CN104198779B - Probe short-circuit signal detection device and signal generating method thereof - Google Patents
Probe short-circuit signal detection device and signal generating method thereof Download PDFInfo
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- CN104198779B CN104198779B CN201410398789.0A CN201410398789A CN104198779B CN 104198779 B CN104198779 B CN 104198779B CN 201410398789 A CN201410398789 A CN 201410398789A CN 104198779 B CN104198779 B CN 104198779B
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Abstract
The invention discloses a probe short-circuit signal detection device and a signal generating method thereof. According to the probe short-circuit signal detection device, a signal output end of a digital processing unit is connected with a signal input end of a digital analog converter, a signal output end of the digital analog converter is connected with a signal input end of a current-to-voltage converter, a signal output end of the current-to-voltage converter is connected with a signal input end of a bipolar voltage converter, a first signal output end of a datum reference source module is connected with a datum reference voltage input end of the digital analog converter, and a second signal output end of a datum reference source module is connected with a datum reference voltage input end of the bipolar voltage converter. According to the probe short-circuit signal detection device and the signal generating method thereof, complicated multiple order test waveforms can be conveniently produced, and the design of a complicated organic light emitting diode (OLED) panel is facilitated.
Description
Technical field
The present invention relates to the inspection of OLED (Organic Light-Emitting Diode, Organic Light Emitting Diode) relevant device
Survey technology field, in particular to a kind of probe short connection type signal detection apparatus and the signal generating method of the equipment.
Background technology
The structure and mode signal output of existing probe short connection type signal detection apparatus (Shortingbar) is relatively simple,
Its structure as described in Figure 1, including two programmable voltage sources, a variable connector and power amplifier, its course of work
For：First by two programmable voltage sources, it would be desirable to which two ranks of output set, now can simply regard two voltage sources as,
That is voltage V1 and voltage V2, subsequently enters 1 variable connector for going out and switches on voltage source V1 and voltage source V2 using one 2,
Past voltage is switched after rear class power amplification, you can be output as subscriber signal.Existing above-mentioned probe short connection type letter
Number testing equipment, may only export relatively simple single order test waveform, and this simple single order test waveform can be suitably used for letter
The design of single small-sized oled panel.But at present oled panel technology is reformed, large complicated oled panel is design
Direction.Above-mentioned existing probe short connection type signal detection apparatus cannot make corresponding multistage test waveform, it is difficult to meet big
The needs of the complicated oled panel design of type.
The content of the invention
Present invention aim to provide a kind of probe short connection type signal detection apparatus and the signal generation side of the equipment
Method, the apparatus and method can easily produce the multistage test waveform of complexity, facilitate the design of complicated oled panel.
In order to achieve this, the probe short connection type signal detection apparatus designed by the present invention, it is characterised in that：It includes number
Word processing device, digital to analog converter, electric current are to voltage changer, bipolar voltage changer and reference source module, the number
The signal output part of word processing device connects the signal input part of digital to analog converter, the signal output part connection electric current of digital to analog converter
To the signal input part of voltage changer, the signal output part of electric current to voltage changer connects the letter of bipolar voltage changer
Number input, the reference voltage input of the first signal output part connection digital to analog converter of the reference source module
End, the secondary signal outfan of reference source module connects the reference voltage input of bipolar voltage changer.
