CN105095082A - application program testing method and device - Google Patents
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- CN105095082A CN105095082A CN201510520968.1A CN201510520968A CN105095082A CN 105095082 A CN105095082 A CN 105095082A CN 201510520968 A CN201510520968 A CN 201510520968A CN 105095082 A CN105095082 A CN 105095082A
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Abstract
According to the application program testing method and device provided by the embodiment of the invention, the time length for testing the current testing function can be obtained in the testing process, and when the time length exceeds the preset time length threshold value, the next function is selected as the current testing function according to the preset testing sequence for testing. The invention automatically jumps to the next function to continue testing when the current testing function test times out, thereby preventing the testing process from being interrupted due to abnormal functions. When the method and the device are used for testing the application program, a large amount of time cannot be wasted, and the rapid testing of the application program is ensured.
Description
Technical field
The present invention relates to Application testing technical field, particularly relate to applied program testing method and device.
Background technology
Along with the development of science and technology, the various application programs in electronic equipment also get more and more, and the update of application program is also more and more faster.
Before application issued, the various functions of first application programs is needed to test.Existing applied program testing method is tested various functions successively according to certain testing sequence.When a certain dysfunction, existing applied program testing method will stop test process, retains field data, test process is interrupted because of the exception of a certain function.
But because the renewal interval of application program is shorter and shorter, the time therefore leaving Application testing for is also less.But existing applied program testing method just stops test when a certain dysfunction, collect after relevant information until technician and just continue test, waste a large amount of time, be unfavorable for the quick test of application program.
Summary of the invention
The object of the embodiment of the present invention is to provide a kind of applied program testing method and device, to realize the quick test of application program.
For achieving the above object, the embodiment of the invention discloses a kind of applied program testing method, be applied in the first electronic equipment, described method comprises:
Successively the function in multiple functions of application program to be tested is tested, in test process as current test function according to the testing sequence preset:
Obtain the duration that current test function is tested;
When described duration exceedes preset duration threshold value, choose next function according to the testing sequence preset and test as current test function.
Optionally, in test process, also comprise:
The generation of monitoring collapse file;
When having monitored collapse file generated, obtaining the described collapse file of generation and having restarted described application program to be tested, after described application program to be tested is restarted, having continued to test the function of described application program to be tested.
Optionally, in test process, also comprise: after having monitored collapse file generated, for the current test function of unsuccessful test arranges test badge;
The function of described continuation to described application program to be tested is tested, and comprising:
Continue to test the current test function with described test badge;
Or, according to the testing sequence preset, continue to test next function of the current test function with described test badge.
Optionally, in test process, also comprise:
Send heartbeat message to the second electronic equipment, when not receiving the heartbeat message of described first electronic equipment transmission to make described second electronic equipment in preset time period, control described first electronic equipment and restart;
After described first electronic equipment is restarted, continue to test the function of described application program to be tested.
Optionally, in test process, also comprise:
For current test function arranges test badge, cancel the test badge of the function setting for success test;
The function of described continuation to described application program to be tested is tested, and comprising:
Continue to test the current test function with described test badge;
Or, according to the testing sequence preset, continue to test next function of the current test function with described test badge.
A kind of Application testing device, be applied in the first electronic equipment, described device comprises: test module and duration detection module,
Described test module, for testing the function in multiple functions of described application program to be tested as current test function successively according to the testing sequence preset;
Described duration detection module, for obtaining the duration tested current test function in described test module test process, when described duration exceedes preset duration threshold value, control described test module and choose next function test as current test function according to the testing sequence preset.
Optionally, also comprise: file monitoring modular and program restart module,
Described file monitoring modular, for the generation of monitoring collapse file in described test module test process;
Described program restarts module, for described file monitoring module monitors to have collapse file generated time, obtain the described collapse file of generation and restart described application program to be tested, after described application program to be tested is restarted, control described test module and continue to test the function of described application program to be tested.
