CN104316759B - A kind of continuous wave power probe - Google Patents
A kind of continuous wave power probe Download PDFInfo
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- CN104316759B CN104316759B CN201410554370.XA CN201410554370A CN104316759B CN 104316759 B CN104316759 B CN 104316759B CN 201410554370 A CN201410554370 A CN 201410554370A CN 104316759 B CN104316759 B CN 104316759B
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Abstract
The present invention proposes a kind of continuous wave power probe, including：Microwave detecting circuit A1 and Larger Dynamic scope detecting circuit process circuit A2；Wherein, microwave detecting circuit A1 is placed on gallium arsenide substrate, and is sealed in an inside cavity；Larger Dynamic scope detecting circuit process circuit A2 is located in printed board, and is sealed by metal shell.The present invention proposes a kind of continuous wave power probe based on MMIC technologies, 90dB dynamic ranges, the probe is connected by cable with continuous wave power meter main frame, realize single probe and reach 90dB in frequency range for 10MHz~18GHz dynamic range, realize the accurate measurement of continuous wave power.
Description
Technical field
The present invention relates to technical field of measurement and test, more particularly to a kind of continuous wave power probe.
Background technology
Power is that microwave signal is most basic, one of most important parameter, almost all of electronic equipment and electronic component
Development, production, be required for power meter to carry out power test to it.Microwave power probe is the most crucial group of microwave power meter
Part, the performance of microwave power probe decides the core index of microwave power meter.
Existing microwave power probe is the small design microstrip circuit in gallium arsenide substrate, by two panels Schottky diode
Symmetrically it is welded on detection electric capacity on microstrip circuit, and microstrip circuit is sealed in the inside cavity of a narrow space.
Existing microwave power probe has following shortcoming：
(1) detecting circuit area is small, and the requirement welded to device is very high, and the problem of having very big when device is welded is such as double
Detector diode welding position non complete symmetry can cause detection balance poor；Different metal connection can form larger current potential
Difference；Detection balance difference and potential difference influence whether greatly the degree of accuracy of the power probe to low-power measurement.
(2) diode detection circuit is designed by separating component, and it is poor to there is detection output-consistence, particularly detection
The linear and Frequency Response of output, even if all there is larger gap with a batch of power probe.
(3) because detecting circuit area is small, microstrip line is very short, if operating lack of standardization or temperature mistake in welding process
It is high, it is easy to damage the microstrip line of detecting circuit, cause a number of defect ware.
The content of the invention
The disadvantages mentioned above existed for existing microwave power probe, the present invention proposes a kind of continuous wave power probe,
The probe is connected by cable with continuous wave power meter main frame, and it is 10MHz~18GHz's to realize single probe in frequency range
Dynamic range reaches 90dB, realizes the accurate measurement of continuous wave power.
The technical proposal of the invention is realized in this way：
A kind of continuous wave power probe, including：Microwave detecting circuit A1 and Larger Dynamic scope detecting circuit process circuit A2；
Wherein, microwave detecting circuit A1 is placed on gallium arsenide substrate, and is sealed in an inside cavity；Larger Dynamic scope detecting circuit
Process circuit A2 is located in printed board, and is sealed by metal shell；
Signal input part employs suspended coplanar waveguide structure, and input signal is accessed by N-type coaxial fitting L1, in sealing
Inside cavity and the circular gold foil L2 perpendicular contacts being disposed vertically, flexible bellows L3 and circle gold foil L2 connect
Touch, by the elasticity of bellows, N-type coaxial fitting L1, circular gold foil L2, bellows L3 are connected, bellows L3 connects
Microstrip transmission line on to gallium arsenide substrate；
MMIC detection chips N1 receives the input signal of access, exports positive and negative two-way detecting circuit；
Positive-coefficient thermistor R3 and microwave detecting circuit A1 is located inside a seal cavity；
Positive detection output is connected to Larger Dynamic scope detecting circuit processing electricity by wire L4, negative detection output by wire L5
In the A2 of road, microwave detecting circuit A1 and Larger Dynamic scope detecting circuit process circuit A2 ground level are connected by wire L6
Connect；
Low drifting balances chopper N2 turns into ac square wave signal, low drifting all the way by positive and negative two-way detecting circuit copped wave
Balance chopper N2 control signal is accessed by power meter main frame by wire L13；
Span-changing device N3 includes two ranges, a lower range, a high range；Power bracket be -70dBm~-
Ac square wave signal after 10dBm detection passes through lower range passage；Power bracket is after -15dBm~+20dBm detection
Ac square wave signal is accessed by high range passage, the control signal of span-changing device by power meter main frame by wire L12；
Capacitance C5 is also set up on the copped wave passage of span-changing device N3 output signals；
Transistor V3 collectively forms cascade with the low-noise accurate operational amplifier in resistance R8, R9 and power meter main frame
Negative-feedback operational amplification circuit, tentatively amplifies to copped wave AC signal；
To pop one's head in printed board and power meter main frames of wire L17 carries out common ground connection.
