CN104198833B - Special pattern automates the detecting system and its method of identification - Google Patents
Special pattern automates the detecting system and its method of identification Download PDFInfo
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- CN104198833B CN104198833B CN201410343029.XA CN201410343029A CN104198833B CN 104198833 B CN104198833 B CN 104198833B CN 201410343029 A CN201410343029 A CN 201410343029A CN 104198833 B CN104198833 B CN 104198833B
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- 238000000034 method Methods 0.000 title claims abstract description 17
- 238000001514 detection method Methods 0.000 claims abstract description 31
- 238000005259 measurement Methods 0.000 claims abstract description 25
- 238000012423 maintenance Methods 0.000 claims abstract description 19
- 238000007689 inspection Methods 0.000 claims description 15
- 238000004458 analytical method Methods 0.000 claims description 14
- 239000011469 building brick Substances 0.000 abstract 6
- 238000010586 diagram Methods 0.000 description 9
- 238000012360 testing method Methods 0.000 description 5
- 230000002159 abnormal effect Effects 0.000 description 4
- 238000013461 design Methods 0.000 description 3
- 238000009825 accumulation Methods 0.000 description 1
- 230000005540 biological transmission Effects 0.000 description 1
- 239000003990 capacitor Substances 0.000 description 1
- 238000004590 computer program Methods 0.000 description 1
- 238000010276 construction Methods 0.000 description 1
- 238000007405 data analysis Methods 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 230000003287 optical effect Effects 0.000 description 1
- 238000003909 pattern recognition Methods 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 230000003068 static effect Effects 0.000 description 1
- 238000012549 training Methods 0.000 description 1
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Abstract
It can be used for the detecting system and its method during electronic product maintenance conditions the present invention relates to one kind,It mainly ties up to the part electronic building brick neighbour side to be measured of a product to be measured and is installed with a special pattern,And when there is product to be measured to be detected,The mobile device of detecting system is controlled by a control device and is moved to product appropriate location to be measured,And by an image acquisition module in mobile device to obtain the special pattern of a certain electronic building brick to be measured,One analytical equipment then can find the electronic building brick data related with the electronic building brick to be measured via the special pattern data captured from database,And measurement module can carry out the measuring program of electronic building brick to be measured according to found out corresponding electronic building brick data one of in mobile device,And sequentially obtain a measuring value and a fiducial value,Thus reach automatic detection and mantenance data systematization,And contribute to the purpose of bad case study.
Description
[ technical field ] A method for producing a semiconductor device
The present invention relates to a detection system and method thereof, and more particularly, to a detection system and method thereof for automatically identifying a specific pattern for electronic product maintenance or factory inspection.
[ background of the invention ]
The maintenance of the conventional electronic products requires manual and direct measurement of the products by operators, but the design of each product is different, so the position of the object to be measured is different from the measurement project, and the operators need to check the products through additional training, product-related documents and design data for various new products. During maintenance and inspection or factory inspection, personnel need to determine whether the product to be detected is normal or abnormal through a measuring instrument or an oscilloscope, and in the detection process, besides personnel errors, measurement values and maintenance data from the measurement to the maintenance completion are not recorded, so that the result of low detection efficiency is generally generated.
In a conventional maintenance and inspection process of electronic products, as shown in fig. 1, in step S101, when a company receives an abnormal product requiring maintenance and inspection or a product to be shipped from a factory for inspection, a circuit diagram record in a database must be started to query the positions of components related to the product to be inspected and the positions to be measured and inspected, in step S102. Then, in step S103, the conventional electronic product maintenance personnel need to measure the product manually. In the past, maintenance personnel need to measure through a measuring instrument and automatically judge whether the product is qualified or wrong. In general, the measurement values from the measurement to the maintenance completion are not recorded, and data analysis and experience accumulation cannot be performed.
