CN104197846B - Method for measuring displacement of reflector based on characteristic pattern reflection - Google Patents
Method for measuring displacement of reflector based on characteristic pattern reflection Download PDFInfo
- Publication number
- CN104197846B CN104197846B CN201410479062.5A CN201410479062A CN104197846B CN 104197846 B CN104197846 B CN 104197846B CN 201410479062 A CN201410479062 A CN 201410479062A CN 104197846 B CN104197846 B CN 104197846B
- Authority
- CN
- China
- Prior art keywords
- virtual image
- displacement
- speculum
- video camera
- reflection
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
- 238000006073 displacement reaction Methods 0.000 title claims abstract description 38
- 238000000034 method Methods 0.000 title claims description 16
- 239000011159 matrix material Substances 0.000 claims description 14
- 238000013519 translation Methods 0.000 claims description 6
- 238000010586 diagram Methods 0.000 claims description 5
- 230000004075 alteration Effects 0.000 claims description 3
- 238000000691 measurement method Methods 0.000 abstract description 3
- 238000005259 measurement Methods 0.000 description 12
- 238000001514 detection method Methods 0.000 description 5
- 230000003287 optical effect Effects 0.000 description 4
- 238000003384 imaging method Methods 0.000 description 3
- 230000035945 sensitivity Effects 0.000 description 3
- 241001083827 Phortica speculum Species 0.000 description 1
- 241001620634 Roger Species 0.000 description 1
- 230000003042 antagnostic effect Effects 0.000 description 1
- 230000003796 beauty Effects 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 238000010606 normalization Methods 0.000 description 1
- 238000007430 reference method Methods 0.000 description 1
- 238000010998 test method Methods 0.000 description 1
- 238000012360 testing method Methods 0.000 description 1
Landscapes
- Length Measuring Devices By Optical Means (AREA)
Abstract
The invention discloses a reflector displacement measurement method based on characteristic pattern reflection. The CCD camera shoots and records the reflected characteristic pattern, namely the CCD shoots and records the virtual image formed by the reflecting mirror of the display screen. When the mirror moves, the virtual image captured by the camera also moves. By calibrating the internal parameters and the external parameters of the camera, the moving distance of the virtual image caused by the movement of the reflector can be obtained. Then, according to the law of light reflection, the moving distance of the reflector is half of the moving distance of the virtual image, so that the displacement of the reflector is obtained.
Description
Technical field
The present invention relates to a kind of optical displacement measurement technology, measures method of testing especially for a kind of mirror displacements.
Technical background
Displacement measurement plays more and more important effect in numerous fields of measurement such as optical precision instrument, Materials Measurement.Survey
Amount displacement, can adopt contact type measurement method and non-contact type measuring method.The contact type measurement method of traditional type include amesdial,
Three coordinate measuring machine, linear grating, laser tracker etc., contactless measurement mainly use laser ranging or measurement
Triangle Principle, such as laser femtosecond method, laser range finder etc..The characteristics of these measuring methods have oneself and limitation, and fit
For different fields of measurement.In optics assembling, it usually needs the displacement of speculum is measured.Generally this kind of reflection
Mirror surface plated film, the easy injured surface of contact type measurement, are caused beauty defects, can only be measured using optical non-contact.
The measuring apparatus of laser class have expensive, the difficult shortcoming of adjustment.
The informative that structure light metering method is obtained is relative with measurement sensitivity height, high precision and equipment cost
Relatively low, environment resistant interference performance is strong, the advantages of can be used for workshop and detect, has been widely used in field of optical measurements.And
For the report that mirror displacements measurement is realized using method of structured light, have no report so far.
Content of the invention
The present invention is a kind of mirror displacements measuring method of feature based pattern reflection, with simple structure, user
Just, sensitivity is high, to environment without particular/special requirement, the advantages of can be detected in workshop condition, images including display screen, CCD
Machine and electronic computer.Computer produces Eigen Structure, shows on a display screen, and projects on speculum, after being reflected is
Ccd video camera is received.CCD shoots and records the Eigen Structure for reflecting.Namely CCD shoots and records display screen by anti-
Penetrate the virtual image of mirror formation.When speculum is moved, the virtual image of shot by camera can also be moved.Calculate speculum
The displacement of the virtual image before and after movement.According to light reflection law, the half of the distance is the displacement of speculum.
