CN103852922A - Array substrate detection method and detection device - Google Patents

Array substrate detection method and detection device Download PDF

Info

Publication number
CN103852922A
CN103852922A CN201410061082.0A CN201410061082A CN103852922A CN 103852922 A CN103852922 A CN 103852922A CN 201410061082 A CN201410061082 A CN 201410061082A CN 103852922 A CN103852922 A CN 103852922A
Authority
CN
China
Prior art keywords
grid line
line
detection
signal
grid
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
CN201410061082.0A
Other languages
Chinese (zh)
Other versions
CN103852922B (en
Inventor
蔡振飞
张银忠
陈正伟
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
BOE Technology Group Co Ltd
Hefei Xinsheng Optoelectronics Technology Co Ltd
Original Assignee
BOE Technology Group Co Ltd
Hefei Xinsheng Optoelectronics Technology Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by BOE Technology Group Co Ltd, Hefei Xinsheng Optoelectronics Technology Co Ltd filed Critical BOE Technology Group Co Ltd
Priority to CN201410061082.0A priority Critical patent/CN103852922B/en
Publication of CN103852922A publication Critical patent/CN103852922A/en
Application granted granted Critical
Publication of CN103852922B publication Critical patent/CN103852922B/en
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Landscapes

  • Monitoring And Testing Of Transmission In General (AREA)

Abstract

The invention provides an array substrate detection method and an array substrate detection device capable of accurately detecting the on-off states of grid lines to be detected, and relates to the field of a display technology. The detection method comprises the steps of enabling a first grid line to be connected with a first detection line, and enabling a second grid line to be connected with a second detection line; or enabling the first detection line to be connected with the second detection line; setting at least one first signal receive and dispatch unit on the first grid line, and setting at least one second signal receive and dispatch signal on a second grid line; and respectively transmitting or receiving a detection signal for detecting either the first grid line or the second grid line.

