CN104637858B - Work treatment installation - Google Patents

Work treatment installation Download PDF

Info

Publication number
CN104637858B
CN104637858B CN201310553969.7A CN201310553969A CN104637858B CN 104637858 B CN104637858 B CN 104637858B CN 201310553969 A CN201310553969 A CN 201310553969A CN 104637858 B CN104637858 B CN 104637858B
Authority
CN
China
Prior art keywords
chuck
workpiece
small
big
group
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
CN201310553969.7A
Other languages
Chinese (zh)
Other versions
CN104637858A (en
Inventor
王坚
贾照伟
张怀东
王晖
Original Assignee
ACM (SHANGHAI) Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by ACM (SHANGHAI) Inc filed Critical ACM (SHANGHAI) Inc
Priority to CN201310553969.7A priority Critical patent/CN104637858B/en
Publication of CN104637858A publication Critical patent/CN104637858A/en
Application granted granted Critical
Publication of CN104637858B publication Critical patent/CN104637858B/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/683Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
    • H01L21/687Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches
    • H01L21/68714Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support
    • H01L21/68785Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support characterised by the mechanical construction of the susceptor, stage or support

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)

Abstract

Present invention discloses a kind of Work treatment installations, comprising: process cavity and Workpiece carrier mechanism, wherein Workpiece carrier mechanism includes big chuck, small chuck and at least one set of pillar.Big chuck is contained in process cavity, and bottom and side wall surround accommodation space.Small chuck is contained in accommodation space, and with chuck main body, top offers several accommodating chambers downwards to accommodate several workpiece.Pillar can be contained in the perforation of one group of through-hole and small chuck corresponding with this group of through-hole of big chuck, to pick and place workpiece.By configuring several small chucks with accommodating chamber, when needing to handle the workpiece with identical or different size and shape, the small chuck of the accommodating chamber with corresponding size and shape need to only be selected, and small chuck is placed in the accommodation space of big chuck, do not need to replace entire big chuck, thus Work treatment installation of the present invention use it is upper more convenient flexible, structure is simple, multi-disc workpiece can be handled simultaneously, improves work pieces process efficiency, reduce work pieces process cost.

