CN1048283A - Gap measuring device - Google Patents

Gap measuring device Download PDF

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Publication number
CN1048283A
CN1048283A CN90100517A CN90100517A CN1048283A CN 1048283 A CN1048283 A CN 1048283A CN 90100517 A CN90100517 A CN 90100517A CN 90100517 A CN90100517 A CN 90100517A CN 1048283 A CN1048283 A CN 1048283A
Authority
CN
China
Prior art keywords
measuring device
gap measuring
connecting rod
shell
piston
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
CN90100517A
Other languages
Chinese (zh)
Other versions
CN1020022C (en
Inventor
李明锤
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Samsung SDI Co Ltd
Original Assignee
Samsung Electron Devices Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Samsung Electron Devices Co Ltd filed Critical Samsung Electron Devices Co Ltd
Publication of CN1048283A publication Critical patent/CN1048283A/en
Application granted granted Critical
Publication of CN1020022C publication Critical patent/CN1020022C/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
    • H01L29/66Types of semiconductor device ; Multistep manufacturing processes therefor
    • H01L29/68Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
    • H01L29/70Bipolar devices

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  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Ceramic Engineering (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Bipolar Transistors (AREA)
  • Manufacture Of Electron Tubes, Discharge Lamp Vessels, Lead-In Wires, And The Like (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)

Abstract

The gap measuring device that is used for spacing between the measurement electron gun parts comprises the upper and lower connecting rod with counterweight and connector, wherein go up a damping device that is used to reduce its movement velocity is housed on the connecting rod, this damping device comprises that a shell and that is used for storing viscous fluid can be in the shell pistons reciprocating.The path that passes through for viscous fluid is arranged on the piston.Gap measuring device of the present invention can prevent the distortion of electron gun grid.And then the quality of improvement electron gun and cathode ray tube.

Description

Gap measuring device
The present invention relates to the gap measuring device of spacing between a kind of measurement electron gun electrode, particularly a kind of improved gap measuring device, it can prevent the part distortion that the collision of connector causes.
An electron gun comprises many parts, for example provides the electrode of certain amplitude voltage on grid and its, and the focus characteristics of electron gun depends on to a great extent and places one three control grid and the screen grid on the polar region section.Therefore, the manufacturing process of an electron gun comprises the step of spacing between the screen grid of measuring the control grid.Finish above-mentioned functions traditional gap measuring device structure as shown in Figure 1, wherein plumb post 12 is fixed on the frame 11, has the last connecting rod 13 of counterweight 14 and 18 and lower link 15 to be contained on the pillar 12 respectively.In addition, prone upward contactor 13b is fixed on the front end of connecting rod 13, and connect the carriage 15a of following contactor 15b and the front end that bellows formula displacement transducer 16 is contained in lower link 15, and following contactor 15b is relative with last contactor 13b, and displacement transducer 16 contacts with last connecting rod 13 all the time.
As last contactor 13b and following contactor 15b and control grid G 1With screen grid G 2During contact, the displacement of traditional gap measuring device detecting sensor 16 of Gou Chenging and the data transaction that detects become the control grid G as mentioned above 1With screen grid G 2Between a measured value of spacing.
Yet, in a kind of so traditional gap measuring device, since the bump of last contactor 13b and following contactor 15b, grid G 1And G 2May be out of shape, even reduced grid G by the counterweight 14 and 18 that connecting rod 13 and 15 are provided 1And G 2Collision, but thisly reduce to still have a limit because the movement velocity of connecting rod, the movement velocity that particularly goes up connecting rod 13 is very high.
Therefore, the purpose of this invention is to provide a kind of improved gap measuring device, wherein, owing to the part distortion that the collision of connector causes, the deformation energy of particularly controlling grid and screen is suppressed to greatest extent.
In order to realize this purpose, gap measuring device of the present invention comprises last connecting rod and the lower link with counterweight and connector, wherein, provides a damping device on the last connecting rod, is used to reduce the movement velocity that goes up connecting rod.Damping device comprises that one is used for storing a kind of shell of viscous fluid and in the shell pistons reciprocating.One fluid path is arranged on the piston, viscous liquid can be flow through.
To make purpose of the present invention and other advantage more obvious with reference to the accompanying drawing detailed description of the present invention.
Fig. 1 is the end view of a traditional gap measuring device;
Fig. 2 is the end view of gap measuring device of the present invention;
Fig. 3 is the cutaway view of the damping device that adopts of gap measuring device;
Fig. 4 A and 4B are the detailed section view of Fig. 3 damping device.
As shown in Figure 2, plumb post 12 is fixed on the frame 11, and last connecting rod 13 and lower link 15 conducts with counterweight 14 are pivotally mounted on the pillar 12, and prone upward contactor 13b is fixed on the front end of connecting rod 13.In addition, carriage 15a and bellows formula displacement transducer 16 are installed in the front end of lower link 15, and carriage 15a is connected with the following contactor 15b that faces last contactor 13b, and displacement transducer 16 contacts with last connecting rod 13 all the time.
Simultaneously, as shown in Figure 3, in a side of displacement transducer 16, provide damping device 20, it comprises that one is contained in the shell 23 on the lower link 15, and form in piston rod 21d lower end be fixed on piston 21 on the connecting rod 13, be used in shell 23 reciprocating motions.A hemisphere recess 21C is formed on the bottom at piston 21.Also provide vertical passage 21a and two horizontal pathways 21b on the piston.In addition, be formed with basin shape inclined-plane 22a and through hole 22b in the center of the casing cover 22 that is fixed on shell 23 tops.
In the gap measuring device of the present invention that constitutes as mentioned above, last connecting rod 13 is low speed and gently rotating on pivot owing to the effect of damping device.That is, electron gun structure is inserted between contactor 13b and the following contactor 15b, and as measurement target, counterweight 14 rotates connecting rod 13 lentamente on pivot, and rotates on pivot with constant speed owing to the effect of damping device 20.
Be appreciated that the above-mentioned gentle movement of connecting rod 13 by following description.Shown in Fig. 4 A, when being fixed on piston 21 on the connecting rod 13 by piston rod 21d when advancing in the shell 23, at hemisphere recess 21c, the toughness fluid flows through among vertical passage 21a and the horizontal pathways 21b, and therefore, the pace of piston 21 is lowered.When piston 21 entered in the shell 23, a part of viscous fluid flowed upward to the top of shell 23 by horizontal pathways 21b, caused a part of fluid to be stayed covering at the bottom of 22 the basin shape among the 22a.On the other hand, if piston 21 moves to the top of shell 23 shown in Fig. 4 B, fluid is forced in the suction shell by the space between piston 21 and through hole 22b.
The gap measuring device of the present invention that provides the damping device of working has in a manner described reduced the distortion of grid body to greatest extent.By preventing the grid distortion, can increase the q﹠r of electron gun, can also improve the image quality of cathode ray tube.

