CN104300532A - Voltage sag evaluation process based on matrix factor - Google Patents

Abstract

The invention provides a voltage sag evaluation process based on a matrix factor. The process includes the steps that (S1) a voltage sag evaluation object is determined, and voltage sag data of a common coupling node of the voltage sag evaluation object are measured; (S2) the voltage sag data are analyzed and sorted, and a voltage sag sensitivity matrix and a voltage sag frequency matrix are built; (S3) a voltage interruption frequency matrix on the common coupling node is computed, and voltage interruption times are obtained through the voltage interruption frequency matrix. By means of the process, actual conditions of equipment when voltage sag occurs during operation of a system can be truly reflected, and the process is suitable for computer processing.

Description

A kind of voltage dip estimation flow based on matrix multiplier

Technical field

The invention belongs to quality of power supply field, be specifically related to a kind of voltage dip estimation flow based on matrix multiplier.

Background technology

Along with the technology innovation based on the universal of high-power electric and electronic switchgear and power consumption equipment, especially Numeric Control Technology is widely used in industrial production, and the harm of the inferior generation of the quality of power supply is more and more obvious.According to international conference report introduction, at present in the U.S., because the quality of power supply declines, annual caused loss reaches 13,300,000,000 dollars, and the tremendous economic loss that the quality of power supply inferior is brought makes people constantly strengthen its degree of attentiveness.

The same with other power quality problem, voltage sag conditions is not a new problem.In recent years, along with various responsive power consumption equipments extensive use in the industry (particularly industrial stokehold), the electrical energy power quality disturbance problems such as voltage dip have become the focus that each side is paid close attention to.Voltage dip is normally caused by the short trouble of electric power system or user inside.Also may cause because the large motor start-up of user is improper.Such as; when thunderbolt and insulator contamination cause system short-circuit; protection act is excised; then automatic reclosing success again; such process is for the user on faulty line; by once short circuit power-off, and generally can stand primary voltage for the associated user of vicinity (same power supply buses) and fall process temporarily.If reclosing is unsuccessful, faulty line is power-off again, then on faulty line, user also may by long-term (being greater than 3min) power-off, and all the other users will stand once to fall process temporarily again.The harm of voltage dip is the same with voltage interruption, comparatively large to user's harm of those voltage-sensitives, as semiconductor manufacturing industry, papermaking, fiber axis, sheet fabrication, injection moulding compression molding production line etc.

For the loss appraisal that voltage dip causes, a general model need be found inherently to be different from amount each other to characterize all these.The method in the past assessed voltage dip is illustration type mostly, and it can provide an assessment to main conditions and potential problems fast.But, in this all processes, need to be mingled with artificial thought, consideration and interference.Meanwhile, it cannot use computer to calculate, and cannot carry out comprehensively accurate analysis to a large industrial process.This method cannot meet the needs of Modern Methods.

Summary of the invention

Technical problem to be solved by this invention is: provide a kind of voltage dip estimation flow based on matrix multiplier, this flow process is according to voltage dip Monitoring Data, set up voltage dip sensitivity matrix and year voltage dip frequency matrix, obtain the voltage dip number of times in a period of time, the actual state of equipment during system cloud gray model generation voltage dip can be reflected truly, be applicable to computer disposal.

The technical solution adopted in the present invention is: a kind of voltage dip estimation flow based on matrix multiplier, comprising:

S1) determine voltage dip evaluation object, measure its common coupling node voltage dip data;

S2) analysis and arrangement voltage dip data, set up voltage dip sensitivity matrix and voltage dip frequency matrix;

S3) calculate common coupling node place voltage interruption frequency matrix, obtain voltage interruption frequency by voltage interruption frequency matrix.

Described flow process, in step S1, common coupling node voltage dip data mainly comprise voltage magnitude, phase place and fall the duration temporarily.

Described flow process, in step S2, the method setting up voltage dip sensitivity matrix P comprises:

According to the amplitude percentage of residual voltage after falling temporarily, setting up row vector α by little to being divided into greatly n section from 0 ~ 100%, dropping on the vector element of respective magnitudes i-th section according to the duration of voltage dip, by 0 ~ t _maxtime period set up column vector β by little to being divided into greatly m section, drop on the corresponding vector element falling time jth section temporarily wherein t _maxfor voltage dip maximum measuring time;

According to i-th element of row vector α and a jth element of column vector β, fall that a situation arises temporarily and set up the break-make Jacobian matrix D of n*m according to the reality in a measurement period T, wherein matrix element

By P=α D β, namely obtain voltage dip sensitivity matrix P.

Described flow process, in step S2, the method setting up voltage dip frequency matrix Q comprises:

Voltage dip frequency matrix Q is the matrix of n*m; In a measurement period T, be the matrix element D of 1 in measurement break-make Jacobian matrix D _ijcorresponding voltage dip frequency Q _ij, the Q element value in break-make Jacobian matrix D corresponding to the matrix element of 0 is then 0, sets up voltage dip frequency matrix Q accordingly.

