CN104237695B - Probe service life testing mechanism - Google Patents
Probe service life testing mechanism Download PDFInfo
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- CN104237695B CN104237695B CN201410495081.7A CN201410495081A CN104237695B CN 104237695 B CN104237695 B CN 104237695B CN 201410495081 A CN201410495081 A CN 201410495081A CN 104237695 B CN104237695 B CN 104237695B
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- pressure head
- probe
- probes
- base
- contiguous block
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Abstract
The invention relates to a testing mechanism. A pressing module of the testing mechanism is mounted on the back side of the upper portion of a base; a probe die holder is mounted on the base; and probes are mounted on the probe die holder movably. A counter is mounted on the upper portion of a front side plate of the pressing module. A power switch, a start button and a buzzer are mounted on the base. After the power switch is turned on, a pressing cylinder of the pressing module is in a reset state, the counter is reset, the pressing module runs to press the probes until the probes retract to a corresponding position once the start button is pushed, and then the counter begins counting and the pressing module rises, and so on, the pressing module stops pressing until the buzzer sends an alarm, at this time, the probes are damaged, values displayed on the counter refer to the service lives of the probes. The testing mechanism can be used for sampling different types of probes and testing service life values of various probes. With the testing mechanism, production efficiency and product test accuracy are improved, judgment mistakes caused by application of counterfeit probes are reduced, and probes going to be scraped can be changed in time.
Description
Technical field:
The present invention relates to a kind of probe life test mechanism.
Background technology:
Now because there being the probe much copied on market, the service life of a lot of probes differs, in prior art not
The life value of the various probes bought can be detected, the quality of product will be affected using the erroneous judgement caused by imitative product probe, nor
Change the probe that will scrap in time, affect follow-up work it is therefore necessary to design a kind of probe life test mechanism, thus
Improve the accuracy rate of test product.
Content of the invention:
The purpose of the present invention be for the deficiencies in the prior art in place of, provide a kind of probe life test mechanism, by difference
The probe of model is installed on probe die holder and carries out sampling observation test, and its structure is simple, easy to use, can measure the life-span of probe
Value.
The technology solution of the present invention is as follows:
A kind of probe life test mechanism, it includes base and pushes module, and the described module that pushes is arranged on base top
Rear side, described base is provided with a probe die holder, probe die holder is movably installed with probe.
The described module that pushes includes front side board, lower air cylinder, push pedal, longitudinal slide rail, longitudinal sliding block, contiguous block, pressure head even
Connect block, pressure head mounting blocks, pressure head slide rail, pressure head slide block and pressure head, described front side board is fixedly mounted on base plate, described under calm the anger
Cylinder and longitudinal slide rail are arranged on the back of front side board, and cooperation in longitudinal slide rail is provided with longitudinal sliding block；The work of described lower air cylinder
Stopper rod lower end is connected to push pedal, and push pedal lower end is connected to pressure head contiguous block；On described longitudinal sliding block, contiguous block is installed, and connects
Block is fixedly mounted on the bottom of pressure head contiguous block；The front portion of described pressure head contiguous block passes through from front side board, pressure head contiguous block
Front end is connected to pressure head mounting blocks, and described pressure head mounting blocks are provided with pressure head slide block, and the cooperation of pressure head slide rail is arranged on pressure head and slides
On block, and pressure head slide rail is linked together with pressure head；Described pressure head is located at the surface of probe；Described front side board top is provided with
Enumerator；On and off switch, start button and buzzer are provided with described base.
After described on and off switch is opened, lower air cylinder is in reset state, counter O reset, then presses start button, under
Pressing mold group works, and pushes probe to probe and retracts to corresponding position, enumerator starts counting up, and then pushes module and rises, such as
This circulation work, until buzzer warning, pushes module and stops pushing, now probe has damaged, and reads counter values, this
Numerical value is exactly the life value of probe.
Preferably, described probe die holder is spirally connected and is fixed on base.
Preferably, described probe has two or more.
Preferably, the rear portion both sides of described front side board are separately installed with left and right side plate, and left and right side plate is fixed on bottom
On seat.
The beneficial effects of the present invention is:
Volume of the present invention is moderate can be to use on work platform for placing, and mechanism stable is reliable, the probe that will be tested
It is attached on probe die holder, turn on the power switch, cylinder playback Aligning control, counter O reset, both hands press start button, dip mold
Group work, presses at probe advanced position, enumerator starts counting up, and pushes module and rises, and so circulation work is up to buzzing
Device is reported to the police, and pushes module and stops pushing, illustrates that probe has damaged, read counter values, this numerical value is exactly the life-span of probe
Value, knows after life value using this kind of probe test, can timely change, when test, the probe that will scrap, with
Exempt to affect follow-up test.The probe life-span of different model equally presses this step operation.
