CN105353179B - A kind of PCB automatic test equipment high-precision shorting pin loaded device - Google Patents

A kind of PCB automatic test equipment high-precision shorting pin loaded device Download PDF

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Publication number
CN105353179B
CN105353179B CN201510934271.9A CN201510934271A CN105353179B CN 105353179 B CN105353179 B CN 105353179B CN 201510934271 A CN201510934271 A CN 201510934271A CN 105353179 B CN105353179 B CN 105353179B
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China
Prior art keywords
probe
sleeve
tail portion
holder
collets
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CN201510934271.9A
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Chinese (zh)
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CN105353179A (en
Inventor
刘新妹
殷俊龄
富强
郭鑫
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North University of China
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North University of China
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Priority to CN201510934271.9A priority Critical patent/CN105353179B/en
Publication of CN105353179A publication Critical patent/CN105353179A/en
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07392—Multiple probes manipulating each probe element or tip individually
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]

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  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Tests Of Electronic Circuits (AREA)

Abstract

The present invention is specially a kind of PCB automatic test equipment high-precision shorting pin loaded device, and solving the problems, such as existing shorting pin loaded device, the adjustment range is small and loading accuracy is low there are complicated in mechanical structure, probe stroke and probe pressure.Mover body surface is provided with holder, the side of holder is fixed with linear motor, the other side of holder is provided with driving wheel and driven wheel, driving belt is provided between driving wheel and driven wheel, sliding block is provided on driving belt, collets are provided on sliding block, collets lower end is provided with probe assembly, probe assembly includes sleeve, probe is installed in sleeve, there is ladder locating piece on the tail portion top of probe, the tail portion of ladder locating piece is cased with buffer spring, probe is made of probe bodies and probe sleeve, and it is provided with steel ball in probe sleeve, probe buffer spring is provided between steel ball and probe bodies tail portion, probe bodies and probe side wall are both provided with anti-dropout boss.This invention ensures that the index of test point loading accuracy.

Description

A kind of PCB automatic test equipment high-precision shorting pin loaded device
Technical field
The present invention relates to shorting pin loaded device, specially a kind of PCB automatic test equipment high-precision shorting pin loaded device.
Background technology
In Automatic Testing System of Circuit Board, instrument contacts the survey on circuit-under-test plate by the probe controlled by computer Pilot extracts signal and realizes test；Common circuit board automatic test equipment（Such as flying probe tester）By more than one spy Needle assemblies are constituted；When test equipment works, the action of shorting pin loaded can be analyzed to probe displacement location（It is often referred to the directions X/Y）Machine The action of structure and probe assembly control probe vertical（It is often referred to Z-direction）The action of direction load.
Existing shorting pin loaded device there are mechanisms complicated, probe height and on-load pressure range is small, loading accuracy is not high The problems such as, and the component height on circuit board is different, and there are blind areas for the test point on periphery, are detected to circuit board When, shorting pin loaded action can cause to deform to circuit board, influence the loading accuracy index of test point.
Invention content
There are the adjustment of complicated in mechanical structure, probe stroke and probe pressure in order to solve existing shorting pin loaded device by the present invention The problem that range is small and loading accuracy is low provides a kind of PCB automatic test equipment high-precision shorting pin loaded device.
The present invention adopts the following technical scheme that realization：A kind of PCB automatic test equipment high-precision shorting pin loaded dress It sets, includes the mover ontology moved along the directions test equipment X/Y, mover body surface is provided with mover bottom plate, on mover bottom plate It is fixed with the holder being obliquely installed, the side of holder is fixed with linear motor, and the other side of holder is provided with driving wheel and driven Wheel, the output axis connection of driving wheel and linear motor, and driving belt is provided between driving wheel and driven wheel, on driving belt It is provided with sliding block, collets are provided on sliding block, collets lower end is provided with probe assembly, and probe assembly includes being plugged on insulation Sleeve in block, probe is installed in sleeve, and there are the ladder locating piece contacted with sleeve lining, ladder locating piece in the tail portion top of probe Tail portion be cased with the buffer spring contacted with collets, probe be by probe bodies and set on it and the probe set of tail portion sealing Cylinder composition, and steel ball is provided in probe sleeve, probe buffer spring, probe are provided between steel ball and probe bodies tail portion Ontology and probe side wall are both provided with anti-dropout boss.
The shorting pin loaded device can be worked by designing double buffer spring in different elastic force sections, linear motor Load depth can realize the adjusting to shorting pin loaded pressure in wide range, while holder is obliquely installed, and meets circuit The test point blind area on the periphery of the higher component on plate is minimum, and the shorting pin loaded in two probe spacings minimums and test is dynamic Make the minimum requirement of the deformation to circuit board, and then ensure test point loading accuracy index, overcomes existing shorting pin loaded device There is a problem of that the adjustment range is small and loading accuracy is low for complicated in mechanical structure, probe stroke and probe pressure.
Structure of the invention reasonable design is reliable, and when detection realizes resilient contact circuit plate, has prevented showing for tissue damage As, and the adjusting to shorting pin loaded pressure can be realized in wide range, while ensure that the index of test point loading accuracy, Requirement of the PCB Auto-Test Systems to shorting pin loaded mechanism is met, is had simple in structure, easy to process and at low cost excellent Point.
Description of the drawings
Fig. 1 is the structural diagram of the present invention；
Fig. 2 is the structural schematic diagram of Fig. 1 middle probe components.
In figure：1- mover ontologies, 2- mover bottom plates, 3- holders, 4- linear motors, 5- driving wheels, 6- driven wheels, 7- transmissions Belt, 8- sliding blocks, 9- collets, 10- probe assemblies, 11- sleeves, 12- probes, 13- ladder locating pieces, 14- buffer springs, 15- probe bodies, 16- probe sleeves, 17- steel balls, 18- probe buffer springs, 19- anti-dropout boss.
Specific implementation mode
A kind of PCB automatic test equipment high-precision shorting pin loaded device includes being moved along what the directions test equipment X/Y moved Sub- ontology 1,1 surface of mover ontology are provided with mover bottom plate 2, and the holder 3 being obliquely installed is fixed on mover bottom plate 2, holder 3 Side is fixed with linear motor 4, and the other side of holder 3 is provided with driving wheel 5 and driven wheel 6, driving wheel 5 and linear motor 4 Axis connection is exported, and is provided with driving belt 7 between driving wheel 5 and driven wheel 6, sliding block 8, sliding block 8 are provided on driving belt 7 On be provided with collets 9,9 lower end of collets is provided with probe assembly 10, and probe assembly 10 includes the set being plugged in collets 9 Cylinder 11 is installed with probe 12 in sleeve 11, and there is the ladder locating piece 13 contacted with 11 inner wall of sleeve on the tail portion top of probe 12, and ladder is fixed The tail portion of position block 13 is cased with the buffer spring 14 contact with collets 9, and probe 12 is by probe bodies 15 and to cover on it and tail What the probe sleeve 16 of portion's sealing formed, and steel ball 17 is provided in probe sleeve 16, steel ball 17 and 15 tail portion of probe bodies it Between be provided with probe buffer spring 18, probe bodies 15 and 12 side wall of probe are both provided with anti-dropout boss 19.

