CN103792441A - Method for testing LED driver - Google Patents
Method for testing LED driver Download PDFInfo
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- CN103792441A CN103792441A CN201210425179.6A CN201210425179A CN103792441A CN 103792441 A CN103792441 A CN 103792441A CN 201210425179 A CN201210425179 A CN 201210425179A CN 103792441 A CN103792441 A CN 103792441A
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Abstract
Provided is a method for testing an LED driver. The method comprises following steps of: a) installing an LED driver test sample in a matched lamp, fully charging the lamp, and testing the anti-electromagnetic interference performance and the charging and discharging performance of the LED driver at a normal temperature condition; b) placing the lamp fully charged in a high-temperature environment, discharging the lamp until the lamp is turned off, observing whether the lamp operating at high temperature is normal and recording discharging time, and then placing the lamp fully charged in a low-temperature environment and discharging the lamp until the lamp is turned off, observing whether the lamp operating at low temperature is normal and recording discharging time; and c) placing the lamp in a normal-temperature environment and fully charging the lamp in order that the lamp operates at maximum power until thermal equilibrium is achieved, and then measuring the operating temperature value of a key heat-unbearable device in the LED driver. The testing method may single out LED drivers with inherent defects in a short time and provide basis for high-quality sample selection in product development.
Description
Technical field
The present invention relates to a kind of method of testing of electronic circuit, relate in particular to a kind of method of testing of LED driver.
Background technology
LED light source has the long-life, can continue to use tens thousand of hours, and the LED driver matching also must be able to use the time of same length.This just requires will take into full account each design link of LED driver in LED Design of Luminaires, comprise the selection from system architecture to the each circuit component as light source carrier, these all directly affect life-span and the failure rate of energy-saving LED light fixture, all electronic circuits of LED lighting are all on drive circuit board, and the material of drive circuit board and processing technology will directly affect quality and the life-span of LED driver.
The effect of LED driver is exactly the power conditioning circuitry that off-line voltage is converted to controlled DC current.LED is current mode LED driver part, and the 1W white light LEDs of 350mA current drives has the forward voltage Vf of 3.0-4.0V conventionally.LED is the PN junction that dynamic resistance is very little, applies the voltage that exceedes tri-times of Vf can cause the magnitude of current uncontrolled to LED.If LED is directly connected on off-line alternating voltage, it can send very bright light, then loses efficacy very soon.Therefore, the quality of LED driver and life-span have determined the quality of a lamp to a great extent.
But in prior art, but do not have a kind of method of testing can test out at short notice the latent defect of LED driver, limit the raising of light fixture global reliability.
Summary of the invention
The technical problem to be solved in the present invention is to overcome the deficiency that above-mentioned prior art exists, and a kind of method of testing of LED driver is proposed, it can test out the latent defect of LED driver at short notice, for light fixture provides good qualified accessory, improves the reliability of light fixture entirety.
For solving the problems of the technologies described above, the present invention proposes a kind of method of testing of LED driver, comprise the steps: step a: under normal temperature condition, LED driver is packed in supporting light fixture, be full of electricity to light fixture, start light fixture and make its work, use an interference source to disturb light fixture, observe light fixture and whether occur extremely, to test the anti-electromagnetic interference performance of LED driver, afterwards, then light fixture is full of to electricity, light fixture is discharged to and extinguishes, record discharge time, and in discharge process, measure the brightness value of light fixture and observe light fixture light every setting-up time whether abnormal, to test the charge and discharge performance of LED driver, step b: will fill, light fixture after discharge test is full of electricity again in normal temperature, then, light fixture is placed in to a hot environment, the temperature that hot environment is set is that light fixture allows the ceiling temperature value using, light fixture is discharged to be extinguished, while observing hot operation, light fixture has or not abnormal and records discharge time, then, light fixture is taken to and in normal temperature, is full of electricity, be placed in a low temperature environment by being full of electric light fixture, the temperature that low temperature environment is set is that light fixture allows the lower-limit temperature value using, light fixture is discharged to be extinguished, while observing low-temperature working, light fixture has or not abnormal and records discharge time, step c: the light fixture after high and low temperature test is got back to normal temperature, be full of electricity to light fixture, make light fixture light work to thermal equilibrium with peak power, in this process, To Be Protected from Heat the temperature value of device in the time of work of the key in setting-up time is measured LED driver.
