CN103731135B - A kind of discrete magnitude Acquisition Circuit with self-checking function - Google Patents
A kind of discrete magnitude Acquisition Circuit with self-checking function Download PDFInfo
- Publication number
- CN103731135B CN103731135B CN201310598259.6A CN201310598259A CN103731135B CN 103731135 B CN103731135 B CN 103731135B CN 201310598259 A CN201310598259 A CN 201310598259A CN 103731135 B CN103731135 B CN 103731135B
- Authority
- CN
- China
- Prior art keywords
- resistance
- semiconductor
- oxide
- metal
- resistor
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Landscapes
- Semiconductor Integrated Circuits (AREA)
Abstract
The present invention discloses a kind of discrete magnitude Acquisition Circuit with self-checking function, is mainly made of a bleeder circuit unit A1, a comparison circuit unit A2, a reference voltage output circuit unit A3, the protection of a reference voltage control circuit unit A4 and one circuit unit A5.Advantages of the present invention：Circuit structure is simple, can not only effectively acquire discrete signal, also have the function of circuitry self test, can quickly position the problem in circuit, testability with higher, maintainability.
Description
Technical field
The present invention relates to a kind of discrete magnitude Acquisition Circuits, acquire more particularly, to a kind of discrete magnitude with self-checking function
Circuit.
Background technique
Discrete magnitude acquisition mainly realize low/open, high/opens ,/acquisition of high discrete signal.It is existing to be adopted using discrete magnitude
The devices such as digital quantity chip acquisition discrete signal is turned using phase inverter, comparator, optocoupler, discrete magnitude in collector, only realize from
Amount acquisition function is dissipated, circuit is without self-checking function.The quick positioning that goes wrong in discrete magnitude Acquisition Circuit can not be tested
Property, maintainability are lower.
Summary of the invention
The purpose of the present invention is to deficiency in the prior art, a kind of discrete magnitude with self-checking function is provided and is adopted
Collector.
To achieve the goals above, the technical proposal of the invention is realized in this way：It is a kind of with self-checking function from
Amount Acquisition Circuit is dissipated, including,
One reference voltage output circuit unit, by a reference voltage chip U1, a 3rd resistor R3, one the 4th resistance
R4, one the 7th resistance R7, one first metal-oxide-semiconductor Q1 and one the 4th metal-oxide-semiconductor Q4 composition, the 7th resistance R7 first terminate the first power supply
VCC1, the 7th resistance R7 second end connect cathode terminal and the 4th metal-oxide-semiconductor Q4 drain electrode of reference voltage chip U1 respectively, this
Four metal-oxide-semiconductor Q4 source levels connect the 4th resistance R4 first end, and the 4th resistance R4 second end connects 3rd resistor R3 first end respectively
With the reference end of reference voltage chip U1,3rd resistor R3 second terminates the first metal-oxide-semiconductor Q1 drain electrode, first metal-oxide-semiconductor
Q1 source electrode ground connection；
One reference voltage control circuit unit, by a first resistor R1, one the 6th resistance R6, one second metal-oxide-semiconductor Q2 and
One third metal-oxide-semiconductor Q3 composition, first resistor R1 first terminate the first power supply VCC1, and first resistor R1 second end connects this respectively
Second metal-oxide-semiconductor Q2 drain electrode and the first metal-oxide-semiconductor Q1 grid, the second metal-oxide-semiconductor Q2 source electrode ground connection, the second metal-oxide-semiconductor Q2 grid are straight
The first end I/O of processor CPU is connect or connects by a second resistance R2, the 6th resistance R6 first terminates the first power supply VCC1,
6th resistance R6 second end connects third metal-oxide-semiconductor Q3 drain electrode and the 4th metal-oxide-semiconductor Q4 grid, the third metal-oxide-semiconductor Q3 source electrode respectively
Ground connection, the third metal-oxide-semiconductor Q3 grid connect the 2nd end I/O of processor CPU directly or by one the 5th resistance R5；
One comparison circuit unit is made of a comparator U2A and one the 8th resistance R8, and comparator U2A first is inputted
The 4th metal-oxide-semiconductor Q4 drain electrode is terminated, which connects the third of the 8th resistance R8 first end and processor CPU respectively
The end I/O, the 8th resistance R8 second terminate second source VCC2；
One bleeder circuit unit is made of one the 9th resistance R9,1 the tenth resistance R10 and an eleventh resistor R11, should
9th resistance R9 first terminates the first power supply VCC1, and the tenth resistance R10 first terminates a discrete magnitude input signal end DISC_
IN, eleventh resistor R11 first end ground connection, the 9th resistance R9 second end, the tenth resistance R10 second end, eleventh resistor
R11 second end all connects the comparator the second input terminal of U2A, and,
One protection circuit unit, be made of one first voltage-stabiliser tube D1 and a first capacitor C1, the first voltage-stabiliser tube D1 and
One end is connect with second input terminal of comparator after first capacitor C1 is in parallel, other end ground connection.
