CN104090164A - Conductor conductivity one-dimension distribution measurement method and device based on compression perception principle - Google Patents

Conductor conductivity one-dimension distribution measurement method and device based on compression perception principle Download PDF

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CN104090164A
CN104090164A CN201410164002.4A CN201410164002A CN104090164A CN 104090164 A CN104090164 A CN 104090164A CN 201410164002 A CN201410164002 A CN 201410164002A CN 104090164 A CN104090164 A CN 104090164A
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conductivity
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CN104090164B (en
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曹宁
王伟
黄峥
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Hohai University HHU
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Abstract

The invention relates to a conductor conductivity one-dimension distribution measurement method and device based on a compression perception principle. The method includes the following steps: step1: closely fitting a programmable switch electrode belt which includes tens to hundreds of programmable switch electrodes with the surface of a to-be-detected conductor; generating a Bernouli random sampling matrix through a computer and obtaining row vectors sequentially from the matrix; step2: measuring resistance values corresponding to the different row vectors in the sampling matrix so as to obtain a resistance sampling vector; step3:selecting corresponding sparse transformations according to different detected conductors so as to form a super complete dictionary; and step4: using a retrieval algorithm to carry out reestablishment on resistance one-dimension distribution of the to-be-detected conductor and using a resistivity calculation formula to obtain conductor resistivity one-dimension distribution and obtaining a reciprocal so as to obtain a conductor conductivity one-dimension distribution result. The conductor conductivity one-dimension distribution measurement method and device based on the compression perception principle have advantages of being simple and convenient in measurement process, high in measurement precision and rapid in measurement and the method and device are applicable to updating and reconstruction to the prior conductivity measurement devices.

Description

Measuring method and device that a kind of conductor conductivity one dimension based on compressed sensing principle distributes
Technical field
The present invention relates to a kind of measuring method of conductor conductivity, particularly relate to measuring method and device that a kind of conductor conductivity one dimension based on compressed sensing principle distributes.
Background technology
The measuring method of conductor conductivity has a wide range of applications in the each field of every profession and trade, as: water sample monitoring, soil analysis, the examination of materials etc.Along with scientific and technological progress, in modern industrial and agricultural production, the production run of various products is had to higher performance and technical requirement, this just need to carry out strict control to each factor of production link.The measuring method of conductor conductivity is applicable to the checking measurements of conductive paper thickness evenness, the checking measurements of pedotheque vertical distribution, the checking measurements of wire resistance silk conductivity, the checking measurements of insulating material conductivity, the fields such as electroconductive nylon conductivity checking measurements, but to the measurement of conductor conductivity space distribution, yet there are no clear and definite, ripe and concrete implementation method.
Chinese patent application 201010188421.3 has proposed " a kind of conductivity of graphite measuring method and measurement mechanism ", although that this scheme has advantages of is simple to operate, cost is lower and be applicable to various anisotropic material conductivity measurements, but also existence is following obviously not enough: the one, and measure the conductivity of N point and must carry out N measurement, it is measured often, and the systematic measurement error bringing is large; The 2nd, each measurement all needs mobile micrometric displacement mobile device, not only waste the plenty of time, and the environmental factor such as conductor conductivity and temperature, humidity is closely related, it is large that the environmental factor because of the long meaning of Measuring Time and between repeatedly measuring is disturbed, and will obviously increase single measurement error.
Chinese patent application 201210305745.X has proposed a kind of " electrical conductivity of solution measuring method and the Key Circuit of triangular wave excitation Integral Processing ", although this scheme has advantages of impact, the elimination randomness of eliminating distribution of electrodes electric capacity and disturbs the impact of measuring accuracy is improved to Measurement sensibility degree, but also exist following obviously not enough: the one, only can measure the conductivity situation of solution entirety, can not specifically measure the distribution of conductivity situation of solution; The 2nd, cannot measure the concrete spread condition of solution concentration.
