CN103823128B - A kind of FCT/ICT comprehensive test device customizing electronic product - Google Patents
A kind of FCT/ICT comprehensive test device customizing electronic product Download PDFInfo
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- CN103823128B CN103823128B CN201210461517.1A CN201210461517A CN103823128B CN 103823128 B CN103823128 B CN 103823128B CN 201210461517 A CN201210461517 A CN 201210461517A CN 103823128 B CN103823128 B CN 103823128B
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Abstract
The invention discloses a kind of FCT/ICT comprehensive test device customizing electronic product, digital analog I/O relay isolation module and fixture interface is customized including embedded control platform, ICT test cell, relay array control module, user, described embedded control platform is used for inputting control signal, and sends control signals to ICT test cell or user customizes digital analog I/O relay isolation module；Described ICT test cell realizes being connected with the circuit of test target by relay array control module, fixture interface, carries out ICT test；Described user customizes digital analog I/O relay isolation module and realizes being connected with the circuit of test target by fixture interface, carries out FCT test.The FCT/ICT comprehensive test device customizing electronic product that the present invention provides, comprehensive FCT test and ICT test, and reduce the cost of test, the motility improving test and testing efficiency.
Description
Technical field
The present invention relates to the production test technology of electronic product, particularly relate to a kind of FCT/ICT customizing electronic product
Comprehensive test device.
Background technology
Any electronic product the most all can pass through test, so either electronic goods, independent electronic module section
Part or PCBA (abbreviation of Printed Circuit Board+Assembly) semi-finished product are directed to the work in terms of test
Make.The production test of current electronic product is broadly divided into two part: ICT and tests (In Circuit Test, on-line testing),
Main inspection electronic devices and components are the most correctly installed；FCT tests (Function Circuit Test, functional test), even surveying
Examination Target Board works in design point, thus obtains output, the duty of validation test Target Board.
The ICT method of testing of current tradition and main flow is to utilize universal I CT test machine, carries out target detection plate online
I-V tests, and i.e. to single components and parts, takes voltage drive, the principle of current measurement and bypass protection (Guarding) to carry out
Impedance inspection one by one, thus judge whether single components and parts are installed correctly.The testing impedance topology knot of universal I CT test machine
Composition is as it is shown in figure 1, wherein: DUT is test target, and Zx is the impedance of test target, and Vx is test and excitation voltage, and Ix is excitation
Electric current, Rr is that electric current uses resistance, and Ir is sample rate current, and the low end of DUT is forced to drag down by amplifier, it is ensured that Ir=Ix, Vr are
Actual measurement voltage, therefore:
Thus:
The advantage using universal I CT test machine to carry out testing is that board is general, stable and reliable operation；Shortcoming is to less
The target detection plate of type, wastes resource, and universal I CT test machine equipment is huge, expensive, measures mesh one by one simultaneously
Device on mapping test plate (panel) is the most time-consuming, this considerably increases the cost of board production test, for current consumer electronics
Product makes rapid progress, the design present situation that the production test cycle constantly shortens, cost constantly forces down, and is out of season.
The FCT method of testing of current tradition and main flow is then mostly based on customization, uses industrial computer and various instrument
Composition tester table constitutes hardware components, uses related software (the Labview software of such as NI company) to carry out program development structure
Become software section.Although conventional instrument is multiple functional, but price is high, and can only use a wherein little portion in production test
Dividing function, it is inefficient that secondary uses；Hardware components is bulky simultaneously, is unfavorable for the automatization of test.
Summary of the invention
Goal of the invention: in order to overcome the deficiencies in the prior art, the present invention provides a kind of electronic product that customizes
FCT/ICT comprehensive test device, comprehensive FCT test and ICT test, and reduce the cost of test, improve the motility of test.