A kind of signal generating method of above-mentioned probe short connection type signal detection apparatus, it comprises the steps：
Step 1：Test waveform and the change frequency of the test waveform that digital processing unit is generated as needed, record respectively
The magnitude of voltage of waveform each change point and the persistent period of each change point, meanwhile, design in digital processing unit with it is above-mentioned
Need the corresponding point data table of test waveform for generating and redirect chained list, wherein, point data table is used to describe and needs what is generated
Test waveform is corresponding per rank voltage magnitude and corresponding persistent period, point data table include each dot address and
Corresponding magnitude of voltage and current value under each dot address；
It is described redirect chained list for control need how the test waveform for generating generates, redirect in chained list write difference at this
Value, be capable of achieving any-mode redirects and circulate perform, this redirects chained list includes chain table address, jump address, redirects meter
Number and point table address, wherein, chain table address is the address number of itself, is linearly incremented by one by one, is immobilized, and is not repeated；
When the jump address is used to record test waveform change, the chain table address corresponding to lower single order is pointed to；
The jump on count is used for when jump address is less than chain table address, and record redirects the number of times that chained list circulation is performed,
After reaching count value, perform downwards in order, when jump address is more than chain table address, it is invalid now to count, and works as jump address
During equal to chain table address, whole skip chain end of list (EOL), last item data voltage is constant, and the time is continued until that circulation performs week
The end of phase；
The dot address that described table address is used in measuring point tables of data；
The chain table address redirected in chained list is mutually corresponding with the dot address in point data table；
By above-mentioned point data table and the test waveform quantization that chained list generates above-mentioned needs is redirected in digital processing unit
For digital value, and the digital value is converted to into corresponding binary coding, then above-mentioned binary coding is stored to numeral
In the internal register of reason device；
Step 2：The binary coding that digital processing unit will be stored in internal register is transferred to digital to analog converter, while
Digital to analog converter receives the reference voltage that reference source module sends, and digital to analog converter joins binary coding in benchmark
In the presence of examining voltage, analog current waveshape signal is converted to；
Step 3：Above-mentioned analog current waveshape signal is sent to electric current to voltage changer by digital to analog converter, and electric current is to electricity
The analog current waveshape signal for receiving is converted into analog voltage waveshape signal by buckling parallel operation；
Step 4：Analog voltage waveshape signal is transferred to bipolar voltage changer by the electric current to voltage changer, together
When bipolar voltage changer receive the reference voltage that reference source module sends, bipolar voltage changer will be simulated
Voltage waveform signal is converted to and carry out after bipolar voltage signal 2 times and amplify and export, i.e., in the presence of reference voltage
The test waveform for needing to generate can be obtained.
Beneficial effects of the present invention：
The present invention is by design by digital processing unit, digital to analog converter, electric current to voltage changer, bipolar voltage conversion
The probe short connection type signal detection apparatus of device and reference source module composition, and design in digital processing unit and need to generate
The corresponding point data table of test waveform and redirect chained list so that the present invention can export any exponent number bipolar voltage test believe
Number waveform.Meanwhile, the present invention can flexibly tackle different applied environments, and the polarity of output voltage can be adjusted flexibly.In addition, this
It is bright using above-mentioned digital processing technology, the various test waveforms that large complicated oled panel design is wanted can be generated.
Description of the drawings
Fig. 1 is the structural representation of existing probe short connection type signal detection apparatus；
Fig. 2 is the structural representation of the present invention；
Fig. 3 is the waveform generting machanism logic chart of the present invention.
Wherein, 1-digital processing unit, 2-digital to analog converter, 3-electric current become to voltage changer, 4-bipolar voltage
Parallel operation, 5-reference source module.
Specific embodiment
Below in conjunction with the drawings and specific embodiments, the present invention is described in further detail：
Probe short connection type signal detection apparatus as shown in Figure 1, it includes digital processing unit 1, digital to analog converter 2, electric current extremely
Voltage changer 3, bipolar voltage changer 4 and reference source module 5, the signal output part of the digital processing unit 1 connects
The signal input part of digital to analog converter 2 is connect, the signal output part of digital to analog converter 2 connects the signal of electric current to voltage changer 3
Input, the signal input part of the signal output part connection bipolar voltage changer 4 of electric current to voltage changer 3, the base
Standard connects the reference voltage input of digital to analog converter 2, fiducial reference source mould with reference to the first signal output part of source module 5
The reference voltage input of the secondary signal outfan connection bipolar voltage changer 4 of block 5, above-mentioned digital processing unit 1
With internal register.