Claims (1)

1. a kind of PCB automatic test equipment high-precision shorting pin loaded device, it is characterised in that：Including along the test equipment side X/Y To the mover ontology of movement（1）, mover ontology（1）Surface is provided with mover bottom plate（2）, mover bottom plate（2）On be fixed with inclination The holder of setting（3）, holder（3）Side be fixed with linear motor（4）, holder（3）The other side be provided with driving wheel（5）With Driven wheel（6）, driving wheel（5）With linear motor（4）Output axis connection, and driving wheel（5）With driven wheel（6）Between be provided with Driving belt（7）, driving belt（7）On be provided with sliding block（8）, sliding block（8）On be provided with collets（9）, collets（9）Lower end It is provided with probe assembly（10）, probe assembly（10）Including being plugged on collets（9）Interior sleeve（11）, sleeve（11）Inside it is installed with Probe（12）, probe（12）Tail portion top have and sleeve（11）The ladder locating piece of inner wall contact（13）, ladder locating piece（13） Tail portion be cased with and collets（9）The buffer spring of contact（14）, probe（12）It is by probe bodies（15）With set on it and The probe sleeve of tail portion sealing（16）Composition, and probe sleeve（16）Inside it is provided with steel ball（17）, steel ball（17）With probe sheet Body（15）Probe buffer spring is provided between tail portion（18）, probe bodies（15）And probe（12）Side wall is both provided with anti-dropout Boss（19）.
CN201510934271.9A 2015-12-15 2015-12-15 A kind of PCB automatic test equipment high-precision shorting pin loaded device Active CN105353179B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201510934271.9A CN105353179B (en) 2015-12-15 2015-12-15 A kind of PCB automatic test equipment high-precision shorting pin loaded device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201510934271.9A CN105353179B (en) 2015-12-15 2015-12-15 A kind of PCB automatic test equipment high-precision shorting pin loaded device

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CN105353179A CN105353179A (en) 2016-02-24
CN105353179B true CN105353179B (en) 2018-08-07

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Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN113341183A (en) * 2021-07-15 2021-09-03 祥腾(深圳)智能装备有限公司 LCR intelligent probe module
CN114441918B (en) * 2022-01-07 2023-03-24 强一半导体（苏州）有限公司 Prevent film probe head and film probe card that probe drops

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2508859B2 (en) * 1975-02-28 1977-03-24 Siemens AG, 1000 Berlin und 8000 München SPRING CONTACT FOR A TEST ADAPTER
CN203688585U (en) * 2013-06-28 2014-07-02 深圳市迈创力科技有限公司 Base structure for flying probe tester
CN203759201U (en) * 2014-03-10 2014-08-06 深圳市大族激光科技股份有限公司 Flying probe testing machine and flying probe testing shaft thereof
CN204116584U (en) * 2014-10-14 2015-01-21 深圳市大族激光科技股份有限公司 A kind of flying probe tester gauge head performance testing device
CN205210132U (en) * 2015-12-15 2016-05-04 中北大学 High accuracy probe loading device for PCB automatic test equipment

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE10320381B4 (en) * 2003-05-06 2010-11-04 Scorpion Technologies Ag Platinum tester with obliquely driven contacting needles

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2508859B2 (en) * 1975-02-28 1977-03-24 Siemens AG, 1000 Berlin und 8000 München SPRING CONTACT FOR A TEST ADAPTER
CN203688585U (en) * 2013-06-28 2014-07-02 深圳市迈创力科技有限公司 Base structure for flying probe tester
CN203759201U (en) * 2014-03-10 2014-08-06 深圳市大族激光科技股份有限公司 Flying probe testing machine and flying probe testing shaft thereof
CN204116584U (en) * 2014-10-14 2015-01-21 深圳市大族激光科技股份有限公司 A kind of flying probe tester gauge head performance testing device
CN205210132U (en) * 2015-12-15 2016-05-04 中北大学 High accuracy probe loading device for PCB automatic test equipment

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