CN103372826A - Universal testing clamp used for microscopic-infrared junction temperature detection of microwave power device - Google Patents
Universal testing clamp used for microscopic-infrared junction temperature detection of microwave power device Download PDFInfo
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- CN103372826A CN103372826A CN2013103109478A CN201310310947A CN103372826A CN 103372826 A CN103372826 A CN 103372826A CN 2013103109478 A CN2013103109478 A CN 2013103109478A CN 201310310947 A CN201310310947 A CN 201310310947A CN 103372826 A CN103372826 A CN 103372826A
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Abstract
The invention discloses a universal testing clamp used for microscopic-infrared junction temperature detection of a microwave power device and belongs to the technical field of infrared temperature measuring. The universal testing clamp is of a split-type structure and mainly comprises a base, a middle carrier and two circuit carriers, the middle carrier and the circuit carriers are arranged on the base, the circuit carriers are arranged parallelly and are on the same plane, the middle carrier is arranged between the circuit carriers, intervals are reserved between the circuit carriers and the middle carrier, a testing circuit board is arranged on each circuit carrier, and the testing circuit boards on the circuit carriers are communicated through a pipe leg of a tested device which is fixed on the middle carrier. The universal testing clamp has high universality and easiness in operating, detection efficiency is greatly improved, manpower and material costs are lowered, and product development period is shortened.
Description
Technical field
The present invention relates to the infrared temperature-test technology field, especially a kind of Universal test clamping apparatus that is fit to infrared microscopy junction temperature detection under the various microwave power device DC condition.
Background technology
It is the requisite important step that performance of devices and life-span are assessed that microwave power device is carried out temperature detection.In the whole bag of tricks and equipment of existing microwave power device temperature detection, thermal microscope is accepted extensively by industry with its higher spatial resolution, higher temperature control, the higher advantages such as sampling rate.Utilize the method can realize detecting for real-time, the accurate Temperature Distribution of DC operation condition microwave power device temperature.This all has great significance for fields such as microwave power device design, production, detection, failure analyses.
But, microwave power device being carried out the infrared microscopy temperature detection, device need to be fixed on the special-purpose test fixture.Domestic general way is at present, adopts the microwave test anchor clamps to carry out infrared temperature and detects, and this has saved cost to a certain extent.But because microwave power device is of a great variety, different components size, different causes the versatility of anchor clamps relatively poor, often needs to change anchor clamps in testing process, and this has wasted a large amount of time virtually, has reduced detection efficiency; In addition, some microwave test anchor clamps is because frame for movement or circuit design and be not suitable for and carry out the infrared microscopy temperature detection, and can there be larger error in the temperature detection result of utilizing these anchor clamps to obtain.
For versatility, the raising detection efficiency that strengthens test fixture, and get rid of because the unreasonable impact that testing result is caused of clamp structure, ensure the accuracy of microwave power device infrared microscopy junction temperature testing result, design a anchor clamps that are applicable to infrared microscopy temperature detection under the various microwave power device DC condition and be necessary.These anchor clamps will provide strong temperature detection guarantee for improving microwave power device production cycle, test analysis ability and the ability of designing and developing.
What the existing test fixture that is used for microwave power device infrared microscopy temperature detection adopted is the microwave test anchor clamps of device special use, and its advantage has:
1) for device of the same race, all adopt the same class anchor clamps to carry out the test of various parameters, clamp structure is fixed, size is fixed, and can guarantee to greatest extent the uniformity of device duty.
2) anchor clamps can be eliminated such as uncertain factors such as device self-excitations through special design and processing.
Its shortcoming is mainly reflected in:
1) versatility is poor, complicated operation, device for different model, need the different anchor clamps of design, different anchor clamps sizes, connect electric mode and all be not quite similar, when the measured device model changes, often need to change anchor clamps, rewiring, this is very inconvenient for the infrared microscopy temperature detection, can reduce to a great extent the efficient of mass detection; In addition, existing test fixture generally all takes the fixing mode of screw to guarantee the thermo-contact of device, and changing a device often needs to dismantle more than four screws, and this has had a strong impact on the speed that detects especially.