A kind of signal generating method of above-mentioned probe short connection type signal detection apparatus, it comprises the steps：
Step 1：Test waveform and the change frequency of the test waveform that digital processing unit 1 is generated as needed, remember respectively
The magnitude of voltage of record waveform each change point and the persistent period of each change point, meanwhile, design with digital processing unit 1
Stating needs the corresponding point data table of the test waveform (being specifically shown in Table 1) of generation and redirects chained list (being specifically shown in Table 2), wherein, points
The test waveform for being used to describe with need to generate according to table is corresponding per rank voltage magnitude and corresponding persistent period, point
Tables of data includes corresponding magnitude of voltage and current value under each dot address and each dot address；
It is described redirect chained list for control need how the test waveform for generating generates, redirect in chained list write difference at this
Value, be capable of achieving any-mode redirects and circulate perform, this redirects chained list includes chain table address, jump address, redirects meter
Number and point table address, wherein, chain table address is the address number of itself, is linearly incremented by one by one, is immobilized, and is not repeated, used as ID
(identity number) number is used；
When the jump address is used to record test waveform change, the chain table address corresponding to lower single order is pointed to, be capable of achieving
Turn function；
The jump on count is used for when jump address is less than chain table address, and record redirects the number of times that chained list circulation is performed,
After reaching count value, perform downwards in order, when jump address is more than chain table address, it is invalid now to count, and works as jump address
During equal to chain table address, whole skip chain end of list (EOL), last item data voltage is constant, and the time is continued until that circulation performs week
The end of phase；
The dot address that described table address is used in measuring point tables of data, equivalent to indexed addressing；
The chain table address redirected in chained list is mutually corresponding with the dot address in point data table；
By above-mentioned point data table and the test waveform quantization that chained list generates above-mentioned needs is redirected in digital processing unit 1
For digital value, and the digital value is converted to into corresponding binary coding, then above-mentioned binary coding is stored to numeral
In the internal register of reason device 1；
Step 2：Digital processing unit 1 will be stored in the binary coding in internal register and be transferred to digital to analog converter 2, together
When digital to analog converter 2 receive the reference voltage that reference source module 5 sends, digital to analog converter 2 exists binary coding
In the presence of reference voltage, analog current waveshape signal is converted to；Digital to analog converter 2 is received after digital quantity, by inside
Switching network, coordinate inside timeticks, corresponding variable-current amount can be produced, now waveform is in the form of the magnitude of current
It is present in digital to analog converter 2；
Step 3：Above-mentioned analog current waveshape signal is sent to electric current to voltage changer 3 by digital to analog converter 2, and electric current is extremely
The analog current waveshape signal for receiving is converted into analog voltage waveshape signal by voltage changer 3；
Step 4：Analog voltage waveshape signal is transferred to bipolar voltage changer 4 by the electric current to voltage changer 3,
Simultaneously bipolar voltage changer 4 receives the reference voltage that reference source module 5 sends, bipolar voltage changer 4
By analog voltage waveshape signal in the presence of reference voltage, (split with fiducial reference source voltage, i.e., joined with benchmark
Examine voltage and do subtraction), be converted to and carry out after bipolar voltage signal 2 times and amplify and export, you can obtain needing what is generated
Test waveform.
In above-mentioned technical proposal, the electric current to voltage changer 3 believes the analog current waveform of the 0～20mA for receiving
Number it is converted into the analog voltage waveshape signal of 0～3.3V.
In above-mentioned technical proposal, the bipolar voltage changer 4 is by the analog voltage waveshape signal of 0～3.3V in benchmark
In the presence of reference voltage, the bipolar voltage signal output of -3.3V～+3.3V is converted to.
In above-mentioned technical proposal, the chain table address that redirects in chained list be in the range of 1～256 from 1 start linearly by
One is incremented to 256.
In the step of above-mentioned technical proposal 1, any test waveform for generating as needed, by the way of time, voltage,
To generate the data of a point, redirected by chained list and control to reach the output of any test waveform.Multistage voltage ripple can be generated
Shape, while supporting redirect, circulate.
Said method is used in oled panel testing equipment, significantly improves system specification index, and waveform output
Method and flexibility ratio.
