CN103486987A - Method for improving ultrasonic thickness measurement accuracy by using curve fitting - Google Patents
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Abstract
The invention relates to a method for improving the ultrasonic thickness measurement accuracy by using curve fitting. The method comprises the following steps: according to the characteristics that an ultrasonic signal is similar to a straight line in a short time period above and below a zero point, and when the signal amplitude is higher, the signal is more similar to the straight line, collecting two adjacent sampling points above and below the zero point at the two sides of the positive maximum peak or the negative maximum peak of an echo signal, fitting a straight line through the sampling points, working out corresponding coordinates of a feature point on the fitted curve, sending the coordinates to a thickness calculating module and calculating the thickness of an object to be measured. The method has the advantages that a curve fitting algorithm is used for compensating sampling precision, so that the ultrasonic thickness measurement accuracy is effectively improved under the condition that the sampling clock frequency is constant so as to meet the requirements on the thickness measurement accuracy in certain occasions, the complexity of hardware implementation is reduced, and the reliability of the implementation is improved.
Description
Technical field
The present invention relates to a kind of method that improves the ultrasonic thickness measurement precision, particularly a kind of method of utilizing curve to improve the ultrasonic thickness measurement precision.
Background technology
Ultrasonic thickness test is carried out thickness measure according to the ultrasonic pulse principle of reflection, and when the ultrasonic pulse of probe emission arrives material interface by testee, pulse is reflected back toward probe.Ultrasonic thickness test calculates by testee upper and lower surface echoed signal the time that ultrasound wave transmits in testee, and the speed that this time and ultrasound wave are transmitted in testee multiplies each other, and obtains object thickness.Usually way is to choose a unique point (zero point or extreme point), calculate twice return mistiming of this unique point as shown in Figure 1.
The ultrasonic thickness test precision is by the decision of two parts precision, and a part is measuring accuracy, by the measurement capability decision of ultrasonic thickness measurement equipment itself; Another part craft precision, depend on the external factor such as probe, measurand, site environment, temperature.The related method of this patent is mainly used to improve the measuring accuracy of ultrasonic thickness measurement equipment itself.
According to the principle of ultrasonic thickness test, in the situation that the velocity of sound is certain, the precision of thickness measure can be converted to the precision of time measurement, and because the time obtains by the statistic sampling clock periodicity, the sampling clock frequency has directly determined the ultrasonic thickness measurement precision.It is therefore existing that to put forward high-precision method be substantially all to start with from improving the sampling clock frequency.But it is more difficult that the sampling clock cycle improves, particularly the higher occasion of some thickness measuring accuracy requirements, only rely on raising sampling clock frequency to meet the demands.
Summary of the invention
Only the present invention be directed to and improve by improving the sampling clock frequency problem that requires that the thickness measuring precision can not meet the precision raising, a kind of method of utilizing curve to improve the ultrasonic thickness measurement precision has been proposed, use curve fitting algorithm compensating sampling precision, make the ultrasonic thickness measurement precision in the situation that the sampling clock frequency is constant effectively improves.
Technical scheme of the present invention is: a kind of method of utilizing curve to improve the ultrasonic thickness measurement precision specifically comprises the steps:
1) the sampled point acquisition module obtains sampled point according to choosing of unique point in two echo zones that preset for thickness measure: two echo zones for thickness measuring are set by gate, gate comprises width and two parameters of height, according to technological requirement, manually arrange, sampled point obtains in the gate width range and carries out, gate height is defined as gate position ordinate Y, the sampled point acquisition module is chosen and is gathered synchronization Y<=0 in echo according to unique point, Y >=0 two sampled points, and preserve;
2) curve fitting module adopts Algorithm of fitting a straight line, step 1) is obtained to two sampled points in echo and fit to straight line, and the point of handing over ordinate is unique point, obtains two unique point X1 and X2 in echo;
Unique point X1 and the X2 of two echoes that 3) will calculate send into the THICKNESS CALCULATION module, calculate testee thickness, and testee thickness S computing formula is as follows:
S=(| X1-X2|)
*t
*v, wherein t is mistiming corresponding to unique point in twice return, and twice return sampled point acquisition time is poor, and V is the velocity of sound in testee.