The method of testing of described LED driver, wherein, in described step a, the step of the anti-electromagnetic interference performance of test LED driver also comprises: before to light fixture charging, whether the various functions that checks light fixture is normal, and, start light fixture be full of electricity to light fixture after before, light fixture is shelved 15 minutes ~ 30 minutes; In the step of the anti-electromagnetic interference performance of test LED driver: use an interference source to disturb light fixture, specifically comprise: use an interference source sentencing different directions interference light fixture apart from light fixture certain distance with different frequency.
The method of testing of described LED driver, wherein, in described step a, the step of the charge and discharge performance of test LED driver also comprises: after light fixture is full of electricity, to before light fixture electric discharge, measure the open-circuit voltage of light fixture battery under full power state.
The method of testing of described LED driver, wherein, in described step b, after light fixture is full of electricity, before light fixture is inserted hot environment, also comprise: light fixture is shelved 15 minutes ~ 30 minutes, measured the open-circuit voltage of light fixture battery under full power state, the various functions that checks light fixture, is placed in closed condition by light fixture; After light fixture is inserted hot environment, test light fixture, before the various functions of the condition of high temperature, also comprises: make light fixture in hot environment, continue insulation 1.5 hours ~ 2.5 hours; Test light fixture specifically comprises at the discharge performance of the condition of high temperature: light fixture is operated under maximum power state and is discharged to and extinguishes, while observing light fixture hot operation, have or not abnormal, record high temperature discharge warning time and discharge time, put after a little finishing and return to normal temperature, inspection lamp has without extremely.
The method of testing of described LED driver, wherein, in described step b, after light fixture is taken to and is full of electricity in normal temperature, before light fixture is inserted to low temperature environment, also comprise: light fixture is shelved in normal temperature 15 minutes ~ 30 minutes, measured the open-circuit voltage of light fixture battery, check light fixture various functions, light fixture is placed in to closed condition; After light fixture is inserted low temperature environment, test light fixture, before the various functions of low-temperature condition, also comprises: make light fixture in low temperature environment, continue insulation 1.5 hours ~ 2.5 hours; Test light fixture specifically comprises at the discharge performance of low-temperature condition: light fixture is operated under maximum power state and is discharged to and extinguishes, while observing light fixture low-temperature working, have or not abnormal, record low temperature discharge warning time and discharge time, put after a little finishing and return to normal temperature, inspection lamp has without extremely.
The method of testing of described LED driver, wherein, in described step c, thermopair in order to measure the instrument of temperature, described thermopair was placed in the LED driver in light fixture light work after light fixture is full of electricity before, and was arranged in each key of driver To Be Protected from Heat on device.
The method of testing of described LED driver, wherein, before described step a, also comprise the normal temperature electric parameters testing step of LED driver: first LED driver is connected with match load, afterwards, give LED driver input rated voltage, whether the various functions that checks LED driver is normal, and LED driver output terminal is carried out to short circuit and open circuit, the voltage and current value while measuring respectively short circuit, open circuit; Then, input respectively these three exemplary voltages values of lower voltage limit, rated voltage and upper voltage limit to LED driver, measure respectively input, the output parameter value of LED driver under three exemplary voltages values, finally, the discharge process of simulation LED driver, make the given voltage of LED driver drop to gradually lower voltage limit from upper voltage limit, measure input, output parameter value under the different electrical voltage points of this process.
The method of testing of described LED driver, wherein, before step a, also comprise the program test step of LED driver: respectively to LED driver input lower voltage limit, these three exemplary voltages values of rated voltage and upper voltage limit, under each exemplary voltages value, with friction speed, LED driver is carried out to switch respectively, observe and have or not deadlock phenomenon in switching process, then, under each exemplary voltages value, make LED driver work in various functional statuses, and under each functional status, carry out switch with different key scrolls, whether observe different switching speeds under every kind of function can get muddled or occur the phenomenon that crashes LED driver program.
