CN104597342A - Lattice structure testing machine multi-position single type multi-step testing method - Google Patents
Lattice structure testing machine multi-position single type multi-step testing method Download PDFInfo
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- CN104597342A CN104597342A CN201510003030.2A CN201510003030A CN104597342A CN 104597342 A CN104597342 A CN 104597342A CN 201510003030 A CN201510003030 A CN 201510003030A CN 104597342 A CN104597342 A CN 104597342A
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Abstract
The invention discloses a lattice structure testing machine multi-position single type multi-step testing method. The method comprises a lattice structure tester to be detected and a lattice structure of a section, a paragraph to be detected while the lattice structure detection the number is more than one, to be detected in a section of the lattice structure made of a plurality of sub-stations in several steps of production, to be detected in a section of the lattice structure is divided into several parts, each part by different workers bit production and insert lattice structure alone tester to complete the test, this test method to start the lattice structure, the lattice structure testing machines perform a test, complete the test measured the lattice structure, and the output of the test results and to remind new test round lattice structure. The invention uses intelligent software to identify and determine the system, based on a combination of lattice structure configuration, lattice structures, and call the appropriate test procedures require comparison test, the test quickly, low cost, foolproof, error prevention, warning and General Motors and other outstanding features.
Description
Technical field
The present invention relates to a kind of fireworks production test instrument, be specifically related to lattice structure body examination test-run a machine multistation monotype multi-step method of testing.
Background technology
Lattice structure body is the key components and parts realizing figure line fireworks, the display determining fireworks can accomplish the effect of user's request, also be that decision figure line fireworks can miniaturization, the critical component of integration, the volume of lattice structure body, dot matrix dense degree, shaping efficiency, the step of production cost and aft-loaded airfoil process all seriously constrains the holistic cost of figure line fireworks, security, reliability and production efficiency, lattice structure body needs precision die, precise forming, a large amount of accurate aftertreatment machining tool, quality testing instrument, shaping tool, tools for loading and anti-error, blast protection measure etc., the core component of figure line fireworks needs a large amount of inter-trade new and high technology supports across technical field and original daring to blaze new trails, the spirit that dare to test, existing every profession and trade lacks corresponding technical support, the data that particularly industry fireworks technical field can be for reference is so tragic that one cannot bear to look at it, need oneself to go developing everywhere.
Summary of the invention
The object of the invention is to the above problem overcoming prior art existence, lattice structure body examination test-run a machine multistation monotype multi-step method of testing is provided, the present invention utilizes software identification and intellectual determination system, combination according to lattice structure body configures, contrast needs the lattice structure body of test and calls corresponding test procedure, rapidly, cost is low in test, has fool proof, mistake proofing, warning and the remarkable function such as general.
For realizing above-mentioned technical purpose, reach above-mentioned technique effect, the present invention is achieved through the following technical solutions:
Lattice structure body examination test-run a machine multistation monotype multi-step method of testing, comprise lattice structure body examination test-run a machine (1) and certain lattice structure body (2) to be detected, detecting number while described certain lattice structure body (2) to be detected is more than one, described certain lattice structure body (2) to be detected completes production by multiple station point multiple step, described certain lattice structure body (2) to be detected is divided into several part, each several part is produced by different stations respectively and is inserted dot matrix structure test machine (1) and completes test separately, start multistation monotype multi-step lattice structure body examination method for testing, lattice structure body examination test-run a machine performs a series of testing procedure, complete the test of dot matrix structure to be measured, and output test result and remind the test carrying out new round lattice structure body.
Further, what whether what lattice structure body examination test-run a machine (1) was arranged can identify certain lattice structure body (2) to be detected was qualified automatically performs step, and step is as follows:
Certain lattice structure body (2), according to the structure of certain lattice structure body (2), is divided into multiple cell mesh by step 1), is produced respectively by multiple direct labor at different production stations substep;
Step 2) described direct labor produces certain cell mesh of certain lattice structure body (2) at the production station of oneself, after its cell mesh produced, this cell mesh of lattice structure body is connected with lattice structure body examination test-run a machine (1), and complete separately the lattice structure body examination examination of this part, certain lattice structure body (2) certified products that part completes are flowed into next station, completes follow-up lattice structure body unit part by Manufacturing Worker below.
