CN103886917A - Storage chip tester - Google Patents
Storage chip tester Download PDFInfo
- Publication number
- CN103886917A CN103886917A CN201410047830.XA CN201410047830A CN103886917A CN 103886917 A CN103886917 A CN 103886917A CN 201410047830 A CN201410047830 A CN 201410047830A CN 103886917 A CN103886917 A CN 103886917A
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- China
- Prior art keywords
- test
- plummer
- storage chip
- detector bar
- detection
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- Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)
Abstract
The invention discloses a storage chip tester which comprises a lower bearing table, wherein light-transmitting holes are formed in two sides of the lower bearing table; a testing tray is arranged on the surface of the lower bearing table; the testing tray and the lower bearing table are rotationally connected; multiple containing grooves are formed in the testing tray; two testing seats are arranged on the testing tray; the testing seats are electrically connected with the testing tray; the two testing seats are connected through detection strips; the number of the detection strips is not less than 1; an infrared detection device is arranged in the middle of one detection strip; an input end of the infrared detection device is electrically connected with an output end of the detection strip. According to the storage chip tester, a testing area of a storage chip tester can be aligned with all chips once, detection is conveniently performed at the same time, lots of detection time is reduced, the detection efficiency is high, the detection result is accurate, and a light leakage phenomenon is difficult to cause.
Description
Technical field
The present invention relates to a kind of test machine, particularly a kind of storage chip test machine.
Background technology
Along with the progress of the correlation technique such as electronics technology, network communication, and the continuous lifting of global electronic market comsupton level, the demand of the electronic products such as personal computer, multimedia, workstation, network and communications relevant device is increased sharply, and has driven the flourish of All Around The World semiconductor industry.The chip product of producing in semiconductor industry, along with it is more and more microminiaturized, the pin densities of chip is also more and more higher, and most high pin chip all adopts BGA encapsulation technology now, and it has become the optimal selection of the high density such as CPU, mainboard chip, high-performance and many pin package.But in the time dispatching from the factory, need to test accurately it, just can better put into market, avoid because of the not good increase and decrease that causes benefit of service property (quality), therefore need better proving installation to detect it, and general apparatus for testing chip cannot meet current demand.
Summary of the invention
The technical problem to be solved in the present invention is: overcome the problems referred to above, a kind of all chips that once can be alignd in the test section of memory chip test machine are provided, facilitate the same time to detect, it has reduced a large amount of detection times, and the high storage chip test machine of detection efficiency.
To achieve these goals, the technical solution used in the present invention is such: storage chip test machine of the present invention, comprise lower plummer, lower plummer both sides have light hole, lower carrier-table surface is provided with test panel, between test panel and lower plummer, adopt and be rotatably connected, on test panel, have several standing grooves, test bench is also installed on test panel, test bench is two, and test bench is electrically connected with test panel, and connect by detector bar between two test benches, more than one of detector bar, wherein a detector bar middle part is provided with infra-red ray detection device, infra-red ray detection device input end is electrically connected with detector bar output terminal, two test bench upper ends are provided with figure harvester, in figure harvester, be provided with probe, probe output terminal is electrically connected with figure harvester input end, also comprise down stake LED chip, the stake LED chip that falls is positioned at figure harvester and probe middle part, figure harvester is provided with plummer, on upper plummer, feet is installed, triaxial driving apparatus is installed on feet, triaxial driving apparatus is electrically connected with feet pin.
Further, as a kind of concrete version, between feet of the present invention and upper plummer, adopt and be fixedly connected with.
Further, as a kind of concrete version, on detector bar of the present invention, comprise at least one correcting part.
Further, as a kind of concrete version, on detector bar of the present invention, comprise multiple check points.
Compared with prior art, the invention has the advantages that: storage chip of the present invention test function is by the test section of memory chip test machine all chips that once align, facilitate the same time to detect, it has reduced a large amount of detection times, and detection efficiency is high, testing result is more accurate, is not easy to produce light leakage phenomena simultaneously.
Accompanying drawing explanation
Below in conjunction with drawings and Examples, the present invention is further described.
Fig. 1 is structural representation of the present invention;
In figure: 1. descend plummer; 2. light hole; 3. test panel; 4. test bench; 5. detection zone; 6. infra-red ray detection device; 7. probe; 8. figure harvester; Fall stake a LED chip; 10. go up plummer; 11. feets; 12. triaxial driving apparatus.
Embodiment
In conjunction with the accompanying drawings, the present invention is further detailed explanation.These accompanying drawings are the schematic diagram of simplification, and basic structure of the present invention is only described in a schematic way, and therefore it only shows the formation relevant with the present invention.
