CN104198091B - A kind of intelligent platinum resistance temperature measurement tester and its method of calibration - Google Patents
A kind of intelligent platinum resistance temperature measurement tester and its method of calibration Download PDFInfo
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- CN104198091B CN104198091B CN201410482799.2A CN201410482799A CN104198091B CN 104198091 B CN104198091 B CN 104198091B CN 201410482799 A CN201410482799 A CN 201410482799A CN 104198091 B CN104198091 B CN 104198091B
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- BASFCYQUMIYNBI-UHFFFAOYSA-N platinum Chemical compound [Pt] BASFCYQUMIYNBI-UHFFFAOYSA-N 0.000 title claims abstract description 102
- 229910052697 platinum Inorganic materials 0.000 title claims abstract description 51
- 238000000034 method Methods 0.000 title claims abstract description 15
- 238000009529 body temperature measurement Methods 0.000 title claims abstract description 13
- 238000012360 testing method Methods 0.000 claims abstract description 22
- 238000006243 chemical reaction Methods 0.000 claims abstract description 13
- 150000001875 compounds Chemical class 0.000 claims abstract description 11
- 230000005611 electricity Effects 0.000 claims abstract description 10
- 238000010438 heat treatment Methods 0.000 claims abstract description 10
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- 238000003199 nucleic acid amplification method Methods 0.000 claims abstract description 7
- 238000012795 verification Methods 0.000 claims description 16
- 238000012545 processing Methods 0.000 claims description 13
- 239000004973 liquid crystal related substance Substances 0.000 claims description 9
- 230000008569 process Effects 0.000 claims description 8
- 238000004458 analytical method Methods 0.000 claims description 7
- 239000003990 capacitor Substances 0.000 claims description 7
- 230000008859 change Effects 0.000 claims description 7
- 238000005070 sampling Methods 0.000 claims description 6
- 238000004364 calculation method Methods 0.000 claims description 5
- 238000001514 detection method Methods 0.000 claims description 5
- 230000006870 function Effects 0.000 claims description 5
- 238000012544 monitoring process Methods 0.000 claims description 4
- 238000007493 shaping process Methods 0.000 claims description 4
- 230000001351 cycling effect Effects 0.000 claims description 3
- 230000010355 oscillation Effects 0.000 claims description 3
- 238000004321 preservation Methods 0.000 claims description 2
- 230000000087 stabilizing effect Effects 0.000 claims description 2
- 238000004519 manufacturing process Methods 0.000 abstract description 2
- 238000005259 measurement Methods 0.000 description 8
- 238000013461 design Methods 0.000 description 4
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- 230000005540 biological transmission Effects 0.000 description 2
- 238000005868 electrolysis reaction Methods 0.000 description 2
- 230000004044 response Effects 0.000 description 2
- 230000001360 synchronised effect Effects 0.000 description 2
- 229920004934 Dacron® Polymers 0.000 description 1
- ATJFFYVFTNAWJD-UHFFFAOYSA-N Tin Chemical compound [Sn] ATJFFYVFTNAWJD-UHFFFAOYSA-N 0.000 description 1
- HCHKCACWOHOZIP-UHFFFAOYSA-N Zinc Chemical compound [Zn] HCHKCACWOHOZIP-UHFFFAOYSA-N 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 230000033228 biological regulation Effects 0.000 description 1
- 210000004556 brain Anatomy 0.000 description 1
- 238000004891 communication Methods 0.000 description 1
- 238000010835 comparative analysis Methods 0.000 description 1
- 238000007405 data analysis Methods 0.000 description 1
- 230000006837 decompression Effects 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 230000005674 electromagnetic induction Effects 0.000 description 1
- 238000007710 freezing Methods 0.000 description 1
- 230000008014 freezing Effects 0.000 description 1
- 229910052738 indium Inorganic materials 0.000 description 1
- APFVFJFRJDLVQX-UHFFFAOYSA-N indium atom Chemical compound [In] APFVFJFRJDLVQX-UHFFFAOYSA-N 0.000 description 1
- 238000007689 inspection Methods 0.000 description 1
- 238000009434 installation Methods 0.000 description 1
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- 238000003860 storage Methods 0.000 description 1
- 229910052718 tin Inorganic materials 0.000 description 1
- 238000012546 transfer Methods 0.000 description 1
- 230000007704 transition Effects 0.000 description 1
- 238000010792 warming Methods 0.000 description 1
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 1
- 229910052725 zinc Inorganic materials 0.000 description 1
- 239000011701 zinc Substances 0.000 description 1
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Abstract
The invention discloses a kind of intelligent platinum resistance temperature measurement tester and its method of calibration, 220V alternating currents are converted to 12V DC working power by AC-DC conversion and oscillating circuit, by the ring oscillator that RC0.2Hz is formed based on six non-gate ics, again after compound transistor power amplification, the upper electricity and dead electricity of control relay；The temperature test electric bridge that platinum resistance temperature checking circuit is mainly made up of resistance and potentiometer, tested RTD Rc and standard platinum resistance Rt is placed in heating furnace, normally opened, normally closed node selections of the Rc and Rt through relay connects with temperature test electric bridge, circuit again through integrated operational amplifier composition carries out power amplification, and the analog signal of output delivers to single-chip microcomputer through A/D converter.The present invention can automatically switch to Rc and Rt, and signal is amplified with same passage and is sent into single-chip microcomputer, have the characteristics of low manufacture cost, measuring accuracy is high.
