CN104019764A - Calibration method for scanning type surface shape measurement optical system of 2*2 array light source - Google Patents

Calibration method for scanning type surface shape measurement optical system of 2*2 array light source Download PDF

Info

Publication number
CN104019764A
CN104019764A CN201410279851.4A CN201410279851A CN104019764A CN 104019764 A CN104019764 A CN 104019764A CN 201410279851 A CN201410279851 A CN 201410279851A CN 104019764 A CN104019764 A CN 104019764A
Authority
CN
China
Prior art keywords
optical system
hot spot
surface shape
type surface
coordinate
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
CN201410279851.4A
Other languages
Chinese (zh)
Other versions
CN104019764B (en
Inventor
刘长春
熊召
陈海平
袁晓东
周海
曹庭分
叶海仙
郑万国
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Laser Fusion Research Center China Academy of Engineering Physics
Original Assignee
Laser Fusion Research Center China Academy of Engineering Physics
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Laser Fusion Research Center China Academy of Engineering Physics filed Critical Laser Fusion Research Center China Academy of Engineering Physics
Priority to CN201410279851.4A priority Critical patent/CN104019764B/en
Publication of CN104019764A publication Critical patent/CN104019764A/en
Application granted granted Critical
Publication of CN104019764B publication Critical patent/CN104019764B/en
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Landscapes

  • Length Measuring Devices By Optical Means (AREA)

Abstract

The invention discloses a calibration device and method for a scanning type surface shape measurement optical system of a 2*2 array light source. The calibration method is characterized by comprising the following steps that the scanning type surface shape measurement optical system and a calibration platform are assembled; a laser (1) is started, and four beams of parallel light are projected to the calibration platform; the calibration platform is adjusted; the single drive step number of the laser (1) is set according to the total drive step number; CCD data-in-line collection is finished; CCD imaging all-region line and column data collection is finished; calibration of an angle within a dynamic test range of the optical system is finished. The calibration method has the remarkable advantages that the measurement efficiency of an original system can be improved while a system structure is simplified, and the capacity of surface shape on-line detection is further improved.