Known compressed sensing (compressed sensing, being called for short CS) theory makes signals collecting break through the restriction of nyquist sampling theorem, propose as long as signal is compressible or is sparse at certain transform domain, so just can with the incoherent observing matrix of transform-based, high conversion gained dimensional signal be projected on a lower dimensional space with one, then just can from these a small amount of projections, reconstruct the principle that realizes of original signal by solving an optimization problem with high probability.Carry out the measurement of conductor conductivity one dimension distribution if utilize compressed sensing principle, can be only by a conductivity testing circuit, through repeatedly utilizing programmable switch group random combine, sample is sampled, recover by certain algorithm again, obtain fast conductor conductivity distribution results more accurately.Utilize compressed sensing principle to measure the method that conductor conductivity one dimension distributes but also do not see at present.
In sum, how to overcome the deficiencies in the prior art and become one of great difficult problem urgently to be resolved hurrily in current conductor conductivity field of measuring technique.
Summary of the invention
The object of the invention is measuring method and device that the deficiency for overcoming prior art existence provides a kind of conductor conductivity one dimension based on compressed sensing principle to distribute, the present invention has that measuring process is easy, measuring accuracy is high and measure the advantages such as quick, is applicable to the upgrading to existing conductivity measuring apparatus.
The measuring method that a kind of conductor conductivity one dimension based on compressed sensing principle proposing according to the present invention distributes, is characterized in that comprising following concrete steps:
Step 1, fits tightly containing tens of programmable switch electrode bands to hundreds of programmable switch electrodes and the surface of conductor to be measured; Generate bernoulli stochastic sampling matrix by computing machine, from this matrix, take out successively row vector, then by computer export row vector signal the control end to programmable switch electrode band, control tens of on off operating modes to hundreds of programmable switch electrodes, 0 pair of inductive switch closure, 1 pair of inductive switch disconnects;
Step 2, accesses conductor to be measured two ends by the potential electrode of electrical impedance tester, records resistance value corresponding to different rows vector in sampling matrix, draws resistance sampling vector;
Step 3, detects conductor according to difference and selects corresponding sparse conversion, forms super complete dictionary;
Step 4, utilize recovery algorithms that conductor resistance one dimension to be measured is distributed and rebuild, utilize resistivity to calculate formula: ρ=RS/L, wherein: ρ is that resistivity, R are that length, the S that resistance value, L are conductor to be measured is cross-sectional area, try to achieve conductor resistance rate one dimension and distribute, then get inverse and obtain conductor conductivity one dimension distribution results.
The further preferred version of measuring method of the present invention is:
Described in step 1 of the present invention, fit tightly containing tens of programmable switch electrode bands to hundreds of programmable switch electrodes and the surface of conductor to be measured, refer to that each programmable switch electrode is in upwards series connection mutually of one-dimensional square, and fit tightly with conductive surface to be measured, form Observable mask.
The structural formula that generates bernoulli stochastic sampling matrix described in step 1 of the present invention is: matrix Φ ∈ R m × Neach element of this matrix is obeyed independently symmetrical bernoulli and is distributed, that is:
Owing to only there is break-make two states in circuit, therefore above formula matrix can be reduced to:
Above formula Φ sin every a line be considered as one group of control vector, computing machine is successively according to the row vector of this matrix output low and high level gauge tap, 0 pair of inductive switch closure, the part measured conductor that this switch is corresponding is by switch short circuit, and this part is not counted in the now resistance of gained; 1 pair of inductive switch disconnects, and this part counts the now resistance of gained.
Resistance sampling vector described in step 2 of the present invention, refers to by different rows vector correspondence in sampling matrix and obtains multiple resistance sampling values again by all be multiplied by be normalized, finally obtain the resistance sampling vector Y=[y being formed by M linear projection observed samples value 1, y 2..., y m] t∈ R m; Wherein: when the distribution of resistance of conductor is N dimension real signal X=[x 1, x 2..., x n] t∈ R n, resistance sampling now vector Y is that the result that signal X is carried out to a compression observation is Y=Φ X.
Sparse conversion described in step 3 of the present invention, refers to from resistance sampling vector Y and recovers conductor resistance one dimension distribution signal X, requiring X is that sparse vector or X are sparse in a transform domain.
Recovery algorithms described in step 4 of the present invention, refers to that from resistance sampling vector Y, recovering one dimension conductor resistance distribution signal X is one and solves system of linear equations, at conductor resistance one dimension distribution signal X under sparse or compressible prerequisite, solves the underdetermined system of equations:
arg min X | | ΨX | |
s.t.A CSΘ=ΦX=Y
 
Described in step 4 of the present invention, recovery algorithms is base back tracking method, matching pursuit algorithm, orthogonal matching pursuit method or method of conjugate gradient.