Description
Technical field
The present invention relates to the electronic installation verified to RTD, the particularly resistance, voltage and temperature to RTD
The electronic instrument that the parameters such as degree are verified.
Background technology
Now, the more of temperature survey are carried out using the material temperature difference just like thermocouple with Volume Changes just like mercurial thermometer
Kind mode.But either warming narrow range or measuring accuracy are low for these modes, it is difficult to meet power system switch, transformer etc.
The high temperature of substantial equipment, accurate be monitored and controlled require, are examined or check according to the analysis of physical property and measurement, learn RTD with temperature
Degree change response is fast, precision is high, stable performance, is the ideal component in Measurement and Control System, therefore selected by emphasis.
RTD is positive temperature coefficient sensor, and resistance makees synchronous rise and fall with temperature, using this feature, carries out temperature
Degree collection measurement.
The extensive use in power system of platinum resistor temperature measuring instrument, but with electromagnetic induction, difference variation, external impacts
Deng will be had an impact to performance, therefore, the present inventor on the basis of thermometric, will design the tester of higher standard, periodically
Detected, judged to make the analysis of RTD quality good or not.
The content of the invention
It is an object of the invention to provide a kind of precision is high, low-cost intelligent platinum resistance temperature measurement tester.
The object of the present invention is achieved like this：A kind of platinum resistance temperature measures tester, AC-DC conversion and vibration electricity
Road forms：Transformer B primary coils one end sequentially concatenates insurance BX1 and power switch K1 and is followed by the fire of 220V alternating currents
Line, the zero line of another termination 220V alternating currents of transformer B primary coils, and by monolithic processor controlled electronic switch K1 ' and power supply
It is in parallel to switch K1, transformer B secondary coils both ends are connected to diode bridge rectifier D1-4 two inputs, two level respectively
The integrated regulator IC1 of pipe bridge rectifier D1-4 positive output end concatenation model 7812 input, IC1 positive output
End concatenation relay J1 is followed by compound transistor BG1-2 colelctor electrode, compound transistor BG1-2 emitter stage series resistor R4
It is followed by being followed by compound transistor BG1- in diode bridge rectifier circuit D1-4 negative output terminal, IC2 8 pin series resistor R3
2 base stage, electric capacity C3 are serially connected between IC2 1 pin and 5 pin, IC2 1 pin sequentially series resistor R2, potentiometer W1 be followed by
IC2 6 pin, potentiometer W1 slip are terminated at IC2 6 pin, and IC2 14 pin are connected to IC1 positive output end, IC1 negative output
IC2 7 pin are terminated at, IC2 7 pin are connected to D1-4 negative output terminal, and electric capacity C2 is serially connected between IC2 14 pin and 7 pin, electrolysis
Electric capacity C1 positive poles are connected to D1-4 positive output ends, and electrochemical capacitor C1 negative poles are connected to D1-4 negative output terminals, and above-mentioned IC2 is that 74L,SO4 six is non-
Door integrated package；
Platinum resistance temperature checking circuit forms：Tested RTD Rc, relay are sequentially concatenated by the IC1 power supply E ﹢ exported
J1 normally opened node J1-1 is followed by sequentially concatenating standard platinum in resistance R5 one end, another power supply E ﹣, power supply E ﹢ that are terminated at of resistance R5
Resistance Rt, relay J1 normally closed node J1-2 are followed by being followed by resistance R6 in resistance R5 one end, power supply E ﹢ concatenations potentiometer W2
One end, another slips for being terminated at power supply E ﹣, potentiometer W2 of resistance R6 are terminated at resistance R6 one end, resistance R5 one end series resistor
R7 is followed by the inverting input in IC3, and resistance R6 one end series resistor R8 is followed by the in-phase input end in IC3, electric capacity C4 one end
Resistance R5 one end is connected to, electric capacity C4 is another to be terminated at power supply E ﹣, and voltage-regulator diode D5 positive poles are connected to IC3 in-phase input end, surely
Pressure diode D5 negative poles are connected to IC3 4 pin, and 7 pin that IC3 4 pin are connected to power supply E ﹣, IC3 are connected to power supply E ﹢, and resistance R9 is serially connected in
Between IC3 inverting input and signal output part, IC3 is model μ A741 integrated operational amplifier, resistance R5 and resistance R6
Resistance value it is identical, resistance R7 is identical with resistance R8 resistance value, standard platinum resistance Rt and potentiometer W2 resistance value with
Tested RTD Rc normal resistance is identical, and tested RTD Rc and standard platinum resistance Rt is placed in heating furnace；
Central signal process circuit forms：Above-mentioned IC3 signal output part concatenation A/D converter is followed by single-chip microcomputer,
LCD liquid crystal displays, buzzer, memory cell and above-mentioned electronic switch K1 ' are connected with single-chip microcomputer respectively.