Description

2 * 2 array light source scan-type surface shape measurement optical system scaling methods
Technical field
The invention belongs to machine vision technique detection field, be specifically related to a kind of 2 * 2 array light source scan-type surface shape measurement optical system scaling methods.
Background technology
Improving at present 2 * 2 scan-type surface shape measurement optical system measuring method methods has: Light path correction method and system calibrating method.Light path correction method, by add light beam fine adjustment stage in light path, is revised incident angle of light skew in scanning process, and reference light Neng Yanyuan road is returned, and the method has formed patent of invention.
But these class methods all increase micro-adjusting mechanism, in use, the error of micro-adjusting mechanism itself and use, also easily cause measuring error, reduced optical system and counted surface shape measurement and fitting precision.
Summary of the invention
This object of the present invention relates generally to a kind of array light source scan-type surface shape measurement optical system scaling method, its design utilizes 2 * 2 array image-forming points mutually with reference to demarcating and obtain the nonlinearity erron that optical system tested object partial face shape graded is introduced with self-reference principle, to the correction of full field range measurement data, thereby improve optical system, count surface shape measurement and fitting precision.
For achieving the above object, the present invention explains a kind of 2 * 2 array light source scan-type surface shape measurement optical system scaling methods, it is characterized in that comprising the following steps:
Step 1, after assembling scan-type surface shape measurement optical system, on the emitting light path of scan-type surface shape measurement optical system, arrange calibrating platform, the directional light Yan Yuan road reflected in parallel that this calibrating platform can penetrate scan-type surface shape measurement optical system is returned described scan-type surface shape measurement optical system;
Step 2, start the laser instrument (1) in described scan-type surface shape measurement optical system, preheating 30 minutes, the light that laser instrument (1) sends collimates through colimated light system (2) successively, then by spectroscope (3), entering beam-expanding system (4) expands, wedge mirror group (5) is divided into four bundle directional lights by the light beam after expanding and penetrates from scan-type surface shape measurement optical system, and invests described calibrating platform;
Step 3, adjust the precise 2-D beat platform (8) on described calibrating platform, the fixture (7) being fixed on precise 2-D beat platform (8) moves thereupon, make the catoptron (6) of fixture (7) clamping vertical with scan-type surface shape measurement optical system, catoptron (6) reflection four bundle directional lights are successively by after wedge mirror group (5) and beam-expanding system (4), after spectroscope (3) is refracted to pentaprism (9), again by imaging len (10) in the upper imaging of CCD (11), in the image of observing at CCD (11), four hot spots are positioned at the center of image;
Step 4, according to the field angle scope of scan-type surface shape measurement optical system, set the driving step number of calibrating platform; According to driving the needed fine degree of step number, set the single actuations step number of laser instrument (1) in scan-type surface shape measurement optical system;
Drive step number to refer to that CCD gathers the step number of the required driving of a row or column data, single actuations step number can be set as 1~3 pixel, the pixel of single actuations step number is fewer, and fine degree is higher, and fine degree correspondence the single actuations step number of a pixel.
Step 5, determine that any one in four hot spots is for reference to hot spot, drive the piezoelectric ceramics mechanism on precise 2-D beat platform (8), make to change with reference to facula position, record, with reference to facula position and four facula position relative variations, completes the collection of CCD data line;
Step 6, repeating step three, to step 5, complete the region-wide row, column data acquisition of CCD imaging, according to imaging facula position and relativeness, can realize the angle calibration in scan-type surface shape measurement optical system test dynamic range.
Described angle calibration is the result according to image imaging, and take the center of that hot spot of the left side on every width image is reference, calculates the center of other three hot spots and relation with reference to hot spot center, can use formula (1a) and (1b) expression:
Δx ni=x ni-x n1-Δx i0-----------------------------(1a)
Δy ni=y ni-y n1-Δy i0-----------------------------(1b)
I=2,3,4 in formula, in presentation video except other three hot spots with reference to hot spot, Δ x i0represent under perfect condition i hot spot x coordinate and with reference to hot spot x coordinate difference, Δ y i0represent under perfect condition i hot spot y coordinate with reference to hot spot y coordinate difference, n=1,2,3..., expression n width image, x n1represent in n width image the x coordinate with reference to hot spot, y n1represent in n width image the y coordinate with reference to hot spot, x nirepresent in n width image except the x coordinate with reference to other hot spots hot spot, y nirepresent in n width image except the y coordinate with reference to other hot spots hot spot Δ x nirepresent in n width image i hot spot x coordinate and poor modified value with reference to hot spot x coordinate, Δ y nirepresent in n width image i hot spot y coordinate and poor modified value with reference to hot spot y coordinate;
After handling, with the x coordinate of every width image reference hot spot, be transverse axis, y coordinate is the longitudinal axis, and the modified value that processing is obtained is made correction card, for table look-up when measuring correction or interpolation calculation correction.
