CN104103714A - Preparation method of novel battery piece - Google Patents

Preparation method of novel battery piece Download PDF

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Publication number
CN104103714A
CN104103714A CN201410299409.8A CN201410299409A CN104103714A CN 104103714 A CN104103714 A CN 104103714A CN 201410299409 A CN201410299409 A CN 201410299409A CN 104103714 A CN104103714 A CN 104103714A
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CN
China
Prior art keywords
layer
thickness
silicon nitride
nitride film
film layer
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Pending
Application number
CN201410299409.8A
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Chinese (zh)
Inventor
王成
蒋方丹
金浩
郭俊华
陈康平
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Zhejiang Jinko Solar Co Ltd
Jinko Solar Co Ltd
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Zhejiang Jinko Solar Co Ltd
Jinko Solar Co Ltd
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Priority to CN201410299409.8A priority Critical patent/CN104103714A/en
Publication of CN104103714A publication Critical patent/CN104103714A/en
Pending legal-status Critical Current

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    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L31/00Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L31/18Processes or apparatus specially adapted for the manufacture or treatment of these devices or of parts thereof
    • H01L31/186Particular post-treatment for the devices, e.g. annealing, impurity gettering, short-circuit elimination, recrystallisation
    • H01L31/1868Passivation
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L31/00Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L31/02Details
    • H01L31/0216Coatings
    • H01L31/02161Coatings for devices characterised by at least one potential jump barrier or surface barrier
    • H01L31/02167Coatings for devices characterised by at least one potential jump barrier or surface barrier for solar cells
    • H01L31/02168Coatings for devices characterised by at least one potential jump barrier or surface barrier for solar cells the coatings being antireflective or having enhancing optical properties for the solar cells
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02EREDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
    • Y02E10/00Energy generation through renewable energy sources
    • Y02E10/50Photovoltaic [PV] energy
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02PCLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
    • Y02P70/00Climate change mitigation technologies in the production process for final industrial or consumer products
    • Y02P70/50Manufacturing or production processes characterised by the final manufactured product

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  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Electromagnetism (AREA)
  • General Physics & Mathematics (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Sustainable Development (AREA)
  • Manufacturing & Machinery (AREA)
  • Sustainable Energy (AREA)
  • Photovoltaic Devices (AREA)

Abstract

The invention discloses a preparation method of a novel battery piece. The preparation method comprises the steps of cleaning, texturing, preparing a junction by diffusion, etching, removing PSG (Phosphosilicate Glass), applying a film, performing silk-screen printing, sintering and sorting, wherein the film is applied by two times: a silicon oxide film layer is applied after etching and removing the PSG, adopted reaction gas is N2O and SiH4, gas flows are 9000sccm and 300sccm respectively, the thickness of the silicon oxide film layer is 20-30nm and the refractive index is 1.8; and then a silicon nitride film layer is applied after sintering, adopted reaction gas is NH3, SiH4 and N2, gas flows are 7000sccm and 700sccm respectively, the thickness of the silicon nitride film layer is 70-80nm and the refractive index is 2.0-2.1. The preparation method improves the photoelectric conversion efficiency of a battery, and the service life is long.