Described unique point choose minutes 4 types, be respectively before zero point after zero point before positive peak-peak, positive peak-peak, negative peak-peak zero point after zero point and negative peak-peak.
It is described that to obtain the sampled point step according to choosing of unique point as follows:
1), new sampling starts, and according to gate height judging characteristic vertex type, if gate height is defined as positive peak-peak type unique point for just, enters step 2), if for negative, to be defined as be to bear peak-peak type unique point to gate height, enter step 7);
2), get three sampled point S of a certain moment arbitrary neighborhood
n(x, y), S
n-1(x, y), S
n-2(x, y) meets S simultaneously
n-2(y)<=0, S
n-1(y)>=0, S
n(y)>=0, S this moment
n-1(x, y), S
n-2(x, y) assignment respectively gives the positive maximal value sampled point S at front zero point
11(x
11, y
11), S
12(x
12, y
12), enter step 3);
3), continue to take off one constantly three sampled points compare, as three sampled points S simultaneously for the first time
n(y)<=S
n-1(y)<=S
n-2(y), the time, get S this moment
n-2(x, y) assignment is given positive maximal value, enters step 4);
4) if just maximal value is in the gate scope, and amplitude enters step 5), otherwise gets back to step 2 over gate height);
5), continue to take off one constantly three sampled points compare, when three sampled points meet S simultaneously
n-2(y)>=0, S
n-1(y)<=0, S
n(y)<=0, by S this moment
n-1(x, y), S
n-2(x, y) difference assignment is to the sampled point S at zero point after positive maximal value
13(x
13, y
13), S
14(x
14, y
14), enter step 6);
6) if obtaining positive maximal value, this is more than or equal to positive peak-peak, the positive maximal value assignment of this being obtained is given positive peak-peak, before positive maximal value, the sampled point assignment at zero point is given the positive peak-peak sampled point at front zero point, after positive maximal value, the sampled point assignment at zero point is to the sampled point at zero point after positive peak-peak, otherwise it is constant to retain after the sampled point at zero point before positive peak-peak, positive peak-peak, positive maximal value the sampled point at zero point, whether judgement now exceeds the gate scope, if exceed, enter step 12), otherwise return to step 2);
7), get three sampled point S of a certain moment arbitrary neighborhood
n(x, y), S
n-1(x, y), S
n-2(x, y), if meet S simultaneously
n-2(y)>=0, S
n-1(y)<=0, S
n(y)<=0, S this moment
n-1(x, y), S
n-2(x, y) assignment respectively gives the negative maximal value sampled point S at front zero point
' 11(x
11, y
11), S
' 12(x
12, y
12), enter step 8);
8), continue to take off one constantly three sampled points compare, when three sampled points meet S for the first time simultaneously
n(y)>=S
n-1(y)>=S
n-2(y), the time, get S this moment
n-2(x, y) assignment is given negative maximal value, enters step 9);
9) if negative maximal value in the gate scope, and amplitude enters step 10) lower than gate height, otherwise gets back to step 7);
10), continue to take off one constantly three sampled points compare, when three sampled points meet S simultaneously
n-2(y)<=0, S
n-1(y)>=0, S
n(y)>=0, S this moment
n-1(x, y), S
n-2(x, y) sampled point S that respectively assignment is given zero point after negative maximal value
' 13(x
13, y
13), S
' 14(x
14, y
14), enter step 11);
11) if obtaining negative maximal value, this is less than or equal to negative peak-peak, the negative maximal value assignment of this being obtained is given negative peak-peak, before negative maximal value, the sampled point assignment at zero point is given the negative peak-peak sampled point at front zero point, the sampled point that after negative maximal value, the sampled point assignment at zero point is given zero point after negative peak-peak, otherwise it is constant to retain after the sampled point at zero point before negative peak-peak, negative peak-peak, negative maximal value the sampled point at zero point, whether judgement now exceeds the gate scope, if exceed, enter step 12), otherwise return to step 7);
12) if the unique point needed is zero point before maximal value, will be just/negative maximal value assignment at front zero point is the curve sampled point, if the unique point needed is zero point after maximal value, will be just/negative maximal value after zero point assignment be the curve sampled point, wait for that sampling finishes, sampling finishes to return to step 1), otherwise rests on step 12).