The present invention has following advantage:
1. Antagonistic Environment interference performance of the present invention is strong, can be used for workshop detection.
2. present configuration is simple, with low cost.
3. the present invention has larger measurement dynamic range.
4. the adjustment, easy to use that the present invention is adopted.
5. detection method has very high sensitivity.
Description of the drawings
Fig. 1 is the detection method system structure diagram that mentions in the present invention;
Fig. 2 is camera model schematic diagram;
Fig. 3 a characteristic feature pattern shape a. gridiron patterns;
Fig. 3 b. Gauss dot matrix;
Fig. 3 c. two dimension sine streaks;
Before and after the movement of Fig. 4 a. speculums, video camera shoots virtual image schematic diagram, the speculum initial position virtual image;
Before and after the movement of Fig. 4 b. speculums, video camera shoots virtual image schematic diagram, the virtual image of speculum shift position.
Specific embodiment
As shown in figure 1, the system includes ccd video camera, display screen and computer.Show that screen display is generated by computer
Eigen Structure, captured by ccd video camera and record after testee or the speculum being fixed on object reflection.Also
It is that the virtual image that display screen is formed is recorded in CCD shootings by speculum.When speculum is moved, the virtual image is relative to video camera
Can also be moved.By demarcating to external parameters of cameras, before and after can calculating speculum movement, the virtual image is relative to taking the photograph
The displacement of camera.According to light reflection law, the half of the distance is the displacement of speculum.Below with display screen
Illustrate as a example by upper display gridiron pattern Eigen Structure.
Rower is entered to video camera first and tries to achieve intrinsic parameter.Camera imaging model is as shown in Fig. 2 using considering aberration
Non-linear camera model describes imaging relations, i.e., added based on the linear camera model that perspective is projected and cause lens distortion
Aberration.If coordinate of spatial point p in world coordinate system is (X, Y, Z), coordinate of its picture point in image coordinate system is
(u, v).For two dimensional surface spatial point Z=0, two dimensional surface perspective projection imaging relation can be expressed as:
In formula λ be the non-zero proportions factor, K be camera Intrinsic Matrix, FuWith FvU, v axle on normalization matrix is represented respectively;
(u0,v0) based on point coordinates;Outer parameters of the R and T for video camera, represents rotation of the camera coordinate system with respect to world coordinate system respectively
Torque battle array and translation matrix, X=x/z, Y=y/z illustrate the projecting direction of p points.Can be in the hope of internal reference by camera calibration
Matrix number K.Camera calibration method is a lot, the two-step method that such as Tsai and Roger is proposed, plane reference method that Zhang Zhengyou is proposed etc..
Second step, shows and shoots gridiron pattern Eigen Structure and carry out image procossing.Standard chessboard is generated in a computer
Lattice Eigen Structure, captured by ccd video camera and records after testee or the speculum being fixed on object reflection.Also
It is that the virtual image that display screen is formed is recorded in CCD shootings by speculum.The virtual image 1 that virtual image position is seen in Fig. 1, the image that CCD shoots
As shown in Fig. 4 (a).Using straight-line detection method or Corner Detection Algorithm, the gridiron pattern characteristic point i.e. exact pixels of angle point are calculated
Position.At this moment, it is possible to be calculated now outer parameter spin matrix R of the video camera relative to the virtual image1With translation matrix T1.
3rd step, after mobile mirror, shows and shoots gridiron pattern Eigen Structure and carry out image procossing.Mobile mirror
Afterwards, ccd video camera shoots and records the virtual image that now display screen is formed by speculum.The virtual image 2, CCD that virtual image position is seen in Fig. 1
Shown in the image of shooting such as Fig. 4 (b).Repeat the calculating process in second step, obtain video camera relative to after movement the virtual image outer
Parameter translational matrix T2.