Description

A kind of preparation method of novel battery sheet
Technical field
The invention belongs to application of solar, be specifically related to a kind of preparation method of crystal silicon solar batteries sheet.
Background technology
At present, in solar battery sheet preparation field, modal process step is exactly: one, and cleaning and texturing, the object of making herbs into wool is to remove mechanical loss layer and the oxide layer of silicon chip surface, is secondly a kind of texture matte that can increase silicon chip surface reflectivity of preparation; Two, diffusion system knot, object is to produce PN junction, forms internal electric field, is also the core of whole cell piece.Three, etching, object is by chemical reaction, the edge PN junction that connects silicon chip upper and lower surface is carved, to reach the object of the insulation at positive and the back side.With HF acid, remove the phosphorosilicate glass of silicon chip surface simultaneously.Four, PECVD plated film, is at cell piece surface deposition silicon nitride anti-reflecting film, increases the absorption of battery to sunray; Also can carry out H passivation to the front surface of battery simultaneously, battery surface is protected, anti-oxidation.Five, silk screen printing and sintering, main purpose is exactly to form electrode in silicon chip surface printing, and front is silver electrode, and the back side is silver-colored aluminium paste back electrode, is convenient to the collection of electric charge.Six, test go-on-go, be mesuring battary sheet under the irradiation of simulated solar light source xenon lamp, thereby by changing the resistance of load resistance, change the open circuit voltage of battery, short circuit current, then by calculating fill factor, curve factor, efficiency, series resistance, the parameters such as parallel resistance, finally by cell classification
Above step is the production model of at present main flow, but continuous maturation and development along with Application of Solar Energy technology, it is imperative developing more high efficiency cell piece, the exploitation of novel battery sheet have become the focus that industry is paid close attention to, only have continuous innovation and exploitation, the use value that improves cell piece, enterprise could obtain and better develops and establish oneself in an unassailable position in fierce market competition.
Summary of the invention
Technical problem to be solved by this invention is to provide a kind of preparation method of novel battery sheet, has not only improved cell photoelectric transformation efficiency, and long service life.
The technical scheme that technical solution problem of the present invention adopts is: a kind of preparation method of novel battery sheet, comprise cleaning and texturing step, diffusion system knot step, etching and remove PSG step, plated film step, silk screen printing step, sintering step and go-on-go step, it is characterized in that: described plated film step is divided into twice, in etching and after removing PSG step, plate one deck membranous layer of silicon oxide for the first time, the reacting gas of employing is N 2o and SiH 4, gas flow is respectively 9000sccm and 300sccm, and the thickness of described membranous layer of silicon oxide is 20~30nm, and refractive index is 1.8; After sintering step, plate for the second time silicon nitride film layer, the reacting gas of employing is NH 3and SiH 4and N 2, gas flow is respectively 7000sccm and 700sccm, and the thickness of described silicon nitride film layer is 70~80nm, and refractive index is 2.0~2.1.
As a kind of preferred, described silicon nitride film layer is monofilm or duplicature or trilamellar membrane, and the thickness of described individual layer silicon nitride film layer is 70~80nm; The ground floor thickness of described double-layer silicon nitride rete is 30~40nm, and second layer thickness is 40~50nm; The ground floor thickness of described three layers of silicon nitride film layer is 20~30nm, and second layer thickness is 30~40nm, and second layer thickness is 10~20nm.
The present invention deposits one deck membranous layer of silicon oxide in etching and after removing PSG step, mainly to play a kind of passivation, the silica density forming on surface is very high, and stone, to stop dirty material or polluter in environment, invade responsive silicon chip surface, meanwhile, its high rigidity can prevent that silicon chip surface is scratched in manufacture process, and the durability that strengthens silicon chip in production procedure process; Secondly, silica is to come from its chemical characteristic to the protection of silicon chip, no matter how high the clean level of technical process is, always also have the active pollutant of some electrical characteristics, finally can enter or drop on silicon chip surface; In oxidizing process, the last layer of silicon becomes silicon dioxide, pollutes and on surface, forms new oxide layer, has kept away electronically active surface, and other pollutants are limited in silicon oxide film, and for silicon chip, injury is very little.Therefore, after oxidation, can remove those unwanted contaminant mobile ions of surface, thereby improve the electrical property of cell piece.On the good cell piece of printing-sintering, plate again one deck silicon nitride film, in order to allow this tunic be utilized more fully, when illumination is mapped on silicon chip, the ground floor medium passing through is silicon nitride film, the silicon nitride film photon that transmission is fallen to shine completely, next is only the media such as metal grid lines below film and silicon chip, even if light can reflect, but major part is also in silicon nitride internal reflection, reflector space is below silicon nitride film and below grid line, silicon nitride film and the space between silicon chip.By ground floor medium, be that metal grid lines just directly reflects away with irradiating light, and through silicon nitride film, do not compare, obviously the first situation is better than the second situation.In coating process, the gas passing into not only can react with silicon chip, also can react with metal ion, and have simple substance to produce, so little on the Gate line conductive capability impact of cell piece simultaneously.
When the present invention plates silicon nitride film layer for the second time, the reacting gas of employing is NH 3and SiH 4, also have micro-N 2.
The invention has the beneficial effects as follows: adopt the inventive method, plated film step is divided into twice and carries out, plate for the first time the colourless membranous layer of silicon oxide of one deck, then after sintering step, plate silicon nitride film layer and not only improved cell photoelectric transformation efficiency, and long service life.
 