Description

Work treatment installation
Technical field
The present invention relates to Work treatment installation more particularly to a kind of Work treatment installations that can handle multi-disc workpiece simultaneously.
Background technique
With semicon industry competition, in semiconductor technology process, in addition to technique processing quality Having outside strict demand, each producer is also constantly seeking to improve technique processing efficiency and is reducing the new way of technique processing cost, this Kind new way includes improving processing unit (plant) and/or improvement process flow.
Such as Chinese patent application CN200810126565.9 disclose it is a kind of can with the device of the multiple substrates of batch machining, The device includes chamber body, three or more support columns and the multiple support teeth extended from three or more support columns, adjacent branch It supports between cog and forms the line of rabbet joint to support substrate.When processing substrate, multiple substrates are placed in chamber body, and in a substantially parallel manner Arrange multiple substrate.The device is compared to can only once process the device of a piece of workpiece, although improving work pieces process efficiency, But when this stacked processing unit (plant) being used to process multiple substrates, substrate is supplied from the side of device and flowed through to gas, causes Substrate surface treatment uniformity is difficult to control, in addition, the by-product or pollutant of the attachment of upper substrate surface are easy to influence lower layer The processing of substrate is fallen on underlying basal.
In order to solve above-mentioned apparatus, Chinese patent application CN201010180970.6 discloses one kind Board, the board include reaction cavity, rotating seat, chip-bearing disc, heater and jet thrust.Reaction cavity has opening.Rotation Swivel base is set in reaction cavity.Chip-bearing disc is set on rotating seat, and rotating seat can drive crystal chip bearing disc spins.Chip is held Load plate includes multiple supporting regions of at least two different-diameters, and on the surface of chip-bearing disc, these supporting regions are applicable in right Multiple chips should be loaded.Heater is set to the lower section of chip-bearing disc, and is located in rotating seat.Jet thrust is covered on reaction cavity Opening on, to discharge reaction gas on the surface towards chip-bearing disc.Though the board is effectively utilized making for chip-bearing disc Replacement need to be corresponded to achieve the purpose that improve production capacity, reduce cost, however when needing to process different wafer sizes with space Entire chip-bearing disc, therefore, the board are in actual use, not convenient enough, flexible.
Summary of the invention
The object of the present invention is to provide a kind of easy to use, flexible, and structure is simple, can handle multi-disc workpiece simultaneously Work treatment installation.
To achieve the above object, Work treatment installation proposed by the present invention, comprising: process cavity and Workpiece carrier mechanism, The Workpiece carrier mechanism includes:
Big chuck, the big chuck are contained in process cavity, and there is big chuck bottom and raising upward along bottom to be formed Side wall, the bottom of big chuck and side wall surround accommodation space, and the bottom of big chuck offers several groups through kilocalorie pan bottom Through-hole;
Small chuck, the small chuck are contained in the accommodation space of big chuck, and small chuck has chuck main body, chuck main body Top offers several accommodating chambers downwards to accommodate several workpiece, and the chuck main body of small chuck offers several groups and perforates, and every group Perforation one group of through-hole connection corresponding with an accommodating chamber of small chuck and big chuck respectively;And
At least one set of pillar, this group of pillar can be contained in the one group of through-hole and lesser calorie corresponding with this group of through-hole of big chuck In the perforation of disk, to pick and place workpiece.
In one embodiment, the size and shape of the accommodating chamber of the small chuck is consistent with the size and shape of workpiece.
In one embodiment, the Workpiece carrier mechanism includes several groups pillar, and each group of pillar can be contained in kilocalorie In the perforation of the one group of through-hole and small chuck corresponding with this group of through-hole of disk, the bottom end of each group of pillar is mutual by connector Connection, the top of each group of pillar are formed with convex edge, and the top of each group of pillar can be fastened in the through-hole of big chuck.
In one embodiment, the Workpiece carrier mechanism further includes supporting plate, and the bottom of process cavity is arranged in the supporting plate Below wall and parallel with the bottom wall of process cavity, the bottom wall of supporting plate and process cavity is tightly connected, the bottom end of a stud and supporting plate It is fixedly connected, the top of the stud passes through the bottom wall of process cavity and can support connector, and then can jack up one group of pillar, to take Put workpiece.
In conclusion the present invention is by configuring several small chucks with accommodating chamber, when need to handle have it is identical or not With size and shape workpiece when, only need to select the small chuck of the accommodating chamber with corresponding size and shape, and small chuck be pacified It is placed on the accommodation space of big chuck, without replacing entire big chuck, therefore, compared with the prior device, workpiece of the present invention adds Tooling is set more convenient, more flexible in use, and Work treatment installation structure of the present invention is simple, can handle multi-disc work simultaneously Part improves work pieces process efficiency, reduces work pieces process cost.
Detailed description of the invention
Fig. 1 discloses the schematic diagram of the section structure of the first embodiment of Work treatment installation of the present invention.
Fig. 2 discloses schematic diagram when Work treatment installation processing workpiece of the present invention.
Fig. 3 discloses the structural schematic diagram of an embodiment of the small chuck of Work treatment installation of the present invention.
Fig. 4 discloses the structural schematic diagram of the another embodiment of the small chuck of Work treatment installation of the present invention.
Fig. 5 discloses the schematic diagram of an embodiment of the big chuck of Work treatment installation of the present invention.
Fig. 6 discloses the schematic diagram of the another embodiment of the big chuck of Work treatment installation of the present invention.
Fig. 7 discloses the schematic diagram of the section structure of the second embodiment of Work treatment installation of the present invention.
