CN104764712A - Method for detecting quality of inner wall of via hole of PCB - Google Patents

Method for detecting quality of inner wall of via hole of PCB Download PDF

Info

Publication number
CN104764712A
CN104764712A CN201510214044.9A CN201510214044A CN104764712A CN 104764712 A CN104764712 A CN 104764712A CN 201510214044 A CN201510214044 A CN 201510214044A CN 104764712 A CN104764712 A CN 104764712A
Authority
CN
China
Prior art keywords
overbar
pcb
image
coordinate
standard form
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
CN201510214044.9A
Other languages
Chinese (zh)
Other versions
CN104764712B (en
Inventor
刘恺
杨力帆
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
ZHEJIANG OULONG ELECTRIC CO., LTD.
Original Assignee
Zhejiang University of Technology ZJUT
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Zhejiang University of Technology ZJUT filed Critical Zhejiang University of Technology ZJUT
Priority to CN201510214044.9A priority Critical patent/CN104764712B/en
Publication of CN104764712A publication Critical patent/CN104764712A/en
Application granted granted Critical
Publication of CN104764712B publication Critical patent/CN104764712B/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Landscapes

  • Image Processing (AREA)

Abstract

The invention provides a method for detecting the quality of the inner wall of a via hole of a PCB. The method includes the steps that step101, the PCB to be detected and a standard template are acquired; step102, an original image of the PCB to be detected and an original image of the standard template are collected through a terahertz wave imaging technology; step103, thresholding and denoising are performed on the original image of the PCB to be detected and the original image of the standard template to obtain a recovered image to be detected and a recovered image of the standard template; step104, characteristic functions of the recovered images are calculated to obtain the circle center and diameter information of the via hole; step105, template matching operation is performed on the characteristic information of the recovered image of the standard template and the characteristic information of the recovered image to be detected; step106, if the matching operation result is within a production permissible error range, it is displayed that the PCB is detected to be qualified; step107, if the matching operation result is beyond the production permissible error range, it is displayed that the PCB is detected to be unqualified. By means of the method, the quality of the inner wall of the via hole is effectively detected, and the product quality of the PCB is guaranteed.