The central signal process circuit also has host computer, and host computer is connected through USB interface with the single-chip microcomputer.
The central signal process circuit also has keyboard, and the received processor JCDL8279 of keyboard connects with the single-chip microcomputer
Connect.
The AC-DC conversion and oscillating circuit also have power work indicating circuit：Light emitting diode Fg1 and resistance R1
It is serially connected between diode bridge rectifier D1-4 positive output end and negative output terminal.
The heating furnace measures stove from fluke 9144.
The electrochemical capacitor C1 is 2200 μ f, and electric capacity C2 is 0.01 μ f.
Resistance R7 is 100k Ω, and resistance R8 is 100k Ω, and resistance R9 is 570k Ω, voltage-regulator diode D5 models
1N4727。
The A/D converter model MAX125, single-chip microcomputer model NEC 78K0, memory cell EEPROM.
The resistance R3 is 100 Ω, and R4 is 10 Ω.
It is yet another object of the invention to provide the method for calibration of above-mentioned tester.
What a further object of the present invention was realized in：A kind of method of calibration of platinum resistance temperature measurement tester, by with
Lower step is carried out：
, it is necessary to insert following parameter after tester initialization：Tested RTD numbering, tested RTD nominal value and metering
Furnace temperature checkpoint, and opened in stove groove, temperature rise, after sampling processing, enter trip temperature multilevel iudge, detect whether to reach school
Test a littleIf do not met, heating sampling, multilevel iudge are continued cycling through, until meeting the requirements, just external output signal, is somebody's turn to do
Signal starts buzzer and sends " drop drop " sound first, tells verification personnel, opens platinum resistance temperature checking circuit, detected
Work；Opening temperature checking circuit has two ways：
First, it is manually pressed by power switch K1；
Second, CPU send control instruction, turn on automatically electronic switch K1 '.
After power switch K1 or electronic switch K1 ' connections, start oscillator, produce 0.2Hz frequencies of oscillation, i.e. 5 seconds when
Between be spaced, standard platinum resistance and tested RTD automatic conversion are tested respectively, and enters through above-mentioned platinum resistance temperature checking circuit
Row partial pressure, shaping, amplification, output voltage analog signal, then changed through A/D, turn into the binary digit letter of monolithic function identification
Number, send CPU central signal processors i.e. single-chip microcomputer to through data/address bus and address bus；
After the temperature test signal obtained by standard platinum resistance and tested RTD is passed to single-chip microcomputer, line number is entered by single-chip microcomputer
According to analyzing and processing, to resistance, voltage, temperature, i.e. R~V~DEG C three physical quantitys are confirmed, and carry out error calculation, make
It is overproof and whether qualified judgement conclusion；
Single-chip microcomputer is by the R~V tested~DEG C physical quantity and corresponding multilevel iudge result, in LCD liquid crystal displays
On show, with profit verification personal observations record, meanwhile, through eeprom memory, related data and conclusion are remained behind,
Inquiry is retrieved for examination with profit；
Host computer is transmitted a signal to by USB interface again, the RTD of administrative area verification situation is carried out deeper into
Comprehensive classification, statistics, preserve, establish database, while complete to verify report, the record printing of checking time, relevant information；
Monitoring is tracked to emphasis RTD, the com-parison and analysis through historical query and new school data, with regard to performance change and good and bad situation
Assessment is made to select with application.
The beneficial effects of the invention are as follows：In the research and design of this intelligent RTD tester, the present inventor is in Gao Ling
On the basis of sensitivity bridge arm ratio is compared with test circuit, hunting of frequency is additionally used, is realized to standard platinum resistance and tested RTD temperature
The automatic switchover of measurement is spent, and makees signal shaping, amplification, A/D conversions with same passage, is sent into single-chip microprocessor system, carry out
Data Analysis Services and error calculation etc., both simplify circuit, reduced cost, reduce error again, meanwhile, to the resistance of RTD and
Nonlinear characteristic between temperature change have also been made filtering process, thus, accuracy of detection is further enhanced, and through USB
Interface is connected with host computer, to make to verify report printing and establish database, forms advanced perfect tester.
