CN105203821B - A kind of method and device analyzed reference clock phase jitter - Google Patents
A kind of method and device analyzed reference clock phase jitter Download PDFInfo
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Abstract
The invention discloses a kind of method and device analyzed reference clock phase jitter, including：The reference clock phase jitter for treating analysis waveform for receiving user's input carries out the control instruction of a bonding analysis；Load all waveforms to be analyzed；Present analysis waveform is chosen from the waveform to be analyzed loaded, judges the type of the present analysis waveform；According to the type of the present analysis waveform, the gradually reference clock phase jitter to each template corresponding to the type is analyzed；Automatically save the data message after analysis；After the present analysis waveform analysis terminates, next waveform is chosen from the waveform to be analyzed loaded automatically, untill all the waveform analysis to be analyzed terminates.The present invention greatly reduces the workload of engineer, improves the operating efficiency of engineer, and can also effectively avoid mistake caused by manual operation by one-touch analysis.
Description
Technical field
The present invention relates to electronic technology field, more particularly to a kind of method analyzed reference clock phase jitter
And device.
Background technology
At present, the analysis of the reference clock phase jitter of system 100,000,000 is all the phase jitter analysis work provided using Intel
Tool is analyzed.The instrument is a instrument that input clock signal shake Pk-Pk values and RMS value are calculated using frequency domain algorithm.
But Intel phase jitter analysis tools, interface are complicated, operating process is very cumbersome, and part required function is not yet
Improve, it is necessary to engineer data intercept and figure one by one.This traditional analytical plan is, it is necessary to manually repeat Loaded contact analysis
And template, it is necessary to which engineer takes a significant amount of time and energy operates especially in the case where data volume is big.However, as letter
Number vital Verification Project of integrality, clock phase shake must not be again without an action.
Therefore it provides the method and device that a kind of one-touch phase jitter automatically to reference clock is analyzed is very
It is necessary.
The content of the invention
It is an object of the invention to provide a kind of method and device analyzed reference clock phase jitter, to save phase
The time and efforts of staff is closed, improves operating efficiency.
In order to solve the above technical problems, the present invention provides a kind of method analyzed reference clock phase jitter, bag
Include：
The reference clock phase jitter for treating analysis waveform for receiving user's input carries out the control instruction of a bonding analysis；
Load all waveforms to be analyzed；
Present analysis waveform is chosen from the waveform to be analyzed loaded, judges the class of the present analysis waveform
Type；
According to the type of the present analysis waveform, gradually to the reference clock phase of each template corresponding to the type
Shake is analyzed；
Automatically save the data message after analysis；
After the present analysis waveform analysis terminates, chosen automatically from the waveform to be analyzed loaded next
Waveform, untill all the waveform analysis to be analyzed terminates.
Alternatively, the type for judging the present analysis waveform includes：
Judge the type of the present analysis waveform for PCIe reference clocks or QPI reference clocks.
Alternatively, the data message automatically saved after analyzing includes：
Automatic interception analysis result picture, and automatically save analysis result data.
Alternatively, in addition to：
After all the waveform analysis to be analyzed terminates, by the data message automatic report generation after analysis.
The present invention also provides a kind of device analyzed reference clock phase jitter, including：
Receiving module, the reference clock phase jitter for treating analysis waveform for receiving user's input carry out a bonding analysis
Control instruction；
Load-on module, for loading all waveforms to be analyzed；
Judge module, for choosing present analysis waveform from the waveform to be analyzed loaded, judge described current
The type of analysis waveform；
Analysis module, for the type according to the present analysis waveform, gradually to each template corresponding to the type
Reference clock phase jitter analyzed；
Preserving module, for automatically saving the data message after analyzing；
Module is chosen, for after the present analysis waveform analysis terminates, automatically from the ripple to be analyzed loaded
Next waveform is chosen in shape, untill all the waveform analysis to be analyzed terminates.
Alternatively, the judge module is used to judge that the type of the present analysis waveform includes：
The judge module is specifically used for judging that the type of the present analysis waveform is joined for PCIe reference clocks or QPI
Examine clock.
Alternatively, the data message that the preserving module is used to automatically save after analyzing includes：
The preserving module is specifically used for automatic interception analysis result picture, and automatically saves analysis result data.
Alternatively, in addition to：
Reports module is generated, after terminating in whole waveform analyses to be analyzed, by the data message after analysis
Automatic report generation.