Description

A kind of detection method of PCB via hole inwall quality
Technical field
The present invention relates to printed circuit board (PCB) (Printed Circuit Board, PCB) detection method field, especially a kind of detection method of PCB via hole inwall quality.
Background technology
Printed circuit board (PCB) (Printed Circuit Board, PCB) carries the main platform of various electronic component as one, has undertaken connection electronic component, makes them really become the effect of a complete functional module.It, as the indispensable basic component part of any electronic product, creates tremendous influence to the electronic industry of the world today.Along with the develop rapidly of electronics industry, the requirement of people to product quality, stable performance is more and more higher, and therefore the detection means of PCB becomes the problem being badly in need of research.
In the existing detection technique that PCB produces, general use flying needle or particular manufacturing craft detect the conducting electrical specification of PCB, be placed with automatic optics inspection (Automatic Optic Inspection, AOI) equipment Inspection PCB paste solder printing, element and the surface quality of lines via hole.But at present not for the detection means fast and effectively of PCB via hole (via) inner wall hole quality (comprising the aspects such as the crude degree of hole wall, hole wall hole integrity degree and hole thickness).And along with the develop rapidly of electronic technology, the frequency of transmission and processing signals is more and more higher, PCB via hole inwall quality directly has influence on the consistance of its conduction, amplitude-frequency phase-frequency characteristic and product, thus in the production run of pcb board, detect that the defect of via hole inwall quality is one and significantly works, to be widely used space in PCB manufacturing enterprise.
Existing domestic and international PCB manufacturing enterprise mainly relies on AOI detection system to carry out for the quality testing of PCB via hole [6-8].Usual employing CCD (Charge-coupled Device) video camera or CIS (Contact ImageSensor) absorb detected image, be translated into digital signal, computer hardware and software engineering is adopted to process image digital signal again, thus obtain required target image characteristics value, and the several functions such as implementation pattern identification on this basis, coordinate calculating, intensity profile figure [9-11].According to the difference of measured target, the testing result of output can be size or the Form and position error of testee, also can be the surface integrity etc. of testee.
But, existing AOI equipment realizes the detection of PCB via hole and there is obvious shortcoming, AOI equipment can only detect the place that direct projection light can arrive, thus only can detect aperture shape, diameter, the attributes such as position, but for hole inner wall defect, (such as hole inwall has tiny burr, hole inwall has screw thread, and the holeization brought thus is incomplete, the problems such as hole unqualified thickness lattice) then cannot accomplish effective detection, these defects directly affect the following process quality of pcb board (as pad bubbles, weld not congruent), and the quality of PCB finished product is (as impedance operator, amplitude versus frequency characte etc.).The general hole quality adopting process control to ensure PCB in current PC B production testing process, and do not have specialized equipment equipment can detect hole inwall.
Summary of the invention
In order to overcome the deficiency that cannot realize detecting, cannot ensureing to via hole inwall quality PCB product quality of existing PCB detection mode, the invention provides the detection method of a kind of effective realization to the detection of via hole inwall quality, the PCB via hole inwall quality of guarantee PCB product quality.
The technical solution adopted for the present invention to solve the technical problems is:
A detection method for PCB via hole inwall quality, described detection method comprises the steps:
Step 101: obtain PCB to be measured and standard form;
Step 102: use THz wave imaging technique to gather PCB original image to be measured and standard form original image;
Step 103: carry out thresholding, denoising to PCB original image to be measured and standard form original image, obtains restored image to be measured and standard form restored image;
Step 104: the fundamental function calculating standard form restored image and restored image to be measured respectively, obtain the via hole center of circle and aperture information, process is as follows:
If point on arbitrfary point P (r, θ) and viewing plane on the circular hole of radius a 2 distance L, hole and sightingpiston distance Z, terahertz pulse is Gaussian in the distribution of time domain and spatial domain, and incident wave pulse width is T, center angular frequency ω, wave number k=2 π/λ, then
During plane wave incidence, incident wave light field is described as
Transmitted wave light field is described as consideration light is the travel-time from P to Q, gets when being brought in U by E c is the light velocity, both
Distribution of light intensity I=|U| 2;
The standard form restored image hole circle heart and radius data obtain from the PCB file of standard form; PCB restored image 8-neighborhood contours extract method to be measured obtains bore edges profile, then calculates central coordinate of circle and radius with least square fitting;
Step 105: the standard form restored image of gained and the characteristic information of restored image to be measured are carried out template matches computing, and process is as follows:
First carrying out image registration, both by carrying out coordinate transform to PCB aperture heart coordinate, making restored image coordinate identical with standard form coordinate;
For the point on random two-dimensional image, all transformation matrix can be passed through G = g 11 g 12 g 13 g 21 g 22 g 23 0 0 1 Realize the geometric transformation to it, both x 2 y 2 1 = G x 1 y 1 1 , Wherein, submatrix g 11 g 12 g 21 g 22 Achieve the rotational transform to impact point, submatrix g 13 g 23 Realize the translation transformation to impact point;
Because one group of respective coordinates point determines 2 equations, therefore by minimum three groups of respective coordinates point determination transformation matrix G;
Be analyzed for reference point standard form and each hole transmitted field field strength distribution of recovery template to be measured with each hole heart coordinate, draw the field intensity difference on arbitrary coordinate point;
Step 106: if matching operation result is within the scope of production permissible error, then show detection qualified;
Step 107: if matching operation result exceeds produce permissible error scope, then show detection defective.
Further, in described step 107, export defect area information, the enlarged image in this region, containing the difference of this area coordinate parameter, this coordinate position actual difference, this defect area region transmission coefficient and standard form that field intensity and standard form detected, is presented confession reviewer according to the coordinate parameters provided and does final judgement by described defect area packets of information on a display screen.
Further again, in described step 103, adopt process of iteration to carry out carrying out image threshold segmentation.