The employee of the next station of step 3) repeats the action of step 2, until all cell mesh all complete test, certified products is put into certified products district, unacceptable product is put into NonConforming Parts Area.
Step 4) lattice structure body examination test-run a machine (1) completes certain qualified lattice structure body (2) production test of defined amount, closes lattice structure body examination test-run a machine (1), completed product run task.
Further, described step 2) also comprise the following steps: that the cell mesh of certain lattice structure body (2) to be detected that oneself is responsible for by the employee of this operation position of step 1) to be completed with lattice structure body examination test-run a machine (1) by bay insertion groove (3) and be connected;
Step 2) lattice structure body examination test-run a machine (1) startup intelligent test processing module;
Step 3) intelligent test processing module exports test signal by bay insertion groove (3);
Step 4) test signal is transmitted by the cell mesh of certain lattice structure body (2) to be detected;
Step 5) lattice structure body examination test-run a machine (1) receives the test signal by certain lattice structure body (2) cell mesh transmission to be detected;
The analysis of step 6) intelligent test processing module judges the test signal of dot matrix structure cell mesh;
Step 7) lattice structure body examination test-run a machine (1) exports the test result of certain lattice structure body (2) cell mesh;
The test result of step 8) money lattice structure body (2) cell mesh is qualified, lattice structure body examination test-run a machine (1) reminds the employee of this operation position that the lattice structure body all do not completed is flowed into next process, the test result of certain lattice structure body (2) cell mesh is underproof, and lattice structure body examination test-run a machine (1) reminds the employee of this operation position to remove certain lattice structure body (2) underproof;
Step 9) repeats the operation of step 1 to step 8, until all cell mesh of certain lattice structure body (2) all complete, all pass through test, and test result is qualified, intelligent testing machine (1) reminds Manufacturing Worker to be removed from intelligent testing machine (1) by certain qualified lattice structure body (2);
Step 10) Manufacturing Worker removes upper certain the qualified lattice structure body (2) of lattice structure body examination test-run a machine (1), restarts the operation of step 1 to step 9, and continual certain lattice structure body (2) carrying out a new round is produced and loop test.
Further, described step 1) is line production, certain cell mesh that the employee of operation position completes single certain lattice structure body (2) to be detected at the station of oneself connects, the employee of other operation positions completes again new single certain another certain cell mesh of lattice structure body (2) to be detected at another station and connects, and so analogizes.
Further, described step 1) is parallel pipelining process operation, the employee of operation position completes many certain lattice structure body (2) certain cell mesh to be detected at the first station and connects, and allows many certain certain cell mesh of lattice structure body to be detected detect simultaneously.
Further, the employee of this operation position, according to the prompting of lattice structure body examination test-run a machine (1) in step 7), removes lattice structure body examination test-run a machine (1) detected by the employee of step 8) operation position and is judged as that underproof lattice structure body puts into NonConforming Parts Area.
The invention has the beneficial effects as follows:
The present invention utilizes software identification and intellectual determination system, and the combination according to lattice structure body configures, and contrast needs the lattice structure body of test and calls corresponding test procedure, and rapidly, cost is low in test, has fool proof, mistake proofing, warning and the remarkable function such as general.
Above-mentioned explanation is only the general introduction of technical solution of the present invention, in order to better understand technological means of the present invention, and can be implemented according to the content of instructions, coordinates accompanying drawing to be described in detail as follows below with preferred embodiment of the present invention.The specific embodiment of the present invention is provided in detail by following examples and accompanying drawing thereof.
Accompanying drawing explanation
Accompanying drawing described herein is used to provide a further understanding of the present invention, and form a application's part, schematic description and description of the present invention, for explaining the present invention, does not form inappropriate limitation of the present invention.In the accompanying drawings:
Fig. 1 is the axle side schematic diagram of a kind of embodiment of the present invention;
Fig. 2 is the axle side schematic diagram of a kind of embodiment of the present invention;
Fig. 3 is the lattice structure body design diagram of a kind of embodiment of the present invention;
Fig. 4 is the lattice structure body sample schematic diagram of a kind of embodiment of the present invention.
Number in the figure illustrates: 1, lattice structure body examination test-run a machine, 2, batch standard dot matrix structure qualified samples to be logged, 3, bay insertion groove, 4, lattice structure body function switches servicing unit, 5, first end winding displacement installs plug, and the 6, second end winding displacement installs plug, and 7, lattice structure body winding displacement group.