Optionally, also comprise: mark module is set, in described test module test process, described file monitoring module monitors to have collapse file generated after, for the current test function of unsuccessful test arranges test badge;
Described program restarts module, specifically for:
Described file monitoring module monitors to have collapse file generated time, obtain the described collapse file of generation and restart described application program to be tested, after described application program to be tested is restarted, control described test module and continue to test the current test function with described test badge;
Or,
Described file monitoring module monitors to have collapse file generated time, obtain the described collapse file of generation and restart described application program to be tested, after described application program to be tested is restarted, control described test module according to the testing sequence preset, continue to test next function of the current test function with described test badge.
Optionally, also comprise: heartbeat sending module, for in described test module test process, heartbeat message is sent to the second electronic equipment, when not receiving the heartbeat message of described first electronic equipment transmission to make described second electronic equipment in preset time period, control described first electronic equipment and restart;
Described test module, also for after described first electronic equipment is restarted, continues to test the function of described application program to be tested.
Optionally, also comprise: mark cancels module, in described test module test process, for current test function arranges test badge, cancel the test badge of the function setting for success test;
Described test module also specifically for:
Function in multiple functions of described application program to be tested tested as current test function successively according to the testing sequence preset, after described first electronic equipment is restarted, the current test function continued having described test badge is tested;
Or, successively the function in multiple functions of described application program to be tested is tested as current test function according to the testing sequence preset, after described first electronic equipment is restarted, according to the testing sequence preset, continue to test next function of the current test function with described test badge.
The embodiment of the present invention additionally provides a kind of storage medium, and wherein, this storage medium is for storing application program, and described application program is used for operationally performing a kind of applied program testing method of the present invention.Wherein, a kind of applied program testing method of the present invention, be applied in the first electronic equipment, described method comprises:
Successively the function in multiple functions of application program to be tested is tested, in test process as current test function according to the testing sequence preset:
Obtain the duration that current test function is tested;
When described duration exceedes preset duration threshold value, choose next function according to the testing sequence preset and test as current test function.
The embodiment of the present invention additionally provides a kind of application program, and wherein, this application program is used for operationally performing a kind of applied program testing method of the present invention.Wherein, a kind of applied program testing method of the present invention, be applied in the first electronic equipment, described method comprises:
Successively the function in multiple functions of application program to be tested is tested, in test process as current test function according to the testing sequence preset:
Obtain the duration that current test function is tested;
When described duration exceedes preset duration threshold value, choose next function according to the testing sequence preset and test as current test function.
The embodiment of the present invention additionally provides a kind of electronic equipment, and this electronic equipment comprises:
Processor, storer, communication interface and bus;
Described processor, described storer and described communication interface are connected by described bus and complete mutual communication;
Described storer stores executable programs code;
Described processor runs the program corresponding with described executable program code by reading the executable program code stored in described storer, for:
Successively the function in multiple functions of application program to be tested is tested, in test process as current test function according to the testing sequence preset:
Obtain the duration that current test function is tested;
When described duration exceedes preset duration threshold value, choose next function according to the testing sequence preset and test as current test function.
A kind of applied program testing method that the embodiment of the present invention provides and device, can automatically jump to next function when current test function test time-out and proceed test.Because dysfunction is for application program is run quickly and burst, importance is much smaller, and therefore the invention enables test process not interrupt because of dysfunction, and can be absorbed in runs quickly to burst to the higher application program of importance tests.When application programs of the present invention is tested, a large amount of time can not be wasted, ensure that the quick test of application program.
Accompanying drawing explanation
In order to be illustrated more clearly in the embodiment of the present invention or technical scheme of the prior art, be briefly described to the accompanying drawing used required in embodiment or description of the prior art below, apparently, accompanying drawing in the following describes is only some embodiments of the present invention, for those of ordinary skill in the art, under the prerequisite not paying creative work, other accompanying drawing can also be obtained according to these accompanying drawings.
The process flow diagram of a kind of applied program testing method that Fig. 1 provides for the embodiment of the present invention;
The process flow diagram of the another kind of applied program testing method that Fig. 2 provides for the embodiment of the present invention;
The process flow diagram of the another kind of applied program testing method that Fig. 3 provides for the embodiment of the present invention;
The structural representation of a kind of Application testing device that Fig. 4 provides for the embodiment of the present invention;
The structural representation of the another kind of Application testing device that Fig. 5 provides for the embodiment of the present invention.
