CN103983871B - A kind of VXI module tester based on FPGA - Google Patents
A kind of VXI module tester based on FPGA Download PDFInfo
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- CN103983871B CN103983871B CN201410206188.5A CN201410206188A CN103983871B CN 103983871 B CN103983871 B CN 103983871B CN 201410206188 A CN201410206188 A CN 201410206188A CN 103983871 B CN103983871 B CN 103983871B
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Abstract
The present invention relates to a kind of based on FPGA VXI module tester that a kind of field programmable gate array meets the various modules of vxi bus agreement.The present invention includes that fpga core processing module, analogue signal provide module, collection of simulant signal module, digital signal acquiring module, digital signal to provide module, test assignment setting module, test process and result display module, switch light-coupled isolation module, linear optical coupling isolation module.The present invention proposes the instrument of a kind of special test VXI module, and VXI system is just being widely used in the field such as Aero-Space and commercial production；The present invention advantageously accounts for the test problem of each module in VXI system, efficiently reduces fault and hidden danger present in VXI system, and the large-scale application of VXI system is had complete effect.
Description
Technical field
The present invention relates to a kind of field programmable gate array and meet the one of various modules of vxi bus agreement based on FPGA
VXI module tester.
Background technology
FPGA is the english abbreviation of field programmable gate array, and inside includes configurable logic blocks CLB (Configurable
Logic Block), input/output module IOB (Input Output Block) and three parts of interconnector (Interconnect).
The logical block of FPGA and connection can change according to the demand of designer, and system designer can be as desired by editable
Connect and the logical block within FPGA is coupled together, so by programming, FPGA can realize multiple different function.With
Time use hardware program language can produce various required sequential easily, system test has the biggest advantage.Vxi bus
It is the extension at instrument field of the VME bus, is the modularity robotic instrument system of computer manipulation.Through development for many years,
It relies on effective standardization, uses modular mode, it is achieved that seriation, generalization and the exchange of vxi bus instrument
Property and interoperability.Its opening system structure complies fully with the requirement of information products.Today, vxi bus instrument and system are
Generally accept for common people, and become the main flow of instrument system development.
Owing to VXI system is to be made up of one or more VXI modules, the performance quality of module directly affects whole VXI system
The performance of system, therefore the test of performance to module own is just particularly important.And present stage is for the detection of VXI module, all
Rest on, with the simple device such as engineering experience and circuit tester, some position of module is carried out, in the level of local detection, not having one
Means of testing molding, systematized and instrument, and this mode is sometimes for dismounting VXI module, and the mould dismounted
Part is no longer available for reliability requirement working environment, and not only test result is unintelligible, also reduces the work Feasible degree of module simultaneously,
Therefore the invention of this test instrunment has the urgent market demand.
Summary of the invention
It is an object of the invention to provide a kind of test instrunment that can test VXI performance of module quality.
The object of the present invention is achieved like this:
The present invention includes that fpga core processing module, analogue signal provide module, collection of simulant signal module, digital signal to adopt
Collection module, digital signal provide module, test assignment setting module, test process and result display module, switch light-coupled isolation
Module, linear optical coupling isolation module, be connected with VXI module by J14A interface, under electrical isolation, passes through analogue signal
Module, digital signal is provided to provide module to input valid data to VXI module, by collection of simulant signal module, digital signal
Acquisition module gathers the output of VXI module, then it is the most intact, by the speed of data stream to process diagnosis VXI module by data
Whether the performance measuring VXI module can also meet the requirement of VXI system, completes the test of VXI module；Fpga core processes mould
Block, with FPGA as kernel control chip, EPCS family chip storage code, SDRAM is used for storing data；FPGA
After determining test assignment, control analog and digital signal collecting part gather the output signal of VXI module, control digital signal and carry
Thering is provided module to provide test signal to VXI module for module and analogue signal, test process utilizes SDRAM to access as required
Data, by input/output signal is compared acquisition test result with program preset value, show corresponding information at colorful display screen
On；Collection of simulant signal/offer module uses A/D and D/A converter and corresponding application to support that circuit is constituted, and uses linear light
Electric coupler realizes electrical isolation between module and does not change the feature of simulation output waveform；A/d converter receives from FPGA
Order, it is achieved module simulation output waveform collection；FPGA controls D/A converter to tested module input test waveform；
Digital signal acquiring module and digital signal provide module to use common I/O mouth to constitute, by switching mode photoelectrical coupler realize with
Electrical isolation between module, utilizes input port to gather the data of module output, utilizes delivery outlet to provide test number to VXI module
According to or interrupt trigger signal；Test assignment setting module is made up of the 4*4 matrix keyboard of standard；Switch light-coupled isolation module, line
Property light-coupled isolation module by switching photoelectric coupled device and precision photoelectric coupler part is constituted, be used for realizing instrument and VXI module it
Between the linear photoconductor coupling of analogue signal and the switch photoelectric coupling of digital signal, reach to protect VXI module and the work of test instrunment
With.