2) be difficult to guarantee the thermo-contact of device and anchor clamps; The bad detected temperatures result that must cause is higher in thermo-contact, and the thermal resistance value of calculating is higher, causes erroneous judgement for performance of devices.Because the microwave test anchor clamps carry out circuit and structural design mainly for its microwave property, aspect thermal design, the method for generally reinforcing and smearing thermal grease conduction by a plurality of screws guarantees to possess good thermo-contact between device and the anchor clamps.But smearing thermal grease conduction when detecting for product class device might stained device; And only depend on screw to fix, and can not effectively guarantee thermo-contact, fact proved that the degree of tightness of screw can cause very large impact to testing result.
3) some microwave power device test fixture is for the special briquetting that guaranteed electrical contact design that device is good.Experiment finds that briquette structure can cause the infrared microscopy temperature detection result on the low side.
Summary of the invention
The technical problem to be solved in the present invention provides a kind of Universal test clamping apparatus for the detection of microwave power device infrared microscopy junction temperature, these anchor clamps can improve the efficient that the infrared junction temperature of microwave power device detects, guarantee testing result accurately and reliably, and these anchor clamps has versatility.
For solving the problems of the technologies described above, the technical solution used in the present invention is: a kind of Universal test clamping apparatus for the detection of microwave power device infrared microscopy junction temperature, it is characterized in that comprising square base, two circuit carriers and an intermediate carrier are set on the described base, two circuit carriers be arranged in parallel, and be in same plane, between two circuit carriers, be provided with intermediate carrier, all leave the gap between circuit carrier and the intermediate carrier, be provided with testing circuit board on the circuit carrier, testing circuit board on two circuit carriers is communicated with by the pipe leg of measured device, and described measured device is fixed on the intermediate carrier.
Said structure is done further to replenish, and the adjacent side of described intermediate carrier upper surface and two circuit carriers surrounds the chamber, the end of placing measured device, and described measured device is fixed on the intermediate carrier by staple.
Said structure is done further to replenish, and described circuit carrier is provided with the slide opening of horizontal direction, passes screw in the described slide opening, and the end of screw cooperates with screw on the base.Screw passes circuit carrier and is fixed on the screw on the base among the present invention, by tightening screw, circuit carrier is fixed on the base.Circuit carrier is regulated at horizontal level, so that the circuit carrier horizontal level changes, reaches the purpose of distance between regulating circuit carrier and the intermediate carrier by push-pull circuit carrier on the horizontal direction.
Said structure is done further to replenish, and described slide opening is set to two, and two slide openings be arranged in parallel, and are positioned at the diagonal angle of circuit carrier, are equipped with the screw that is mated in two slide openings.Two parallel slide openings are set among the present invention, and the width of slide opening cooperates with the screw diameter of axle, guarantee that when moving horizontally integral body do not rotate, testing circuit board cooperates fully with the pipe leg of measured device, the assurance test accuracy.
Said structure is done further to replenish, be socketed with spring on the described screw, spring and is in compressive state between circuit carrier and base.Come the height of control circuit carrier among the present invention by the elasticity of spring, when needs are heightened, loosening screw, otherwise, tighten screw.Spring on the screw is can the holding circuit carrier height constant.
Said structure is done further to replenish, and the upper surface of described intermediate carrier is coated with one deck indium sheet.The present invention because the bad phenomenon of thermo-contact that the fastening degree of staple causes takes screw fastening and pad to cover the method for indium sheet, fully guarantees thermo-contact good between measured device and the intermediate carrier in order to get rid of.
Said structure is done further to replenish, also comprise two symmetrically arranged briquettings, described briquetting is located at 2 above the circuit carrier, and compresses the pipe leg of measured device.Briquetting among the present invention is to guarantee that pipe leg and testing circuit board power up the good contact of microstrip line, the appearance of cavity in traditional briquette structure with holes has been avoided in the setting of two side pressing blocks, improve the degree of accuracy of testing result, get rid of the fixture cavity body structure for the impact that detects.