The device of a kind of conductor conductivity one dimension distribution measurement method based on compressed sensing principle proposing according to the present invention, it comprises electrical impedance tester, characterized by further comprising electrical impedance tester and is connected successively with programmable switch electrode band and computing machine; Wherein: programmable switch electrode band comprises tens of to hundreds of programmable switch electrodes, the control module that contains single-chip microcomputer and communication interfaces, and each programmable switch electrode of programmable switch electrode band in upwards series connection fitting tightly as Observable mask with conductive surface to be measured mutually of one-dimensional square; Programmable switch electrode band, control module and communication interface are connected successively; Described single-chip microcomputer is 51 single-chip microcomputers, msp430 single-chip microcomputer or atmega single-chip microcomputer; Described computing machine is the computing machine that contains matlab software, C Plus Plus software or java software.
The present invention compared with prior art its remarkable advantage is: the one, and the present invention is conductor conductivity one dimension distribution measurement method and the device of creating based on compressed sensing principle, only need the potential electrode of electrical impedance tester to access conductor to be measured two ends, can carry out easy reliable measurement, greatly shorten measurement number of times, be less than or equal to 35% of existing measurement number of times, can high precision rebuild conductivity one dimension distribution situation 0.35 × N time, reduce the systematic error of introducing in measuring process, improved measuring accuracy; The 2nd, not only number of times is few to the present invention is based on the measurement that compressed sensing principle carries out, and without mobile any device, measuring speed is fast, has obviously reduced single measurement error, provides guarantee for improving the measuring precision; The 3rd, the present invention can measure the overall condition of conductor conductivity, can measure again the one dimension distribution spread condition of conductor conductivity, has widened range of application.The comparing result of the present invention and prior art measuring method and device refers to table 1.The present invention is widely used in the upgrading to existing conductivity measuring apparatus, is specially adapted to the measurement of the conductivity one dimension distribution situation of slender conductor.
Table 1: the comparing result of the present invention and prior art measuring method and device
Brief description of the drawings
Fig. 1 is the structural representation of the measurement mechanism that proposes of the present invention.
Fig. 2 is the schematic diagram of the removing method of bernoulli stochastic matrix and row vector.
Embodiment
Below in conjunction with drawings and Examples, the specific embodiment of the present invention is described in further detail.
The measuring method that a kind of conductor conductivity one dimension based on compressed sensing principle that the present invention proposes distributes, mainly comprises following concrete steps:
Step 1, in conjunction with Fig. 1, fits tightly containing tens of programmable switch electrode bands to hundreds of programmable switch electrodes and the surface of conductor to be measured; In conjunction with Fig. 2, generate bernoulli stochastic sampling matrix by computing machine, from this matrix, take out successively row vector, the control end to programmable switch electrode band by computer export row vector signal again, control tens of on off operating modes to hundreds of programmable switch electrodes, 0 pair of inductive switch closure, 1 pair of inductive switch disconnects;
Step 2, accesses conductor to be measured two ends by the potential electrode of electrical impedance tester, records resistance value corresponding to different rows vector in sampling matrix, draws resistance sampling vector;
Step 3, detects conductor according to difference and selects corresponding sparse conversion, forms super complete dictionary;
Step 4, utilize recovery algorithms that conductor resistance one dimension to be measured is distributed and rebuild, utilize resistivity to calculate formula: ρ=RS/L, wherein: ρ is that resistivity, R are that length, the S that resistance, L are conductor to be measured is cross-sectional area, try to achieve conductor resistance rate one dimension and distribute, then get inverse and obtain conductor conductivity one dimension distribution results.