Further, should compared with device U2A select LM139, reference voltage chip U1 select TL431, first to fourth metal-oxide-semiconductor Q1~
Q4 selects 2N7002, and first and second, five, six, eight resistance R1, R2, R5, R6, R8 resistance values select 10k Ω, the 4th resistance R4 resistance
Value selection 2k Ω, 3rd resistor R3 resistance value selection 1.5k Ω, the selection of the 7th resistance R7 resistance value 1k, the 9th to 11 resistance R9,
It is+15VDC that R10, R11 resistance value, which select 39k Ω, the first power supply VCC1, and second source VCC2 is+3.3VDC, the first voltage-stabiliser tube
D1 selects BZV55-C15, and first capacitor C1 capacitance is 50V100nf.
Compared with prior art, advantages of the present invention：Circuit structure is simple, can not only effectively acquire discrete signal, also
Have the function of circuitry self test, can quickly position the problem in circuit, testability, maintainability are higher, convenient and reliable.
Detailed description of the invention
Fig. 1 is electrical block diagram of the invention.
Specific embodiment
It elaborates with reference to the accompanying drawings and examples to the present invention.
Referring to Figure 1, shown in figure is a kind of discrete magnitude Acquisition Circuit with self-checking function, mainly by a partial pressure
Circuit unit A1, a comparison circuit unit A2, a reference voltage output circuit unit A3, a reference voltage control circuit unit A4
With a protection circuit unit A5 composition.
The reference voltage output circuit unit A3 by a reference voltage chip U1, a 3rd resistor R3, one the 4th resistance R4,
One the 7th resistance R7, one first metal-oxide-semiconductor Q1 and one the 4th metal-oxide-semiconductor Q4 composition, the 7th resistance R7 first terminate the first power supply
VCC1, the 7th resistance R7 second end connect cathode terminal and the 4th metal-oxide-semiconductor Q4 drain electrode of reference voltage chip U1 respectively, this
Four metal-oxide-semiconductor Q4 source levels connect the 4th resistance R4 first end, and the 4th resistance R4 second end connects 3rd resistor R3 first end respectively
With the reference end of reference voltage chip U1,3rd resistor R3 second terminates the first metal-oxide-semiconductor Q1 drain electrode, first metal-oxide-semiconductor
Q1 source electrode ground connection.
The reference voltage control circuit unit A4 is by a first resistor R1, one the 6th resistance R6, one second metal-oxide-semiconductor Q2 and one
Third metal-oxide-semiconductor Q3 composition, first resistor R1 first terminate the first power supply VCC1, first resistor R1 second end connect respectively this
Two metal-oxide-semiconductor Q2 drain electrode and the first metal-oxide-semiconductor Q1 grid, the second metal-oxide-semiconductor Q2 source electrode ground connection, the second metal-oxide-semiconductor Q2 grid pass through
One second resistance R2 connects the first end I/O of processor CPU, and the 6th resistance R6 first terminates the first power supply VCC1, the 6th electricity
Resistance R6 second end connects third metal-oxide-semiconductor Q3 drain electrode and the 4th metal-oxide-semiconductor Q4 grid respectively, and third metal-oxide-semiconductor Q3 source electrode ground connection, this
Three metal-oxide-semiconductor Q3 grids connect the 2nd end I/O of processor CPU by one the 5th resistance R5.
The comparison circuit unit A2 is made of a comparator U2A and one the 8th resistance R8, comparator U2A positive input termination
4th metal-oxide-semiconductor Q4 drain electrode, the comparator output terminal connect the 8th resistance R8 first end and the 3rd I/O of processor CPU respectively
End, the 8th resistance R8 second terminate second source VCC2.
