CN105095325A - Method and device for generating test data - Google Patents

Method and device for generating test data Download PDF

Info

Publication number
CN105095325A
CN105095325A CN201410222200.1A CN201410222200A CN105095325A CN 105095325 A CN105095325 A CN 105095325A CN 201410222200 A CN201410222200 A CN 201410222200A CN 105095325 A CN105095325 A CN 105095325A
Authority
CN
China
Prior art keywords
data
test data
tables
test
database systems
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
CN201410222200.1A
Other languages
Chinese (zh)
Inventor
姜志强
孙放宽
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
ZTE Corp
Original Assignee
ZTE Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by ZTE Corp filed Critical ZTE Corp
Priority to CN201410222200.1A priority Critical patent/CN105095325A/en
Priority to PCT/CN2014/086966 priority patent/WO2015176431A1/en
Publication of CN105095325A publication Critical patent/CN105095325A/en
Withdrawn legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00Error detection; Error correction; Monitoring
    • G06F11/36Preventing errors by testing or debugging software

Landscapes

  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Quality & Reliability (AREA)
  • Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Debugging And Monitoring (AREA)

Abstract

The invention provides a method and a device for generating test data, relating to the technical field of computers. The method and the device are used for solving the problem that a great amount of time and manpower needs to consumed by generating the test data in the prior art. The method comprises the steps as follows: obtaining data structure information and data configuration information of each data table in a database system; randomly generating the test data in a preset number according to the data structure information and the data configuration information, and distinguishing the test data in the preset number with service function test data of the database system. The method and the device of the invention could be used for testing program performance of the database system.