Fig. 8 discloses the schematic diagram of the section structure of the 3rd embodiment of Work treatment installation of the present invention.
Fig. 9 discloses the structural schematic diagram of the another embodiment of the small chuck of Work treatment installation of the present invention.
Figure 10 discloses the schematic diagram of the section structure of the fourth embodiment of Work treatment installation of the present invention.
Specific embodiment
By the technology contents that the present invention will be described in detail, construction feature, reached purpose and efficacy, below in conjunction with embodiment And schema is cooperated to be described in detail.
Refering to fig. 1, the schematic diagram of the section structure of the first embodiment of Work treatment installation of the present invention is disclosed.Such as Fig. 1 institute Show, which includes process cavity 110 and Workpiece carrier mechanism 210." workpiece " described here can be wafer, base Plate, substrate or its similarity piece.
Process cavity 110 has 111, two pairs of side walls 112 of roof and the bottom wall 113 opposite with roof 111, process cavity 110 111, two pairs of side walls 112 of roof and bottom wall 113 surround a space, carry out technique processing to accommodate workpiece.Process cavity 110 one side wall 112 offers the workpiece entrance 114 for picking and placing workpiece, is provided with valve 310 at workpiece entrance 114, Valve 310 is used to open or closes workpiece entrance 114.According to different process requirements, the roof 111 of process cavity 110 can To offer air inlet 115, the bottom wall 113 of process cavity 110 can offer several symmetrical exhaust outlets 116.Wherein, The lower section of air inlet 115 is equipped with the spray head 410 for being contained in process cavity 110, and process gas is via air inlet 115 and spray head 410 enter process cavity 110 and are uniformly distributed in process cavity 110.
Workpiece carrier mechanism 210 includes support shaft 211 and the big chuck 212 being arranged in support shaft 211.Support shaft 211 Through the bottom wall 113 of process cavity 110, one end of support shaft 211 is located in process cavity 110, the other end position of support shaft 211 In the lower section of the bottom wall 113 of process cavity 110.Big chuck 212 is fixed at one end of support shaft 211, and big chuck 212 is by propping up Support axis 211 is supported and is contained in process cavity 110.In conjunction with Fig. 5, big chuck 212 has bottom and upward convex along bottom margin The side wall formed is acted, the bottom of big chuck 212 and side wall surround accommodation space, and the bottom of big chuck 212 offers multiple groups and runs through The through-hole 213 of big 212 bottom of chuck, every group of through-hole 213 include three through-holes 213, and three 213 roughly triangular points of through-hole Cloth, the shape of through-hole 213 are circle.
Workpiece carrier mechanism 210 further includes multiple small chucks 214, the through-hole of the quantity of small chuck 214 and big chuck 212 213 group number is identical, and small chuck 214 is contained in the accommodation space of big chuck 212 and corresponding one group for being placed in big chuck 212 is logical 213 top of hole, small chuck 214 is placed in the accommodation space of big chuck 212 by fixed device (not shown), small to prevent Chuck 214 slides.In conjunction with Fig. 3, small chuck 214 has a chuck main body 2141, the top of the chuck main body 2141 of small chuck 214 to Under offer accommodating chamber 2142 to accommodate workpiece 510.The chuck main body 2141 of small chuck 214 offers one group of perforation 215, the group Perforation 215 is connected to the accommodating chamber 2142 of small chuck 214, and 215 quantity comprising perforation 215 of group perforation and big chuck 212 are every The quantity for the through-hole 213 that group through-hole 213 includes is consistent, and therefore, correspondingly, group perforation 215 includes three perforation 215, the group 215 one group of through-hole 213 corresponding with big chuck 212 of perforation are connected.Preferably, the chuck main body 2141 of small chuck 214 Top opens up downwards accommodating chamber 2142 along certain gradient, so that workpiece 510 is put into the accommodating chamber 2142 of small chuck 214.Lesser calorie The size and shape of 214 accommodating chamber 2142 of disk are almost the same with the size and shape of workpiece 510, such as the size of workpiece 510 When being 4 inches, 6 inches, 8 inches, 12 inches or 18 inches, the accommodating chamber 2142 of small chuck 214 can be designed to and workpiece The size that 510 size matches.Each small chuck 214 has the chuck main body 2141 of identical size and shape.As shown in figure 4, Small chuck 214 ' has the chuck main body of identical size and shape with small chuck 214, and difference is only that the receipts of small chuck 214 ' Cavity is smaller than the accommodating chamber of small chuck 214, to accommodate small size workpiece 510.Small chuck 214,214 ' can be by aluminium, stainless steel Or one or more of copper material is made.
Workpiece carrier mechanism 210 further includes one group of pillar 216, this group of pillar 216 is contained in process cavity 110 and fixation is set It sets on the bottom wall 113 of process cavity 110.The quantity and 212 every groups of through-holes of big chuck for the pillar 216 that this group of pillar 216 includes The quantity of 213 through-holes 213 for including is consistent, and therefore, correspondingly, this group of pillar 216 includes three pillars 216, three pillars 216 It can be contained in the perforation 215 of one group of through-hole 213 and small chuck 214 corresponding with this group of through-hole 213 of big chuck 212.Branch One end that support axis 211 is located at 113 lower section of bottom wall of process cavity 110 is filled by vacuum rotary feedthroughs 217 and the first driving 218 connections are set, first driving device 218 drives vacuum rotary feedthroughs 217 and support shaft 211 to rotate, to drive kilocalorie Disk 212 rotates.Connecting plate 219 is arranged in the lower section of the bottom wall 113 of process cavity 110, and with the bottom wall of process cavity 110 113 It is arranged in parallel, connecting plate 219 and support shaft 211 are located at one end below the bottom wall 113 of process cavity 110 and pass through vacuum sealing biography Dynamic device 217 is connected.Scalable cutting ferrule 220 is arranged between the bottom wall 113 of process cavity 110 and connecting plate 219 and is arranged It is located at one end of 113 lower section of bottom wall of process cavity 110 in support shaft 211.By the way that scalable cutting ferrule 220 and vacuum sealing is arranged Transmission device 217 can prevent the gas in process cavity 110 from leaking.Fixing axle 221 is parallel to the setting of support shaft 211, fixed Axis 221 is set to the lower section of the bottom wall 113 of process cavity 110 and is fixedly connected with the bottom wall of process cavity 110 113.Fixing axle A pair of of loading plate 222 is provided on 221, this is located at the opposite both ends of fixing axle 221 to loading plate 222.Screw rod 223 with should Loading plate 222 is connected and is arranged in parallel with fixing axle 221, screw rod 223 passes through connecting plate 219 and loading plate 222, screw rod 223 Bottom end connect with the second driving device 224, the second driving device 224 be drivingly connected plate 219 risen or fallen along screw rod 223, To drive big chuck 212 to rise or fall in process cavity 110.First driving device 218 and the second driving device 224 can To select motor.