The bleeder circuit unit A1 is made of one the 9th resistance R9,1 the tenth resistance R10 and an eleventh resistor R11, should
9th resistance R9 first terminates the first power supply VCC1, and the tenth resistance R10 first terminates a discrete magnitude input signal end DISC_
IN, eleventh resistor R11 first end ground connection, the 9th resistance R9 second end, the tenth resistance R10 second end, eleventh resistor
R11 second end all connects the comparator the second input terminal of U2A.
The protection circuit unit A5 is made of one first voltage-stabiliser tube D1 and a first capacitor C1, the first voltage-stabiliser tube D1 and
One end is connect with comparator U2A negative input end after one capacitor C1 is in parallel, other end ground connection.
Wherein, LM139, reference voltage chip U1 should be selected to select TL431 compared with device U2A（Reference voltage is 2.5V）, first
2N7002 is selected to four metal-oxide-semiconductor Q1~Q4, first and second, five, six, eight resistance R1, R2, R5, R6, R8 resistance values select 10k
Ω, the 4th resistance R4 resistance value select 2k Ω, 3rd resistor R3 resistance value select 1.5k Ω, the 7th resistance R7 resistance value select 1k, the 9th
39k Ω is selected to 11 resistance R9, R10, R11 resistance values, the first power supply VCC1 is+15VDC, second source VCC2 is+
3.3VDC, the first voltage-stabiliser tube D1 select BZV55-C15, and first capacitor C1 capacitance is 50V100nf, the city above-mentioned electronic component Dou Wei
Sell product.
When locality/ON signal is open circuit, comparator U2A negative input end（4 feet）Voltage is+7.5V, when the of processor CPU
One, when two ends I/O are low level, second and third metal-oxide-semiconductor Q2, Q3 are closed, and first, fourth metal-oxide-semiconductor Q1, Q4 conducting, comparator U2A is just
Input terminal（5 feet）Reference voltage Vref be (2/1.5+1) × 2.5=5.83V, comparator U2A positive input terminal voltage is less than at this time
Negative input end voltage, output are low level, and the 3rd end I/O of processor CPU is low level.
When discrete signal input voltage V1 is less than 2.49V, comparator U2A negative input end voltage (15+V1)/3 is less than
5.83V, comparator U2A output at this time is open circuit, and after 10k pulls up 3.3V, the 3rd end I/O is high level, completes measures of dispersion
According to acquisition.
When needing self-test, high level is set at the first end I/O, the second metal-oxide-semiconductor Q2 conducting, the first metal-oxide-semiconductor Q1 are closed, by second
The end I/O sets low level, and third metal-oxide-semiconductor Q3 is closed, the 4th metal-oxide-semiconductor Q4 is connected, and outputting reference voltage Vref is 2.5V, comparator
U2A positive input terminal voltage is less than negative input end voltage, exports as low level, i.e. the 3rd end I/O is low level.Then by first,
Two ends I/O are set to high level, third metal-oxide-semiconductor Q3 conducting, and the 4th metal-oxide-semiconductor Q4 is closed；First end I/O is set to low level, second
Metal-oxide-semiconductor Q2 is closed, and the first metal-oxide-semiconductor Q1 conducting, a reference source outputting reference voltage Vref is 15V, and comparator positive input terminal voltage is big
In negative input end voltage, the 3rd end I/O is high level, realizes the self-checking function of discrete magnitude Acquisition Circuit.
In circuit, the first voltage-stabiliser tube D1 prevents signal end undershoot voltage-contrast compared with the influence of device U2A, and first capacitor C1 can
Filtering clutter and spike interference.
This discrete signal Acquisition Circuit with self-checking function be equally applicable to it is high/open discrete signal acquisition, only need to configure
The height with self-checking function/open or ground/high RST can be realized in resistance value in bleeder circuit, the voltage for adjusting reference voltage Vref
Acquisition Circuit.
Embodiments of the present invention are only expressed above, and the description thereof is more specific and detailed, but can not therefore understand
For the limitation to patent of invention range.It should be pointed out that for those of ordinary skill in the art, not departing from this hair
Under the premise of bright design, various modifications and improvements can be made, and these are all within the scope of protection of the present invention.Therefore, this hair
The scope of protection shall be subject to the appended claims for bright patent.