The method of testing of described LED driver wherein, also comprised visual inspection step before described step a: under normal temperature, the welding of the apparent size of visual inspection LED driver, mark and electronic devices and components, checks and have or not extremely.
The method of testing of described LED driver, wherein, described visual inspection step also comprises: whether range estimation has in electron device near the heater members device that is laid in that To Be Protected from Heat.
Compared with prior art, the present invention has following beneficial effect: the present invention is mainly by putting into LED driver supporting light fixture, first test through normal temperature, again through high low-temperature test, finally get back to normal temperature test, realize the object that tests out fast at short notice LED driver latent defect, thereby improve light fixture global reliability in use; Secondly, the present invention is also by carrying out the integration tests such as visual inspection, normal temperature electric parameters testing and program test to LED driver, carry out to test comprehensively, reliably the properties of LED driver, for the offering sample foundation of high-quality is selected in product development, for product Incoming Quality Control provides a kind of comprehensive, effective method of inspection, make product after long-term use, still there is higher quality level, meet the long-term demand using of client, also be of value to the reliability that improves product, make product there is the higher market competitiveness simultaneously.
Embodiment
In order to further illustrate principle of the present invention and structure, existing to a preferred embodiment of the present invention will be described in detail.
The method of testing of LED driver of the present invention, is roughly divided into following two steps.
One, visual inspection test.
Choose a collection of LED driver test sample, and be numbered.Under normal temperature, whether the welding of the apparent size of visual inspection LED driver, mark and electronic devices and components, check and have outward appearance abnormal, whether correctly identify, whether electronic devices and components welding has the phenomenon such as rosin joint, short weldering, if any extremely, records and stick defective mark.In when range estimation should also be noted that to observe electron device, whether have near the heater members device that is laid in that To Be Protected from Heat, if had, record, to put on record to follow-up improvement.
Two, upper electrical testing.
Upper electrical testing roughly comprises following three steps.
(1): the normal temperature electrical quantity of test LED driver.
The object of electric parameters testing is: investigate LED driver by the full electric whole course of work to discharging completely of battery.
Normal temperature electric parameters testing concrete steps comprise: LED driver is connected with match load (can be direct-flow voltage regulation source), first, (rated voltage is to determine according to the light fixture battery parameter in LED driver practical application to give LED driver input rated voltage, what light fixture adopted conventionally is lithium battery, the rated voltage of lithium battery is DC3.8v, so rated voltage herein can be DC3.8v), check that whether various functions is normal, and LED driver output terminal is carried out to short circuit and open circuit, measure short circuit, voltage when open circuit, current value, observe short circuit, when open circuit, LED driver has or not extremely, short circuit, after open circuit, again connect again load, whether normally observe LED driver, then, input lower voltage limit, rated voltage and these three exemplary voltages values of upper voltage limit (because the rated voltage of lithium ion battery is 3.8v to LED driver, full piezoelectric voltage is at 4.2v, battery low-voltage is 3.4v, the upper voltage limit that is LED driver work is 4.2v, the lower voltage limit of LED driver work is 3.4v), measure respectively input, the output parameter value of LED driver under three exemplary voltages values, finally, the discharge process of simulation LED driver, make the given voltage of LED driver drop to gradually lower voltage limit from upper voltage limit, in this process, selected upper voltage limit is to the several different electrical voltage point between lower voltage limit, measures input, output parameter value under each different electrical voltage points of this process.Input, output parameter specifically comprise: the relevant electrical quantitys such as input voltage, output voltage, electric current, electric discharge warning voltage, low voltage warning voltage, under-voltage protection voltage, quiescent current.
(2): the program of test LED driver.
The object of LED driver program test is: test the reliability of the Single Chip Microcomputer (SCM) program in LED driver, investigate the adaptability of LED driver program by the switch of different voltage, friction speed.