Beneficial effect of the present invention is: the present invention utilizes curve to improve the method for ultrasonic thickness measurement precision, the method use curve fitting algorithm compensating sampling precision, make the ultrasonic thickness measurement precision in the situation that the sampling clock frequency is constant effectively improves, to meet the requirement of some occasion to the thickness measuring precision, reduce the hardware implementation complexity, improve and realize reliability.
The accompanying drawing explanation
Fig. 1 is the ultrasonic thickness-measuring method schematic diagram;
Fig. 2 is high-level schematic functional block diagram in curve ultrasonic thickness-measuring method of the present invention;
Fig. 3 is that unique point of the present invention is chosen schematic diagram;
Fig. 4 is unique point type schematic diagram of the present invention;
Fig. 5 is sampled point obtaining step schematic diagram of the present invention;
Fig. 6 is thickness measuring method schematic diagram of the present invention.
Embodiment
Utilize curve fitting algorithm to calculate mistiming corresponding to unique point in twice return, this mistiming and the velocity of sound are multiplied each other and obtain thickness, high-level schematic functional block diagram in the curve ultrasonic thickness-measuring method, comprise the sampled point acquisition module as shown in Figure 2, curve fitting module and THICKNESS CALCULATION module.
Because ultrasonic signal (sampling period) within upper and lower minor time slice at zero point is similar to straight line, and signal amplitude is higher, more be similar to straight line, therefore unique point is chosen for the zero point of the positive peak-peak of echoed signal or negative peak-peak both sides, curve fitting algorithm adopts fitting a straight line, fitting a straight line needs two sampled points, and these two sampled points are chosen for two neighbouring sampled points of unique point, and unique point is chosen schematic diagram as shown in Figure 3.
The sampled point acquisition module is connected with curve fitting module, is the sampled point of curve fitting module offer curves matching needs;
The sampled point that curve fitting module utilizes the sampled point acquisition module to obtain carries out curve fitting, and calculates unique point respective coordinates in matched curve, and this coordinate is delivered to the THICKNESS CALCULATION module and calculate testee thickness;
The THICKNESS CALCULATION module is obtained the unique point coordinate from curve fitting module, calculates mistiming corresponding to unique point in twice return, and this mistiming and the velocity of sound are multiplied each other and obtain testee thickness.
