CN104914307B - A kind of spectral measuring method of frequency spectrograph and its parallel frequency sweep of multi-parameter - Google Patents
A kind of spectral measuring method of frequency spectrograph and its parallel frequency sweep of multi-parameter Download PDFInfo
- Publication number
- CN104914307B CN104914307B CN201510196966.1A CN201510196966A CN104914307B CN 104914307 B CN104914307 B CN 104914307B CN 201510196966 A CN201510196966 A CN 201510196966A CN 104914307 B CN104914307 B CN 104914307B
- Authority
- CN
- China
- Prior art keywords
- frequency
- test
- measurement
- window
- test window
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Landscapes
- Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
Abstract
The invention discloses a kind of frequency spectrograph and its spectral measuring method of the parallel frequency sweep of multi-parameter, frequency spectrograph includes signal input module, control process module, signal measurement module and display module.During spectrum measurement, signal input module obtains input signal；The test window quantity that control process module is set according to default test window quantity or user, multiple test windows are partitioned on display module, and according to the setting of user, preserve the setting of parameter setting and test frequency or frequency range that user is carried out to each test window；Signal measurement module carries out spectrum measurement to the frequency corresponding to each test window or frequency range；Display module shows the measurement result corresponding to each test window.User can be directed to the situation of different frequent points or unlike signal in same signal, be partitioned into multiple test windows and different parameters are set to it, can save the time of spectrum measurement, it is to avoid prior art carries out the troublesome operation of parameter switching.
Description
Technical field
The present invention relates to spectrum measurement field, and in particular to a kind of frequency spectrograph and its spectrum measurement of the parallel frequency sweep of multi-parameter
Method.
Background technology
Spectrum measurement technology has become more and more extensive measuring method, but utilizes the spectrum measurement side of prior art
When method is tested echo signal, frequency spectrograph only one of which display window and a set of sweep parameter, to a signal not
When measuring with frequency or multiple signals, generally require to set a variety of different parameters, the method for prior art is accomplished by leading to
The input keyboard or on-screen menu for crossing instrument set different parameters to be tested respectively, switch cumbersome, test effect between parameter
Rate is relatively low.
For example, being intended to measure multiple frequencies signal frequency point apart from each other, it is necessary to sweep width while covering these using wider
Point.If using larger frequency resolution (RBW, Resolution Band With), although time of measuring can shorten, surveying
Test result resolution ratio is not fine, and details can not be observed；If using less frequency resolution, although it is observed that each frequency
Point place very fine measurement details, but sweep time for growing very much can be caused, because (scanning divides smaller RBW time of measuring length
Resolution is small or sweeps roomy, and sweep time is just long；Scanning resolution is big or sweeps wide small, and sweep time is just short).So being typically only capable to
These are needed on the frequency of careful observation, and repeatedly independent test is carried out using less frequency range, to increase measurement details simultaneously
Reduce sweep time, but which results in switch cumbersome, the problem of testing efficiency is relatively low between parameter.
In another example, it is intended to measure the different signal of multiple level magnitudes, it is necessary to could see using different measurement datums
Examine the difference for obtaining these signals.If using the larger higher signal of datum (Reference Level) measuring amplitude,
Increase decay is accomplished by, then bottom is made an uproar rise, it is impossible to while it was observed that the relatively low signal of amplitude；If being surveyed using less datum
The relatively low signal of discharge amplitude, it is necessary to open preamplifier, then add distortion, it is impossible to while it was observed that the higher letter of amplitude
Number.So being typically only capable on the level of these careful observations of needs, carried out using different datum frequency ranges multiple independent
Test process, with increase measurement details and reduce measurement distortion.
In existing frequency spectrograph technical scheme, sweeping the parameters such as width/resolution ratio/datum/sweep time can only be arranged on
Uniquely executable sweep parameter is set in man-machine interface, and from the beginning single pass sweeps to tail, and will on a display screen
Scanning result is shown.If, it is necessary to make when the multiple different frequencies of measurement and amplitude state diversity ratio larger signal
Wide or larger datum is swept while covering these points with wider, the characteristics of instrument state can not take into account multiple signals, that
A set of sweep parameter cannot be adapted to frequency accuracy and the amplitude precision that each needs measurement signal well, can only carry out
Repeatedly independent test process, switching complexity, are also inconvenient to be contrasted.