Embodiment
Below in conjunction with the accompanying drawing in the embodiment of the present invention, be clearly and completely described the technical scheme in the embodiment of the present invention, obviously, described embodiment is only the present invention's part embodiment, instead of whole embodiments.Based on the embodiment in the present invention, those of ordinary skill in the art, not making the every other embodiment obtained under creative work prerequisite, belong to the scope of protection of the invention.
As shown in Figure 1, a kind of applied program testing method that the embodiment of the present invention provides, be applied in the first electronic equipment, the method can comprise:
Successively the function in multiple functions of application program to be tested is tested as current test function according to the testing sequence preset; In test process, comprise the steps:
S100, obtain the duration that current test function is tested;
Wherein, above-mentioned multiple function can be repertoire or the partial function of application program to be tested.Testing sequence can be determined according to parameters such as the significance level of each function, complexity, test cost durations.
S200, when described duration exceedes preset duration threshold value, choose next function test as current test function according to the testing sequence preset.
When certain function of application programs is tested, may occur testing abnormal situation.In this case, to this function carry out test cost time longer.Now, the present invention can skip this function, directly tests next function, and the test spended time that doing so avoids owing to extremely causing the test occurred in certain functional test is longer.
A kind of applied program testing method that the embodiment of the present invention provides, can automatically jump to next function when current test function is abnormal and proceed test.Because dysfunction is for application program is run quickly and burst, importance is much smaller, and therefore the invention enables test process not interrupt because of dysfunction, and can be absorbed in runs quickly to burst to the higher application program of importance tests.When application programs of the present invention is tested, a large amount of time can not be wasted, ensure that the quick test of application program.
On basis embodiment illustrated in fig. 1, as shown in Figure 2, the another kind of applied program testing method that the embodiment of the present invention provides, can also comprise:
The generation of S300, monitoring collapse file;
Wherein, collapse file is the file that application program to be tested generates automatically when application crash to be tested, and optionally, collapse file is Dump file.Dump file is the memory mirror of program process.The executing state of application program is preserved in Dump file, as: the internal memory of whole User space, certainly, the executing state be kept in Dump file can moreover be only part capsule information, as register and thread stack space.After acquisition collapse file, just can analyze collapse file, to determine the reason of application crash and to solve.
Step S100 shown in Fig. 1 obtains the duration tested current test function, and the generation of step S300 monitoring collapse file can perform simultaneously in test process.The execution sequence of step S100, step S200 shown in step S300 and Fig. 1 can have multiple, and the present invention is not construed as limiting.
S400, when having monitored collapse file generated, obtaining the described collapse file generated and also having restarted described application program to be tested, after described application program to be tested is restarted, having continued to test the function of described application program to be tested.
Wherein, the execution sequence of step S100, step S200 shown in step S400 and Fig. 1 can have multiple, and the present invention is not construed as limiting.
Wherein, whether application crash to be tested embodies the overall operation situation of application program to be tested.Because the important procedure of the overall operation situation of application program to be tested is higher than the ruuning situation of individual event function, whether therefore the present invention only can pay close attention to the overall operation situation of application program to be tested, normally run, ignore individual event function.Like this, in the short period of time, the overall operation situation of application program to be tested can be confirmed, ensure that the application program to be tested issued can normally be run on the whole, there will not be collapse.And the more individual event functional test of spended time can be carried out after application issued to be tested, after pinpointing the problems, is adjusted the function of announced application program to be tested by modes such as patches.
Concrete, the mode obtaining the described collapse file generated can be for: from the preservation address of collapse file, take out generated collapse file.
In other embodiments of the present invention, in test process, can also comprise: after having monitored collapse file generated, for the current test function of unsuccessful test arranges test badge;
Step S400 continues to test the function of described application program to be tested, can comprise:
Continue to test the current test function with described test badge;
Or, according to the testing sequence preset, continue to test next function of the current test function with described test badge.