Description

A kind of array base palte detection method and pick-up unit
Technical field
The present invention relates to display technique field, relate in particular to a kind of array base palte detection method and pick-up unit.
Background technology
TFT-LCD(Thin Film Transistor-Liquid Crystal Display, thin-film transistor LCD device) the most a kind of panel display apparatus, because it has the features such as little, low in energy consumption, the radiationless and cost of manufacture of volume is relatively low, and be applied to more and more in the middle of high-performance demonstration field.
Liquid crystal indicator mainly comprises display panels and drives the drive unit of this display panels; Display panels mainly comprises the array base palte and the color membrane substrates that are oppositely arranged.Wherein, on array base palte, be provided with grid line and data line that many transverse and longitudinals are intersected, and define multiple pixel cells of arranging with matrix form.Drive unit comprises that sweep signal is exported to the gate driver circuit of grid line and exports data-signal to data line is source electrode drive circuit.
In order to reduce overall dimensions and the manufacturing cost of liquid crystal indicator, existing gate driver circuit often adopts GOA(Gate Driver on Array, and array base palte is capable to be driven) design is integrated on the array base palte of display panel TFT gate switch circuit to form the turntable driving to display panels.For large-sized display panels, owing to being provided with too much electric capacity and resistance in circuit, can in the process of signal transmission, slacken the intensity of signal.Therefore, can all bind (banding) in the both sides of display panel and have PCB(Printed CircuitBoard, printed circuit board (PCB)) grid line on display panel is driven simultaneously.But, so, as shown in Figure 1, in the time that the grid line on above-mentioned display panel is detected, because the both sides of array base palte are provided with short-circuited conducting sleeve (Shorting).For example, the two ends of each grid line 10 are connected with the first detection line 11 and the second detection line 12 that are positioned at array base palte both sides respectively, form short-circuited conducting sleeve.So, cannot detect by grid line break-make detection method of the prior art the situation that grid opens circuit.Concrete, grid line break-make detection method of the prior art is, at the two ends of grid line to be detected, a signal transmitter/receiver unit is set respectively, and each signal transmitter/receiver unit both can emissioning testing signal, also can receive test signal; In the break-make testing process to grid line to be detected, an if signal transmitter/receiver unit emissioning testing signal, for example, first signal transmitter/receiver unit 20 emissioning testing signals in figure, even if grid line to be detected opens circuit, still, due to the existence of above-mentioned short-circuited conducting sleeve, test signal can be passed through the adjacent grid line of grid line to be detected, be passed to secondary signal transmitter/receiver unit 21, cannot be detected thereby cause grid line to open circuit.
Summary of the invention
Embodiments of the invention provide a kind of array base palte detection method and pick-up unit, can detect exactly the on off operating mode of grid line to be detected.
For achieving the above object, embodiments of the invention adopt following technical scheme:
The one side of the embodiment of the present invention, provides a kind of array base palte detection method, comprising:
At least a line the first grid line is connected with the first detection line; At least one first signal Transmit-Receive Unit is set on described the first grid line, to send or to receive detection signal;
At least a line the second grid line is connected with the second detection line; Or, be connected with described the second detection line with described the first detection line; At least one secondary signal Transmit-Receive Unit is set on described the second grid line, to send or to receive described detection signal.
The embodiment of the present invention on the other hand, provides a kind of array substrate detecting device, comprising:
At least one first signal Transmit-Receive Unit, is arranged on the first grid line, for sending or receive detection signal;
At least one secondary signal Transmit-Receive Unit, is arranged on the second grid line, for sending or receive described detection signal.
The embodiment of the present invention provides a kind of array base palte detection method and pick-up unit, and the method comprises: the first grid line is connected with the first detection line, and the second grid line is connected with the second detection line; Or, be connected with the second detection line with the first detection line; At least one first signal Transmit-Receive Unit is set on the first grid line, at least one secondary signal Transmit-Receive Unit is set on the second grid line; Send respectively or receive the detection signal for detection of the first grid line or the second grid line.So, can avoid two adjacent grid lines to be connected with the first detection line and the second detection line time simultaneously, test signal can be by being received by the signal receiver on grid line to be measured after the grid line adjacent with grid line to be detected, and cause the phenomenon that the off state of grid line to be measured cannot detect to produce, thereby can detect the break-make situation of grid line to be measured exactly.
Accompanying drawing explanation
In order to be illustrated more clearly in the embodiment of the present invention or technical scheme of the prior art, to the accompanying drawing of required use in embodiment or description of the Prior Art be briefly described below, apparently, accompanying drawing in the following describes is only some embodiments of the present invention, for those of ordinary skills, do not paying under the prerequisite of creative work, can also obtain according to these accompanying drawings other accompanying drawing.
A kind of array base palte detection method schematic diagram that Fig. 1 provides for prior art;
A kind of array base palte detection method process flow diagram that Fig. 2 provides for the embodiment of the present invention;
A kind of array base palte detection method schematic diagram that Fig. 3 provides for the embodiment of the present invention;
The another kind of array base palte detection method schematic diagram that Fig. 4 provides for the embodiment of the present invention;
The another kind of array base palte detection method schematic diagram that Fig. 5 provides for the embodiment of the present invention;
Another array base palte detection method schematic diagram that Fig. 6 provides for the embodiment of the present invention;
A kind of array substrate detecting device structural representation that Fig. 7 provides for the embodiment of the present invention.
Reference numeral:
10-grid line, 11-the first detection line; 12-the second detection line; 20-first signal transmitter/receiver unit; 21-secondary signal transmitter/receiver unit; 100-the first grid line; 101-the second grid line; 200-first signal Transmit-Receive Unit; 2001-first signal sends subelement; 2002-first signal receives subelement; 201-secondary signal Transmit-Receive Unit; 2011-secondary signal sends subelement; 2012-secondary signal receives subelement.
Embodiment
Below in conjunction with the accompanying drawing in the embodiment of the present invention, the technical scheme in the embodiment of the present invention is clearly and completely described, obviously, described embodiment is only the present invention's part embodiment, rather than whole embodiment.Based on the embodiment in the present invention, those of ordinary skills, not making the every other embodiment obtaining under creative work prerequisite, belong to the scope of protection of the invention.
The embodiment of the present invention provides a kind of array base palte detection method, as shown in Figure 2, can comprise:
S101, as shown in Figure 3, can be connected a line the first grid line 100 at least with the first detection line 11; At least one first signal Transmit-Receive Unit 200 is set on the first grid line 100, to send or to receive detection signal.
S102, general at least a line the second grid line 101 are connected with the second detection line 12; Or, be connected with the second detection line 12 with the first detection line 11; At least one secondary signal Transmit-Receive Unit 201 is set on the second grid line 101, to send or to receive detection signal.
It should be noted that, in said method, preferably the first grid line 100 and the second grid line 101 intervals can be arranged, as shown in Figure 3,2nd, the first grid line 100 of 4,6,8 even number lines is connected with the first detection line 11, and the second grid line 101 of the the 1st, 3,5,7 odd-numbered lines is connected with the second detection line 12.So, can make the wire structures of testing circuit neat, succinct.Certainly, those skilled in the art, also can be according to actual needs, the connected mode of the grid line to each row and the first detection line 11 and the second detection line 12 is adjusted, for example, the grid line of the 1st, 2,3 row can be connected with the first detection line 11, the grid line of the 4th, 5,6 row is connected with the second detection line 12, at this moment the grid line of the 1st, 2,3 row is that the grid line of the first grid line 100, the 4,5,6 row is the second grid line 101.Other connected mode is given an example no longer one by one at this, but all should belong to protection scope of the present invention.
It should be noted that, above-mentioned detection signal, for detection of the on off operating mode of the first grid line 100 or the second grid line 101.First signal Transmit-Receive Unit 200 and secondary signal Transmit-Receive Unit 201 can receive above-mentioned detection signal, can receive again this detection signal.
So, as shown in Figure 3, take even number line the 2nd row grid line as example, the first grid line 100 connects the first detection line 11, be provided with a first signal Transmit-Receive Unit 200 in one end of the first grid line 100, the other end is provided with a first signal Transmit-Receive Unit 200, in the time that one of them sends the detection signal of the first grid line 100, if another first signal Transmit-Receive Unit 200 can receive this detection signal, prove that this first grid line 100 is in conducting state.In the time that one of them sends the detection signal of the first grid line 100, if another first signal Transmit-Receive Unit 200 fails to receive this detection signal, prove that this first grid line 100 is in off state.The testing process of the odd-numbered line 1st row grid line (second grid line 101) adjacent with this first grid line 100 in like manner.
Again for example, for the 7th row the second grid line 101, one end of this second grid line 101 is connected with the first detection line 11, and the other end is connected with the second detection line 12 simultaneously.And eighth row first grid line 100 adjacent with the 7th row the second grid line 101 is only connected the first detection line 11.At this moment, can a secondary signal Transmit-Receive Unit 201 be set respectively at the two ends of the 7th row the second grid line 101; Near one end of the second detection line 12, a first signal Transmit-Receive Unit 200 is set at eighth row the first grid line 100.So, in the time that on the second grid line 101, the secondary signal Transmit-Receive Unit 201 near first detection line 11 one end sends detection signal, if the 7th row the second grid line 101 and eighth row the first grid line 100 are all in conducting state, on the 7th row the second grid line 101, on the secondary signal Transmit-Receive Unit 201 of close second detection line 12 one end and eighth row the first grid line 100, the first signal Transmit-Receive Unit 200 of one end of close the second detection line 12 all can be subject to above-mentioned detection signal.If the secondary signal Transmit-Receive Unit 201 near second detection line 12 one end on the 7th row the second grid line 101 fails to be subject to above-mentioned detection signal, illustrate that the 7th row the second grid line 101 is in off state; If the first signal Transmit-Receive Unit 200 of one end of close the second detection line 12 fails to be subject to above-mentioned detection signal on eighth row the first grid line 100, illustrate that this eighth row first grid line 100 is in off state.The break-make of other row grid line detects and can, with reference to said method, again give an example no longer one by one.
It should be noted that; above-mentioned is take the first grid line 100 as even number line grid line; the second grid line 101 for odd-numbered line grid line be the explanation that example is carried out; when the first grid line 100 is odd-numbered line grid line; when the second grid line 101 is even number line grid line; or detection method when from the first grid line 100 of other type of the different generations of the first detection line 11 and the second detection line 12 connected modes and the second grid line 101 is the same, does not repeat them here, but all should belong to protection scope of the present invention.
The embodiment of the present invention provides a kind of array base palte detection method, and the method comprises: the first grid line is connected with the first detection line, and the second grid line is connected with the second detection line; Or, be connected with the second detection line with the first detection line; At least one first signal Transmit-Receive Unit is set on the first grid line, at least one secondary signal Transmit-Receive Unit is set on the second grid line; Send respectively or receive the detection signal for detection of the first grid line or the second grid line.So, can avoid two adjacent grid lines to be connected with the first detection line and the second detection line time simultaneously, test signal can be by being received by the signal receiver on grid line to be measured after the grid line adjacent with grid line to be detected, and cause the phenomenon that the off state of grid line to be measured cannot detect to produce, thereby can detect the break-make situation of grid line to be measured exactly.