The method and device provided by the present invention analyzed reference clock phase jitter, inputted by receiving user
Treat analysis waveform reference clock phase jitter carry out a bonding analysis control instruction, load all waveforms to be analyzed,
Present analysis waveform is selected from the waveform to be analyzed loaded；According to the type of the waveform, gradually to the ginseng of each template
Examine clock phase shake to be analyzed, the data message after analysis is preserved；After present analysis waveform analysis terminates, from
It is dynamic to choose next waveform from the waveform to be analyzed loaded, untill all waveform analysis to be analyzed terminates.
It can be seen that compared with the analysis that tradition is cumbersome mechanical and easily omits, it is provided by the present invention to reference clock phase
The method and device analyzed is shaken, by one-touch analysis, the workload of engineer is greatly reduced, improves engineer
Operating efficiency, and can also effectively avoid mistake caused by manual operation.
Brief description of the drawings
Fig. 1 is a kind of embodiment of the method provided by the present invention analyzed reference clock phase jitter
Flow chart；
Fig. 2 is another specific embodiment party of the method provided by the present invention analyzed reference clock phase jitter
The flow chart of formula；
Fig. 3 is another specific embodiment party of the method provided by the present invention analyzed reference clock phase jitter
Formula median surface schematic diagram；
Fig. 4 is the traditional analysis flow chart of Intel phase jitter analysis tools；
Fig. 5 is a kind of embodiment of the device provided by the present invention analyzed reference clock phase jitter
Structured flowchart.
Embodiment
In order that those skilled in the art more fully understand the present invention program, with reference to the accompanying drawings and detailed description
The present invention is described in further detail.Obviously, described embodiment is only part of the embodiment of the present invention, rather than
Whole embodiments.Based on the embodiment in the present invention, those of ordinary skill in the art are not making creative work premise
Lower obtained every other embodiment, belongs to the scope of protection of the invention.
A kind of stream of embodiment of the method provided by the present invention analyzed reference clock phase jitter
Journey figure is as shown in figure 1, this method includes：
Step S101：The reference clock phase jitter for treating analysis waveform for receiving user's input carries out the control of a bonding analysis
System instruction；
Step S102：Load all waveforms to be analyzed；
Step S103：Present analysis waveform is chosen from the waveform to be analyzed loaded, judges the present analysis
The type of waveform；
Step S104：According to the type of the present analysis waveform, gradually to the ginseng of each template corresponding to the type
Clock phase shake is examined to be analyzed；
Step S105：Automatically save the data message after analysis；
Step S106：After the present analysis waveform analysis terminates, automatically from the waveform to be analyzed loaded
Next waveform is chosen, untill all the waveform analysis to be analyzed terminates.
It can be seen that compared with the analysis that tradition is cumbersome mechanical and easily omits, it is provided by the present invention to reference clock phase
The method and device analyzed is shaken, by one-touch analysis, the workload of engineer is greatly reduced, improves engineer
Operating efficiency, and can also effectively avoid mistake caused by manual operation.
On the basis of above-described embodiment, step S103 judges that the type of present analysis waveform can be specially to judge currently
The type of analysis waveform is PCIe reference clocks or QPI reference clocks.Another embodiment provided by the present invention
Flow chart as shown in Fig. 2 this method can be realized specifically to a key of 100,000,000 reference clock phase jitters using C/C++ language
Analysis, it can comprise the steps：
Step S201：The reference clock phase jitter for treating analysis waveform for receiving user's input carries out the control of a bonding analysis
System instruction；
Step S202：Load all waveforms to be analyzed；
Step S203：Single waveform is loaded, judges the type of the present analysis waveform for PCIe reference clocks or QPI
Reference clock；
Step S204：If present analysis waveform is PCIe reference clocks, 7 moulds of sequential analysis PCIe reference clocks
Plate；If present analysis waveform is QPI reference clocks, 2 templates of sequential analysis QPI reference clocks.
As corresponding to PCIe reference clocks in table 1 and QPI reference clocks shown in template, single waveform needs the mould analyzed
Plate, the reference clock for a PCIe are analyzed, it is necessary to gradually load 7 templates.For a QPI reference clock, need
2 templates are gradually loaded to be analyzed.For four common tunnel systems, according to 15 PCIe reference clocks, 4 QPI references
If clock calculation.Need to repeat to load 19 waveforms, repeat to load template more than 100 times, repeat sectional drawing and cut data more than 200
More than secondary.When system design is changed, it is necessary to be verified again to System Clock Reference, workload will be multiplied.
Table 1
Step S205：Automatically save the data message after analysis；
Specifically, analysis result picture can be intercepted automatically, and automatically saves analysis result data.