Remarkable result of the present invention is: the reason that system calibrating method produces by error in analysis scan formula face shape test process, show that system accuracy becomes the conclusion of nonlinear function with tested object partial face shape gradient, for 2 * 2 array scanning formula scan modes, mutual reference and self-reference scaling method have been proposed, and design its special calibrating device, realized optical system test specification overall situation Accurate Calibration.Therefore can when measuring, to test data, revise, improve the precision of systematic survey.
The method, in simplied system structure, can improve the measurement efficiency of original system, further improves the online ability detecting of surperficial face shape.
Accompanying drawing explanation
Fig. 1 is demarcation schematic diagram of the present invention;
Fig. 2 is imaging facula distribution schematic diagram;
Fig. 3 is method step figure of the present invention.
Embodiment
Below in conjunction with the drawings and specific embodiments, the present invention is described in further detail.
As shown in Figure 3: a kind of 2 * 2 array light source scan-type surface shape measurement optical system scaling methods, is characterized in that comprising the following steps:
Step 1, after assembling scan-type surface shape measurement optical system, on the emitting light path of scan-type surface shape measurement optical system, arrange calibrating platform, the directional light Yan Yuan road reflected in parallel that this calibrating platform can penetrate scan-type surface shape measurement optical system is returned described scan-type surface shape measurement optical system;
Step 2, start the laser instrument 1 in described scan-type surface shape measurement optical system, preheating 30 minutes, the light that laser instrument 1 sends is successively through colimated light system 2 collimations, then by spectroscope 3, entering beam-expanding system 4 expands, wedge mirror group 5 is divided into four bundle directional lights by the light beam after expanding and penetrates from scan-type surface shape measurement optical system, and invests described calibrating platform;
Step 3, adjust the precise 2-D beat platform 8 on described calibrating platform, the fixture 7 being fixed on precise 2-D beat platform 8 moves thereupon, make the catoptron 6 of fixture 7 clampings vertical with scan-type surface shape measurement optical system, catoptron 6 reflection four bundle directional lights are successively by after wedge mirror group 5 and beam-expanding system 4, after spectroscope 3 is refracted to pentaprism 9, again by imaging len 10 imaging on CCD11, in the image of observing at CCD11, four hot spots are positioned at the center of image;
Step 4, according to the field angle scope of scan-type surface shape measurement optical system, set the driving step number of calibrating platform; According to driving the needed fine degree of step number, set the single actuations step number of laser instrument 1 in scan-type surface shape measurement optical system;
Step 5, determine that any one in four hot spots is for reference to hot spot, drive the piezoelectric ceramics mechanism on precise 2-D beat platform 8, make to change with reference to facula position, record, with reference to facula position and four facula position relative variations, completes the collection of CCD data line;
Step 6, repeating step three, to step 5, complete the region-wide row, column data acquisition of CCD imaging, realize the angle calibration in scan-type surface shape measurement optical system test dynamic range.
Described angle calibration is the result according to image imaging, and take the center of that hot spot of the left side on every width image is reference, calculates the center of other three hot spots and relation with reference to hot spot center, can represent with formula 1a and 1b:
Δx ni=x ni-x n1-Δx i0-----------------------------1a
Δy ni=y ni-y n1-Δy i0-----------------------------1b
I=2,3,4 in formula, in presentation video except other three hot spots with reference to hot spot, Δ x i0represent under perfect condition i hot spot x coordinate and with reference to hot spot x coordinate difference, Δ y i0represent under perfect condition i hot spot y coordinate with reference to hot spot y coordinate difference, n=1,2,3..., expression n width image, x n1represent in n width image the x coordinate with reference to hot spot, y n1represent in n width image the y coordinate with reference to hot spot, x nirepresent in n width image except the x coordinate with reference to other hot spots hot spot, y nirepresent in n width image except the y coordinate with reference to other hot spots hot spot Δ x nirepresent in n width image i hot spot x coordinate and poor modified value with reference to hot spot x coordinate, Δ y nirepresent in n width image i hot spot y coordinate and poor modified value with reference to hot spot y coordinate;
After handling, with the x coordinate of every width image reference hot spot, be transverse axis, y coordinate is the longitudinal axis, and the modified value that processing is obtained is made correction card, for table look-up when measuring correction or interpolation calculation correction.
Correction card is as follows:
Error correction:
In the process of tested planar optical elements being measured in scan-type surface shape measurement optical system, according to the position enquiring correction card of first hot spot, if the center of first hot spot does not have at correction card, carry out interpolation calculation.Obtain the optical system error value in this width image and the center of other three hot spots is revised, with the center calculating measured point direction of normal of revised 4 hot spots and obtain the face shape of tested planar optical elements by the reconstruct of face shape.