Meanwhile this tester uses conventional electronics, such as six non-gate ics, integrated transporting discharging and single-chip microcomputer group
Into there is the characteristics of low manufacture cost, be easy to be widely popularized.
Brief description of the drawings
Fig. 1 is AC-DC conversion and oscillating circuit figure.
Fig. 2 is platinum resistance temperature measuring circuit figure.
Fig. 3 is central signal processor hardware block diagram.
Fig. 4 is RTD checking routine flow chart.
Embodiment
1. circuit design
Our intelligent RTD tester, as signal acquisition, is re-introduced into micro- electricity based on bridge test circuit
Brain technology is analyzed and processed, to reach comprehensive perfect stage.This tester is in the case where ensureing high-resolution, error energy
Less than 0.15 DEG C requirement, so can be used as A level standards, implement verification calibrating to lower grade platinum resistance.
1.1）Power supply and vibration
Tester divides soft and hardware two large divisions, and wherein hardware includes power supply early stage and oscillating circuit, see Fig. 1, RTD
In temperature survey tester, AC-DC conversion and oscillating circuit composition are：Transformer B primary coils one end sequentially concatenates insurance
BX1 and power switch K1 is followed by the live wire of 220V alternating currents, and the zero of another termination 220V alternating currents of transformer B primary coils
Line, and it is in parallel with power switch K1 by monolithic processor controlled electronic switch K1 ', transformer B secondary coils both ends are connected to two respectively
Level pipe bridge rectifier D1-4 two inputs, diode bridge rectifier D1-4 positive output end sequentially concatenate model
It is followed by for 7812 integrated regulator IC1, relay J1 in compound transistor BG1-2 colelctor electrode, compound transistor BG1-2's
Emitter stage series resistor R4 is followed by being followed by diode bridge rectifier circuit D1-4 negative output terminal, IC2 8 pin series resistor R3
In compound transistor BG1-2 base stage, electric capacity C3 is serially connected between IC2 1 pin and 5 pin, IC2 1 pin sequentially series resistor R2,
Potentiometer W1 is followed by 6 pin in IC2, and potentiometer W1 slip is terminated at IC2 6 pin, and IC2 14 pin are connected to IC1 positive output
End, IC2 7 pin are connected to D1-4 negative output terminal, and electric capacity C2 is serially connected between IC2 14 pin and 7 pin, and electrochemical capacitor C1 positive poles connect
In D1-4 positive output ends, electrochemical capacitor C1 negative poles are connected to D1-4 negative output terminals, and above-mentioned IC2 is the non-gate ics of 74L,SO4 six；Hand over
Direct current is changed and oscillating circuit also has power work indicating circuit：Light emitting diode Fg1 and resistance R1 are serially connected in diode bridge
Between formula rectifier D1-4 positive output end and negative output terminal.
Fig. 1 is AC-DC conversion and oscillating circuit, 220V AC powers through switch K1 or controlled by single chip microprocessor switch K1 ',
Insurance（Or protective tube）BX1 and transformer B1 decompressions, the bridge rectifier electricity that transformer secondary voltage is formed through diode D1-4
Road rectification, 2200 μ f electrolysis hold C1 and power frequency are filtered, and 0.01 μ f electric capacity of the dacron C2 is then to caused high frequency in rectifying and wave-filtering
Filtering, the filtering of height frequency, make dc source purer reliable, be advantageous to temperature and accurately measure, light emitting diode Fg1 and
Resistance R1 partial pressures, do power supply instruction, and 7812 integrated regulator IC1 make 12V voltage stabilizings, then through the non-gate ic IC2 of 74L,SO4 six with
The RC circular type shakers that electric capacity C3, resistance R2, potentiometer W1 are formed, export 0.2 hertz（5 seconds cycles）Frequency, the frequency warp
Resistance R3 sends compound transistor BG1-2, BG1-2 ON-OFF to, relay J1 is completed synchronous operation.