Further, in described step 103, described denoising adopts Wavelet Denoising Method function: process is as follows: the first, signal is carried out wavelet transformation, the second, signal and noise different conditions are spatially utilized, carry out signal to wavelet coefficient to cut out, noise is removed from signal, the 3rd, utilize restructing algorithm also original image.
In step 104, the process of 8-neighborhood contours extract method is as follows:
For a secondary bianry image, if background pixel is black, object is white, for black background pixel a certain in image, if be all background pixel point in its 8 neighborhoods, then this point is set to white, all pixels of traversing graph picture just can complete the extraction to all circular hole profiles;
The Fitting Calculation of central coordinate of circle radius is completed by least square method:
For the N group data (x on edge contour i, y i), if central coordinate of circle P (A, B), radius is R, then equation of a circle is written as (x-A) 2+ (y-B) 2=R 2
Note residuals squares sum functions is
S = Σ i = 1 N [ ( x i - A ) 2 + ( y i - B ) 2 - R 2 ] 2 , Have according to the principle of least square ∂ S ∂ A = ∂ S ∂ B = ∂ S ∂ R = 0 .
Order x n y m ‾ = Σ i = 1 N ( x i n y i m ) / N , Solve central coordinate of circle and radius is:
A = ( x 2 ‾ x ‾ + x ‾ y 2 ‾ - x 3 ‾ - xy 2 ‾ ) [ ( y ‾ ) 2 - y 2 ‾ ] - ( x 2 ‾ y ‾ + y ‾ y 2 ‾ - x 2 y ‾ - y 3 ‾ ) ( x ‾ y ‾ - xy ‾ ) 2 [ ( x ‾ ) 2 - x 2 ‾ ] [ ( y ‾ ) 2 - y 2 ‾ ] - 2 ( x ‾ y ‾ - xy ‾ ) 2 B = ( x 2 ‾ x ‾ + x ‾ y 2 ‾ - x 2 y ‾ - y 3 ‾ ) [ ( x ‾ ) 2 - x 2 ‾ ] - ( x 2 ‾ x ‾ + x ‾ y 2 ‾ - x 3 ‾ - x y 2 ‾ ) ( x ‾ y ‾ - xy ‾ ) 2 [ ( x ‾ ) 2 - x 2 ‾ ] [ ( y ‾ ) 2 - y 2 ‾ ] - 2 ( x ‾ y ‾ - xy ‾ ) 2 R = A 2 - 2 x ‾ A + B 2 - 2 y ‾ B + x 2 ‾ + y 2 ‾
Technical conceive of the present invention is: as shown in Figure 1, and the electromagnetic radiation that frequency is in 0.1THz-10THz is called as THz wave, and it is in the region of microwave to infrared ray transition.Have the characteristic of microwave and optics concurrently.THz wave self has some unique characteristic.
(1) transient state.The typical pulse-widths of THz pulse, can easily to the research of various material line time resolved spectroscopy in picosecond level.
(2) broadband property.Terahertz pulse source only comprises the electromagnetic oscillation in several cycles usually, and individual pulse frequency band can cover the scope of GHz to tens THz, is convenient to inner analysis substance spectra characteristic on a large scale.
(3) coherence.The coherence of THz comes from its relevant generation mechanism.THz coherent measurement technology directly can measure amplitude and the phase place of electric field, thus extracts the optical parametric such as refractive index, absorption coefficient, extinction coefficient, specific inductive capacity of sample easily.
(4) low energy.The energy of THz photon only has milli electron-volt, compared with X ray, can not destroy detected material because of photoionization.
(5) absorption, reflection characteristic.THz ripple has stronger penetrability to a lot of nonmetal, non-polar materials, and pottery, timber, plastic or other material are transparent concerning THz ripple; And water has extremely strong absorbability to THz ripple, in addition, metal material has strong reflection to THz ripple.Absorb reflection characteristic based on THz ripple to the difference of different materials, and the structure and material of pcb board is formed, we think, THz ripple is kind of the wave source be well suited for for the quality testing of PCB via hole.
THz wave can be the same with optical imagery as microwave, as the radiation source of imaging, so the imaging mode that two spectral ranges adopt can be used for reference in THz imaging technology easily, form novel imaging mode, supplement as the effective of other imaging modes.The ultimate principle of THz wave imaging is: utilize the THz wave of known waveform as imaging ray, the space distribution of sample complex permittivity is contained through the Terahertz wave intensity of Imaged samples (or from sample reflection) and phase place, the intensity of terahertz electromagnetic wave of transmission (or reflection) and the two-dimensional signal of phase place are recorded, through suitable digital processing and spectrum analysis, the THz wave image of sample just can be obtained.
The form producing and detect mechanism according to THz wave can be divided into Pulse Imageing and continuous wave imaging.When THz wave imaging is applied to the detection of object defect, due to the defect of interior of articles or damage to the absorption of THz wave different and edge to the scattering effect of terahertz light, the intensity distributions of Terahertz electric field can be affected, the light and shade Terahertz image being reacted to object being shown as image is different, namely corresponding intensity is different, releases the position at interior of articles defect or damage place accordingly.
By the detection of THz wave imaging technique application with PCB via hole quality, in conjunction with digital image processing techniques, standard component Feature Extraction Technology and corresponding template matching algorithm, build the PCB via hole inwall quality detecting system that is different from existing equipment, make up the defect of existing detection technique.
Beneficial effect of the present invention is mainly manifested in: the absorption characteristic different to THz wave according to metal material on PCB and nonmetallic materials, is incorporated into THz wave imaging technique in the quality testing of PCB via hole.The digital image processing techniques such as combining image Threshold segmentation, Wavelet Denoising Method and characteristic matching method, achieve the detection fast and effectively of PCB being crossed to hole surface and inwall quality, particularly the incomplete PCB via hole of aperturesization detects, and compensate for the deficiency of existing checkout equipment.This patent to ensureing PCB product quality, stability of enhancing product performance, realize the raising of PCB manufacturing enterprise profit and have extremely important meaning.
Accompanying drawing explanation
Fig. 1 is the schematic diagram of THz wave.
Fig. 2 is the block diagram of pcb board via hole detection system structure.
Fig. 3 is the process flow diagram of the detection method of PCB via hole inwall quality.
Embodiment
Below in conjunction with accompanying drawing, the invention will be further described.
With reference to Fig. 1 ~ Fig. 3, a kind of detection method of PCB via hole inwall quality, described detection method comprises the steps:
Step 101: obtain PCB to be measured and standard form;
Step 102: use THz wave imaging technique to gather PCB original image to be measured and standard form original image;
Step 103: carry out thresholding, denoising to PCB original image to be measured and standard form original image, obtains restored image to be measured and standard form restored image;
Step 104: the fundamental function calculating standard form restored image and restored image to be measured respectively, obtain the via hole center of circle and aperture information, process is as follows:
The circular hole of radius a is put point on P (r, θ) and viewing plane 2 distance L, hole and sightingpiston distance Z, if terahertz pulse is Gaussian in the distribution of time domain and spatial domain, incident wave pulse width is T, center angular frequency ω, wave number k=2 π/λ,
During plane wave incidence, incident wave light field describes
Transmitted wave light field describes light is the travel-time from P to Q, gets when being brought in U by E c is the light velocity, both
Distribution of light intensity I=|U| 2;