Described flow process, step S3 specifically comprises:

Dot product is carried out to voltage dip sensitivity matrix P and voltage dip frequency matrix Q, obtains the voltage interruption frequency matrix I of n*m, the element I namely in matrix I _ij=P _ijq _ij;

Voltage interruption frequency in a measurement period T

Described flow process, n is 10, m is 5, t _maxfor 1s, T are 1 year.

Advantage of the present invention: the invention provides a kind of voltage dip estimation flow based on matrix multiplier, this flow process adopts voltage dip sensitivity, falls the method process voltage dip related data of the frequency equiprobability matrix of generation temporarily, obtains the number of times of year voltage dip.This flow process successfully the technical Analysis of analysis result and voltage dip is combined into a kind of uniqueness, method flexibly, reflect the actual state of equipment during system cloud gray model generation voltage dip comparatively really, also be applicable to computer disposal, for voltage dip loss appraisal provides a kind of practical approach simultaneously.

Accompanying drawing explanation

Accompanying drawing 1 is a kind of voltage dip estimation flow block diagram based on matrix multiplier.

Embodiment

The present invention is based on the flow process that matrix multiplier sets up voltage dip loss appraisal, the assessment for voltage dip provide a set of can quantum chemical method, agile and all-purpose type be applicable to the computational methods of computer.The method adopts the method process voltage dip related data of applied probability matrix, obtains the number of times of year voltage dip.

Based on a voltage dip economic evaluation methods for expense factor matrix, mainly comprise following steps:

S1) determine voltage dip evaluation object, measure and add up the temporary drop data of its PCC node voltage;

S2) analysis and arrangement voltage dip actual measurement and statistics, set up voltage dip sensitivity matrix and year voltage dip frequency matrix;

S3) Nodes year voltage dip frequency and frequency is calculated.

Described method, in step S1, need to PCC node monitors power quality data, wherein voltage dip data mainly comprise voltage magnitude, phase place and fall the duration temporarily.

Described method, in step S2, defines voltage dip device sensitivity matrix P and year voltage dip frequency matrix Q respectively.Two matrixes are two-dimensional matrix, and the variable of matrix P is composed as follows:

The row vector α of matrix represents the amplitude of falling residual voltage temporarily, is divided into 10 parts ([100%-90%) from 100%-0, [90%-80%) ... [10%-0]); Column vector β represents the duration of voltage dip, is divided into 5 parts ([0-200ms) from 0-1s, [200-400ms), [and 400-600ms), [600-800ms), [800-1000ms]).

By P=α D β, namely obtain voltage dip sensitivity matrix P.

Year voltage dip frequency matrix Q is according to each vector actual measurement in P matrix.

If residual voltage is u, process sensltlvty function is P (u), and falling frequency function is temporarily Q (u), and disruption risk function is I (u), then

I(u)＝P(u)·Q(u)

For continuous distribution function, total fall number of times due to what interrupt causing temporarily and be:

$N=\underset{u=0\%}{\overset{100\%}{\∫}}\left(P\left(u\right)Q\left(u\right)\right)\mathrm{du}$

Described method, in step S3, two matrixes in integrating step 2, fall number of times computing formula discretization temporarily to above-mentioned:

By element multiplication corresponding for temporary desensitization matrix P and year temporary frequency reducing rate matrix Q, the annual frequency matrix I interrupting occurring can be obtained, I characterizes in each u ~ t (voltage-vs-time) category and the frequency of falling relevant interruption temporarily and occurring, and then can obtain the number of times that interruption total every year occurs.

I _ij＝P _ij·Q _ij

$N=\underset{i=1}{\overset{m}{\mathrm{\Σ}}}\underset{j=1}{\overset{n}{\mathrm{\Σ}}}I(i,j)$

The present invention is described in further detail below in conjunction with specific embodiment.

The present invention the invention provides a kind of voltage dip estimation flow based on matrix multiplier, the method adopts the method process voltage dip related data of applied probability matrix, obtain the number of times of year voltage dip, can be the loss assessing annual voltage dip and lay the foundation.Set up the flow process of voltage dip loss appraisal based on matrix multiplier, the assessment for voltage dip provide a set of can quantum chemical method, agile and all-purpose type be applicable to the computational methods of computer.

Based on a voltage dip appraisal procedure for matrix multiplier, its key step is as follows:

S1) determine voltage dip evaluation object, measure the temporary drop data of its PCC (common coupling node) node voltage;

S2) analysis and arrangement voltage dip measured data, set up voltage dip sensitivity matrix and year voltage dip frequency matrix;

S3) Nodes year voltage dip frequency and frequency is calculated.