1.2）Bridge measurement is compared with
Bridge circuit has sensitive response function, so, make temperature survey using the circuit, be fabulous signal acquisition side
Formula, see Fig. 2：
Fig. 2 is RTD check test circuit, and platinum resistance temperature checking circuit composition is：The power supply E ﹢ exported by IC1 are suitable
Secondary concatenation is detected RTD Rc, relay J1 normally opened node J1-1 is followed by resistance R5 one end, and resistance R5 is another to be terminated at electricity
Source E ﹣, power supply E ﹢ sequentially concatenate standard platinum resistance Rt, relay J1 normally closed node J1-2 is followed by resistance R5 one end, power supply E ﹢
Concatenation potentiometer W2 is followed by resistance R6 one end, and resistance R6 is another to be terminated at power supply E ﹣, and potentiometer W2 slip is terminated at resistance
R6 one end, resistance R5 one end series resistor R7 are followed by the inverting input in IC3, resistance R6 one end series resistor R8 be followed by
IC3 in-phase input end, the ends of electric capacity C4 mono- are connected to resistance R5 one end, and electric capacity C4 is another to be terminated at power supply E ﹣, voltage-regulator diode D5
Positive pole is connected to IC3 in-phase input end, and voltage-regulator diode D5 negative poles are connected to IC3 4 pin, and IC3 4 pin are connected to power supply E ﹣, IC3's
7 pin are connected to power supply E ﹢, and resistance R9 is serially connected between IC3 inverting input and signal output part, and IC3 is model μ A741 collection
Into operational amplifier, resistance R5 is identical with resistance R6 resistance value, and resistance R7 is identical with resistance R8 resistance value, standard platinum resistance
Rt and potentiometer W2 resistance value are identical with tested RTD Rc normal resistance, are detected RTD Rc and standard platinum
Resistance Rt is placed in heating furnace；Because having continuity with Fig. 1, Unified number is pretended.Rc or Rt and potentiometer W2 and R5, R6 are formed
Temperature test electric bridge, circuit requirement R5=R6, and Rc or Rt, W2 choose same resistance as far as possible（Rt, W2 resistance value are from Rc's
Normal resistance）, potentiometer W2 be exactly do resistance value fine tuning, so, electric bridge keep balance, when making steady node 1., node 2.
No signal exports.
Dotted line represents the metering stove of fluke 9144 of configuration in Fig. 2（Some title heating furnaces）, establish related temperature scale definition
Water triple point, zinc, tin, Indium fusings and freezing point device, the calibrating for platinum resistance thermometer, which indexes, to be used, there is provided stable
Temperature source.Emphasis verifies R0 and two parameters of R100/ R0 again in actual measurement, measures verified resistance temperature in stove is measured respectively
The R0 and R100 of meter, then check whether R0 values and R100/R0 ratio meet defined technical indicator, in terms of temperature
It is whether qualified.And tested RTD Rc and standard platinum resistance Rt is placed oneself in the midst of in metering stove simultaneously, impression and measurement same temperature, subtract
Few temperature time delay error for successively inserting Rc, Rt.Rc and Rt upper ends are connected with positive supply, lower end respectively with relay normally open knot
Point J1-1 and normally closed node J1-2 connect.With 0.2 hertz of IC2 circular type shakers in Fig. 1（5 seconds cycles）Frequency conversion control,
Standard platinum resistance Rt and tested RTD Rc are respectively turned on, is compared test.
Concrete application process is, when metering furnace temperature rises to test request, to be manually pressed by power switch K1, test electricity
Devote oneself to work on road.When just pressing K1, relay J1 not yet starts, and normally closed node J1-2 connects standard platinum resistance Rt, and resistance is with meter
The rising of furnace temperature is measured, 1. voltage declines node, makes U3>U2, μ A741 integrated transporting dischargings IC3 are overturn, through 6 pin outputting measurement values, because
Toroidal oscillation is carried out in IC2, has 5 second stand-by period, digital record can be finished in the meantime.And then relay J1 starts,
Normally closed node J1-2 disconnects, and standard platinum resistance Rt stops test, normally opened node J1-1 closures, switchs to tested RTD Rc and does temperature
Test.Because in same metering stove, test is same temperature, therefore Rc can be compared with the above Rt data tested,
Error amount is calculated, is made whether satisfactory judgement, reaches the purpose of verification.
RTD carrys out certain error with there is certain nonlinear characteristic in varying with temperature to calibration tape, therefore, being used as outer
Circuit is enclosed, we introduce electric capacity C4 and make High frequency filter processing, so as to improve measuring accuracy.
1N4727 (3V) voltage-regulator diodes D5 is the reference voltage set in Fig. 2 circuits, and it is desirable that just anti-phase integrate in IC3
Make the comparison of equal conditions before amplifier μ A741, it requires R7=R8, while in order to reduce power consumption, typically by R7, R8 value compared with
Greatly, this circuit design is 100k Ω, considers further that the relation of homophase input integrated transporting discharging gain calculating formula and quality factor, we are true
It is 570k Ω to determine R9 values, brings into formula and calculates：
A=1+R9/R7=1+570/100=6.57
Obtain more than 6 times of multiplication factor.Thus, the comparison that temperature sampling and ic chip 3 are done through RTD is put
Big etc., in 6 pin, i.e. 3. node is changed into larger voltage signal output.
