CN104330666A - Fault positioning device and method for single capacitors in super-capacitor banks - Google Patents

Abstract

The invention belongs to the technical field of aerial airborne electronics, is applied to independent power supplies of recorders, and particularly relates to a fault positioning device and method for single capacitors in super-capacitor banks. A microcontroller controls a voltage monitoring and current monitoring circuit and acquires current flowing through each super-capacitor bank and the voltage of each single capacitor, the capacity of each super-capacitor can be calculated by calculating acquired data, the calculated value of the capacity of each super-capacitor is compared with a rated value of the capacity, and the fault of the super-capacitor can be judged if the calculated value exceeds an allowable range. As a fault detection circuit of each super-capacitor and a positioning algorithm are embedded into aerial airborne electronic equipment, online detection and fault report for the super-capacitors are realized, compared with an existing method, faults of the super-capacitors can be recognized as early as possible, and the maintenance efficiency of the independent power supplies is greatly improved.

Description

Electric capacity monomer fault locator and method in a kind of super capacitor group

Technical field

The invention belongs to airborne electronic technology field, be applied to register independent current source, particularly relate to a kind of electric capacity monomer fault locator and method in super capacitor group.

Background technology

On domestic air mail passenger cabin voice-frequency sender (being commonly called as: black box) independent current source, adopt super capacitor as energy-accumulating medium.But, super capacitor mainly towards industrial circle application, as doing power storage in new forms of energy (wind-powered electricity generation, solar electrical energy generation etc.) system, its reliability not as military tantalum electrochemical capacitor.And because super capacitor belongs to liquid electrolyte capacitor, according to its sealing situation, after certain hour, its electrolytic solution can progressively volatilize, and causes condenser capacity to decline, even loses efficacy.

For the detection that ultracapacitor lost efficacy, can be tested by special ultra-capacitor tester, mainly the test of electric capacity.Because capacity of super capacitor is excessive, its capacity generally adopts constant current charge-discharge, measures over time calculate according to voltage, but not general capacitor adopts the mode of ac-excited test equiva lent impedance to realize, and therefore, its test duration is longer, and efficiency is lower.

For the application of super capacitor, the general mode adopting series connection to add parallel connection, forms higher super capacitor group that is withstand voltage, more high power capacity and carrys out storage power.If a super capacitor damages, then need to check all super capacitors, with locate failure electric capacity, be convenient to maintenance.For typical register independent current source application, there are 12 400F ultracapacitors its inside, adopts manual testing, and each is only each once by the 1A charging and discharging of standard, respectively need about 18 minutes time, the test completing 12 electric capacity then needs 7.2 hours, during general test, also will carry out the test under high temperature and low temperature, then about 3 working days consuming time, certainly, adopt hyperchannel charging, significantly can reduce positioning time.

At present, for airborne electronic equipment, if in use can localizing faults electric capacity monomer, then can greatly reduce the ground maintenance time.Therefore, the fault location function of embedded super capacitor in airborne electronic equipment, can when super capacitor be abnormal, and provide information and locate, then the impact that independent current source can be avoided to lose efficacy on airborne function, improves maintenance efficiency simultaneously.

Summary of the invention

Goal of the invention: the object of the invention is to provide a kind of electric capacity monomer failure detector and method in super capacitor group, realize the localization of fault of super capacitor monomer based on these apparatus and method.

Technical scheme: electric capacity monomer fault locator in a kind of super capacitor group, comprise microcontroller 11, voltage monitoring 13 and current monitoring 12, wherein current monitoring 12 1 termination charging circuit and discharge circuit, another termination series capacitance group anode, current monitoring 12 is monitored output and is met voltage monitoring 13 monitoring input CI0, the monitoring input CI1 ~ CIn of voltage monitoring 13 is accessed at all electric capacity two ends of series capacitance group successively, and the data control bus often organizing the voltage monitoring 13 of series capacitance group configuration is connected with microcontroller 11.