By the interpolation of test badge, the present invention can, after application program to be tested is run quickly and burst, continue, to the function of testing before or next functional test of function tested before, not need the test that starts anew, avoid the function that test had been tested, save the time.
A kind of applied program testing method that the embodiment of the present invention provides, can automatically jump to next function when current test function test time-out and proceed test, thus test process is not interrupted because of dysfunction.Meanwhile, the present invention can also obtain collapse file when application crash and re-launching applications proceeds test, and therefore the present invention also makes test process not interrupt because of application crash.When application programs of the present invention is tested, a large amount of time can not be wasted, ensure that the quick test of application program.
As shown in Figure 3, the another kind of applied program testing method that the embodiment of the present invention provides, in test process, can also comprise:
S500, to second electronic equipment send heartbeat message, with make described second electronic equipment do not receive in preset time period described first electronic equipment send heartbeat message time, control described first electronic equipment and restart; After described first electronic equipment is restarted, continue to test the function of described application program to be tested.
Concrete, the execution sequence of step S500 and step S100, step S200 can have multiple, and be not limited to the one shown in Fig. 3, the present invention is not construed as limiting this.
Wherein, step S500 also can add to embodiment illustrated in fig. 2 in, equally, step S500 and embodiment illustrated in fig. 2 in the execution sequence of each step can have multiple, the present invention is not construed as limiting.
Wherein, heartbeat message refers to that an electronic equipment is by periodically sending information to another electronic equipment, reports health status, makes the electronic equipment of reception information can whether judge the other side " survival ".
Wherein, embodiment illustrated in fig. 3 in test process, can also comprise:
For current test function arranges test badge, cancel the test badge of the function setting for success test;
Step S500 continues to test the function of described application program to be tested, can comprise:
Continue to test the current test function with described test badge;
Or, according to the testing sequence preset, continue to test next function of the current test function with described test badge.
By arranging test badge for current test function, cancel the test badge of the function setting for success test, test badge just can be made to follow current test function, thus after the first electronic equipment is restarted, the current test function of unsuccessful test before continuation or before deserving next function of test function test.
Be understandable that, in the process treating test application test, operating system also may be collapsed, and now test process cannot proceed.In this case, the present invention can make this another electronic equipment restart the electronic equipment of application the inventive method when the operating system of the electronic equipment applying the inventive method is collapsed by sending heartbeat message to another electronic equipment, thus electronic equipment can be restarted in time and proceed test.
Corresponding with said method embodiment, present invention also offers a kind of Application testing device.
As shown in Figure 4, a kind of Application testing device that the embodiment of the present invention provides, be applied in the first electronic equipment, this device can comprise: test module 100 and duration detection module 200,
Test module 100, for testing the function in multiple functions of application program to be tested as current test function successively according to the testing sequence preset;
Wherein, above-mentioned multiple function can be repertoire or the partial function of application program to be tested.Testing sequence can be determined according to parameters such as the significance level of each function, complexity, test cost durations.
Duration detection module 200, for obtaining the duration tested current test function in described test module 100 test process, when described duration exceedes preset duration threshold value, control described test module and choose next function test as current test function according to the testing sequence preset.
When certain function of application programs is tested, may occur testing abnormal situation.In this case, to this function carry out test cost time longer.Now, the present invention can skip this function, directly tests next function, and the test spended time that doing so avoids owing to extremely causing the test occurred in certain functional test is longer.
A kind of Application testing device that the embodiment of the present invention provides, can automatically jump to next function when current test function test time-out and proceed test.Because dysfunction is for application program is run quickly and burst, importance is much smaller, and therefore the invention enables test process not interrupt because of dysfunction, and can be absorbed in runs quickly to burst to the higher application program of importance tests.When application programs of the present invention is tested, a large amount of time can not be wasted, ensure that the quick test of application program.