Measuring accuracy is decided by that standard platinum resistance Rt, Rt rank is higher in circuit, and resolution ratio, the degree of accuracy, measuring accuracy are all
It is higher, so, if improving RTD Rt ranks, the grade of tester can also also be lifted.
2. intelligence system hardware configuration
For Function Extension and perfect, we introduce single-chip microcomputer technology, make intelligent processing method to test data.School
The system hardware structure for testing instrument is as shown in Figure 3.The problems such as in view of the precision and price of power consumption and complete machine, the single-chip microcomputer of temperature measurer
Controller uses NEC 8 78K0 series monolithics, and enables watchdog function, to improve the interference free performance of temperature measurer.
The analog signal that from Fig. 2 3. IC3 6 pin, i.e. node exports, is incorporated into Fig. 3 dotted line frames, carries out further work.
Referring to Fig. 3, central signal process circuit composition is：Above-mentioned IC3 signal output part concatenation A/D converter be followed by
Single-chip microcomputer, LCD liquid crystal displays, buzzer, memory cell and above-mentioned electronic switch K1 ' are connected with single-chip microcomputer respectively.
Intelligent hardware structure mainly has following several major：
2.1）A/D is changed
Because what 3. node sent in Fig. 2 is analog signal, and microcomputer chip response is data signal, it is therefore desirable to first
Do A/D conversion process.The present apparatus is specifically using MAX125 type A/D converters, by the analog-signal transitions collected into number
Word signal, then CPU central signal processors are sent to by data/address bus and address bus, come with the transmission of keyboard setting signal
Setting signal be combined, work judges, sorted out etc. deeply to work.
2.2）Keyboard is set
On Fig. 3 right side, keyboard is through IOP（I/O Processor）Integrated reception processing device is connected with single-chip microcomputer, the processing
Device is the instruction door of CPU central signal processors, including inserting by school parameter, the processing of signal instruction, PCI and SCSI total
Line data transfer etc., in being cooperated with keyboard, human-computer dialogue is completed, realizes detected RTD resistance, sequence number, alarm
Value, communication protocol etc. are set.Meanwhile can also by keyboard as historical data retrieve for examination inquiry etc., the present apparatus specifically using
JCDL8279 unit keyboard interfaces（That is reception processing device）.
2.3）Central signal processor
CPU central signal processors（Containing single-chip microcomputer）It is intelligent nerve center, through address bus and data/address bus, receives
After the parameter instruction inserted to detected A/D conversion signals and keyboard, therebetween with reference to software programming, complete data classification,
Comparative analysis, error calculation, it is qualified it is no the processing such as judge, and then send buzzing, display, storage, switch K1 ' controls, on interface
The command signals such as biography, it is powerful.
2.4）Memory
In order to make performance tracking and monitoring to each RTD, while the inquiry of historical data control is convenient for, further made
Whether the judgement of regulation technical indicator is met during new detection, therefore this tester employs eeprom memory, will verify every time
Data retain to get up.
2.5）LCD liquid crystal displays
RTD check results send KS084 (8.4 inches) LCD liquid crystal displays simultaneously, with show the resistance value currently tested and
Each section of temperature data, in favor of testing staff's observation, judge.And keyboard operation is combined, can also be by LCD liquid crystal displays to each platinum electricity
Resistance retrieves for examination inquiry as historical record.
2.6）USB interface
This tester is also connected by USB interface with host computer.Host computer reads slave computer data, makes detection time
Record and further statistics, analysis, judge, processing, and connect that printer carries out verification report printing and information transmission etc. is bigger
The work of scope.
3. intelligence system software flow
This RTD tester is using NEC 78K0 series monolithics, therefore it is NEC to compile debugging enironment
Project Manager and ID78K0, program are shown a C language.Related procedure is as shown in Figure 4.
After tester initialization, need to insert by school RTD numbering, school resistance nominal value and metering furnace temperature verification
The parameters such as point, and opened in stove groove, temperature rise, after sampling processing, enter trip temperature multilevel iudge, detect whether to reach verification
PointIf do not met, output is held from " N " of inquiry block, heating is continued cycling through and samples, compares, judging, until conforming to
Ask, just hold output from " Y " of inquiry block.
From the signal of " Y " end output, start buzzer first and send " drop drop " sound, tell verification personnel, can open
RTD checking circuit, carry out detection work.Opening checking circuit has two ways：
First, it is manually pressed by power switch K1；
Second, CPU send control instruction, turn on automatically electronic switch K1 '.
Both are connected in parallel by K1, K1 ', and one can play a part of connecting vibration, verification, amplification in appointing, and add inspection
Survey the reliability of work.