Below with regard to this scheme, be described in detail:
The sampled point acquisition module obtains sampled point according to choosing of unique point in two echo zones that preset for thickness measure.Two echo zones for thickness measuring are set by gate, gate comprises width and two parameters of height, need to manually arrange according to technological requirement, gate width (as the scope of double-head arrow restriction in Fig. 1) determines algorithm execution scope, sampled point and unique point are obtained all and are carried out in the gate width range, and gate height is defined as gate position ordinate.Unique point has been chosen Four types, unique point type schematic diagram as shown in Figure 4, be respectively zero point after zero point and negative peak-peak before zero point after zero point before positive peak-peak, positive peak-peak, negative peak-peak, sampled point obtains by sampled point obtaining step schematic diagram as shown in Figure 5:
Step 1, new sampling start, according to gate height judging characteristic vertex type, if gate height is for just, as shown in front two width figure in Fig. 4, be defined as positive peak-peak type unique point, enter step 2, if gate height is for negative, as shown in two width figure after in Fig. 4, being defined as is negative peak-peak type unique point, enters step 7;
Step 2, get three sampled point S of a certain moment arbitrary neighborhood
n(x, y), S
n-1(x, y), S
n-2(x, y) meets S simultaneously
n-2(y)<=0, S
n-1(y)>=0, S
n(y)>=0, S this moment
n-1(x, y), S
n-2(x, y) assignment respectively gives the positive maximal value sampled point S at front zero point
11(x
11, y
11), S
12(x
12, y
12), enter step 3;
Step 3, continue to take off one constantly three sampled points compare, as three sampled points S simultaneously for the first time
n(y)<=S
n-1(y)<=S
n-2(y), the time, get S this moment
n-2(x, y) assignment is given positive maximal value, enters step 4;
If the positive maximal value of step 4 is in the gate scope, and amplitude enters step 5, otherwise gets back to step 2 over gate height;
Step 5, continue to take off one constantly three sampled points compare, when three sampled points meet S simultaneously
n-2(y)>=0, S
n-1(y)<=0, S
n(y)<=0, by S this moment
n-1(x, y), S
n-2(x, y) difference assignment is to the sampled point S at zero point after positive maximal value
13(x
13, y
13), S
14(x
14, y
14), enter step 6;
If this obtains step 6 positive maximal value and is more than or equal to positive peak-peak, the positive maximal value assignment of this being obtained is given positive peak-peak, before positive maximal value, the sampled point assignment at zero point is given the positive peak-peak sampled point at front zero point, the sampled point that after positive maximal value, the sampled point assignment at zero point is given zero point after positive peak-peak, otherwise it is constant to retain after the sampled point at zero point before positive peak-peak, positive peak-peak, positive maximal value the sampled point at zero point.Whether judgement now exceeds the gate scope, if exceed, enters step 12, otherwise returns to step 2;
Step 7, get three sampled point S of a certain moment arbitrary neighborhood
n(x, y), S
n-1(x, y), S
n-2(x, y), if meet S simultaneously
n-2(y)>=0, S
n-1(y)<=0, S
n(y)<=0, S this moment
n-1(x, y), S
n-2(x, y) assignment respectively gives the negative maximal value sampled point S at front zero point
' 11(x
11, y
11), S
' 12(x
12, y
12), enter step 8;
Step 8, continue to take off one constantly three sampled points compare, when three sampled points meet S for the first time simultaneously
n(y)>=S
n-1(y)>=S
n-2(y), the time, get S this moment
n-2(x, y) assignment is given negative maximal value, enters step 9;
If the negative maximal value of step 9 is in the gate scope, and amplitude enters step 10 lower than gate height, otherwise gets back to step 7;
Step 10, continue to take off one constantly three sampled points compare, when three sampled points meet S simultaneously
n-2(y)<=0, S
n-1(y)>=0, S
n(y)>=0, S this moment
n-1(x, y), S
n-2(x, y) sampled point S that respectively assignment is given zero point after negative maximal value
' 13(x
13, y
13), S
' 14(x
14, y
14), enter step 11;
If this obtains step 11 negative maximal value and is less than or equal to negative peak-peak, the negative maximal value assignment of this being obtained is given negative peak-peak, before negative maximal value, the sampled point assignment at zero point is given the negative peak-peak sampled point at front zero point, the sampled point that after negative maximal value, the sampled point assignment at zero point is given zero point after negative peak-peak, otherwise it is constant to retain after the sampled point at zero point before negative peak-peak, negative peak-peak, negative maximal value the sampled point at zero point.Whether judgement now exceeds the gate scope, if exceed, enters step 12, otherwise returns to step 7;
If the unique point that step 12 needs is zero point before maximal value, will be just/negative maximal value assignment at front zero point is the curve sampled point, if the unique point needed is zero point after maximal value, will be just/negative maximal value after zero point assignment be the curve sampled point, wait for that sampling finishes, sampling finishes to return to step 1, otherwise rests on step 12.