On basis embodiment illustrated in fig. 4, as shown in Figure 5, the another kind of Application testing device that the embodiment of the present invention provides, can also comprise: file monitoring modular 300 and program restart module 400,
Described file monitoring modular 300, for the generation of monitoring collapse file in described test module 100 test process;
Wherein, collapse file is the file that application program to be tested generates automatically when application crash to be tested, and optionally, collapse file is Dump file.Dump file is the memory mirror of program process.The executing state of application program is preserved in Dump file, as: the internal memory of whole User space, certainly, the executing state be kept in Dump file can moreover be only part capsule information, as register and thread stack space.After acquisition collapse file, just can analyze collapse file, to determine the reason of application crash and to solve.
Described program restarts module 400, during for having monitored collapse file generated at described file monitoring modular 300, obtain the described collapse file of generation and restart described application program to be tested, after described application program to be tested is restarted, control described test module 100 and continue to test the function of described application program to be tested.
Wherein, whether application crash to be tested embodies the overall operation situation of application program to be tested.Because the important procedure of the overall operation situation of application program to be tested is higher than the ruuning situation of individual event function, whether therefore the present invention only can pay close attention to the overall operation situation of application program to be tested, normally run, ignore individual event function.Like this, in the short period of time, the overall operation situation of application program to be tested can be confirmed, ensure that the application program to be tested issued can normally be run on the whole, there will not be collapse.And the more individual event functional test of spended time can be carried out after application issued to be tested, after pinpointing the problems, is adjusted the function of announced application program to be tested by modes such as patches.
In other embodiments of the present invention, Fig. 5 shown device can also comprise: mark arranges module, for in described test module 100 test process, after described file monitoring modular 300 has monitored collapse file generated, for the current test function of unsuccessful test arranges test badge;
Described program restarts module 400, specifically for:
When described file monitoring modular 300 has monitored collapse file generated, obtain the described collapse file of generation and restart described application program to be tested, after described application program to be tested is restarted, control the current test function that described test module 100 continues having described test badge and test;
Or,
When described file monitoring modular 300 has monitored collapse file generated, obtain the described collapse file of generation and restart described application program to be tested, after described application program to be tested is restarted, control described test module 100 according to the testing sequence preset, continue to test next function of the current test function with described test badge.
By the interpolation of test badge, the present invention can, after application program to be tested is run quickly and burst, continue, to the function of testing before or next functional test of function tested before, not need the test that starts anew, avoid the function that test had been tested, save the time.
A kind of Application testing device that the embodiment of the present invention provides, can automatically jump to next function when current test function test time-out and proceed test, thus test process is not interrupted because of dysfunction.Meanwhile, the present invention can also obtain collapse file when application crash and re-launching applications proceeds test, and therefore the present invention also makes test process not interrupt because of application crash.When application programs of the present invention is tested, a large amount of time can not be wasted, ensure that the quick test of application program.
The another kind of Application testing device that the embodiment of the present invention provides, can also comprise:
Heartbeat sending module, for in described test module 100 test process, send heartbeat message to the second electronic equipment, when not receiving the heartbeat message of described first electronic equipment transmission to make described second electronic equipment in preset time period, control described first electronic equipment and restart;
Wherein, heartbeat message refers to that an electronic equipment is by periodically sending information to another electronic equipment, reports health status, makes the electronic equipment of reception information can whether judge the other side " survival ".
Described test module 100, also for after described first electronic equipment is restarted, the function continuing to treat test application is tested.
When a kind of Application testing device that the embodiment of the present invention provides comprises heartbeat sending module, further, this device can also comprise: mark cancels module, for in described test module 100 test process, for current test function arranges test badge, cancel the test badge of the function setting for success test;
Described test module 100 specifically for:
Function in multiple functions of described application program to be tested tested as current test function successively according to the testing sequence preset, after described first electronic equipment is restarted, the current test function continued having described test badge is tested;
Or, successively the function in multiple functions of described application program to be tested is tested as current test function according to the testing sequence preset, after described first electronic equipment is restarted, according to the testing sequence preset, continue to test next function of the current test function with described test badge.
By arranging test badge for current test function, cancel the test badge of the function setting for success test, test badge just can be made to follow current test function, thus after the first electronic equipment is restarted, the current test function of unsuccessful test before continuation or before deserving next function of test function test.
