CN104102017B - The super diffraction limit imaging system of random scatter optics and method shone based on structure light - Google Patents
The super diffraction limit imaging system of random scatter optics and method shone based on structure light Download PDFInfo
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Abstract
The invention discloses a kind of super diffraction limit imaging system of random scatter optics and method shone based on structure light, the difficult realization of existing similar technique complex process, imaging time length, system architecture is mainly solved, the problem of imaging resolution is low.Its imaging system includes：The wave plate of light source, beam expander, spatial light modulator, λ/4, extender lens group, light barrier, lens, random scattering media, convergent lens and CCD camera；The light beam of light source transmitting is incided in spatial light modulator after being expanded through beam expander, obtains 0 grade of light and ± 1 grade of light；Circularly polarized light is obtained by the wave plate of λ/4, light barrier is reached after being expanded through extender lens group, retains ± 1 grade of light；± 1 grade of light is interfered through lens, produces Structured Illumination observed object；The observed object illuminated enters random scattering media, occurs strong scattering, concentrated lens entrance to CCD camera.The present invention has the advantages that simple in construction and imaging resolution is high, available for the imaging of optical ultra-discrimination rate.
Description
Technical field
The invention belongs to technical field of imaging, more particularly to a kind of optical imaging system, available for optical ultra-discrimination rate into
Picture.
Background technology
The resolution ratio of traditional optical imaging is limited by diffraction limit, and measurement is difficult in visible-range and is less than 200nm's
Distance, therefore it is extremely urgent to break through the research of optical system diffraction limit imaging.
At present, around the research of the super diffraction limit imaging near field and far field, the progress attracted people's attention has been obtained.Near field is super to spread out
Perfect lens that emitter-base bandgap grading limit imaging method is mainly prepared using nano-probe, plasma super material and material with negative refractive index etc.
Evanescent wave is detected, its resolution ratio is not limited by Rayleigh criterion.But due to nano-probe, plasma super material, bear
The preparation of refraction materials need to meet very exacting terms, and technique is extremely complex, and technology is ripe not enough, cause its scanning to be visited
Pin easily causes damage to sample, and is unfavorable for being observed biological tissue.
And the super diffraction limit imaging method in far field, such as stimulated emission depletion microtechnic, random optical rebuild microtechnic
Microtechnic etc. is positioned with photosensitive, they believe by detecting the space of the fluorescence signal distributed acquisition sample of excited fluorescence molecule
Breath, detectable sample interior, at present up to 20~50nm, and under maximum conditions up to 5.8nm resolution ratio.But because it reaches
Spatial resolution be, seriously to sacrifice temporal resolution as cost, to cause that imaging process is complicated, time-consuming, it is difficult to realize real
When observe.
The content of the invention
It is an object of the invention to the deficiency for above-mentioned prior art, a kind of random scatter shone based on structure light is proposed
The super diffraction limit imaging system of optics and method, to simplify material preparation process, simplify imaging process, raising imaging resolution.
The technical proposal of the invention is realized in this way：
One, technical thoughts are：Using structure light as imaging source, illuminating watches target is obtained by random scattering media
To image, and transmit it in main control computer, reconstruct final observed object by calculating imaging method, obtain high-quality
The super-resolution image of amount.
Two, are spread out based on the super diffraction limit imaging system of random scatter optics that structure light is shone, including optics sub-device with super
Emitter-base bandgap grading limits imaging device, it is characterised in that：
The optics sub-device, including light source, two aperture diaphragms, beam expander, spatial light modulator, four lens, λ/4
Wave plate, three speculums and light barrier；The light beam of light source transmitting sequentially passes through the first aperture diaphragm, beam expander, the first speculum
Back lighting produces 0 grade of light ,+1 grade of light and -1 grade of light, this three-level light is by the first lens by parallel point in spatial light modulator
Open, through λ/4 wave plate obtain circularly polarized light, then pass sequentially through the second speculum and the second lens, the second diaphragm and the 3rd lens enter
Row is expanded, and keeps off 0 grade of middle light by light barrier, retains+1 grade of light and -1 grade of light, then by the after the 3rd speculum
Four lens so that+1 grade of light and -1 grade of light are interfered on focal plane, produce structure light to illuminate observed object；
The super diffraction limit imaging device, including three lens, the 3rd aperture diaphragm, random scattering media, CCD phases
Machine；Observed object through illuminating sequentially passes through the diameter that the 5th lens, the 3rd aperture diaphragm and the 6th lens reduce whole light beam,
Make light beam that strong scattering occur in random scattering media, then after the progress beam energy convergence of the 7th lens, received by CCD camera
Image.