Electric capacity monomer Fault Locating Method in a kind of super capacitor group, utilizes above-mentioned fault locator, comprises the following steps:

Step 1: series connected super-capacitor module charge or discharge, timing △ t gathers voltage U nx m+1 time altogether of charging current Ix and each super capacitor at equal intervals, and n is electric capacity sequence number, x for gathering sequence number, respectively correspondence 0,1,2 ..., m; The value of m is actual discharge and recharge number of times;

Step 2: the capacity of the energy that each super capacitor is filled with after calculating a period of time m × △ t according to m+1 sampled result, formula is:

$\mathrm{\Δ}{W}_n=\underset{x=1}{\overset{m}{\mathrm{\Σ}}}(I_x\·U_{\mathrm{nx}}\·\mathrm{\Δt})=\underset{x=1}{\overset{m}{\mathrm{\Σ}}}\left(U_{\mathrm{nx}}\right)\·I_x\·\mathrm{\Δt}$ Formula 1.;

Step 3: the relation formula according between capacitive energy change and change in voltage:

$\mathrm{\Δ}{W}_n=W_{\mathrm{nm}}-W_{n0}=\frac{1}{2}{C}_n({U_{\mathrm{nm}}}^2-{U_{n0}}^2)$ Formula 2.

Show that each super capacitor capacity is: $C_n=\frac{2\·\mathrm{\Δ}{W}_n}{{U_{\mathrm{nm}}}^2-{U_{n0}}^2}=\frac{2\·\underset{x=1}{\overset{m}{\mathrm{\Σ}}}\left(U_{\mathrm{nx}}\right)\·I_x\·\mathrm{\Δt}}{{U_{\mathrm{nm}}}^2-{U_{n0}}^2}$ Formula 3.;

Step 4: breakdown judge is carried out to all ultracapacitors, to each ultracapacitor, under the calculated capacity of this super capacitor is lower than rated capacity permissible variation in limited time, or the calculated capacity of this super capacitor higher than on rated capacity permissible variation in limited time, think this super capacitor fault.

Beneficial effect: the present invention is embedded in airborne electronic equipment due to the failure detector circuit of super capacitor and location algorithm, achieve super capacitor on-line checkingi and report event, compared to existing mode, can identification super capacitor fault as early as possible, and improve the maintenance efficiency of independent current source greatly.

Accompanying drawing explanation

Fig. 1 is the super capacitor monomer failure detector circuit theory diagram that the present invention adopts;

Fig. 2 is the embodiment hardware circuit diagram that the present invention adopts;

Fig. 3 is the super capacitor localization of fault flow process that the present invention adopts.

Wherein:

[11] microcontroller

[12] current monitoring

[13] voltage monitoring

[121]Rsense

[122]Rin1

[123]Rin2

[124]LT6104

[125]Rout

Embodiment

The present invention is by microprocessor controls voltage monitoring and current monitoring circuit, gather and flow through each the group electric current of ultracapacitor and voltage of each electric capacity monomer, by calculating the data collected, the calculating of each super capacitor capacity can be carried out, then by each super capacitor calculation of capacity value and its capacity ratings comparison, if exceed the scope of permission, then can judge this super capacitor fault.

Be described in further detail below in conjunction with a kind of embodiment of accompanying drawing to invention, refer to Fig. 1 ~ Fig. 3.

Hardware embodiment is as follows:

Adopt series-connected cell/electric capacity chip monitoring LT6803, form voltage monitoring 13 unit, its monitoring side receives the two ends of each super capacitor respectively.Adopt LT6104 to form current monitoring 12 unit, the output of current monitoring 12 unit connects the temperature signal test interface of voltage monitoring 13 unit, and microcontroller 11 is connected to the spi bus interface of voltage monitoring 13 unit by spi bus.As shown in Figure 3.The connection of current monitoring 12 unit is according to shown in Fig. 2, and the voltage relationship wherein on electric current I and Rout125 is:

$V_{\mathrm{Rout}}=I\·\frac{R_{\mathrm{sense}}\·R_{\mathrm{out}}}{R_{\mathrm{in}}}.$

In order to control power consumption, generally Rsense being controlled below 100 milliohms, suitably adjusting according to working current size.