The content of the invention
According to the first aspect of the invention there is provided a kind of spectral measuring method of the parallel frequency sweep of multi-parameter, including：
Split window：Start segmentation test window function；The survey set according to default test window quantity or user
Number of windows is tried, multiple test windows are partitioned on screen；
Parameter setting：One of multiple test windows is chosen successively and parameter setting is carried out to it；
The setting of test frequency or frequency range is carried out to selected test window；
Signal measurement：Spectrum measurement is carried out to its corresponding frequency or frequency range on each test window；
As a result show：The measurement result corresponding to each test window is shown on screen.
Split window step also includes：Automatically generate the sequence number of multiple test windows.
Or, the sequence number of test window is set in parameter setting step, can be that sequence number is carried out to the test window chosen
Set；Or, the sequence number layout of test window is generated according to the order that the test window is selected.
Parameter is carried out to the test window chosen to be set to：To sweeping wide and/or resolution ratio and/or datum and/or sweeping
The time of retouching is configured.
Signal measurement step is：Frequency spectrum is carried out to its corresponding frequency or frequency range using each test window in order
Measurement.
Spectral measuring method can also include：Increase or decrease the quantity of test window.The parameter of increased test window
It is identical by the parameter of the test window of carry out parameter setting with last in original test window.
Spectral measuring method can also include setting measurement pattern, and setting measurement pattern is：The measurement mould of frequency spectrograph is set
Formula is single measurement or circulation measurement；Single measurement is that frequency spectrograph is completed after a spectrum measurement of multiple test windows, knot
Beam measurement process；Circulation is measured as, and frequency spectrograph is completed after a spectrum measurement of multiple test windows, and circulation performs spectrum measurement
Process, until reaching default cycle-index or the cycle-index of setting.
According to the second aspect of the invention there is provided a kind of frequency spectrograph, including signal input module, control process module, letter
Number measurement module and display module.Signal input module is connected to control process module, for obtaining input signal；Control process
Module is used for the test window quantity set according to default test window quantity or user, is partitioned on display module many
Individual test window, and according to the setting of user, preserve parameter setting and test frequency that user is carried out to each test window
The setting of point or frequency range；Signal measurement module is connected to control process module, for corresponding to each test window
Frequency or frequency range carry out spectrum measurement；Display module is connected to control process module and signal measurement module, every for showing
Measurement result corresponding to one test window.
Parameter setting includes sweeping the setting of wide and/or resolution ratio and/or datum and/or sweep time.
Control process module is additionally operable to increase or decrease the quantity of test window, the parameter of increased test window with it is original
Last in test window is identical by the parameter of the test window of carry out parameter setting.
Signal measurement module carries out frequency spectrum survey using each test window to its corresponding frequency or frequency range in order
Amount.
Control process module is additionally operable to set measurement pattern, that is, sets the measurement pattern of frequency spectrograph for single measurement or follow
Ring is measured；Single measurement is that frequency spectrograph is completed after a spectrum measurement of multiple test windows, terminates measurement process；Circulation is surveyed
Measure and be, frequency spectrograph is completed after a spectrum measurement of multiple test windows, circulation performs spectrum measurement process, until reaching default
Cycle-index or setting cycle-index.
The beneficial effects of the invention are as follows, user can be directed to the situation of different frequent points or unlike signal in same signal,
It is partitioned into multiple test windows and multiple test windows is set with different parameters, for the high frequency of precise requirements, sets
Higher resolution ratio, low frequency is handed over for precise requirements, without setting higher resolution ratio, has so both saved frequency spectrum survey
The time of amount, it also avoid the troublesome operation that prior art carries out parameter switching.