Further, as shown in Figure 4, in the time that the first grid line 100 is connected with the first detection line 11; The method that first signal Transmit-Receive Unit 200 is set on the first grid line 100 can also comprise:
First signal is set in one end of the first grid line 100 and sends subelement 2001, for sending detection signal to the first grid line 100, the other end arranges first signal and receives subelement 2002, for receiving above-mentioned detection signal.
When the second grid line 101 is connected with the second detection line 12; The method that secondary signal Transmit-Receive Unit 201 is set on the second grid line 101 can also comprise:
Secondary signal is set in one end of the second grid line 101 and sends subelement 2011, for sending detection signal to described the second grid line 101, the other end arranges secondary signal and receives subelement 2012, for receiving detection signal.
Wherein, above-mentioned connected mode can be, all the first grid lines 100 are only connected with the first detection line 11, and the second grid line 101 is only connected with the second detection line 12.This method of testing is concrete, and as shown in Figure 4, the first grid line 100(is even number line the 2nd, 8 row grid lines for example) be connected with the first detection line 11; The second grid line 101(is odd-numbered line the 1st, 7 row grid lines for example) be connected with the second detection line 12.In the time that first signal transmission subelement 2001 sends detection signal to the first grid line 100, if receiving subelement 2002, first signal receives above-mentioned detection signal, illustrate that the first grid line 100 is in conducting state; If first signal receives subelement 2002 and fails to receive above-mentioned detection signal, illustrate that the first grid line 100 is in off state.Detection case for the second grid line 101 is the same.So, because the first grid line 100 connects different detection lines from the second grid line 101, therefore can avoid in the time that the first grid line 100 or the second grid line 101 connect the first detection line 11 and the second detection line 12 simultaneously, because test signal is received by the signal receiver on grid line to be measured after by the grid line adjacent with grid line to be detected, and cause the phenomenon that the off state of grid line to be measured cannot detect to produce, thereby can detect the break-make situation of grid line to be measured exactly.
It should be noted that; below be all take the first grid line 100 as even number line grid line, the explanation carried out as odd-numbered line grid line as example of the second grid line 101; when the first grid line 100 is odd-numbered line grid line; when the second grid line 101 is even number line grid line; or testing process when from the first grid line 100 of other type of the different generations of the first detection line 11 and the second detection line 12 connected modes and the second grid line 101 in like manner can obtain; here repeat no more, but all should belong to protection scope of the present invention.
Further, as shown in Figure 5, when the first grid line 100 is connected with the first detection line 11; First signal is set in one end of the first grid line 100 and sends subelement 2001, the other end arranges first signal and receives subelement 2002; When the second grid line 101 is connected with the second detection line 12 with the first detection line 11; The method that secondary signal Transmit-Receive Unit 201 is set on the second grid line 101 can also comprise:
Secondary signal is set on the second grid line 101 and receives subelement 2012.
Concrete, as shown in Figure 5, the first grid line 100(is even number line the 2nd, 8 row grid lines for example) be connected with the first detection line 11; The second grid line 101(is odd-numbered line the 1st, 7 row grid lines for example) be connected with the second detection line 12 with the first detection line 11.In the time that the first signal transmission subelement 2001 on the first grid line 100 sends detection signal, because second grid line 101 adjacent with this first grid line 100 is connected with the second detection line 12 with the first detection line 11 simultaneously, therefore this detection signal can be divided into two parts, a part is sent to the first grid line 100, and another part is sent to the second grid line 101 by the first detection line 11.Therefore, can receive above-mentioned detection signal if the first signal on the first grid line 100 receives subelement 2002, illustrate that this first grid line 100 is in conducting state; If the first signal on the first grid line 100 receives subelement 2002 and fails to receive above-mentioned detection signal, illustrate that this first grid line 100 is in off-state.In like manner, can receive above-mentioned detection signal if be arranged at the second grid line 101 near the secondary signal reception subelement 2012 of the second detection line 12 1 sides, illustrate that this second grid line 101 is in conducting state; Fail to receive above-mentioned detection signal if secondary signal receives subelement 2012, illustrate that this second grid line 101 is in off-state.So, can avoid in the time that the first grid line 100 or the second grid line 101 connect the first detection line 11 and the second detection line 12 simultaneously, because test signal is received by the signal receiver on grid line to be measured after by the grid line adjacent with grid line to be detected, and cause the phenomenon that the off state of grid line to be measured cannot detect to produce, thereby can detect the break-make situation of grid line to be measured exactly.
It should be noted that, preferred, secondary signal can be received to subelement 2012 and be arranged at the side of the second grid line 101 near the second detection line 12, so, can detect the break-make situation of whole the second grid line 101.Certainly, the position that those skilled in the art can also receive subelement 2012 to secondary signal by actual conditions is adjusted, for example, only need to detect the second grid line 101 of close the first detection line 11 parts time, this secondary signal reception subelement 2012 can be arranged to the centre position of the second grid line 101.
It should be noted that; below be all take the first grid line 100 as even number line grid line, the explanation carried out as odd-numbered line grid line as example of the second grid line 101; when the first grid line 100 is odd-numbered line grid line; when the second grid line 101 is even number line grid line; or testing process when from the first grid line 100 of other type of the different generations of the first detection line 11 and the second detection line 12 connected modes and the second grid line 101 in like manner can obtain; here repeat no more, but all should belong to protection scope of the present invention.