The beneficial effect that adopts technique scheme to produce is: the present invention has designed special-purpose frame for movement and circuit structure, adopt the combination of base, circuit carrier and intermediate carrier, realize circuit carrier in the horizontal direction with vertical direction on adjusting, can satisfy the needs that various microwave power device infrared microscopy junction temperatures detect, have higher versatility; Intermediate carrier carrying measured device among the present invention, the good thermo-contact of device and carrier is to guarantee one of key factor of the testing result degree of accuracy, takes in the structure to cover the indium sheet on the intermediate carrier, the mode that adds screw in compression guarantees thermo-contact; Briquetting form among the present invention has been avoided the formation of cavity, and can satisfy the testing requirement of different size device, guarantees the degree of accuracy of testing result; The present invention is simple in structure, and operating aspect has been saved in test the clamp-replacing time, has improved detection efficiency.
Description of drawings
The present invention is further detailed explanation below in conjunction with the drawings and specific embodiments.
Fig. 1 is general structure front view of the present invention;
Fig. 2 is horizontal level adjusting device schematic diagram of the present invention;
Fig. 3 is the schematic diagram that removes among Fig. 2 behind the screw;
Fig. 4 is measured device thermo-contact structural representation;
Fig. 5 is the top view of the present invention in test;
Fig. 6 is the infrared detection figure of the present invention in test process;
Fig. 7 is the result who adopts the traditional microwave test fixture that a certain model device is detected, and maximum temperature is 133;
Fig. 8 is for adopting the present invention that same device is carried out the result of temperature detection under identical power consumption condition, and maximum temperature is 154 ℃;
Wherein: 1, circuit carrier, 2, base, 3, the pipe leg, 4, intermediate carrier, 5, chamber, the end, 6, slide opening, 7, screw, 8, testing circuit board, 9, screw, 10, measured device, 11, the indium sheet, 12, staple, 13, briquetting.
The specific embodiment
The present invention is specifically related to a kind of Universal test clamping apparatus for the detection of microwave power device infrared microscopy junction temperature, is used for the high accuracy infrared microscopy temperature detection under the various microwave power device DC condition.
1 as can be known with reference to the accompanying drawings, the present invention is split-type structural, mainly by base 2, intermediate carrier 4 and 1 three parts of two circuit carriers form, two circuit carriers 1 and an intermediate carrier 4 are set on the base 2, two circuit carriers 1 be arranged in parallel, and be in same plane, between two circuit carriers 1, be provided with intermediate carrier 4, all leave the gap between circuit carrier 1 and the intermediate carrier 4, be provided with testing circuit board 8 on the circuit carrier 1, testing circuit board 8 on two circuit carriers 1 is communicated with by the pipe leg 3 of measured device 10, and measured device 10 is fixed on the intermediate carrier 4.Adjacent side by intermediate carrier 1 upper surface and two circuit carriers 1 surrounds the chamber, the end 5 of placing measured device 10, and measured device 10 is fixed on the intermediate carrier 4 by staple 12.Testing circuit board 8 is fixed by welding on the both sides circuit carrier 1, forms test module.Place measured device 10 on the intermediate carrier 4, measured device 10 is fixed on the intermediate carrier 4 by screw, measured device 10 links to each other with the test module circuit by left and right sides pipe leg 3, and chamber, the end 5 and the both sides circuit carrier 1 of measured device 10 are adjacent to, for 10 liang of side pipe legs 3 of measured device provide support.
The present invention be directed to different measured device 10, because chamber, the end 5 sizes that different components is corresponding are different, only have the distance by regulating circuit carrier 1 and intermediate carrier 4 could satisfy the different size requirement on devices, therefore the spacing of both sides circuit carrier 1 and highly be can be freely regulated according to the size of measured device 10, but the both sides carrier should directly not contact with intermediate carrier 4.Under original state, the height of intermediate carrier 4 is higher than the circuit carrier 1 of both sides, when using, need to heighten the circuit carrier 1 of both sides, guarantees that pipe leg 3 contacts with testing circuit board 8.Because the thickness of measured device 10 is different, also can according to the thickness of measured device 10, middle carrier 4 be changed, to adapt to different test case.
In accompanying drawing 2 and accompanying drawing 3, can find out that circuit carrier 1 is provided with the slide opening 6 of horizontal direction, pass screw 7 in the slide opening 6, the end of screw 7 cooperates with screw 9 on the base 2.Slide opening 6 is set to two, and two slide openings 6 be arranged in parallel, and is positioned at the diagonal angle of circuit carrier 1, is equipped with the screw 7 that is mated in two slide openings 6.