In conjunction with Fig. 1, the device of a kind of conductor conductivity one dimension distribution measurement method based on compressed sensing principle that the present invention proposes, it comprises by electrical impedance tester, programmable switch electrode band and being connected successively with computing machine; Wherein: programmable switch electrode band comprises tens of to hundreds of programmable switch electrodes, the control module that contains single-chip microcomputer and communication interfaces, and each programmable switch electrode of programmable switch electrode band in upwards series connection fitting tightly as Observable mask with conductive surface to be measured mutually of one-dimensional square; Programmable switch electrode band, control module and communication interface are connected successively; Described single-chip microcomputer is 51 single-chip microcomputers, msp430 single-chip microcomputer or atmega single-chip microcomputer; Described computing machine is the computing machine that contains matlab software, C Plus Plus software or java software.
Below further illustrate specific embodiments of the invention.
Embodiment 1, the conductivity one dimension that is applied to measurement conductive paper with the present invention is distributed as example:
Measure object: measure the conductivity one dimension distribution situation of conductive paper, can reflect conductive paper even thickness situation, have or not the production technology such as crack and impurity problem.
Measurement mechanism: the measurement mechanism of the present embodiment 1 comprises that electrical impedance tester, programmable switch electrode band are connected successively with computing machine, wherein, permanent Order/HHY8-TA-901 that electrical impedance tester adopts Beijing permanent Order instrument and meter company limited to produce; Programmable switch electrode band comprises 80 programmable switch electrodes, control module and communication interfaces.Concrete assembling be by 80 control switch electrodes able to programme in upwards series connection mutually of one-dimensional square, be spaced apart 1cm, open and closure by the control module gauge tap that contains 51 single-chip microcomputers, and by communication interface with contain matlabthe computing machine of software carries out data communication, and this communication interface adopts serial line interface.Measure sample: conductive paper, the eternally happy Electronics Factory in Guangdong produces, and composition is carbon black and paper pulp, is of a size of 100cm (length) × 1cm (wide) × 0.2cm (thick).
Measuring method: the concrete steps that the present invention is applied to the conductivity one dimension distribution situation of measuring conductive paper comprise as follows:
Step 1, fits tightly the each electrode in programmable switch electrode band and conductive paper sample surfaces; Generate bernoulli stochastic sampling matrix by computing machine, from this matrix, take out successively row vector, the control end to programmable switch electrode band by computer export row vector signal again, control the on off operating mode of programmable switch electrode, 0 pair of inductive switch closure, 1 pair of inductive switch disconnects, and forms Observable mask; Wherein:
The structural formula that generates bernoulli stochastic sampling matrix is: matrix Φ ∈ R m × N, each element of this matrix is obeyed independently symmetrical bernoulli and is distributed, that is:
Owing to only there is break-make two states in circuit, therefore above formula matrix can be reduced to:
Above formula Φ sin every a line be considered as one group of control vector, computing machine is successively according to the row vector of this matrix export low and high level to 51 Single-chip Controlling switches by serial line interface electrode, 0 pair of inductive switch closure, the part measured conductor that this switch is corresponding is by switch short circuit, and this part is not counted in the now resistance of gained; 1 pair of inductive switch disconnects, and this part counts the now resistance of gained;
Need to further illustrate: the highest resolution that wherein control number of switches N able to programme is the distribution of conductivity that can record; By M × N rank stochastic matrix gauge tap break-make, the number of times (M<<N) that M is random measurement, the accuracy of restoring signal increases with M, and the N of the present embodiment 1 is 80, M selects 25.
Step 2, utilizes the electrical impedance tester that accesses conductive paper sample two ends, records resistance value corresponding to different rows vector in sampling matrix, draws resistance sampling vector; Wherein: described resistance sampling vector, refers to by different rows vector correspondence in sampling matrix and obtain multiple resistance sampling values again by all be multiplied by be normalized, finally obtain the resistance sampling vector Y=[y being formed by M linear projection observed samples value 1, y 2..., y m] t∈ R m; Wherein: when the distribution of resistance of conductor is N dimension real signal X=[x 1, x 2..., x n] t∈ R n, resistance sampling now vector Y is that the result that signal X is carried out to a compression observation is Y=Φ X.