Step S206：After the present analysis waveform analysis terminates, automatically from the waveform to be analyzed loaded
Next waveform is chosen, untill all the waveform analysis to be analyzed terminates.
As a kind of preferred embodiment, the present embodiment after all the waveform analyses to be analyzed terminate, in addition to：
By the data message automatic report generation after analysis.
By automatically generating the function of Excel forms, the result analyzed and data content can be entered with Excel forms
Row displaying, further simplify the workload of engineer's post-production report.
Specifically, the present embodiment can need single waveform all template files analyzed, and write auxiliary journey in advance
Among formula.The subprogram for only needing to write is put into original Phase Jitter Tool-files path, without again
Installation and operation Environmental Support, support it is common " .wfm | .bin " form wave files, use range are wider.
In use, it need to only perform the subprogram, it is only necessary to which the wave sequence being disposably analysed to is dragged to subprogram
In the list box at interface, click start to analyze, subprogram can load automatically template, automatically analyze, automatic data intercept and cut
Figure, as shown in the interface schematic diagram in Fig. 3.
It refer to Fig. 4, Fig. 4 is the traditional analysis flow chart of Intel phase jitter analysis tools, its process bag analyzed
Include：Loaded contact analysis；Load template；Click on analysis；Etc. end to be analyzed；Data intercept and figure；Switching waveform and template, lay equal stress on
Multiple above procedure is completed until all waveform analyses.It can be seen that prior art needs artificial Loaded contact analysis file one by one, loading
Template, manual analyzing, Manual interception data sectional drawing.The present invention is changed into analysis method that is original cumbersome mechanical and easily omitting more
For easy, clearly one-touch analysis, the workload of tester is greatly reduced.It is changed to simultaneously by manual mode of operation program control
Operation, not only effectively avoids mistake caused by manual operation, additionally it is possible to reduces the construction delay caused by errors and omissions.
A kind of knot of embodiment of the device provided by the present invention analyzed reference clock phase jitter
Structure block diagram is as shown in figure 5, the device includes：
Receiving module 100, the reference clock phase jitter for treating analysis waveform for receiving user's input carry out a key
The control instruction of analysis；
Load-on module 200, for loading all waveforms to be analyzed；
Judge module 300, for choosing present analysis waveform from the waveform to be analyzed loaded, judge described work as
The type of preceding analysis waveform；
Analysis module 400, for the type according to the present analysis waveform, gradually to each mould corresponding to the type
The reference clock phase jitter of plate is analyzed；
Preserving module 500, for automatically saving the data message after analyzing；
Module 600 is chosen, it is automatically described to be analyzed from what is loaded for after the present analysis waveform analysis terminates
Next waveform is chosen in waveform, untill all the waveform analysis to be analyzed terminates.
Specifically, when above-mentioned judge module 300 can be used for judging that the type of the present analysis waveform refers to for PCIe
Clock or QPI reference clocks.
Above-mentioned preserving module 500 is specifically used for automatic interception analysis result picture, and automatically saves analysis result data.
As a kind of preferred embodiment, the device provided by the present invention analyzed reference clock phase jitter is also
It may further include：
Reports module 700 is generated, for after all the waveform analysis to be analyzed terminates, the data after analysis to be believed
Cease automatic report generation.
The device provided by the present invention analyzed reference clock phase jitter, by receiving treating for user's input
The reference clock phase jitter of analysis waveform carries out the control instruction of a bonding analysis, loads all waveforms to be analyzed, adds from
Present analysis waveform is selected in the waveform to be analyzed carried；According to the type of the waveform, gradually to the reference clock of each template
Phase jitter is analyzed, and the data message after analysis is preserved；After present analysis waveform analysis terminates, automatically from
Next waveform is chosen in the waveform to be analyzed of loading, untill all waveform analysis to be analyzed terminates.
It can be seen that compared with the analysis that tradition is cumbersome mechanical and easily omits, it is provided by the present invention to reference clock phase
The device analyzed is shaken, by one-touch analysis, the workload of engineer is greatly reduced, improves the work of engineer
Efficiency, and can also effectively avoid mistake caused by manual operation.
The device provided by the present invention analyzed reference clock phase jitter is corresponding with the above method, can be mutual
Reference, it will not be repeated here.
Each embodiment is described by the way of progressive in this specification, what each embodiment stressed be with it is other
The difference of embodiment, between each embodiment same or similar part mutually referring to.
The foregoing description of the disclosed embodiments, professional and technical personnel in the field are enable to realize or using the present invention.