Three, are comprised the following steps based on the super diffraction limit imaging method of random scatter optics that structure light is shone：
(1) original image collected to CCD camera carries out brightness of image homogenization processing, to eliminate by light source fluctuation pair
The influence of brightness of image；
(2) image after handling brightness of image homogenization carries out Fourier transform operation, obtains corresponding frequency spectrum；
(3) by controlling spatial light modulator to input three different phases on each direction of 0 °, 45 °, 90 ° and 135 °
Value, constitutes 3 × 3 systems of linear equations and solves, to isolate 0 grade on each direction ,+1 grade and -1 grade spectral imaging information；
(4) overlapping region for 0 grade ,+1 grade and -1 grade spectral imaging information isolated on four direction, obtains four groups
The frequency component k of Structured Illuminationi, i ∈ { 0 °, 45 °, 90 °, 135 ° }；
(5) using the fourier transform property of cosine function, by the frequency component k of obtain four groups of Structured IlluminationsiEnter
Line frequency is spliced, and be expanded frequency spectrum k0±ki, wherein k0For original frequency component；
(6) the transmission matrix data cube E of random scattering media is obtained in frequency domain using angular spectra theorym；
(7) the frequency spectrum k extended according to Structured Illumination0±kiWith the transmission matrix data cube E of random scattering mediam,
ASCIRA algorithms are rebuild by image and reconstruct observed object image.
The present invention has the following advantages that compared with prior art：
1) principle that the present invention is imaged according to super diffraction limit and Structured Illumination is imaged, devises what is shone based on structure light
The super diffraction limit imaging system of random scatter optics, compared with existing optical system, material preparation process is simple, and system architecture is easy
Realize, imaging resolution is significantly improved.
2) present invention utilizes angular spectra theory, designs the super diffraction limit imaging side of random scatter optics shone based on structure light
Method, compared with existing imaging method, had not only filtered veiling glare but also had remained the high-frequency information of observed object, and effectively reduced
Imaging time, improves imaging resolution.
Brief description of the drawings
Fig. 1 is the structure chart for the super diffraction limit imaging system of random scatter optics that the present invention is shone based on structure light；
Fig. 2 is the implementation process figure for the super diffraction limit imaging method of random scatter optics that the present invention is shone based on structure light；
Fig. 3 is the schematic diagram of intermediate frequency spectrum image-forming information separation of the present invention；
Fig. 4 is the schematic diagram of intermediate frequency spectrum extension of the present invention；
Fig. 5 is the transmission matrix data cube schematic diagram of acquisition random scattering media in the present invention.
Embodiment
Below with reference to accompanying drawing, the super diffraction of random scatter optics under Structured Illumination of the present invention is clearly and completely described
The setting of limit imaging system, and imaging method realize step.
Referring to Fig. 1, imaging system of the invention, including optics sub-device and super diffraction limit imaging device two parts.Its
In：
The optics sub-device, including light source 1, two aperture diaphragms, beam expander 3, spatial light modulator 4, four lens,
The wave plate of λ/4 6, three speculums and light barriers 12.Wherein, light source 1 is using the laser of visible light wave range, the light of laser transmitting
Beam filters out the veiling glare in light beam through the first aperture diaphragm 2, is expanded through beam expander 3, and light beam is controlled in sky by the first speculum 7
Between incident direction on optical modulator 4, it is respectively 0 °, 45 °, 90 ° and 135 ° four direction, i.e., produce respectively in each direction
Raw 0 grade of light ,+1 grade of light and -1 grade of light；This three-level light is parallel separated by the first lens 5, through λ/4 wave plate 6 obtain have more preferably polarization
The circularly polarized light of characteristic；The circularly polarized light changes optical path direction by the second speculum 8, via the second lens 9, the second diaphragm 10
The extender lens group constituted with the 3rd lens 11 is expanded, then keeps off 0 grade of middle light through light barrier 12, retains+1 grade of light
With -1 grade of light；Change the direction of propagation of+1 grade of light retained in light path and -1 grade of light by the 3rd speculum 13, then pass through the 4th
Lens 14, are interfered on its focal plane, produce structure light to illuminate observed object.
The super diffraction limit imaging device, including three lens, the 3rd aperture diaphragm 17, random scattering media 19, CCD
Camera 21, the thickness of wherein random scattering media 19 elects 10~20 μm as, to reduce its absorption to light and strengthen it to light
Scattering.Observed object through illuminating inversely is expanded via what the 5th lens 16, the 3rd aperture diaphragm 17 and the 6th lens 18 were constituted
Lens group, to filter out the veiling glare in light path and reduce the diameter of whole light beam, then makes light beam by random scattering media 19,
And strong scattering occurs inside it, the output beam after strong scattering carries out energy convergence through the 7th lens 20, finally by CCD phases
Machine 21 receives image.
Referring to Fig. 2, imaging method of the invention, implementation step is as follows：
Step 1, gather original image and carry out brightness of image homogenization processing.