Step 3, selects the sparse conversion of wavelet transformation as distribution of resistance signal, forms super complete dictionary; Wherein: sparse conversion, refer to from resistance sampling vector Y and recover conductor resistance one dimension distribution signal X, requiring X is that sparse vector or X are sparse in a transform domain, that is: X available orthogonal base vector linear combination formula represent:
X = &Sigma; i = 1 N &theta; i &psi; i
Write as matrix form, can be obtained:
X=ΨΘ
Wherein: Ψ=[ψ 1, ψ 2..., ψ n] ∈ R n × Nfor orthogonal basis dictionary matrix (meets Ψ Ψ ttΨ=I), Θ Θ is the projection coefficient of X in a sparse transform domain, launches sparse coefficient vector Θ=[θ 1, θ 2..., θ n] t;
In conjunction with the compression observation to signal X, note CS information operator is A cS=Φ Ψ, can obtain:
Y=ΦX=ΦΨΘ=A CSΘ
Also be an ill-conditioning problem although recover Θ from Y, because coefficient Θ is sparse, unknown number number greatly reduces like this, makes signal reconstruction become possibility;
Conventional rarefaction method also comprises discrete cosine transform, discrete Fourier transform (DFT) etc., because the degree of rarefication of Θ coefficient affects final recovery effects largely.Therefore,, in order to obtain best recovery effects, can select suitable sparse conversion according to different conductors to be measured.
Step 4, is containing matlabon the computing machine of software, utilize recovery algorithms (specifically orthogonal matching pursuit method, be OMP) conductive paper sample resistance one dimension is distributed and rebuild, utilize resistivity to calculate formula and try to achieve conductor resistance rate one dimension and distribute, then get inverse and obtain sample conductivity one dimension distribution results; Wherein, at conductor resistance one dimension distribution signal X, under sparse or compressible prerequisite, orthogonal matching pursuit method (OMP) is for solving the underdetermined system of equations:
arg min X | | &Psi;X | |
s.t.A CSΘ=ΦX=Y
From resistance sampling vector Y, recover distribution of resistance signal X; This resistivity is calculated formula: ρ=RS/L, wherein: ρ is that resistivity, R are that length, the S that resistance, L are conductor to be measured is cross-sectional area.
Conventional recovery algorithms, except orthogonal matching pursuit method, also can adopt base back tracking method, matching pursuit algorithm or method of conjugate gradient etc.
The conductivity one dimension distribution results that finally calculates this sample, its average conductivity is 8.3349 × 10 -4s/m.
Embodiment 2, is applied to measurement electrical conductance of cable rate with the present invention and is distributed as example:
Measure object: the distribution of conductivity situation of measuring resistance silk, even thickness situation, oxidation situation, each point conductivity that can reflected resistance silk whether all can be up to standard etc. problem.
Measurement mechanism: the measurement mechanism of the present embodiment 2 comprises that electrical impedance tester, programmable switch electrode band are connected successively with computing machine, wherein, electrical impedance tester adopts five and half desk-top multimeter 8840A of Fluke company; Programmable switch electrode band comprises 240 programmable switch electrodes, control module and communication interfaces.Concrete assembling is, 240 control switch electrodes able to programme are upwards connected mutually at one-dimensional square, be spaced apart 1cm, open and closure by the control module gauge tap that contains msp430 single-chip microcomputer, can carry out data communication by communication interface and the computing machine containing C Plus Plus software, this communication interface is serial line interface.
Measure sample: nichrome wire (Cr20Ni80), wire diameter 0.15mm,, measures wherein 240 meters by long 300 meters.
Measuring method: the concrete steps that the present invention is applied to the distribution of conductivity situation of measuring resistance silk comprise as follows:
Step 1, testing resistance silk is drawn measurement point every 1 meter, and the each electrode in programmable switch electrode band is connected successively with sample measurement point; Generate bernoulli stochastic sampling matrix by computing machine, from this matrix, take out successively row vector, the control end to programmable switch electrode band by computer export row vector signal again, control the on off operating mode of programmable switch electrode, 0 pair of inductive switch closure, 1 pair of inductive switch disconnects, and forms Observable mask; Wherein:
The structural formula that generates bernoulli stochastic sampling matrix is: matrix Φ ∈ R m × N, each element of this matrix is obeyed independently symmetrical bernoulli and is distributed, that is:
Owing to only there is break-make two states in circuit, therefore above formula matrix can be reduced to:
Above formula Φ sin every a line be considered as one group of control vector, computing machine is successively according to the row vector of this matrix export the gauge tap of low and high level to msp430 single-chip microcomputer by serial line interface electrode, 0 pair of inductive switch closure, the part measured conductor that this switch is corresponding is by switch short circuit, and this part is not counted in the now resistance of gained; 1 pair of inductive switch disconnects, and this part counts the now resistance of gained;
Need to further illustrate: the highest resolution that wherein control number of switches N able to programme is the distribution of conductivity that can record; By M × N rank stochastic matrix gauge tap break-make, the number of times (M<<N) that M is random measurement, the accuracy of restoring signal increases with M, and the N of the present embodiment 2 is 240, M selects 70.
