CN104833656A - Method for simultaneously measuring specular reflectivity and diffuse reflectivity of material based on integrating sphere - Google Patents

Abstract

The invention relates to a method for simultaneously measuring the specular reflectivity, the diffuse reflectivity and the total reflectivity of a material based on an integrating sphere. The specular reflectivity, the diffuse reflectivity and the total reflectivity of the material can be rapidly, conveniently and accurately obtained through the method. The method for measuring the reflectivity comprises the following steps: arranging a light trap on a traditional integrating sphere device, respectively measuring in the opening state and the closed state of the light trap, and carrying out data processing to obtain the specular reflectivity, the diffuse reflectivity and the total reflectivity of the material.

Description

A kind of material specular reflectivity based on integrating sphere and diffuse reflectance measuring method simultaneously

Technical field

The present invention relates to photoelectric measurement field, particularly relate to a kind of material specular reflectivity based on integrating sphere and diffuse reflectance measuring method simultaneously.

Background technology

Below background of related of the present invention is described, but these explanations might not form prior art of the present invention.

Material surface reflectivity, as the physical quantity of exosyndrome material radiation characteristic, is very important parameter.At space industry, due to outer space bad environments, in space, there are solar radiation and other radiation, so the coating on aerospacecraft surface, the appearance covering etc. of the space objects such as satellite all will consider its reflectivity, to prevent irradiation space from causing damage to it, extends its serviceable life.In national defence, Measurement accuracy material reflectance is for target identification, and defense in the air, the Performance Evaluation of precision strike hostile target and stealth material all plays a very important role.At civil area, the albedo measurement of material can promote further developing of coating process technology and related industry.

Measure material reflectance and have multiple method, wherein the most frequently used is integration ball.The surface roughness of different materials is different, and in reflected light, mirror reflection is different with irreflexive ratio, and what integration ball was in the past surveyed is the total reflectivity that mirror reflects and diffuse reflection is mixed in together, and can not measure specular reflectivity and diffuse reflectance separately.As shown in Figure 1, conventional integrating sphere structure comprises light source, entrance aperture, sample well, baffle plate, exploration hole.

For the albedo measurement technical elements of material, some researchs are carried out both at home and abroad.The human hairs such as Dunkle in 1962 understand that hot cavity reflection meter mensuration is to measure the reflectivity of material, within 1900, Ulbricht has built first integrating sphere in the world, this is a rather great event in photometry development history, the method was widely applied afterwards, all have employed integrating sphere reflectometer in the PULSE HEATING device as people such as the visible ray measuring equipment of PerkinElmer company and the Righini of Italian IMGC and Harbin Institute of Technology Fan Yi.The people such as Shanghai leaf man of technology physics institute good fortune in 2000 devise a kind of measuring method-ellipsoid method of approximate integration ball reflectometer method.The nineties, American National Standard research institute proposed a kind of method utilizing polarized light measurement rod-like samples reflectivity emissivity.Wherein integrating sphere method is owing to being simple and easy to use, is widely used, but above-mentioned employing can not utilize a set of integrating sphere to measure the specular reflectivity of sample and diffuse reflectance and total reflectivity based on the method for integrating sphere simultaneously.

Therefore, need in prior art a kind ofly can solve a set of integrating sphere and measure the specular reflectivity of sample and the solution of diffuse reflectance and total reflectivity simultaneously.

Summary of the invention

The object of the invention is to propose a kind of a set of integrating sphere can be utilized to measure sample simultaneously specular reflectivity and the device of diffuse reflectance and total reflectivity and measuring method thereof.

For achieving the above object, the invention provides a kind of integrating sphere that simultaneously can obtain material specular reflectivity, diffuse reflectance and total reflectivity, include perforation, sample well, baffle plate and exploration hole, it is characterized in that: also comprise ligh trap, described ligh trap is used for all receiving specular reflectance beam.

Preferably, the diameter dimension of described ligh trap 8 opening, slightly larger than the diameter dimension of the specular reflectance beam 5 of sample, makes the specular reflectance beam 5 of sample enter completely in ligh trap 8.

For achieving the above object, the present invention also provides a kind of measuring method that simultaneously can obtain material specular reflectivity, diffuse reflectance and total reflectivity, it is characterized in that comprising the steps:

A () increases a ligh trap device on regular integral ball;

B () measures the reference signal V of the on-gauge plate of known reflectivity _st;

C () measures the total reflection signal V of specimen material;

D () measures the diffuse signal V of specimen material _d;

E () data processing, obtains the specular reflectance ρ of sample _m, diffuse reflectance ρ _dand total reflectivity ρ.