The concrete steps of LED driver program test comprise: first to LED driver input lower voltage limit, rated voltage and upper voltage limit (DC3.4v, DC3.8v and DC4.2v) these three exemplary voltages values, under each exemplary voltages value, LED driver is carried out to switch respectively, observe and have or not deadlock phenomenon in switching process, then under each exemplary voltages value, make LED driver work in various functional statuses, and under each functional status, carry out switch with different key scrolls, whether observe different switching speeds under every kind of function can get muddled or occur the phenomenon that crashes LED driver program.
(3): the performance of test LED driver in supporting light fixture.
The performance of test LED driver in supporting light fixture mainly comprises following three steps.
Step a: under normal temperature condition, LED driver is carried out to electromagnetic interference (EMI) and charge and discharge test;
The object of anti-Electromagnetic Interference Test is: simulate the electromagnetic interference capability that is subject under the different conditions of LED driver in the time that reality is used.
Anti-Electromagnetic Interference Test concrete steps comprise: LED driver is installed in supporting light fixture, start light fixture, check that whether light fixture various functions is normal, be full of electricity to light fixture with supporting charger, after full electricity, shelve 15 minutes ~ 30 minutes, by light fixture at various functional status (as: high lights, the low light level, the sudden strain of a muscle of exposing to the sun, signal lamp function) lower startup work, use an interference source (interference source can be the intercom that is opened into maximum power state) sentencing different directions interference light fixture apart from light fixture 10cm about 1 minute with different frequency, whether observe light fixture there will be light dimmed, extinguish, flickers etc. are abnormal.
The object of normal temperature charge-discharge test is: investigate LED driver and be contained in the normal temperature charge and discharge performance on supporting light fixture, the parameter of monitoring light fixture discharge process under different condition, by the variation of same range points brightness value in monitoring discharge process, investigate the constant current performance of LED driver.
Normal temperature charge-discharge test concrete steps comprise: first measure the open-circuit voltage of light fixture under battery full power state, in the time measuring open-circuit voltage, if light fixture can show open-circuit voltage and can directly read open-circuit voltage numerical value, if light fixture is to show that by electric weight number of times reflects the approximate range value of open-circuit voltage, the demonstration number of times that also can record electric weight roughly reflects open-circuit voltage; Afterwards; light fixture is discharged until light fixture protection is extinguished; record discharge time and electric discharge warning time (if any the record of light fixture of low voltage warning function; without need not recording of this function); and measure apart from the brightness value of light fixture a distance every setting-up time in discharge process, and monitor discharge process light fixture light and have flicker free, shake etc. abnormal.The distance that brightness value is measured is decided by the size of illuminance of lamp value, and the distance of conventionally measuring brightness value can be set as apart from 2 meters of of light fixture.Measuring the setting-up time interval of brightness value is chosen by length discharge time of light fixture, conventionally, for the light fixture that is less than or equal to 10 hours discharge time, measure the setting-up time interval of brightness value be chosen for 1 hour (as: record electric discharge initial time, 1 hour, 2 hours, 3 hours.。。。。。Brightness value till extinguishing to protection); For the light fixture that is greater than 10 hours discharge time, measure the setting-up time interval of brightness value can be chosen for 2 hours (as: record electric discharge initial time, 2 hours, 4 hours, 6 hours.。。。。。Brightness value till extinguishing to protection); For having the light fixture of taper function (if LED driver has electric current taper function in discharge process, the electric current of light fixture in discharge process can change from big to small gradually), also can be in initial one hour of discharge process, make the setting-up time interval of measuring brightness value choose shortlyer,, (as: record electric discharge initial time, 15 minutes, 30 minutes, 1 hour, 2 hours, 3 hours.。。。。。Brightness value till extinguishing to protection).
Step b: under high and low temperature environment, LED driver is carried out to function and charge and discharge test respectively.
Whether the object of high temperature performance test is: investigate the performance of LED driver under the high and low temperature environment allowing and meet the demands.
