference value more than 2 times while increase, its increment rate is larger, and the generation probability of defect can raise further.
Below in order to contribute to understanding of the present invention, illustrate preferred embodiment, these embodiments just illustrate the present invention, do not limit the scope of appended Patent right requirement, to those skilled in the art, various change can be carried out to embodiment and correction is apparent in the scope of category of the present invention and technological thought, and, such distortion and revise the scope of the Patent right requirement certainly also belonging to appended.
Embodiment 1
For the light polarizing film manufactured by volume to volume operation, on direct of travel, every 1m photographs, the inside that the length on the limit of film direct of travel is more than 2mm to be included in, the length on the limit vertical with film direct of travel is the quadrilateral of 1 ~ 20mm, with the difference of the brightness of reference area be the spot of 3 ~ 20gray for object, measure the lightness of each stained region.
Then, measure the difference of the brightness of stained region and reference area, calculate intensity of brightness, be scaled hundredths.
The luminance intensity value of 85 hundredths of described scaled value is chosen to be the typical value (G value) of spot, when G value exceedes as defect reference value 3.2, has warned the generation of defect.
Method described in employing has carried out defect monitoring for the light polarizing film of 500,000m.
Test method: orthogonal b value judges
For identical check object light polarizing film, measure orthogonal b value, compare with the defect monitored results of described embodiment 1, its result data is shown in Fig. 4.
According to following benchmark, can judge the generation of defect, orthogonal b value and luminance intensity value have and are in inversely proportional and are inclined to.
The determining defects benchmark > of the orthogonal b value of <
Certified products: exceed the situation of-0.7
The generation of warning defect: exceed-0.9 and situation below-0.7
Defective: the situation below-0.9
With reference to Fig. 4, adopt the change of G value and the orthogonal b value of mensuration of the defect monitoring method that the present invention relates to, its change pattern is consistent, and therefore the failure prediction probability of known method for supervising of the present invention is very excellent.
Claims (8)
1. a defect monitoring method for light polarizing film, it comprises:
(S1) with the stage in the region existed the image recognition spot of being photographed by the light polarizing film transferred;
(S2) difference of the brightness of each mensuration stained region of each spot and reference area is obtained to the stage of intensity of brightness in described image;
(S3) intensity of brightness of described each spot is scaled the stage of hundredths; With
(S4) at described hundredths be 65 ~ 100 luminance intensity value in the typical value (G) of selected spot, warn the stage of the generation of defect when the typical value (G) of described spot exceedes defect reference value.
2. the defect monitoring method of light polarizing film according to claim 1, wherein, the photography supervising device of described light polarizing film carries out, and this supervising device comprises:
At the light source of the side of described light polarizing film configuration;
In the photography portion that the opposite side of described light polarizing film configures; With
Configure between described light source with photography portion, at least one inspection polagizing filter that light polarizing film is vertical with absorption axle.
3. the defect monitoring method of light polarizing film according to claim 2, wherein, by described inspection polagizing filter with described light polarizing film for benchmark is configured at light source side and side, photography portion respectively, its absorb axle be parallel to each other.
4. the defect monitoring method of light polarizing film according to claim 1, wherein, the length that described spot is included in the limit of film direct of travel is more than 2mm, the length on the limit vertical with film direct of travel is the inside of the quadrilateral of 1 ~ 20mm, is 3 ~ 20gray with the difference of the brightness of reference area.
5. the defect monitoring method of light polarizing film according to claim 1, wherein, the apperance of described spot is selected from linear, circular and oval.
6. the defect monitoring method of light polarizing film according to claim 1, wherein, the hundredths converted in stage at described (S4) is in the luminance intensity value of 80 ~ 90, the typical value (G) of selected spot, when the typical value (G) of described spot exceedes defect reference value, the generation of warning defect.
7. the defect monitoring method of light polarizing film according to claim 1, wherein, at described (S4) in the stage, G value is continuous when exceeding defect reference value more than 2 times, the generation of warning defect.
8. the defect monitoring method of light polarizing film according to claim 1, wherein, at described (S4) in the stage, G value exceedes defect reference value continuous more than 2 times, when also increasing simultaneously, the generation of warning defect.
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| KR1020140115246A KR101702841B1 (en) | 2014-09-01 | 2014-09-01 | Method for monitoring defect in polaroid films |
| KR10-2014-0115246 | 2014-09-01 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN105388165A true CN105388165A (en) | 2016-03-09 |
| CN105388165B CN105388165B (en) | 2019-05-03 |
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201510546614.4A Active CN105388165B (en) | 2014-09-01 | 2015-08-31 | The defect monitoring method of light polarizing film |
Country Status (4)
| Country | Link |
|---|---|
| JP (1) | JP2016050939A (en) |
| KR (1) | KR101702841B1 (en) |
| CN (1) | CN105388165B (en) |
| TW (1) | TW201610418A (en) |
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| CN109187577A (en) * | 2018-08-29 | 2019-01-11 | 深圳市盛波光电科技有限公司 | A kind of polaroid recessiveness defect light detection means and method |
| CN111316142A (en) * | 2017-09-13 | 2020-06-19 | 日东电工株式会社 | Polarizing film, polarizing plate, and method for producing polarizing film |
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| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TWI588470B (en) * | 2016-06-28 | 2017-06-21 | 住華科技股份有限公司 | Defect detecting device |
| TWI743373B (en) * | 2017-09-13 | 2021-10-21 | 日商日東電工股份有限公司 | Polarizing film, polarizing plate, and manufacturing method of polarizing film |
| JP6470456B1 (en) * | 2017-09-13 | 2019-02-13 | 日東電工株式会社 | Polarizing film, polarizing plate, and manufacturing method of polarizing film |
| JP6470455B1 (en) * | 2017-09-13 | 2019-02-13 | 日東電工株式会社 | Polarizing film, polarizing plate, and manufacturing method of polarizing film |
| JP6470457B1 (en) * | 2017-09-13 | 2019-02-13 | 日東電工株式会社 | Polarizing film, polarizing plate, and manufacturing method of polarizing film |
| JP6890160B2 (en) * | 2018-10-15 | 2021-06-18 | 日東電工株式会社 | Polarizing plate with retardation layer and image display device using it |
| KR20200140639A (en) * | 2019-06-07 | 2020-12-16 | 주식회사 엘지화학 | Device for testing adhesive stain of polarizing plate and method for testing adhesive stain of polarizing plate |
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| JP5274622B2 (en) * | 2011-06-27 | 2013-08-28 | 富士フイルム株式会社 | Defect inspection apparatus and method |
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| CN1508536A (en) * | 2002-12-17 | 2004-06-30 | 住友化学工业株式会社 | Method for checking defect of polarizing plate adhered with protective film |
| CN1920539A (en) * | 2005-08-26 | 2007-02-28 | 精工爱普生株式会社 | Defect detecting method and defect detecting device |
| CN101360989A (en) * | 2006-01-11 | 2009-02-04 | 日本电工株式会社 | Layered film fabrication method, layered film defect detection method, layered film defect detection device, layered film, and image display device |
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Also Published As
| Publication number | Publication date |
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| JP2016050939A (en) | 2016-04-11 |
| KR20160026400A (en) | 2016-03-09 |
| TW201610418A (en) | 2016-03-16 |
| CN105388165B (en) | 2019-05-03 |
| KR101702841B1 (en) | 2017-02-06 |
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