Be understandable that, in the process treating test application test, operating system also may be collapsed, and now test process cannot proceed.In this case, the present invention can make this another electronic equipment restart the electronic equipment of application the inventive method when the operating system of the electronic equipment applying the inventive method is collapsed by sending heartbeat message to another electronic equipment, thus electronic equipment can be restarted in time and proceed test.
Correspondingly, the embodiment of the present invention additionally provides a kind of storage medium, and wherein, this storage medium is for storing application program, and described application program is used for operationally performing a kind of applied program testing method of the present invention.Wherein, a kind of applied program testing method of the present invention, be applied in the first electronic equipment, described method comprises:
Successively the function in multiple functions of application program to be tested is tested, in test process as current test function according to the testing sequence preset:
Obtain the duration that current test function is tested;
When described duration exceedes preset duration threshold value, choose next function according to the testing sequence preset and test as current test function.
Correspondingly, the embodiment of the present invention additionally provides a kind of application program, and wherein, this application program is used for operationally performing a kind of applied program testing method of the present invention.Wherein, a kind of applied program testing method of the present invention, be applied in the first electronic equipment, described method comprises:
Successively the function in multiple functions of application program to be tested is tested, in test process as current test function according to the testing sequence preset:
Obtain the duration that current test function is tested;
When described duration exceedes preset duration threshold value, choose next function according to the testing sequence preset and test as current test function.
Correspondingly, the embodiment of the present invention additionally provides a kind of electronic equipment, and this electronic equipment comprises:
Processor, storer, communication interface and bus;
Described processor, described storer and described communication interface are connected by described bus and complete mutual communication;
Described storer stores executable programs code;
Described processor runs the program corresponding with described executable program code by reading the executable program code stored in described storer, for:
Successively the function in multiple functions of application program to be tested is tested, in test process as current test function according to the testing sequence preset:
Obtain the duration that current test function is tested;
When described duration exceedes preset duration threshold value, choose next function according to the testing sequence preset and test as current test function.
A kind of electronic equipment that the embodiment of the present invention provides, can automatically jump to next function when current test function test time-out and proceed test.Because dysfunction is for application program is run quickly and burst, importance is much smaller, and therefore the invention enables test process not interrupt because of dysfunction, and can be absorbed in runs quickly to burst to the higher application program of importance tests.When application programs of the present invention is tested, a large amount of time can not be wasted, ensure that the quick test of application program.
It should be noted that, in this article, the such as relational terms of first and second grades and so on is only used for an entity or operation to separate with another entity or operational zone, and not necessarily requires or imply the relation that there is any this reality between these entities or operation or sequentially.And, term " comprises ", " comprising " or its any other variant are intended to contain comprising of nonexcludability, thus make to comprise the process of a series of key element, method, article or equipment and not only comprise those key elements, but also comprise other key elements clearly do not listed, or also comprise by the intrinsic key element of this process, method, article or equipment.When not more restrictions, the key element limited by statement " comprising ... ", and be not precluded within process, method, article or the equipment comprising described key element and also there is other identical element.
Each embodiment in this instructions all adopts relevant mode to describe, between each embodiment identical similar part mutually see, what each embodiment stressed is the difference with other embodiments.Especially, for system embodiment, because it is substantially similar to embodiment of the method, so description is fairly simple, relevant part illustrates see the part of embodiment of the method.
The foregoing is only preferred embodiment of the present invention, be not intended to limit protection scope of the present invention.All any amendments done within the spirit and principles in the present invention, equivalent replacement, improvement etc., be all included in protection scope of the present invention.
Claims (10)
1. an applied program testing method, is characterized in that, be applied in the first electronic equipment, described method comprises:
Successively the function in multiple functions of application program to be tested is tested, in test process as current test function according to the testing sequence preset:
Obtain the duration that current test function is tested;
When described duration exceedes preset duration threshold value, choose next function according to the testing sequence preset and test as current test function.