High temperature performance test concrete steps comprise: first the light fixture after normal temperature charge-discharge test is full of to electricity in normal temperature, shelves a period of time (can be 15 minutes ~ 30 minutes), measure the open-circuit voltage of light fixture under battery full power state, check light fixture various functions, then, light fixture is inserted in high-low temperature test chamber in off position, it is light fixture maximum permisible service temperature value (can be 40 ℃ ± 3 ℃) that chamber temperature is set, after reaching light fixture maximum permisible service temperature value, temperature continues insulation 2 hours, check and whether record the each function of light fixture normal, afterwards, starting light fixture makes it under peak power (high light) state, be discharged to and extinguish, while observing hot operation, light has or not extremely, record high temperature discharge warning time and discharge time, the high temperature discharge time is answered 90% of Da Changwen equal state discharge time, just meet the demands, carry out follow-up improvement otherwise need put on record, after high temperature discharge, return to normal temperature, inspection lamp has without abnormal, if had extremely, judge that light fixture is defective, then, after treating high temperature test, light fixture is taken under normal temperature and is full of electricity, shelve a period of time (can be 15 minutes ~ 30 minutes), measure battery open circuit voltage, check light fixture various functions, light fixture is placed in to high-low temperature test chamber in off position, and it is the minimum permission serviceability temperature of light fixture (can be-20 ℃ ± 3 ℃) that chamber temperature is set, after temperature reaches minimum permission serviceability temperature, continue insulation 2 hours, check and whether record light fixture various functions normal, finally, starting light fixture makes it under peak power (high light) state, be discharged to and extinguish, while observing low-temperature working, light has or not extremely, record low temperature discharge warning time and discharge time, the low temperature discharge time should reach 60% of normal temperature equal state discharge time, just meets the demands, otherwise need are put on record and carried out follow-up improvement, after low temperature discharge, return to normal temperature, inspection lamp has without abnormal, if had extremely, judges that light fixture is defective.
Step c: under normal temperature condition, the temperature value of the key of test in LED driver To Be Protected from Heat device.
The object of the temperature value of the key of test in LED driver To Be Protected from Heat device is: the device temperature value of investigating when LED driver is contained in supporting light fixture work that To Be Protected from Heat, and the temperature surplus of the device that calculates that To Be Protected from Heat, and then investigate its reliability.
The concrete steps of To Be Protected from Heat the device temperature of the key in LED driver test comprise: by height, light fixture after low-temperature test gets back in normal temperature, be full of electricity to light fixture with supporting charger, light fixture is placed in to calm environment, with the harshest user to placing, light fixture is adjusted to peak power (high light), lighting light fixture makes its work to thermal equilibrium, light to thermal equilibrium and measure each key To Be Protected from Heat device (as: power tube every setting-up time during this period of time at light fixture, inductance, electric capacity, IC, transformer etc.) temperature value, as: record 1 hour, 2 hours, 3 hours, 4 hours to thermal equilibrium interior each device temperature value during this period of time, extrapolate the temperature surplus of crucial To Be Protected from Heat the device of LED driver when the work (as: concerning general electrochemical capacitor by the specified heatproof value of surveyed device, 105 ℃ of its minimum heatproofs, this minimum heatproof is deducted to the actual temperature value recording of electrochemical capacitor and is the temperature surplus of electrochemical capacitor, this temperature surplus is larger, heat resistance is just better, reliability is just higher), judge that the temperature surplus of respectively To Be Protected from Heat device is whether in the temperature usable range allowing, and infer thus the heat resistance of whole LED driver.
The temperature value of the each key of said determination To Be Protected from Heat device, both can adopt non-contact testing instrument to measure, and also can adopt contact testing tool to measure.In the present embodiment, its testing tool adopting is contact instrument: thermopair.Thermopair before be full of electricity to light fixture after, also light fixture is lighted work, is loaded in the LED driver in light fixture.When assembling, first light fixture is taken apart, multiple thermopairs are arranged in to each key of LED driver To Be Protected from Heat on device, more again install light fixture.
So far just completed the whole test process of the LED driver of the present embodiment.