Alternatively, the signal input part also includes the impedance matching net set up jointly by attenuator R1 and matching network R2
Network.
Alternatively, include two panels low barrier Schottky diode V1, V2 inside the MMIC detection chips N1 and two panels is regarded
Frequency filter capacitor C1, C2；Low barrier Schottky diode V1, V2 of two panels is inside MMIC detection chips N1 using the configuration balanced
Mode, the symmetrically precipitation around coplanar transmission is formed, and row energization, two panels video filtering electric capacity are entered with push pull mode
C1, C2 are connected on after low barrier Schottky diode V1, V2 of two panels respectively, export positive and negative two-way detecting circuit.
Alternatively, the positive-coefficient thermistor R3 resistance changes temperature change, sets up temperature change and detection
The corresponding relation of output, software compensation is carried out according to the corresponding relation to detecting circuit.
Alternatively, temperature offset resistance R4, R5 constitute a resistor network with the thermistor R3, when temperature becomes
Change, thermistor R3 resistances change, and voltage changes on wire L14.
Alternatively, the low drifting balance chopper suppresses electric capacity C3, C4 by switching noise and suppresses noise spike.
Alternatively, the span-changing device N3 includes two ranges, and one is 1:The lower range of 1 gain, one is 1:134
The high range of gain；Power bracket passes through 1 for the ac square wave signal after -70dBm~-10dBm detection:1 lower range passage；
Ac square wave signal of the power bracket after -15dBm~+20dBm detection passes through 1:The high range passage of 134 gains, is carried out
134 times of decay.
Alternatively, continuous wave power of the invention probe also includes：Iic bus memory N4, the information of in store probe,
Information data of popping one's head in writes iic bus memory N4 by iic bus, and main frame is read probe information data by iic bus.
Alternatively, main frame is by wire L15 feedings+7V power supply, the output+5V after positive voltage low-dropout regulator N5
Power supply；Main frame is by wire L16 feedings -7V power supply, the output -5V power supply after negative voltage low-dropout regulator N6；+5V、-
5V power supplys are MMIC detection chips N1, low drifting balance chopper N2, span-changing device N3, iic bus memory N4 provide work
Make power supply.
Alternatively, the microwave power probe is hermetically sealed by metal shell.
The beneficial effects of the invention are as follows：
(1) convenient welding, will not damage circuit, high yield rate because of welding；
(2) the linear and Frequency Response uniformity of detection output is good, and detection balance is high, eliminates different metal connection and causes
Potential difference, improve the degree of accuracy of weak-signal measurement.
Brief description of the drawings
In order to illustrate more clearly about the embodiment of the present invention or technical scheme of the prior art, below will be to embodiment or existing
There is the accompanying drawing used required in technology description to be briefly described, it should be apparent that, drawings in the following description are only this
Some embodiments of invention, for those of ordinary skill in the art, on the premise of not paying creative work, can be with
Other accompanying drawings are obtained according to these accompanying drawings.
Fig. 1 is a kind of circuit theory diagrams of continuous wave power probe of the invention；
Reference：
A1：Microwave detecting circuit；
A2：Larger Dynamic scope detecting circuit process circuit；
L1：N-type coaxial fitting；
L2：Circular gold foil；
L3：Bellows；
R1：3dB attenuators；
R2：50 Europe matching networks；
N1：MMIC detection chips；
V1、V2：Low barrier Schottky diode in MMIC detection chips；
C1、C2：Video filtering electric capacity in MMIC detection chips；
R3：Positive-coefficient thermistor；
L4、L5、L6、L7：Proof gold wire；
X1：Plastics pressure head；
N2：Low drifting balances chopper；
C3、C4：Chopper switches noise suppressed electric capacity；
N3：Span-changing device；
C5：Copped wave passage capacitance；
V3：The high β bipolar transistors of cascode；
R8、R9：The gain resistor of negative feedback operational amplifier；
N4：Iic bus memory；
N5：Positive voltage low-dropout regulator；
N6：Negative voltage low-dropout regulator；
X2：In double flat cable socket；
X3：12 core circular sockets.