Claims (2)

1. 2 * 2 array light source scan-type surface shape measurement optical system scaling methods, is characterized in that comprising the following steps:
Step 1, after assembling scan-type surface shape measurement optical system, on the emitting light path of scan-type surface shape measurement optical system, arrange calibrating platform, the directional light Yan Yuan road reflected in parallel that this calibrating platform can penetrate scan-type surface shape measurement optical system is returned described scan-type surface shape measurement optical system;
Step 2, start the laser instrument (1) in described scan-type surface shape measurement optical system, preheating 30 minutes, the light that laser instrument (1) sends collimates through colimated light system (2) successively, then by spectroscope (3), entering beam-expanding system (4) expands, wedge mirror group (5) is divided into four bundle directional lights by the light beam after expanding and penetrates from scan-type surface shape measurement optical system, and invests described calibrating platform;
Step 3, adjust the precise 2-D beat platform (8) on described calibrating platform, the fixture (7) being fixed on precise 2-D beat platform (8) moves thereupon, make the catoptron (6) of fixture (7) clamping vertical with scan-type surface shape measurement optical system, catoptron (6) reflection four bundle directional lights are successively by after wedge mirror group (5) and beam-expanding system (4), after spectroscope (3) is refracted to pentaprism (9), again by imaging len (10) in the upper imaging of CCD (11), in the image of observing at CCD (11), four hot spots are positioned at the center of image;
Step 4, according to the field angle scope of scan-type surface shape measurement optical system, set the driving step number of calibrating platform; According to driving the needed fine degree of step number, set the single actuations step number of laser instrument (1) in scan-type surface shape measurement optical system;
Step 5, determine that any one in four hot spots is for reference to hot spot, drive the piezoelectric ceramics mechanism on precise 2-D beat platform (8), make to change with reference to facula position, record, with reference to facula position and four facula position relative variations, completes the collection of CCD data line;
Step 6, repeating step three, to step 5, complete the region-wide row, column data acquisition of CCD imaging, realize the angle calibration in scan-type surface shape measurement optical system test dynamic range.
2. 2 * 2 array light source scan-type surface shape measurement optical system scaling methods according to claim 1, it is characterized in that: described angle calibration is the result according to image imaging, take the center of that hot spot of the left side on every width image is reference, the center of calculating other three hot spots and relation with reference to hot spot center, can use formula (1a) and (1b) expression:
Δx ni=x ni-x n1-Δx i0-----------------------------(1a)
Δy ni=y ni-y n1-Δy i0-----------------------------(1b)
I=2,3,4 in formula, in presentation video except other three hot spots with reference to hot spot, Δ x i0represent under perfect condition i hot spot x coordinate and with reference to hot spot x coordinate difference, Δ y i0represent under perfect condition i hot spot y coordinate with reference to hot spot y coordinate difference, n=1,2,3..., expression n width image, x n1represent in n width image the x coordinate with reference to hot spot, y n1represent in n width image the y coordinate with reference to hot spot, x nirepresent in n width image except the x coordinate with reference to other hot spots hot spot, y nirepresent in n width image except the y coordinate with reference to other hot spots hot spot Δ x nirepresent in n width image i hot spot x coordinate and poor modified value with reference to hot spot x coordinate, Δ y nirepresent in n width image i hot spot y coordinate and poor modified value with reference to hot spot y coordinate;
After handling, with the x coordinate of every width image reference hot spot, be transverse axis, y coordinate is the longitudinal axis, and the modified value that processing is obtained is made correction card, for table look-up when measuring correction or interpolation calculation correction.
CN201410279851.4A 2014-06-20 2014-06-20 2 × 2 array light source scan-type surface shape measurement optical system scaling methods Expired - Fee Related CN104019764B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201410279851.4A CN104019764B (en) 2014-06-20 2014-06-20 2 × 2 array light source scan-type surface shape measurement optical system scaling methods

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201410279851.4A CN104019764B (en) 2014-06-20 2014-06-20 2 × 2 array light source scan-type surface shape measurement optical system scaling methods

Publications (2)

Publication Number Publication Date
CN104019764A true CN104019764A (en) 2014-09-03
CN104019764B CN104019764B (en) 2016-08-24

Family

ID=51436648

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201410279851.4A Expired - Fee Related CN104019764B (en) 2014-06-20 2014-06-20 2 × 2 array light source scan-type surface shape measurement optical system scaling methods

Country Status (1)

Country Link
CN (1) CN104019764B (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN109696121A (en) * 2019-02-25 2019-04-30 天津工业大学 A kind of quick calibration method based on laser interferometer light path