The standard form restored image hole circle heart and radius data obtain from the PCB file of standard form; PCB restored image 8-neighborhood contours extract method to be measured obtains bore edges profile, then calculates central coordinate of circle and radius with least square fitting;
Step 105: the standard form restored image of gained and the characteristic information of restored image to be measured are carried out template matches computing, and process is as follows:
First carrying out image registration, both by carrying out coordinate transform to PCB aperture heart coordinate, making restored image coordinate identical with standard form coordinate;
For the point on random two-dimensional image, all transformation matrix can be passed through G = g 11 g 12 g 13 g 21 g 22 g 23 0 0 1 Realize the geometric transformation to it, both x 2 y 2 1 = G x 1 y 1 1 . Wherein, submatrix g 11 g 12 g 21 g 22 Achieve the rotational transform to impact point, submatrix g 13 g 23 Realize the translation transformation to impact point.
Because one group of respective coordinates point determines 2 equations, therefore by minimum three groups of respective coordinates point determination transformation matrix G;
Be analyzed for reference point standard form and each hole transmitted field field strength distribution of recovery template to be measured with each hole heart coordinate, draw the field intensity difference on arbitrary coordinate point;
Step 106: if matching operation result is within the scope of production permissible error, then show detection qualified;
Step 107: if matching operation result exceeds produce permissible error scope, then show detection defective.
Further, in described step 107, export defect area information, the enlarged image in this region, containing the difference of this area coordinate parameter, this coordinate position actual difference, this defect area region transmission coefficient and standard form that field intensity and standard form detected, is presented confession reviewer according to the coordinate parameters provided and does final judgement by described defect area packets of information on a display screen.
Further again, in described step 103, adopt process of iteration to carry out carrying out image threshold segmentation.
Further, in described step 103, described denoising adopts Wavelet Denoising Method function: process is as follows: the first, signal is carried out wavelet transformation, the second, signal and noise different conditions are spatially utilized, carry out signal to wavelet coefficient to cut out, noise is removed from signal, the 3rd, utilize restructing algorithm also original image.
In step 104, the process of 8-neighborhood contours extract method is as follows:
For a secondary bianry image, if background pixel is black, object is white, for black background pixel a certain in image, if be all background pixel point in its 8 neighborhoods, then this point is set to white, all pixels of traversing graph picture just can complete the extraction to all circular hole profiles;
The Fitting Calculation of central coordinate of circle radius is completed by least square method:
For the N group data (x on edge contour i, y i), if central coordinate of circle P (A, B), radius is R, then equation of a circle is written as (x-A) 2+ (y-B) 2=R 2
Note residuals squares sum functions is
S = Σ i = 1 N [ ( x i - A ) 2 + ( y i - B ) 2 - R 2 ] 2 , Have according to the principle of least square ∂ S ∂ A = ∂ S ∂ B = ∂ S ∂ R = 0 .
Order x n y m ‾ = Σ i = 1 N ( x i m y i n ) / N , Solve central coordinate of circle and radius is:
A = ( x 2 ‾ x ‾ + x ‾ y 2 ‾ - x 3 ‾ - xy 2 ‾ ) [ ( y ‾ ) 2 - y 2 ‾ ] - ( x 2 ‾ y ‾ + y ‾ y 2 ‾ - x 2 y ‾ - y 3 ‾ ) ( x ‾ y ‾ - xy ‾ ) 2 [ ( x ‾ ) 2 - x 2 ‾ ] [ ( y ‾ ) 2 - y 2 ‾ ] - 2 ( x ‾ y ‾ - xy ‾ ) 2 B = ( x 2 ‾ x ‾ + x ‾ y 2 ‾ - x 2 y ‾ - y 3 ‾ ) [ ( x ‾ ) 2 - x 2 ‾ ] - ( x 2 ‾ x ‾ + x ‾ y 2 ‾ - x 3 ‾ - x y 2 ‾ ) ( x ‾ y ‾ - xy ‾ ) 2 [ ( x ‾ ) 2 - x 2 ‾ ] [ ( y ‾ ) 2 - y 2 ‾ ] - 2 ( x ‾ y ‾ - xy ‾ ) 2 R = A 2 - 2 x ‾ A + B 2 - 2 y ‾ B + x 2 ‾ + y 2 ‾ .
There is the features such as interference fringe, contrast is lower, image is fuzzyyer in the original image that THz wave imaging obtains.This patent processes image from algorithm, reaches stress release treatment, interference fringe, improves the object of picture contrast and enhancing image border etc.Produce in conjunction with PCB actual, enable the image after process meet the needs of PCB via hole detection.
Original image threshold division: imagethresholding is a kind of traditional the most frequently used image partition method, because of its realize simple, calculated amount is little, performance is comparatively stable and to become in Iamge Segmentation the most most widely used cutting techniques of fundamental sum.It is specially adapted to the image that target and background occupies different grey-scale scope, under many circumstances, is the Image semantic classification process of the necessity of carrying out before graphical analysis, feature extraction and pattern-recognition.Common carrying out image threshold segmentation method has Otsu, maximum entropy, process of iteration, Adaptive Thresholding etc., and this patent adopts process of iteration to carry out carrying out image threshold segmentation.
Wavelet Denoising Method function: wavelet function is as one effective time (space)/dimensional analysis algorithm, it applies the multiple research fields throughout signal and image analysis processing, three steps are divided: the first, signal is carried out wavelet transformation to PCB imaging processing, the second, signal and noise different conditions are spatially utilized, carry out signal to wavelet coefficient to cut out, noise is removed from signal, the 3rd, utilize restructing algorithm also original image.
The calculating of standard form and collection image eigenfunction, comprises following process:
First, the center of circle in hole is located and radius derivation algorithm: the core of detection system is exactly solve the quality problems detecting PCB via hole, will carry out the determination of the center of circle and radius, calculate the fundamental function of through hole on this basis for the through hole after each imaging.
Then, the via structure of field strength distribution and symmetric fundamental function: Standard PC B exists symmetry, the result of thus its THz wave imaging also has corresponding symmetry.And the PCB via hole that there is mass defect structurally must have asymmetry, also just necessarily uneven to the absorption characteristic of THz wave in via hole zones of different, this finally result in the asymmetry of the imaging results to defect PCB via hole.
Finally. template matching algorithm: template matching algorithm is ingredient important in PCB detection system, which determines accuracy rate and the degree of accuracy of detection system.This project, according to the feature of this detection system, is intended adopting traditional essential characteristic matching method to combine with relational structure matching method, to improve the accuracy rate of systems axiol-ogy.
Detection system is primarily of the generating means of (1) Terahertz light source as shown in Figure 2, (2) board under test article carrying platform, and (3) terahertz wave detector part and (4) are formed for the computing machine of Digital Image Processing.Objective table is for adjusting the relative position of pcb board and light source.Common THz wave detecting devices is pyroelectric detector.The information input computing machines such as the THz wave field strength distribution obtain checkout equipment, just can obtain the THz wave imaging results of carrying out matching detection for same standard picture after certain Digital Image Processing.

