CN104267285A - Accurate measurement device for signal delay time - Google Patents
Accurate measurement device for signal delay time Download PDFInfo
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- CN104267285A CN104267285A CN201410513261.3A CN201410513261A CN104267285A CN 104267285 A CN104267285 A CN 104267285A CN 201410513261 A CN201410513261 A CN 201410513261A CN 104267285 A CN104267285 A CN 104267285A
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Abstract
The invention discloses an accurate measurement device for signal delay time. The accurate measurement device comprises a comparison amplification unit (10), a signal processing unit (20), a microprocessing unit (30) and a display unit (40). The comparison amplification unit is connected with the signal processing unit. The signal processing unit is connected with the microprocessing unit which is connected with the display unit. The accurate measurement device for signal delay time is mainly used for accurately measuring delay time, specifically the time spent by transmission from the starting end to the terminal of a transmission line and the time spent by transmission from the starting end to the terminal of the transmission line and transmission from the terminal to the starting end of the transmission line. The whole accurate measurement device is composed of the comparison amplification unit, the signal processing unit, the microprocessing unit and the display unit. According to the accurate measurement device, the delay time is converted into digital signals through a comparison amplifier, then the digital signals are sent to a programmable logic device to be processed, a microprocessor is used for calculation and control, and finally the display unit displays the result.
Description
Technical field
The present invention relates to the studying technological domain of transmission line propagation characteristic, in particular to one device for accurately measuring signal delay time.
Background technology
Along with the technical development in the fields such as electronics, communication and electric system needs, the research about transmission line more and more causes the concern of people.The propagation characteristic of research transmission line has suitable difficulty, but is very significant.
The various Study on Problems existed due to distributed constant circuit itself have larger difficulty, with regard to uniform transmission line, still have many problem values to study.The propagation characteristic of electromagnetic wave on lossy uniform transmission lines is studied from the angle of experiment, not only can observe the experimental phenomena can not observed in Computer Simulation, and very naturally can do the preparation on some bases for exploring high-precision transmission open acess device.Meanwhile, along with the not only expansion of electric system scale, the raising of transmission line of electricity electric pressure, transmission distance is more and more longer.Whether transmission line of electricity normal operation has very important effect to the safety and stability of electric system, once break down, must find trouble spot as early as possible, fix a breakdown, restore electricity.This process institute's time spent is shorter, and the loss caused is just fewer, and the threat formed the safe and stable operation of system is just fewer.But high pressure and extra high voltage network are all longer, and through the landform of various complexity, want very fast early to trouble spot, by no means easy.For many years, domestic and international many scholars are being devoted to the research of line fault positioner, and its emphasis is the degree of accuracy how improving locating device.But positioning product practical at present exists many problems in positioning precision and Reliability of Microprocessor etc. to be had to be solved, be difficult to meet the requirement running on-the-spot high precision localization of fault.
Summary of the invention
Technical matters solved by the invention: in the process of the research propagation characteristic of electromagnetic wave on lossy uniform transmission lines, how accurately measuring-signal time delay.
The invention provides following technical scheme: one device for accurately measuring signal delay time, comprise and compare amplifying unit, signal processing unit, microprocessing unit, display unit, the described amplifying unit that compares is connected with signal processing unit, described signal processing unit is connected with microprocessing unit, described microprocessing unit is connected with display unit, the described amplifying unit that compares comprises voltage compare amplifier, the function of described signal processing unit is completed by programmable logic device (PLD), and described microprocessing unit comprises microprocessor.
The device for accurately measuring of signal delay time is mainly in order to accurately test time delay.Specifically, the device for accurately measuring of signal delay time mainly measures the time propagating into terminal from transmission line top, and propagates into terminal goes back to top again time from end reflection from transmission line top.Whole device by compare amplifying unit, signal processing unit, microprocessing unit and display unit four part form.This device first will be converted to digital signal by comparison amplifier time delay, then give programmable logic device (PLD) and carry out signal transacting, then be calculated by microprocessor and will control, finally result be shown by display unit.
Further illustrate as of the present invention, described display unit comprises one group of light-emitting diode display, and described light-emitting diode display is driven by display circuit.The signal of two comparison amplifier outputs is after signal processing unit processes, and what obtain is a binary number reflecting time delay, and display unit is exactly to be shown intuitively by this number.There are two kinds of methods can show this number: a kind of method is by diode displaying out; Another kind method is shown by one group of light-emitting diode display.The preferred light-emitting diode display of the present invention.
