CN105301808B - For the test method of the super more backlight subarea controls of backlight module - Google Patents
For the test method of the super more backlight subarea controls of backlight module Download PDFInfo
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- CN105301808B CN105301808B CN201510800217.5A CN201510800217A CN105301808B CN 105301808 B CN105301808 B CN 105301808B CN 201510800217 A CN201510800217 A CN 201510800217A CN 105301808 B CN105301808 B CN 105301808B
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- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/1306—Details
- G02F1/1309—Repairing; Testing
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- G—PHYSICS
- G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
- G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
- G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
- G09G3/20—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters
- G09G3/34—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters by control of light from an independent source
- G09G3/3406—Control of illumination source
- G09G3/342—Control of illumination source using several illumination sources separately controlled corresponding to different display panel areas, e.g. along one dimension such as lines
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- Nonlinear Science (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Chemical & Material Sciences (AREA)
- Crystallography & Structural Chemistry (AREA)
- Optics & Photonics (AREA)
- Computer Hardware Design (AREA)
- Theoretical Computer Science (AREA)
- Control Of Indicators Other Than Cathode Ray Tubes (AREA)
- Liquid Crystal Display Device Control (AREA)
Abstract
The invention discloses one kind, it is only necessary to m horizontal direction test charts, the test method for the super more backlight subarea controls of backlight module tested the module of (m × n) a backlight subarea can be completed in n vertical direction test charts, and beneficial effects of the present invention are：By the implementation of this method, workload and the test period of the research and development of multi partition backlight and test phase can be greatly reduced.And number of partitions is more, advantage is more apparent.
Description
Technical field
The present invention relates to technical field of television sets, and in particular to a kind of survey for the super more backlight subarea controls of backlight module
Method for testing.
Background technology
LOCAL_DIMMING (local backlight dynamic regulation) technology is a skill for being applied to LCD TV backlight control
Art, its working mechanism are such：Master chip is according to the bright dark degree of picture material come the backlight of dynamic regulation corresponding region
Brightness makes bright image brighter, and dark image is darker, with reference to image compensation, so as to reach raising dynamic contrast and reduce work(
The effect of consumption.Since the brightness of backlight is determined by brightness of image, the test of that backlight subarea control can also be based on this feature
To complete.
Currently used test method is：Make one group of " black and white corresponding with each backlight subarea position and that quantity is equivalent
" test chart (such as Fig. 1：2 × 4 subregion backlight test charts) each subregion is tested one by one.General ELED TVs (carry on the back by side entering type
Optical mode group) backlight subarea only has 8 subregions, 16 subregions when less subregion, make one group of band 8 open, 16 test pictures can be very
Easily and effectively realize the test (as shown in Figure 1) of backlight subarea.But DLED TVs (down straight aphototropism mode set) number of partitions
When reaching up to a hundred or even hundreds of, if also corresponding to the test pictures that each subregion makes respective numbers, that is either tested
The making of picture or test process are all extremely time-consuming.
Invention content
The present invention overcomes existing in the prior art to make test pictures and the low deficiency of test process efficiency, one is provided
It plants it is only necessary to m horizontal direction test charts, the module to (m × n) a backlight subarea can be completed in n vertical direction test charts
The test method for the super more backlight subarea controls of backlight module tested.