The preferred embodiment of storage chip test machine of the present invention as shown in Figure 1, comprise lower plummer 1, lower plummer 1 both sides have light hole 2, lower plummer 1 surface is provided with test panel 3, between test panel 3 and lower plummer 1, adopt and be rotatably connected, on test panel 3, have several standing grooves, test bench 4 is also installed on test panel 3, test bench 4 is two, and test bench 4 is electrically connected with test panel 3, and connect by detector bar 5 between two test benches 4, more than one of detector bar 5, wherein detector bar 5 middle parts are provided with infra-red ray detection device 6, infra-red ray detection device 6 input ends are electrically connected with detector bar 5 output terminals, two test bench 4 upper ends are provided with figure harvester 8, in figure harvester 8, be provided with probe 7, probe 7 output terminals are electrically connected with figure harvester 8 input ends, also comprise down stake LED chip 9, the stake LED chip 9 that falls is positioned at figure harvester 8 and probe 7 middle parts, figure harvester 8 is provided with plummer 10, on upper plummer 10, feet 11 is installed, triaxial driving apparatus 12 is installed on feet 11, triaxial driving apparatus 12 is electrically connected with feet 11 pins, between described feet 11 and upper plummer 10, adopt and be fixedly connected with, on described detector bar 5, comprise at least one correcting part, on described detector bar 5, comprise multiple check points.
Storage chip of the present invention test function is by the test section of memory chip test machine all chips that once align, facilitate the same time to detect, it has reduced a large amount of detection times, and detection efficiency is high, testing result is more accurate, is not easy to produce light leakage phenomena simultaneously.Between described feet 11 and upper plummer 10, adopt and be fixedly connected with, switching performance is good; On described detector bar 5, comprise at least one correcting part, on described detector bar 5, comprise multiple check points, strengthened detection effect.
Take above-mentioned foundation desirable embodiment of the present invention as enlightenment, by above-mentioned description, relevant staff can, not departing from the scope of this invention technological thought, carry out various change and modification completely.The technical scope of this invention is not limited to the content on instructions, must determine its technical scope according to claim scope.
Claims (4)
1. a storage chip test machine, comprise lower plummer, it is characterized in that: lower plummer both sides have light hole, lower carrier-table surface is provided with test panel, between test panel and lower plummer, adopt and be rotatably connected, on test panel, have several standing grooves, test bench is also installed on test panel, test bench is two, and test bench is electrically connected with test panel, and connect by detector bar between two test benches, more than one of detector bar, wherein a detector bar middle part is provided with infra-red ray detection device, infra-red ray detection device input end is electrically connected with detector bar output terminal, two test bench upper ends are provided with figure harvester, in figure harvester, be provided with probe, probe output terminal is electrically connected with figure harvester input end, also comprise down stake LED chip, the stake LED chip that falls is positioned at figure harvester and probe middle part, figure harvester is provided with plummer, on upper plummer, feet is installed, triaxial driving apparatus is installed on feet, triaxial driving apparatus is electrically connected with feet pin.
2. storage chip test machine according to claim 1, is characterized in that: between described feet and upper plummer, adopt and be fixedly connected with.
3. storage chip test machine according to claim 1, is characterized in that: on described detector bar, comprise at least one correcting part.
4. storage chip test machine according to claim 1, is characterized in that: on described detector bar, comprise multiple check points.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201410047830.XA CN103886917A (en) | 2014-02-11 | 2014-02-11 | Storage chip tester |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201410047830.XA CN103886917A (en) | 2014-02-11 | 2014-02-11 | Storage chip tester |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN103886917A true CN103886917A (en) | 2014-06-25 |
Family
ID=50955769
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201410047830.XA Pending CN103886917A (en) | 2014-02-11 | 2014-02-11 | Storage chip tester |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN103886917A (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105390163A (en) * | 2015-12-15 | 2016-03-09 | 深圳佰维存储科技有限公司 | Emmc testing device |
Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20080141188A1 (en) * | 2006-12-07 | 2008-06-12 | Rohit Kapur | Method and apparatus for limiting power dissipation in test |
| CN203038674U (en) * | 2012-12-21 | 2013-07-03 | 标准科技股份有限公司 | Memory chip testing machine |
| CN203217044U (en) * | 2013-02-25 | 2013-09-25 | 东莞市福地电子材料有限公司 | Inverted-mounting LED chip testing machine |
-
2014
- 2014-02-11 CN CN201410047830.XA patent/CN103886917A/en active Pending
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20080141188A1 (en) * | 2006-12-07 | 2008-06-12 | Rohit Kapur | Method and apparatus for limiting power dissipation in test |
| CN203038674U (en) * | 2012-12-21 | 2013-07-03 | 标准科技股份有限公司 | Memory chip testing machine |
| CN203217044U (en) * | 2013-02-25 | 2013-09-25 | 东莞市福地电子材料有限公司 | Inverted-mounting LED chip testing machine |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105390163A (en) * | 2015-12-15 | 2016-03-09 | 深圳佰维存储科技有限公司 | Emmc testing device |
| CN105390163B (en) * | 2015-12-15 | 2018-05-08 | 深圳佰维存储科技股份有限公司 | EMMC test devices |
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| C06 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
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| WD01 | Invention patent application deemed withdrawn after publication |
Application publication date: 20140625 |
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| WD01 | Invention patent application deemed withdrawn after publication |