4th step, calculates virtual image displacement.Speculum can be obtained according to formula 2 and move the shifting between former and later two virtual images
Dynamic:
R in formula1And T1It is outer parameter spin matrix and translation square of the front video camera of speculum movement relative to the virtual image respectively
Battle array, T2It is outer parameter translational matrix of the video camera relative to the virtual image, column vector T=[t after speculum is movedx, ty, tz]T, wherein tx
And tyIt is displacement of the angle point in the both direction parallel to virtual image plane, in this test, does not need the two amounts;tz
It is angle point in the displacement on virtual image plane direction, as required virtual image displacement.According to light line reflection
Principle, the displacement of speculum are the half of virtual image displacement, i.e., speculum displacement is tz/2.
Claims (5)
1. the mirror displacements measuring method that a kind of feature based pattern reflects, it is characterised in that:Measuring system includes that CCD is imaged
Machine, display screen and computer;Carry out camera calibration first, obtain the intrinsic parameter of video camera;Characteristic pattern is produced by computer again
Sample, and show on a display screen, and project on speculum, recorded by video camera after reflection;CCD shoots and records reflection
The Eigen Structure that returns, i.e. CCD shoot and record the virtual image that display screen is formed by speculum;When speculum is moved, should
The virtual image can also be moved relative to video camera;By demarcating to external parameters of cameras, virtual image phase before and after speculum movement is obtained
For the position of video camera, and then calculate the displacement of the virtual image;Understand further according to light reflection law, the movement of speculum
Distance is the half of its virtual image displacement, so as to obtain the displacement of speculum;
The external parameters of cameras relative to the virtual image before and after being moved by speculum tries to achieve the displacement of the virtual image;If speculum is moved
External parameters of cameras spin matrix before dynamic relative to the virtual image is R1, translation matrix is T1, after speculum movement, translation matrix is
T2, then displacement t of the virtual imagezCan be calculated by following formula:
Column vector T=[t in formulax, ty, tz]T, wherein tzThe displacement of the as virtual image.
2. mirror displacements measuring method according to claim 1, it is characterised in that:Obtained in which by camera calibration
Parameter, using the nonlinear model for considering aberration.
3. mirror displacements measuring method according to claim 1, it is characterised in that:It is two-dimentional sine streak pattern,
Gridiron pattern pattern or Gauss lattice diagram.
4. mirror displacements measuring method according to claim 1, it is characterised in that:External parameters of cameras is demarcated as carrying
Take the characteristic point location of pixels in record image, the outer parameter that the video camera relative to the virtual image is calculated by camera calibration
Translation matrix.
5. mirror displacements measuring method according to claim 1, it is characterised in that:According to plane reflection law, reflection
The displacement of mirror for virtual image displacement 1/2, by the virtual image displacement for obtaining divided by 2 displacements that speculum is just obtained, i.e.,
It is equal to tz/ 2, t in formulazThe displacement of the as virtual image.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201410479062.5A CN104197846B (en) | 2014-09-18 | 2014-09-18 | Method for measuring displacement of reflector based on characteristic pattern reflection |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201410479062.5A CN104197846B (en) | 2014-09-18 | 2014-09-18 | Method for measuring displacement of reflector based on characteristic pattern reflection |
Publications (2)
Publication Number | Publication Date |
---|---|
CN104197846A CN104197846A (en) | 2014-12-10 |
CN104197846B true CN104197846B (en) | 2017-03-15 |
Family
ID=52083174
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN201410479062.5A Active CN104197846B (en) | 2014-09-18 | 2014-09-18 | Method for measuring displacement of reflector based on characteristic pattern reflection |