Step 2, utilizes the electrical impedance tester that accesses resistance wire sample two ends, records resistance wire resistance value corresponding to different rows vector sampling in sampling matrix, obtains resistance sampling vector; Wherein: described resistance sampling vector, refers to by different rows vector correspondence in sampling matrix and obtain multiple resistance sampling values again by all be multiplied by be normalized, finally obtain the resistance sampling vector Y=[y being formed by M linear projection observed samples value 1, y 2..., y m] t∈ R m; Wherein: when the distribution of resistance of conductor is N dimension real signal X=[x 1, x 2..., x n] t∈ R n, resistance sampling now vector Y is that the result that signal X is carried out to a compression observation is Y=Φ X.
Step 3, selects the sparse conversion of discrete cosine transform as the distribution of resistance signal of resistance wire, forms super complete dictionary; Wherein: sparse conversion, refer to from resistance sampling vector Y and recover conductor resistance one dimension distribution signal X, requiring X is that sparse vector or X are sparse in a transform domain, that is: X available orthogonal base vector linear combination formula represent
X = &Sigma; i = 1 N &theta; i &psi; i
Write as matrix form, can be obtained:
X=ΨΘ
Wherein: Ψ=[ψ 1, ψ 2... ψ n] ∈ R n × Nfor orthogonal basis dictionary matrix (meets Ψ Ψ ttΨ=I), Θ Θ is the projection coefficient of X in a sparse transform domain, launches sparse coefficient vector Θ=[θ 1, θ 2..., θ n] t;
In conjunction with the compression observation to signal X, note CS information operator is A cS=Φ Ψ, can obtain:
Y=ΦX=ΦΨΘ=A CSΘ
Also be an ill-conditioning problem although recover Θ from Y, because coefficient Θ is sparse, unknown number number greatly reduces like this, makes signal reconstruction become possibility;
Conventional rarefaction method, except discrete cosine transform, also comprises wavelet transformation, discrete Fourier transform (DFT) etc., because the degree of rarefication of Θ coefficient affects final recovery effects largely.Therefore,, in order to obtain best recovery effects, can select suitable sparse conversion according to different conductors to be measured.
Step 4, containing on the computing machine of C Plus Plus software software, utilize recovery algorithms (specifically to adopt base back tracking method, be BP) conductive paper sample resistance one dimension is distributed and rebuild, utilize resistivity to calculate formula and try to achieve conductor resistance rate one dimension and distribute, then get inverse and obtain sample conductivity one dimension distribution results; Wherein, at conductor resistance one dimension distribution signal X, under sparse or compressible prerequisite, base back tracking method (BP) is for solving the underdetermined system of equations:
arg min X | | &Psi;X | |
s.t.A CSΘ=ΦX=Y
From resistance wire resistance sampling vector Y, recover distribution of resistance signal X; This resistivity is calculated formula: ρ=RS/L, wherein: ρ is that resistivity, R are that length, the S that resistance, L are conductor to be measured is cross-sectional area.
Conventional recovery algorithms, except base back tracking method (BP), also can be adopted matching pursuit algorithm, orthogonal matching pursuit or method of conjugate gradient etc.
Due to bernoulli stochastic matrix and connecting and disconnecting of the circuit correlativity higher, so observing matrix usually adopts bernoulli matrix, but the inventive method is not only confined to bernoulli stochastic matrix, adopt the observing matrix of other any types, as long as can be mutually corresponding with connecting and disconnecting of the circuit relation, just can adopt the inventive method to show that one dimension conductor conductivity distributes.
The conductivity one dimension distribution results that finally calculates this sample, its average conductivity is 9.1729 × 10 5s/m.