Refering to fig. 1 and Fig. 2, it illustrates how to handle work using Work treatment installation of the present invention by taking gas phase etching technics as an example Part 510.Firstly, selecting corresponding small chuck 214 according to the size and shape of workpiece 510 to be processed, small chuck 214 is placed in In big chuck 212, in the present embodiment, big chuck 212 can accommodate four small chuck 214, and big chuck 212 accommodates small chuck 214 quantity depends on the size of big chuck 212 and small chuck 214.Then, workpiece 510 is loaded into small chuck 214, Second driving device 224 be drivingly connected plate 219 along screw rod 223 decline, thus drive big chuck 212 in process cavity 110 under It is down to " loaded " position, three pillars 216 are contained in one group of through-hole 213 of big chuck 212 and corresponding small with this group of through-hole 213 In the perforation 215 of chuck 214, three pillars 216 are stretched out from the perforation 215 of small chuck 214, open valve 310, workpiece 510 Enter process cavity 110 from workpiece entrance 114 and be placed on three pillars 216, You Sangen pillar 216 is held up.The Two driving devices 224 are drivingly connected plate 219 and rise along screw rod 223, so that big chuck 212 be driven to rise in process cavity 110 To the top of three pillars 216, the workpiece 510 on pillar 216 is fallen into small chuck 214, to complete first small chuck 214 Workpiece load.Make it is spaced apart between the bottom of big chuck 212 and the top of three pillars 216, to guarantee big chuck 212 do not interfere in rotary course with pillar 216.Then, first driving device 218 drives vacuum rotary feedthroughs 217 and support shaft 211 rotate, so that big chuck 212 be driven to rotate, make second group of through-hole 213 of big chuck 212 and second small Chuck 214 is located at the top of three pillars 216.Second driving device 224 is drivingly connected plate 219 and declines along screw rod 223, thus band It moves big chuck 212 and drops to " loaded " position in process cavity 110, three pillars 216 be contained in big chuck 212 second group is logical In the perforation 215 of hole 213 and second small chuck 214 corresponding with this group of through-hole 213, three pillars 216 are small from second It is stretched out in the perforation 215 of chuck 214, workpiece 510 enters process cavity 110 from workpiece entrance 114 and is placed on three On pillar 216, You Sangen pillar 216 is held up.Second driving device 224 is drivingly connected plate 219 and rises along screw rod 223, thus band The top that big chuck 212 rises to three pillars 216 in process cavity 110 is moved, the workpiece 510 on pillar 216 falls into second In a small chuck 214, so that the workpiece for completing second small chuck 214 loads.And so on, it completes to own in big chuck 212 The workpiece of small chuck 214 loads.Then, valve 310 is closed, big chuck 212 and spray head are adjusted by the second driving device 224 Spacing between 410, to reach optimised process position.Process gas enters process cavity via air inlet 115 and spray head 410 110, first driving device 218 drives big chuck 212 to rotate, to guarantee the etching homogeneity of every workpiece 510.Remaining technique Gas and process gas react the product generated with workpiece 510 and are excluded by exhaust outlet 116 to outside process cavity 110.Gas phase is carved After etching technique, open valve 310, take workpiece 510 away from small chuck 214, take the process of workpiece 510 as follows: rotation is big Chuck 212 makes one group of through-hole 213 of big chuck 212 and small chuck 214 corresponding with this group of through-hole 213 be located at three pillars 216 top, the second driving device 224 is drivingly connected plate 219 and declines along screw rod 223, to drive big chuck 212 in process cavity Decline in body 110, three pillars 216 are contained in this group of through-hole 213 of big chuck 212 and corresponding small with this group of through-hole 213 In the perforation 215 of chuck 214, three pillars 216 are stretched out from the perforation 215 of small chuck 214, and three pillars 216 are by small chuck The jack-up of workpiece 510 in 214 leaves small chuck 214, and workpiece 510 is taken away from three pillars 216.Then, the second driving device 224 are drivingly connected plate 219 rises along screw rod 223, so that big chuck 212 be driven to rise to three pillars in process cavity 110 216 top, spaced apart between the bottom of big chuck 212 and the top of three pillars 216, first driving device 218 It drives vacuum rotary feedthroughs 217 and support shaft 211 to rotate, so that big chuck 212 be driven to rotate, makes the of big chuck 212 Two groups of through-holes 213 and small chuck 214 corresponding with this group of through-hole 213 are located at the top of three pillars 216, the second driving device 224 are drivingly connected plate 219 declines along screw rod 223, so that big chuck 212 is driven to decline in process cavity 110, three pillars 216 are contained in the perforation 215 of second group of through-hole 213 of big chuck 212 and small chuck 214 corresponding with this group of through-hole 213, Three pillars 216 are stretched out from the perforation 215 of small chuck 214, three pillars 216 by the workpiece 510 in small chuck 214 jack up from Small chuck 214 is opened, workpiece 510 is taken away from three pillars 216.And so on, by the workpiece 510 in all small chucks 214 by One takes away.When needing to handle various sizes of workpiece 510, small chuck 214 corresponding with 510 size of workpiece need to be only changed. In order to avoid process gas etching technics cavity 110 and Workpiece carrier mechanism 210, in process cavity 110 and Workpiece carrier mechanism 210 surfaces that contact with process gas coat one layer of erosion-resisting coating, such as: oxide layer, ceramics, Teflon, silicon carbide or Silicon nitride etc..
According to different process requirements, can process cavity 110 111, two pairs of side walls 112 of roof and bottom wall 113 with And temperature control equipment (not shown) is set in big chuck 212, spray head 410, it can also be in the roof of process cavity 110 Several halogen lamp of 111 installations or infrared lamp (not shown), after gas phase etching technics, to pass through for assisting heating Halogen lamp or infrared 510 surface of light irradiation workpiece, 510 surface temperature of workpiece increase rapidly, react process gas with workpiece 510 What is generated is product evaporated, and is excluded by exhaust outlet 116 to outside process cavity 110.