Brief description of the drawings
Fig. 1 is the structural scheme of mechanism of the frequency spectrograph of the embodiment of the present invention one；
Fig. 2 is the measured signal schematic diagram of the embodiment of the present invention one；
Fig. 3 is the window segmentation effect figure of the frequency spectrograph of the embodiment of the present invention one；
Fig. 4 is the spectrum measurement result display renderings of the embodiment of the present invention one；
Fig. 5 is the measured signal schematic diagram of the embodiment of the present invention two；
Fig. 6 is the spectrum measurement result display renderings of the embodiment of the present invention two.
Embodiment
The present invention is described in further detail below by embodiment combination accompanying drawing.
Embodiment one：
It is as shown in Figure 1 the structural representation of the present embodiment frequency spectrograph, including input module 001, control process module
002nd, signal measurement module 003 and display module 004.Input module 001 is connected to control process module 002, defeated for obtaining
Enter signal；Control process module 002 is used for the test window quantity set according to default test window quantity or user,
Multiple test windows are partitioned on display module, and according to the setting of user, preserve what user was carried out to each test window
The setting of parameter setting and test frequency or frequency range；Signal measurement module 003 is connected to control process module 002, is used for
Spectrum measurement is carried out to the frequency corresponding to each test window or frequency range；Display module 004 is connected to control process mould
Block 002 and signal measurement module 003, for showing the measurement result corresponding to each test window, display module 004 shields
Curtain.
The spectral measuring method of the parallel frequency sweep of multi-parameter of the present embodiment comprises the following steps：
S1, input module 001 obtain signal, and user starts segmentation test window function, and control process module 002 is according to pre-
If test window quantity or user set test window quantity, multiple test windows are partitioned on screen.Specifically,
As shown in Fig. 2 user needs to be scanned tetra- frequencies of A1, A2, A3, A4 on frequency spectrograph screen, understand by analysis, four
Individual frequency needs to be scanned using different scanning resolutions, therefore, and the test window of the present embodiment is by user in frequency spectrograph
TIP or on-screen menu or corresponding remote menu on be configured, the quantity of test window is four, then shields
Four test windows are partitioned on curtain, the segmentation effect of four test windows is as shown in Figure 3.
S2, choose four test windows one, the setting of test frequency or frequency range is carried out to the test window, and right
It carries out parameter setting, i.e., be configured to sweeping width, resolution ratio // datum, sweep time etc. so that the window can show
Show the scanning result to A1 frequencies.The sequence number layout of test window is generated according to the order that the test window is selected, therefore
The test window numbering chosen for the first time is one.
Similarly, second window is selected, test frequency or frequency range and parameter are configured so that the window can
The scanning result to A2 frequencies is shown, test window numbering is two.
Similarly, the setting of the test window corresponding to A3 and A4 frequencies is completed.
Because tetra- frequencies of A1, A2, A3, A4 are mainly the requirement difference to scanning resolution, therefore four test windows
The main distinction of parameter setting lie also in scanning resolution and set different.
S3, unlatching scanning process, the signal measurement module 003 of frequency spectrograph is in order using four test windows to its correspondence
Frequency or frequency range carry out spectrum measurement, i.e., frequency spectrograph successively complete No. first to fourth test window scanning.
The measurement result to tetra- frequencies of A1, A2, A3, A4 is shown on S4, screen respectively, Fig. 4 show A1, A2, A3, A4
The schematic diagram of the measurement result of four frequencies.
In the implementation procedure of spectral measuring method, the quantity of test window can be increased or decreased.Increased testing window
The parameter of mouth is with last in original test window by the test window of carry out parameter setting (i.e. corresponding to the 4th of A4 frequencies the
Number test window) parameter it is identical.
Spectral measuring method can also include setting measurement pattern, and the step of setting measurement pattern can be in S3 steps
Before, it is single measurement or circulation measurement that can set the measurement pattern of frequency spectrograph.Single measurement is that frequency spectrograph completes multiple survey
After a spectrum measurement for trying window, terminate measurement process；Circulation is measured as, and frequency spectrograph completes the once frequency of multiple test windows
After spectrometry, circulation performs spectrum measurement process, until reaching default cycle-index or the cycle-index of setting.