Claims (1)

1, the gap measuring device of spacing comprises between a kind of measurement electron gun parts:
One damping device, it comprises a shell, one piston, described shell is used to store a kind of viscous fluid and receiving piston moves back and forth therein, provide fluid passage on the described piston, described cover top portion provides one and is used to accept the basin shape bottom surface of viscous fluid and the through hole that described piston is passed through.
CN90100517A 1989-06-21 1990-02-03 Gap measuring device Expired - Fee Related CN1020022C (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
KR89-8577 1989-06-21
KR1019890008577A KR0152971B1 (en) 1989-06-21 1989-06-21 Method for manufacturing a self aligned high integrated bipolar transistor

Publications (2)

Publication Number Publication Date
CN1048283A true CN1048283A (en) 1991-01-02
CN1020022C CN1020022C (en) 1993-03-03

Family

ID=19287316

Family Applications (1)

Application Number Title Priority Date Filing Date
CN90100517A Expired - Fee Related CN1020022C (en) 1989-06-21 1990-02-03 Gap measuring device

Country Status (2)

Country Link
KR (1) KR0152971B1 (en)
CN (1) CN1020022C (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104833299A (en) * 2014-02-07 2015-08-12 赫尔穆特费希尔有限责任公司电子及测量技术研究所 Method for electrically controlling a gauge stand and gauge stand for holding a measurement gauge

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104833299A (en) * 2014-02-07 2015-08-12 赫尔穆特费希尔有限责任公司电子及测量技术研究所 Method for electrically controlling a gauge stand and gauge stand for holding a measurement gauge

Also Published As

Publication number Publication date
KR0152971B1 (en) 1998-10-01
KR910002002A (en) 1991-01-31
CN1020022C (en) 1993-03-03

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C06 Publication
PB01 Publication
C10 Entry into substantive examination
SE01 Entry into force of request for substantive examination
C14 Grant of patent or utility model
GR01 Patent grant
C15 Extension of patent right duration from 15 to 20 years for appl. with date before 31.12.1992 and still valid on 11.12.2001 (patent law change 1993)
OR01 Other related matters
C19 Lapse of patent right due to non-payment of the annual fee
CF01 Termination of patent right due to non-payment of annual fee