CN103884949B - 削减板级物理测试点的测试方法 - Google Patents
削减板级物理测试点的测试方法 Download PDFInfo
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- CN103884949B CN103884949B CN201410152611.8A CN201410152611A CN103884949B CN 103884949 B CN103884949 B CN 103884949B CN 201410152611 A CN201410152611 A CN 201410152611A CN 103884949 B CN103884949 B CN 103884949B
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CN201410152611.8A CN103884949B (zh) | 2010-12-14 | 2010-12-14 | 削减板级物理测试点的测试方法 |
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CN201410152611.8A CN103884949B (zh) | 2010-12-14 | 2010-12-14 | 削减板级物理测试点的测试方法 |
CN201010587165.5A CN102540046B (zh) | 2010-12-14 | 2010-12-14 | 削减板级物理测试点的测试方法 |
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CN201010587165.5A Division CN102540046B (zh) | 2010-12-14 | 2010-12-14 | 削减板级物理测试点的测试方法 |
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CN103884949A CN103884949A (zh) | 2014-06-25 |
CN103884949B true CN103884949B (zh) | 2016-08-24 |
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Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
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CN1453593A (zh) * | 2002-04-23 | 2003-11-05 | 华为技术有限公司 | 一种非边界扫描器件逻辑簇故障测试方法 |
CN1619325A (zh) * | 2003-11-19 | 2005-05-25 | 华为技术有限公司 | 一种边界扫描测试控制器及边界扫描测试方法 |
CN1965242A (zh) * | 2004-06-08 | 2007-05-16 | 西门子公司 | 用于测试集成电路的测试方法和测试装置 |
CN101398465A (zh) * | 2007-09-28 | 2009-04-01 | 德律科技股份有限公司 | 电子元件的检测***及其方法 |
Family Cites Families (2)
Publication number | Priority date | Publication date | Assignee | Title |
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US7478281B2 (en) * | 2005-06-06 | 2009-01-13 | Denniston William B | System and methods for functional testing of embedded processor-based systems |
US20070032999A1 (en) * | 2005-08-05 | 2007-02-08 | Lucent Technologies Inc. | System and method for emulating hardware failures and method of testing system software incorporating the same |
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Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN1453593A (zh) * | 2002-04-23 | 2003-11-05 | 华为技术有限公司 | 一种非边界扫描器件逻辑簇故障测试方法 |
CN1619325A (zh) * | 2003-11-19 | 2005-05-25 | 华为技术有限公司 | 一种边界扫描测试控制器及边界扫描测试方法 |
CN1965242A (zh) * | 2004-06-08 | 2007-05-16 | 西门子公司 | 用于测试集成电路的测试方法和测试装置 |
CN101398465A (zh) * | 2007-09-28 | 2009-04-01 | 德律科技股份有限公司 | 电子元件的检测***及其方法 |
Non-Patent Citations (2)
Title |
---|
边界扫描技术在PCB可测性设计中的应用;王建业等;《空军工程大学学报(自然科学版)》;20031031;第4卷(第5期);第60-63页 * |
面向电路板级的边界扫描技术的应用;梁佐庆等;《国外电子测量技术》;20030922;第22卷(第S1期);第40-42页 * |
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CN103884949A (zh) | 2014-06-25 |
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Effective date of registration: 20160623 Address after: Xinghan street Suzhou Industrial Park in Suzhou city in Jiangsu province 215021 B No. 5 Building 4 floor 13/16 unit Applicant after: Centec Networks (Suzhou) Inc. Address before: Xinghan Street Industrial Park of Suzhou city in Jiangsu province 215000 B No. 5 Building 4 Building 16 unit Applicant before: Suzhou Industrial Park ICP Technologies Co., Ltd. |
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Address after: 215000 unit 13 / 16, 4th floor, building B, No.5 Xinghan street, Suzhou Industrial Park, Jiangsu Province Patentee after: Suzhou Shengke Communication Co.,Ltd. Address before: 215021 unit 13 / 16, floor 4, building B, No. 5, Xinghan street, Suzhou Industrial Park, Suzhou, Jiangsu Patentee before: CENTEC NETWORKS (SU ZHOU) Co.,Ltd. |
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