To achieve the above object, the present invention uses following technical scheme：
A kind of test method for the super more backlight subarea controls of backlight module, which is characterized in that it includes the following steps：
The resolution ratio of several test pictures is arranged to, root identical with the resolution ratio of liquid crystal display by step a with graphics module
There is m rectangular sub-area in the horizontal direction according to the backlight module of the liquid crystal display, the requirement that vertical direction has n rectangular sub-area will be set
Several test pictures of good resolution ratio are divided into horizontal direction test pictures and vertical direction test pictures, the horizontal direction
Test pictures are m, and m horizontal direction test pictures are respectively designated as H1, H2, H3H (m), described
Vertical direction test pictures are n, and n vertical direction test pictures are respectively designated as V1, V2, V3V
(n)；
Each test pictures in m horizontal direction test pictures are averagely divided into m by step b according to horizontal direction
A region, and m horizontal direction test pictures are sequentially generated in accordance with the following methods：
The 1st region in H1 horizontal direction test pictures in m region is set as Quan Baichang, remaining region setting
It is preserved for completely black field, and by the H1 horizontal directions test pictures of generation；
The 2nd region in H2 horizontal direction test pictures in m region is set as Quan Baichang, remaining region setting
It is preserved for completely black field, and by the H2 horizontal directions test pictures of generation；
And so on, until m-th of region in H (m) horizontal direction test pictures in m region is set as complete white
, remaining region is set as completely black field, and H (m) the horizontal directions test pictures of generation are preserved；
Each test pictures in n vertical direction test pictures are averagely divided into n by step c according to vertical direction
A region, and n vertical direction test pictures are sequentially generated in accordance with the following methods；
The 1st region in V1 vertical direction test pictures in n region is set as Quan Baichang, remaining region setting
It is preserved for completely black field, and by the V1 vertical direction test pictures of generation；
The 2nd region in V2 horizontal direction test pictures in n region is set as Quan Baichang, remaining region setting
It is preserved for completely black field, and by the V2 horizontal directions test pictures of generation；
And so on, until n-th of region in V (m) vertical direction test pictures in n region is set as complete white
, remaining region is set as completely black field, and V (m) the horizontal directions test pictures of generation are preserved；
Step d surveys the n vertical direction generated in the m generated in step b horizontal direction test pictures and step c
Attempt piece to be played out with model machine to be measured, when field areas white in any test pictures of horizontal direction or vertical direction occurs
During shadow, then it is incorrect to correspond to zonal control for shadow.
Compared with prior art, the beneficial effects of the invention are as follows：
By the implementation of this method, the workload of the research and development of multi partition backlight and test phase and test week can be greatly reduced
Phase.And number of partitions is more, advantage is more apparent.
Description of the drawings
Fig. 1 tests the test pictures that liquid crystal display backlight module is 8 backlight subareas to be used in the prior art.
Fig. 2 is the schematic diagram that liquid crystal display backlight module is m × n backlight subarea in an embodiment of the present invention.
Fig. 3 is the schematic diagram for generating H1 horizontal direction test pictures in an embodiment of the present invention in step b.
Fig. 4 is the schematic diagram for generating H2 horizontal direction test pictures in an embodiment of the present invention in step b.
Fig. 5 is the schematic diagram for generating V1 vertical direction test pictures in an embodiment of the present invention in step c.
Fig. 6 is the schematic diagram for generating V2 vertical direction test pictures in an embodiment of the present invention in step c.
Fig. 7 is the test pictures point that liquid crystal display backlight module is 24 × 12 backlight subareas in another embodiment of the invention
Area's schematic diagram.
Fig. 8 amounts to 8 for H1 horizontal directions test pictures in another embodiment of the present invention to H8 horizontal direction test pictures
Open the schematic diagram of horizontal direction test pictures.
Fig. 9 amounts to 8 for H9 horizontal directions test pictures in another embodiment of the present invention to H16 horizontal direction test pictures
Open the schematic diagram of horizontal direction test pictures.
Figure 10 is total to for H17 horizontal directions test pictures in another embodiment of the present invention to H24 horizontal direction test pictures
Count the schematic diagram of 8 horizontal direction test pictures.
Figure 11 amounts to 8 for V1 vertical direction test pictures in another embodiment of the present invention to V8 vertical direction test pictures
Open the schematic diagram of vertical direction test pictures.
Figure 12 amounts to for V9 vertical direction test pictures in another embodiment of the present invention to V12 vertical direction test pictures
The schematic diagram of 4 vertical direction test pictures.
Specific embodiment
The present invention is further elaborated below in conjunction with the accompanying drawings.