Further, as shown in Figure 6, in the time that the first grid line 100 is connected with the first detection line 11; The method that first signal Transmit-Receive Unit 200 is set on the first grid line 100 can also comprise:
First signal is set on the first grid line 100 and receives subelement 2002.
In the time that the second grid line 101 is connected with the second detection line 12 with the first detection line 11; The method that secondary signal Transmit-Receive Unit 201 is set on the second grid line 101 can also comprise:
Secondary signal is set in one end of the second grid line 101 and sends subelement 2011, the other end arranges secondary signal and receives subelement 2012.
Concrete, as shown in Figure 6, the first grid line 100(is even number line the 2nd, 8 row grid lines for example) be connected with the first detection line 11; The second grid line 101(is odd-numbered line the 1st, 7 row grid lines for example) be connected with the second detection line 12 with the first detection line 11.In the time that the secondary signal transmission subelement 2011 arranging on the second grid line 101 sends detection signal, because second grid line 101 adjacent with this first grid line 100 is connected with the second detection line 12 with the first detection line 11 simultaneously, therefore this detection signal can be divided into two parts, a part is sent to the second grid line 101, and another part is sent to the first grid line 100 by the first detection line 11.
Therefore, can receive above-mentioned detection signal if the secondary signal on the second grid line 101 receives subelement 2012, illustrate that this second grid line 101 is in conducting state; If the secondary signal on the second grid line 101 receives subelement 2012 and fails to receive above-mentioned detection signal, illustrate that this second grid line 101 is in off-state.In like manner, can receive above-mentioned detection signal if be arranged at the first grid line 100 near the first signal reception subelement 2002 of the second detection line 12 1 sides, illustrate that this first grid line 100 is in conducting state; Fail to receive above-mentioned detection signal if first signal receives subelement 2002, illustrate that this first grid line 100 is in off-state.So, can avoid in the time that the first grid line 100 or the second grid line 101 connect the first detection line 11 and the second detection line 12 simultaneously, because test signal is received by the signal receiver on grid line to be measured after by the grid line adjacent with grid line to be detected, and cause the phenomenon that the off state of grid line to be measured cannot detect to produce, thereby can detect the break-make situation of grid line to be measured exactly.
It should be noted that, preferred, first signal can be received to subelement 2002 and be arranged at the side of the first grid line 100 near the second detection line 12, so, can detect the break-make situation of whole the first grid line 100.Certainly, the position that those skilled in the art can also receive subelement 2002 to first signal by actual conditions is adjusted, for example, only need to detect the first grid line 100 of close the first detection line 11 parts time, this first signal reception subelement 2002 can be arranged to the centre position of the first grid line 100.
It should be noted that; below be all take the first grid line 100 as even number line grid line, the explanation carried out as odd-numbered line grid line as example of the second grid line 101; when the first grid line 100 is odd-numbered line grid line; when the second grid line 101 is even number line grid line; or testing process when from the first grid line 100 of other type of the different generations of the first detection line 11 and the second detection line 12 connected modes and the second grid line 101 in like manner can obtain; here repeat no more, but all should belong to protection scope of the present invention.
Further, above-mentioned array base palte detection method can also comprise:
Intensity and the preset value of the detection signal that first signal Transmit-Receive Unit 200 or secondary signal Transmit-Receive Unit 201 are received compare, so that the first grid line 100 or the second opening circuit of grid line 101 are detected.So, can be using above-mentioned preset value as reference, make the judgement of the on off operating mode to the first grid line 100 or the second grid line 101 more directly perceived.
Wherein, those skilled in the art can need to set above-mentioned preset value according to actual production processing.Preferably, above-mentioned preset value can be numerically equal to the intensity of the above-mentioned detection signal that first signal Transmit-Receive Unit 200 or secondary signal Transmit-Receive Unit 201 receive.Take Fig. 3 as example, above-mentioned preset value can be numerically equal to first signal and receive subelement 2002 or secondary signal and receive the intensity of the detection signal that subelement 2012 receives.
Concrete, when the first grid line 100(is as the grid line of even number line the 2nd row) and the second grid line 101(as the grid line of odd-numbered line the 1st row) during all in conducting state, first signal receives the intensity that subelement 2002 and secondary signal receive the detection signal that subelement 2012 receives and equals above-mentioned preset value.When the first grid line 100(is as the grid line of even number line eighth row) in conducting state, and the second grid line 101(is as the grid line of odd-numbered line the 7th row) in the time of off state.The intensity of the detection signal that first signal reception subelement 2002 receives can be greater than preset value.Because, because the second grid line 101 opens circuit, so secondary signal receives subelement 2012 and does not receive the detection signal that secondary signal transmission subelement 2011 sends, and this detection signal is all received by first signal reception subelement 2002, so the intensity of the detection signal that first signal reception subelement 2002 receives can be greater than preset value.So, can make the judgement of the on off operating mode to the first grid line 100 or the second grid line 101 easier, directly perceived.
The embodiment of the present invention provides a kind of array substrate detecting device, as shown in Figure 7, can comprise:
At least one first signal Transmit-Receive Unit 200, is arranged on the first grid line 100, for sending or receive detection signal.
At least one secondary signal Transmit-Receive Unit, is arranged on the second grid line 101, for sending or receive above-mentioned detection signal.
It should be noted that, above-mentioned detection signal, for detection of the on off operating mode of the first grid line 100 or the second grid line 101.First signal Transmit-Receive Unit 200 and secondary signal Transmit-Receive Unit 201 can receive above-mentioned detection signal, can receive again this detection signal.