A variety of modifications to these embodiments will be apparent for those skilled in the art, as defined herein
General Principle can be realized in other embodiments without departing from the spirit or scope of the present invention.Therefore, it is of the invention
The embodiments shown herein is not intended to be limited to, and is to fit to and principles disclosed herein and features of novelty phase one
The most wide scope caused.
Claims (6)
- A kind of 1. method analyzed reference clock phase jitter, it is characterised in that including：The reference clock phase jitter for treating analysis waveform for receiving user's input carries out the control instruction of a bonding analysis；Load all waveforms to be analyzed；Present analysis waveform is chosen from the waveform to be analyzed loaded, judges the type of the present analysis waveform；According to the type of the present analysis waveform, gradually to the reference clock phase jitter of each template corresponding to the type Analyzed；Automatically save the data message after analysis；After the present analysis waveform analysis terminates, next ripple is chosen from the waveform to be analyzed loaded automatically Shape, untill all the waveform analysis to be analyzed terminates；The type for judging the present analysis waveform includes：Judge the type of the present analysis waveform for PCIe reference clocks or QPI reference clocks.
- 2. the method analyzed as claimed in claim 1 reference clock phase jitter, it is characterised in that the automatic guarantor Depositing the data message after analysis includes：Automatic interception analysis result picture, and automatically save analysis result data.
- 3. the method analyzed as claimed in claim 1 or 2 reference clock phase jitter, it is characterised in that also include：After all the waveform analysis to be analyzed terminates, by the data message automatic report generation after analysis.
- A kind of 4. device analyzed reference clock phase jitter, it is characterised in that including：Receiving module, the reference clock phase jitter for treating analysis waveform for receiving user's input carry out the control of a bonding analysis System instruction；Load-on module, for loading all waveforms to be analyzed；Judge module, for choosing present analysis waveform from the waveform to be analyzed loaded, judge the present analysis The type of waveform；Analysis module, for the type according to the present analysis waveform, gradually to the ginseng of each template corresponding to the type Clock phase shake is examined to be analyzed；Preserving module, for automatically saving the data message after analyzing；Module is chosen, for after the present analysis waveform analysis terminates, automatically from the waveform to be analyzed loaded Next waveform is chosen, untill all the waveform analysis to be analyzed terminates；The judge module is used to judge that the type of the present analysis waveform includes：When the judge module is specifically used for judging the type of the present analysis waveform for PCIe reference clocks or QPI references Clock.
- 5. the device analyzed as claimed in claim 4 reference clock phase jitter, it is characterised in that the preservation mould The data message that block is used to automatically save after analyzing includes：The preserving module is specifically used for automatic interception analysis result picture, and automatically saves analysis result data.
- 6. the device analyzed reference clock phase jitter as described in claim 4 or 5, it is characterised in that also include：Reports module is generated, it is after terminating in whole waveform analyses to be analyzed, the data message after analysis is automatic Generate form.
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| CN101393234A (en) * | 2007-09-17 | 2009-03-25 | 鸿富锦精密工业（深圳）有限公司 | Waveform auto-measuring system and method |
| CN101630283A (en) * | 2008-07-16 | 2010-01-20 | 鸿富锦精密工业（深圳）有限公司 | System and method for automatically generating report |
| CN204302410U (en) * | 2014-12-05 | 2015-04-29 | 荣信电力电子股份有限公司 | The automatic measuring and analysing meter of a kind of intelligent wave shape parameter |
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| JP2003329740A (en) * | 2002-05-16 | 2003-11-19 | Hitachi Ltd | Device and method for inspecting semiconductor, and method for manufacturing semiconductor device |
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| CN101393234A (en) * | 2007-09-17 | 2009-03-25 | 鸿富锦精密工业（深圳）有限公司 | Waveform auto-measuring system and method |
| CN101630283A (en) * | 2008-07-16 | 2010-01-20 | 鸿富锦精密工业（深圳）有限公司 | System and method for automatically generating report |
| CN204302410U (en) * | 2014-12-05 | 2015-04-29 | 荣信电力电子股份有限公司 | The automatic measuring and analysing meter of a kind of intelligent wave shape parameter |
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Effective date of registration: 20180817 Address after: 200436 Room 411, No. three, JIANGCHANG Road, Jingan District, Shanghai, 411 Patentee after: Shanghai wave Cloud Computing Service Co., Ltd. Address before: 100085 floor 1, C 2-1, No. 2, Shang Di Road, Haidian District, Beijing. Patentee before: Electronic information industry Co.,Ltd of the tide (Beijing) |