Accompanying drawing explanation
Fig. 1 is the structural representation of embodiment of the present invention cell piece.
Wherein 1, metal grid lines; 2, silicon nitride film; 3, silicon oxide film; 4, N+ layer; 5, Si substrate; 6, P+ layer; 7, back electrode.
Below in conjunction with accompanying drawing, the present invention will be further described.
Embodiment
Embodiment 1: a kind of preparation method of novel battery sheet, comprise cleaning and texturing step, diffusion system knot step, etching and remove PSG step, plated film step, silk screen printing step, sintering step and go-on-go step, wherein plated film step is divided into twice, in etching and after removing PSG step, plate the colourless membranous layer of silicon oxide of one deck for the first time, the reacting gas of employing is N 2o and SiH 4, gas flow is respectively 9000sccm and 300sccm, and the thickness of described membranous layer of silicon oxide is 30nm, and refractive index is 1.8; After sintering step, plate for the second time one deck silicon nitride film layer, the reacting gas of employing is NH 3and SiH 4, gas flow is respectively 7000sccm and 700sccm, and the thickness of described silicon nitride film layer is 70nm, and refractive index is 2.05.
Embodiment 2: the preparation method of another kind of novel battery sheet, and wherein the thickness of membranous layer of silicon oxide is 20nm, refractive index is 1.8; After sintering step, plate for the second time two layers of silicon nitride film layer, the reacting gas that ground floor adopts is NH 3and SiH 4, gas flow is respectively 4000sccm and 1000sccm, and the thickness of ground floor silicon nitride film layer is 40nm, and refractive index is 2.0; The reacting gas that the second layer adopts is NH 3and SiH 4, gas flow is respectively 7000sccm and 900sccm, and the thickness of second layer silicon nitride film layer is 50nm, and refractive index is 2.05.Other is identical with embodiment 1.
Embodiment 3: the preparation method of another novel battery sheet, and wherein the thickness of membranous layer of silicon oxide is 25nm, refractive index is 1.8; After sintering step, plate for the second time three layers of silicon nitride film layer, the reacting gas that ground floor adopts is NH 3and SiH 4, gas flow is respectively 3000sccm and 300sccm, and the thickness of ground floor silicon nitride film layer is 30nm, and refractive index is 2.0; The reacting gas that the second layer adopts is NH 3and SiH 4, gas flow is respectively 6000sccm and 660sccm, and the thickness of second layer silicon nitride film layer is 40nm, and refractive index is 2.05; The reacting gas of the 3rd layer of employing is NH 3and SiH 4, gas flow is respectively 6000sccm and 660sccm, and the thickness of the 3rd layer of silicon nitride film layer is 10nm, and refractive index is 2.1.Other is identical with embodiment 1.

Claims (2)

1. the preparation method of a novel battery sheet, comprise cleaning and texturing step, diffusion system knot step, etching and remove PSG step, plated film step, silk screen printing step, sintering step and go-on-go step, it is characterized in that: described plated film step is divided into twice, in etching and after removing PSG step, plate one deck membranous layer of silicon oxide for the first time, the reacting gas of employing is N 2o and SiH 4, gas flow is respectively 9000sccm and 300sccm, and the thickness of described membranous layer of silicon oxide is 20~30nm, and refractive index is 1.8; After sintering step, plate for the second time silicon nitride film layer, the reacting gas of employing is NH 3and SiH 4, gas flow is respectively 7000sccm and 700sccm, and the thickness of described silicon nitride film layer is 70~80nm, and refractive index is 2.0~2.1.
2. the preparation method of a kind of novel battery sheet as claimed in claim 1, is characterized in that: described silicon nitride film layer is monofilm or duplicature or trilamellar membrane, and the thickness of described individual layer silicon nitride film layer is 70~80nm; The ground floor thickness of described double-layer silicon nitride rete is 30~40nm, and second layer thickness is 40~50nm; The ground floor thickness of described three layers of silicon nitride film layer is 20~30nm, and second layer thickness is 30~40nm, and second layer thickness is 10~20nm.
CN201410299409.8A 2014-06-27 2014-06-27 Preparation method of novel battery piece Pending CN104103714A (en)

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Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102903764A (en) * 2012-09-27 2013-01-30 东方电气集团(宜兴)迈吉太阳能科技有限公司 Three-layered silicon nitride antireflective film of crystalline silicon solar cell and preparation method thereof
US20130171763A1 (en) * 2010-07-15 2013-07-04 Shin-Etsu Chemical Co., Ltd. Method for producing solar cell and film-producing device
CN103387011A (en) * 2012-05-10 2013-11-13 王洪举 Carbon fiber solar panel car roof

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20130171763A1 (en) * 2010-07-15 2013-07-04 Shin-Etsu Chemical Co., Ltd. Method for producing solar cell and film-producing device
CN103387011A (en) * 2012-05-10 2013-11-13 王洪举 Carbon fiber solar panel car roof
CN102903764A (en) * 2012-09-27 2013-01-30 东方电气集团(宜兴)迈吉太阳能科技有限公司 Three-layered silicon nitride antireflective film of crystalline silicon solar cell and preparation method thereof

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Application publication date: 20141015