Test process and result display module are made up of 2.4 cun of TFT colorful display screens, are used for showing current test assignment, test
Process and test result, and possible fault message.
The beneficial effects of the present invention is:
1. the present invention proposes the instrument of a kind of special test VXI module, and VXI system is just being widely used in Aero-Space and industry
The fields such as production；The present invention advantageously accounts for the test problem of each module in VXI system, efficiently reduces in VXI system and exists
Fault and hidden danger, the large-scale application of VXI system is had complete effect.
2. the present invention have employed powerful, apply FPGA flexibly as core processor, to have the spy of field-programmable
Levy, can realize, by field programming, the test assignment that many species diversity is huge, advantageously reduce cost, expand instrumental function.
3. the present invention uses modular expansion mode, for special test assignment, can build satisfied by the amendment of little scope
The test environment required, smoothly completes test assignment.
4. the present invention has perfect quarantine measures, can be prevented effectively from interfering between test instrunment and VXI module, have
Higher measuring accuracy and credibility.
5. system has the interpersonal interactive interface improving close friend, by test process controllable visualization, provides more rich for tester
Test information, be conducive to carrying out accident analysis.
Accompanying drawing explanation
Fig. 1 is the system architecture diagram of the present invention；
Fig. 2 is the system layout schematic diagram of the present invention；
Fig. 3 is the software flow pattern of the present invention.
Detailed description of the invention
Illustrate below in conjunction with the accompanying drawings and the present invention be described in more detail:
The present invention is with stimulus response testing technology as principle, by VXI module is applied certain specification and the dynamic exciting of feature,
Test its output response, by excitation and the analysis of response, drawing the dynamic property residing for equipment；VXI mould is gathered in static state
The Static output of part, the data collected by process draw module state in which and static properties.
For the test of completion system VXI module, the present invention by fpga core processing module, collection of simulant signal/offer module,
Digital signal acquiring/offer module, test assignment setting module and test process and result display module are constituted, by typically
J14A adapter is connected with VXI module, uses switch/linear optical coupling to realize electrical isolation between instrument and module.
Collection of simulant signal/offer module uses A/D and D/A converter and corresponding application to support that circuit is constituted, and uses linear light
Electric coupler while electrical isolation, does not change the feature of simulation output waveform between realization and module；A/d converter receives
Order from FPGA, it is achieved the collection of module simulation output waveform；FPGA controls D/A converter as required to tested
Test waveform needed for module input.
Digital signal acquiring/offer module uses common I/O mouth to constitute, and is realized between module by switching mode photoelectrical coupler
Electrical isolation, utilize input port gather module output data, utilize delivery outlet to VXI module provide test needed for data or
Interrupt trigger signal.
Test assignment setting module is made up of the 4*4 matrix keyboard of standard, by different Macintosh input test demands.
Test process and result display module are made up of 2.4 cun of TFT colorful display screens, are used for showing current test assignment, test
Process and test result, and possible fault message.