Technical scheme: for solving above-mentioned technical problem, the technical solution used in the present invention is:
Customize the FCT/ICT comprehensive test device of electronic product, including embedded control platform, ICT test cell, continue
Electrical equipment array control module, user customize digital analog I/O relay isolation module and fixture interface,
Described embedded control platform is used for inputting control signal, and sends control signals to ICT test cell or use
Family customization digital analog I/O relay isolation module；
Described relay array control module and user customize digital analog I/O relay isolation module and fixture interface
Corresponding input terminal circuit connects；
Described fixture interface is used for clamping test target；
Described ICT test cell realizes the circuit with test target even by relay array control module, fixture interface
Connect, test target is carried out ICT test, and test result is fed back to embedded control platform；
Described user customizes digital analog I/O relay isolation module and realizes the circuit with test target by fixture interface
Connect, test target is carried out FCT test, and test result is fed back to embedded control platform.
Preferably, also including industrial computer, described industrial computer realizes communicating with embedded control platform by network.
Preferably, described ICT test cell includes three subelements, and the outfan of two of which subelement concatenates one respectively
After individual test target, the outfan with the 3rd subelement links together；Described subelement include two amplifiers and one adopt
Sample resistance, an input of one of them amplifier is voltage drive end, and another input is as the output of this subelement
End is also connected on the two ends of sampling resistor respectively with the outfan of this amplifier, simultaneously the two ends of this sampling resistor the most respectively with separately
Two inputs of one amplifier are connected, and the outfan of this another amplifier is current measurement end.
Preferably, described relay array control module is made up of 8 4*32 low pressure high-speed relay matrixes.
The FCT/ICT comprehensive test device of above-mentioned customization electronic product, tests FCT together with ICT test synthesis；
A small amount of hardware can be coordinated just can to realize self-defined signal generator, numeral by software by embedded control platform simultaneously
Wave filter, digital oscilloscope and image file process, the calculating of testing impedance parameter, testing impedance automatic range selecting circuit, impedance are surveyed
Examination calibration automatically, SPI communication interface, self-defined relay array control the function such as bus, ICT Human-machine Control interface, it is to avoid each
Plant piling up of instrument, it is possible to effectively reduce volume and the cost of equipment, improve the motility of test.
It addition, the ICT test cell of autonomous Design can measure two test targets simultaneously, substantially increase test effect
Rate.
Beneficial effect: the FCT/ICT comprehensive test device customizing electronic product that the present invention provides, comprehensive FCT tests
Test with ICT, reduce the cost of test, the motility improving test and testing efficiency.
Accompanying drawing explanation
Fig. 1 is the testing impedance topology diagram of the universal I CT test machine of prior art；
Fig. 2 is the structural representation of the present invention；
Fig. 3 is the testing impedance topology diagram of the ICT test cell in the present invention；
Fig. 4 is the computation model of prior art；
Fig. 5 is the computation model of the present invention.
Detailed description of the invention
Below in conjunction with the accompanying drawings the present invention is further described.
It is illustrated in figure 2 a kind of FCT/ICT comprehensive test device customizing electronic product, including industrial computer, embedded
Control platform, ICT test cell, relay array control module, user customize digital analog I/O relay isolation module and folder
Tool interface,
Described embedded control platform uses SBRIO9842 (integrated collection and control system), is used for inputting control signal,
And send control signals to ICT test cell or user customizes digital analog I/O relay isolation module；Coordinated by software
A small amount of hardware realizes self-defined signal generator, digital filter, digital oscilloscope and image file process, testing impedance parameter
Calculating, testing impedance automatic range selecting circuit, testing impedance are calibrated automatically, SPI communication interface, self-defined relay array control total
The functions such as line, ICT Human-machine Control interface；
Described relay array control module and user customize digital analog I/O relay isolation module and fixture interface
Corresponding input terminal circuit connects, and wherein relay array control module is made up of 8 4*32 low pressure high-speed relay matrixes；
Described fixture interface is used for clamping test target；
Described ICT test cell (being referred to as PMU unit) is realized by relay array control module, fixture interface
It is connected with the circuit of test target, test target is carried out ICT test, and test result is fed back to embedded control platform；
Described user customizes digital analog I/O relay isolation module and can customize and extension according to different FCT testing requirements,
Realize being connected with the circuit of test target by fixture interface, test target is carried out FCT test, and test result is fed back to
Embedded control platform；
Described industrial computer realizes communicating with embedded control platform by network, can realize an industrial computer by router
Control respectively to multiple embedded control platform；When specifically testing, by industrial computer, embedded platform can be carried out in real time
Control, it is possible to use download and carry out working alone of embedded control platform.