[ summary of the invention ]
In view of the above problems, the present invention provides a detection system and method for automatically recognizing a special pattern, which can automatically perform a measurement operation after actively detecting a special pattern on a product to be measured by a measurement instrument, without adding or modifying measurement procedures for various products, and only by defining in advance a standard range value of an item to be measured of an electronic component corresponding to each pattern: such as voltage, current or resistance, etc., thereby saving labor and time cost for maintenance and inspection, increasing measurement accuracy and data systematization, and simultaneously recording measurement values and being helpful for analyzing bad problems.
In view of the above, the present invention provides a detection system for automatically recognizing a special pattern, which comprises: one or more special patterns fixed adjacent to an electronic component to be tested of a product to be tested; a control device; a mobile device electrically connected to the control device and having an image capturing module and a measuring module, wherein the image capturing module can capture the special pattern and generate a pattern image data, and the measuring module can measure the electronic component to be measured according to an electronic component data and obtain a measurement side value; and an analyzer electrically connected to the controller and having a database for storing one or more electronic component data corresponding to the special pattern, and a determiner for receiving the pattern image data and the measured side value and generating a comparison value according to the measured value and the electronic component data.
In addition, to achieve the above object, the present invention provides a method for detecting automatic recognition of a special pattern, which comprises: fixing a special pattern on the adjacent side of an electronic component to be tested of a product to be tested; providing a mobile device connected with a control device, wherein the mobile device is provided with an image capturing module and a measuring module; providing an analysis device connected with the control device, wherein the analysis device is provided with a database and a judger; storing at least one electronic component data corresponding to each special pattern in the database; moving the mobile device to a proper position of the product to be tested, capturing the special pattern adjacent to the electronic component to be tested by the image capturing module, and generating a pattern image data; the judger receives the pattern image data and finds out the electronic component data corresponding to the pattern image data; the measuring module measures the electronic component to be measured according to the electronic component data and obtains a measuring value; the measured value is transmitted to the judger, and the judger compares the measured value with the electronic component data to generate a comparison value.
In another embodiment of the present invention, the electronic component data includes a specific pattern, a detected position, a strain measurement item, a component characteristic, a component setting value or a standard range value.
In another embodiment of the present invention, the analysis device includes an alarm.
In yet another embodiment of the present invention, the analyzing device comprises an analyzer.
In yet another embodiment of the present invention, the pattern image data, the measured value and the comparison value can be stored in the database.
In another embodiment of the present invention, the special pattern can be a figure, a symbol, a number or a letter.
In another embodiment of the present invention, the mobile device can be a one-dimensional mobile device or a multi-dimensional mobile device.
The automatic special pattern recognition and detection system as described above, wherein the moving device can be a one-dimensional moving device, a two-dimensional moving device or a three-dimensional moving device, and the moving system composed of a sliding rail, a transmission belt and a servo motor can be automatically controlled by a computer program to move and position the moving device; the database can be a hard disk, flash memory, erasable optical disk or any type of recording medium, and can store the measurement items of each electronic component to be tested, and can set different detection items according to the characteristics of different products or electronic components to be tested, such as the measurement of voltage, current or resistance value, etc.; the judger can be a microprocessor or an arithmetic unit; the analyzer can be a microprocessor or arithmetic unit; the image capturing module can be a CCD/CMOS camera, a web camera (Webcam) or various dynamic/static digital image photographing devices; the electronic device to be tested can be a display adapter, a sound card, a motherboard or any possible electronic equipment; the electronic component under test may be at least one transistor, integrated circuit, resistor, inductor, capacitor, diode, relay, transformer, battery, power supply, switch, or a combination thereof; the special pattern (ICON) corresponding to the electronic component to be tested can be at least one pattern with any different shape, geometric figure or combination thereof, and fig. 6 is an example of the automatic recognition pattern of the present invention.
[ description of the drawings ]
The present invention will be described in further detail with reference to the accompanying drawings and embodiments.
FIG. 1 is a flow chart of a conventional electronic product maintenance inspection process.