Refering to Fig. 6, the schematic diagram of the another embodiment of big chuck is disclosed.In this embodiment, big 212 ' bottom of chuck The shape of the through-hole 213 ' opened up be it is arc-shaped, the center of circle of circular arc is consistent with the center of circle of big chuck 212 '.By by through-hole 213 ' It designs in the arc-shaped, workpiece is loaded or during taking workpiece away, even if through-hole 213 ' and pillar are not aligned completely, slightly partially Difference, pillar remain to insertion through-hole 213 '.Obviously, other than round and arc-shaped, through-hole can also have other shapes.
Refering to Fig. 7, the schematic diagram of the section structure of the second embodiment of Work treatment installation of the present invention is disclosed.It is real with first It applies example to compare, the difference of second embodiment is: being provided with supporting plate 610, supporting plate 610 below the bottom wall 113 of process cavity 110 It is parallel with the bottom wall 113 of process cavity 110, the bottom end of each pillar 216 be each passed through the bottom wall 113 of process cavity 110 and with support Plate 610 is fixedly connected, by supporting plate 610 support pillar 216, each pillar 216 pass through 110 bottom wall 113 of process cavity one end by Elastic sealing element 710 surrounds, and one end of elastic sealing element 710 is fixedly connected with the bottom wall 113 of process cavity 110, elastic packing The other end of part 710 is fixedly connected with supporting plate 610, and third driving device (not shown) is connect with supporting plate 610, third driving dress Driving supporting plate 610 is set to rise or fall, so that pillar 216 is driven to rise or fall in process cavity 110, third driving device Motor or cylinder can be selected.Other than aforementioned difference, the other structures of second embodiment are and shown in first embodiment Counter structure is identical, and details are not described herein.
It still illustrates how to handle workpiece 510 using the Work treatment installation by taking gas phase etching technics as an example.Firstly, according to The size and shape of workpiece 510 to be processed select corresponding small chuck 214, and small chuck 214 is placed in big chuck 212.So Afterwards, workpiece 510 is loaded into small chuck 214, third driving device drives supporting plate 610 to rise, to drive pillar 216 in technique Rise in cavity 110, pillar 216 is contained in the one group of through-hole 213 and lesser calorie corresponding with this group of through-hole 213 of big chuck 212 In the perforation 215 of disk 214, pillar 216 is stretched out from the perforation 215 of small chuck 214, opens valve 310, and workpiece 510 is from workpiece Enter process cavity 110 at entrance 114 and be placed on pillar 216, is held up by pillar 216.The driving of third driving device Supporting plate 610 declines, to drive pillar 216 to drop to the lower section of big 212 bottom of chuck in process cavity 110, on pillar 216 Workpiece 510 fall into small chuck 214, so that the workpiece for completing first small chuck 214 loads.Make the bottom of big chuck 212 It is spaced apart between the top of pillar 216, to guarantee that big chuck 212 does not occur to do in rotary course with pillar 216 It relates to.Then, first driving device 218 drives vacuum rotary feedthroughs 217 and support shaft 211 to rotate, to drive big chuck 212 rotations, make second group of through-hole 213 of big chuck 212 and second small chuck 214 be located at the top of pillar 216.Third driving Device drives supporting plate 610 to rise, so that pillar 216 be driven to rise in process cavity 110, pillar 216 is contained in big chuck 212 Second group of through-hole 213 and second small chuck 214 corresponding with this group of through-hole 213 perforation 215 in, pillar 216 is from It is stretched out in the perforation 215 of two small chuck 214, workpiece 510 enters process cavity 110 and is placed from workpiece entrance 114 On pillar 216, held up by pillar 216.Third driving device drives supporting plate 610 to decline, to drive pillar 216 in process cavity The lower section of big 212 bottom of chuck is dropped in body 110, the workpiece 510 on pillar 216 is fallen into second small chuck 214, thus The workpiece for completing second small chuck 214 loads.And so on, complete the workpiece dress of all small chucks 214 in big chuck 212 It carries.Then, valve 310 is closed, between can adjusting between big chuck 212 and spray head 410 by the second driving device 224 Away to reach optimised process position.Process gas enters process cavity 110 via air inlet 115 and spray head 410, and first drives Dynamic device 218 drives big chuck 212 to rotate, to guarantee the etching homogeneity of every workpiece 510.Remaining process gas and technique Gas reacts the product generated with workpiece 510 and is excluded by exhaust outlet 116 to outside process cavity 110.Gas phase etching technics terminates Afterwards, valve 310 is opened, workpiece 510 is taken away from small chuck 214, takes the process of workpiece 510 as follows: rotating big chuck 212, make The one group of through-hole 213 and small chuck 214 corresponding with this group of through-hole 213 of big chuck 212 are located at the top of pillar 216, third Driving device drives supporting plate 610 to rise, so that pillar 216 be driven to rise in process cavity 110, pillar 216 is contained in kilocalorie In the perforation 215 of this group of through-hole 213 of disk 212 and small chuck 214 corresponding with this group of through-hole 213, pillar 216 is from small chuck It is stretched out in 214 perforation 215, the jack-up of workpiece 510 in small chuck 214 is left small chuck 214 by pillar 216, and workpiece 510 is from branch It is taken away on column 216.Then, third driving device driving supporting plate 610 decline, thus drive pillar 216 in process cavity 110 under It is down to the lower section of big 212 bottom of chuck, spaced apart between the bottom of big chuck 212 and the top of pillar 216, first drives Dynamic device 218 drives vacuum rotary feedthroughs 217 and support shaft 211 to rotate, so that big chuck 212 be driven to rotate, makes kilocalorie Second group of through-hole 213 of disk 212 and small chuck 214 corresponding with this group of through-hole 213 are located at the top of pillar 216, and third is driven Dynamic device driving supporting plate 610 rises, so that pillar 216 be driven to rise in process cavity 110, pillar 216 is contained in big chuck In the perforation 215 of 212 second group of through-hole 213 and small chuck 214 corresponding with this group of through-hole 213, pillar 216 is from small chuck It is stretched out in 214 perforation 215, the jack-up of workpiece 510 in small chuck 214 is left small chuck 214 by pillar 216, and workpiece 510 is from branch It is taken away on column 216.And so on, the workpiece 510 in all small chucks 214 is taken away one by one.It is various sizes of when needing to handle When workpiece 510, small chuck 214 corresponding with 510 size of workpiece need to be only changed.