Description

A kind of generation method of test data and device
Technical field
The present invention relates to field of computer technology, particularly relate to a kind of generation method and device of test data.
Background technology
In the performance history of Database Systems, sql (StructuredQueryLanguage, Structured Query Language (SQL)) be distributed in multiple application module, write respectively by multiple application developer, because the professional skill of each developer is all had nothing in common with each other with programming custom, therefore the overall performance of sql program is difficult to ensure, needs to test by a lot of test data and verify.But database system structure is complicated, data volume is usually very huge, mathematical logic between the Database Systems of different business is different, needs to expend the huge time and manpower constructs the test data met the demands.
Need to expend huge time and human side for the generation of test data in correlation technique, not yet propose effective solution at present.
Summary of the invention
The technical problem to be solved in the present invention is to provide a kind of generation method and device of test data, needs to expend huge time and human side in order to solve the generation of test data in prior art.
For solving the problems of the technologies described above, on the one hand, the invention provides a kind of generation method of test data, comprising: the data structure information and the data configuration information that obtain each tables of data in Database Systems; According to described data structure information and described data configuration information, stochastic generation presets the test data of number, and the test data of described default number is distinguished mutually with the business function test data of described Database Systems.
Optionally, described data structure information comprises field length, the putting in order between field type and field of each field in each tables of data.
Optionally, described data configuration information comprises the field span of each field.
Concrete, in described acquisition Database Systems, the data structure information of each tables of data and data configuration information specifically comprise: the data structure information being obtained described each tables of data by the data dictionary reading described Database Systems; The data configuration information of described each tables of data is obtained by the service allocation list reading described Database Systems.
Optionally, according to described data structure information and data configuration information, stochastic generation presets the test data of number, the test data of described default number and the business function test data phase region of described Database Systems divide and comprise: according to the data volume of the test data that described data structure information, data configuration information and needs generate, configure the tables of data belonging to test data to be generated; Determine the span of the Major key of the tables of data belonging to described test data to be generated, the test data of described default number and the business function test data of described Database Systems to be distinguished mutually; Tables of data belonging to the test data of configuration and the span of described Major key determined, stochastic generation presets the test data of number.
On the other hand, the present invention also provides a kind of generating apparatus of test data, comprising:
Acquiring unit, for obtaining data structure information and the data configuration information of each tables of data in Database Systems; Generation unit, for the described data structure information that obtains according to described acquiring unit and data configuration information, stochastic generation presets the test data of number, and the test data of described default number is distinguished mutually with the business function test data of described Database Systems.
Optionally, described data structure information comprises field length, the putting in order between field type and field of each field in each tables of data.
Optionally, described data configuration information comprises the field span of each field in each tables of data.
Optionally, described acquiring unit specifically for: obtain the data structure information of described each tables of data by the data dictionary reading described Database Systems;
The data configuration information of described each tables of data is obtained by the service allocation list reading described Database Systems.
Optionally, described generation unit specifically for: the data volume of test data generated according to described data structure information, data configuration information and needing, configures the tables of data belonging to test data to be generated; Determine the span of the Major key of the tables of data belonging to described test data to be generated, the test data of described default number and the business function test data of described Database Systems to be distinguished mutually; Tables of data belonging to the test data of configuration and the span of described Major key determined, stochastic generation presets the test data of number.
The generation method of the test data that embodiments of the invention provide and device, data structure information and the data configuration information of each tables of data in Database Systems can be obtained, and the test data of number is preset according to the data structure information obtained and data configuration information stochastic generation, like this, the existing certain randomness of test data generated, also the grammar request of each field in each tables of data is met completely, therefore, it is possible to produce a large amount of test data in comparatively easy mode, thus the performance deficiency existed in abundant proving program performance history.Again due to generate the test data of default number and the business function test data of described Database Systems effectively distinguished, the test data of this proving program performance by the business function misapplied in validation database system, therefore can not can not affect the reliability of business function checking.
Accompanying drawing explanation
Fig. 1 is a kind of process flow diagram of the generation method of the test data that the embodiment of the present invention provides;
Fig. 2 is a kind of detail flowchart of the generation method of the test data that the embodiment of the present invention provides;
Fig. 3 is a kind of structural representation of the generating apparatus of the test data that the embodiment of the present invention provides.
Embodiment
Below in conjunction with drawings and Examples, the specific embodiment of the present invention is described in further detail.Following examples for illustration of the present invention, but are not used for limiting the scope of the invention.
As shown in Figure 1, embodiments of the invention provide a kind of generation method of test data, comprising:
S11, obtains data structure information and the data configuration information of each tables of data in Database Systems;
S12, according to described data structure information and described data configuration information, stochastic generation presets the test data of number, and the test data of described default number is distinguished mutually with the business function test data of described Database Systems.
The generation method of the test data that embodiments of the invention provide, data structure information and the data configuration information of each tables of data in Database Systems can be obtained, and the test data of number is preset according to the data structure information obtained and data configuration information stochastic generation, like this, the existing certain randomness of test data generated, also the grammar request of each field in each tables of data is met completely, therefore, it is possible to produce a large amount of test data in comparatively easy mode, thus the performance deficiency existed in abundant proving program performance history.Again due to generate the test data of default number and the business function test data of described Database Systems effectively distinguished, the test data of this proving program performance by the business function misapplied in validation database system, therefore can not can not affect the reliability of business function checking.
Database Systems store a large amount of data, and various data relationship embodies with the form of a large amount of tables of data usually.And in most cases, an entry in tables of data often needs multiple different field to describe, the field such as student number, name, sex, class, Chinese language, mathematics, English, politics of student such as, in the tables of data of a school transcript, may be comprised.In the data of description table such as to put in order so between the field length of each field, field type and field, the information of the relatively changeless feature of each field just defines the data structure information of tables of data.Such as, the student number of student can be integer, and name can be character string type, and sex can be integer, and class can be character string type, and Chinese language, mathematics, English, political achievement etc. can be Real-valued.The data dictionary that these data structure information can be write by the supplier of Database Systems carrys out record.Therefore, in step S11, the data structure information of described each tables of data specifically can be obtained by the data dictionary of read data storehouse system.