Concrete implementation step is as follows:

1, determine evaluation object, PCC node or common bus install power quality monitoring device, record quality of power supply related data.

2, analysis and arrangement voltage dip measured data, respectively to voltage magnitude, the phase place of voltage dip data and fall the duration temporarily and arrange, set up voltage dip sensitivity matrix and year voltage dip frequency matrix.

3, the voltage dip sensitivity matrix drawn by probability theory statistical computation and year voltage dip frequency matrix, calculate year voltage dip frequency meter frequency further.

I _ij＝P _ij·Q _ij

$N=\underset{i=1}{\overset{m}{\mathrm{\Σ}}}\underset{j=1}{\overset{n}{\mathrm{\Σ}}}I(i,j)$

The data that the method obtains can be voltage dip loss appraisal and lay the foundation.When specifically assessing, for concrete evaluation object, voltage dip expense factor matrix can be set up, then calculating assessment voltage dip annual loss.

Such as, pressure drop disturbance caused is carried out unifying conversion, then calculates the economic loss caused.Such as, based on short time disturbance, suppose that the economic loss that short supply interruption causes is 1; When voltage dip higher than 90% time, do not cause damage to equipment, namely loss factor is 0; When the degree of falling is 70 ~ 90% temporarily, loss factor is 0.1; When the degree of falling is 50 ~ 70% temporarily, loss factor is 0.4; When voltage dip lower than 50% time, loss factor is 0.8.In analytical weight because of the period of the day from 11 p.m. to 1 a.m, have ignored the impact of falling the duration temporarily, namely think that economic loss that voltage dip causes decides primarily of the amplitude of falling temporarily, such hypothesis meets device characteristics.Therefore, obtain and identical with Q structure with matrix P fall cost metrix E temporarily.

Based on matrix P and matrix Q, in conjunction with expense factor matrix E, the failure costs drawing year voltage dip can be assessed:

$C=\underset{i=1}{\overset{m}{\mathrm{\Σ}}}\underset{j=1}{\overset{n}{\mathrm{\Σ}}}(P_{\mathrm{ij}}\·Q_{\mathrm{ij}}\·E_{\mathrm{ij}})$

The method to voltage dip sensitivity, fall temporarily generation frequency and at every turn fall the loss caused temporarily and calculate, by the loss of expense factor matrix computations assessment voltage dip, reflect the actual state of equipment during system cloud gray model generation voltage dip comparatively really, for voltage dip loss appraisal provides a kind of practical approach.

Claims (6)

1., based on a voltage dip estimation flow for matrix multiplier, it is characterized in that comprising:

S1) determine voltage dip evaluation object, measure its common coupling node voltage dip data;

S2) analysis and arrangement voltage dip data, set up voltage dip sensitivity matrix and voltage dip frequency matrix;

S3) calculate common coupling node place voltage interruption frequency matrix, obtain voltage interruption frequency by voltage interruption frequency matrix.

2. flow process according to claim 1, is characterized in that: in step S1, and common coupling node voltage dip data mainly comprise voltage magnitude, phase place and fall the duration temporarily.

3. flow process according to claim 1, is characterized in that: in step S2, and the method setting up voltage dip sensitivity matrix P comprises:

According to the amplitude percentage of residual voltage after falling temporarily, setting up row vector α by little to being divided into greatly n section from 0 ~ 100%, dropping on the vector element of respective magnitudes i-th section according to the duration of voltage dip, by 0 ~ t _maxtime period set up column vector β by little to being divided into greatly m section, drop on the corresponding vector element falling time jth section temporarily wherein t _maxfor voltage dip maximum measuring time;

According to i-th element of row vector α and a jth element of column vector β, fall that a situation arises temporarily and set up the break-make Jacobian matrix D of n*m according to the reality in a measurement period T, wherein matrix element

By P=α D β, namely obtain voltage dip sensitivity matrix P.

4. flow process according to claim 3, is characterized in that: in step S2, and the method setting up voltage dip frequency matrix Q comprises:

Voltage dip frequency matrix Q is the matrix of n*m; In a measurement period T, be the matrix element D of 1 in measurement break-make Jacobian matrix D _ijcorresponding voltage dip frequency Q _ij, the Q element value in break-make Jacobian matrix D corresponding to the matrix element of 0 is then 0, sets up voltage dip frequency matrix Q accordingly.

5. flow process according to claim 4, is characterized in that, step S3 specifically comprises:

Dot product is carried out to voltage dip sensitivity matrix P and voltage dip frequency matrix Q, obtains the voltage interruption frequency matrix I of n*m, the element I namely in matrix I _ij=P _ijq _ij;

Voltage interruption frequency in a measurement period T

6. the flow process according to any one of claim 3 ~ 5, is characterized in that: n is 10, m is 5, t _maxfor 1s, T are 1 year.