In above-mentioned steps 1, the waveform generting machanism in digital processing unit 1 arranges as described in Figure 3, first an execution cycle
The length of time, then, the execution cycle, taking-up redirect first linked list data of chained list (data of the first row i.e. in table 2,
Including chain table address, jump address, jump on count and dot address), now when the jump address of the data is equal to chain table address
When, maintain the magnitude of voltage in the point data table pointed by the data to terminate to current period；When jump address is more than chained list ground
During location, a linked list data is taken out in turn in chained list is redirected；
Then the relation in current linked list data between jump address and chain table address is compared, when jump address is equal to chained list
During address, the magnitude of voltage in the point data table pointed by the data is maintained to perform end cycle to current；When jump address it is big
When chain table address, the magnitude of voltage and time value in the point data table pointed by the data is taken out, and downwards order is performed often
Bar linked list data, has been performed until redirecting chained list the last item data, i.e., currently perform end cycle；When jump address is less than
During chain table address, jump on count starts, and performs a linked list data pointed by jump on count；
Current execution enter after end cycle next execution cycle, the logic flow all same in each cycle.
Table 1：Point data table
| Dot address | Voltage | Time |
| 1 | -5V | 20uS |
| 2 | -2V | 8uS |
| 3 | +1V | 10uS |
| 4 | -3V | 22uS |
| 5 | +5V | 5uS |
| 6 | -7V | 5uS |
| 7 | -5.5V | 20uS |
| 8 | -0.3V | 15uS |
| … | 0V | 0uS |
| 64 | 0V | 0uS |
Table 2：Redirect chained list
| Chain table address | Jump address | Jump on count | Dot address |
| 1 | 2 | 0 | 1 |
| 2 | 3 | 0 | 2 |
| 3 | 4 | 0 | 3 |
| 4 | 5 | 0 | 4 |
| 5 | 6 | 0 | 5 |
| 6 | 7 | 0 | 6 |
| 7 | 8 | 0 | 7 |
| 8 | 8 | 0 | 8 |
| 9 | 1 | 0 | 9 |
| 256 | … | … | … |
Due to being not involved with needing the waveform of jump on count in the present embodiment, so the jump on count of table 2 is 0.
The content that this specification is not described in detail belongs to prior art known to professional and technical personnel in the field.
Claims (6)
1. a kind of probe short connection type signal detection apparatus, it is characterised in that：It includes digital processing unit (1), digital to analog converter
(2), electric current is to voltage changer (3), bipolar voltage changer (4) and reference source module (5), the digital processing unit
(1) signal input part of signal output part connection digital to analog converter (2), the signal output part connection electricity of digital to analog converter (2)
The signal input part of voltage changer (3) is flow to, the signal output part connection bipolar voltage of electric current to voltage changer (3) becomes
The signal input part of parallel operation (4), first signal output part connection digital to analog converter (2) of the reference source module (5)
Reference voltage input, secondary signal outfan connection bipolar voltage changer (4) of reference source module (5)
Reference voltage input；
The digital processing unit (1) designs the survey for the change frequency of the test waveform that generates as needed and the test waveform
Try the corresponding point data table of waveform and redirect chained list；Digital processing unit (1) is additionally operable to any test waveform for generating as needed,
The data of a point are generated by the way of time, voltage, redirects control to reach any test waveform by chained list
Output, can generate multistage voltage waveform, while supporting redirect, circulate；The point data table is used for the survey for describing with needing to generate
The corresponding every rank voltage magnitude of examination waveform and corresponding persistent period.