Preferably, in described step (a), the diameter of ligh trap 8 opening should slightly larger than the diameter of the specular reflectance beam 5 of sample, to guarantee to allow the specular reflectance beam 5 of sample enter in ligh trap 8.

Preferably, the reference signal V of the on-gauge plate of known reflectivity is measured in described step (b) _stconcrete grammar be: ligh trap switch 9 is in closed condition, is ρ by known reflectivity _ston-gauge plate be placed on sample well place, be incident on on-gauge plate by incident beam 2 with suitable angle, light is uniformly distributed in integrating sphere through multiple reflections, detector obtain reference signal V _st.

Preferably, the concrete grammar measuring the total reflection signal V of specimen material in described step (c) is: ligh trap switch 9 is in closed condition, now not only comprise scattered light 3 but also comprise specular reflectance beam 5 by the energy of sample reflection source, finally reaching uniform distribution in integrating sphere after multiple reflections, detector obtains total reflection signal V.

Preferably, the diffuse signal V of specimen material is measured in described step (d) _dconcrete grammar be: ligh trap switch 9 is in open mode, specular reflectance beam 5 enters in ligh trap 8 and is all absorbed, thus remaining in integrating sphere be the irreflexive energy of sample surfaces, finally reaching uniform distribution in integrating sphere after multiple reflections, detector obtains diffuse signal V _d.

Preferably, the concrete steps of described step (e) are: the signal V obtained in step (c) deducts the signal V obtained in step (d) _dbe the signal that sample mirror-reflection should obtain, i.e. V _m=V-V _d; Principle according to integrating sphere can obtain specular reflectance diffuse reflectance ${\mathrm{\ρ}}_d={\mathrm{\ρ}}_{\mathrm{st}}\·\frac{V_d}{V_{\mathrm{st}}},$ And total reflectivity $\mathrm{\ρ}={\mathrm{\ρ}}_{\mathrm{st}}\·\frac{V}{V_{\mathrm{st}}}.$

Present applicant has proposed a kind of measuring method that simultaneously can obtain material specular reflectivity, diffuse reflectance and total reflectivity based on integrating sphere, the method can obtain the specular reflectivity of material and diffuse reflectance and total reflectivity fast, easily and accurately, when adopting the method to carry out albedo measurement, need on traditional integrating sphere device, increase a ligh trap design, then measuring when opening and closing ligh trap respectively, carrying out data processing and obtaining the specular reflectivity of material and diffuse reflectance and total reflectivity.

Accompanying drawing explanation

By the embodiment part provided referring to accompanying drawing, the features and advantages of the present invention will become easier to understand, in the accompanying drawings:

Fig. 1 is the schematic diagram of regular integral spherical structure;

Fig. 2 is integrating sphere structural representation of the present invention.

1. light source; 2. incident beam; 3. scattered light; 4. sample well; 5. specular reflectance beam; 6 baffle plates; 7. detector; 8. ligh trap; 9. ligh trap switch.

Embodiment

With reference to the accompanying drawings illustrative embodiments of the present invention is described in detail.Be only for demonstration object to the description of illustrative embodiments, and be never the restriction to the present invention and application or usage.

Provided by the invention based on the measurement sample specular reflectivity of integrating sphere and the method for diffuse reflectance and total reflectivity, comprise the following steps:

(1) on regular integral ball, a ligh trap device is increased

Position suitable on regular integral ball increases a ligh trap design, as shown in ligh trap in Fig. 28.Suitable position refers to sample well to be reflection spot, with sample plane normal for axis of symmetry, and the position on the integrating sphere corresponding with entrance aperture.The diameter of ligh trap 8 opening should slightly larger than the diameter of the specular reflectance beam 5 of sample, to guarantee to allow the specular reflectance beam 5 of sample enter in ligh trap 8.

(2) the reference signal V of the on-gauge plate of known reflectivity is measured _st

When ligh trap switch 9 is in closed condition, be ρ by known reflectivity _ston-gauge plate be placed on sample well place, be incident on on-gauge plate by incident beam 2, light is uniformly distributed in integrating sphere through multiple reflections, detector obtain reference signal V _st.

(3) close ligh trap, measure the total reflection signal V of specimen material

When ligh trap switch 9 is in closed condition, now not only comprise scattered light 3 but also comprise specular reflectance beam 5 by the energy of sample reflection source, finally reaching uniform distribution in integrating sphere after multiple reflections, detector obtains total reflection signal V.

(4) open ligh trap, measure the diffuse signal V of specimen material _d

When ligh trap switch 9 is in open mode, specular reflectance beam 5 enters in ligh trap 8 and is all absorbed, thus remaining in integrating sphere be the irreflexive energy of sample surfaces, finally reaching uniform distribution in integrating sphere after multiple reflections, detector obtains diffuse signal V _d.