Embodiment
Below with reference to the accompanying drawings and in conjunction with the embodiments, describe the present invention in detail.
Shown in Fig. 1-Fig. 4, lattice structure body examination test-run a machine multistation monotype multi-step method of testing, comprise lattice structure body examination test-run a machine 1 and certain lattice structure body 2 to be detected, detecting number while described certain lattice structure body 2 to be detected is more than one, described certain lattice structure body 2 to be detected completes production by multiple station point multiple step, described certain lattice structure body 2 to be detected is divided into several part, each several part is produced by different stations respectively and is inserted dot matrix structure test machine 1 and completes test separately, start multistation monotype multi-step lattice structure body examination method for testing, lattice structure body examination test-run a machine performs a series of testing procedure, complete the test of dot matrix structure to be measured, and output test result and remind the test carrying out new round lattice structure body.
Further, lattice structure body examination test-run a machine 1 arrange can identify certain lattice structure body 2 to be detected whether qualified automatically perform step, step is as follows:
Certain lattice structure body 2, according to the structure of certain lattice structure body 2, is divided into multiple cell mesh by step 1, is produced respectively by multiple direct labor at different production stations substep;
Direct labor described in step 2 produces certain cell mesh of certain lattice structure body 2 at the production station of oneself, after its cell mesh produced, this cell mesh of lattice structure body is connected with lattice structure body examination test-run a machine 1, and complete separately the lattice structure body examination examination of this part, certain lattice structure body 2-in-1 lattice product that part completes are flowed into next station, completes follow-up lattice structure body unit part by Manufacturing Worker below.
The employee of the next station of step 3 repeats the action of step 2, until all cell mesh all complete test, certified products is put into certified products district, unacceptable product is put into NonConforming Parts Area.
Step 4 lattice structure body examination test-run a machine 1 completes certain qualified lattice structure body 2 production test of defined amount, closes lattice structure body examination test-run a machine 1, completed product run task.
Further, described step 2 also comprises the following steps: that the cell mesh of certain lattice structure body 2 to be detected that oneself is responsible for by the employee of this operation position of step 1 to be completed with lattice structure body examination test-run a machine 1 by bay insertion groove 3 and is connected;
Step 2 lattice structure body examination test-run a machine 1 starts intelligent test processing module;
Step 3 intelligent test processing module exports test signal by bay insertion groove 3;
Step 4 test signal is transmitted by the cell mesh of certain lattice structure body 2 to be detected;
Step 5 lattice structure body examination test-run a machine 1 receives the test signal by certain lattice structure body 2 cell mesh transmission to be detected;
The analysis of step 6 intelligent test processing module judges the test signal of dot matrix structure cell mesh;
Step 7 lattice structure body examination test-run a machine 1 exports the test result of certain lattice structure body 2 cell mesh;
The test result of certain lattice structure body 2 cell mesh of step 8 is qualified, lattice structure body examination test-run a machine 1 reminds the employee of this operation position that the lattice structure body all do not completed is flowed into next process, the test result of certain lattice structure body 2 cell mesh is underproof, and lattice structure body examination test-run a machine 1 reminds the employee of this operation position to remove certain lattice structure body 2 underproof;
Step 9 repeats the operation of step 1 to step 8, until all cell mesh of certain lattice structure body 2 all complete, all pass through test, and test result is qualified, intelligent testing machine 1 reminds Manufacturing Worker to be removed from intelligent testing machine 1 by certain qualified lattice structure body 2;
Step 10 Manufacturing Worker removes certain lattice structure body 2 qualified on lattice structure body examination test-run a machine 1, restarts the operation of step 1 to step 9, and continual certain lattice structure body 2 carrying out a new round is produced and loop test.
Further, described step 1 is line production, certain cell mesh that the employee of operation position completes single certain lattice structure body 2 to be detected at the station of oneself connects, the employee of other operation positions completes again new single another certain cell mesh of certain lattice structure body 2 to be detected at another station and connects, and so analogizes.
Further, described step 1 is parallel pipelining process operation, and the employee of operation position completes many certain certain cell mesh of lattice structure body 2 to be detected at the first station and connects, and allows many certain certain cell mesh of lattice structure body to be detected detect simultaneously.