Embodiment two：
The spectral measuring method of the parallel frequency sweep of multi-parameter of the present embodiment comprises the following steps：
S1, startup segmentation test window function, as shown in figure 5, user is needed to two frequencies of B1, B2 on frequency spectrograph screen
Point is scanned, and is understood by analysis, due to distant, so the part between two frequencies need not be scanned, therefore, this reality
The test window for applying example is set to two by user, then two test windows are partitioned on screen.
The parameters such as scanning resolution and the datum that S2, two frequency bins need choose wherein one as could be arranged to
Individual test window, to the test window test the setting of frequency, and it is swept width, resolution ratio, datum, sweep time
Etc. being configured so that the window can show the scanning result to B1 frequencies.The sequence number layout of test window is according to the test
The selected order of window is generated, therefore the test window numbering chosen for the first time is one.
Similarly, second window is selected, test frequency or frequency range and parameter are configured so that the window can
The scanning result to B2 frequencies is shown, test window numbering is two.
S3, unlatching scanning process, frequency spectrograph carry out frequency spectrum survey using two test windows to its corresponding frequency in order
Amount.
The measurement result to B1, B2 two frequency bins is shown on S4, screen respectively, Fig. 6 show the survey of B1, B2 two frequency bins
Measure the schematic diagram of result.For ease of checking, user can click number one test window, and such No. second test window is just hidden
Gear so that two test windows can preferably show details without being extruded on screen simultaneously.
The present invention is in the structure of existing frequency spectrograph, by instrument in input keyboard (or long-range host computer order) segmentation window
The setting of mouth function, multiple independent display windows are divided into by original single on-screen display (osd) area, and select to set many sets
Correspondence sweep parameter, often one independent measurement of set sweep parameter completion is realized many with scanning process completion by once setting
Cover the measurement of parameter.User can be directed to the situation of different frequent points or unlike signal in same signal, multiple to what is be partitioned into
Test window sets different parameters, such as the high frequency of precise requirements, higher resolution ratio is set, for accuracy
It is required that handing over low frequency, without setting higher resolution ratio, the time of spectrum measurement was so both saved, existing skill is it also avoid
Art carries out the troublesome operation of parameter switching.
Above content is to combine specific embodiment further description made for the present invention, it is impossible to assert this hair
Bright specific implementation is confined to these explanations.For general technical staff of the technical field of the invention, do not taking off
On the premise of from present inventive concept, some simple deduction or replace can also be made.
Claims (10)
1. a kind of spectral measuring method of the parallel frequency sweep of multi-parameter, it is characterised in that including：
Split window：Start segmentation test window function；
According to default test window quantity, multiple test windows are partitioned on screen；
Parameter setting：One of the multiple test window is chosen successively and parameter setting is carried out to it；
The setting of test frequency or frequency range is carried out to selected test window；
Signal measurement：Spectrum measurement is carried out to its corresponding frequency or frequency range on each test window；
As a result show：The measurement result corresponding to each test window is shown on screen.
2. spectral measuring method as claimed in claim 1, it is characterised in that it is described that the split window step also includes generation
The sequence number of multiple test windows；
The mode of the sequence number of the multiple test window of the generation is：The sequence number of the multiple test window is automatically generated, or
The sequence number of the test window that person chooses is generated by setting, or test window sequence number layout according to the test window quilt
The order chosen is generated.
3. spectral measuring method as claimed in claim 1, it is characterised in that parameter setting is carried out to the test window chosen
For：It is configured to sweeping wide and/or resolution ratio and/or datum and/or sweep time.
4. spectral measuring method as claimed in claim 1, it is characterised in that the signal measurement step is：Utilize in order
Each test window carries out spectrum measurement to its corresponding frequency or frequency range.
5. spectral measuring method as claimed in claim 1, it is characterised in that also include：Increase or decrease the number of test window
Amount.