Corresponding with data structure information is data configuration information, this part information often describes the data characteristics that in tables of data, attribute is variable, therefore be not written in the data dictionary of Database Systems, but be arranged in some service allocation lists, can be defined according to embody rule and configure by user oneself.In step s 11, the data configuration information of described each tables of data specifically can be obtained by the service allocation list reading described Database Systems.Optionally, data configuration information can comprise the field span of each field, field enumerates scope etc.Such as, if student performance implementation is centesimal system, then the span of score of each subject is 0 to 100, if student performance is 150 points of systems, so the span of score of each subject is just 0 to 150.If student performance be with excellent, good, in, difference etc. measurement, so the scope of enumerating of score of each subject may be just 1,2,3,4, represent respectively excellent, good, in, poor.
After the data structure information obtaining each tables of data in database in step s 11 and data configuration information, in step s 12 just can according to described data structure information and described data configuration information, stochastic generation presets the test data of number.These test datas generated also can present with the form of test data table, accordingly, structure and the field of the structure of this test data table and field and the corresponding data table in Database Systems to be tested are corresponding, therefore, it is possible to carry out good test to these Database Systems to be measured.
It should be noted that, the test of Database Systems, except carrying out except the test of program feature, also needs to test accordingly the business function of these Database Systems, but is test equally, and the two requirement for test data is different.The test data data volume of business function test request is little, but strictly will coordinate with operation flow and service logic, therefore usually require a great deal of time and energy go customization.And the test data data volume of program feature test request is large, cover comprehensively, but test data itself strictly need not coordinate operation flow and service logic, therefore generates such test data simply too much.The different characteristics that embodiments of the invention are tested with program feature according to business function test, the data being used for program feature test are separated from business functional test data, generate the test data being specially adapted for program feature test in a large number, thus substantially increase program feature testing efficiency.
Specifically, method program feature test data and business function test data distinguished mutually can be varied, and embodiments of the invention are not restricted this.Preferably, in one embodiment of the invention, according to the span of the Major key of the test data table generated, the test data of described default number and the business function test data of described Database Systems can be distinguished mutually.Accordingly, in step s 12, according to described data structure information and data configuration information, the test data that stochastic generation presets number specifically can comprise the steps:
According to described data structure information, data configuration information and the data volume needing the test data generated, configure the tables of data belonging to test data to be generated;
Determine the span of the Major key of the tables of data belonging to described test data to be generated, the test data of described default number and the business function test data of described Database Systems to be distinguished mutually;
Tables of data belonging to the test data of configuration and the span of described Major key determined, stochastic generation presets the test data of number.
Illustrate, in one embodiment of the invention, suppose to be used in the test data table of business function test, the span of Major key is 10000 to 20000, so can the span of the Major key of tables of data belonging to the test data of stochastic generation be defined as from 810000, progressively increase progressively, thus the test data of described default number and the business function test data of described Database Systems are distinguished mutually.Wherein, the test data presetting number refers to the entry number of the test data that the needs preset generate.Such as, for the school transcript tables of data in previous embodiment, suppose to need generation 500000 test datas to carry out proving program performance, so 500000 be corresponding default number, if the initial value of Major key is 810000, then the span of the Major key of this tables of data is 810000 to 1310000.Optionally, this default number can according to business development trend, and prediction business uses the tables of data scale after the several years, to configure more applicable data volume.
Be described in detail below by the generation method of specific embodiment to test data provided by the invention.As shown in Figure 2, in the present embodiment, the generation method of test data comprises the steps:
S101. data structure information and the data configuration information of each tables of data in Database Systems is obtained;
S102. according to the data structure information obtained and data configuration information, configure the default number of test data in test data table to be generated, the field span of each field, field enumerate scope, the parameter configuration of the initial value of Major key and test data file cutting size etc.
It should be noted that, because systemic the subject of knowledge and the object of knowledge is limit, the too much test data of disposable loading may the processing speed of influential system, therefore, for the test of big data quantity, generally whole data file can be done and split, be divided into some sections of small documents and carry out successively being loaded into and testing.Therefore, in this step, the parameter of test data file cutting size can be set in data configuration table.Optionally, file division can be carried out using 2,000,000 each entries as a small documents.
S103. by sql statement, above-mentioned parameter is configured in the configuration of data inserting table and field configuration two table;
S104. the configuration data in above-mentioned two tables is read, and from data dictionary table, obtain corresponding data list structure, according to each field type of list structure, size, sequentially, generate corresponding random string, random digit, random date etc., be spliced into an entry according to each order of the field again, between each field of an entry, use binary-coded character to split.For the field having configuration major key and special constraint, also corresponding test data can be produced according to configuration.
Accordingly, embodiments of the invention also provide a kind of generating apparatus of test data, and as shown in Figure 3, this device comprises:
Acquiring unit 310, for obtaining data structure information and the data configuration information of each tables of data in Database Systems;
Generation unit 312, for the described data structure information that obtains according to acquiring unit 310 and data configuration information, stochastic generation presets the test data of number, and the test data of described default number is distinguished mutually with the business function test data of described Database Systems.
The generating apparatus of the test data that embodiments of the invention provide, acquiring unit 310 can obtain data structure information and the data configuration information of each tables of data in Database Systems, generation unit 312 can preset the test data of number according to the data structure information obtained and data configuration information stochastic generation, like this, the existing certain randomness of test data generated, also the grammar request of each field in each tables of data is met completely, therefore, it is possible to produce a large amount of test data in comparatively easy mode, thus the performance deficiency existed in abundant proving program performance history.Again due to generate the test data of default number and the business function test data of described Database Systems effectively distinguished, the test data of this proving program performance by the business function misapplied in validation database system, therefore can not can not affect the reliability of business function checking.
Optionally, described data structure information comprises field length, the putting in order between field type and field of each field in each tables of data.Described data configuration information comprises the field span of each field in each tables of data, field enumerates scope etc.
Concrete, acquiring unit 310 can be specifically for:
The data structure information of described each tables of data is obtained by the data dictionary reading described Database Systems;
The data configuration information of described each tables of data is obtained by the service allocation list reading described Database Systems.
Optionally, generation unit 312 can be specifically for:
According to described data structure information, data configuration information and the data volume needing the test data generated, configure the tables of data belonging to test data to be generated;
Determine the span of the Major key of the tables of data belonging to described test data to be generated, the test data of described default number and the business function test data of described Database Systems to be distinguished mutually;
Tables of data belonging to the test data of configuration and the span of described Major key determined, stochastic generation presets the test data of number.
Although be example object, disclose the preferred embodiments of the present invention, it is also possible for those skilled in the art will recognize various improvement, increase and replacement, and therefore, scope of the present invention should be not limited to above-described embodiment.