It should be noted that, the method of testing of LED driver of the present invention is mainly by LED driver being put into supporting light fixture, the first test of the normal temperature in step a, height in step b again, low-temperature test, test finally by the normal temperature of getting back in step c, realize the object that tests out fast at short notice LED driver latent defect, by step a, visual inspection step outside step b and step c, normal temperature electric parameters testing step and program test step etc., can more fully test out the properties of LED driver, for the more offering sample foundation of high-quality is selected in product development.
These are only better possible embodiments of the present invention, not limit the scope of the invention, in other embodiments, other steps except step a, step b and step c also can be saved.The equivalent structure that all utilizations description of the present invention has been done changes, and is all included in protection scope of the present invention.
Claims (10)
1. a method of testing for LED driver, is characterized in that, comprises the steps:
Step a: under normal temperature condition, LED driver is packed in supporting light fixture, be full of electricity to light fixture, start light fixture and make its work, use an interference source to disturb light fixture, observe light fixture and whether occur extremely, to test the anti-electromagnetic interference performance of LED driver; Afterwards, then light fixture is full of to electricity, light fixture is discharged to and extinguishes, record discharge time, and in discharge process, measure the brightness value of light fixture and observe light fixture light every setting-up time whether abnormal, to test the charge and discharge performance of LED driver;
Step b: will fill, light fixture after discharge test is full of electricity again in normal temperature, then, light fixture is placed in to a hot environment, the temperature that hot environment is set is that light fixture allows the ceiling temperature value using, light fixture is discharged to be extinguished, while observing hot operation, light fixture has or not abnormal and records discharge time, then, light fixture is taken to and in normal temperature, is full of electricity, be placed in a low temperature environment by being full of electric light fixture, the temperature that low temperature environment is set is that light fixture allows the lower-limit temperature value using, light fixture is discharged to be extinguished, while observing low-temperature working, light fixture has or not abnormal and records discharge time,
Step c: the light fixture after high and low temperature test is got back to normal temperature, be full of electricity to light fixture, make light fixture light work to thermal equilibrium with peak power, in this process, To Be Protected from Heat the temperature value of device in the time of work of the key in setting-up time is measured LED driver.
2. the method for testing of LED driver as claimed in claim 1, it is characterized in that, in described step a, the step of the anti-electromagnetic interference performance of test LED driver also comprises: before to light fixture charging, whether the various functions that checks light fixture is normal, and, start light fixture be full of electricity to light fixture after before, light fixture is shelved 15 minutes ~ 30 minutes; In the step of the anti-electromagnetic interference performance of test LED driver: use an interference source to disturb light fixture, specifically comprise: use an interference source sentencing different directions interference light fixture apart from light fixture certain distance with different frequency.
3. the method for testing of LED driver as claimed in claim 1, it is characterized in that, in described step a, the step of the charge and discharge performance of test LED driver also comprises: after light fixture is full of electricity, to before light fixture electric discharge, measure the open-circuit voltage of light fixture battery under full power state.
4. the method for testing of LED driver as claimed in claim 1, it is characterized in that, in described step b, after light fixture is full of electricity, before light fixture is inserted hot environment, also comprise: light fixture is shelved 15 minutes ~ 30 minutes, measured the open-circuit voltage of light fixture battery under full power state, the various functions that checks light fixture, is placed in closed condition by light fixture; After light fixture is inserted hot environment, test light fixture, before the various functions of the condition of high temperature, also comprises: make light fixture in hot environment, continue insulation 1.5 hours ~ 2.5 hours; Test light fixture specifically comprises at the discharge performance of the condition of high temperature: light fixture is operated under maximum power state and is discharged to and extinguishes, while observing light fixture hot operation, have or not abnormal, record high temperature discharge warning time and discharge time, put after a little finishing and return to normal temperature, inspection lamp has without extremely.