Embodiment
Below in conjunction with the accompanying drawing in the embodiment of the present invention, the technical scheme in the embodiment of the present invention is carried out clear, complete
Site preparation is described, it is clear that described embodiment is only a part of embodiment of the invention, rather than whole embodiments.It is based on
Embodiment in the present invention, it is every other that those of ordinary skill in the art are obtained under the premise of creative work is not made
Embodiment, belongs to the scope of protection of the invention.
As shown in figure 1, the continuous wave power probe of the present invention includes two parts：Microwave detecting circuit A1 and Larger Dynamic scope
Detecting circuit process circuit A2, wherein microwave detecting circuit A1 are placed on gallium arsenide substrate, and are sealed in an inside cavity；
Larger Dynamic scope detecting circuit process circuit A2 is located in the printed board of RF4 materials, and is sealed by metal shell.
The signal input part of continuous wave power probe employs suspended coplanar waveguide structure, and input signal is coaxial by N-type
Joint L1 is accessed, with the circular gold foil L2 perpendicular contacts being disposed vertically, flexible bellows L3 inside seal cavity
Contact, by the elasticity of bellows, L1, L2, L3 are connected, L3 is connected on gallium arsenide substrate with circular gold foil L2
Microstrip transmission line.
Preferably, the signal input part of continuous wave power probe also includes being set up jointly by attenuator R1 and matching network R2
Impedance matching network, improve the standing-wave ratio of input port, and improve the burn-out resistance and reliability of power probe, for example
Attenuator R1 is 3dB, and matching network R2 is 50 Europe.
MMIC detection chips N1 receives the input signal of access, and N1 is to use the integrated double diode detection of MMIC Technology designs
The MMIC detection chips of device and filter capacitor.Inside MMIC detection chips N1 include the low barrier Schottky diode V1 of two panels,
V2 and two panels video filtering electric capacity C1, C2.V1, V2 use the configuration mode of balance inside MMIC detection chips N1, around altogether
The symmetrically precipitation of face transmission line is formed, and enters row energization with push pull mode, it is suppressed that even-order harmonic is caused in input signal
Measurement error, so as to improve the detection quality of signal, improve the degree of accuracy of weak-signal measurement.C1, C2 are connected on V1, V2 respectively
Afterwards, carrier signal is filtered out, continuous wave signal detection is completed, positive and negative two-way detecting circuit is exported.
Positive-coefficient thermistor R3 is located inside a seal cavity with microwave detecting circuit, in -40 DEG C~+85 DEG C temperature
In the range of, R3 resistances are in positive linear change with temperature, and R3 accurately reflects inside cavity temperature change.Due to V1, V2 detection
Output voltage is influenced by ambient temperature than larger, therefore can be changed by R3 resistance changes temperature, sets up temperature change
Change the corresponding relation exported with detection, software compensation is carried out to detecting circuit according to the corresponding relation.
Positive detection output is connected to Larger Dynamic scope detecting circuit processing electricity by wire L4, negative detection output by wire L5
In the A2 of road, L4~L7 is proof gold wire, is that gold utensil has more preferable electric conductivity using proof gold wire reason, by wire L6 by microwave
Detecting circuit A1 and Larger Dynamic scope detecting circuit process circuit A2 ground level are attached, and reduce the ground potential of two units
Poor noise.Gold thread is crimped on by wire L4~L7 on Larger Dynamic scope detecting circuit process circuit A2 by plastics pressure head X1
On Larger Dynamic scope detecting circuit process circuit A2 pad, Larger Dynamic scope detecting circuit process circuit A2 pads are plating gold solder
Disk, can reduce influence of the junction capacity to signal when unlike material is connected, it is ensured that the standard of weak-signal measurement by crimping mode
Exactness.