Claims (3)
1. a kind of discrete magnitude Acquisition Circuit with self-checking function, which is characterized in that including,
One reference voltage output circuit unit, by a reference voltage chip U1, a 3rd resistor R3, one the 4th resistance R4, one
7th resistance R7, one first metal-oxide-semiconductor Q1 and one the 4th metal-oxide-semiconductor Q4 composition, the 7th resistance R7 first terminate the first power supply VCC1,
7th resistance R7 second end meets cathode terminal and the 4th metal-oxide-semiconductor Q4 drain electrode of reference voltage chip U1, the 4th MOS respectively
Pipe Q4 source level connects the 4th resistance R4 first end, and the 4th resistance R4 second end connects 3rd resistor R3 first end and the base respectively
The reference end of quasi- voltage chips U1,3rd resistor R3 second terminate the first metal-oxide-semiconductor Q1 drain electrode, the first metal-oxide-semiconductor Q1 source electrode
Ground connection；
One reference voltage control circuit unit, by a first resistor R1, one the 6th resistance R6, one second metal-oxide-semiconductor Q2 and 1
Three metal-oxide-semiconductor Q3 composition, first resistor R1 first terminate the first power supply VCC1, first resistor R1 second end connect respectively this second
Metal-oxide-semiconductor Q2 drain electrode and the first metal-oxide-semiconductor Q1 grid, the second metal-oxide-semiconductor Q2 source electrode ground connection, the second metal-oxide-semiconductor Q2 grid directly or
Connect the first end I/O of processor CPU by a second resistance R2, the 6th resistance R6 first terminates the first power supply VCC1, this
Six resistance R6 second ends connect third metal-oxide-semiconductor Q3 drain electrode and the 4th metal-oxide-semiconductor Q4 grid respectively, which is grounded,
The third metal-oxide-semiconductor Q3 grid connects the 2nd end I/O of processor CPU directly or by one the 5th resistance R5；
One comparison circuit unit is made of a comparator U2A and one the 8th resistance R8, and comparator U2A first input end connects
4th metal-oxide-semiconductor Q4 drain electrode, the comparator output terminal connect the 8th resistance R8 first end and the 3rd I/O of processor CPU respectively
End, the 8th resistance R8 second terminate second source VCC2；And
One bleeder circuit unit is made of, the 9th one the 9th resistance R9,1 the tenth resistance R10 and an eleventh resistor R11
The first power supply of termination of resistance R9 first VCC1, the tenth resistance R10 first terminate a discrete magnitude input signal end DISC_IN, should
Eleventh resistor R11 first end ground connection, the 9th resistance R9 second end, the tenth resistance R10 second end, eleventh resistor R11 the
Two ends all connect the comparator the second input terminal of U2A.
2. a kind of discrete magnitude Acquisition Circuit with self-checking function according to claim 1, which is characterized in that further include
One protection circuit unit, is made of, the first voltage-stabiliser tube D1 and first capacitor one first voltage-stabiliser tube D1 and a first capacitor C1
One end is connect with second input terminal of comparator after C1 is in parallel, other end ground connection.