In the specific embodiment of the present invention, all explanations not relating to belong to the known technology of this area, can be implemented with reference to known technology.
Above embodiment and embodiment are the measuring method of a kind of conductor conductivity one dimension distribution based on compressed sensing principle to the present invention's proposition and the concrete support of device technique thought; can not limit protection scope of the present invention with this; every technological thought proposing according to the present invention; the change of any equivalent variations of doing on the technical program basis or equivalence, all still belongs to the scope that technical solution of the present invention is protected.

Claims (10)

1. a method for the conductor conductivity one dimension distribution measuring based on compressed sensing principle, is characterized in that comprising following concrete steps:
Step 1, fits tightly containing tens of programmable switch electrode bands to hundreds of programmable switch electrodes and the surface of conductor to be measured; Generate bernoulli stochastic sampling matrix by computing machine, from this matrix, take out successively row vector, then by computer export row vector signal the control end to programmable switch electrode band, control tens of on off operating modes to hundreds of programmable switch electrodes, 0 pair of inductive switch closure, 1 pair of inductive switch disconnects;
Step 2, accesses conductor to be measured two ends by the potential electrode of electrical impedance tester, records resistance value corresponding to different rows vector in sampling matrix, draws resistance sampling vector;
Step 3, detects conductor according to difference and selects corresponding sparse conversion, forms super complete dictionary;
Step 4, utilize recovery algorithms that conductor resistance one dimension to be measured is distributed and rebuild, utilize resistivity to calculate formula: ρ=RS/L, wherein: ρ is that resistivity, R are that length, the S that resistance, L are conductor to be measured is cross-sectional area, try to achieve conductor resistance rate one dimension and distribute, then get inverse and obtain conductor conductivity one dimension distribution results.
2. the conductor conductivity one dimension distribution measurement method based on compressed sensing principle according to claim 1, it is characterized in that fitting tightly containing tens of programmable switch electrode bands to hundreds of programmable switch electrodes and the surface of conductor to be measured described in step 1, refer to that each programmable switch electrode is in upwards series connection mutually of one-dimensional square, and fit tightly with conductive surface to be measured, form Observable mask.
3. the conductor conductivity one dimension distribution measurement method based on compressed sensing principle according to claim 1, is characterized in that the structural formula that generates bernoulli stochastic sampling matrix described in step 1 is: matrix Φ ∈ R m × Neach element of this matrix is obeyed independently symmetrical bernoulli and is distributed, that is:
Owing to only there is break-make two states in circuit, therefore above formula matrix can be reduced to:
Above formula Φ sin every a line be considered as one group of control vector, computing machine is successively according to the row vector of this matrix output low and high level gauge tap, 0 pair of inductive switch closure, the part measured conductor that this switch is corresponding is by switch short circuit, and this part is not counted in the now resistance of gained; 1 pair of inductive switch disconnects, and this part counts the now resistance of gained.
4. the conductor conductivity one dimension distribution measurement method based on compressed sensing principle according to claim 1, is characterized in that resistance sampling vector described in step 2, refers to by different rows vector correspondence in sampling matrix and obtains multiple resistance sampling values again by all be multiplied by be normalized, finally obtain the resistance sampling vector Y=[y being formed by M linear projection observed samples value 1, y 2..., y m] t∈ R m; Wherein: when the distribution of resistance of conductor is N dimension real signal X=[x 1, x 2..., x n] t∈ R n, resistance sampling now vector Y is that the result that signal X is carried out to a compression observation is Y=Φ X.
5. the measuring method of the one dimension distribution of conductivity based on compressed sensing principle according to claim 1, it is characterized in that sparse conversion described in step 3, refer to from resistance sampling vector Y and recover conductor resistance one dimension distribution signal X, requiring X is that sparse vector or X are sparse in a transform domain.