Original image T (r) 1a) is gathered by CCD camera, and uploads to main control computer；
1b) main control computer uniforms principle according to brightness of image, with the modulus value of original image | T (r) | divided by original graph
As T (r), the image of brightness homogenization is obtainedTo eliminate the influence by light source fluctuation to brightness of image, and will
It is stored in main control computer.
Step 2, the frequency spectrum that brightness uniforms image is obtained, i.e., Fourier's change is carried out to the image D (r) that brightness is uniformed
Change, obtain the frequency spectrum that the brightness uniforms imageWherein,Represent Fourier transform operation.
Step 3,0 grade ,+1 grade and -1 grade spectral imaging information on 0 °, 45 °, 90 ° and 135 ° each direction is isolated.
Referring to Fig. 3, the realization of this step is as follows：
3a) by main control computer control spatial light modulator respectively on 0 °, 45 °, 90 ° and 135 ° each direction arbitrarily
Input three different phase value φj, j ∈ { 1,2,3 }；
3b) by three different phase value φjSubstitute into Structured Illumination intensity expression formula, obtain structure light 0 °, 45 °,
90 ° and 135 ° each direction intensity of light expression formulas are as follows：
I (r)=I0[1+cos(ki·r)+φj],<1>
Wherein, I0For the luminous intensity of light source, kiFor the frequency component of different directions Structured Illumination, i ∈ 0 °, and 45 °, 90 °,
135 ° }, r is space coordinate；
3c) according to structure light in 0 °, 45 °, 90 ° and 135 ° each direction intensity of light I (r) and the point of whole optical system
Spread function PSF (r), obtains the mathematic(al) representation of whole optical system model：
Wherein, O (r) represents observed object image, and D (r) represents the image after brightness homogenization, and PSF (r) represents whole light
The point spread function of system；
3d) to formula<2>Fourier transform is carried out, the mathematic(al) representation in whole optical system frequency domain is obtained：
Wherein, D (k) is the frequency spectrum that brightness uniforms image, and OTF (k) represents the optical transfer function of whole optical system,
S(k0)、S(k0+ki)、S(k0-ki) it is respectively 0 grade ,+1 grade, -1 grade of spectral imaging information；
Three different phases that spatial light modulator is inputted 3e) are controlled by main control computerj, j ∈ { 1,2,3 },
Substitute into formula<3>, constitute 3 × 3 systems of linear equations：
Equation group is solved, to isolate 0 grade on each direction ,+1 grade and -1 grade spectral imaging information, i.e. S (k0)、S
(k0+ki)、S(k0-ki)。
Step 4,0 grade ,+1 grade and -1 respectively be isolated by by structure light on 0 °, 45 °, 90 ° and 135 ° this four direction
Level spectral imaging information S (k0)、S(k0+ki)、S(k0-ki) overlapping region, obtain the frequency component k of four groups of Structured Illuminationsi,
i∈{0°,45°,90°,135°}。
Step 5, using the fourier transform property of cosine function, by the frequency component k of obtain four groups of Structured Illuminationsi
Enter line frequency splicing, be expanded frequency spectrum k0±kiSo that more high-frequency informations are included in the image that Structured Illumination is obtained,
So as to contribute to the raising of resolution ratio, wherein, k0For original frequency component, the frequency spectrum after extension is as shown in Figure 4.
Step 6, the transmission matrix data cube E of random scattering media is obtainedm；
Referring to Fig. 5, the realization of this step is as follows：
6a) according to angular spectra theory, obtaining the plane of incidence wave field by observed object is:
Wherein, kxAnd kyWave component vector of the light wave in x-axis and y-axis direction is represented respectively, and between incident light and optical axis
Angle thetax、θyIt is relevant, i.e. kx/ 2 π=sin θx/ λ, ky/ 2 π=sin θy/ λ, Ao(kx,ky) it is referred to as angular spectrum, represent each plane wavelength-division
The complex amplitude of amount；
6b) according to formula<4>Angle theta between middle incident light and x-axisxAngle theta between y-axisy, by different angles
(θx,θy) laser beam be irradiated in the same position of random scattering media successively, when recording the incident light irradiation of each angle respectively,
The speckle field E produced in image planesm(x,y,kx,ky) it is random scattering media transmission matrix；
6c) during light irradiation that different angles are incident, the different speckle field E produced in image planesm(x,y,kx,ky) be superimposed upon
Random medium transmission matrix data cube E is just constituted togetherm。
Step 7, observed object image is rebuild.