Refering to Fig. 8, the schematic diagram of the section structure of the 3rd embodiment of Work treatment installation of the present invention is disclosed.It is real with second It applies example to compare, the present embodiment can be considered as a kind of simplification of second embodiment, in the present embodiment, eliminate vacuum sealing biography Dynamic device, connecting plate, scalable cutting ferrule, fixing axle, loading plate, screw rod and the second driving device, remaining structure are real with second It is identical to apply counter structure shown in example.In the present embodiment, the spacing between big chuck 212 and spray head 410 is in technique mistake It is unable to adjust in journey.
Refering to Fig. 9, the structural schematic diagram of the another embodiment of the small chuck of Work treatment installation of the present invention is disclosed.Lesser calorie Disk 214 " has chuck main body 2141 ", if the top of chuck main body 2141 " offers several accommodating chambers 2142 " downwards to accommodate Dry workpiece, the size and shape of the accommodating chamber 2142 " of small chuck 214 " and the size and shape of workpiece are consistent.Small chuck 214 " is received It is dissolved in the accommodation space of big chuck.The chuck main body 2141 " of small chuck 214 " offers several groups perforation 215 ", every group of perforation 215 " respectively one group of through-hole corresponding with an accommodating chamber 2142 " of small chuck and big chuck be connected to, one group of pillar can be contained in In the perforation 215 " of the one group of through-hole and small chuck 214 " corresponding with this group of through-hole of big chuck, to pick and place workpiece.Work as needs When handling various sizes of workpiece, small chuck 214 " corresponding with workpiece size need to be only changed.
Refering to fig. 10, disclose the schematic diagram of the section structure of the fourth embodiment of Work treatment installation of the present invention.With second Embodiment is compared, difference in this case is that, the Workpiece carrier mechanism in the present embodiment includes several groups pillar 216, each Group pillar 216 can be contained in the perforation of one group of through-hole and small chuck 214 " corresponding with this group of through-hole of big chuck 212, often The bottom end of one group of pillar 216 is connected with each other by connector, and the top of each group of pillar 216 is formed with convex edge, each group of pillar 216 top can be fastened in the through-hole of big chuck 212.The bottom end of one stud 611 is fixedly connected with supporting plate 610, the stud 611 Top pass through the bottom wall of process cavity and connector can be supported, and then one group of pillar 216 can be jacked up, to pick and place workpiece.It loads When workpiece, first driving device 218 drives vacuum rotary feedthroughs 217 and support shaft 211 to rotate, to drive big chuck 212 rotations, make the connector of one group of pillar 216 be located at the top of stud 611.Third driving device drives supporting plate 610 to rise, from And drive stud 611 to rise in process cavity 110 and support connector, and then jack up one group of pillar 216, make this group of pillar 216 stretch out from the perforation of small chuck 214 ", and workpiece is placed on pillar 216, are held up by pillar 216.Then, third drives Device drives supporting plate 610 to decline, to drive stud 611 to decline in process cavity 110 until stud 611 and connector point From this group of pillar 216 falls, and the workpiece on pillar 216 is fallen into small chuck 214 ", and the top of this group of pillar 216 is fastened on greatly In the through-hole of chuck 212, this group of pillar 216 is suspended on the lower section of big chuck 212, to complete the loading of unit one.So Afterwards, first driving device 218 drives vacuum rotary feedthroughs 217 and support shaft 211 to rotate, so that big chuck 212 be driven to revolve Turn, the dress of second workpiece is completed in the same way in the top for making the connector of second group of pillar 216 be located at stud 611 It carries.And so on, complete the loading of all workpiece.When taking workpiece, big chuck 212 is rotated, makes the connector position of one group of pillar 216 In the top of stud 611, third driving device drive supporting plate 610 rise, thus drive stud 611 in process cavity 110 on Connector is risen and supported, and then jacks up one group of pillar 216, stretches out this group of pillar 216 from the perforation of small chuck 214 ", pillar Workpiece jack-up in small 214 " accommodating chamber of chuck is left small chuck 214 " by 216, and workpiece is taken away from pillar 216.Then, third Driving device drives supporting plate 610 to decline, to drive stud 611 to decline in process cavity 110 until stud 611 and connector Separation, this group of pillar 216 fall, and the top of this group of pillar 216 is fastened in the through-hole of big chuck 212, this group of pillar 216 is hung In the lower section of big chuck 212.Then, first driving device 218 drives vacuum rotary feedthroughs 217 and support shaft 211 to rotate, To drive big chuck 212 to rotate, so that the connector of second group of pillar 216 is located at the top of stud 611, pass through identical side Formula completes the unloading of second workpiece.And so on, complete the unloading of all workpiece.
It can be seen from the above, the present invention is by configuring several small chucks with accommodating chamber, when need to handle have it is identical or When the workpiece of different size and shapes, the small chuck of the accommodating chamber with corresponding size and shape need to be only selected, and by small chuck It is placed in the accommodation space of big chuck, without replacing entire big chuck, therefore, and compared with the prior device, workpiece of the present invention Processing unit (plant) is more convenient in use, more flexible, and Work treatment installation structure of the present invention is simple, can handle multi-disc work simultaneously Part improves work pieces process efficiency, reduces work pieces process cost.
In conclusion the present invention is illustrated by above embodiment and correlative type, oneself is specific, full and accurate to disclose correlation Technology implements those skilled in the art accordingly.And embodiment described above is used only to illustrate the present invention, rather than Interest field of the invention for limiting, of the invention should be defined by claim of the invention.As for member described herein The change of number of packages purpose or the replacement of equivalence element etc. still all should belong to interest field of the invention.