The realization that horizontal level is regulated: distance is adjustable between circuit carrier 1 and the intermediate carrier 4, and slide opening 6 is positioned on the circuit carrier 1, and its screwing 7 is corresponding with screw 9 on the intermediate carrier 4.Screw 7 is fixed on the screw 9, by tightening screw 7, circuit carrier 1 is fixed on the intermediate carrier 4.By unscrewing screw 7, circuit carrier 1 along continuous straight runs on intermediate carrier 4 is moved around, reach the purpose of distance between regulating circuit carrier 1 and the intermediate carrier 4.
The realization that the upright position is regulated: screw 7 passes a spring after by testing circuit board 8, access again the screw 9 of two wing bases 2, spring and is in compressive state between circuit carrier and base, just can realize like this adjusting of circuit board upright position by slack adjuster.
The aspect that microwave power device infrared microscopy junction temperature detects two keys is thermo-contact and electrically contacts, and in order to guarantee good thermo-contact and to electrically contact, has designed the device fixed structure.
Base among the present invention and carrier all adopt the brass material that thermal conductivity is good, intensity is high.In addition, in order to guarantee the realization of good thermo-contact, can find out in accompanying drawing 4 that the upper surface of intermediate carrier 4 is coated with one deck indium sheet 11.Indium is the very good and soft metal material of quality of a kind of thermal conductivity, and this material is in the air gap that can fully fill up after the device pressing between device and the carrier, thereby greatly reduces thermal resistance between device and the carrier to guarantee the thermo-contact characteristic.Because the bad phenomenon of thermo-contact that screw tightening degree causes takes screw fastening and pad to cover the method for indium sheet 11, fully guarantee thermo-contact good between measured device 10 and the intermediate carrier 4 in order to get rid of.
In order to guarantee the good realization that electrically contacts, traditional microwave test anchor clamps adopts briquette structure with holes to guarantee that pipe leg and circuit board power up the good contact of microstrip line.But the briquette structure here can form a cavity, and the size of cavity can cause larger impact to infrared microscopy junction temperature testing result.Here at circuit carrier 1 briquetting 13 two symmetries, that be made of polytetrafluoroethylmaterial material is set, with the fixing pipe leg 3 of measured device 10, as shown in Figure 5, has avoided the formation of cavity and can satisfy the testing requirement of different size device.Two topmost effects of side pressing block are the degrees of accuracy that improve testing result, get rid of the fixture cavity body structure for the impact that detects.
For advantage of the present invention place is described, be that example describes for the test process of each 20 device of two models.Adopt the situation of common microwave test anchor clamps as follows:
For the electrical lead that adds of 2 kinds of microwave test anchor clamps and correspondence, concrete testing procedure is as follows:
1, according to the suitable intermediate carrier 4 of measured device 10 size Selection, guarantees that measured device 10 nail 12 that can be fixed is fixed on the intermediate carrier 4;
2, the condition that powers up according to measured device 10 is connected to power supply output line on circuit carrier 1 and the intermediate carrier 4;
3, adjustment screw 7, so that feed line good contact in the testing circuit board 8 of the pipe leg 3 of measured device and circuit carrier 1;
4, the present invention is placed on the thermal infrared imager heating platform;
5, pressing two side pressing blocks 13;
6, power up and test;
7, open two side pressing blocks 13, unscrew the staple 12 of intermediate carrier 4, change measured device;
8, pressing two side pressing blocks 13 add electrical testing;
If the model of 9 measured devices changes then only need change intermediate carrier 4, and micrometer adjusting screw 7 can repeat to measure by above-mentioned steps.
In test process, the temperature value that gathers is the temperature on the measured device middle part horizontal line shown in Fig. 6, wherein can have Fig. 7 and Fig. 8 to find out along horizontal line temperature value from left to right.
Test result is as follows:
The overall test time is 4 hours, and wherein the clamp-replacing time is 10 minutes, and the device lay day accounted for 2 and a half hours, and maximum temperature is 133 ℃, as shown in Figure 7.
Adopt the situation of this patent Universal test clamping apparatus as follows:
Standby Universal test clamping apparatus and add electrical lead one cover;
The overall test time is 3 hours, has saved the clamp-replacing time, and the device always loading and unloading time is 1 hour, and maximum temperature is 154 ℃, as shown in Figure 8.
