CN103675470B - A kind of N*M dimension resistor network measurement mechanism - Google Patents
A kind of N*M dimension resistor network measurement mechanism Download PDFInfo
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- CN103675470B CN103675470B CN201310557056.2A CN201310557056A CN103675470B CN 103675470 B CN103675470 B CN 103675470B CN 201310557056 A CN201310557056 A CN 201310557056A CN 103675470 B CN103675470 B CN 103675470B
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Abstract
The invention discloses a kind of N*M dimension resistor network measurement mechanism, comprise constant current source, magnifier, voltage collection circuit and four multiway analog switches; Every N number of resistance forms a resistor network, forms M resistor network altogether; One end of each resistance in each resistor network is by wire interconnects and form tie point; Described tie point is connected with a road of the 3rd multiway analog switch by a cable; Described tie point is connected with a road of the 4th multiway analog switch by another root cable; The other end of each resistance in each resistor network is connected with a road of the first multiway analog switch, a road of the second multiway analog switch respectively by two cables; Constant current source, the second multiway analog switch and the 3rd multiway analog switch form current source path; First multiway analog switch, the 4th multiway analog switch and magnifier coating-forming voltage test access; The test that N × M ties up each resistance in resistance is realized by controlling four multiway analog switches.
Description
Technical field
The invention belongs to precision resistance fields of measurement.
Background technology
During by long testing lines precision resistance, the impedance of cable can impact test result.For avoiding cable on the impact of test, usually adopt four-wire system test precision resistance [1-3].Two of resistance measurement loops are divided into power to go between and sense leads by four-wire system.Make pressure drop appears in resistance to power lead-in wire Injection Current by constant current source; By magnification at high multiple and precision measurement route survey resistance drop in the sense leads of high impedance, the resistance of non-lead-in conductor interference can be measured.This four-wire system method of testing is applicable to the good precision temperature fields of measurement of high precision, stability and consistance.
[1] the high-resolution hydrocode device utilizing platinum resistance to measure, CN200920109994.5, Space Sci. & Application Research Center, Chinese Academy of Sciences;
[2] a high-precision platinum resistor resistance automatic testing equipment, CN201120325724.5, The 49th Research Institute of CECT;
[3] the high-resolution hydrocode device utilizing platinum resistance to measure, CN200920109994.5, Space Sci. & Application Research Center, Chinese Academy of Sciences;
[4] circuit for two constant current source measuring tempeature platinum resistance is utilized, CN201120288667.8, Changchun Ltd of meteorologic instrument research institute.
But four-line measurement has circuit complexity, cable is many and cost is high limitation, therefore [4] document adopts the mode that three-wire system four-wire system is general, and test precision resistance, reduces the cost of resistance measurement.
The ion-conductance that satellite newly grinds advances circuit to adopt accurate Pt resistance as temperature probe in a large number.Pt resistance has precision, feature that rate of change is little (0.3851 Ω/DEG C), larger by cable resistance (0.2 Ω-3 Ω) impact, need spaceborne circuit to adopt four-wire system measuring resistance method, provide constant current source and magnification at high multiple circuit to every road Pt resistance.When advancing a large amount of employing Pt resistance as thermometric sensor, needing the Pt resistance way of collection more, needing to consume a large amount of hardware circuit resource and whole star cable.By analysis, the platinum resistance network of satellite ion propulsion, has the advantages that resistance number is many, resistance is grouped into N × M distribution.If adopt traditional four-wire system resistance test network, cable circuit cost and debugging cost higher.
Summary of the invention
Technical matters to be solved by this invention is: provide a kind of and realize simply, few, the lower-cost N × M of number of cables (N be more than or equal to 2 integer, M be more than or equal to 2 integer) tie up resistor network measurement mechanism.
The present invention includes following technical scheme:
A kind of N*M dimension resistor network measurement mechanism, comprises constant current source, magnifier and voltage collection circuit; First multiway analog switch, the second multiway analog switch, the 3rd multiway analog switch and the 4th multiway analog switch; First multiway analog switch, the second multiway analog switch have N × M path analoging switch; 3rd multiway analog switch and the 4th multiway analog switch have M path analoging switch; Every N number of resistance forms a resistor network, forms M resistor network altogether; One end of each resistance in each resistor network is by wire interconnects and form tie point; Described tie point is connected with a road of the 3rd multiway analog switch by a cable; Described tie point is connected with a road of the 4th multiway analog switch by another root cable; The other end of each resistance in each resistor network is connected with a road of the first multiway analog switch, a road of the second multiway analog switch respectively by two cables; One end of constant current source is connected with described second multiway analog switch, and the other end of constant current source is connected with the 3rd multiway analog switch, thus forms current source path; First multiway analog switch is connected with an input end of magnifier, and the 4th multiway analog switch is connected with another input end of magnifier, thus coating-forming voltage test access; The output terminal of magnifier is connected with voltage collection circuit; The test that N × M ties up each resistance in resistance is realized by controlling four multiway analog switches.
Described resistance is for thermometric platinum resistance.