Described ICT test cell includes three subelements, and the outfan of two of which subelement concatenates a test respectively
After target, the outfan with the 3rd subelement links together；Described subelement includes two amplifiers and a sampling electricity
Resistance, an input of one of them amplifier is voltage drive end, another input as this subelement outfan and
Outfan with this amplifier is connected on the two ends of sampling resistor respectively, and the two ends of this sampling resistor are put with another the most respectively simultaneously
Two inputs of big device are connected, and the outfan of this another amplifier is current measurement end.
Use said structure, compare existing measuring method measuring speed and double；During test, owing to voltage drive 2, voltage swash
Encouraging 3 to be all zeroed out, the voltage on test target 1 and test target 2 is solely dependent upon voltage drive 1, and flows through test target 1 and survey
Electric current in examination target 2 is obtained by current measurement 2 and current measurement 3 respectively, thus can simultaneously measure test target 1 and survey
The impedance of examination target 2, makes ICT test speed double.
Meanwhile, use the structure of this case can be effectively improved the precision of current measurement, in theory for, the survey of desired impedance
Test result is Zdut=Vx/Ix.
Being illustrated in figure 4 the computation model using traditional method, its Zdut=Vm/R_sense*Vi, error results from fortune
The offset:Vx=Vm-Voffset put, Ix=(Vi-Voffset)/Rsense-Ioffset.
Being illustrated in figure 5 the computation model using this case, it have employed symmetrical structure, Vx=(Vf1-to H end and L end
Voffset)-(Vf2-Voffset)=Vf1-Vf2, Ix use high-precision difference measurement, avoid amplifier null offset
The impact that Voffset produces, turn avoid the error that current measurement is brought by amplifier bias current Ioffset so that measure essence
Degree is greatly improved.Simultaneously for require in measuring in many impedances simultaneously L end can not the situation of connecting to neutral point, L end can be adjusted flexibly
Voltage.
It is demonstrated experimentally that this case achieves FCT test and the integration of ICT test, improve test speed (during ICT test
Between reduce 50%), improve measuring accuracy (testing impedance precision by correction can control within 5%), decrease simultaneously
Hardware cost (minimizing 70% compared with general testing scheme), it is achieved that the customization of test equipment, produces at electronic product
In method of testing, it is achieved that great innovation.
The above is only the preferred embodiment of the present invention, it should be pointed out that: for the ordinary skill people of the art
For Yuan, under the premise without departing from the principles of the invention, it is also possible to make some improvements and modifications, these improvements and modifications also should
It is considered as protection scope of the present invention.
Claims (3)
1. the FCT/ICT comprehensive test device customizing electronic product, it is characterised in that: include embedded control platform,
ICT test cell, relay array control module, user customize digital analog I/O relay isolation module and fixture interface, institute
State embedded control platform for inputting control signal, and send control signals to ICT test cell or user customizes numeral
Simulation I/O relay isolation module；
It is corresponding with fixture interface that described relay array control module and user customize digital analog I/O relay isolation module
Input terminal circuit connects；
Described fixture interface is used for clamping test target；
Described ICT test cell realizes being connected with the circuit of test target by relay array control module, fixture interface, right
Test target carries out ICT test, and test result is fed back to embedded control platform；
Described user customizes digital analog I/O relay isolation module and realizes the circuit with test target even by fixture interface
Connect, test target is carried out FCT test, and test result is fed back to embedded control platform；
Described ICT test cell includes three subelements, and the outfan of two of which subelement concatenates a test target respectively
Outfan with the 3rd subelement links together afterwards；Described subelement includes two amplifiers and a sampling resistor, its
In an input of an amplifier be voltage drive end, another input as this subelement outfan and with this
The outfan of amplifier is connected on the two ends of sampling resistor respectively, simultaneously the two ends of this sampling resistor the most respectively with another amplifier
Two inputs be connected, the outfan of this another amplifier is current measurement end.
