CN104865284A - Apparatus used for generating single-frequency low-energy soft X-ray beam - Google Patents
Apparatus used for generating single-frequency low-energy soft X-ray beam Download PDFInfo
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- CN104865284A CN104865284A CN201510158754.4A CN201510158754A CN104865284A CN 104865284 A CN104865284 A CN 104865284A CN 201510158754 A CN201510158754 A CN 201510158754A CN 104865284 A CN104865284 A CN 104865284A
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Abstract
The invention an apparatus used for generating a single-frequency low-energy soft X-ray beam. The apparatus comprises an X-ray light source, an X-ray raster, an attenuation slice group and a diaphragm which are placed in a sequence, wherein the X-ray raster carries out light splitting on the input X-ray light source, the attenuation slice group is used for attenuating the energy of an X-ray beam, and the diaphragm is used for choosing target spectrum bands of X rays. The apparatus provided by the invention is used for generation and acquisition of the single-frequency low-energy soft X-ray beam.
Description
Technical field
The present invention relates to a kind of single-frequency low energy grenz ray light beam to produce and emitter, particularly the laser of single-frequency low energy grenz ray light beam produces and emitter.
Background technology
Space environment is four living environments of the mankind except sea, land and sky.The mankind will enter space, utilize space, must space exploration, Cognitive Spaces, grasp space environment to the impact of mankind's activity.Low energy grenz ray is the important component part of space environment, therefore, and the important tool in the low energy soft x-ray detector solution space that has been the mankind, understanding space.In order to ensureing that the performance of low energy soft x-ray detector meets user demand in-orbit, need to carry out ground test to detector.Wherein, the low-yield soft X_ray source of single-frequency is the important leverage of carrying out the test of ground experiment room.
Synchrotron, X ray light pipe, laser-plasma X-ray source are the methods of comparatively common acquisition X ray.But domestic synchrotron is bulky, domestic only several are difficult to meet the long-term testing requirement in laboratory; X ray light pipe can produce soft X-ray source, but output power is higher, can not the low-yield soft X_ray source environment in real simulation space; Laser-plasma X-ray source utilizes high-power laser pulse irradiated material, produce high-temperature high-density laser plasma, ionized by atom high and the plasma that formed can produce very strong radiation at Soft X-Ray Region, laser plasma soft X-ray light source stability is poor, also can not meet soft x-ray detector testing requirement.In addition, the grenz ray spectral coverage that synchrotron, X ray light pipe, laser-plasma X-ray source produce is wider, all can not meet soft x-ray detector certain spectral performance test demand.In sum, the acquisition of the low-yield soft X_ray source of single-frequency brings extreme difficulties to the ground test of soft x-ray detector.
Summary of the invention
The technical matters that the present invention solves is: overcome the deficiencies in the prior art, provide a kind of device producing single-frequency low energy grenz ray light beam, can realize generation and the acquisition of the low-yield grenz ray light beam of single frequency band.
Technical scheme of the present invention is: a kind of device for generation of single-frequency low energy grenz ray light beam, comprises X-ray source, X ray grating, attenuator group and diaphragm; Described attenuator group is made up of multiple independently X-ray attenuation sheet; After X-ray source produces X ray, extract X ray target spectral coverage through X ray grating and diaphragm, then carry out exporting after energy attenuation through attenuator group.
Described aperture material is plumbous.
Described x-ray source is double anode X-ray tube.
Described diaphragm placement location meets by X ray target spectral coverage.
Described x-ray spectrometry device chooses transmission-type X-ray grating, and screen periods is 500nm, area 10 × 0.1mm
2, golden thickness 500nm, dutycycle 0.4 ~ 0.6, grid line shape is rectangle, useful area 70%.
Described X-ray attenuation sheet comprises polyimide film and aluminum membranous layer, uses the method for evaporation to be plated on polyimide film by aluminum membranous layer; The X ray of polyimide film to below 1keV has decay shielding action, and aluminium film has decay shielding action to visible light wave range.
The thicknesses of layers of polyimide is 1um.
Aluminum membranous layer thickness is 10 nanometers or 20nm or 30nm or 40nm or 50nm.
The present invention's advantage is compared with prior art:
The invention provides a kind of device for generation of single-frequency low energy grenz ray light beam, novel part embodies a concentrated reflection of and can carry out single-frequency process to polytype x-ray source, can control X-ray intensity, be a kind of universal method producing single-frequency low energy grenz ray simultaneously.Compared with X ray synchrotron radiation source, volume is little, floor area significantly reduces, cost reduces, and selectable X ray spectral coverage is various, and adjustment fast.Compared with laser x-ray source, the X-ray intensity of generation is stablized, and spectral purity is high, signal to noise ratio (S/N ratio) is high.
Accompanying drawing explanation
Fig. 1 single-frequency low-yield grenz ray light beam generating method schematic diagram;
Fig. 2 X ray spectral schematic diagram;
Fig. 3 X-ray attenuation schematic diagram.
Embodiment
A kind of device for generation of single-frequency low energy grenz ray light beam of the present invention, comprises X-ray source, X ray grating, attenuator group and diaphragm; Described attenuator group is made up of multiple independently X-ray attenuation sheet; After X-ray source produces X ray, extract X ray target spectral coverage through X ray grating and diaphragm, then carry out exporting after energy attenuation through attenuator group.As shown in Figure 1, X-ray tube, X ray grating, attenuator group and diaphragm order are placed.X-ray tube uses double anode excitation types, and metallic target material is magnesium (Mg), aluminium (Al) and zirconium (Zr), and corresponding spectral coverage is respectively 1.25keV, 1.49keV and 2.04keV, belongs to Soft X-ray Spectra segment limit.
