CN104360110B - Blade type probe mounting and clamping system - Google Patents
Blade type probe mounting and clamping system Download PDFInfo
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- CN104360110B CN104360110B CN201410627805.9A CN201410627805A CN104360110B CN 104360110 B CN104360110 B CN 104360110B CN 201410627805 A CN201410627805 A CN 201410627805A CN 104360110 B CN104360110 B CN 104360110B
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- blade type
- type probe
- clamping system
- casket
- spring
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Abstract
The present invention relates to a kind of blade type probe mounting and clamping system, belong to chip-detecting apparatus technical field.The blade type probe mounting and clamping system of the structure includes blade type probe, the blade type probe includes hilt and the probe for being fixed on hilt front end, the system further includes dress casket, the dress casket one end open, the dress casket is internally provided with spring, the hilt of the blade type probe can be inserted in the dress casket by the opening, and supported to set by the spring and be fixed on the inner wall of the dress casket.Employ the blade type probe mounting and clamping system of the invention, due to its by fill the spring in casket by blade type probe support set be fixed on dress casket inner wall on, consequently facilitating the replacement of probe, simplify maintenance process, maintenance cost is reduced, and then improves chip detection efficiency, and it is simple in structure, it is of low cost, the quite extensive blade type probe mounting and clamping system of application range.
Description
Technical field
The present invention relates to chip-detecting apparatus technical field, more particularly to blade type probe technique field, in particular to one kind
Blade type probe mounting and clamping system.
Background technology
In existing chip test probe card, occupy considerable proportion using blade type probe test.Blade type probe card exists
There are following two modes during use:
Mode 1, as shown in Figure 1, being directly welded on blade type probe 1 in printed wiring board 8 by solder 7, adjusts position
Put.Its shortcoming is:Directly by the welding of blade type probe on a printed-wiring board, it is necessary to which special technology carries out tune pin, usually
Make manufacturer's completion in pin blocking, if the position of indivedual blade type probes or level go wrong and need repairing, also or have a knife
Probe needs replacing, it is necessary to depot repair, time and costly.
Mode 2, as shown in Fig. 2, blade type probe 1 to be welded on to the needle stand 9 of tri- axis adjustable apparatus 6 of XYZ by solder 7
On, with the adjusting apparatus carried, the position of metering needle and level, realize test purpose.It is the disadvantage is that, blade type probe is welded
On the adjustable needle stand of tri- axis of XYZ, with the adjusting apparatus carried, can generally there is tester voluntarily to complete, to specialty
Technical requirements are not high., can be by the XYZ tri- that carries if the position of indivedual blade type probes or level go wrong and need repairing
Axis adjustment device is debugged, it is necessary to which needle stand is removed when having the blade type probe to need replacing, is voluntarily welded, then pass through from
Tri- axis adjustment devices of XYZ of band are debugged, and time loss is general.
Which kind of mode no matter is taken, repairs or replaces blade type probe and all more bother, it is time-consuming and laborious, make to utilize blade type probe
Carrying out the efficiency of chip detection reduces.Therefore it provides one kind is convenient for probe replacement, it is possible to increase the knife of chip detection efficiency
Type probe becomes the task of top priority of the technical field.
The content of the invention
The purpose of the present invention is overcome it is above-mentioned in the prior art the shortcomings that, there is provided it is a kind of by being capable of spring leaf geometrical clamp
Blade type probe is filled, consequently facilitating the replacement of probe, simplifies maintenance process, reduces maintenance cost, and then improves chip detection efficiency,
And simple in structure, of low cost, the quite extensive blade type probe mounting and clamping system of application range.
In order to realize above-mentioned purpose, blade type probe mounting and clamping system of the invention has following form:
The blade type probe mounting and clamping system includes blade type probe, before which includes hilt and be fixed on the hilt
The probe at end.The blade type probe mounting and clamping system further includes dress casket, and the dress casket one end open, the dress casket is internally provided with spring, institute
The hilt for the blade type probe stated can be inserted in the dress casket by the opening, and supported to set by the spring and be fixed on the dress
On the inner wall of casket.
In the blade type probe mounting and clamping system, the dress casket is cuboid, and the opening is arranged at cuboid dress casket
Length direction on one end.