Claims (10)

1. a generation method for test data, is characterized in that, comprising:
Obtain data structure information and the data configuration information of each tables of data in Database Systems;
According to described data structure information and described data configuration information, stochastic generation presets the test data of number; Wherein, the test data of described default number is distinguished mutually with the business function test data of described Database Systems.
2. method according to claim 1, is characterized in that, described data structure information comprises field length, the putting in order between field type and field of each field in each tables of data.
3. method according to claim 1, is characterized in that, described data configuration information comprises the field span of each field.
4. according to the method in any one of claims 1 to 3, it is characterized in that, in described acquisition Database Systems, the data structure information of each tables of data and data configuration information specifically comprise:
The data structure information of described each tables of data is obtained by the data dictionary reading described Database Systems;
The data configuration information of described each tables of data is obtained by the service allocation list reading described Database Systems.
5. according to the method in any one of claims 1 to 3, it is characterized in that, according to described data structure information and data configuration information, stochastic generation presets the test data of number, and the test data of described default number and the business function test data phase region of described Database Systems divide and comprise:
According to described data structure information, data configuration information and the data volume needing the test data generated, configure the tables of data belonging to test data to be generated;
Determine the span of the Major key of the tables of data belonging to described test data to be generated, the test data of described default number and the business function test data of described Database Systems to be distinguished mutually;
Tables of data belonging to the test data of configuration and the span of described Major key determined, stochastic generation presets the test data of number.
6. a generating apparatus for test data, is characterized in that, comprising:
Acquiring unit, for obtaining data structure information and the data configuration information of each tables of data in Database Systems;
Generation unit, for the described data structure information that obtains according to described acquiring unit and data configuration information, stochastic generation presets the test data of number, and the test data of described default number is distinguished mutually with the business function test data of described Database Systems.
7. device according to claim 6, is characterized in that, described data structure information comprises field length, the putting in order between field type and field of each field in each tables of data.
8. device according to claim 6, is characterized in that, described data configuration information comprises the field span of each field in each tables of data.
9. the device according to any one of claim 6 to 8, is characterized in that, described acquiring unit specifically for:
The data structure information of described each tables of data is obtained by the data dictionary reading described Database Systems;
The data configuration information of described each tables of data is obtained by the service allocation list reading described Database Systems.
10. the device according to any one of claim 6 to 8, is characterized in that, described generation unit specifically for:
According to described data structure information, data configuration information and the data volume needing the test data generated, configure the tables of data belonging to test data to be generated;
Determine the span of the Major key of the tables of data belonging to described test data to be generated, the test data of described default number and the business function test data of described Database Systems to be distinguished mutually;
Tables of data belonging to the test data of configuration and the span of described Major key determined, stochastic generation presets the test data of number.
CN201410222200.1A 2014-05-23 2014-05-23 Method and device for generating test data Withdrawn CN105095325A (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
CN201410222200.1A CN105095325A (en) 2014-05-23 2014-05-23 Method and device for generating test data
PCT/CN2014/086966 WO2015176431A1 (en) 2014-05-23 2014-09-19 Method and device for generating test data

