CN104697973A - 一种外延片拉曼散射光谱数据生成方法 - Google Patents
一种外延片拉曼散射光谱数据生成方法 Download PDFInfo
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- CN104697973A CN104697973A CN201310648303.XA CN201310648303A CN104697973A CN 104697973 A CN104697973 A CN 104697973A CN 201310648303 A CN201310648303 A CN 201310648303A CN 104697973 A CN104697973 A CN 104697973A
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- 238000001228 spectrum Methods 0.000 title claims abstract description 51
- 238000001069 Raman spectroscopy Methods 0.000 title claims abstract description 44
- 238000000034 method Methods 0.000 title claims abstract description 18
- 235000012431 wafers Nutrition 0.000 claims abstract description 74
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 claims abstract description 66
- 229910002804 graphite Inorganic materials 0.000 claims abstract description 66
- 239000010439 graphite Substances 0.000 claims abstract description 66
- 238000013480 data collection Methods 0.000 claims description 15
- 239000004065 semiconductor Substances 0.000 abstract description 7
- 238000004519 manufacturing process Methods 0.000 abstract description 3
- 239000000463 material Substances 0.000 description 8
- 238000000407 epitaxy Methods 0.000 description 6
- 238000001237 Raman spectrum Methods 0.000 description 4
- 238000010586 diagram Methods 0.000 description 2
- 238000004616 Pyrometry Methods 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 238000005229 chemical vapour deposition Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 238000005286 illumination Methods 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 238000012544 monitoring process Methods 0.000 description 1
- 238000000103 photoluminescence spectrum Methods 0.000 description 1
- 238000001845 vibrational spectrum Methods 0.000 description 1
- 230000000007 visual effect Effects 0.000 description 1
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Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN114062342A (zh) * | 2020-07-30 | 2022-02-18 | 顶极科技股份有限公司 | 一种半导体制程零配件的质变检测***和方法 |
Citations (7)
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CN101339092A (zh) * | 2008-08-13 | 2009-01-07 | 重庆大学 | Led芯片/晶圆/外延片的非接触式检测方法及检测装置 |
CN101471271A (zh) * | 2007-12-27 | 2009-07-01 | 深圳市方大国科光电技术有限公司 | 氮化镓外延片的快速检测方法 |
CN101514964A (zh) * | 2009-03-27 | 2009-08-26 | 福州高意光学有限公司 | 一种基于拉曼光谱技术的物质检测仪 |
CN101906622A (zh) * | 2010-08-20 | 2010-12-08 | 华晟光电设备(香港)有限公司 | 用于mocvd***中控制外延片温度及均匀性的装置与方法 |
CN102403248A (zh) * | 2011-11-23 | 2012-04-04 | 河北普兴电子科技股份有限公司 | 硅抛光片或外延片层错及位错缺陷的无损检测方法 |
CN103364386A (zh) * | 2012-03-27 | 2013-10-23 | 武汉鹰飞拓光电子有限公司 | 深紫外激光拉曼光谱仪 |
JP2013232553A (ja) * | 2012-04-27 | 2013-11-14 | National Institute Of Advanced Industrial & Technology | 炭化珪素半導体素子の製造方法 |
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2013
- 2013-12-04 CN CN201310648303.XA patent/CN104697973B/zh active Active
Patent Citations (7)
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CN101471271A (zh) * | 2007-12-27 | 2009-07-01 | 深圳市方大国科光电技术有限公司 | 氮化镓外延片的快速检测方法 |
CN101339092A (zh) * | 2008-08-13 | 2009-01-07 | 重庆大学 | Led芯片/晶圆/外延片的非接触式检测方法及检测装置 |
CN101514964A (zh) * | 2009-03-27 | 2009-08-26 | 福州高意光学有限公司 | 一种基于拉曼光谱技术的物质检测仪 |
CN101906622A (zh) * | 2010-08-20 | 2010-12-08 | 华晟光电设备(香港)有限公司 | 用于mocvd***中控制外延片温度及均匀性的装置与方法 |
CN102403248A (zh) * | 2011-11-23 | 2012-04-04 | 河北普兴电子科技股份有限公司 | 硅抛光片或外延片层错及位错缺陷的无损检测方法 |
CN103364386A (zh) * | 2012-03-27 | 2013-10-23 | 武汉鹰飞拓光电子有限公司 | 深紫外激光拉曼光谱仪 |
JP2013232553A (ja) * | 2012-04-27 | 2013-11-14 | National Institute Of Advanced Industrial & Technology | 炭化珪素半導体素子の製造方法 |
Non-Patent Citations (2)
Title |
---|
INGRID DE WOLF: "《Micro-Raman spectroscopy to study local mechanical stress in silicon integrated circuits》", 《SEMICOND.SCI.TECHNOL.》 * |
R.SCHOLZ ET AL.: "《Resonant Raman spectroscopy of 3,4,9,10-perylene-tetracarboxylic-dianhydride epitaxial films》", 《PHYSICAL REVIEW B》 * |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN114062342A (zh) * | 2020-07-30 | 2022-02-18 | 顶极科技股份有限公司 | 一种半导体制程零配件的质变检测***和方法 |
CN114062342B (zh) * | 2020-07-30 | 2024-01-23 | 顶极科技股份有限公司 | 一种半导体制程零配件的质变检测***和方法 |
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