Fpga core processing module FPGA is as kernel control chip, and EPCS family chip storage code, SDRAM uses
In storage data；FPGA controls analog and digital signal collecting part after determining test assignment and gathers the output letter of VXI module
Number, analog and digital signal offer part is provided the most as required and tests signal, test process accordingly to the offer of VXI module
SDRAM is utilized to access data as required, by input/output signal is compared acquisition test result with program preset value, will
Corresponding information shows on colorful display screen.
In the present invention, the problem of actual solution is: in VXI system, each VXI module is due to its function of life-time service and reliability
Dare not ensure, now be accomplished by VXI module is tested, and currently there are no the tester being specifically designed for VXI module design
Device, can only lean on basic micro-judgment；The present invention proposes a kind of test instrunment being specifically designed for VXI module, at real system
Middle high efficient and reliable VXI module is tested, it is ensured that the reliability service of VXI system.
It is the system architecture diagram of the present invention in conjunction with Fig. 1, Fig. 1；Native system is adopted by fpga core processing module, analogue signal
Collection/module, digital signal acquiring/offer module, test assignment setting module, test process and result display module and switch are provided
/ linear optical coupling isolation modules etc. are constituted.Data input pin, analogue signal and digital signal respectively by linear and switch optocoupler every
From entering collection of simulant signal module and numeral signal acquisition module, collection of simulant signal module passes through AD conversion by analogue signal
Change into digital signal and pass to FPGA, and digital signal is directly gathered by the I/O mouth of FPGA；At data output end, number
Word signal is directly exported by FPGA, exports VXI module interface end by switch light-coupled isolation, and analogue signal is controlled by FPGA
DA chip processed, is output as analogue signal by DA after being changed, this analogue signal is input to VXI mould by linear optical coupling isolation
In the middle of part；FPGA control module is as the system core, and each module coordination of unified call system works, by task setting module
Obtain external tasks information, call corresponding module according to the difference of test assignment and complete data output or acquisition tasks, by number
Draw test result according to process and show on color screen.
It is the system layout schematic diagram of the present invention in conjunction with Fig. 2, Fig. 2；The present invention is the test of each VXI module in VXI system,
VXI module is general all with similar interfaces such as J14A, and to realize and outside data interaction, native system utilizes VXI just
This class interface of module, on the premise of electrical isolation, controls DA and common I/O mouth by FPGA and inputs to VXI module
Effective analog/digital signal, and the analog and digital signal of VXI module output is gathered by AD and common I/O mouth, then lead to
Cross data process this VXI module of diagnosis the most intact, by the speed of data stream, the performance of VXI module can be measured the most also
The existing requirement of VXI system can be met, complete the multinomial test assignment of VXI module by similar method.
It is the software flow pattern of the present invention in conjunction with Fig. 3, Fig. 3；After powering on, first system completes initial work；Judge busy letter
Whether number is " 0 ", " 0 " represents that system is idle, can carry out task setting, and it is the busiest that " 1 " represents system, it is impossible to carries out task
Set；When busy signal is " 0 ", wait extraneous incoming task set information；Set busy signal calling after confirming task
Corresponding program, according to task needs, arranges corresponding input/output module, then by the corresponding number of input/output module output
According to VXI module, and utilize the output information of data collecting module collected VXI module；Finally by output data and adopt
Collect to data carry out data process, the result this time tested the busy signal that resets, come back to busy signal judge, in order to
Set new task.