2. the signal generating method of probe short connection type signal detection apparatus described in a kind of claim 1, it is characterised in that it includes
Following steps：
Step 1：Test waveform and the change frequency of the test waveform that digital processing unit (1) is generated as needed, record respectively
The magnitude of voltage of waveform each change point and the persistent period of each change point, meanwhile, in digital processing unit (1) design with it is upper
Stating needs the corresponding point data table of test waveform for generating and redirects chained list, wherein, point data table is used to describe and needs to generate
Test waveform it is corresponding per rank voltage magnitude and corresponding persistent period, point data table include each dot address with
And corresponding magnitude of voltage and current value under each dot address；
It is described redirect chained list for control need generation test waveform how to generate, this redirect write in chained list it is different
Value, is capable of achieving redirecting for any-mode and performs with circulation, and this redirects chained list includes chain table address, jump address, jump on count
With a table address, wherein, chain table address is the address number of itself, is linearly incremented by one by one, is immobilized, and is not repeated；
When the jump address is used to record test waveform change, the chain table address corresponding to lower single order is pointed to；
The jump on count is used for when jump address is less than chain table address, and record redirects the number of times that chained list circulation is performed, and reaches
After count value, then order is performed downwards, and when jump address is more than chain table address, it is invalid now to count, when jump address is equal to
During chain table address, whole skip chain end of list (EOL), last item data voltage is constant, and the time is continued until the circulation execution cycle
Terminate；
The dot address that described table address is used in measuring point tables of data；
The chain table address redirected in chained list is mutually corresponding with the dot address in point data table；
The test waveform for needing to generate is quantified as by numeral with chained list is redirected by above-mentioned point data table in digital processing unit (1)
Value, and the digital value is converted to into corresponding binary coding, then above-mentioned binary coding is stored to digital processing unit (1)
Internal register in；
Step 2：The binary coding that digital processing unit (1) will be stored in internal register is transferred to digital to analog converter (2), together
When digital to analog converter (2) receive the reference voltage that reference source module (5) sends, digital to analog converter (2) is by binary system
Coding is converted to analog current waveshape signal in the presence of reference voltage；
Step 3：Above-mentioned analog current waveshape signal is sent to electric current to voltage changer (3) by digital to analog converter (2), and electric current is extremely
The analog current waveshape signal for receiving is converted into analog voltage waveshape signal by voltage changer (3)；
Step 4：Analog voltage waveshape signal is transferred to bipolar voltage changer (4) by the electric current to voltage changer (3),
Simultaneously bipolar voltage changer (4) receives the reference voltage that reference source module (5) sends, bipolar voltage conversion
Analog voltage waveshape signal in the presence of reference voltage, is converted to bipolar voltage signal and is exported by device (4), you can
Obtain the test waveform for needing to generate.
3. the signal generating method of probe short connection type signal detection apparatus according to claim 2, it is characterised in that：It is described
The analog current waveshape signal of the 0～20mA for receiving is converted into electric current the simulation electricity of 0～3.3V to voltage changer (3)
Corrugating signal.
4. the signal generating method of probe short connection type signal detection apparatus according to claim 3, it is characterised in that：It is described
Bipolar voltage changer (4) in the presence of reference voltage, is converted to the analog voltage waveshape signal of 0～3.3V-
The bipolar voltage signal output of 3.3V～+3.3V.
5. the signal generating method of probe short connection type signal detection apparatus according to claim 2, it is characterised in that：It is described
It is linearly to be incremented to 256 one by one from 1 beginning in the range of 1～256 to redirect the chain table address in chained list.
6. the signal generating method of probe short connection type signal detection apparatus according to claim 2, it is characterised in that：It is described
In step 4, bipolar voltage changer (4) carries out bipolar voltage signal to export again after 2 times of amplifications.
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| CN2376629Y (en) * | 1999-05-05 | 2000-05-03 | 山东艾诺仪器有限公司 | Program-controlled testing power supply |
| CN1831541A (en) * | 2006-04-14 | 2006-09-13 | 北京航空航天大学 | Multichannel synchronous sinusoidal signal generator |
| CN201984137U (en) * | 2010-12-01 | 2011-09-21 | 西安谊邦电子科技有限公司 | Signal generation and sampling treatment device for semi-conductor discrete device testing system |
| JP5438803B2 (en) * | 2012-06-28 | 2014-03-12 | 株式会社アドバンテスト | Power supply apparatus and test apparatus using the same |
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Address after: 430070 Hubei City, Hongshan Province, South Lake Road, No. 53, Hongshan Venture Center, building on the 4 floor, No. Patentee after: Wuhan fine test electronics group Limited by Share Ltd Address before: 430070 Hubei City, Hongshan Province, South Lake Road, No. 53, Hongshan Venture Center, building on the 4 floor, No. Patentee before: Wuhan Jingce Electronic Technology Co., Ltd. |