The embodiment of the present invention provides a kind of array substrate detecting device, this device comprises: be arranged on the first grid line, for sending or receive at least one first signal Transmit-Receive Unit of detection signal and being arranged at the second grid line, for sending or receive at least one secondary signal Transmit-Receive Unit of above-mentioned detection signal.During due to detection, the first grid line is connected with the first detection line, and the second grid line is connected with the second detection line; Or, be connected with the second detection line with the first detection line.So, can avoid two adjacent grid lines to be connected with the first detection line and the second detection line in testing process by this device time simultaneously, test signal can be by being received by the signal receiver on grid line to be measured after the grid line adjacent with grid line to be detected, and cause the phenomenon that the off state of grid line to be measured cannot detect to produce, thereby can detect the break-make situation of grid line to be measured exactly.
Preferably, first signal Transmit-Receive Unit 200 comprises:
First signal sends subelement 2001, for sending detection signal to the first grid line 100.
First signal receives subelement 2002, for receiving the detection signal of the first grid line 100.
Preferably, secondary signal Transmit-Receive Unit 201 comprises:
Secondary signal sends subelement 2011, for sending detection signal to the second grid line 101;
Secondary signal receives subelement 2012, for receiving the detection signal of the second grid line 101.
So, can be according to the first grid line 100 and the second grid line 101 connected mode different from the first detection line 11 or the second detection line 12, the position that above-mentioned first signal is sent to subelement 2001, first signal reception subelement 2002 and secondary signal transmission subelement 2011, secondary signal reception subelement 2012 arranges.
For example, shown in Fig. 4, the first grid line 100(is even number line the 2nd, 8 row grid lines for example) be connected with the first detection line 11; The second grid line 101(is odd-numbered line the 1st, 7 row grid lines for example) be connected with the second detection line 12.First signal can be set in one end of the first grid line 100 and send subelement 2001, the other end arranges first signal and receives subelement 2002; Secondary signal transmission subelement 2011 other ends are set in one end of the second grid line 101 secondary signal reception subelement 2012 is set.In the time that first signal transmission subelement 2001 sends detection signal to the first grid line 100, if receiving subelement 2002, first signal receives above-mentioned detection signal, illustrate that the first grid line 100 is in conducting state; If first signal receives subelement 2002 and fails to receive above-mentioned detection signal, illustrate that the first grid line 100 is in off state.This array substrate detecting device is the same for the detection case of the second grid line 101.So, because the first grid line 100 connects different detection lines from the second grid line 101, therefore pass through above-mentioned detection device, in testing process, can avoid in the time that the first grid line 100 or the second grid line 101 connect the first detection line 11 and the second detection line 12 simultaneously, because test signal is received by the signal receiver on grid line to be measured after by the grid line adjacent with grid line to be detected, and cause the phenomenon that the off state of grid line to be measured cannot detect to produce, thereby can detect the break-make situation of grid line to be measured exactly.
Again for example, shown in Fig. 6, the first grid line 100(is even number line the 2nd, 8 row grid lines for example) be connected with the first detection line 11; The second grid line 101(is odd-numbered line the 1st, 7 row grid lines for example) be connected with the second detection line 12 with the first detection line 11.Can near one end of the second detection line 12, first signal be set at the first grid line 100 and receive subelement 2002; Secondary signal is set in one end of the second grid line 101 and sends subelement 2011, the other end arranges secondary signal and receives subelement 2012.In the time that the secondary signal transmission subelement 2011 arranging on the second grid line 101 sends detection signal, because second grid line 101 adjacent with this first grid line 100 is connected with the second detection line 12 with the first detection line 11 simultaneously, therefore this detection signal can be divided into two parts, a part is sent to the second grid line 101, and another part is sent to the first grid line 100 by the first detection line 11.
Therefore, can receive above-mentioned detection signal if the secondary signal on the second grid line 101 receives subelement 2012, illustrate that this second grid line 101 is in conducting state; If the secondary signal on the second grid line 101 receives subelement 2012 and fails to receive above-mentioned detection signal, illustrate that this second grid line 101 is in off-state.In like manner, can receive above-mentioned detection signal if be arranged at the first grid line 100 near the first signal reception subelement 2002 of the second detection line 12 1 sides, illustrate that this first grid line 100 is in conducting state; Fail to receive above-mentioned detection signal if first signal receives subelement 2002, illustrate that this first grid line 100 is in off-state.So, pass through above-mentioned detection device, in testing process, can avoid in the time that the first grid line 100 or the second grid line 101 connect the first detection line 11 and the second detection line 12 simultaneously, because test signal is received by the signal receiver on grid line to be measured after by the grid line adjacent with grid line to be detected, and cause the phenomenon that the off state of grid line to be measured cannot detect to produce, thereby can detect the break-make situation of grid line to be measured exactly.
Other sends subelement 2001, first signal for first signal and receives subelement 2002 and secondary signal and send subelement 2011, secondary signal and receive being arranged on this and giving an example no longer one by one of subelement 2012 positions, but all should belong to protection scope of the present invention.
The above; be only the specific embodiment of the present invention, but protection scope of the present invention is not limited to this, any be familiar with those skilled in the art the present invention disclose technical scope in; can expect easily changing or replacing, within all should being encompassed in protection scope of the present invention.Therefore, protection scope of the present invention should be as the criterion with the protection domain of described claim.