6. spectral measuring method as claimed in claim 5, it is characterised in that the parameter of increased test window and original test
Last in window is identical by the parameter of the test window of carry out parameter setting.
7. the spectral measuring method as described in claim any one of 1-6, it is characterised in that also including setting measurement pattern, institute
Stating setting measurement pattern is：It is single measurement or circulation measurement to set the measurement pattern of frequency spectrograph；
The single measurement is that frequency spectrograph is completed after a spectrum measurement of the multiple test window, terminates measurement process；
The circulation is measured as, and frequency spectrograph is completed after a spectrum measurement of the multiple test window, and circulation performs frequency spectrum and surveyed
Amount process, until reaching default cycle-index.
8. a kind of frequency spectrograph, it is characterised in that including signal input module, control process module, signal measurement module and display
Module；
The signal input module is connected to the control process module, for obtaining input signal；
The control process module is used for according to default test window quantity, and multiple testing windows are partitioned on display module
Mouthful, and according to the setting of user, preserve parameter setting and test frequency or frequency that user is carried out to each test window
The setting of section；
The signal measurement module is connected to the control process module, for the frequency corresponding to each test window or
Person's frequency range carries out spectrum measurement；
The display module is connected to the control process module and the signal measurement module, for showing each testing window
Measurement result corresponding to mouthful.
9. frequency spectrograph as claimed in claim 8, it is characterised in that the parameter setting include sweeping wide and/or resolution ratio and/or
Datum and/or the setting of sweep time.
10. frequency spectrograph as claimed in claim 8, it is characterised in that the control process module is additionally operable to increase or decrease survey
The quantity of window is tried, the parameter of increased test window is with last in original test window by the test of carry out parameter setting
The parameter of window is identical.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201510196966.1A CN104914307B (en) | 2015-04-23 | 2015-04-23 | A kind of spectral measuring method of frequency spectrograph and its parallel frequency sweep of multi-parameter |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201510196966.1A CN104914307B (en) | 2015-04-23 | 2015-04-23 | A kind of spectral measuring method of frequency spectrograph and its parallel frequency sweep of multi-parameter |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN104914307A CN104914307A (en) | 2015-09-16 |
| CN104914307B true CN104914307B (en) | 2017-09-12 |
Family
ID=54083547
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201510196966.1A Active CN104914307B (en) | 2015-04-23 | 2015-04-23 | A kind of spectral measuring method of frequency spectrograph and its parallel frequency sweep of multi-parameter |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN104914307B (en) |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105182071A (en) * | 2015-09-29 | 2015-12-23 | 中国电子科技集团公司第四十一研究所 | Method for improving spectrum display speed of digital television tester |
| CN111758280B (en) * | 2017-11-24 | 2022-03-08 | 华为技术有限公司 | Network access node and method thereof |
Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP1032156A2 (en) * | 1999-02-26 | 2000-08-30 | TRW Inc. | Windowed presummation calcualtor for digital channeliser |
| CN1520589A (en) * | 2001-05-15 | 2004-08-11 | ά����ķ����˾ | Device and method for processing audio signal |
| WO2011150618A1 (en) * | 2010-06-02 | 2011-12-08 | 中兴通讯股份有限公司 | Radio terminal and signal scanning method thereof |
| CN103176043A (en) * | 2011-12-21 | 2013-06-26 | 北京普源精电科技有限公司 | Signal generator with frequency meter and signal processing method |
| CN104020330A (en) * | 2014-05-14 | 2014-09-03 | 中国电子科技集团公司第四十一研究所 | Method for improving accuracy of frequency spectrum measurement of signal analyzer |