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201410222200.1A CN105095325A (en) 2014-05-23 2014-05-23 Method and device for generating test data

Publications (1)

Publication Number Publication Date
CN105095325A true CN105095325A (en) 2015-11-25

Family

ID=54553318

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201410222200.1A Withdrawn CN105095325A (en) 2014-05-23 2014-05-23 Method and device for generating test data

Country Status (2)

Country Link
CN (1) CN105095325A (en)
WO (1) WO2015176431A1 (en)

Cited By (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN105512042A (en) * 2015-12-22 2016-04-20 广东金赋信息科技有限公司 Automatic generation method and device for testing data of database and testing system
CN106649108A (en) * 2016-12-13 2017-05-10 北京锐安科技有限公司 Generation method and device of test data
CN106897205A (en) * 2015-12-18 2017-06-27 阿里巴巴集团控股有限公司 A kind of test data generating method and device
CN108459951A (en) * 2017-02-21 2018-08-28 腾讯科技(深圳)有限公司 test method and device
CN108563584A (en) * 2018-05-09 2018-09-21 平安普惠企业管理有限公司 Test data generating method, device, computer equipment and storage medium
CN109753495A (en) * 2019-01-28 2019-05-14 浪潮软件集团有限公司 A kind of universal architecture big data generation method
CN110188037A (en) * 2019-05-13 2019-08-30 北京一览群智数据科技有限责任公司 A kind of digital simulation method and device
CN110263029A (en) * 2019-05-06 2019-09-20 平安科技(深圳)有限公司 Method, apparatus, terminal and the medium of database generation test data
CN110516008A (en) * 2019-08-14 2019-11-29 北京海致星图科技有限公司 A kind of method of structural map platform test data
CN110750442A (en) * 2019-09-06 2020-02-04 平安医疗健康管理股份有限公司 Test case generation method, device, equipment and storage medium
CN111309734A (en) * 2020-02-20 2020-06-19 第四范式(北京)技术有限公司 Method and system for automatically generating table data

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN110109824B (en) * 2019-04-09 2022-05-17 平安科技(深圳)有限公司 Big data autoregression test method and device, computer equipment and storage medium
CN110674029A (en) * 2019-08-26 2020-01-10 平安科技(深圳)有限公司 Method and device for automatically generating test data, electronic equipment and storage medium
CN112073709B (en) * 2020-07-27 2023-04-14 武汉旷视金智科技有限公司 Test data generation method and device and electronic equipment
CN113986747A (en) * 2021-11-05 2022-01-28 京东科技信息技术有限公司 Data generation method and device, electronic equipment and storage medium
CN114416531A (en) * 2021-12-23 2022-04-29 税友信息技术有限公司 Test data generation method, device, equipment and medium

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102722537A (en) * 2012-05-22 2012-10-10 苏州阔地网络科技有限公司 Database test data generation method and system thereof
CN102902685A (en) * 2011-07-27 2013-01-30 阿里巴巴集团控股有限公司 Database-based testing method and device for tool system
CN102968370A (en) * 2012-11-26 2013-03-13 中国电信股份有限公司云计算分公司 Test data generating method and device
CN103176894A (en) * 2011-12-22 2013-06-26 ***股份有限公司 Test data automatic derivative method and automatic derivative device facing database

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3366257B2 (en) * 1998-07-07 2003-01-14 エヌイーシーシステムテクノロジー株式会社 Data warehouse test data creation device
CN103186639B (en) * 2011-12-31 2017-10-10 腾讯科技(北京)有限公司 Data creation method and system
US9734214B2 (en) * 2012-06-28 2017-08-15 Entit Software Llc Metadata-based test data generation
CN103810171B (en) * 2012-11-06 2017-02-08 深圳市金蝶天燕中间件股份有限公司 Method and system for generating random test data within limited range

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102902685A (en) * 2011-07-27 2013-01-30 阿里巴巴集团控股有限公司 Database-based testing method and device for tool system
CN103176894A (en) * 2011-12-22 2013-06-26 ***股份有限公司 Test data automatic derivative method and automatic derivative device facing database
CN102722537A (en) * 2012-05-22 2012-10-10 苏州阔地网络科技有限公司 Database test data generation method and system thereof
CN102968370A (en) * 2012-11-26 2013-03-13 中国电信股份有限公司云计算分公司 Test data generating method and device