Claims (5)

1. a detection method for PCB via hole inwall quality, is characterized in that: described detection method comprises the steps:
Step 101: obtain PCB to be measured and standard form;
Step 102: use THz wave imaging technique to gather PCB original image to be measured and standard form original image;
Step 103: carry out thresholding, denoising to PCB original image to be measured and standard form original image, obtains restored image to be measured and standard form restored image;
Step 104: the fundamental function calculating standard form restored image and restored image to be measured respectively, obtain the via hole center of circle and aperture information, process is as follows:
If point on arbitrfary point P (r, θ) and viewing plane on the circular hole of radius a 2 distance L, hole and sightingpiston distance Z, terahertz pulse is Gaussian in the distribution of time domain and spatial domain, and incident wave pulse width is T, center angular frequency ω, wave number k=2 π/λ, then
During plane wave incidence, incident wave light field is described as
Transmitted wave light field is described as consideration light is the travel-time from P to Q, gets when being brought in U by E c is the light velocity, both
Distribution of light intensity I=|U| 2;
The standard form restored image hole circle heart and radius data obtain from the PCB file of standard form; PCB restored image 8-neighborhood contours extract method to be measured obtains bore edges profile, then calculates central coordinate of circle and radius with least square fitting;
Step 105: the standard form restored image of gained and the characteristic information of restored image to be measured are carried out template matches computing, and process is as follows:
First carrying out image registration, both by carrying out coordinate transform to PCB aperture heart coordinate, making restored image coordinate identical with standard form coordinate;
For the point on random two-dimensional image, all transformation matrix can be passed through G = g 11 g 12 g 13 g 21 g 22 g 23 0 0 1 Realize the geometric transformation to it, both x 2 y 2 1 = G x 1 y 1 1 , Wherein, submatrix g 11 g 12 g 21 g 22 Achieve the rotational transform to impact point, submatrix g 13 g 23 Realize the translation transformation to impact point;
Because one group of respective coordinates point determines 2 equations, therefore by minimum three groups of respective coordinates point determination transformation matrix G;
Be analyzed for reference point standard form and each hole transmitted field field strength distribution of recovery template to be measured with each hole heart coordinate, draw the field intensity difference on arbitrary coordinate point;
Step 106: if matching operation result is within the scope of production permissible error, then show detection qualified;
Step 107: if matching operation result exceeds produce permissible error scope, then show detection defective.
2. the detection method of a kind of PCB via hole inwall quality as claimed in claim 1, it is characterized in that: in described step 107, export defect area information, the enlarged image in this region, containing the difference of this area coordinate parameter, this coordinate position actual difference, this defect area region transmission coefficient and standard form that field intensity and standard form detected, is presented confession reviewer according to the coordinate parameters provided and does final judgement by described defect area packets of information on a display screen.
3. the detection method of a kind of PCB via hole inwall quality as claimed in claim 1 or 2, is characterized in that: in described step 103, adopts process of iteration to carry out carrying out image threshold segmentation.
4. the detection method of a kind of PCB via hole inwall quality as claimed in claim 1 or 2, it is characterized in that: in described step 103, described denoising adopts Wavelet Denoising Method function: process is as follows: the first, signal is carried out wavelet transformation, the second, signal and noise different conditions are spatially utilized, carry out signal to wavelet coefficient to cut out, noise is removed from signal, the 3rd, utilize restructing algorithm also original image.
5. the detection method of a kind of PCB via hole inwall quality as claimed in claim 1 or 2, it is characterized in that: in step 104, the process of 8-neighborhood contours extract method is as follows:
For a secondary bianry image, if background pixel is black, object is white, for black background pixel a certain in image, if be all background pixel point in its 8 neighborhoods, then this point is set to white, all pixels of traversing graph picture just can complete the extraction to all circular hole profiles;
The Fitting Calculation of central coordinate of circle radius is completed by least square method:
For the N group data (x on edge contour i, y i), if central coordinate of circle P (A, B), radius is R, then equation of a circle is written as (x-A) 2+ (y-B) 2=R 2
Note residuals squares sum functions is
S = Σ i = 1 N [ ( x i - A ) 2 + ( y i - B ) 2 - R 2 ] 2 , Have according to the principle of least square ∂ S ∂ A = ∂ S ∂ B = ∂ S ∂ R = 0 ;
Order x n y m ‾ = Σ i = 1 N ( x i n y i m ) / N , Solve central coordinate of circle and radius is:
A = ( x 2 ‾ x ‾ + x ‾ y 2 ‾ - x 3 ‾ - xy 2 ‾ ) [ ( y ‾ ) 2 - y 2 ‾ ] - ( x 2 ‾ y ‾ + y ‾ y 2 ‾ - x 2 y ‾ - y 3 ‾ ) ( x ‾ y ‾ - xy ‾ ) 2 [ ( x ‾ ) 2 - x 2 ‾ ] [ ( y ‾ ) 2 - y 2 ‾ ] - 2 ( x ‾ y ‾ - xy ‾ ) 2 B = ( x 2 ‾ y ‾ + y ‾ y 2 ‾ - x 2 y ‾ - y 3 ‾ ) [ ( x ‾ ) 2 - x 2 ‾ ] - ( x 2 ‾ x ‾ + x ‾ y 2 ‾ - x 3 ‾ - xy 2 ‾ ) ( x ‾ y ‾ - xy ‾ ) 2 [ ( x ‾ ) 2 - x 2 ‾ ] [ ( y ‾ ) 2 - y 2 ‾ ] - 2 ( x ‾ y ‾ - xy ‾ ) 2 R = A 2 - 2 x ‾ A + B 2 - 2 y ‾ B + x 2 ‾ + y 2 ‾ .
CN201510214044.9A 2015-04-29 2015-04-29 A kind of detection method of PCB vias inwall quality Active CN104764712B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201510214044.9A CN104764712B (en) 2015-04-29 2015-04-29 A kind of detection method of PCB vias inwall quality