The present invention compared with prior art tool has the following advantages:
The present invention uses 2 × N × M+2M cable grid to substitute four-wire system test, avoids cable resistance on the impact of resistance precision, save a large amount of cable by the mode distinguishing voltage path and current path; The mode adopting timesharing to suit multiway analog switch provides independent current source path and voltage tester path respectively to N × M resistance, saves a large amount of circuit area.Number of cable saves 2M × (N-1) root by original design basis, circuit saves 1/ (N × M) for original design, can save a large amount of cable and hardware circuit under the prerequisite meeting measuring accuracy, reduce hardware cost and debugging complicacy, cost performance is higher.
Accompanying drawing explanation
Fig. 1 is that N × M (M=2) ties up resistor network measurement dress schematic diagram.
Embodiment
Just by reference to the accompanying drawings the present invention is described further below.
As shown in Figure 1, be N*M dimension resistor network measurement mechanism schematic diagram during M=2; Comprise constant current source A, magnifier and voltage collection circuit; Also comprise the first multiway analog switch M1, the second multiway analog switch M2, the 3rd multiway analog switch M3 and the 4th multiway analog switch M4; First multiway analog switch M1, the second multiway analog switch M2 have N × M path analoging switch; 3rd multiway analog switch M3 and the 4th multiway analog switch M4 has M path analoging switch; Every N number of resistance forms a resistor network, forms M resistor network altogether; One end of each resistance in each resistor network is by wire interconnects and form tie point; Described tie point is connected with a road of the 3rd multiway analog switch M3 by a cable; Described tie point is connected with a road of the 4th multiway analog switch M4 by another root cable; The other end of each resistance in each resistor network is connected with a road of the first multiway analog switch, a road of the second multiway analog switch respectively by two cables; One end of constant current source A is connected with described second multiway analog switch M2, and the other end of constant current source A is connected with the 3rd multi-channel analog M3 switch, thus forms current source path; First multiway analog switch M1 is connected with an input end of magnifier, and the 4th multiway analog switch M4 is connected with another input end of magnifier, thus coating-forming voltage test access; The output terminal of magnifier is connected with voltage collection circuit; Switch multiway analog switch by timesharing and provide current source path and voltage tester path to each dimension in resistance of N × M.
Adopt the constant current source A that voltage reference device provides input impedance less; Adopt amplifier chip to build high power magnifier, input impedance is greater than 40M ohm; The cable system of 2 × (N × M)+2M is adopted to tie up Pt resistance simulation four-wire system connected mode to N × M; Multiway analog switch M1-M4 is adopted to control conducting and the cut-out of the test circuit corresponding to the resistance of every road; Wherein after a road conducting, because magnifier path resistance is comparatively large, the electric current that constant current source provides will flow through Pt resistance according to current return and be back to constant current source loop.Because electric current is without the cable resistance of pressure measurement path, therefore pressure measurement circuit is not subject to the impact of cable resistance on the test of Pt resistance; Test terminates rear switching multiway analog switch, opens next road resistance of test.Wire between N number of resistance connects impedance r1-rN and determines by demarcating, and can obtain accurate resistance.
Measurement mechanism of the present invention can be applied to satellite ion propulsion Pt Resistance Temperature Measuring Circuit, and now, above-mentioned resistor network measurement mechanism is for thermometric platinum resistance network measure device.Also the network measure of other precision resistance can be applied to.
The unspecified part of the present invention belongs to general knowledge as well known to those skilled in the art.
Claims (2)
1. a N*M dimension resistor network measurement mechanism, comprises constant current source, magnifier and voltage collection circuit; It is characterized in that, also comprise the first multiway analog switch, the second multiway analog switch, the 3rd multiway analog switch and the 4th multiway analog switch; First multiway analog switch, the second multiway analog switch have N × M path analoging switch; 3rd multiway analog switch and the 4th multiway analog switch have M path analoging switch; Every N number of resistance forms a resistor network, forms M resistor network altogether; One end of each resistance in each resistor network is by wire interconnects and form tie point; Described tie point is connected with a road of the 3rd multiway analog switch by a cable; Described tie point is connected with a road of the 4th multiway analog switch by another root cable; The other end of each resistance in each resistor network is connected with a road of the first multiway analog switch, a road of the second multiway analog switch respectively by two cables; One end of constant current source is connected with described second multiway analog switch, and the other end of constant current source is connected with the 3rd multiway analog switch, thus forms current source path; First multiway analog switch is connected with an input end of magnifier, and the 4th multiway analog switch is connected with another input end of magnifier, thus coating-forming voltage test access; The output terminal of magnifier is connected with voltage collection circuit; The test that N × M ties up each resistance in resistance is realized by controlling four multiway analog switches.
2. N*M dimension resistor network measurement mechanism as claimed in claim 1, is characterized in that: described resistance is for thermometric platinum resistance.
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| CN103675470B true CN103675470B (en) | 2016-02-10 |
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| CN103941133B (en) * | 2014-04-29 | 2017-01-04 | 西北工业大学 | A kind of microminiature parallel processor Cable Testing System and method of testing |
| CN107687905B (en) * | 2016-08-04 | 2020-01-14 | 中车株洲电力机车研究所有限公司 | Platinum resistance temperature acquisition device |
| CN112327057A (en) * | 2020-12-03 | 2021-02-05 | 常州同惠电子股份有限公司 | On-resistance testing method for wire tester |
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