Cited By (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN106897205A (en) * 2015-12-18 2017-06-27 阿里巴巴集团控股有限公司 A kind of test data generating method and device
CN106897205B (en) * 2015-12-18 2021-01-05 创新先进技术有限公司 Test data generation method and device
CN105512042B (en) * 2015-12-22 2018-09-04 广东金赋科技股份有限公司 A kind of automatic generation method of the test data of database, device and test system
CN105512042A (en) * 2015-12-22 2016-04-20 广东金赋信息科技有限公司 Automatic generation method and device for testing data of database and testing system
CN106649108A (en) * 2016-12-13 2017-05-10 北京锐安科技有限公司 Generation method and device of test data
CN108459951A (en) * 2017-02-21 2018-08-28 腾讯科技(深圳)有限公司 test method and device
CN108459951B (en) * 2017-02-21 2022-07-29 腾讯科技(深圳)有限公司 Test method and device
CN108563584A (en) * 2018-05-09 2018-09-21 平安普惠企业管理有限公司 Test data generating method, device, computer equipment and storage medium
CN109753495A (en) * 2019-01-28 2019-05-14 浪潮软件集团有限公司 A kind of universal architecture big data generation method
CN110263029A (en) * 2019-05-06 2019-09-20 平安科技(深圳)有限公司 Method, apparatus, terminal and the medium of database generation test data
CN110263029B (en) * 2019-05-06 2023-06-23 平安科技(深圳)有限公司 Method, device, terminal and medium for generating test data by database
CN110188037A (en) * 2019-05-13 2019-08-30 北京一览群智数据科技有限责任公司 A kind of digital simulation method and device
CN110188037B (en) * 2019-05-13 2024-01-09 北京一览群智数据科技有限责任公司 Data simulation method and device
CN110516008A (en) * 2019-08-14 2019-11-29 北京海致星图科技有限公司 A kind of method of structural map platform test data
CN110750442A (en) * 2019-09-06 2020-02-04 平安医疗健康管理股份有限公司 Test case generation method, device, equipment and storage medium
CN111309734A (en) * 2020-02-20 2020-06-19 第四范式(北京)技术有限公司 Method and system for automatically generating table data
CN111309734B (en) * 2020-02-20 2023-12-05 第四范式(北京)技术有限公司 Method and system for automatically generating table data

Also Published As

Publication number Publication date
WO2015176431A1 (en) 2015-11-26

Similar Documents

Publication Publication Date Title
CN105095325A (en) Method and device for generating test data
JP7343568B2 (en) Identifying and applying hyperparameters for machine learning
EP3563243B1 (en) Determining application test results using screenshot metadata
US9020981B2 (en) Systems and methods for generating schemas that represent multiple data sources
US9652472B2 (en) Service requirement analysis system, method and non-transitory computer readable storage medium
WO2019085474A1 (en) Calculation engine implementing method, electronic device, and storage medium
US10956381B2 (en) Data migration system
US9460069B2 (en) Generation of test data using text analytics
Holzschuher et al. Querying a graph database–language selection and performance considerations
US20150186808A1 (en) Contextual data analysis using domain information
CN110019116B (en) Data tracing method, device, data processing equipment and computer storage medium
CN113505128A (en) Method, device and equipment for creating data table and storage medium
JPWO2013161850A1 (en) Text mining system, text mining method and program
CN104077218A (en) Test method and device of MapReduce distributed system
US20190205128A1 (en) Determining similarity groupings for software development projects
CN103559313B (en) Searching method and device
US11645523B2 (en) Generating explanatory paths for predicted column annotations
US11487801B2 (en) Dynamic data visualization from factual statements in text
CN111309586B (en) Command testing method and device and storage medium thereof
CN109582906A (en) Determination method, apparatus, equipment and the storage medium of data reliability
CN109542757A (en) Interface testing environment determines method, apparatus, electronic equipment and storage medium
US9805073B1 (en) Data normalization system
CN113434542B (en) Data relationship identification method and device, electronic equipment and storage medium
CN115617773A (en) Data migration method, device and system
CN112434009A (en) End-to-end data probing method and device, computer equipment and storage medium

Legal Events

Date Code Title Description
C06 Publication
PB01 Publication
SE01 Entry into force of request for substantive examination
SE01 Entry into force of request for substantive examination
WW01 Invention patent application withdrawn after publication
WW01 Invention patent application withdrawn after publication

Application publication date: 20151125