FIG. 2 is a schematic diagram of an embodiment of an automated identification and detection system according to the present invention.
FIG. 3 is a schematic diagram of another embodiment of the automated identification and detection system of the present invention.
FIG. 4 is a schematic diagram of an automated identification and detection system according to another embodiment of the present invention.
FIG. 5 is a flow chart of the automated identification and inspection system of the present invention during inspection.
FIG. 6 is a schematic diagram of a portion of an automated identification pattern (ICON) according to the present invention.
Description of the main component symbols:
1.20 detection System
2.21 control device
3.23 moving device
4.231 image capturing module
5.233 measuring module
6.2335 measurement
7.25 analytical equipment
8.251 database
9.2511 electronic component data
10.253 decision device
11.2535 comparison value
12.27 Special design
13.271 image data
14.29 Special Pattern
15.200 product to be tested
16.201 electronic component to be tested
17.203 electronic component to be tested
18.30 detection System
19.355 warning device
20.40 detection System
21.457 Analyzer
[ detailed description ] embodiments
The embodiments of the present invention will be described in detail below with reference to the accompanying drawings, and the present invention will be fully understood from the following description of the embodiments, so that those skilled in the art can make this invention. The same symbols represent members or devices having the same or similar functions.
First, please refer to fig. 2 and fig. 5, which are a schematic structural diagram and a schematic flow chart of an embodiment of an automatic identification and detection system according to the present invention. The detection system 20 for automatic recognition of the special pattern comprises a control device 21, a moving device 23, an analyzing device 25 and one or more special patterns 27, 29. The control device 21 is electrically connected to the moving device 23 and the analyzing device 25, respectively.
The mobile device 23 with one-dimensional or multi-dimensional movement function is provided with an image capturing module 231 and a measuring module 233, and the image capturing module 231 and the measuring module 233 are connected and can be operated by the command of the control device 21. The analysis device 25 is provided with a database 251 and a determination device 253, the database 251 stores an electronic component data 2511, and the electronic component data 2511 records a special pattern, a detection position, an item to be measured, a component characteristic, a component setting value and/or a standard range value (or a fault-tolerant range value) corresponding to one or more electronic components 201, 203 of one or more products 200 to be measured, as shown in step S501. The special patterns 27, 29 can be respectively fixed on the adjacent sides of the electronic components 201, 203 of the corresponding product 200.
When a product to be inspected leaves the factory or a product to be repaired or inspected waits for the product 200 to be inspected, in step S502, the control device 21 of the inspection system 20 controls the moving device 23 to move to a proper position of the product 200 to be inspected, and the image capturing module 231 captures an image of the product 200 to be inspected. When the image of the special pattern 27 is captured or captured, a pattern image data 271 is obtained accordingly (step S503).
The pattern image data 271 is transmitted to the determiner 253 of the analysis device 25, and at this time, the determiner 253 compares the pattern image data 271 with the electronic component data 2511 stored in the database 251 to obtain the type, the detection position, the measurement item and/or the standard range value of the electronic component to be measured corresponding to the pattern image data 271 (step S504).
The control device 21 will subsequently control the measurement module 233 in the mobile device 23 to measure the electronic component 201 according to the type, the detection position, and/or the item to be measured of the electronic component to be measured recorded in the electronic component data 2511, and thus obtain a measurement value 2335, in step S505.
The measured value 2335 is also sent to the determiner 253, and the determiner 253 compares the measured value 2335 with the standard range value recorded in the electronic component data 2511 to obtain a comparison value 2535. If the measured value 2335 does not exceed the standard range of the electronic component data 2511, it indicates that the electronic component 201 under test is functioning normally. On the contrary, if the measured value 2335 exceeds the standard range of the electronic component data 2511, it represents that the electronic component 201 to be tested is out of function and is to be disassembled for maintenance, in step S506.
The pattern image data 271, the measurement value 2335 and the comparison value 2535 may be stored in the database 251 in step S507.