Claims (2)
1. a VXI module tester based on FPGA, including fpga core processing module, analogue signal provide module,
Collection of simulant signal module, digital signal acquiring module, digital signal provide module, test assignment setting module, test process
And result display module, switch light-coupled isolation module, linear optical coupling isolation module, it is characterised in that: above-mentioned all modules are passed through
J14A interface is connected with VXI module, under electrical isolation, by analogue signal provide module, digital signal provide module to
VXI module input test signal, gathers the output of VXI module by collection of simulant signal module, digital signal acquiring module,
Process diagnosis VXI module by data more intact, whether can also be expired by the performance of the velocity determination VXI module of data stream
The requirement of foot VXI system, completes the test of VXI module；Fpga core processing module, with FPGA as kernel control chip,
EPCS family chip storage code, SDRAM is used for storing data；FPGA controls analogue signal after determining test assignment
Acquisition module and numeral signal acquisition module gather the output signal of VXI module, and controlling digital signal provides module and analogue signal
Thering is provided module to provide test signal to VXI module, test process utilizes SDRAM to access data as required, by by input
Output signal compares acquisition test result with program preset value, is shown by corresponding information on test process and result display module；
Collection of simulant signal module, analogue signal provide module to use A/D and D/A converter and corresponding application to support that circuit is constituted,
Use precision photoelectric coupler part to realize the electrical isolation between different VXI modules and do not change the feature of simulation output waveform；
A/d converter receives the order from FPGA, it is achieved the collection of VXI module simulation output waveform；FPGA controls DA and turns
Parallel operation is to tested VXI module input test signal；Digital signal acquiring module and digital signal provide module to use common I/O mouth
Constitute, realize the electrical isolation between VXI module by switching mode photoelectrical coupler, utilize input port to gather VXI module defeated
The data gone out, utilize delivery outlet to provide test signal or interrupt trigger signal to VXI module；Test assignment setting module is by standard
4*4 matrix keyboard constitute；Switch light-coupled isolation module, linear optical coupling isolation module are respectively by switching mode photoelectrical coupler and line
Property photoelectric coupled device constitute, be used for realizing above-mentioned fpga core processing module, analogue signal provides module, analogue signal to adopt
Collection module, digital signal acquiring module, digital signal provide module, test assignment setting module, test process and result to show
Module, switch light-coupled isolation module, between linear optical coupling isolation module and VXI module, the linear photoconductor of analogue signal couples sum
The switching mode photoelectric coupling of word signal, reaches to protect VXI module and the effect of tester.
A kind of VXI module tester based on FPGA the most according to claim 1, it is characterised in that: described tested
Journey and result display module are made up of 2.4 cun of TFT colorful display screens, are used for showing current test assignment, test process and test
As a result, and possible fault message.
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| Application Number | Priority Date | Filing Date | Title |
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| CN201410206188.5A CN103983871B (en) | 2014-05-16 | 2014-05-16 | A kind of VXI module tester based on FPGA |
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| CN201410206188.5A CN103983871B (en) | 2014-05-16 | 2014-05-16 | A kind of VXI module tester based on FPGA |
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| CN103983871A CN103983871A (en) | 2014-08-13 |
| CN103983871B true CN103983871B (en) | 2016-12-07 |
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| CN113359550B (en) * | 2021-06-03 | 2023-08-29 | 广州地铁集团有限公司 | FSK data monitoring equipment based on FPGA |
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| Publication number | Priority date | Publication date | Assignee | Title |
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| US5748916A (en) * | 1995-09-18 | 1998-05-05 | National Instruments Corporation | VXIbus device which intelligently monitors bus conditions and begins early cycles for improved performance |
| CN202339398U (en) * | 2011-12-14 | 2012-07-18 | 北京自动测试技术研究所 | Ageing module for VXI bus digital test system |
| CN202929136U (en) * | 2012-10-23 | 2013-05-08 | 北京自动测试技术研究所 | Fault diagnosis module for VXI bus digital test system |
| CN203149382U (en) * | 2013-03-29 | 2013-08-21 | 成都飞机设计研究所 | Virtual apparatus bus product calibration platform |
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Application publication date: 20140813 Assignee: Harbin Engineering Technology Co. Ltd. North Assignor: Harbin Engineering Univ. Contract record no.: 2019230000018 Denomination of invention: VXI module tester based on FPGA Granted publication date: 20161207 License type: Common License Record date: 20190704 |
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