Further, the employee of this operation position, according to the prompting of lattice structure body examination test-run a machine 1 in step 7, removes lattice structure body examination test-run a machine 1 detected by the employee of step 8 operation position and is judged as that underproof lattice structure body puts into NonConforming Parts Area.
The principle of work of the present embodiment is as follows:
According to the structure of certain lattice structure body 2, certain lattice structure body 2 is divided into multiple cell mesh, produced at different production stations substep by multiple direct labor respectively, direct labor produces certain cell mesh of certain lattice structure body 2 at the production station of oneself, after its cell mesh produced, the cell mesh of certain lattice structure body 2 to be detected that oneself is responsible for by the employee of this operation position to be completed with lattice structure body examination test-run a machine 1 by bay insertion groove 3 and is connected, lattice structure body examination test-run a machine 1 starts intelligent test processing module, intelligent test processing module exports test signal by bay insertion groove 3, test signal is transmitted by the cell mesh of certain lattice structure body 2 to be detected, lattice structure body examination test-run a machine 1 receives the test signal by certain lattice structure body 2 cell mesh transmission to be detected, the analysis of intelligent test processing module judges the test signal of dot matrix structure cell mesh, lattice structure body examination test-run a machine 1 exports the test result of certain lattice structure body 2 cell mesh, the test result of certain lattice structure body 2 cell mesh is qualified, lattice structure body examination test-run a machine 1 reminds the employee of this operation position that the lattice structure body all do not completed is flowed into next process, repeat above operation, until all cell mesh of certain lattice structure body 2 all complete, all pass through test, and test result is qualified, intelligent testing machine 1 reminds Manufacturing Worker to be removed from intelligent testing machine 1 by certain qualified lattice structure body 2, and certified products are put into certified products district, then continual certain lattice structure body 2 carrying out a new round is produced and loop test, in the link of any production test, the test result of certain lattice structure body 2 cell mesh is underproof, lattice structure body examination test-run a machine 1 reminds the employee of this operation position to remove certain lattice structure body 2 underproof, unacceptable product is put into NonConforming Parts Area, lattice structure body examination test-run a machine 1 completes certain qualified lattice structure body 2 production test of defined amount, close lattice structure body examination test-run a machine 1, completed product run task., the data that lattice structure body examination test-run a machine 1 Automatically invoked is relevant and program are tested automatically, and save time, save trouble, cost-saving, accuracy is reliable.
The foregoing is only the preferred embodiments of the present invention, be not limited to the present invention, for a person skilled in the art, the present invention can have various modifications and variations.Within the spirit and principles in the present invention all, any amendment done, equivalent replacement, improvement etc., all should be included within protection scope of the present invention.
Claims (6)
1. lattice structure body examination test-run a machine multistation monotype multi-step method of testing, it is characterized in that: comprise lattice structure body examination test-run a machine (1) and certain lattice structure body (2) to be detected, detecting number while described certain lattice structure body (2) to be detected is more than one, described certain lattice structure body (2) to be detected completes production by multiple station point multiple step, described certain lattice structure body (2) to be detected is divided into several part, each several part is produced by different stations respectively and is inserted dot matrix structure test machine (1) and completes test separately, start multistation monotype multi-step lattice structure body examination method for testing, lattice structure body examination test-run a machine performs a series of testing procedure, complete the test of dot matrix structure to be measured, and output test result and remind the test carrying out new round lattice structure body.
2. lattice structure body examination test-run a machine multistation monotype multi-step method of testing according to claim 1, it is characterized in that: what whether what lattice structure body examination test-run a machine (1) was arranged can identify certain lattice structure body (2) to be detected was qualified automatically performs step, and step is as follows:
Certain lattice structure body (2), according to the structure of certain lattice structure body (2), is divided into multiple cell mesh by step 1), is produced respectively by multiple direct labor at different production stations substep;
Step 2) described direct labor produces certain cell mesh of certain lattice structure body (2) at the production station of oneself, after its cell mesh produced, this cell mesh of lattice structure body is connected with lattice structure body examination test-run a machine (1), and complete separately the lattice structure body examination examination of this part, certain lattice structure body (2) certified products that part completes are flowed into next station, completes follow-up lattice structure body unit part by Manufacturing Worker below;
The employee of the next station of step 3) repeats the action of step 2, until all cell mesh all complete test, certified products is put into certified products district, unacceptable product is put into NonConforming Parts Area;
Step 4) lattice structure body examination test-run a machine (1) completes certain qualified lattice structure body (2) production test of defined amount, closes lattice structure body examination test-run a machine (1), completed product run task.