As a further improvement on the present invention, described display circuit comprises microprocessor, crystal oscillating circuit, reset circuit, three display driver chips one, a display driver chip two, light-emitting diode display, capacitor filter, power supply, described crystal oscillating circuit is connected with microprocessor with reset circuit, described three display driver chips one are connected with microprocessor respectively, a described display driver chip two is connected with microprocessor, described display driver chip two is connected with pull-up resistor, described light-emitting diode display is connected with display driver chip one and display driver chip two, the chip selection signal of described light-emitting diode display is through display driver chip one, the section of described light-emitting diode display selects signal through display driver chip two, described capacitor filter is attempted by the power input of display driver chip two.The method of some bright display has Static and dynamic two kinds, and the present invention adopts dynamic display method, because LED Dynamic Announce electric current is very large, enough goes lotus root measure, then often cause misoperation because dynamic current is excessive if do not take on Power Management Design.The present invention passes through at display driver chip two power input and connects large bulk capacitance wave filter, to avoid LED Dynamic Announce to cause misoperation because dynamic current is excessive, ensures that LED Dynamic Announce accurately, reliably.
Accompanying drawing explanation
Below in conjunction with accompanying drawing, the present invention is described further:
Fig. 1 is the structural representation of the present invention's device for accurately measuring a kind of signal delay time;
Fig. 2 is the circuit theory diagrams of the display circuit of light-emitting diode display.
Symbol description in figure:
10-compares amplifying unit;
20-signal processing unit;
30-microprocessing unit; 300-microprocessor; 301-crystal oscillating circuit; 302-reset circuit;
40-display unit; 400-LED display; 401-display driver chip one; 402-display driver chip two;
C-electric capacity; C0-capacitor filter;
R-resistance.
Embodiment
As shown in Figure 1, one device for accurately measuring signal delay time, comprises and compares amplifying unit 10, signal processing unit 20, microprocessing unit 30, display unit 40.The described amplifying unit 10 that compares is connected with signal processing unit 20, and described signal processing unit 20 is connected with microprocessing unit 30, and described microprocessing unit 30 is connected with display unit 40.
The described amplifying unit 10 that compares comprises voltage compare amplifier, relatively the effect of amplifying unit compares the voltage of input, and the voltage of high and low two level is exported according to comparative result, with the satisfied digital circuit connected below to the requirement of 1 and 0 two logic level, complete primarily of comparison amplifier.Comparison amplifying unit in the present invention is formed with integrated voltage compare amplifier MAX9686 and peripheral circuit thereof.Relatively the specific implementation circuit of amplifier section is made up of two MAX9686 and peripheral circuit thereof, and the circuit theory diagrams of two comparers are identical.
The function of described signal processing unit 20 is completed by programmable logic device (PLD).Programmable logic device (PLD) is divided into complex programmable logic device (CPLD) and on-site programmable gate array FPGA two class, the preferred CPLD of the present invention.
Described microprocessing unit 30 comprises microprocessor 300, the preferred AT89C51 of the present invention.
Described display unit 40 comprises one group of light-emitting diode display 400.
As shown in Figure 2, described light-emitting diode display 400 is driven by display circuit, described display circuit comprises microprocessor 300, crystal oscillating circuit 301, reset circuit 302, three display driver chips 1, a display driver chip 2 402, light-emitting diode display 400, capacitor filter C0, power supply, described crystal oscillating circuit 301 is connected with microprocessor 300 with reset circuit 302, described three display driver chips 1 are connected with microprocessor 300 respectively, a described display driver chip 2 402 is connected with microprocessor 300, described display driver chip 2 402 is connected with pull-up resistor R, described light-emitting diode display 400 is connected with display driver chip 1 and display driver chip 2 402, chip selection signal CS1 ~ the CS3 of described light-emitting diode display 400 is through display driver chip 1, the section of described light-emitting diode display 400 selects signal DATA1 ~ DATA7 through display driver chip 2 402, described capacitor filter C0 is attempted by the power input of display driver chip 2 402.
Wherein, described display driver chip 1 selects 74ALS05, and described display driver chip 2 402 selects 74LS244.
