CN104730087B - Observe the device of bubble in quartz glass crucibles hyaline layer - Google Patents
Observe the device of bubble in quartz glass crucibles hyaline layer Download PDFInfo
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- CN104730087B CN104730087B CN201510111215.5A CN201510111215A CN104730087B CN 104730087 B CN104730087 B CN 104730087B CN 201510111215 A CN201510111215 A CN 201510111215A CN 104730087 B CN104730087 B CN 104730087B
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CN201510111215.5A CN104730087B (en) | 2014-12-12 | 2015-03-16 | Observe the device of bubble in quartz glass crucibles hyaline layer |
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CN201410760272 | 2014-12-12 | ||
CN2014107602721 | 2014-12-12 | ||
CN201510111215.5A CN104730087B (en) | 2014-12-12 | 2015-03-16 | Observe the device of bubble in quartz glass crucibles hyaline layer |
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CN104730087A CN104730087A (en) | 2015-06-24 |
CN104730087B true CN104730087B (en) | 2017-09-08 |
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CN201510111215.5A Active CN104730087B (en) | 2014-12-12 | 2015-03-16 | Observe the device of bubble in quartz glass crucibles hyaline layer |
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Families Citing this family (5)
Publication number | Priority date | Publication date | Assignee | Title |
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CN107543824B (en) * | 2016-06-23 | 2022-03-22 | 中国科学院长春光学精密机械与物理研究所 | Device and method for detecting surface defects of planar optical element |
CN109191440A (en) * | 2018-08-24 | 2019-01-11 | 上海应用技术大学 | Glass blister detection and method of counting |
CN109584259B (en) * | 2019-01-18 | 2021-10-01 | 赵谦 | Quartz crucible bubble layered counting device and method |
CN109827962A (en) * | 2019-03-15 | 2019-05-31 | 浙江飞哲工贸有限公司 | A kind of method and apparatus for detecting aluminium alloy melt hydrogen content |
CN112147710B (en) * | 2019-06-26 | 2022-02-18 | 上海微电子装备(集团)股份有限公司 | Detection method and detection device of wet-process optical cement device |
Family Cites Families (10)
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JPH0813340B2 (en) * | 1989-08-30 | 1996-02-14 | 三菱マテリアル株式会社 | Optical nondestructive inspection method for quartz crucible and its equipment |
FR2742865B1 (en) * | 1995-12-22 | 1998-01-16 | Saint Gobain Cinematique | METHOD FOR CHECKING A GLASS CONTAINER |
JP2001027613A (en) * | 1999-07-13 | 2001-01-30 | Toshiba Ceramics Co Ltd | Foreign matter detection apparatus of transparent ingot and transparent object producing method using the same |
KR20060003731A (en) * | 2004-07-07 | 2006-01-11 | 윈텍 주식회사 | Method and defect examination apparatus for display bare glass |
CN101750422A (en) * | 2010-01-07 | 2010-06-23 | 秦皇岛凯维科技有限公司 | On-line automatic detection device for glass defect |
CN102183530A (en) * | 2011-05-02 | 2011-09-14 | 苏州工业园区高登威科技有限公司 | Adjustable charge coupled device (CCD) optical check device |
KR101638584B1 (en) * | 2011-12-22 | 2016-07-11 | 가부시키가이샤 섬코 | Method for evaluating silica glass crucible, method for producing silicon single crystals |
CN202643923U (en) * | 2012-05-19 | 2013-01-02 | 鸿福晶体科技(安徽)有限公司 | Device for observing crystal growth situation |
CN202994684U (en) * | 2012-12-09 | 2013-06-12 | 滁州德丰高科机械有限公司 | Air bubble detection device for glass production |
CN203275317U (en) * | 2013-05-20 | 2013-11-06 | 浙江矽盛电子有限公司 | Detection device of quartz crucible |
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Legal Events
Date | Code | Title | Description |
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C06 | Publication | ||
PB01 | Publication | ||
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CB02 | Change of applicant information | ||
CB02 | Change of applicant information |
Address after: When the industrial park of Nantong city in Jiangsu Province Haimen 226100 Applicant after: NANTONG ROBUST QUARTZ MATERIAL CO.,LTD. Address before: When the industrial park of Nantong city in Jiangsu Province Haimen 226100 Applicant before: Nantong Robust Quartz Material Co.,Ltd. |
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GR01 | Patent grant | ||
GR01 | Patent grant | ||
TR01 | Transfer of patent right | ||
TR01 | Transfer of patent right |
Effective date of registration: 20200820 Address after: 200120 building C, No. 888, Huanhu West 2nd Road, Lingang xinpian District, Pudong New Area, Shanghai Patentee after: Shanghai hengmujing New Material Co.,Ltd. Address before: When the industrial park of Nantong city in Jiangsu Province Haimen 226100 Patentee before: NANTONG ROBUST QUARTZ MATERIAL Co.,Ltd. |
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TR01 | Transfer of patent right | ||
TR01 | Transfer of patent right |
Effective date of registration: 20230510 Address after: 661100 Intersection of No.5 Road and Honghe Avenue, Mengzi Economic Development Zone, Honghe Hani and Yi Autonomous Prefecture, Yunnan Province Patentee after: Honghe Bangde New Materials Co.,Ltd. Address before: 200120 building C, No. 888, Huanhu West 2nd Road, Lingang xinpian District, Pudong New Area, Shanghai Patentee before: Shanghai hengmujing New Material Co.,Ltd. |