Mechanism can detect the life value of the various probes of purchase, thus substantially increasing production efficiency and test product
Accuracy rate, reduce because using the erroneous judgement caused by imitative product probe, the probe that will scrap can be changed in time.
Brief description:
The present invention is described further below in conjunction with the accompanying drawings:
Fig. 1 is the structural representation of the present invention；
Fig. 2 is the top view of Fig. 1；
Fig. 3 is the structural representation pushing module of the present invention, (not including front side board)；
Fig. 4 is the structural representation of the probe die holder of the present invention.
Specific embodiment:
Embodiment, is shown in accompanying drawing 1～4, a kind of probe life test mechanism, and it includes base 1 and pushes module, described under
Pressing mold group is arranged on rear side of base top, described base is bolted and fixed with a probe die holder 2, probe die holder is movably installed with
Probe 3, probe has two.
Described push module include front side board 4, lower air cylinder 5, push pedal 6, longitudinal slide rail 7, longitudinal sliding block 8, contiguous block 9,
Pressure head contiguous block 10, pressure head mounting blocks 11, pressure head slide rail 12, pressure head slide block 13 and pressure head 14, described front side board is fixedly mounted on
On base plate, the rear portion both sides of front side board are separately installed with left and right side plate 15,16, and left and right side plate is fixed on base, is easy to
Entirely push the stability of module.
Described lower air cylinder and longitudinal slide rail are arranged on the back of front side board, and cooperation in longitudinal slide rail is provided with longitudinal cunning
Block；The piston-rod lower end of described lower air cylinder is connected to push pedal, and push pedal lower end is connected to pressure head contiguous block；On described longitudinal sliding block
Contiguous block is installed, and contiguous block is fixedly mounted on the bottom of pressure head contiguous block；The front portion of described pressure head contiguous block is from front side board
On through the front end of pressure head contiguous block is connected to pressure head mounting blocks, and described pressure head mounting blocks are provided with pressure head slide block, and pressure head is slided
Rail cooperation is arranged on pressure head slide block, and pressure head slide rail is linked together with pressure head；Described pressure head is located at the surface of probe；Institute
State front side board top and enumerator 17 is installed；On and off switch 18, start button 19 and buzzer 20 are provided with described base.
Operation principle of the present invention: after turning on the power switch, lower air cylinder is in reset state, counter O reset, then presses
Start button, pushes module work, pushes probe to probe and retract to corresponding position, enumerator starts counting up, and then pushes
Module rises, and so circulation work, until buzzer warning, pushes module and stops pushing, now probe has damaged, and reads meter
Number device numerical value, this numerical value is exactly the life value of probe.
Above-described embodiment is the specific descriptions that the present invention is carried out, and simply the present invention is further described it is impossible to manage
Solve as limiting the scope of the present invention, it is nonessential that those skilled in the art makes some according to the content of foregoing invention
Improve and adjustment each falls within protection scope of the present invention.
Claims (4)
1. a kind of probe life test mechanism, it includes base and push module, described pushes after module is arranged on base top
Side it is characterised in that: a probe die holder is provided with described base, probe die holder is movably installed with probe；
Described push module include front side board, lower air cylinder, push pedal, longitudinal slide rail, longitudinal sliding block, contiguous block, pressure head contiguous block,
Pressure head mounting blocks, pressure head slide rail, pressure head slide block and pressure head, described front side board is fixedly mounted on base plate, described lower air cylinder and
Longitudinal slide rail is arranged on the back of front side board, and cooperation in longitudinal slide rail is provided with longitudinal sliding block；The piston rod of described lower air cylinder
Lower end is connected to push pedal, and push pedal lower end is connected to pressure head contiguous block；On described longitudinal sliding block, contiguous block is installed, and contiguous block is solid
Dingan County is contained in the bottom of pressure head contiguous block；The front portion of described pressure head contiguous block passes through from front side board, the front end of pressure head contiguous block
It is connected to pressure head mounting blocks, described pressure head mounting blocks is provided with pressure head slide block, the cooperation of pressure head slide rail is arranged on pressure head slide block,
And pressure head slide rail is linked together with pressure head；Described pressure head is located at the surface of probe；Described front side board top is provided with counting
Device；On and off switch, start button and buzzer are provided with described base；
After described on and off switch is opened, lower air cylinder is in reset state, counter O reset, then presses start button, dip mold
Group work, pushes probe to probe and retracts to corresponding position, enumerator starts counting up, and then pushes module and rises, so follows
Ring work, until buzzer warning, pushes module and stops pushing, now probe has damaged, and reads counter values, this numerical value
It is exactly the life value of probe.
2. a kind of probe life test mechanism according to claim 1 it is characterised in that: described probe die holder is spirally connected fixation
On base.