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201510214044.9A CN104764712B (en) 2015-04-29 2015-04-29 A kind of detection method of PCB vias inwall quality

Publications (2)

Publication Number Publication Date
CN104764712A true CN104764712A (en) 2015-07-08
CN104764712B CN104764712B (en) 2017-08-25

Family

ID=53646677

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201510214044.9A Active CN104764712B (en) 2015-04-29 2015-04-29 A kind of detection method of PCB vias inwall quality

Country Status (1)

Country Link
CN (1) CN104764712B (en)

Cited By (22)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN105717256A (en) * 2016-02-02 2016-06-29 浪潮(北京)电子信息产业有限公司 Method and device for detecting state of via holes in wave-soldering zone
CN106290413A (en) * 2016-07-21 2017-01-04 深圳市纳研科技有限公司 A kind of x-ray imaging apparatus for the detection of pcb board via
CN106327496A (en) * 2016-08-26 2017-01-11 西安电子科技大学 System and method for detecting defects of blind holes in PCB (Printed Circuit Board) bare board based on AOI (Automated Optical Inspection)
CN106546603A (en) * 2016-10-29 2017-03-29 图麟信息科技(上海)有限公司 A kind of TP, the industrial vision detection means of glass cover-plate and detection method
CN106886989A (en) * 2015-12-11 2017-06-23 东莞东聚电子电讯制品有限公司 The automatic optical detection method of keyboard
CN106897994A (en) * 2017-01-20 2017-06-27 北京京仪仪器仪表研究总院有限公司 A kind of pcb board defect detecting system and method based on layered image
CN107767379A (en) * 2017-11-16 2018-03-06 桂林电子科技大学 Pcb board marks print quality inspection method
CN108445010A (en) * 2018-03-12 2018-08-24 昆山国显光电有限公司 Automatic optical detection method and device
CN109559294A (en) * 2017-09-26 2019-04-02 凌云光技术集团有限责任公司 A kind of detection method and device of drop circular hole quality
CN109741310A (en) * 2018-12-27 2019-05-10 深圳市鹰眼在线电子科技有限公司 Image processing method, system and the storage medium of pcb board
CN109754395A (en) * 2017-01-10 2019-05-14 中国人民银行印制科学技术研究所 The defect extracting method and defect extraction element of valuable bills
CN110175614A (en) * 2019-04-23 2019-08-27 浙江工业大学 A kind of detection method of printed circuit board via hole inner wall quality
CN111595809A (en) * 2020-06-08 2020-08-28 霍州煤电集团有限责任公司辛置煤矿 Terahertz scanning-based coal mine vertical shaft cage guide detection system and method
CN112102355A (en) * 2020-09-25 2020-12-18 江苏瑞尔医疗科技有限公司 Low-contrast resolution identification method, equipment, storage medium and system for flat panel detector
CN112188743A (en) * 2020-10-27 2021-01-05 惠州市特创电子科技有限公司 Multilayer circuit board and rivet drilling method thereof
CN112255479A (en) * 2020-10-12 2021-01-22 安徽来福电子科技有限公司 Shunt performance test system
WO2021036056A1 (en) * 2019-08-30 2021-03-04 苏州康代智能科技股份有限公司 Hole site measurement method and device based on circuit board having upper and lower drilled holes
CN113310997A (en) * 2021-07-30 2021-08-27 苏州维嘉科技股份有限公司 PCB defect confirmation method and device, automatic optical detection equipment and storage medium
CN113744163A (en) * 2021-11-03 2021-12-03 季华实验室 Integrated circuit image enhancement method and device, electronic equipment and storage medium
CN113808067A (en) * 2020-06-11 2021-12-17 广东美的白色家电技术创新中心有限公司 Circuit board detection method, visual detection equipment and device with storage function
CN116481461A (en) * 2022-11-24 2023-07-25 广州帕卡汽车零部件有限公司 Method for detecting roughness of hole forming and notch of sound and heat insulation spare and accessory parts of automobile
CN116907341A (en) * 2023-07-06 2023-10-20 深圳市塔联科技有限公司 Intelligent detection method and system for PCB