In K1, K1 ' connection, start oscillator, produce the time interval of 0.2Hz, i.e. 5 second, respectively to standard platinum resistance with
Test is converted by school RTD automatically, and through partial pressure, shaping, amplification, output voltage analog signal, then changed through A/D, turn into single
The binary digital signal of piece function identification, CPU numer centres are sent to through data/address bus and address bus.
Here a feature is again：The temperature test data of standard platinum resistance and tested RTD, are sent into by same passage
Computer, because there is the time interval of 5 seconds, therefore it can work and transmit respectively, so not contradiction, does not interfere with each other, it is simple
Change circuit, reduce cost；And also because walking same passage, so, both completely avoid circuit error.
The temperature test signal obtained by standard platinum resistance and tested RTD, after being passed to single-chip microcomputer, will be carried out by program
Data Analysis Services, maximum functional characteristics are that resistance, voltage, temperature, i.e. R~V~DEG C three physical quantitys will obtain herein
Confirm, and carry out error calculation, make it is overproof and whether qualified judgement conclusion.
Program backward, is then the R~V~DEG C physical quantity and judged result that will be tested, shown on LCD liquid crystal displays again
Come, with profit verification personal observations' record.Meanwhile through ROM memory, related data and conclusion are remained behind, is retrieved for examination and looked into profit
Ask.
Finally, we transmit a signal to host computer with USB interface, and the RTD verification situation of administrative area is carried out more
Deeply comprehensive classification, statistics, preservation, establish database, while complete to verify report, checking time, the note of relevant information
Record printing.Monitoring can be also tracked to emphasis RTD, the com-parison and analysis through historical query and new school data, with regard to performance change
Assessment is made with good and bad situation to select with application.
Claims (10)
1. a kind of platinum resistance temperature measures tester, it is characterized in that, AC-DC conversion and oscillating circuit composition are：At the beginning of transformer B
Level coil one end sequentially concatenate insurance BX1 and power switch K1 be followed by it is another in the live wire of 220V alternating currents, transformer B primary coils
The zero line of one termination 220V alternating currents, and, transformer B time in parallel with power switch K1 by monolithic processor controlled electronic switch K1 '
Level coil both ends are connected to diode bridge rectifier D1-4 two inputs respectively, diode bridge rectifier D1-4's
Positive output end concatenation model 7812 integrated regulator IC1 input, IC1 positive output end concatenation relay J1 be followed by
Compound transistor BG1-2 colelctor electrode, compound transistor BG1-2 emitter stage series resistor R4 are followed by diode bridge rectification
Circuit D1-4 negative output terminal, IC2 8 pin series resistor R3 are followed by being serially connected in compound transistor BG1-2 base stage, electric capacity C3
Between IC2 1 pin and 5 pin, sequentially series resistor R2, potentiometer W1 are followed by 6 pin in IC2, potentiometer W1 cunning to IC2 1 pin
Moved end is connected to IC2 6 pin, and IC2 14 pin are connected to IC1 positive output end, and IC1 negative output terminal is connected to IC2 7 pin, and the 7 of IC2
Pin is connected to D1-4 negative output terminal, and electric capacity C2 is serially connected between IC2 14 pin and 7 pin, and electrochemical capacitor C1 positive poles are being connected to D1-4 just
Output end, electrochemical capacitor C1 negative poles are connected to D1-4 negative output terminals, and above-mentioned IC2 is the non-gate ics of 74L,SO4 six；
Platinum resistance temperature checking circuit forms：Tested RTD Rc, relay J1 are sequentially concatenated by the IC1 power supply E ﹢ exported
Normally opened node J1-1 is followed by sequentially concatenating standard platinum resistance in resistance R5 one end, another power supply E ﹣, power supply E ﹢ that are terminated at of resistance R5
Rt, relay J1 normally closed node J1-2 are followed by being followed by resistance R6 one end in resistance R5 one end, power supply E ﹢ concatenations potentiometer W2,
Another slips for being terminated at power supply E ﹣, potentiometer W2 of resistance R6 are terminated at resistance R6 one end, after the series resistor R7 of resistance R5 one end
IC3 inverting input is connected to, resistance R6 one end series resistor R8 is followed by the in-phase input end in IC3, and the ends of electric capacity C4 mono- are connected to
Resistance R5 one end, electric capacity C4 is another to be terminated at power supply E ﹣, and voltage-regulator diode D5 positive poles are connected to IC3 in-phase input end, voltage stabilizing two
Pole pipe D5 negative poles are connected to IC3 4 pin, and 7 pin that IC3 4 pin are connected to power supply E ﹣, IC3 are connected to power supply E ﹢, resistance R9 and are serially connected in IC3
Inverting input and signal output part between, IC3 is model μ A741 integrated operational amplifier, resistance R5 and resistance R6's
Resistance value is identical, and resistance R7 is identical with resistance R8 resistance value, standard platinum resistance Rt and potentiometer W2 resistance value with quilt
It is identical to examine RTD Rc normal resistance, tested RTD Rc and standard platinum resistance Rt is placed in heating furnace；
Central signal process circuit forms：Above-mentioned IC3 signal output part concatenation A/D converter is followed by single-chip microcomputer, LCD liquid
Crystal display, buzzer, memory cell and above-mentioned electronic switch K1 ' are connected with single-chip microcomputer respectively.
