CN103926799B - 一种调焦调平测量方法 - Google Patents
一种调焦调平测量方法 Download PDFInfo
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CN104165596B (zh) * | 2014-09-02 | 2017-01-25 | 南京中科神光科技有限公司 | 一种测定离焦量的方法及*** |
CN105806239B (zh) * | 2016-05-16 | 2018-07-24 | 北京控制工程研究所 | 一种激光扫描式星敏感器离焦量检测方法 |
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KR0132269B1 (ko) * | 1994-08-24 | 1998-04-11 | 이대원 | 노광장비에서의 자동초점과 자동수평 조절장치 및 조절방법 |
DE4434822C1 (de) * | 1994-09-29 | 1996-01-11 | Schott Glaswerke | Vorrichtung zur berührungslosen Messung von Abständen zu reflektierenden Grenzflächen oder Abstandsdifferenzen dazwischen, insbesondere zur Bestimmung der Dicke von Meßobjekten aus transparentem Material |
JP2002156578A (ja) * | 2000-11-20 | 2002-05-31 | Olympus Optical Co Ltd | 焦点検出装置、及びそれを備えた対物レンズ、光学顕微鏡又は光学検査装置 |
CN101276160B (zh) * | 2008-05-09 | 2010-09-15 | 上海微电子装备有限公司 | 用于光刻机的调焦调平装置及测量方法 |
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Address after: 201203 Shanghai Zhangjiang High Tech Park of Pudong New Area Zhang Road No. 1525 Applicant after: Shanghai microelectronics equipment (Group) Limited by Share Ltd Address before: 201203 Shanghai Zhangjiang High Tech Park of Pudong New Area Zhang Road No. 1525 Applicant before: Shanghai Micro Electronics Equipment Co., Ltd. |
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Correction item: deemed abandonment of patent right Correct: The revocation of the patent right shall be regarded as giving up False: The patent right is deemed to be abandoned Number: 35-01 Volume: 33 |
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