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN109557053A (en) * 2018-11-27 2019-04-02 江门市利诺达电路科技有限公司 A kind of detection method of the circuit board via quality based on infrared external reflection principle

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58117440A (en) * 1982-01-05 1983-07-13 Nec Corp Automatic inspecting apparatus for through-hole in printed circuit board
EP0466013A2 (en) * 1990-07-10 1992-01-15 Dainippon Screen Mfg. Co., Ltd. Method of and device for inspecting pattern of printed circuit board
CN101738381A (en) * 2009-12-14 2010-06-16 西北工业大学 Method for manufacturing single-pixel terahertz imaging template
CN201773071U (en) * 2010-09-07 2011-03-23 景旺电子科技(龙川)有限公司 PCB appearance inspection platform
CN103389309A (en) * 2012-05-11 2013-11-13 三星泰科威株式会社 Method and apparatus for inspecting via hole

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58117440A (en) * 1982-01-05 1983-07-13 Nec Corp Automatic inspecting apparatus for through-hole in printed circuit board
EP0466013A2 (en) * 1990-07-10 1992-01-15 Dainippon Screen Mfg. Co., Ltd. Method of and device for inspecting pattern of printed circuit board
CN101738381A (en) * 2009-12-14 2010-06-16 西北工业大学 Method for manufacturing single-pixel terahertz imaging template
CN201773071U (en) * 2010-09-07 2011-03-23 景旺电子科技(龙川)有限公司 PCB appearance inspection platform
CN103389309A (en) * 2012-05-11 2013-11-13 三星泰科威株式会社 Method and apparatus for inspecting via hole

Non-Patent Citations (2)

* Cited by examiner, † Cited by third party
Title
刘文霞 等: ""红外热成像技术在PCB板过孔质量检测中的应用"", 《激光与红外》 *
杨力帆 等: ""PCB孔质量检测技术的研究"", 《电声技术》 *

Cited By (29)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN106886989A (en) * 2015-12-11 2017-06-23 东莞东聚电子电讯制品有限公司 The automatic optical detection method of keyboard
CN105717256B (en) * 2016-02-02 2019-07-26 浪潮(北京)电子信息产业有限公司 A kind of method and device of the state for the via hole detecting wave-soldering region
CN105717256A (en) * 2016-02-02 2016-06-29 浪潮(北京)电子信息产业有限公司 Method and device for detecting state of via holes in wave-soldering zone
CN106290413A (en) * 2016-07-21 2017-01-04 深圳市纳研科技有限公司 A kind of x-ray imaging apparatus for the detection of pcb board via
CN106327496A (en) * 2016-08-26 2017-01-11 西安电子科技大学 System and method for detecting defects of blind holes in PCB (Printed Circuit Board) bare board based on AOI (Automated Optical Inspection)
CN106327496B (en) * 2016-08-26 2019-04-23 西安电子科技大学 The detection system and method for PCB bare board blind hole defect based on AOI
CN106546603A (en) * 2016-10-29 2017-03-29 图麟信息科技(上海)有限公司 A kind of TP, the industrial vision detection means of glass cover-plate and detection method
CN109754395A (en) * 2017-01-10 2019-05-14 中国人民银行印制科学技术研究所 The defect extracting method and defect extraction element of valuable bills
CN109754395B (en) * 2017-01-10 2021-03-02 中国人民银行印制科学技术研究所 Method and device for extracting defects of value documents
CN106897994A (en) * 2017-01-20 2017-06-27 北京京仪仪器仪表研究总院有限公司 A kind of pcb board defect detecting system and method based on layered image
CN109559294A (en) * 2017-09-26 2019-04-02 凌云光技术集团有限责任公司 A kind of detection method and device of drop circular hole quality
CN109559294B (en) * 2017-09-26 2021-01-26 凌云光技术股份有限公司 Method and device for detecting quality of circular hole of drop
CN107767379A (en) * 2017-11-16 2018-03-06 桂林电子科技大学 Pcb board marks print quality inspection method
CN107767379B (en) * 2017-11-16 2021-02-12 桂林电子科技大学 PCB label printing quality detection method
CN108445010A (en) * 2018-03-12 2018-08-24 昆山国显光电有限公司 Automatic optical detection method and device
CN109741310A (en) * 2018-12-27 2019-05-10 深圳市鹰眼在线电子科技有限公司 Image processing method, system and the storage medium of pcb board
CN110175614A (en) * 2019-04-23 2019-08-27 浙江工业大学 A kind of detection method of printed circuit board via hole inner wall quality
WO2021036056A1 (en) * 2019-08-30 2021-03-04 苏州康代智能科技股份有限公司 Hole site measurement method and device based on circuit board having upper and lower drilled holes
CN111595809A (en) * 2020-06-08 2020-08-28 霍州煤电集团有限责任公司辛置煤矿 Terahertz scanning-based coal mine vertical shaft cage guide detection system and method
CN113808067A (en) * 2020-06-11 2021-12-17 广东美的白色家电技术创新中心有限公司 Circuit board detection method, visual detection equipment and device with storage function
CN112102355A (en) * 2020-09-25 2020-12-18 江苏瑞尔医疗科技有限公司 Low-contrast resolution identification method, equipment, storage medium and system for flat panel detector
CN112255479A (en) * 2020-10-12 2021-01-22 安徽来福电子科技有限公司 Shunt performance test system
CN112188743A (en) * 2020-10-27 2021-01-05 惠州市特创电子科技有限公司 Multilayer circuit board and rivet drilling method thereof
CN113310997A (en) * 2021-07-30 2021-08-27 苏州维嘉科技股份有限公司 PCB defect confirmation method and device, automatic optical detection equipment and storage medium
CN113744163A (en) * 2021-11-03 2021-12-03 季华实验室 Integrated circuit image enhancement method and device, electronic equipment and storage medium
CN113744163B (en) * 2021-11-03 2022-02-08 季华实验室 Integrated circuit image enhancement method and device, electronic equipment and storage medium
CN116481461A (en) * 2022-11-24 2023-07-25 广州帕卡汽车零部件有限公司 Method for detecting roughness of hole forming and notch of sound and heat insulation spare and accessory parts of automobile
CN116481461B (en) * 2022-11-24 2023-09-22 广州帕卡汽车零部件有限公司 Method for detecting roughness of hole forming and notch of sound and heat insulation spare and accessory parts of automobile
CN116907341A (en) * 2023-07-06 2023-10-20 深圳市塔联科技有限公司 Intelligent detection method and system for PCB