Curve fitting module adopts Algorithm of fitting a straight line, utilize unique point to choose type and gather the zero passage sampled point, the sampled point provided by zero passage sampled point acquisition module simulates straight line, and known features point is the point in matched curve, and unique point ordinate y=0, can calculate the spy and decorate horizontal ordinate x.Two sampled points are defined as (x
1, y
1), (x
2, y
2) the fitting a straight line formula is as follows:
y?=?kx?+?b
Wherein,
k=(y 1 -y 2 )/(x 1 -x 2 );
b=(y 2* x 1 -y 1* x 2 )/(x 1 -x 2 )
As shown in Figure 6, unique point X1 and the X2 of two echoes calculating are sent into to the THICKNESS CALCULATION module, calculate testee thickness.
The THICKNESS CALCULATION module is calculated mistiming corresponding to unique point in twice return according to X1 and X2, and this mistiming and the velocity of sound are multiplied each other and obtain testee thickness.The definition sampling period is t (second), and in testee, the velocity of sound is the V(meter per second), testee thickness S(rice) computing formula is as follows:
S?=?(|X1?-?X2|)?
*?t?
*?V
Thickness measuring method schematic diagram as shown in Figure 6, sampling period is 10ns, in testee, the velocity of sound is 5920m/s, adopting zero point before positive maximal value is unique point, getting adjacent two echoes is the thickness measuring zone, two echo zones for thickness measuring are set by gate, and sampled point and unique point are obtained all and carried out in the gate scope, and sampled point obtains as follows:
Step 1, new sampling start, and according to gate height judging characteristic vertex type, are positive peak-peak type unique point, enter step 2;
Step 2, get three sampled point S of a certain moment arbitrary neighborhood
n(x, y), S
n-1(x, y), S
n-2(x, y), if meet S simultaneously
n-2(y)<=0, S
n-1(y)>=0, S
n(y)>=0, S this moment
n-1(x, y), S
n-2(x, y) assignment respectively gives the positive maximal value sampled point S at front zero point
11(x
11, y
11), S
12(x
12, y
12), enter step 3;
Step 3, continue to take off one constantly three sampled points compare, as three sampled points S simultaneously for the first time
n(y)<=S
n-1(y)<=S
n-2(y), the time, get S this moment
n-2(x, y) assignment is given positive maximal value, enters step 4;
If the positive maximal value of step 4 is in the gate scope, and amplitude enters step 5, otherwise gets back to step 2 over gate height;
Step 5, continue to take off one constantly three sampled points compare, when three sampled points meet S simultaneously
n-2(y)>=0, S
n-1(y)<=0, S
n(y)<=0, by S this moment
n-1(x, y), S
n-2(x, y) difference assignment is to the sampled point S at zero point after positive maximal value
13(x
13, y
13), S
14(x
14, y
14), enter step 6;
If this obtains step 6 positive maximal value and is more than or equal to positive peak-peak, just this positive maximal value assignment of obtaining is given positive peak-peak, before positive maximal value, the sampled point assignment at zero point is given the positive peak-peak sampled point at front zero point, the sampled point that after positive maximal value, the sampled point assignment at zero point is given zero point after positive peak-peak, otherwise it is constant to retain after the sampled point at zero point before positive peak-peak, positive peak-peak, positive maximal value the sampled point at zero point.Whether judgement now exceeds the gate scope, if exceed, enters step 7, otherwise returns to step 2;
Step 7, the unique point needed are zero point before maximal value,, by zero point before positive maximal value, assignment was the curve sampled point, enter step 8;
Step 8, repeated execution of steps one are to step 7, until sampling finishes.
The sampled point that obtains two echoes is respectively (x
11, y
11), (x
21, y
21), (x
12, y
12), (x
22, y
22), curve fitting module adopts Algorithm of fitting a straight line, and the sampled point that utilizes the sampled point acquisition module to provide simulates straight line, and take the unique point amplitude and calculate at it X on straight line as Y.Formula is as follows:
y?=?kx?+?b
Wherein,
k 1=(y 11 -y 21 )/(x 11 -x 21 ), b1=(y 21* x 11 -y 11* x 21 )/(x 11 -x 21 )
k?2=?(y
12
?-?y
22
)/(?x
12
?-?x
22
)，b2?=?(y
22*
?x
12?