Therefore the present invention can satisfy the needs that various microwave power device infrared microscopy junction temperatures detect, and has improved detection efficiency, and has guaranteed the degree of accuracy of testing result.
Claims (7)
1. one kind is used for the Universal test clamping apparatus that microwave power device infrared microscopy junction temperature detects, it is characterized in that comprising square base (2), two circuit carriers (1) and an intermediate carrier (4) are set on the described base (2), two circuit carriers (1) be arranged in parallel, and be in same plane, between two circuit carriers (1), be provided with intermediate carrier (4), all leave the gap between circuit carrier (1) and the intermediate carrier (4), be provided with testing circuit board (8) on the circuit carrier (1), testing circuit board (8) on two circuit carriers (1) is communicated with by the pipe leg (3) of measured device (10), and described measured device (10) is fixed on the intermediate carrier (4).
2. the Universal test clamping apparatus that detects for microwave power device infrared microscopy junction temperature according to claim 1, the adjacent side that it is characterized in that described intermediate carrier (1) upper surface and two circuit carriers (1) surrounds the chamber, the end (5) of placing measured device (10), and described measured device (10) is fixed on the intermediate carrier (4) by staple (12).
3. the Universal test clamping apparatus that detects for microwave power device infrared microscopy junction temperature according to claim 1, it is characterized in that described circuit carrier (1) is provided with the slide opening (6) of horizontal direction, pass screw (7) in the described slide opening (6), the end of screw (7) cooperates with screw (9) on the base (2).
4. the Universal test clamping apparatus that detects for microwave power device infrared microscopy junction temperature according to claim 3, it is characterized in that described slide opening (6) is set to two, article two, slide opening (6) be arranged in parallel, and be positioned at the diagonal angle of circuit carrier (1), be equipped with the screw (7) that is mated in two slide openings (6).
5. according to claim 3 or the 4 described Universal test clamping apparatus that detect for microwave power device infrared microscopy junction temperature, it is characterized in that being socketed with spring on the described screw (7), spring is positioned between circuit carrier (1) and the base (2), and is in compressive state.
6. the Universal test clamping apparatus for the detection of microwave power device infrared microscopy junction temperature according to claim 2 is characterized in that the upper surface of described intermediate carrier (4) is coated with one deck indium sheet (11).
7. the Universal test clamping apparatus that detects for microwave power device infrared microscopy junction temperature according to claim 1, characterized by further comprising two symmetrically arranged briquettings (13), described briquetting (13) is located at above 2 circuit carriers (1), and compresses the pipe leg (3) of measured device (10).
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201310310947.8A CN103372826B (en) | 2013-07-23 | 2013-07-23 | For the Universal test clamping apparatus that microwave power device infrared microscopy junction temperature detects |
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201310310947.8A CN103372826B (en) | 2013-07-23 | 2013-07-23 | For the Universal test clamping apparatus that microwave power device infrared microscopy junction temperature detects |
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| CN103372826A true CN103372826A (en) | 2013-10-30 |
| CN103372826B CN103372826B (en) | 2015-09-09 |
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Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN106053889A (en) * | 2016-06-22 | 2016-10-26 | 珠海纳睿达科技有限公司 | Multifunctional microwave testing clamp |
| CN110794221A (en) * | 2019-11-05 | 2020-02-14 | 中国电子科技集团公司第四十一研究所 | MEMS attenuator testing arrangement |
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| CN203438103U (en) * | 2013-07-23 | 2014-02-19 | 中国电子科技集团公司第十三研究所 | Universal testing clamp for detecting microscopic infrared junction temperature of microwave power device |
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| US3583694A (en) * | 1970-03-20 | 1971-06-08 | John R Davies | Circuit board clamp |
| EP0131996A2 (en) * | 1983-07-06 | 1985-01-23 | Philips Electronics Uk Limited | Infra-red radiation detector |
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| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN106053889A (en) * | 2016-06-22 | 2016-10-26 | 珠海纳睿达科技有限公司 | Multifunctional microwave testing clamp |
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| CN110794221B (en) * | 2019-11-05 | 2021-07-09 | 中国电子科技集团公司第四十一研究所 | MEMS attenuator testing arrangement |
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| CN103372826B (en) | 2015-09-09 |
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