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP1371939A1 (en) * 2002-05-15 2003-12-17 Icos Vision Systems N.V. A device for measuring in three dimensions a topographical shape of an object
JP2008256464A (en) * 2007-04-03 2008-10-23 Nikon Corp Measurement apparatus
CN102322820A (en) * 2011-09-14 2012-01-18 西南科技大学 Automatic separation method for front and rear surface reflected light spots in surface shape detection system
CN103245303A (en) * 2013-05-17 2013-08-14 中国工程物理研究院激光聚变研究中心 Multi-pose large-caliber plane optical element surface shape detecting device and method

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP1371939A1 (en) * 2002-05-15 2003-12-17 Icos Vision Systems N.V. A device for measuring in three dimensions a topographical shape of an object
JP2008256464A (en) * 2007-04-03 2008-10-23 Nikon Corp Measurement apparatus
CN102322820A (en) * 2011-09-14 2012-01-18 西南科技大学 Automatic separation method for front and rear surface reflected light spots in surface shape detection system
CN103245303A (en) * 2013-05-17 2013-08-14 中国工程物理研究院激光聚变研究中心 Multi-pose large-caliber plane optical element surface shape detecting device and method

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
程晓锋等: "基于高分辨力CCD的大口径光学元件疵病检测", 《强激光与粒子束》 *

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN109696121A (en) * 2019-02-25 2019-04-30 天津工业大学 A kind of quick calibration method based on laser interferometer light path
CN109696121B (en) * 2019-02-25 2020-07-17 天津工业大学 Rapid calibration method based on laser interferometer detection light path

Also Published As

Publication number Publication date
CN104019764B (en) 2016-08-24

Similar Documents

Publication Publication Date Title
US11672631B2 (en) Intraoral scanner calibration
CN102620690B (en) Multi-probe flatness detector and flatness detection method
US7619191B1 (en) Increase spatial sampling for wave front mid-spatial frequency error recovery
CN102564343B (en) Detection device for surface-shape errors of solar trench type curved surface reflector
JP2014163895A (en) Shape measurement instrument and shape measurement method using shack-hartmann sensor
JP2021530714A (en) Chromatic confocal area sensor
CN108344383A (en) A kind of non-contact coordinate measuring machine
CN110736721B (en) Glass plate refractive index uniformity detection device and detection method based on diffraction grating
CN106052585A (en) Surface shape detection device and detection method
KR20160102244A (en) Non-imaging coherent line scanner systems and methods for optical inspection
CN102914373A (en) Hartmann wave-front sensor based on micro-cylindrical lens array
JP2004507730A (en) Method and apparatus for measuring the transmission of the geometric structure of an optical element
CN111238408A (en) Device and method for rapidly measuring parallelism of parallel flat plate
JP4340625B2 (en) Optical inspection method and apparatus
CN104019764A (en) Calibration method for scanning type surface shape measurement optical system of 2*2 array light source
CN100449260C (en) Method for precision measuring space offset of telephotolens and eyepiece using interferometer
CN105758333A (en) Long-trace optical surface profile detector
JP2016211933A (en) Surface shape measurement device, surface shape measurement method, processing device, and optical element processed by the same
CN110243760B (en) Line domain frequency domain optical coherence tomography system and longitudinal coordinate calibration method thereof
CN105783708B (en) Optical correction device and optical correction method
CN205562427U (en) Optical element surface defect detecting device of reflection -type synthetic aperture digital holographic art
CN103673884B (en) Optical system of double triangle optical probe
JP4488710B2 (en) Lens characteristic inspection method and apparatus
JP2001066125A (en) Drift component extraction method of interference measurement
CN105067229A (en) Grating ruler three-probe focal length measurement device and measurement method based on combined lens method

Legal Events

Date Code Title Description
C06 Publication
PB01 Publication
C10 Entry into substantive examination
SE01 Entry into force of request for substantive examination
C14 Grant of patent or utility model
GR01 Patent grant
CF01 Termination of patent right due to non-payment of annual fee
CF01 Termination of patent right due to non-payment of annual fee

Granted publication date: 20160824

Termination date: 20170620