-?y
12*
x
22
)/?(?x
12
?-?x
22
)
Unique point X1 and the X2 of two echoes calculating are sent into to the THICKNESS CALCULATION module, calculate testee thickness.
The THICKNESS CALCULATION module is calculated mistiming corresponding to unique point in twice return according to X1 and X2, and this mistiming and the velocity of sound are multiplied each other and obtain testee thickness.The definition sampling period is t (second), and in testee, the velocity of sound is the V(meter per second), testee thickness S(rice) computing formula is as follows:
S?=?(|X1?-?X2|)?
*?t?
*?V?=?5.92
*?10
-5 *?(|X1?-?X2|)
But should be understood that, the above-mentioned description for specific embodiment is more detailed, can not therefore think the restriction to patent right protection domain of the present invention, patent right protection domain of the present invention should be as the criterion with appended claims.
Claims (3)
1. a method of utilizing curve to improve the ultrasonic thickness measurement precision, is characterized in that, specifically comprises the steps:
1) the sampled point acquisition module obtains sampled point according to choosing of unique point in two echo zones that preset for thickness measure: two echo zones for thickness measuring are set by gate, gate comprises width and two parameters of height, according to technological requirement, manually arrange, sampled point obtains in the gate width range and carries out, gate height is defined as gate position ordinate Y, the sampled point acquisition module is chosen and is gathered synchronization Y<=0 in echo according to unique point, Y >=0 two sampled points, and preserve;
2) curve fitting module adopts Algorithm of fitting a straight line, step 1) is obtained to two sampled points in echo and fit to straight line, and the point of handing over ordinate is unique point, obtains two unique point X1 and X2 in echo;
Unique point X1 and the X2 of two echoes that 3) will calculate send into the THICKNESS CALCULATION module, calculate testee thickness, and testee thickness S computing formula is as follows:
S=(| X1-X2|)
*t
*v, wherein t is mistiming corresponding to unique point in twice return, and twice return sampled point acquisition time is poor, and V is the velocity of sound in testee.
2. utilize according to claim 1 curve to improve the method for ultrasonic thickness measurement precision, it is characterized in that, described unique point choose minutes 4 types, be respectively before zero point after zero point before positive peak-peak, positive peak-peak, negative peak-peak zero point after zero point and negative peak-peak.
3. utilize according to claim 2 curve to improve the method for ultrasonic thickness measurement precision, it is characterized in that, described to obtain the sampled point step according to choosing of unique point as follows:
1), new sampling starts, and according to gate height judging characteristic vertex type, if gate height is defined as positive peak-peak type unique point for just, enters step 2), if for negative, to be defined as be to bear peak-peak type unique point to gate height, enter step 7);
2), get three sampled point S of a certain moment arbitrary neighborhood
n(x, y), S
n-1(x, y), S
n-2(x, y) meets S simultaneously
n-2(y)<=0, S
n-1(y)>=0, S
n(y)>=0, S this moment
n-1(x, y), S
n-2(x, y) assignment respectively gives the positive maximal value sampled point S at front zero point
11(x
11, y
11), S
12(x
12, y
12), enter step 3);
3), continue to take off one constantly three sampled points compare, as three sampled points S simultaneously for the first time
n(y)<=S
n-1(y)<=S
n-2(y), the time, get S this moment
n-2(x, y) assignment is given positive maximal value, enters step 4);
4) if just maximal value is in the gate scope, and amplitude enters step 5), otherwise gets back to step 2 over gate height);
5), continue to take off one constantly three sampled points compare, when three sampled points meet S simultaneously
n-2(y)>=0, S
n-1(y)<=0, S
n(y)<=0, by S this moment
n-1(x, y), S
n-2(x, y) difference assignment is to the sampled point S at zero point after positive maximal value
13(x
13, y
13), S
14(x
14, y
14), enter step 6);