In the blade type probe mounting and clamping system, the spring is parallel to each other to be arranged on the cuboid dress casket two
Between inner wall, the compression direction of the spring fills the length direction of casket perpendicular to cuboid.
In the blade type probe mounting and clamping system, the spring is high-strength spring piece, and the high-strength spring piece is close to institute
There is oblique hilt to import position for the position for stating opening.
In the blade type probe mounting and clamping system, which further includes three axle controls devices, three axis
The control device connection dress casket.
The blade type probe mounting and clamping system of the invention is employed, since it is solid to setting by blade type probe by filling the spring in casket
Due on the inner wall of dress casket, consequently facilitating the replacement of probe, simplifies maintenance process, maintenance cost is reduced, and then improve chip inspection
Survey efficiency, and simple in structure, of low cost, the quite extensive blade type probe mounting and clamping system of application range.
Brief description of the drawings
Fig. 1 is a kind of structure diagram of blade type probe fixed form in the prior art.
Fig. 2 is the structure diagram of another blade type probe fixed form in the prior art.
Fig. 3 is the structure diagram of the blade type probe mounting and clamping system of the present invention.
Fig. 4 is dress casket and the signal of blade type probe assembling structure overlook direction of the blade type probe mounting and clamping system of the present invention
Figure.
Fig. 5 is dress casket and the signal of blade type probe assembling structure side-looking direction of the blade type probe mounting and clamping system of the present invention
Figure.
Embodiment
In order to be more clearly understood that the technology contents of the present invention, described in detail especially exemplified by following embodiments.
In one embodiment, as shown in Fig. 3,4,5, which includes blade type probe 1, the blade type
Probe 1 includes hilt 11 and the probe 12 for being fixed on 11 front end of hilt.The blade type probe mounting and clamping system further includes dress casket
2,2 one end open 3 of dress casket, the dress casket 2 is internally provided with spring 4, and the hilt 11 of the blade type probe 1 can be by described
Opening 3 is inserted in the dress casket 2, and is supported to set by the spring 4 and be fixed on the inner wall of the dress casket 2.
In a preferred embodiment, the dress casket 2 is cuboid, and the opening 3 is arranged at cuboid dress casket 2
Length direction on one end.The spring 4 support be arranged on described cuboid dress casket 2 two inner walls being parallel to each other it
Between, the compression direction of the spring 4 fills the length direction of casket 2 perpendicular to cuboid.
In further preferred embodiment, the spring 4 is high-strength spring piece, which exists
Close to the position of the opening 3 there is oblique hilt to import position 5.
In preferred embodiment, which further includes three axle controls devices 6, three axis
Control device 6 connects the dress casket 2 by needle stand 9.
In practical applications, the present invention is to need to be welded on this fixation hand on tri- axis adjustment devices of XYZ by blade type probe
Section is improved, using the means being mechanically fixed, realized on the premise of need not needle stand be removed blade type probe it is quick more
Change, save the time.When needing to replace blade type probe, it is not necessary to carry out complicated time-consuming welding operation, and directly use spring
The mode that piece deformation produces elastic force fixes blade type probe into row position.
The blade type probe mounting and clamping system of the invention is employed, since it is solid to setting by blade type probe by filling the spring in casket
Due on the inner wall of dress casket, consequently facilitating the replacement of probe, simplifies maintenance process, maintenance cost is reduced, and then improve chip inspection
Survey efficiency, and simple in structure, of low cost, the quite extensive blade type probe mounting and clamping system of application range.
In this description, the present invention is described with reference to its specific embodiment.But it is clear that it can still make
Various modifications and alterations are without departing from the spirit and scope of the present invention.Therefore, specification and drawings are considered as illustrative
It is and nonrestrictive.
Claims (3)
1. a kind of blade type probe mounting and clamping system, including blade type probe, which includes hilt and is fixed on the hilt
The probe of front end, it is characterised in that the blade type probe mounting and clamping system further includes dress casket, the dress casket one end open, inside the dress casket
Spring is provided with, the dress casket is cuboid, and the opening is arranged at one end on the length direction of cuboid dress casket,
The spring, which supports, to be arranged between two inner walls being parallel to each other of the cuboid dress casket, and the compression direction of the spring is vertical
In the length direction of cuboid dress casket, the hilt of the blade type probe can be inserted in the dress casket by the opening, and be led to
Cross the spring and support to set and be fixed on the inner wall of the dress casket.