Country Status (1)
Country | Link |
---|---|
CN (1) | CN104197846B (en) |
Families Citing this family (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN105403173B (en) * | 2015-12-29 | 2018-05-01 | 上海大学 | A kind of light field deviation art measuring system calibration mirror and its application process |
CN108413871A (en) * | 2018-03-07 | 2018-08-17 | 中国工程物理研究院机械制造工艺研究所 | A kind of sub- mirror of plane based on phase analysis splices state measurement strategy |
CN108399640A (en) * | 2018-03-07 | 2018-08-14 | 中国工程物理研究院机械制造工艺研究所 | A kind of speculum relative pose measurement method based on camera calibration |
CN108917632B (en) * | 2018-05-15 | 2020-06-02 | 河北工程大学 | High-efficiency high-precision digital image correlation displacement post-processing method |
CN110619664B (en) * | 2019-09-17 | 2023-06-27 | 武汉理工大学 | Laser pattern-assisted camera distance posture calculation method and server |
CN114518295A (en) * | 2020-11-19 | 2022-05-20 | 中车株洲电力机车研究所有限公司 | Tower load measuring method, device and system |
Family Cites Families (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP4495327B2 (en) * | 2000-10-05 | 2010-07-07 | 株式会社メック | Defect detection apparatus and method |
CN102313541B (en) * | 2011-07-28 | 2013-01-02 | 中国科学院自动化研究所 | Method for controlling laser impact point position based on movable reflector |
CN102564348A (en) * | 2012-01-03 | 2012-07-11 | 四川大学 | Systematic geometric demarcation method for reflection three-dimensional measurement of stripe |
JP6238521B2 (en) * | 2012-12-19 | 2017-11-29 | キヤノン株式会社 | Three-dimensional measuring apparatus and control method thereof |
-
2014
- 2014-09-18 CN CN201410479062.5A patent/CN104197846B/en active Active
Also Published As
Publication number | Publication date |
---|---|
CN104197846A (en) | 2014-12-10 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
CN104197846B (en) | Method for measuring displacement of reflector based on characteristic pattern reflection | |
US11808564B2 (en) | Calibration method for fringe projection systems based on plane mirrors | |
CN104990515B (en) | Large-sized object three-dimensional shape measure system and its measuring method | |
Kimura et al. | Projector calibration using arbitrary planes and calibrated camera | |
CN104279960B (en) | Method for measuring size of object by mobile equipment | |
Albarelli et al. | Robust camera calibration using inaccurate targets | |
US10506225B2 (en) | Method of calibrating a camera | |
Zappa et al. | Static and dynamic features of Fourier transform profilometry: A review | |
CN106643563B (en) | A kind of Table top type wide view-field three-D scanning means and method | |
TWI512263B (en) | Shape measuring device and shape measuring method | |
JP5633058B1 (en) | 3D measuring apparatus and 3D measuring method | |
KR20170002409A (en) | Device and method for three-dimensional reconstruction of a scene by image analysis | |
TWI309294B (en) | 3-d profile measuring system | |
CN107941168A (en) | Reflective stripe surface shape measuring method and device based on speckle position calibration | |
CN108399640A (en) | A kind of speculum relative pose measurement method based on camera calibration | |
Hou et al. | Camera lens distortion evaluation and correction technique based on a colour CCD moiré method | |
CN104180778A (en) | Structured light method for small angle measurement | |
JP2017098859A (en) | Calibration device of image and calibration method | |
Boehm | Accuracy investigation for structured-light based consumer 3D sensors | |
Lu et al. | Distance and angle measurement of distant objects on an oblique plane based on pixel variation of CCD image | |
CN113251953B (en) | Mirror included angle measuring device and method based on stereo deflection technology | |
US20120056999A1 (en) | Image measuring device and image measuring method | |
Wang et al. | The human-height measurement scheme by using image processing techniques | |
CN103900495B (en) | Large-diameter mirror plane shape detecting method and device based on stripe reflection | |
CN113822920A (en) | Method for acquiring depth information by structured light camera, electronic equipment and storage medium |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
C06 | Publication | ||
PB01 | Publication | ||
C10 | Entry into substantive examination | ||
SE01 | Entry into force of request for substantive examination | ||
C14 | Grant of patent or utility model | ||
GR01 | Patent grant |