5. the method for testing of LED driver as claimed in claim 1, it is characterized in that, in described step b, after light fixture is taken to and is full of electricity in normal temperature, before light fixture is inserted to low temperature environment, also comprise: light fixture is shelved in normal temperature 15 minutes ~ 30 minutes, measured the open-circuit voltage of light fixture battery, check light fixture various functions, light fixture is placed in to closed condition; After light fixture is inserted low temperature environment, test light fixture, before the various functions of low-temperature condition, also comprises: make light fixture in low temperature environment, continue insulation 1.5 hours ~ 2.5 hours; Test light fixture specifically comprises at the discharge performance of low-temperature condition: light fixture is operated under maximum power state and is discharged to and extinguishes, while observing light fixture low-temperature working, have or not abnormal, record low temperature discharge warning time and discharge time, put after a little finishing and return to normal temperature, inspection lamp has without extremely.
6. the method for testing of LED driver as claimed in claim 1, it is characterized in that, in described step c, thermopair in order to measure the instrument of temperature, before described thermopair is lighted work after light fixture is full of electricity, be placed in the LED driver in light fixture, and be arranged in each key of driver To Be Protected from Heat on device.
7. the method for testing of LED driver as claimed in claim 1, it is characterized in that, before described step a, also comprise the normal temperature electric parameters testing step of LED driver: first LED driver is connected with match load, afterwards, give LED driver input rated voltage, whether the various functions that checks LED driver is normal, and LED driver output terminal is carried out to short circuit and open circuit, the voltage and current value while measuring respectively short circuit, open circuit; Then, input respectively these three exemplary voltages values of lower voltage limit, rated voltage and upper voltage limit to LED driver, measure respectively input, the output parameter value of LED driver under three exemplary voltages values, finally, the discharge process of simulation LED driver, make the given voltage of LED driver drop to gradually lower voltage limit from upper voltage limit, measure input, output parameter value under the different electrical voltage points of this process.
8. the method for testing of LED driver as claimed in claim 1, it is characterized in that, before step a, also comprise the program test step of LED driver: respectively to LED driver input lower voltage limit, these three exemplary voltages values of rated voltage and upper voltage limit, under each exemplary voltages value, with friction speed, LED driver is carried out to switch respectively, observe and have or not deadlock phenomenon in switching process, then, under each exemplary voltages value, make LED driver work in various functional statuses, and under each functional status, carry out switch with different key scrolls, whether observe different switching speeds under every kind of function can get muddled or occur the phenomenon that crashes LED driver program.
9. the method for testing of LED driver as claimed in claim 1, is characterized in that, also comprises visual inspection step before described step a: under normal temperature, the welding of the apparent size of visual inspection LED driver, mark and electronic devices and components, checks and have or not extremely.
10. the method for testing of LED driver as claimed in claim 9, is characterized in that, described visual inspection step also comprises: whether range estimation has in electron device near the heater members device that is laid in that To Be Protected from Heat.
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| CN201210425179.6A CN103792441A (en) | 2012-10-31 | 2012-10-31 | Method for testing LED driver |
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| CN201210425179.6A CN103792441A (en) | 2012-10-31 | 2012-10-31 | Method for testing LED driver |
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Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN107402133A (en) * | 2017-07-21 | 2017-11-28 | 芜湖赛宝机器人产业技术研究院有限公司 | A kind of Novel industrial robot servo-driver Performance Test System and test method |
| CN109959851A (en) * | 2019-03-25 | 2019-07-02 | 江苏聚润硅谷新材料科技有限公司 | It is a kind of for detecting the technique of luminous diode temperature |
-
2012
- 2012-10-31 CN CN201210425179.6A patent/CN103792441A/en active Pending
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN107402133A (en) * | 2017-07-21 | 2017-11-28 | 芜湖赛宝机器人产业技术研究院有限公司 | A kind of Novel industrial robot servo-driver Performance Test System and test method |
| CN107402133B (en) * | 2017-07-21 | 2019-08-23 | 芜湖赛宝机器人产业技术研究院有限公司 | A kind of Novel industrial robot servo-driver Performance Test System and test method |
| CN109959851A (en) * | 2019-03-25 | 2019-07-02 | 江苏聚润硅谷新材料科技有限公司 | It is a kind of for detecting the technique of luminous diode temperature |
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Application publication date: 20140514 |