Claims (2)

1. a kind of Work treatment installation characterized by comprising process cavity and Workpiece carrier mechanism, the Workpiece carrier machine Structure includes:
Big chuck, the big chuck are contained in process cavity, and big chuck has bottom and the side wall to be formed that raises upward along bottom, The bottom of big chuck and side wall surround accommodation space, and the bottom of big chuck offers the through-hole that several groups run through kilocalorie pan bottom;
Small chuck, the small chuck are contained in the accommodation space of big chuck, and small chuck has chuck main body, the top of chuck main body Offer several accommodating chambers downwards to accommodate several workpiece, the chuck main body of small chuck offers several groups perforation, every group of perforation One group of through-hole connection corresponding with an accommodating chamber of small chuck and big chuck, small chuck can be replaced with the size with workpiece respectively It is adapted;And
Several groups pillar, each group of pillar can be contained in the one group of through-hole and corresponding with this group of through-hole small chuck of big chuck In perforation, to pick and place workpiece, the bottom end of each group of pillar is connected with each other by connector, and the top of each group of pillar is formed with convex The top on edge, each group of pillar can be fastened in the through-hole of big chuck;
Supporting plate, the bottom wall that the supporting plate is arranged in below the bottom wall of process cavity and with process cavity is parallel, supporting plate and process cavity The bottom wall of body is tightly connected, and the bottom end of a stud is fixedly connected with supporting plate, and the top of the stud passes through the bottom wall of process cavity simultaneously Connector can be supported, and then one group of pillar can be jacked up, to pick and place workpiece.
2. Work treatment installation according to claim 1, which is characterized in that the size and shape of the accommodating chamber of the small chuck Shape is consistent with the size and shape of workpiece.
CN201310553969.7A 2013-11-08 2013-11-08 Work treatment installation Active CN104637858B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201310553969.7A CN104637858B (en) 2013-11-08 2013-11-08 Work treatment installation