Embodiment 1
The test method for the super more backlight subarea controls of backlight module as shown in figures 2-6, which is characterized in that it includes
Following steps：Step a, the resolution ratio of several test pictures is arranged to graphics module it is identical with the resolution ratio of liquid crystal display,
M rectangular sub-area is had according to the backlight module of the liquid crystal display in the horizontal direction, the requirement that vertical direction has n rectangular sub-area will be set
Several test pictures for having put resolution ratio are divided into horizontal direction test pictures and vertical direction test pictures, the level side
It is m to test pictures, and m horizontal direction test pictures is respectively designated as H1, H2, H3H (m), institute
It is n to state vertical direction test pictures, and n vertical direction test pictures are respectively designated as V1, V2, V3
V(n)；Each test pictures in m horizontal direction test pictures are averagely divided into m area according to horizontal direction by step b
Domain, and m horizontal direction test pictures are sequentially generated in accordance with the following methods：It will be in H1 horizontal direction test pictures in m region
The 1st region be set as Quan Baichang, remaining region is set as completely black field, and the H1 horizontal directions test pictures of generation are protected
It deposits；The 2nd region in H2 horizontal direction test pictures in m region is set as Quan Baichang, remaining region is set as complete
Black field, and the H2 horizontal directions test pictures of generation are preserved；And so on, until by m in H (m) horizontal direction test pictures
M-th of region in a region is set as Quan Baichang, and remaining region is set as completely black field, and by H (m) horizontal directions of generation
Test pictures preserve；Step c averagely draws each test pictures in n vertical direction test pictures according to vertical direction
It is divided into n region, and sequentially generates n vertical direction test pictures in accordance with the following methods；By n in V1 vertical direction test pictures
The 1st region in a region is set as Quan Baichang, and remaining region is set as completely black field, and the V1 vertical direction of generation is surveyed
Attempt piece preservation；The 2nd region in V2 horizontal direction test pictures in n region is set as Quan Baichang, remaining region
Completely black field is set as, and the V2 horizontal directions test pictures of generation are preserved；And so on, it is tested until by V (m) vertical direction
N-th of region in picture in n region is set as Quan Baichang, and remaining region is set as completely black field, and by the V (m) of generation
Horizontal direction test pictures preserve；Step d, the n that will be generated in the m generated in step b horizontal direction test pictures and step c
It opens vertical direction test pictures to be played out with model machine to be measured, when in any test pictures of horizontal direction or vertical direction
When shadow occurs in white field areas, then it is incorrect to correspond to zonal control for shadow.
The test of only horizontal direction is correct or the test of only vertical direction is correct, not can determine that all zonal controls
Correctness.Because when the test in only horizontal (or vertical) direction is correct, subregion Wrong control is likely to occur in a certain
Inside horizontal (or vertical) subregion；Only it just can determine that zonal control all just when test both horizontally and vertically is all correct
Really.
In the operating process that test pictures make, it is only necessary to make the picture of half quantity manually, the other half is using horizontal
Or the method for flip vertical is i.e. available.
Embodiment 2
Embodiment 2 is using a liquid crystal display backlight module as 24 × 12 and liquid crystal display that screen resolution is 3840*2160
Backlight subarea test for illustrate：
The resolution ratio of 36 test pictures is set as 3840*2160, according to the liquid crystal display by step a with graphics module
Backlight module has 24 rectangular sub-areas in the horizontal direction, and the requirement that vertical direction has 12 rectangular sub-areas will set resolution ratio
36 test pictures are divided into horizontal direction test pictures and vertical direction test pictures, and the horizontal direction test pictures are 24
, and by 24 horizontal direction test pictures be respectively designated as H1, H2, H3, H4, H5, H6, H7, H8, H9, H10, H11, H12,
H13, H14, H15, H16, H17, H18, H19, H20, H21, H22, H23, H24, the vertical direction test pictures are 12, and
12 vertical direction test pictures are respectively designated as V1, V2, V3, V4, V5, V6, V7, V8, V9, V10, V11, V12.