Claims (12)

1. an array base palte detection method, is characterized in that, comprising:
At least a line the first grid line is connected with the first detection line; At least one first signal Transmit-Receive Unit is set on described the first grid line, to send or to receive detection signal;
At least a line the second grid line is connected with the second detection line; Or, be connected with described the second detection line with described the first detection line; At least one secondary signal Transmit-Receive Unit is set on described the second grid line, to send or to receive described detection signal.
2. array base palte detection method according to claim 1, is characterized in that, also comprises:
Described the first grid line and described the second grid line interval are arranged.
3. array base palte detection method according to claim 2, is characterized in that, in the time that described the first grid line is connected with described the first detection line; The described method that first signal Transmit-Receive Unit is set on described the first grid line also comprises:
First signal is set in one end of described the first grid line and sends subelement, for sending described detection signal to described the first grid line, the other end arranges first signal and receives subelement, for receiving described detection signal.
4. array base palte detection method according to claim 2, is characterized in that, when described the second grid line is connected with described the second detection line; The described method that secondary signal Transmit-Receive Unit is set on described the second grid line also comprises:
Secondary signal is set in one end of described the second grid line and sends subelement, for sending described detection signal to described the second grid line, the other end arranges secondary signal and receives subelement, for receiving described detection signal.
5. array base palte detection method according to claim 3, is characterized in that, in the time that described the second grid line is connected with described the second detection line with described the first detection line; The described method that secondary signal Transmit-Receive Unit is set on described the second grid line also comprises:
Described secondary signal is set on described the second grid line and receives subelement.
6. array base palte detection method according to claim 2, is characterized in that, in the time that described the first grid line is connected with described the first detection line; The described method that first signal Transmit-Receive Unit is set on described the first grid line also comprises:
First signal is set on described the first grid line and receives subelement.
7. array base palte detection method according to claim 6, is characterized in that, in the time that described the second grid line is connected with described the second detection line with described the first detection line; The described method that secondary signal Transmit-Receive Unit is set on described the second grid line also comprises:
Described secondary signal is set in one end of described the second grid line and sends subelement, the other end arranges described secondary signal and receives subelement.
8. according to the array base palte detection method described in claim 1-7 any one, it is characterized in that, also comprise:
Intensity and the preset value of the described detection signal that described first signal Transmit-Receive Unit or described secondary signal Transmit-Receive Unit are received compare, so that described the first grid line or opening circuit of described the second grid line are detected.
9. array base palte detection method according to claim 8, is characterized in that, described preset value is numerically equal to the intensity of the described detection signal that described first signal Transmit-Receive Unit or described secondary signal Transmit-Receive Unit receive.
10. an array substrate detecting device, is characterized in that, comprising:
At least one first signal Transmit-Receive Unit, is arranged on the first grid line, for sending or receive detection signal;
At least one secondary signal Transmit-Receive Unit, is arranged on the second grid line, for sending or receive described detection signal.
11. array substrate detecting devices according to claim 10, is characterized in that, described first signal Transmit-Receive Unit comprises:
First signal sends subelement, for sending detection signal to described the first grid line;
First signal receives subelement, for receiving the detection signal of described the first grid line.
12. array substrate detecting devices according to claim 10, is characterized in that, described secondary signal Transmit-Receive Unit comprises:
Secondary signal sends subelement, for sending detection signal to described the second grid line;
Secondary signal receives subelement, for receiving the detection signal of described the second grid line.
CN201410061082.0A 2014-02-21 2014-02-21 A kind of array base palte detection method and detecting device Expired - Fee Related CN103852922B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201410061082.0A CN103852922B (en) 2014-02-21 2014-02-21 A kind of array base palte detection method and detecting device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201410061082.0A CN103852922B (en) 2014-02-21 2014-02-21 A kind of array base palte detection method and detecting device