(5) through data processing, the specular reflectance ρ of sample is obtained _m, diffuse reflectance ρ _dand total reflectivity ρ.

The signal obtained in step (2) deducts the signal obtained in step (3) and is the signal that sample mirror-reflection should obtain, i.e. V _m=V-V _d.According to the known specular reflectance of the principle of integrating sphere ${\mathrm{\ρ}}_m={\mathrm{\ρ}}_{\mathrm{st}}\·\frac{V-V_d}{V_{\mathrm{st}}},$ Diffuse reflectance ${\mathrm{\ρ}}_d={\mathrm{\ρ}}_{\mathrm{st}}\·\frac{V_d}{V_{\mathrm{st}}},$ And total reflectivity $\mathrm{\ρ}={\mathrm{\ρ}}_{\mathrm{st}}\·\frac{V}{V_{\mathrm{st}}}.$ The signal data obtained is processed, just can measure the specular reflectivity of sample, diffuse reflectance and total reflectivity simultaneously.

Although with reference to illustrative embodiments, invention has been described, but be to be understood that, the present invention is not limited in literary composition the embodiment described in detail and illustrate, when not departing from claims limited range, those skilled in the art can make various change to described illustrative embodiments.

Claims (8)

1. can obtain an integrating sphere for material specular reflectivity, diffuse reflectance and total reflectivity simultaneously, include perforation, sample well, baffle plate and exploration hole, it is characterized in that: also comprise ligh trap, described ligh trap is used for all receiving specular reflectance beam.

2. integrating sphere as claimed in claim 1, it is characterized in that: the diameter dimension of described ligh trap (8) opening, slightly larger than the diameter dimension of the specular reflectance beam (5) of sample, makes the specular reflectance beam of sample (5) enter completely in ligh trap (8).

3. can obtain a measuring method for material specular reflectivity, diffuse reflectance and total reflectivity simultaneously, it is characterized in that comprising the steps:

A () increases a ligh trap device on regular integral ball;

B () measures the reference signal V of the on-gauge plate of known reflectivity _st;

C () measures the total reflection signal V of specimen material;

D () measures the diffuse signal V of specimen material _d;

E () data processing, obtains the specular reflectance ρ of sample _m, diffuse reflectance ρ _dand total reflectivity ρ.

4. measuring method as claimed in claim 3, it is characterized in that: in described step (a), the diameter of ligh trap (8) opening should slightly larger than the diameter of the specular reflectance beam of sample (5), to guarantee to allow the specular reflectance beam of sample (5) enter in ligh trap (8).

5. measuring method as claimed in claim 3, is characterized in that the reference signal V of the on-gauge plate measuring known reflectivity in described step (b) _stconcrete grammar be: ligh trap switch (9) is in closed condition, is ρ by known reflectivity _ston-gauge plate be placed on sample well place, be incident on on-gauge plate by incident beam (2), light is uniformly distributed in integrating sphere through multiple reflections, detector obtain reference signal V _st.

6. measuring method as claimed in claim 3, it is characterized in that the concrete grammar of the total reflection signal V measuring specimen material in described step (c) is: ligh trap switch (9) is in closed condition, now not only comprise scattered light (3) but also comprise specular reflectance beam (5) by the energy of sample reflection source, finally reaching uniform distribution in integrating sphere after multiple reflections, detector obtains total reflection signal V.

7. measuring method as claimed in claim 3, is characterized in that the diffuse signal V measuring specimen material in described step (d) _dconcrete grammar be: ligh trap switch (9) is in open mode, specular reflectance beam (5) enters in ligh trap (8) and is all absorbed, thus remaining in integrating sphere be the irreflexive energy of sample surfaces, finally reaching uniform distribution in integrating sphere after multiple reflections, detector obtains diffuse signal V _d.

8. measuring method as claimed in claim 3, is characterized in that the concrete steps of described step (e) are: the signal V obtained in step (c) deducts the signal V obtained in step (d) _dbe the signal that sample mirror-reflection should obtain, i.e. V _m=V-V _d; Principle according to integrating sphere can obtain specular reflectance ${\mathrm{\ρ}}_m={\mathrm{\ρ}}_{\mathrm{st}}\·\frac{V-V_d}{V_{\mathrm{st}}},$ Diffuse reflectance ${\mathrm{\ρ}}_d={\mathrm{\ρ}}_{\mathrm{st}}\·\frac{V_d}{V_{\mathrm{st}}},$ And total reflectivity $\mathrm{\ρ}={\mathrm{\ρ}}_{\mathrm{st}}\·\frac{V}{V_{\mathrm{st}}}.$