Also Published As

Publication number Publication date
CN104764712B (en) 2017-08-25

Similar Documents

Publication Publication Date Title
CN104764712A (en) Method for detecting quality of inner wall of via hole of PCB
Di Leo et al. A vision system for the online quality monitoring of industrial manufacturing
CN108346141A (en) Unilateral side incidence type light guide plate defect extracting method
CN109102455B (en) Defect detection method, detection image generation method, system and storage device
CN108416766A (en) Bilateral incidence type light guide plate defective vision detection method
US20050258836A1 (en) Apparatus and method of inspecting breakdown of conducting wire
CN103499392B (en) TeraHertz-wave far-field detection super-diffraction resolution imaging instrument
CN103759676A (en) Non-contact type workpiece surface roughness detecting method
Zhang et al. Automatic detection of defective apples using NIR coded structured light and fast lightness correction
CN104007115A (en) Method and system for detecting jewelry structure by using terahertz time domain spectroscopic technique
CN102842120B (en) Image blurring degree detection method based on supercomplex wavelet phase measurement
CN110473194A (en) Fruit surface defect detection method based on more image block Threshold Segmentation Algorithms
CN103226829A (en) Image edge detection method based on edge enhancement operator
Gong et al. Automatic subway tunnel crack detection system based on line scan camera
Hilden et al. Optical quality assurance of GEM foils
CN107300562B (en) X-ray nondestructive testing method for measuring contact distance of finished relay product
CN103337067B (en) The visible detection method of single needle scan-type screw measurement instrument probe X-axis rotating deviation
CN106030285A (en) Apparatus and method for testing conductivity of graphene
CN109682821A (en) A kind of citrus detection method of surface flaw based on multiple dimensioned Gaussian function
CN108986088A (en) A kind of image based on MATLAB automatically extracts optimization method and equipment
Chen et al. An effective image segmentation method for noisy low-contrast unbalanced background in Mura defects using balanced discrete-cosine-transfer (BDCT)
CN111316086B (en) Optical detection method for surface defects and related device
DE112016006272T5 (en) Detecting a direction of lateral motion of an object remotely using phase difference based optical orbit angular momentum spectroscopy
CN107543502A (en) Optical device for real-time detecting full-field thickness
CN115931915A (en) Microwave detection method for composite material layering defects by coupling infrared thermography

Legal Events

Date Code Title Description
C06 Publication
PB01 Publication
EXSB Decision made by sipo to initiate substantive examination
SE01 Entry into force of request for substantive examination
GR01 Patent grant
GR01 Patent grant
TR01 Transfer of patent right

Effective date of registration: 20190513

Address after: 325000 No. 4226 Sandao Binhai, Wenzhou Economic and Technological Development Zone, Zhejiang Province

Patentee after: ZHEJIANG OULONG ELECTRIC CO., LTD.

Address before: 310014 Zhejiang University of Technology, 18 Zhaowang Road, Zhaohui six District, Hangzhou, Zhejiang

Patentee before: Zhejiang University of Technology

TR01 Transfer of patent right