7a) the frequency spectrum k for extending Structured Illumination0±kiInverse Fourier transform is carried out, the speckle field E in spatial domain is obtaineds
Include more observed object high-frequency informations in (x, y), the speckle field；
7b) by the speckle field E in spatial domains(x, y), is expressed as with angular spectrum and random scattering media transmission matrix：
Wherein, Ao(kx,ky) it is angular spectrum, Em(x,y,kx,ky) it is random scattering media transmission matrix；
7c) by step 7a) speckle field E in obtained spatial domains(x, y) and step 6b) obtained random scattering media passes
Defeated matrix Em(x,y,kx,ky), substitute into formula<5>Solve angular spectrum Ao(kx,ky)；
7d) by obtained angular spectrum Ao(kx,ky) substitute into plane of incidence wave field formula
Solve the plane of incidence wave field E by observed objecto(x,y)；
7e) to the plane of incidence wave field E Jing Guo observed objecto(x, y) take absolute value after square, obtain the sight finally rebuild
Survey target image T：
T=| Eo(x,y)|2。
Above description is only example of the present invention, does not constitute any limitation of the invention.Obviously for
, all may be without departing substantially from the principle of the invention, structure after present invention and principle has been understood for one of skill in the art
In the case of, the various modifications and variations in progress form and details, but these modifications and variations based on inventive concept
Still within the claims of the present invention.
Claims (4)
1. a kind of super diffraction limit imaging system of random scatter optics shone based on structure light, including optics sub-device and super diffraction
Limit imaging device, it is characterised in that：
The optics sub-device, including light source (1), two aperture diaphragms (2,10), beam expander (3), spatial light modulator (4),
Four lens (5,9,11,14), the wave plate (6) of λ/4, three speculums (7,8,13) and light barrier (12)；The light of light source (1) transmitting
Beam sequentially passes through the first aperture diaphragm (2), beam expander (3), in the first speculum (7) back lighting to spatial light modulator (4), production
Raw 0 grade of light ,+1 grade of light and -1 grade of light, this three-level light by the first lens (5) by parallel separated, through λ/4 wave plate (6) to obtain circle inclined
Shake light, then passes sequentially through the second speculum (8) and the second lens (9), the second aperture diaphragm (10) and the progress of the 3rd lens (11)
Expand, and keep off 0 grade of middle light by light barrier (12), retain+1 grade of light and -1 grade of light, then after the 3rd speculum (13)
Pass through the 4th lens (14) so that+1 grade of light and -1 grade of light are interfered on focal plane, produce structure light to illuminate imaging mesh
Mark；
The super diffraction limit imaging device, including three lens (16,18,20), the 3rd aperture diaphragm (17), random scatters are situated between
Matter (19), CCD camera (21)；Imageable target through illuminating sequentially passes through the 5th lens (16), the 3rd aperture diaphragm (17) and
Six lens (18) reduce the diameter of whole light beam, make light beam that strong scattering occur in random scattering media (19), then saturating through the 7th
Mirror (20) is carried out after beam energy convergence, and image is received by CCD camera (21).
2. imaging system according to claim 1, it is characterised in that 0 grade of light ,+1 produced in spatial light modulator (4)
Level light and -1 grade of light, are to separate what is produced on each direction of 0 °, 45 °, 90 ° and 135 ° this four direction by structure light.
3. imaging system according to claim 1, it is characterised in that the thickness of random scattering media (19) is 10~20 μ
M, to reduce the absorption to light, strengthens the scattering to light.
4. imaging system according to claim 1, it is characterised in that the light source (1) is the laser of visible light wave range.
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| CN107037577A (en) * | 2017-05-10 | 2017-08-11 | 中国科学院苏州生物医学工程技术研究所 | A kind of Structured Illumination optical system and method |
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Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6721258B1 (en) * | 1999-06-21 | 2004-04-13 | Citizen Watch Co., Ltd. | Optical device for super-resolution |
| CN101866060A (en) * | 2009-12-23 | 2010-10-20 | 南京邮电大学 | Super-resolution optical imaging device and method |
| CN101907781A (en) * | 2010-07-13 | 2010-12-08 | 杭州电子科技大学 | Method for manufacturing optical flat plate with beam converging function |
| CN102289083A (en) * | 2011-08-23 | 2011-12-21 | 中国科学院光电技术研究所 | Far-field super-resolution visual imaging device and imaging method |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP5713405B2 (en) * | 2009-10-30 | 2015-05-07 | 国立大学法人北海道大学 | Optical communication system and method of operating optical communication system |
-
2014
- 2014-07-07 CN CN201410320944.7A patent/CN104102017B/en active Active
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6721258B1 (en) * | 1999-06-21 | 2004-04-13 | Citizen Watch Co., Ltd. | Optical device for super-resolution |
| CN101866060A (en) * | 2009-12-23 | 2010-10-20 | 南京邮电大学 | Super-resolution optical imaging device and method |
| CN101907781A (en) * | 2010-07-13 | 2010-12-08 | 杭州电子科技大学 | Method for manufacturing optical flat plate with beam converging function |
| CN102289083A (en) * | 2011-08-23 | 2011-12-21 | 中国科学院光电技术研究所 | Far-field super-resolution visual imaging device and imaging method |
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