Similarly, when the image capturing module 231 captures the image of the special pattern 29, a pattern image data 271 is obtained, the measuring value 2335 and the comparing value 2535 are obtained by the detecting system 20, and the pattern image data 271, the measuring value 2335 and the comparing value 2535 are stored in the database 251. If the measured value 2335 does not exceed the standard range of the electronic component data 2511, it indicates that the electronic component 203 under test is functioning normally. On the contrary, if the measured value 2335 exceeds the standard range of the electronic component data 2511, it represents that the electronic component 203 under test is out of function. Therefore, the purposes of automatic detection, systemization of maintenance data and contribution to analysis of bad problems are achieved.
Please refer to fig. 3, which is a schematic structural diagram of an automated identification and detection system according to another embodiment of the present invention. As shown, the difference from the previous embodiment is that: the analyzer 25 of the present embodiment is provided with an alarm 355, wherein the alarm 355 can be a sound component, a vibration component, a light source component and/or an electronic trigger component (such as a wireless remote control signal or a wired notification signal). The detection system 30 of this embodiment can also sequentially obtain the pattern image data 271, the measurement value 2335, and the comparison value 2535, and the pattern image data 271, the measurement value 2335, and the comparison value 2535 can be stored in the database 251. When the measured value 2335 exceeds the standard range of the electronic component data 2511, it represents that the function of the electronic component 203 under test is abnormal, and at this time, the control device 21 will control the alarm 355 to send out a warning signal to notify the operator or related personnel that the product has abnormal phenomena and must be repaired or replaced, thereby achieving the purpose of automatic detection and data maintenance systematization and being helpful for analyzing bad problems.
In addition, please refer to fig. 4, which is a schematic structural diagram of an automated identification and detection system according to another embodiment of the present invention. As shown, the difference from the previous embodiment is that: an analyzer 457 may be added to the analysis device 25 of this embodiment. The analyzer 457 can count and analyze the data such as the pattern image data 271, the measured value 2335, and the comparison value 2535 stored in the database 251, and can obtain an analysis data, thereby achieving the purposes of automatic detection, systemization of maintenance data, and contribution to analysis of bad problems.
Finally, please refer to fig. 6, which is a schematic diagram of a part of an automatic identification pattern (ICON) according to the present invention. The special patterns 27 and 29 of the present invention can be in various forms, such as a figure, a symbol, a number, or a letter, and each of the special patterns 27 and 29 can represent a to-be-tested electronic component 201 or 203 of a to-be-tested product 200.
Although the present invention has been described with reference to particular embodiments, it will be understood by those skilled in the art that various changes in form, construction, features and quantities may be made therein without departing from the spirit and scope of the invention as defined by the appended claims.
Claims (12)
1. A detection system for automatic identification of special patterns for electronic product maintenance, repair, inspection or factory inspection, comprising:
one or more special patterns fixed to an adjacent side of an electronic component to be tested of a product to be tested;
a control device;
a mobile device electrically connected to the control device and having an image capturing module and a measuring module; and
the analysis device is electrically connected with the control device and is provided with a database and a judger, wherein the database stores one or more electronic component data corresponding to the special pattern, and the electronic component data comprises one or more of a special pattern, a detection position, a strain item, a component characteristic, a component set value and a standard range value;
wherein,
the control device is used for controlling the mobile device to move to a proper position of the electronic component to be tested;
the image acquisition module is used for acquiring an image on the electronic component to be detected and generating pattern image data when acquiring the image of the special pattern;
the measuring module is controlled by the control device and is used for measuring the electronic component to be measured according to the electronic component data corresponding to the pattern image data so as to obtain a measuring value;
the judger is used for receiving the pattern image data and the measuring value and generating a comparison value according to the measuring value and the electronic component data.
2. The system of claim 1, wherein the analysis device comprises an alarm.
3. The system of claim 1, wherein the analysis device comprises an analyzer.
4. The system of claim 1, wherein the pattern image data, the measured values and the comparison values are stored in the database.