Each test pictures in 24 horizontal direction test pictures are averagely divided by step b according to horizontal direction
24 regions, and 24 horizontal direction test pictures are sequentially generated in accordance with the following methods：
The 1st region in H1 horizontal direction test pictures in 24 regions is set as Quan Baichang, remaining region is set
Completely black field is set to, and the H1 horizontal directions test pictures of generation are preserved；
The 2nd region in H2 horizontal direction test pictures in 24 regions is set as Quan Baichang, remaining region is set
Completely black field is set to, and the H2 horizontal directions test pictures of generation are preserved；
The 3rd region in H3 horizontal direction test pictures in 24 regions is set as Quan Baichang, remaining region is set
Completely black field is set to, and the H3 horizontal directions test pictures of generation are preserved；
The 4th region in H4 horizontal direction test pictures in 24 regions is set as Quan Baichang, remaining region is set
Completely black field is set to, and the H4 horizontal directions test pictures of generation are preserved；
The 5th region in H5 horizontal direction test pictures in 24 regions is set as Quan Baichang, remaining region is set
Completely black field is set to, and the H5 horizontal directions test pictures of generation are preserved；
The 6th region in H6 horizontal direction test pictures in 24 regions is set as Quan Baichang, remaining region is set
Completely black field is set to, and the H6 horizontal directions test pictures of generation are preserved；
The 7th region in H7 horizontal direction test pictures in 24 regions is set as Quan Baichang, remaining region is set
Completely black field is set to, and the H7 horizontal directions test pictures of generation are preserved；
The 8th region in H8 horizontal direction test pictures in 24 regions is set as Quan Baichang, remaining region is set
Completely black field is set to, and the H8 horizontal directions test pictures of generation are preserved；
The 9th region in H9 horizontal direction test pictures in 24 regions is set as Quan Baichang, remaining region is set
Completely black field is set to, and the H9 horizontal directions test pictures of generation are preserved；
The 10th region in H10 horizontal direction test pictures in 24 regions is set as Quan Baichang, remaining region
Completely black field is set as, and the H10 horizontal directions test pictures of generation are preserved；
The 11st region in H11 horizontal direction test pictures in 24 regions is set as Quan Baichang, remaining region
Completely black field is set as, and the H11 horizontal directions test pictures of generation are preserved；
The 12nd region in H12 horizontal direction test pictures in 24 regions is set as Quan Baichang, remaining region
Completely black field is set as, and the H12 horizontal directions test pictures of generation are preserved；
The 13rd region in H13 horizontal direction test pictures in 24 regions is set as Quan Baichang, remaining region
Completely black field is set as, and the H13 horizontal directions test pictures of generation are preserved；
The 14th region in H14 horizontal direction test pictures in 24 regions is set as Quan Baichang, remaining region
Completely black field is set as, and the H14 horizontal directions test pictures of generation are preserved；
The 15th region in H15 horizontal direction test pictures in 24 regions is set as Quan Baichang, remaining region
Completely black field is set as, and the H15 horizontal directions test pictures of generation are preserved；
The 16th region in H16 horizontal direction test pictures in 24 regions is set as Quan Baichang, remaining region
Completely black field is set as, and the H16 horizontal directions test pictures of generation are preserved；
The 17th region in H17 horizontal direction test pictures in 24 regions is set as Quan Baichang, remaining region
Completely black field is set as, and the H17 horizontal directions test pictures of generation are preserved；
The 18th region in H18 horizontal direction test pictures in 24 regions is set as Quan Baichang, remaining region
Completely black field is set as, and the H18 horizontal directions test pictures of generation are preserved；
The 19th region in H19 horizontal direction test pictures in 24 regions is set as Quan Baichang, remaining region
Completely black field is set as, and the H19 horizontal directions test pictures of generation are preserved；
The 20th region in H20 horizontal direction test pictures in 24 regions is set as Quan Baichang, remaining region
Completely black field is set as, and the H20 horizontal directions test pictures of generation are preserved；
The 21st region in H21 horizontal direction test pictures in 24 regions is set as Quan Baichang, remaining region
Completely black field is set as, and the H21 horizontal directions test pictures of generation are preserved；
The 22nd region in H22 horizontal direction test pictures in 24 regions is set as Quan Baichang, remaining region
Completely black field is set as, and the H22 horizontal directions test pictures of generation are preserved；
The 23rd region in H23 horizontal direction test pictures in 24 regions is set as Quan Baichang, remaining region
Completely black field is set as, and the H23 horizontal directions test pictures of generation are preserved；
The 24th region in H24 horizontal direction test pictures in 24 regions is set as Quan Baichang, remaining region
Completely black field is set as, and the H24 horizontal directions test pictures of generation are preserved；
The schematic diagram of 24 horizontal direction test pictures of generation is as seen in figs. 8-10.