3. lattice structure body examination test-run a machine multistation monotype multi-step method of testing according to claim 2, is characterized in that: described step 2) also comprise the following steps: that the cell mesh of certain lattice structure body (2) to be detected that oneself is responsible for by the employee of this operation position of step 1) to be completed with lattice structure body examination test-run a machine (1) by bay insertion groove (3) and be connected;
Step 2) lattice structure body examination test-run a machine (1) startup intelligent test processing module;
Step 3) intelligent test processing module exports test signal by bay insertion groove (3);
Step 4) test signal is transmitted by the cell mesh of certain lattice structure body (2) to be detected;
Step 5) lattice structure body examination test-run a machine (1) receives the test signal by certain lattice structure body (2) cell mesh transmission to be detected;
The analysis of step 6) intelligent test processing module judges the test signal of dot matrix structure cell mesh;
Step 7) lattice structure body examination test-run a machine (1) exports the test result of certain lattice structure body (2) cell mesh;
The test result of step 8) money lattice structure body (2) cell mesh is qualified, lattice structure body examination test-run a machine (1) reminds the employee of this operation position that the lattice structure body all do not completed is flowed into next process, the test result of certain lattice structure body (2) cell mesh is underproof, and lattice structure body examination test-run a machine (1) reminds the employee of this operation position to remove certain lattice structure body (2) underproof;
Step 9) repeats the operation of step 1 to step 8, until all cell mesh of certain lattice structure body (2) all complete, all pass through test, and test result is qualified, intelligent testing machine (1) reminds Manufacturing Worker to be removed from intelligent testing machine (1) by certain qualified lattice structure body (2);
Step 10) Manufacturing Worker removes upper certain the qualified lattice structure body (2) of lattice structure body examination test-run a machine (1), restarts the operation of step 1 to step 9, and continual certain lattice structure body (2) carrying out a new round is produced and loop test.
4. lattice structure body examination test-run a machine multistation monotype multi-step method of testing according to claim 3, it is characterized in that: described step 1) is line production, certain cell mesh that the employee of operation position completes single certain lattice structure body (2) to be detected at the station of oneself connects, the employee of other operation positions completes again new single certain another certain cell mesh of lattice structure body (2) to be detected at another station and connects, and so analogizes.
5. lattice structure body examination test-run a machine multistation monotype multi-step method of testing according to claim 2, it is characterized in that: described step 1) is parallel pipelining process operation, the employee of operation position completes many certain lattice structure body (2) certain cell mesh to be detected at the first station and connects, and allows many certain certain cell mesh of lattice structure body to be detected detect simultaneously.
6. lattice structure body examination test-run a machine multistation monotype multi-step method of testing according to claim 2, it is characterized in that: the employee of this operation position, according to the prompting of lattice structure body examination test-run a machine (1) in step 7), removes lattice structure body examination test-run a machine (1) detected by the employee of step 8) operation position and is judged as that underproof lattice structure body puts into NonConforming Parts Area.
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| CN103983884A (en) * | 2014-04-28 | 2014-08-13 | 北京世纪东方国铁科技股份有限公司 | Multi-core cable testing system and method |
| CN204008938U (en) * | 2014-06-13 | 2014-12-10 | 苏州固基电子科技有限公司 | Beam Detector |
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2015
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Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR20110083196A (en) * | 2010-01-14 | 2011-07-20 | 마이크로 인스펙션 주식회사 | Inspection apparatus of touch panel |
| CN202256540U (en) * | 2011-10-25 | 2012-05-30 | 芯通科技（成都）有限公司 | Testing device for cable socket |
| CN103576047A (en) * | 2013-10-08 | 2014-02-12 | 山东英特力光通信开发有限公司 | Cable detector |
| CN103983884A (en) * | 2014-04-28 | 2014-08-13 | 北京世纪东方国铁科技股份有限公司 | Multi-core cable testing system and method |
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Application publication date: 20150506 |