Publications (2)

Publication Number Publication Date
CN103852922A true CN103852922A (en) 2014-06-11
CN103852922B CN103852922B (en) 2016-07-06

Family

ID=50860781

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201410061082.0A Expired - Fee Related CN103852922B (en) 2014-02-21 2014-02-21 A kind of array base palte detection method and detecting device

Country Status (1)

Country Link
CN (1) CN103852922B (en)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104122689A (en) * 2014-07-29 2014-10-29 深圳市华星光电技术有限公司 Testing device and testing method of testing device
WO2015043306A1 (en) * 2013-09-29 2015-04-02 京东方科技集团股份有限公司 Detection method and detection device for broken circuit of gate line
CN104793365A (en) * 2015-04-23 2015-07-22 深圳市华星光电技术有限公司 Display panel circuit detecting device and method
WO2016000293A1 (en) * 2014-06-30 2016-01-07 深圳市华星光电技术有限公司 Display panel
WO2016082190A1 (en) * 2014-11-24 2016-06-02 深圳市华星光电技术有限公司 Display panel detection circuit and detection method therefor

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007183165A (en) * 2006-01-06 2007-07-19 Nec Kagoshima Ltd Method and device for inspecting wiring defect
CN101364022A (en) * 2008-09-12 2009-02-11 昆山龙腾光电有限公司 Array substrate and defect detecting method thereof
US20090219048A1 (en) * 2002-12-18 2009-09-03 Semiconductor Energy Laboratory Co., Ltd. Image Display Device and Testing Method of the Same
CN101652705A (en) * 2007-04-25 2010-02-17 夏普株式会社 Liquid crystal display panel and its inspecting method
CN103309064A (en) * 2013-05-24 2013-09-18 深圳市华星光电技术有限公司 Sensor, detection device and method
CN103499892A (en) * 2013-09-29 2014-01-08 京东方科技集团股份有限公司 Grid line make-and-break detecting method and device

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20090219048A1 (en) * 2002-12-18 2009-09-03 Semiconductor Energy Laboratory Co., Ltd. Image Display Device and Testing Method of the Same
JP2007183165A (en) * 2006-01-06 2007-07-19 Nec Kagoshima Ltd Method and device for inspecting wiring defect
CN101652705A (en) * 2007-04-25 2010-02-17 夏普株式会社 Liquid crystal display panel and its inspecting method
CN101364022A (en) * 2008-09-12 2009-02-11 昆山龙腾光电有限公司 Array substrate and defect detecting method thereof
CN103309064A (en) * 2013-05-24 2013-09-18 深圳市华星光电技术有限公司 Sensor, detection device and method
CN103499892A (en) * 2013-09-29 2014-01-08 京东方科技集团股份有限公司 Grid line make-and-break detecting method and device

Cited By (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2015043306A1 (en) * 2013-09-29 2015-04-02 京东方科技集团股份有限公司 Detection method and detection device for broken circuit of gate line
US9576514B2 (en) 2013-09-29 2017-02-21 Boe Technology Group Co., Ltd. Method for detecting disconnection of gate line and detection apparatus
WO2016000293A1 (en) * 2014-06-30 2016-01-07 深圳市华星光电技术有限公司 Display panel
GB2542993A (en) * 2014-06-30 2017-04-05 Shenzhen China Star Optoelect Display panel
EA032445B1 (en) * 2014-06-30 2019-05-31 Шэньчжэнь Чайна Стар Оптоэлектроникс Текнолоджи Ко., Лтд. Display panel
GB2542993B (en) * 2014-06-30 2020-09-02 Shenzhen China Star Optoelect Display panel
CN104122689A (en) * 2014-07-29 2014-10-29 深圳市华星光电技术有限公司 Testing device and testing method of testing device
WO2016082190A1 (en) * 2014-11-24 2016-06-02 深圳市华星光电技术有限公司 Display panel detection circuit and detection method therefor
CN104793365A (en) * 2015-04-23 2015-07-22 深圳市华星光电技术有限公司 Display panel circuit detecting device and method

Also Published As

Publication number Publication date
CN103852922B (en) 2016-07-06

Similar Documents

Publication Publication Date Title
CN207458545U (en) A kind of display panel and display device
CN103852922A (en) Array substrate detection method and detection device
CN104732947B (en) Driving chip, driving board and method for testing same, and display device
CN103926767B (en) Liquid crystal display and detection method thereof
US20210020085A1 (en) Test circuit and display device
CN103499892B (en) Grid line break-make detection method and checkout equipment
CN103345077B (en) The quality detection device of liquid crystal display module and using method thereof
CN105632382A (en) Display device and method for detecting binding condition of binding area
CN104360509A (en) Light-on test method and device
CN106157858A (en) The test circuit of the gate driver circuit of display panels and method of work thereof
CN103280173B (en) Detection device and detection method for liquid crystal display panel
CN104505045A (en) Liquid crystal display panel, gate drive circuit and fault detection method of gate drive circuit
CN101206843B (en) Control board and display apparatus having the same
EP2299313A3 (en) Liquid Crystal Display Device and Method of Fabricating the Same
CN104460082A (en) Liquid crystal display with touch function and touch detection method of liquid crystal display
CN103926717A (en) Display panel, detection circuit of display panel and detection method of display panel
CN101847357A (en) Display panel, display device and test method thereof
CN105976785A (en) Goa circuit and liquid crystal display panel
CN103226274B (en) Array base palte and driving method thereof and electrochromic display device (ECD)
WO2019114054A1 (en) Display panel pixel potential measurement circuit, method and display panel
CN109658854B (en) Display device and overhauling method and driving method thereof
CN101369061A (en) Method for driving liquid crystal display panel
US20160282642A1 (en) Display panel and detection method thereof
CN103778881B (en) A kind of data drive circuit, display device and driving method thereof
CN202084281U (en) Driving device for liquid crystal display and liquid crystal display device

Legal Events

Date Code Title Description
C06 Publication
PB01 Publication
C10 Entry into substantive examination
SE01 Entry into force of request for substantive examination
C14 Grant of patent or utility model
GR01 Patent grant
CF01 Termination of patent right due to non-payment of annual fee
CF01 Termination of patent right due to non-payment of annual fee

Granted publication date: 20160706

Termination date: 20210221