The positive and negative two-way detecting circuit of detection output is low frequency or direct current signal, and for low frequency or direct current signal,
1/f (1/ frequency) noise is topmost noise source, and 1/f noise is determined by the physical characteristic of semi-conducting material, therefore integrated fortune
The amplification to faint direct current signal can not be directly realized by by calculating the amplifying circuit of the semiconductor devices such as amplifier.Present invention employs low
Drift balance chopper N2, turns into ac square wave signal all the way by positive and negative two-way detecting circuit copped wave, has evaded component in itself
Interference of 1/f (1/ frequency) noises to rectified signal.Low drifting balance chopper N2 control signal is led to by power meter main frame
Wire L12 accesses are crossed, the chopping frequency of chopper is 400Hz.
Moment due to chopper in turn-on and turn-off can produce interference signal, and interference signal is carried in useful signal,
The liter edge of the square-wave signal generated in copped wave and falling edge occur noise spike, chopper switches noise suppressed electric capacity C3,
C4 is to suppress noise spike.
Because probe power bracket is very wide, it is therefore desirable to carry out segment processing to detecting circuit inside probe.Range turns
Parallel operation N3 includes 2 ranges, and one is 1:The lower range of 1 gain, one is 1:The high range of 134 gains.Power bracket for-
Ac square wave signal after 70dBm~-10dBm detection passes through 1:1 lower range passage；Power bracket is in -15dBm~+20dBm
Detection after ac square wave signal pass through 1:The high range passage of 134 gains, the decay of 134 times of progress.Span-changing device
Control signal is accessed by power meter main frame by wire L12.
Capacitance C5 is also set up on the copped wave passage of span-changing device N3 output signals, the direct current in chopping signal is filtered out
Component.
The high β bipolar transistors V3 of cascode and the low-noise accurate operation amplifier in resistance R8, R9 and power meter main frame
Device collectively forms cascade negative-feedback operational amplification circuit, realizes the preliminary amplification to copped wave AC signal.
The information of the in store probes of iic bus memory N4, such as probe model, numbering, linear data, compensating for frequency response number
According to, temperature compensation data etc..It is SCL (serial that information data of popping one's head in writes iic bus memory N4, wire L8 by iic bus
Clock line), wire L9 is SDA (serial data line), operationally, and main frame is read probe information data by iic bus, and
Computing is participated in measurement process.
Main frame is by wire L15 feedings+7V power supply, the output+5V power supply after positive voltage low-dropout regulator N5；It is main
Machine is by wire L16 feedings -7V power supply, the output -5V power supply after negative voltage low-dropout regulator N6.+ 5V, -5V power supply
Working power is provided for MMIC detection chips N1, low drifting balance chopper N2, span-changing device N3, iic bus memory N4.
Temperature offset resistance R4, R5 and thermistor R3 constitutes a resistor network, and when temperature changes, R3 resistances are sent out
Changing, then voltage changes on wire L14.
To pop one's head in printed board and power meter main frames of wire L17 carries out common ground connection.
Wire L8~L17 is connected in printed board in double flat cable socket X2, by plug and cable by X2 and 12
Core circular socket X3 is linked together, and 12 core circular socket X3 are fixed in the frame of microwave power probe.
Microwave power probe is hermetically sealed by metal shell.
The present invention proposes a kind of continuous wave power based on MMIC technologies (monolithic integrated optical circuit), 90dB dynamic ranges and visited
Head, the probe is connected by cable with continuous wave power meter main frame, realize single probe frequency range be 10MHz~
18GHz dynamic range reaches 90dB, realizes the accurate measurement of continuous wave power.
The present invention continuous wave probe realize typical index be：
Frequency range：10MHz~18GHz；
Power bracket：- 70dBm~+20dBm；
The power measurement degree of accuracy：± 0.17dB (- 40dBm~+20dBm).
The continuous wave power probe of the present invention can not individually complete power measurement, and it is needed by 12 core flexible cables and microwave work(
Rate meter main frame is connected, and microwave power measurement is completed jointly.
