CN103698068B - 一种静电卡盘基本性能检测装置及其检测方法 - Google Patents
一种静电卡盘基本性能检测装置及其检测方法 Download PDFInfo
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- CN103698068B CN103698068B CN201310656962.8A CN201310656962A CN103698068B CN 103698068 B CN103698068 B CN 103698068B CN 201310656962 A CN201310656962 A CN 201310656962A CN 103698068 B CN103698068 B CN 103698068B
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- 238000001514 detection method Methods 0.000 title claims abstract description 12
- 230000003068 static effect Effects 0.000 claims abstract description 45
- 238000000034 method Methods 0.000 claims abstract description 27
- 238000005259 measurement Methods 0.000 claims abstract description 11
- 238000003795 desorption Methods 0.000 claims description 15
- 238000010521 absorption reaction Methods 0.000 claims description 12
- 238000002474 experimental method Methods 0.000 claims description 12
- 238000007789 sealing Methods 0.000 claims description 9
- 241000486406 Trachea Species 0.000 claims description 6
- 210000003437 trachea Anatomy 0.000 claims description 6
- 238000007664 blowing Methods 0.000 claims description 5
- 239000013078 crystal Substances 0.000 claims description 4
- 238000009413 insulation Methods 0.000 claims description 4
- 238000005086 pumping Methods 0.000 claims description 4
- FGUUSXIOTUKUDN-IBGZPJMESA-N C1(=CC=CC=C1)N1C2=C(NC([C@H](C1)NC=1OC(=NN=1)C1=CC=CC=C1)=O)C=CC=C2 Chemical compound C1(=CC=CC=C1)N1C2=C(NC([C@H](C1)NC=1OC(=NN=1)C1=CC=CC=C1)=O)C=CC=C2 FGUUSXIOTUKUDN-IBGZPJMESA-N 0.000 claims description 3
- 238000004026 adhesive bonding Methods 0.000 claims description 3
- 238000012544 monitoring process Methods 0.000 claims description 3
- 238000009529 body temperature measurement Methods 0.000 abstract description 3
- 238000004519 manufacturing process Methods 0.000 abstract description 3
- 230000010354 integration Effects 0.000 abstract description 2
- 238000001179 sorption measurement Methods 0.000 abstract description 2
- 230000005540 biological transmission Effects 0.000 abstract 1
- 238000013480 data collection Methods 0.000 abstract 1
- 238000010586 diagram Methods 0.000 description 13
- 238000005516 engineering process Methods 0.000 description 3
- 239000001307 helium Substances 0.000 description 3
- 229910052734 helium Inorganic materials 0.000 description 3
- SWQJXJOGLNCZEY-UHFFFAOYSA-N helium atom Chemical compound [He] SWQJXJOGLNCZEY-UHFFFAOYSA-N 0.000 description 3
- 230000000694 effects Effects 0.000 description 2
- NJPPVKZQTLUDBO-UHFFFAOYSA-N novaluron Chemical compound C1=C(Cl)C(OC(F)(F)C(OC(F)(F)F)F)=CC=C1NC(=O)NC(=O)C1=C(F)C=CC=C1F NJPPVKZQTLUDBO-UHFFFAOYSA-N 0.000 description 2
- 230000010287 polarization Effects 0.000 description 2
- 241001391944 Commicarpus scandens Species 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 239000000498 cooling water Substances 0.000 description 1
- 230000007423 decrease Effects 0.000 description 1
- 230000007812 deficiency Effects 0.000 description 1
- 238000009826 distribution Methods 0.000 description 1
- 239000011261 inert gas Substances 0.000 description 1
- 238000003754 machining Methods 0.000 description 1
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CN201310656962.8A CN103698068B (zh) | 2013-12-06 | 2013-12-06 | 一种静电卡盘基本性能检测装置及其检测方法 |
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CN103698068B true CN103698068B (zh) | 2014-11-12 |
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Families Citing this family (4)
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CN105097591B (zh) * | 2015-06-17 | 2019-02-19 | 北京北方华创微电子装备有限公司 | 一种硅片分布状态光电图像组合扫描方法及装置 |
CN105241599B (zh) * | 2015-11-05 | 2017-09-22 | 清华大学 | 静电卡盘静电力的检测***及检测方法 |
CN110277328B (zh) * | 2018-03-15 | 2021-08-13 | 北京北方华创微电子装备有限公司 | 晶片脱附的方法、装置及半导体处理设备 |
CN110873640B (zh) * | 2018-08-13 | 2021-10-01 | 北京华卓精科科技股份有限公司 | 静电卡盘性能检测装置及检测方法 |
Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2000234973A (ja) * | 1999-02-16 | 2000-08-29 | Ngk Insulators Ltd | 双極型静電チャックの表面特性測定方法及び測定装置 |
CN2807475Y (zh) * | 2005-03-29 | 2006-08-16 | 北京北方微电子基地设备工艺研究中心有限责任公司 | 一种静电卡盘功能测试装置 |
CN101174548A (zh) * | 2006-11-03 | 2008-05-07 | 爱德牌工程有限公司 | 测量卡盘附着力的设备和方法 |
US8313664B2 (en) * | 2008-11-21 | 2012-11-20 | Applied Materials, Inc. | Efficient and accurate method for real-time prediction of the self-bias voltage of a wafer and feedback control of ESC voltage in plasma processing chamber |
CN203657947U (zh) * | 2013-12-06 | 2014-06-18 | 清华大学 | 一种静电卡盘基本性能检测装置 |
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Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2000234973A (ja) * | 1999-02-16 | 2000-08-29 | Ngk Insulators Ltd | 双極型静電チャックの表面特性測定方法及び測定装置 |
CN2807475Y (zh) * | 2005-03-29 | 2006-08-16 | 北京北方微电子基地设备工艺研究中心有限责任公司 | 一种静电卡盘功能测试装置 |
CN101174548A (zh) * | 2006-11-03 | 2008-05-07 | 爱德牌工程有限公司 | 测量卡盘附着力的设备和方法 |
US8313664B2 (en) * | 2008-11-21 | 2012-11-20 | Applied Materials, Inc. | Efficient and accurate method for real-time prediction of the self-bias voltage of a wafer and feedback control of ESC voltage in plasma processing chamber |
CN203657947U (zh) * | 2013-12-06 | 2014-06-18 | 清华大学 | 一种静电卡盘基本性能检测装置 |
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Inventor after: Ji Linhong Inventor after: Wang Kecheng Inventor after: Cheng Jia Inventor after: Wang Xingkuo Inventor after: Xu Dengfeng Inventor after: Xu Yan Inventor after: Zhang Xuguang Inventor after: Yang Yiyong Inventor before: Cheng Jia Inventor before: Wang Kecheng Inventor before: Wang Xingkuo Inventor before: Ji Linhong Inventor before: Zhu Xiaoying |
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Free format text: CORRECT: INVENTOR; FROM: CHENG JIA WANG KESHENG WANG XINGKUO JI LINHONG ZHU XIAOYING TO: JI LINHONGWANG KESHENG CHENG JIA WANG XINGKUO XU DENGFENG XU YAN ZHANG XUGUANG YANG YIYONG |
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