2. blade type probe mounting and clamping system according to claim 1, it is characterised in that the spring is high-strength spring
Piece, the high-strength spring piece close to the position of the opening there is oblique hilt to import position.
3. blade type probe mounting and clamping system according to claim 1 or 2, it is characterised in that the blade type probe mounting and clamping system is also
Including three axle controls devices, three axle controls devices connection dress casket.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201410627805.9A CN104360110B (en) | 2014-11-10 | 2014-11-10 | Blade type probe mounting and clamping system |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201410627805.9A CN104360110B (en) | 2014-11-10 | 2014-11-10 | Blade type probe mounting and clamping system |
Publications (2)
Publication Number | Publication Date |
---|---|
CN104360110A CN104360110A (en) | 2015-02-18 |
CN104360110B true CN104360110B (en) | 2018-05-01 |
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CN201410627805.9A Active CN104360110B (en) | 2014-11-10 | 2014-11-10 | Blade type probe mounting and clamping system |
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Citations (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN2234849Y (en) * | 1995-06-27 | 1996-09-11 | 杨武益 | Box-type automatic reset double shaver |
JP2001343398A (en) * | 2000-06-01 | 2001-12-14 | Masami Umeki | Magnet probe |
JP2002090416A (en) * | 2000-09-13 | 2002-03-27 | Mitsubishi Electric Corp | Contact method for semiconductor device in ic socket and contact pin for ic socket |
CN2901321Y (en) * | 2006-05-12 | 2007-05-16 | 富港电子(东莞)有限公司 | Switch connector for multimeter pen |
CN202189071U (en) * | 2011-06-27 | 2012-04-11 | 江苏和利普激光科技有限公司 | Simple multipurpose resistance-adjusting test probe |
CN102636670A (en) * | 2012-05-04 | 2012-08-15 | 鲁东大学 | Meter pen of automotive universal meter capable of replacing joint |
CN203322016U (en) * | 2013-05-16 | 2013-12-04 | 贵州航天林泉电机有限公司 | Anti-looseness self-locking screw connecting structure |
CN203811643U (en) * | 2014-04-04 | 2014-09-03 | 北京世迈腾科技有限公司 | Glass touch screen detection probe |
CN204302328U (en) * | 2014-11-10 | 2015-04-29 | 上海依然半导体测试有限公司 | Blade type probe mounting and clamping system |
-
2014
- 2014-11-10 CN CN201410627805.9A patent/CN104360110B/en active Active
Patent Citations (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN2234849Y (en) * | 1995-06-27 | 1996-09-11 | 杨武益 | Box-type automatic reset double shaver |
JP2001343398A (en) * | 2000-06-01 | 2001-12-14 | Masami Umeki | Magnet probe |
JP2002090416A (en) * | 2000-09-13 | 2002-03-27 | Mitsubishi Electric Corp | Contact method for semiconductor device in ic socket and contact pin for ic socket |
CN2901321Y (en) * | 2006-05-12 | 2007-05-16 | 富港电子(东莞)有限公司 | Switch connector for multimeter pen |
CN202189071U (en) * | 2011-06-27 | 2012-04-11 | 江苏和利普激光科技有限公司 | Simple multipurpose resistance-adjusting test probe |
CN102636670A (en) * | 2012-05-04 | 2012-08-15 | 鲁东大学 | Meter pen of automotive universal meter capable of replacing joint |
CN203322016U (en) * | 2013-05-16 | 2013-12-04 | 贵州航天林泉电机有限公司 | Anti-looseness self-locking screw connecting structure |
CN203811643U (en) * | 2014-04-04 | 2014-09-03 | 北京世迈腾科技有限公司 | Glass touch screen detection probe |
CN204302328U (en) * | 2014-11-10 | 2015-04-29 | 上海依然半导体测试有限公司 | Blade type probe mounting and clamping system |
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Publication number | Publication date |
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CN104360110A (en) | 2015-02-18 |
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