Each test pictures in 12 vertical direction test pictures are averagely divided by step c according to vertical direction
12 regions, and 12 vertical direction test pictures are sequentially generated in accordance with the following methods：
The 1st region in V1 vertical direction test pictures in 12 regions is set as Quan Baichang, remaining region is set
Completely black field is set to, and the V1 vertical direction test pictures of generation are preserved；
The 2nd region in V2 vertical direction test pictures in 12 regions is set as Quan Baichang, remaining region is set
Completely black field is set to, and the V2 vertical direction test pictures of generation are preserved；
The 3rd region in V3 vertical direction test pictures in 12 regions is set as Quan Baichang, remaining region is set
Completely black field is set to, and the V3 vertical direction test pictures of generation are preserved；
The 4th region in V4 vertical direction test pictures in 12 regions is set as Quan Baichang, remaining region is set
Completely black field is set to, and the V4 vertical direction test pictures of generation are preserved；
The 5th region in V5 vertical direction test pictures in 12 regions is set as Quan Baichang, remaining region is set
Completely black field is set to, and the V5 vertical direction test pictures of generation are preserved；
The 6th region in V6 vertical direction test pictures in 12 regions is set as Quan Baichang, remaining region is set
Completely black field is set to, and the V6 vertical direction test pictures of generation are preserved；
The 7th region in V7 vertical direction test pictures in 12 regions is set as Quan Baichang, remaining region is set
Completely black field is set to, and the V7 vertical direction test pictures of generation are preserved；
The 8th region in V8 vertical direction test pictures in 12 regions is set as Quan Baichang, remaining region is set
Completely black field is set to, and the V8 vertical direction test pictures of generation are preserved；
The 9th region in V9 vertical direction test pictures in 12 regions is set as Quan Baichang, remaining region is set
Completely black field is set to, and the V9 vertical direction test pictures of generation are preserved；
The 10th region in V10 vertical direction test pictures in 12 regions is set as Quan Baichang, remaining region
Completely black field is set as, and the V10 vertical direction test pictures of generation are preserved；
The 11st region in V11 vertical direction test pictures in 12 regions is set as Quan Baichang, remaining region
Completely black field is set as, and the V11 vertical direction test pictures of generation are preserved；
The 12nd region in V12 vertical direction test pictures in 12 regions is set as Quan Baichang, remaining region
Completely black field is set as, and the V12 vertical direction test pictures of generation are preserved；
The schematic diagram of 12 vertical direction test pictures of generation is as depicted in figs. 11-12.
The 12 vertical direction test charts that will be generated in generated in step b 24 horizontal direction test pictures and step c
Piece is played out with model machine to be measured, when shadow occurs in field areas white in any one test chart of horizontal or vertical direction, then
It is incorrect that shadow corresponds to zonal control.Only it just can determine that backlight subarea is controlled when all tests both horizontally and vertically are all correct
System is all correct.
It is learnt by above-described embodiment 2, a backlight module with 24 × 12 subregions, totally 288 independent control subregions, profit
Only need 36 test pictures that test job can be completed with this method, but if each subregion corresponds to a test chart
Piece, that just needs to make 288 test pictures, and continuously 288 test charts of broadcasting could complete backlight subarea test.
So the present invention can greatly reduce workload and the test period of the research and development of multi partition backlight and test phase.
The essence of the present invention is described in detail, but can not be to protection scope of the present invention in more than specific embodiment
It is limited, it should be apparent that, under the enlightenment of the present invention, those of ordinary skill in the art can also carry out many improvement
And modification, it should be noted that these improvement and modification are all fallen within the claims of the present invention.