Embodiment is process flow diagram as shown in Figure 3.This process flow diagram is only for electric discharge or charging single-mode.Below illustrate:

First, microcontroller timer 1s Interruption is set and opens, then when each 1s Interruption triggers, carry out as follows:

The first step: the voltage gathering each electric capacity by SPI Interface Controller LT6803, gathers charge/discharge current simultaneously;

Second step: if current collection gathers for the 0th time, then preserve current voltage value and electric current is initial value Un0 and In0, and reset by energy change value △ Wn, otherwise accumulated energy variable quantity is Δ Wn=Δ Wn+Unx × Ix × Δ t;

3rd step: if complete the m time collection, then each electric capacity capacitance according to can calculate, wherein Unm is the capacitance voltage collected for the m time, and Un0 is the capacitance voltage collected for the 0th time;

4th step: judging capacitor's capacity whether in the scope accepted, is 300F ~ 400F as capacitor's capacity accepts scope, then the capacitance calculated then thinks this super capacitor fault lower than 300F or higher than 400F.

Claims (2)

1. electric capacity monomer fault locator in a super capacitor group, comprise microcontroller [11], voltage monitoring [13] and current monitoring [12], wherein current monitoring [12] termination charging circuit and discharge circuit, another termination series capacitance group anode, current monitoring [12] monitoring output meets voltage monitoring [13] monitoring input CI0, the monitoring input CI1 ~ CIn of voltage monitoring [13] is accessed at all electric capacity two ends of series capacitance group successively, the data control bus often organizing the voltage monitoring [13] of series capacitance group configuration is connected with microcontroller [11].

2. an electric capacity monomer Fault Locating Method in super capacitor group, uses fault locator according to claim 1, it is characterized in that, comprise the following steps:

Step 1: series connected super-capacitor module charge or discharge, timing △ t gathers voltage U nx m+1 time altogether of charging current Ix and each super capacitor at equal intervals, and n is electric capacity sequence number, x for gathering sequence number, respectively correspondence 0,1,2 ..., m;

Step 2: the capacity of the energy that each super capacitor is filled with after calculating a period of time m × △ t according to m+1 sampled result, formula is:

$\mathrm{\Δ}{W}_n=\underset{x=1}{\overset{m}{\mathrm{\Σ}}}(I_x\·U_{\mathrm{nx}}\·\mathrm{\Δt})=\underset{x=1}{\overset{m}{\mathrm{\Σ}}}\left(U_{\mathrm{nx}}\right)\·I_x\·\mathrm{\Δt}$ Formula 1.;

Step 3: the relation formula according between capacitive energy change and change in voltage:

$\mathrm{\Δ}{W}_n=W_{\mathrm{nm}}-W_{n0}=\frac{1}{2}{C}_n({U_{\mathrm{nm}}}^2-{U_{n0}}^2)$ Formula 2.

Show that each super capacitor capacity is: $C_n=\frac{2\·\mathrm{\Δ}{W}_n}{{U_{\mathrm{nm}}}^2-{U_{n0}}^2}=\frac{2\·\underset{x=1}{\overset{m}{\mathrm{\Σ}}}\left(U_{\mathrm{nx}}\right)\·I_x\·\mathrm{\Δt}}{{U_{\mathrm{nm}}}^2-{U_{n0}}^2}$ Formula 3.;

Step 4: breakdown judge is carried out to all ultracapacitors, to each ultracapacitor, under the calculated capacity of this super capacitor is lower than rated capacity permissible variation in limited time, or the calculated capacity of this super capacitor higher than on rated capacity permissible variation in limited time, think this super capacitor fault.