5. The system of claim 1, wherein the specific pattern is a figure, a symbol, a number or a letter.
6. The system of claim 1, wherein the mobile device is a one-dimensional mobile device or a multi-dimensional mobile device.
7. A detection method for automatic identification of special patterns for electronic product maintenance, repair and inspection or factory inspection is characterized by comprising the following steps:
fixing a special pattern on the adjacent side of an electronic component to be tested of a product to be tested;
providing a mobile device connected with a control device, wherein the mobile device is provided with an image capturing module and a measuring module;
providing an analysis device connected with the control device, wherein the analysis device is provided with a database and a judger;
storing at least one electronic component data corresponding to each special pattern in the database, wherein the electronic component data comprises a special pattern, a detection position, a strain item, a component characteristic, a component set value or a standard range value;
moving the mobile device to a proper position of the product to be detected, and capturing the special pattern on the adjacent side of the electronic component to be detected by the image capturing module, thereby generating pattern image data;
the judger receives the pattern image data and finds out the electronic component data corresponding to the pattern image data;
the measuring module measures the electronic component to be measured according to the electronic component data corresponding to the pattern image data and obtains a measuring value; and
the measured value is transmitted to the judger, and the judger compares the measured value with the electronic component data to generate a comparison value.
8. The method as claimed in claim 7, wherein the special pattern is a figure, a symbol, a number or a letter.
9. The method as claimed in claim 7, wherein the method comprises storing the image data, the measurement value and the comparison value in the database.
10. The method as claimed in claim 7, wherein the analyzing device further comprises an alarm.
11. The method as claimed in claim 7, wherein the analyzing device further comprises an analyzer.
12. The method as claimed in claim 7, wherein the electronic component data includes a specific pattern, a detected position, a measurement item, a component characteristic, a component setting value or a standard range value.
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| Application Number | Priority Date | Filing Date | Title |
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| CN201410343029.XA CN104198833B (en) | 2014-07-18 | 2014-07-18 | Special pattern automates the detecting system and its method of identification |
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| CN201410343029.XA CN104198833B (en) | 2014-07-18 | 2014-07-18 | Special pattern automates the detecting system and its method of identification |
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| CN104198833A CN104198833A (en) | 2014-12-10 |
| CN104198833B true CN104198833B (en) | 2018-05-29 |
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| CN105628710A (en) * | 2014-11-28 | 2016-06-01 | 浙江金徕镀膜有限公司 | Material detection system and detection method thereof |
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| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5481930A (en) * | 1994-01-19 | 1996-01-09 | Westinghouse Electric Corporation | Probe guide assembly for a reactor coolant pump motor |
| CN102233334A (en) * | 2010-04-21 | 2011-11-09 | 鸿劲科技股份有限公司 | Test device for electronic component test classifier |
| CN103090963A (en) * | 2011-11-07 | 2013-05-08 | 技嘉科技股份有限公司 | Volume detection method and volume detection device |
| CN103674959A (en) * | 2012-09-21 | 2014-03-26 | 英业达科技有限公司 | System and method for detecting electronic element on circuit board |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP3157047B2 (en) * | 1992-07-15 | 2001-04-16 | アジレント・テクノロジー株式会社 | Failure module identification method for electronic equipment |
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Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5481930A (en) * | 1994-01-19 | 1996-01-09 | Westinghouse Electric Corporation | Probe guide assembly for a reactor coolant pump motor |
| CN102233334A (en) * | 2010-04-21 | 2011-11-09 | 鸿劲科技股份有限公司 | Test device for electronic component test classifier |
| CN103090963A (en) * | 2011-11-07 | 2013-05-08 | 技嘉科技股份有限公司 | Volume detection method and volume detection device |
| CN103674959A (en) * | 2012-09-21 | 2014-03-26 | 英业达科技有限公司 | System and method for detecting electronic element on circuit board |
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