| CN104036273A (en) * | 2014-05-22 | 2014-09-10 | 南京信息工程大学 | Fingerprint image segmentation method based on compositing window SIVV features |
-
2015
- 2015-04-23 CN CN201510196966.1A patent/CN104914307B/en active Active
Patent Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP1032156A2 (en) * | 1999-02-26 | 2000-08-30 | TRW Inc. | Windowed presummation calcualtor for digital channeliser |
| CN1520589A (en) * | 2001-05-15 | 2004-08-11 | ά����ķ����˾ | Device and method for processing audio signal |
| WO2011150618A1 (en) * | 2010-06-02 | 2011-12-08 | 中兴通讯股份有限公司 | Radio terminal and signal scanning method thereof |
| CN103176043A (en) * | 2011-12-21 | 2013-06-26 | 北京普源精电科技有限公司 | Signal generator with frequency meter and signal processing method |
| CN104020330A (en) * | 2014-05-14 | 2014-09-03 | 中国电子科技集团公司第四十一研究所 | Method for improving accuracy of frequency spectrum measurement of signal analyzer |
| CN104036273A (en) * | 2014-05-22 | 2014-09-10 | 南京信息工程大学 | Fingerprint image segmentation method based on compositing window SIVV features |
Non-Patent Citations (1)
| Title |
|---|
| 基于神经网络的多窗口频谱估计方法研究;马伟 等;《电波科学学报》;20091231;第24卷(第6期);第1154-1157、1176-1177页 * |
Also Published As
| Publication number | Publication date |
|---|---|
| CN104914307A (en) | 2015-09-16 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| US8872504B2 (en) | Method for automatically setting frequency span in a spectrum analyzer | |
| US4611164A (en) | Spectrum analyzer with automatic peak frequency tuning function | |
| CN104133120B (en) | A kind of WB-RCS method of testing simultaneously tested based on multichannel | |
| CN104914307B (en) | A kind of spectral measuring method of frequency spectrograph and its parallel frequency sweep of multi-parameter | |
| US5869959A (en) | Spectrum analyzer | |
| CN102565546A (en) | Electromagnetic radiation scanning and positioning method | |
| CN106019188B (en) | MR saturation under conditions of considering anatomical structure to be imaged | |
| US10061466B2 (en) | Method for automatically adjusting the magnification and offset of a display to view a selected feature | |
| JPS63218869A (en) | Spectrum analyzer | |
| US8446144B2 (en) | Frequency characteristics measuring device | |
| US6407756B1 (en) | Graphical user interface for a logic analyzer which allows simplified clock selection | |
| JPH0544989B2 (en) | ||
| CN202710660U (en) | SOPC-based frequency characteristic H(jomega) testing device | |
| US5175880A (en) | Signal analysis | |
| CN103698639B (en) | Crystal oscillator waveform parameter automatic measurement system and method | |
| CN104198846B (en) | Automatic testing method and system of aging characteristics of crystal oscillator | |
| CN103185820B (en) | A kind of oscillograph with automatic cursor tracking function | |
| JP2009085942A (en) | System and method for providing signal analysis data | |
| CN111245536A (en) | Multi-channel real-time spectrum analysis device and method | |
| US20180152255A1 (en) | Method for searching a spur in a signal received and device for searching a spur in a signal received | |
| CN106872775A (en) | A kind of spectrum analyzer and its signal processing method | |
| CN109900983B (en) | Measuring device for parasitic parameters of high-frequency transformer | |
| CN108595153B (en) | Radar equipment parameter testing development model based on general instrument | |
| CN105004678B (en) | A kind of rock core spectrum scanner spectral measurement source tracing method | |
| CN107835056A (en) | A kind of multichannel power measurement and display methods and device |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C06 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| GR01 | Patent grant | ||
| GR01 | Patent grant | ||
| CP03 | Change of name, title or address |
Address after: 518000 Guangdong Province, Baoan District, Baoan District, Xin'an Street, Xingdong Community, 68 District, Antongda Industrial Factory Area, 4 factories, 3 floors, 5 office buildings, 1-3 floors Patentee after: Shenzhen dingyang Technology Co., Ltd Address before: Shenzhen City, Guangdong province Baoan District 518000 District 68 road left three Antongda Industrial Park, 4 floor Patentee before: Shenzhen Siglent Technologies Co., Ltd. |
|
| CP03 | Change of name, title or address |