6. the measuring method of the one dimension distribution of conductivity based on compressed sensing principle according to claim 1, it is characterized in that recovery algorithms described in step 4, refer to that from resistance sampling vector Y, recovering one dimension conductor resistance distribution signal X is one and solves system of linear equations, at conductor resistance one dimension distribution signal X under sparse or compressible prerequisite, solve the underdetermined system of equations:
arg min X | | &psi;X | | s.t.A CSΘ=αΦX=Y
7. according to the measuring method of the one dimension distribution of conductivity based on compressed sensing principle described in claim 1 or 6, it is characterized in that described in step 4 that recovery algorithms is base back tracking method, matching pursuit algorithm, orthogonal matching pursuit method or method of conjugate gradient.
8. a device for the conductor conductivity one dimension distribution measurement method based on compressed sensing principle claimed in claim 1, it comprises electrical impedance tester, characterized by further comprising electrical impedance tester and is connected successively with programmable switch electrode band and computing machine; Wherein: programmable switch electrode band comprises tens of to hundreds of programmable switch electrodes, the control module that contains single-chip microcomputer and communication interfaces, and each programmable switch electrode of programmable switch electrode band in upwards series connection fitting tightly as Observable mask with conductive surface to be measured mutually of one-dimensional square; Programmable switch electrode band, control module and communication interface are connected successively.
9. the device of the one dimension distribution of conductivity measuring method based on compressed sensing principle according to claim 8, is characterized in that computing machine is for containing matlabthe computing machine of software, C Plus Plus software or java software.
10. the device of the one dimension distribution of conductivity measuring method based on compressed sensing principle according to claim 8 or claim 9, is characterized in that described single-chip microcomputer is 51 single-chip microcomputers, msp430 single-chip microcomputer or atmega single-chip microcomputer.
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Publication number Priority date Publication date Assignee Title
CN104407222A (en) * 2014-12-02 2015-03-11 河南江河机械有限责任公司 Method for measuring electrical resistivity of irregular small-section copper bar material
CN104678181A (en) * 2015-03-23 2015-06-03 攀钢集团研究院有限公司 Method for measuring resistivity of steel rail
CN110133056A (en) * 2019-05-30 2019-08-16 浙江大学 A kind of conductivity measurement system of highly conductive liquid
CN113252984A (en) * 2021-07-06 2021-08-13 国网湖北省电力有限公司检修公司 Measurement data processing method and system based on Bluetooth insulator measuring instrument

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2003073089A1 (en) * 2002-02-25 2003-09-04 Zyomyx, Inc. Method and device for performing impedance spectroscopy
WO2011039416A1 (en) * 2009-09-29 2011-04-07 Numcore Oy Three dimensional imaging of a mass flow
CN102027366A (en) * 2008-03-28 2011-04-20 棉花集水社区合作研究中心有限公司 System, apparatus and method for measuring soil moisture content
CN203148889U (en) * 2013-03-19 2013-08-21 中国石油大学(华东) Nondestructive testing device

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2003073089A1 (en) * 2002-02-25 2003-09-04 Zyomyx, Inc. Method and device for performing impedance spectroscopy
CN102027366A (en) * 2008-03-28 2011-04-20 棉花集水社区合作研究中心有限公司 System, apparatus and method for measuring soil moisture content
WO2011039416A1 (en) * 2009-09-29 2011-04-07 Numcore Oy Three dimensional imaging of a mass flow
CN203148889U (en) * 2013-03-19 2013-08-21 中国石油大学(华东) Nondestructive testing device

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
邢强等: "基于压缩感知的过套管电阻率数据重构方法研究", 《石油仪器》 *

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104407222A (en) * 2014-12-02 2015-03-11 河南江河机械有限责任公司 Method for measuring electrical resistivity of irregular small-section copper bar material
CN104678181A (en) * 2015-03-23 2015-06-03 攀钢集团研究院有限公司 Method for measuring resistivity of steel rail
CN104678181B (en) * 2015-03-23 2017-09-29 攀钢集团研究院有限公司 Rail resistance rate measuring method
CN110133056A (en) * 2019-05-30 2019-08-16 浙江大学 A kind of conductivity measurement system of highly conductive liquid
CN113252984A (en) * 2021-07-06 2021-08-13 国网湖北省电力有限公司检修公司 Measurement data processing method and system based on Bluetooth insulator measuring instrument
CN113252984B (en) * 2021-07-06 2021-11-09 国网湖北省电力有限公司检修公司 Measurement data processing method and system based on Bluetooth insulator measuring instrument

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