Microwave power meter main frame needs to complete following work：
Operational amplifier in main frame constitutes high-gain, the signal amplification circuit of low noise with V3, R8, R9, to power
Signal is tentatively amplified；
The amplification of component of signal journey, filtering and A/D samplings to Larger Dynamic scope, carry out going to cut in software to sampling ADC
Ripple processing, and linear compensation, compensating for frequency response and temperature-compensating are carried out to sampling ADC data, adc data is converted into accurate work(
Rate value；
+ 7V, -7V power supply are provided for probe；
By iic bus, to probe N3 write-ins or reading probe data.
The continuous wave power probe convenient welding of the present invention, will not damage circuit, high yield rate because of welding；Detection is defeated
The linear and Frequency Response uniformity gone out is good, and detection balance is high, eliminates the potential difference that different metal connection is caused, improves small
The degree of accuracy of signal measurement.
The foregoing is merely illustrative of the preferred embodiments of the present invention, is not intended to limit the invention, all essences in the present invention
God is with principle, and any modification, equivalent substitution and improvements made etc. should be included in the scope of the protection.
Claims (10)
1. a kind of continuous wave power probe, it is characterised in that including：Microwave detecting circuit (A1) and Larger Dynamic scope detecting circuit
Process circuit (A2)；Wherein, microwave detecting circuit (A1) is placed on gallium arsenide substrate, and is sealed in an inside cavity；Greatly
Dynamic range detecting circuit process circuit (A2) is located in printed board, and is sealed by metal shell；
Microwave detecting circuit (A1) includes MMIC detection chips (N1), and the signal input part of microwave detecting circuit (A1) employs outstanding
Coplanar waveguide structure is put, input signal is accessed by N-type coaxial fitting (L1), the circle inside seal cavity with being disposed vertically
Gold foil (L2) perpendicular contact, flexible bellows (L3) is contacted with circular gold foil (L2), by the elasticity of bellows,
N-type coaxial fitting (L1), circular gold foil (L2), bellows (L3) are connected, bellows (L3) is connected to GaAs lining
Microstrip transmission line on bottom；
MMIC detection chips (N1) receive the input signal of access, export positive and negative two-way detecting circuit；
Positive-coefficient thermistor (R3) is located inside a seal cavity with microwave detecting circuit (A1)；
Positive detection output is connected to Larger Dynamic scope detecting circuit by wire (L5) and handled by wire (L4), negative detection output
In circuit (A2), by wire (L6) by microwave detecting circuit (A1) and the ground of Larger Dynamic scope detecting circuit process circuit (A2)
Plane is attached；Larger Dynamic scope detecting circuit process circuit (A2) includes low drifting balance chopper (N2), range swithching
Device (N3), transistor (V3)；
Positive and negative two-way detecting circuit copped wave is turned into ac square wave signal all the way by low drifting balance chopper (N2), and low drifting is put down
The control signal of weighing apparatus chopper (N2) passes through wire (L13) by power meter main frame and accessed；
Span-changing device (N3) includes two ranges, a lower range, a high range；Power bracket is -70dBm~-10dBm
Detection after ac square wave signal pass through lower range passage；Exchange side of the power bracket after -15dBm~+20dBm detection
Ripple signal is accessed by high range passage, the control signal of span-changing device by power meter main frame by wire (L12)；
Capacitance (C5) is also set up on the copped wave passage of span-changing device (N3) output signal；
Transistor (V3) collectively forms cascade with the low-noise accurate operational amplifier in resistance (R8, R9) and power meter main frame
Negative-feedback operational amplification circuit, tentatively amplifies to the copped wave AC signal that span-changing device (N3) is exported；
Probe printed board is carried out common ground connection by wire (L17) with power meter main frame.
2. continuous wave power probe as claimed in claim 1, it is characterised in that the signal input part also includes by attenuator
And the impedance matching network set up jointly of matching network (R2) (R1).
3. continuous wave power probe as claimed in claim 1, it is characterised in that include inside the MMIC detection chips (N1)
The low barrier Schottky diode of two panels (V1, V2) and two panels video filtering electric capacity (C1, C2)；The low barrier Schottky diode of two panels
(V1, V2) uses the configuration mode of balance inside MMIC detection chips (N1), around symmetrically sinking for coplanar transmission
Shallow lake is formed, and row energization is entered with push pull mode, and two panels video filtering electric capacity (C1, C2) is connected on the low pole of barrier schottky two of two panels respectively
Manage after (V1, V2), export positive and negative two-way detecting circuit.