3. a kind of probe life test mechanism according to claim 1 it is characterised in that: described probe has two or more.
4. a kind of probe life test mechanism according to claim 1 it is characterised in that: the rear portion both sides of described front side board
It is separately installed with left and right side plate, and left and right side plate is fixed on base.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201410495081.7A CN104237695B (en) | 2014-09-24 | 2014-09-24 | Probe service life testing mechanism |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201410495081.7A CN104237695B (en) | 2014-09-24 | 2014-09-24 | Probe service life testing mechanism |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN104237695A CN104237695A (en) | 2014-12-24 |
| CN104237695B true CN104237695B (en) | 2017-01-25 |
Family
ID=52226168
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201410495081.7A Active CN104237695B (en) | 2014-09-24 | 2014-09-24 | Probe service life testing mechanism |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN104237695B (en) |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP7175171B2 (en) * | 2018-12-12 | 2022-11-18 | 東京エレクトロン株式会社 | PROBE CARD MANAGEMENT SYSTEM AND PROBE CARD MANAGEMENT METHOD |
| CN113483804A (en) * | 2021-06-04 | 2021-10-08 | 深圳市正源翔工业智能有限公司 | Probe life test machine |
Citations (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH04361543A (en) * | 1991-06-10 | 1992-12-15 | Mitsubishi Electric Corp | Prober |
| US6091253A (en) * | 1997-01-24 | 2000-07-18 | Acer Peripherals, Inc. | Jig for electrically bridging between a circuit board and a tester during testing of the circuit board |
| TW581257U (en) * | 2002-10-03 | 2004-03-21 | Shun-Shiu Su | Switch lifetime testing machine |
| CN101441625A (en) * | 2007-11-23 | 2009-05-27 | 上海华虹Nec电子有限公司 | Probe card tester in silicon wafer characteristic test and method for counting use amount of probe card |
| CN201681417U (en) * | 2010-03-22 | 2010-12-22 | 华润赛美科微电子(深圳)有限公司 | Needle inserting frequency counting device of probe card and probe card |
| CN102707221A (en) * | 2011-04-22 | 2012-10-03 | 苏州市科林源电子有限公司 | PCB (Printed Circuit Board) test fixture for fully utilizing service life of probe at one time |
| CN102768348A (en) * | 2012-07-10 | 2012-11-07 | 中南大学 | System for automatically testing service life of probe |
| CN203422440U (en) * | 2013-09-13 | 2014-02-05 | 苏州精实电子科技有限公司 | Probe-type electrical test fixture |
| CN203759196U (en) * | 2013-12-23 | 2014-08-06 | 苏州路之遥科技股份有限公司 | ICT test fixture with probe use number recording |
-
2014
- 2014-09-24 CN CN201410495081.7A patent/CN104237695B/en active Active
Patent Citations (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH04361543A (en) * | 1991-06-10 | 1992-12-15 | Mitsubishi Electric Corp | Prober |
| US6091253A (en) * | 1997-01-24 | 2000-07-18 | Acer Peripherals, Inc. | Jig for electrically bridging between a circuit board and a tester during testing of the circuit board |
| TW581257U (en) * | 2002-10-03 | 2004-03-21 | Shun-Shiu Su | Switch lifetime testing machine |
| CN101441625A (en) * | 2007-11-23 | 2009-05-27 | 上海华虹Nec电子有限公司 | Probe card tester in silicon wafer characteristic test and method for counting use amount of probe card |
| CN201681417U (en) * | 2010-03-22 | 2010-12-22 | 华润赛美科微电子(深圳)有限公司 | Needle inserting frequency counting device of probe card and probe card |
| CN102707221A (en) * | 2011-04-22 | 2012-10-03 | 苏州市科林源电子有限公司 | PCB (Printed Circuit Board) test fixture for fully utilizing service life of probe at one time |
| CN102768348A (en) * | 2012-07-10 | 2012-11-07 | 中南大学 | System for automatically testing service life of probe |
| CN203422440U (en) * | 2013-09-13 | 2014-02-05 | 苏州精实电子科技有限公司 | Probe-type electrical test fixture |
| CN203759196U (en) * | 2013-12-23 | 2014-08-06 | 苏州路之遥科技股份有限公司 | ICT test fixture with probe use number recording |
Also Published As
| Publication number | Publication date |
|---|---|
| CN104237695A (en) | 2014-12-24 |
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Address after: The Wujiang economic and Technological Development Zone West Road Wujiang District of Suzhou City, Jiangsu Province, No. 666 215200 Patentee after: Bo Seiko Polytron Technologies Inc Address before: The Wujiang economic and Technological Development Zone West Road Wujiang District of Suzhou City, Jiangsu Province, No. 666 215200 Patentee before: Suzhou Bozhong Precision Industry Technology Co., Ltd. |