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201310553969.7A CN104637858B (en) 2013-11-08 2013-11-08 Work treatment installation

Publications (2)

Publication Number Publication Date
CN104637858A CN104637858A (en) 2015-05-20
CN104637858B true CN104637858B (en) 2019-04-12

Family

ID=53216444

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201310553969.7A Active CN104637858B (en) 2013-11-08 2013-11-08 Work treatment installation

Country Status (1)

Country Link
CN (1) CN104637858B (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US10777442B2 (en) * 2016-11-18 2020-09-15 Applied Materials, Inc. Hybrid substrate carrier

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1909182A (en) * 2005-08-05 2007-02-07 中微半导体设备(上海)有限公司 Semiconductor technology processing system and method
JP4680657B2 (en) * 2005-04-08 2011-05-11 株式会社アルバック Substrate transfer system
CN102439710A (en) * 2010-03-25 2012-05-02 应用材料公司 Segmented substrate loading for multiple substrate processing

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7750818B2 (en) * 2006-11-29 2010-07-06 Adp Engineering Co., Ltd. System and method for introducing a substrate into a process chamber

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4680657B2 (en) * 2005-04-08 2011-05-11 株式会社アルバック Substrate transfer system
CN1909182A (en) * 2005-08-05 2007-02-07 中微半导体设备(上海)有限公司 Semiconductor technology processing system and method
CN102439710A (en) * 2010-03-25 2012-05-02 应用材料公司 Segmented substrate loading for multiple substrate processing

Also Published As

Publication number Publication date
CN104637858A (en) 2015-05-20

Similar Documents

Publication Publication Date Title
JP5844681B2 (en) Substrate liquid processing apparatus and substrate liquid processing method
CN105580126B (en) Substrate board treatment
CN204991662U (en) Fluid process treatment device
CN107958864A (en) Substrate board treatment and substrate processing method using same
US20150243490A1 (en) Substrate processing apparatus and substrate processing method
CN105990197A (en) Substrate processing apparatus
CN102110634B (en) Rotary heating adsorption device
CN101246812A (en) Substrate processing apparatus
CN105659373A (en) Substrate carrier apparatus
CN104637858B (en) Work treatment installation
CN107240566A (en) Liquid processing device
CN104637857B (en) Work treatment installation
US20190057884A1 (en) Cleaning liquid supply unit, substrate treating apparatus including the same, and substrate treating method
CN104637856B (en) Work treatment installation
CN106796871A (en) Cellular multizone gas distribution plate
CN208767258U (en) Base plate transfer device
US20020139400A1 (en) Vertical process reactor
CN112071784B (en) Apparatus and method for processing substrate
KR102229786B1 (en) Apparatus and method for treating a substrate
KR20100056795A (en) A robot for transferring wafer
CN109423628B (en) Disposable full-surface vapor deposition support, vapor deposition furnace and deposition method thereof
US10304687B2 (en) Substrate treating apparatus and substrate treating method
JP6095750B2 (en) Substrate liquid processing apparatus and substrate liquid processing method
KR101736853B1 (en) method and Apparatus for Processing Substrate
CN108470704A (en) Pass sheet chamber room and semiconductor processing equipment

Legal Events

Date Code Title Description
C06 Publication
PB01 Publication
C10 Entry into substantive examination
SE01 Entry into force of request for substantive examination
GR01 Patent grant
GR01 Patent grant
CP03 Change of name, title or address

Address after: 201203 building 4, No. 1690, Cailun Road, free trade zone, Pudong New Area, Shanghai

Patentee after: Shengmei semiconductor equipment (Shanghai) Co., Ltd

Address before: 201203 Shanghai Zhangjiang High Tech Park of Pudong New Area Cailun Road No. fourth 1690

Patentee before: ACM (SHANGHAI) Inc.

CP03 Change of name, title or address