4. continuous wave power probe as claimed in claim 1, it is characterised in that positive-coefficient thermistor (R3) resistance value
Change temperature change, set up the corresponding relation that temperature change is exported with detection, detecting circuit is entered according to the corresponding relation
Row software compensation.
5. continuous wave power probe as claimed in claim 4, it is characterised in that temperature offset resistance (R4, R5) and the heat
Quick resistance (R3) constitutes a resistor network, and when temperature changes, thermistor (R3) resistance changes, wire (L14)
Upper voltage changes.
6. continuous wave power probe as claimed in claim 1, it is characterised in that the low drifting balance chopper passes through switch
Noise suppressed electric capacity (C3, C4) suppresses noise spike.
7. continuous wave power probe as claimed in claim 1, it is characterised in that the span-changing device (N3) includes two amounts
Journey, one be 1: 1 gain lower range, one be 1: 134 gain high range；Power bracket is -70dBm~-10dBm inspection
Ac square wave signal after ripple passes through 1: 1 lower range passage；Exchange side of the power bracket after -15dBm~+20dBm detection
Ripple signal passes through the high range passage of 1: 134 gain, the decay of 134 times of progress.
8. continuous wave power probe as claimed in claim 1, it is characterised in that also include：Iic bus memory (N4), is protected
The information of probe is deposited, probe information data writes iic bus memory (N4) by iic bus, and main frame will by iic bus
Information data of popping one's head in is read.
9. continuous wave power probe as claimed in claim 1, it is characterised in that the electricity that main frame passes through wire (L15) feeding+7V
Source, the output+5V power supply after positive voltage low-dropout regulator (N5)；Main frame passes through wire (L16) feeding -7V power supply, warp
Negative voltage low-dropout regulator (N6) output -5V afterwards power supply；+ 5V, -5V power supply are MMIC detection chips (N1), low drifting is put down
Weigh chopper (N2), span-changing device (N3), iic bus memory (N4) offer working power.
10. continuous wave power probe as claimed in claim 1, it is characterised in that the microwave power probe is by metal shell
It is hermetically sealed.
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| Publication number | Priority date | Publication date | Assignee | Title |
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| CN105425028A (en) * | 2015-10-27 | 2016-03-23 | 中国电子科技集团公司第四十一研究所 | Microwave power measurer based on FPGA |
| CN106018909B (en) * | 2016-05-16 | 2018-10-09 | 中国电子科技集团公司第四十一研究所 | A kind of circuit and method of digital oscilloscope probe automatic adaptation |
| CN106443161B (en) * | 2016-08-18 | 2019-01-18 | 中国电子科技集团公司第四十一研究所 | A kind of power-measuring device that supporting power probe hot plug and method |
| CN109143185A (en) * | 2018-07-13 | 2019-01-04 | 中国船舶重工集团公司第七〇九研究所 | A kind of temperature-compensation method, power detection device and radar system |
| CN118091243B (en) * | 2024-04-23 | 2024-07-05 | 北京中玮科技有限公司 | Double-sided symmetrical coplanar waveguide chip and power sensor device |
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| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5873029A (en) * | 1997-02-19 | 1999-02-16 | Motorola, Inc. | High dynamic range millimeter wave power detector with temperature compensation |
| JP3075205B2 (en) * | 1997-03-26 | 2000-08-14 | 日本電気株式会社 | High frequency detector, transmission power controller, and method of installing high frequency detector |
| DE10039665A1 (en) * | 2000-08-14 | 2002-02-28 | Rohde & Schwarz | power sensor |
| CN101819229A (en) * | 2010-04-28 | 2010-09-01 | 复旦大学 | High dynamic range radio frequency signal power detection circuit |
| CN102147429B (en) * | 2011-02-28 | 2013-04-24 | 中国科学院国家天文台 | Broadband microwave power meter and interference signal filtering method |
| CN202949394U (en) * | 2012-11-26 | 2013-05-22 | 成都四威航空电源有限公司 | Power detection and protection device for microwave amplifier |
| CN203433038U (en) * | 2013-09-17 | 2014-02-12 | 湖南航天工业总公司 | Microwave continuous wave test platform |
-
2014
- 2014-10-10 CN CN201410554370.XA patent/CN104316759B/en not_active Expired - Fee Related
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| CN104316759A (en) | 2015-01-28 |
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