2. a kind of platinum resistance temperature measurement tester according to claim 1, it is characterized in that, the central signal processing electricity
Road also has host computer, and host computer is connected through USB interface with the single-chip microcomputer.
3. a kind of platinum resistance temperature measurement tester according to claim 2, it is characterized in that, the central signal processing electricity
Road also has keyboard, and the received processor JCDL8279 of keyboard is connected with the single-chip microcomputer.
4. a kind of platinum resistance temperature measurement tester according to claim 1 or 2 or 3, it is characterized in that, the alternating current-direct current turns
Change and oscillating circuit also has power work indicating circuit：Light emitting diode Fg1 and resistance R1 are serially connected in diode bridge rectification
Between device D1-4 positive output end and negative output terminal.
5. a kind of platinum resistance temperature measurement tester according to claim 4, it is characterized in that, the heating furnace selects good fortune Lu
Grams 9144 metering stoves.
6. a kind of platinum resistance temperature measurement tester according to claim 5, it is characterized in that, the electrochemical capacitor C1 is
2200 μ f, electric capacity C2 are 0.01 μ f.
7. a kind of platinum resistance temperature measurement tester according to claim 6, it is characterized in that, the resistance R7 is 100k
Ω, resistance R8 are 100k Ω, and resistance R9 is 570k Ω, voltage-regulator diode D5 models 1N4727.
8. a kind of platinum resistance temperature measurement tester according to claim 7, it is characterized in that, the A/D converter model
For MAX125, single-chip microcomputer model NEC 78K0, memory cell EEPROM.
9. a kind of platinum resistance temperature measurement tester according to claim 8, it is characterized in that, the resistance R3 is 100 Ω,
R4 is 10 Ω.
10. a kind of method of calibration of the tester as described in claim 1-9 any claims, it is characterized in that, according to the following steps
Carry out：
, it is necessary to insert following parameter after tester initialization：Tested RTD numbering, tested RTD nominal value and metering furnace temperature
Checkpoint is spent, and is opened in stove groove, temperature raises, and after sampling processing, enters trip temperature multilevel iudge, detects whether to reach verification
PointIf do not met, heating sampling, multilevel iudge are continued cycling through, until meeting the requirements, the external output signal of, the letter
Start buzzer number first and send " drop drop " sound, tell verification personnel, open platinum resistance temperature checking circuit, carry out detection work
Make；Opening temperature checking circuit has two ways：
First, it is manually pressed by power switch K1；
Second, CPU send control instruction, turn on automatically electronic switch K1 '；
After power switch K1 or electronic switch K1 ' connections, start oscillator, produce 0.2Hz frequencies of oscillation, i.e. between the 5 second time
Every testing respectively standard platinum resistance and tested RTD automatic conversion, and divided through above-mentioned platinum resistance temperature checking circuit
Pressure, shaping, amplification, output voltage analog signal, then changed through A/D, turn into the binary digital signal of monolithic function identification, warp
Data/address bus and address bus send CPU central signal processors i.e. single-chip microcomputer to；
After the temperature test signal obtained by standard platinum resistance and tested RTD is passed to single-chip microcomputer, data point are carried out by single-chip microcomputer
Analysis handle, to resistance, voltage, temperature, i.e. R~V~DEG C three physical quantitys are confirmed, and carry out error calculation, make it is overproof
Whether qualified judgement conclusion；
Single-chip microcomputer shows the R~V tested~DEG C physical quantity and corresponding multilevel iudge result on LCD liquid crystal displays
Show to come, with profit verification personal observations' record, meanwhile, through eeprom memory, related data and conclusion are remained behind, with profit
Retrieve for examination inquiry；
Host computer is transmitted a signal to by USB interface again, the RTD verification situation of administrative area is carried out deeper into comprehensive
Classification, statistics, preservation, establish database, at the same complete verify report, checking time, relevant information record print；Counterweight
Point RTD is tracked monitoring, the com-parison and analysis through historical query and new school data, is made with regard to performance change and good and bad situation
Assess and selected with application.
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