2. method according to claim 1, is characterized in that, in test process, also comprises:
The generation of monitoring collapse file;
When having monitored collapse file generated, obtaining the described collapse file of generation and having restarted described application program to be tested, after described application program to be tested is restarted, having continued to test the function of described application program to be tested.
3. method according to claim 2, is characterized in that, in test process, also comprises: after having monitored collapse file generated, for the current test function of unsuccessful test arranges test badge;
The function of described continuation to described application program to be tested is tested, and comprising:
Continue to test the current test function with described test badge;
Or, according to the testing sequence preset, continue to test next function of the current test function with described test badge.
4. method according to claim 1, is characterized in that, in test process, also comprises:
Send heartbeat message to the second electronic equipment, when not receiving the heartbeat message of described first electronic equipment transmission to make described second electronic equipment in preset time period, control described first electronic equipment and restart;
After described first electronic equipment is restarted, continue to test the function of described application program to be tested.
5. method according to claim 4, is characterized in that, in test process, also comprises:
For current test function arranges test badge, cancel the test badge of the function setting for success test;
The function of described continuation to described application program to be tested is tested, and comprising:
Continue to test the current test function with described test badge;
Or, according to the testing sequence preset, continue to test next function of the current test function with described test badge.
6. an Application testing device, is characterized in that, be applied in the first electronic equipment, described device comprises: test module and duration detection module,
Described test module, for testing the function in multiple functions of described application program to be tested as current test function successively according to the testing sequence preset;
Described duration detection module, for obtaining the duration tested current test function in described test module test process, when described duration exceedes preset duration threshold value, control described test module and choose next function test as current test function according to the testing sequence preset.
7. device according to claim 6, is characterized in that, also comprises: file monitoring modular and program restart module,
Described file monitoring modular, for the generation of monitoring collapse file in described test module test process;
Described program restarts module, for described file monitoring module monitors to have collapse file generated time, obtain the described collapse file of generation and restart described application program to be tested, after described application program to be tested is restarted, control described test module and continue to test the function of described application program to be tested.
8. device according to claim 7, it is characterized in that, also comprise: mark arranges module, in described test module test process, described file monitoring module monitors to have collapse file generated after, for the current test function of unsuccessful test arranges test badge;
Described program restarts module, specifically for:
Described file monitoring module monitors to have collapse file generated time, obtain the described collapse file of generation and restart described application program to be tested, after described application program to be tested is restarted, control described test module and continue to test the current test function with described test badge;
Or,
Described file monitoring module monitors to have collapse file generated time, obtain the described collapse file of generation and restart described application program to be tested, after described application program to be tested is restarted, control described test module according to the testing sequence preset, continue to test next function of the current test function with described test badge.
9. device according to claim 6, it is characterized in that, also comprise: heartbeat sending module, for in described test module test process, heartbeat message is sent to the second electronic equipment, when not receiving the heartbeat message of described first electronic equipment transmission to make described second electronic equipment in preset time period, control described first electronic equipment and restart;
Described test module, also for after described first electronic equipment is restarted, continues to test the function of described application program to be tested.
10. device according to claim 9, is characterized in that, also comprises: mark cancels module, in described test module test process, for current test function arranges test badge, cancels the test badge of the function setting for success test;
Described test module also specifically for:
Function in multiple functions of described application program to be tested tested as current test function successively according to the testing sequence preset, after described first electronic equipment is restarted, the current test function continued having described test badge is tested;
Or, successively the function in multiple functions of described application program to be tested is tested as current test function according to the testing sequence preset, after described first electronic equipment is restarted, according to the testing sequence preset, continue to test next function of the current test function with described test badge.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201510520968.1A CN105095082A (en) | 2015-08-21 | 2015-08-21 | application program testing method and device |
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| CN114245416A (en) * | 2021-12-22 | 2022-03-25 | 上海豪承信息技术有限公司 | Test management method, device, equipment and test system |
| CN114676069A (en) * | 2022-05-30 | 2022-06-28 | 深圳市科力锐科技有限公司 | Kernel file testing method, device, equipment and storage medium |
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