6) if obtaining positive maximal value, this is more than or equal to positive peak-peak, the positive maximal value assignment of this being obtained is given positive peak-peak, before positive maximal value, the sampled point assignment at zero point is given the positive peak-peak sampled point at front zero point, after positive maximal value, the sampled point assignment at zero point is to the sampled point at zero point after positive peak-peak, otherwise it is constant to retain after the sampled point at zero point before positive peak-peak, positive peak-peak, positive maximal value the sampled point at zero point, whether judgement now exceeds the gate scope, if exceed, enter step 12), otherwise return to step 2);
7), get three sampled point S of a certain moment arbitrary neighborhood
n(x, y), S
n-1(x, y), S
n-2(x, y), if meet S simultaneously
n-2(y)>=0, S
n-1(y)<=0, S
n(y)<=0, S this moment
n-1(x, y), S
n-2(x, y) assignment respectively gives the negative maximal value sampled point S at front zero point
' 11(x
11, y
11), S
' 12(x
12, y
12), enter step 8);
8), continue to take off one constantly three sampled points compare, when three sampled points meet S for the first time simultaneously
n(y)>=S
n-1(y)>=S
n-2(y), the time, get S this moment
n-2(x, y) assignment is given negative maximal value, enters step 9);
9) if negative maximal value in the gate scope, and amplitude enters step 10) lower than gate height, otherwise gets back to step 7);
10), continue to take off one constantly three sampled points compare, when three sampled points meet S simultaneously
n-2(y)<=0, S
n-1(y)>=0, S
n(y)>=0, S this moment
n-1(x, y), S
n-2(x, y) sampled point S that respectively assignment is given zero point after negative maximal value
' 13(x
13, y
13), S
' 14(x
14, y
14), enter step 11);
11) if obtaining negative maximal value, this is less than or equal to negative peak-peak, the negative maximal value assignment of this being obtained is given negative peak-peak, before negative maximal value, the sampled point assignment at zero point is given the negative peak-peak sampled point at front zero point, the sampled point that after negative maximal value, the sampled point assignment at zero point is given zero point after negative peak-peak, otherwise it is constant to retain after the sampled point at zero point before negative peak-peak, negative peak-peak, negative maximal value the sampled point at zero point, whether judgement now exceeds the gate scope, if exceed, enter step 12), otherwise return to step 7);
12) if the unique point needed is zero point before maximal value, will be just/negative maximal value assignment at front zero point is the curve sampled point, if the unique point needed is zero point after maximal value, will be just/negative maximal value after zero point assignment be the curve sampled point, wait for that sampling finishes, sampling finishes to return to step 1), otherwise rests on step 12).
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Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN107621638A (en) * | 2017-08-01 | 2018-01-23 | 昆明理工大学 | A kind of method that the time difference between two pulse signals is asked based on translation signal peak |
| WO2020199197A1 (en) * | 2019-04-04 | 2020-10-08 | 华为技术有限公司 | Method and apparatus for processing echo signals |
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| Publication number | Priority date | Publication date | Assignee | Title |
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| CN107621638A (en) * | 2017-08-01 | 2018-01-23 | 昆明理工大学 | A kind of method that the time difference between two pulse signals is asked based on translation signal peak |
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| CN112703420B (en) * | 2019-04-04 | 2022-06-14 | 华为技术有限公司 | Echo signal processing method and device |
| CN113009432A (en) * | 2020-02-28 | 2021-06-22 | 加特兰微电子科技(上海)有限公司 | Method, device and equipment for improving measurement precision and target detection precision |
| CN113009432B (en) * | 2020-02-28 | 2024-05-31 | 加特兰微电子科技(上海)有限公司 | Method, device and equipment for improving measurement accuracy and target detection accuracy |
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