Open X-ray tube working power, produce X ray.Select X ray operating power, be 300W (Mg) or 400W (Al) to the maximum.
The X ray collimation produced due to X-ray tube is poor, and therefore X ray can within the scope of 140 ° of cone angles, and spectral coverage differentiation is carried out in the radiation using X ray grating pair X-ray tube to produce, and is picked out, as Fig. 2 by the spectral coverage of slit by needs.According to grating principle, dsin θ=λ, wherein d is grating constant, and θ is light splitting angle, and λ is incident X-rays wavelength.Between slit parameter D and spectroscopic distance L, relation can be expressed as:
tgθ＝D/L
Because θ is low-angle, can be approximated to be tg θ=sin θ=θ, therefore L=dD/ λ
As calculated, L ≈ 1330mm, transmits after namely requiring to have at least the space of 1330mm to make X ray light splitting.After transmission range reaches light splitting requirement, the X ray of different spectral coverage can separate in locus, by the position of accurate adjustment diaphragm, makes required spectral coverage from diaphragm slit effusion mistake, completes single-frequency election process.
As Fig. 3, the X-ray energy of attenuator group to incidence is used to decay.Attenuator is made up of two parts, is respectively Kapton and aluminium film.
The content be not described in detail in instructions of the present invention belongs to the known technology of those skilled in the art.
Claims (8)
1. for generation of a device for single-frequency low energy grenz ray light beam, it is characterized in that: comprise X-ray source, X ray grating, attenuator group and diaphragm; Described attenuator group is made up of multiple independently X-ray attenuation sheet; After X-ray source produces X ray, extract X ray target spectral coverage through X ray grating and diaphragm, then carry out exporting after energy attenuation through attenuator group.
2. a kind of device for generation of single-frequency low energy grenz ray light beam according to claim 1, is characterized in that: described aperture material is for plumbous.
3. a kind of device for generation of single-frequency low energy grenz ray light beam according to claim 1, is characterized in that: described x-ray source is double anode X-ray tube.
4. a kind of device for generation of single-frequency low energy grenz ray light beam according to claim 1, is characterized in that: described diaphragm placement location meets by X ray target spectral coverage.
5. a kind of device for generation of single-frequency low energy grenz ray light beam according to claim 1, it is characterized in that: described x-ray spectrometry device chooses transmission-type X-ray grating, screen periods is 500nm, area 10 × 0.1mm
2, golden thickness 500nm, dutycycle 0.4 ~ 0.6, grid line shape is rectangle, useful area 70%.
6. a kind of device for generation of single-frequency low energy grenz ray light beam according to claim 1, is characterized in that: described X-ray attenuation sheet comprises polyimide film and aluminum membranous layer, uses the method for evaporation to be plated on polyimide film by aluminum membranous layer; The X ray of polyimide film to below 1keV has decay shielding action, and aluminium film has decay shielding action to visible light wave range.
7. a kind of device for generation of single-frequency low energy grenz ray light beam according to claim 6, is characterized in that: the thicknesses of layers of polyimide is 1um.
8. a kind of device for generation of single-frequency low energy grenz ray light beam according to claim 6, is characterized in that: aluminum membranous layer thickness is 10 nanometers or 20nm or 30nm or 40nm or 50nm.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
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| CN201510158754.4A CN104865284A (en) | 2015-04-03 | 2015-04-03 | Apparatus used for generating single-frequency low-energy soft X-ray beam |
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| CN201510158754.4A CN104865284A (en) | 2015-04-03 | 2015-04-03 | Apparatus used for generating single-frequency low-energy soft X-ray beam |
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Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1166595A (en) * | 1996-12-26 | 1997-12-03 | 中国科学院上海光学精密机械研究所 | high-efficiency high-resolution soft X-ray transmission grating spectrometer |
| CN1214451A (en) * | 1998-11-19 | 1999-04-21 | 中国科学院上海光学精密机械研究所 | Large-area transmission grating soft X-ray spectrometer |
| CN2399725Y (en) * | 1998-11-19 | 2000-10-04 | 中国科学院上海光学精密机械研究所 | Transmission grating spectrometer for soft X-ray wave band |
-
2015
- 2015-04-03 CN CN201510158754.4A patent/CN104865284A/en active Pending
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1166595A (en) * | 1996-12-26 | 1997-12-03 | 中国科学院上海光学精密机械研究所 | high-efficiency high-resolution soft X-ray transmission grating spectrometer |
| CN1214451A (en) * | 1998-11-19 | 1999-04-21 | 中国科学院上海光学精密机械研究所 | Large-area transmission grating soft X-ray spectrometer |
| CN2399725Y (en) * | 1998-11-19 | 2000-10-04 | 中国科学院上海光学精密机械研究所 | Transmission grating spectrometer for soft X-ray wave band |
Non-Patent Citations (3)
| Title |
|---|
| 赵屹东 等: "天文观察用超软X射线探测器的标定", 《高能物理与核物理》 * |
| 邱克强: "软X射线透射光栅制作", 《中国博士学位论文全文数据库基础科学辑》 * |
| 陈田祥 等: "航天用遮光膜的制备与表征制备及表征", 《2010年第二十三届全国空间探测学术交流会论文集》 * |
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Application publication date: 20150826 |