Claims (1)
1. a kind of test method for the super more backlight subarea controls of backlight module, which is characterized in that it includes the following steps：
Step a, the resolution ratio of several test pictures is arranged to graphics module it is identical with the resolution ratio of liquid crystal display, according to this
The backlight module of liquid crystal display has a m rectangular sub-area in the horizontal direction, and the requirement that vertical direction has n rectangular sub-area will be set point
Several test pictures of resolution are divided into horizontal direction test pictures and vertical direction test pictures, the horizontal direction test
Picture is m, and m horizontal direction test pictures are respectively designated as H1, H2, H3H (m), described vertical
Direction test pictures are n, and n vertical direction test pictures are respectively designated as V1, V2, V3V (n)；
Each test pictures in m horizontal direction test pictures are averagely divided into m area according to horizontal direction by step b
Domain, and m horizontal direction test pictures are sequentially generated in accordance with the following methods：
The 1st region in H1 horizontal direction test pictures in m region is set as Quan Baichang, remaining region is set as complete
Black field, and the H1 horizontal directions test pictures of generation are preserved；
The 2nd region in H2 horizontal direction test pictures in m region is set as Quan Baichang, remaining region is set as complete
Black field, and the H2 horizontal directions test pictures of generation are preserved；
And so on, until m-th of region in H (m) horizontal direction test pictures in m region is set as Quan Baichang, remain
Remaining region is set as completely black field, and H (m) the horizontal directions test pictures of generation are preserved；
Each test pictures in n vertical direction test pictures are averagely divided into n area according to vertical direction by step c
Domain, and n vertical direction test pictures are sequentially generated in accordance with the following methods；
The 1st region in V1 vertical direction test pictures in n region is set as Quan Baichang, remaining region is set as complete
Black field, and the V1 vertical direction test pictures of generation are preserved；
The 2nd region in V2 horizontal direction test pictures in n region is set as Quan Baichang, remaining region is set as complete
Black field, and the V2 horizontal directions test pictures of generation are preserved；
And so on, until n-th of region in V (m) vertical direction test pictures in n region is set as Quan Baichang, remain
Remaining region is set as completely black field, and V (m) the horizontal directions test pictures of generation are preserved；
Step d, the n vertical direction test charts that will be generated in the m generated in step b horizontal direction test pictures and step c
Piece is played out with model machine to be measured, when shadow occurs in field areas white in any test pictures of horizontal direction or vertical direction
When, then it is incorrect to correspond to zonal control for shadow.
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| CN201510800217.5A CN105301808B (en) | 2015-11-19 | 2015-11-19 | For the test method of the super more backlight subarea controls of backlight module |
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| CN105301808B true CN105301808B (en) | 2018-06-29 |
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| CN1543636A (en) * | 2001-08-28 | 2004-11-03 | 三星电子株式会社 | Liquid crystal display device and a method for driving the same |
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| JP5337074B2 (en) * | 2010-02-22 | 2013-11-06 | 株式会社東芝 | Video display device and video display method |
| CN105047141A (en) * | 2015-08-17 | 2015-11-11 | 青岛海信电器股份有限公司 | Split screen detection method and apparatus of multi-divided-zone dynamic backlight, and liquid crystal television set |
| CN105070241A (en) * | 2015-09-22 | 2015-11-18 | 青岛海信电器股份有限公司 | Multi-partition dynamic backlight detection method, multi-partition dynamic backlight detection device and liquid crystal display television |
-
2015
- 2015-11-19 CN CN201510800217.5A patent/CN105301808B/en active Active
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1543636A (en) * | 2001-08-28 | 2004-11-03 | 三星电子株式会社 | Liquid crystal display device and a method for driving the same |
| CN101101237A (en) * | 2007-08-21 | 2008-01-09 | 友达光电（苏州）有限公司 | Method for measuring luminescent picture brightness uniformity |
| JP5337074B2 (en) * | 2010-02-22 | 2013-11-06 | 株式会社東芝 | Video display device and video display method |
| CN105047141A (en) * | 2015-08-17 | 2015-11-11 | 青岛海信电器股份有限公司 | Split screen detection method and apparatus of multi-divided-zone dynamic backlight, and liquid crystal television set |
| CN105070241A (en) * | 2015-09-22 | 2015-11-18 | 青岛海信电器股份有限公司 | Multi-partition dynamic backlight detection method, multi-partition dynamic backlight detection device and liquid crystal display television |
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| CN105301808A (en) | 2016-02-03 |
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