3. a kind of discrete magnitude Acquisition Circuit with self-checking function according to claim 1 or 2, which is characterized in that should
Comparator U2A selects LM139, reference voltage chip U1 that TL431, first to fourth metal-oxide-semiconductor Q1~Q4 is selected to select 2N7002, the
One, two, five, six, eight resistance R1, R2, R5, R6, R8 resistance values select 10k Ω, and the 4th resistance R4 resistance value selects 2k Ω, third electricity
It hinders R3 resistance value and selects 1.5k Ω, the 7th resistance R7 resistance value selects 1k Ω, and the 9th to 11 resistance R9, R10, R11 resistance values are selected
39k Ω, the first power supply VCC1 are+15VDC, and second source VCC2 is+3.3VDC.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201310598259.6A CN103731135B (en) | 2013-11-25 | 2013-11-25 | A kind of discrete magnitude Acquisition Circuit with self-checking function |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201310598259.6A CN103731135B (en) | 2013-11-25 | 2013-11-25 | A kind of discrete magnitude Acquisition Circuit with self-checking function |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN103731135A CN103731135A (en) | 2014-04-16 |
| CN103731135B true CN103731135B (en) | 2018-11-27 |
Family
ID=50455086
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201310598259.6A Active CN103731135B (en) | 2013-11-25 | 2013-11-25 | A kind of discrete magnitude Acquisition Circuit with self-checking function |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN103731135B (en) |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN110542848B (en) * | 2019-09-20 | 2021-07-20 | 天津津航计算技术研究所 | Discrete magnitude acquisition power-on BIT self-detection circuit based on micro relay |
| CN112098762A (en) * | 2020-09-22 | 2020-12-18 | 陕西千山航空电子有限责任公司 | Discrete switching value acquisition and detection circuit |
Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101111103A (en) * | 2007-08-08 | 2008-01-23 | 常州美欧电子有限公司 | Digital microphone parameter measuring system |
| CN201315017Y (en) * | 2008-12-12 | 2009-09-23 | 中国科学院沈阳自动化研究所 | Data acquisition device |
| CN101750987A (en) * | 2008-12-12 | 2010-06-23 | 中国科学院沈阳自动化研究所 | Analog quantity and digital quantity data acquisition device and method |
| CN203645647U (en) * | 2013-11-25 | 2014-06-11 | 上海航空电器有限公司 | Discrete magnitude collection circuit with self-test function |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US9406036B2 (en) * | 2009-04-24 | 2016-08-02 | Rockwell Automation Technologies, Inc. | Discrete energy assignments for manufacturing specifications |
-
2013
- 2013-11-25 CN CN201310598259.6A patent/CN103731135B/en active Active
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101111103A (en) * | 2007-08-08 | 2008-01-23 | 常州美欧电子有限公司 | Digital microphone parameter measuring system |
| CN201315017Y (en) * | 2008-12-12 | 2009-09-23 | 中国科学院沈阳自动化研究所 | Data acquisition device |
| CN101750987A (en) * | 2008-12-12 | 2010-06-23 | 中国科学院沈阳自动化研究所 | Analog quantity and digital quantity data acquisition device and method |
| CN203645647U (en) * | 2013-11-25 | 2014-06-11 | 上海航空电器有限公司 | Discrete magnitude collection circuit with self-test function |
Also Published As
| Publication number | Publication date |
|---|---|
| CN103731135A (en) | 2014-04-16 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN103063979B (en) | Load open-circuit detection circuit | |
| CN203811727U (en) | Device for detecting commercial power | |
| CN103731135B (en) | A kind of discrete magnitude Acquisition Circuit with self-checking function | |
| CN203204062U (en) | Comparator-based voltage signal detection circuit | |
| CN200976023Y (en) | CMOS battery voltage detecting circuit | |
| CN203645647U (en) | Discrete magnitude collection circuit with self-test function | |
| CN203117295U (en) | Resistance value detection circuit and device | |
| CN104034956A (en) | Positive/negative voltage measuring circuit | |
| CN203385803U (en) | Novel super capacitor detection circuit | |
| CN210037952U (en) | Detection circuit, chip and electronic equipment of load current direction | |
| CN110456141A (en) | A kind of flash over-current detection circuit and its method | |
| CN203455403U (en) | Battery voltage detection circuit based on Zener diode | |
| CN204836131U (en) | Effective switch input signal acquisition circuit of high level | |
| CN204302445U (en) | A kind of rectifying device testing arrangement reverse recovery time | |
| CN204330872U (en) | The load voltage testing circuit of current zero-crossing point testing circuit and correspondence | |
| CN103336204B (en) | A kind of voltage type super capacitor detection circuit | |
| CN104596599B (en) | Excitation high pressure automatic control device | |
| CN103163358A (en) | Fast and reliable alternative current power failure detection circuit | |
| CN203929854U (en) | Voltage magnitude testing circuit | |
| CN209526657U (en) | A kind of slope control circuit | |
| CN204157132U (en) | Load voltage testing circuit | |
| CN208707546U (en) | Constant current output control circuit | |
| CN203606422U (en) | Zero-crossing detection circuit | |
| CN203287424U (en) | Surge current testing device | |
| CN203643520U (en) | Optoelectronic coupler fault detector |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C06 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| GR01 | Patent grant | ||
| GR01 | Patent grant |