The principle of work of above-mentioned display circuit is as follows: 8 bits that the counter in the pulse width measuring module in the device for accurately measuring of drive singal time delay exports are connected with microprocessor 300 by controlled triple gate, microprocessor 300 reads this and to count and after remaining on internal data memory, control triple gate by P1.0, counter is exported P0 mouth and keeps high-impedance state.Microprocessor 300 first will carry out two ~ decimal system to the binary number preserved and transform, respectively by hundred, ten, individual position is kept in the different address locations of data-carrier store, then through software decoding, by display driver chip 1 and display driver chip 2 402 driving LED display 400, individual, ten, hundred numeral is presented on light-emitting diode display 400 successively.Only depict a circuit theory diagrams for position light-emitting diode display 400 in fig. 2, ten and hundred except chip selection signal, (individual position chip selection signal is CS1, ten chip selection signals are CS2, and hundred chip selection signals are CS3) outside difference, the connection of other pin is identical with a position light-emitting diode display 400.Chip selection signal CS1 ~ the CS3 of light-emitting diode display 400 is produced by P1.1, P1.2, P1.3 of microprocessor 10, by software delay 1ms, to three light-emitting diode display 400 dynamic scans.Section selects signal DATA1 ~ DATA7 (being d0 ~ d7 after display driver chip 2 402) to be produced by P0 mouth, through display driver chip 2 402, adds pull-up resistor R driving LED display 400 afterwards.
In practical study, signal delay time of the present invention, the device for accurately measuring course of work was as follows: will be converted to digital signal by comparison amplifier time delay, then give programmable logic device (PLD) and carry out signal transacting, then calculated by microprocessor 300 and control, finally by light-emitting diode display 400, result being shown.
Above content is only better embodiment of the present invention, and for those of ordinary skill in the art, according to thought of the present invention, all will change in specific embodiments and applications, this description should not be construed as limitation of the present invention.
Claims (3)
1. one kind signal delay time device for accurately measuring, comprise and compare amplifying unit (10), signal processing unit (20), microprocessing unit (30), display unit (40), it is characterized in that: the described amplifying unit (10) that compares is connected with signal processing unit (20), described signal processing unit (20) is connected with microprocessing unit (30), described microprocessing unit (30) is connected with display unit (40), the described amplifying unit (10) that compares comprises voltage compare amplifier, the function of described signal processing unit (20) is completed by programmable logic device (PLD), described microprocessing unit (30) comprises microprocessor (300).
2. one device for accurately measuring signal delay time as claimed in claim 1, is characterized in that: described display unit (40) comprises one group of light-emitting diode display (400).
3. one device for accurately measuring signal delay time as claimed in claim 2, it is characterized in that: described light-emitting diode display (400) is driven by display circuit, described display circuit comprises microprocessor (300), crystal oscillating circuit (301), reset circuit (302), three display driver chips one (401), a display driver chip two (402), light-emitting diode display (400), capacitor filter (C0), power supply, described crystal oscillating circuit (301) is connected with microprocessor (300) with reset circuit (302), described three display driver chips one (401) are connected with microprocessor (300) respectively, a described display driver chip two (402) is connected with microprocessor (300), described display driver chip two (402) is connected with pull-up resistor (R), described light-emitting diode display (400) is connected with display driver chip one (401) and display driver chip two (402), chip selection signal (the CS1 of described light-emitting diode display (400), CS2, CS3) through display driver chip one (401), the section of described light-emitting diode display (400) selects signal (DATA1 ~ DATA7) through display driver chip two (402), and described capacitor filter (C0) is attempted by the power input of display driver chip two (402).
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| CN201410513261.3A CN104267285A (en) | 2014-09-29 | 2014-09-29 | Accurate measurement device for signal delay time |
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| CN201410513261.3A CN104267285A (en) | 2014-09-29 | 2014-09-29 | Accurate measurement device for signal delay time |
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Patent Citations (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN201035143Y (en) * | 2007-05-18 | 2008-03-12 | 重庆大学 | Digital type microwave declined displacement measurement device |
| CN201615802U (en) * | 2010-02-05 | 2010-10-27 | 上海伟器光电科技有限公司 | Multi-channel LED pin temperature detector |
| US8483079B2 (en) * | 2010-02-19 | 2013-07-09 | Fuji Xerox Co., Ltd. | Signal processing system, signal processing apparatus, signal processing program for test measurement |
| CN202339482U (en) * | 2011-11-17 | 2012-07-18 | 成都可为科技发展有限公司 | Real-time clock display system based on IRIG-B (inter-range instrumentation group-B) code |
| CN103134397A (en) * | 2013-02-08 | 2013-06-05 | 前进民爆股份有限公司 | Method and time-measurement instrument of optically measuring time delay of digital electronic detonator powder explosion detonation |
| CN103134398A (en) * | 2013-02-08 | 2013-06-05 | 前进民爆股份有限公司 | Method and time measuring instrument for measuring detonation delaying of digital electronic detonator through mechanics |
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