A kind of FCT/ICT comprehensive test device customizing electronic product the most according to claim 1, it is characterised in that:
Also including industrial computer, described industrial computer realizes communicating with embedded control platform by network.
A kind of FCT/ICT comprehensive test device customizing electronic product the most according to claim 1, it is characterised in that:
Described relay array control module is made up of 8 4*32 low pressure high-speed relay matrixes.
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| CN104049201A (en) * | 2014-06-26 | 2014-09-17 | 珠海格力电器股份有限公司 | Test method, device and system for printed circuit board |
| CN104898011A (en) * | 2015-05-19 | 2015-09-09 | 苏州高新区世纪福科技有限公司 | Raspberry Pi-based automatic open and short circuit measuring device |
| CN105974300A (en) * | 2016-06-14 | 2016-09-28 | 浪潮电子信息产业股份有限公司 | Test method for increasing relay board to improve ICT test coverage rate |
| CN107992031B (en) * | 2017-12-25 | 2024-03-15 | 天航长鹰(江苏)科技有限公司 | FCT test system based on resistance simulation |
| CN110907806A (en) * | 2019-12-12 | 2020-03-24 | 苏州市运泰利自动化设备有限公司 | ICC multifunctional integrated test system |
| CN111175634A (en) * | 2019-12-16 | 2020-05-19 | 珠海博杰电子股份有限公司 | ICT test platform |
| CN113985260A (en) * | 2021-12-06 | 2022-01-28 | 苏州奥特美自动化技术有限公司 | FCT multifunctional matrix test board card |
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| CN101667273A (en) * | 2009-09-27 | 2010-03-10 | 西门子威迪欧汽车电子(惠州)有限公司 | Interlocking and fail-safe method during detection process and system thereof |
| CN102636741A (en) * | 2012-04-27 | 2012-08-15 | 北京星河康帝思科技开发有限公司 | Method and system for testing circuit board |
| CN203037754U (en) * | 2012-11-16 | 2013-07-03 | 苏州工业园区世纪福科技有限公司 | Customized FCT/ICT integrated test device for electronic products |
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| JPH1183925A (en) * | 1997-09-12 | 1999-03-26 | Ishikawajima Harima Heavy Ind Co Ltd | Apparatus and method for environment test to control apparatus |
| KR100408256B1 (en) * | 2001-07-06 | 2003-12-03 | 엘지산전 주식회사 | Apparatus and method of relay test of electronic time switch |
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| CN101667273A (en) * | 2009-09-27 | 2010-03-10 | 西门子威迪欧汽车电子(惠州)有限公司 | Interlocking and fail-safe method during detection process and system thereof |
| CN102636741A (en) * | 2012-04-27 | 2012-08-15 | 北京星河康帝思科技开发有限公司 | Method and system for testing circuit board |
| CN203037754U (en) * | 2012-11-16 | 2013-07-03 | 苏州工业园区世纪福科技有限公司 | Customized FCT/ICT integrated test device for electronic products |
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Address after: 215000 Suzhou high tech Zone, Jiangsu, No. 189 Kunlun Road Patentee after: SIFO TECHNOLOGY (SND) CO., LTD. Address before: Double Road Industrial Park in Suzhou city in Jiangsu province 215121 No. 2 building 12 layer 1-2 Patentee before: SiFO Technology Co., Ltd. |